CN206945856U - Solar energy bypass diode temperature rise test automation device - Google Patents
Solar energy bypass diode temperature rise test automation device Download PDFInfo
- Publication number
- CN206945856U CN206945856U CN201720809292.2U CN201720809292U CN206945856U CN 206945856 U CN206945856 U CN 206945856U CN 201720809292 U CN201720809292 U CN 201720809292U CN 206945856 U CN206945856 U CN 206945856U
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- Prior art keywords
- temperature
- mcu controllers
- test
- box
- solar energy
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Abstract
The utility model discloses a kind of solar energy bypass diode temperature rise test automation device, including MCU controllers, numeric keypad, constant current constant voltage source, insulating box, temperature collecting cell, power-supply controller of electric, controller to be connected with above-mentioned device respectively;Thermocouple is fixed on the diode in terminal box to be measured, and is put into insulating box;The temperature of setting is sent to insulating box by controller;Temperature collecting cell is transferred to MCU controllers, the temperature and constant temperature the temperature inside the box of the diodes inside terminal box to be measured that MCU controller real-time reception temperature collecting cells collect after the temperature signal that thermocouple gathers is handled;The controller sets transmission parameter to adjust output current to the constant current constant voltage source according to test condition.The utility model discharges labour, test condition Digital Control, ensures the uniformity of test condition using testing efficiency is lifted, automatic to terminate test and alarm when occurring abnormal, lifts Security of test energy.
Description
Technical field
Solar energy testing field is the utility model is related to, more particularly to solar energy bypass diode temperature rise test is automatically
Makeup is put.
Background technology
During existing solar junction box temperature rise test, terminal box is put into after insulating box is warming up