CN207440149U - Suitable for the probe unit of chip high-frequency test - Google Patents
Suitable for the probe unit of chip high-frequency test Download PDFInfo
- Publication number
- CN207440149U CN207440149U CN201721693822.8U CN201721693822U CN207440149U CN 207440149 U CN207440149 U CN 207440149U CN 201721693822 U CN201721693822 U CN 201721693822U CN 207440149 U CN207440149 U CN 207440149U
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- probe
- master collet
- frequency test
- chip high
- limit plug
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Abstract
The utility model is related to a kind of probe units suitable for chip high-frequency test, include probe assembly, sleeve assembly is arranged with outside probe assembly, probe assembly is surrounded by master collet body, elastic parts is provided in master collet body, the one side of master collet body is provided with primary probe, the needle section of primary probe is located in master collet, the opposite side of master collet body is provided with secondary probe, the Aculeata of secondary probe is located in master collet, and the needle section of primary probe, the Aculeata of secondary probe are in contact respectively with elastic parts.Specification is controllable during as a result, prepared by various components, meets the coaxial matching between probe, reduces noise jamming, can weaken the interference of outer signals well.The specification that test chip can be directed to is customized, and improves measuring accuracy.Equipped with independent elastic parts, possess preferable elastic mechanism, ensure effective break-make.It is simple in structure, it is easily assembled, safeguards and routine use.
Description
Technical field
The utility model is related to a kind of probe unit more particularly to a kind of probe units suitable for chip high-frequency test.
Background technology
Impedance matching is the part in microwave electronics, is mainly used on transmission line, to reach the microwave of all high frequencies
Signal can all reach the purpose of load point, do not have signal reflex and return source point, so as to promote source benefit.In chip testing
In, it is connected between chip and PCB to be measured by testing probe, the signal of chip is also to be transferred to by test on PCB, and signal is complete
Whole property can be because the presence loss of test probe be many, especially in the particularly evident of high-frequency test performance.How right research shows
Testing needle carries out impedance matching, reduces chip signal by test probe loss, is a crucial ring in high-frequency test.
In view of the above shortcomings, the designer, is actively subject to research and innovation, it is a kind of suitable for chip high frequency to found
The probe unit of test makes it with more the utility value in industry.
Utility model content
In order to solve the above technical problems, the purpose of this utility model is to provide a kind of probe suitable for chip high-frequency test
Device.
The probe unit suitable for chip high-frequency test of the utility model, includes probe assembly, wherein：The probe
Sleeve assembly is arranged with outside component, the probe assembly is surrounded by master collet body, elastic group is provided in the master collet body
Part, the one side of the master collet body are provided with primary probe, and the needle section of the primary probe is located in master collet, the master collet
The opposite side of body is provided with secondary probe, and the Aculeata of the pair probe is located in master collet, needle section, the pair of the primary probe
The Aculeata of probe is in contact respectively with elastic parts.
Further, the above-mentioned probe unit suitable for chip high-frequency test, wherein, the sleeve assembly includes pair
Sleeve body, the pair sleeve body are provided at both ends with limit plug, probe via, the main spy are provided on the limit plug
The tail end of pin, the head of secondary probe are pierced by from the probe via of corresponding limit plug.
Further, the above-mentioned probe unit suitable for chip high-frequency test, wherein, the two of the pair sleeve body
End is distributed with punching press and gets ready, and the limit plug is inserted into respectively inside the both ends of secondary sleeve body, the outer wall of the limit plug and punching
Pressure, which is got ready, to be in contact.
Further, the above-mentioned probe unit suitable for chip high-frequency test, wherein, the limit plug is convex character shape
Limit plug, the front end of the convex character shape limit plug are provided with positioning groove.
Further, the above-mentioned probe unit suitable for chip high-frequency test, wherein, divide in the pair sleeve body
It is furnished with auxiliary positioning item.
Further, the above-mentioned probe unit suitable for chip high-frequency test, wherein, the syringe needle of the primary probe
Portion, the Aculeata of secondary probe are both provided with independent contact tip, and the contact tip penetrates elastic parts.
Yet further, the above-mentioned probe unit suitable for chip high-frequency test, wherein, the elastic parts is bullet
Spring.
According to the above aspect of the present invention, the utility model at least has the following advantages：
1st, specification is controllable during prepared by various components, meets the coaxial matching between probe, reduces noise jamming, can be very well
Weaken the interference of outer signals in ground.
2nd, the specification that can be directed to test chip is customized, and improves measuring accuracy.
3rd, equipped with independent elastic parts, possess preferable elastic mechanism, ensure effective break-make.
4th, it is simple in structure, it is easily assembled, safeguards and routine use.
Above description is only the general introduction of technical solutions of the utility model, in order to better understand the skill of the utility model
Art means, and being practiced according to the content of specification with the preferred embodiment of the utility model and coordinate attached drawing detailed below
It describes in detail bright as after.
Description of the drawings
Fig. 1 applies to the structure diagram of the probe unit of chip high-frequency test.
The meaning of each reference numeral is as follows in figure.
1 master collet body, 2 elastic parts
The secondary probe of 3 primary probe 4
56 limit plugs of secondary sleeve body
8 auxiliary positioning items are got in 7 punching presses ready
Specific embodiment
With reference to the accompanying drawings and examples, specific embodiment of the present utility model is described in further detail.Below
Embodiment is not intended to limit the scope of the present invention for illustrating the utility model.
Such as the probe unit suitable for chip high-frequency test of Fig. 1, include probe assembly, unusual is in
In：In order to realize itself constraint positioning needs of probe assembly during use, meet the test that multiple devices simultaneously participate in chip
It needs, sleeve assembly is arranged with outside probe assembly.Specifically, in order to realize the contact of resilient contact formula, the fast of detection is met
Fast break-make, the probe assembly of use are surrounded by master collet body 1, elastic parts 2, master collet body 1 are provided in master collet body 1
One side be provided with primary probe 3, the needle section of primary probe 3 is located in master collet.It is corresponding to be, in master collet body 1
Opposite side is provided with secondary probe 4, and the Aculeata of secondary probe 4 is located in master collet.The presence of master collet body 1 is relied on, to master
The needle section of probe 3, the Aculeata of secondary probe 4 carry out /V, ensure that primary probe 3, secondary probe 4 will not be loosened from master collet.
Meanwhile the needle section of primary probe 3, the Aculeata of secondary probe 4 are in contact respectively with elastic parts 2.
From the point of view of one preferable embodiment of the utility model, in order to realize that the storage of probe assembly uses, use
Sleeve assembly includes secondary sleeve body 5, the limit plug 6 for being provided at both ends with Teflon material composition of secondary sleeve body 5, positioning
Probe via is provided on plug 6, the tail end of primary probe 3, the head of secondary probe 4 are worn from the probe via of corresponding limit plug 6
Go out.Simultaneously, it is contemplated that effective /V after the installation of limit plug 6 prevents limit plug 6 from unnecessary vibrations occur or loosening, secondary
The both ends of sleeve body 5 are distributed with punching press and get 7 ready, and limit plug 6 is inserted into respectively inside the both ends of secondary sleeve body 5, limit plug 6
Outer wall gets 7 ready with punching press and is in contact.Also, in order to preferably be assembled, limit plug 6 is convex character shape limit plug 6, and convex character shape is fixed
The front end of position plug 6 is provided with positioning groove.
From the point of view of further, auxiliary positioning item 8 is distributed in secondary sleeve body 5 in the utility model, convenient for actually using the phase
Between by other assemblies realize multigroup probe synchronism detection needs.Meanwhile the needle section of primary probe 3, the Aculeata of secondary probe 4 are equal
Independent contact tip is provided with, contact tip penetrates elastic parts 2.In this way, after receiving to squeeze, elastic parts 2 bounces back, main
The needle section of probe 3, the contact tip of the Aculeata of pair probe 4 contact with each other, and realize conducting.In order to possess during use compared with
Good retraction feedback, the elastic parts 2 used is spring.
It can be seen that by above-mentioned character express and with reference to attached drawing using after the utility model, gather around and have the following advantages：
1st, specification is controllable during prepared by various components, meets the coaxial matching between probe, reduces noise jamming, can be very well
Weaken the interference of outer signals in ground.
2nd, the specification that can be directed to test chip is customized, and improves measuring accuracy.
3rd, equipped with independent elastic parts, possess preferable elastic mechanism, ensure effective break-make.
4th, it is simple in structure, it is easily assembled, safeguards and routine use.
The above is only the preferred embodiment of the utility model, is not intended to limit the utility model, it is noted that
For those skilled in the art, on the premise of the utility model technical principle is not departed from, can also do
Go out several improvement and modification, these improvements and modifications also should be regarded as the scope of protection of the utility model.
Claims (7)
1. suitable for the probe unit of chip high-frequency test, include probe assembly, it is characterised in that：The probe assembly housing
Equipped with sleeve assembly, the probe assembly is surrounded by master collet body (1), and elastic parts is provided in the master collet body (1)
(2), the one side of the master collet body (1) is provided with primary probe (3), and the needle section of the primary probe (3) is located in master collet,
The opposite side of the master collet body (1) is provided with secondary probe (4), and the Aculeata of the pair probe (4) is located in master collet, institute
State the needle section of primary probe (3), the Aculeata of secondary probe (4) is in contact respectively with elastic parts (2).
2. the probe unit according to claim 1 suitable for chip high-frequency test, it is characterised in that：The sleeve assembly
Include secondary sleeve body (5), the pair sleeve body (5) is provided at both ends with limit plug (6), is set on the limit plug (6)
Probe via is equipped with, the tail end of the primary probe (3), the head of secondary probe (4) are from the probe via of corresponding limit plug (6)
It is pierced by.
3. the probe unit according to claim 2 suitable for chip high-frequency test, it is characterised in that：The pair sleeve sheet
The both ends of body (5) are distributed with punching press and get ready (7), and the limit plug (6) is inserted into respectively inside the both ends of secondary sleeve body (5), institute
The outer wall for stating limit plug (6) gets (7) ready with punching press and is in contact.
4. the probe unit according to claim 2 suitable for chip high-frequency test, it is characterised in that：The limit plug
(6) it is convex character shape limit plug (6), the front end of the convex character shape limit plug (6) is provided with positioning groove.
5. the probe unit according to claim 2 suitable for chip high-frequency test, it is characterised in that：The pair sleeve sheet
Auxiliary positioning item (8) is distributed on body (5).
6. the probe unit according to claim 1 suitable for chip high-frequency test, it is characterised in that：The primary probe
(3) needle section, the Aculeata of secondary probe (4) are both provided with independent contact tip, and the contact tip penetrates elastic parts
(2)。
7. the probe unit according to claim 1 suitable for chip high-frequency test, it is characterised in that：The elastic parts
(2) it is spring.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201721693822.8U CN207440149U (en) | 2017-12-07 | 2017-12-07 | Suitable for the probe unit of chip high-frequency test |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201721693822.8U CN207440149U (en) | 2017-12-07 | 2017-12-07 | Suitable for the probe unit of chip high-frequency test |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN207440149U true CN207440149U (en) | 2018-06-01 |
Family
ID=62285988
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201721693822.8U Active CN207440149U (en) | 2017-12-07 | 2017-12-07 | Suitable for the probe unit of chip high-frequency test |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN207440149U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112083200A (en) * | 2020-09-11 | 2020-12-15 | 苏州韬盛电子科技有限公司 | Novel high-frequency test socket |
-
2017
- 2017-12-07 CN CN201721693822.8U patent/CN207440149U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112083200A (en) * | 2020-09-11 | 2020-12-15 | 苏州韬盛电子科技有限公司 | Novel high-frequency test socket |
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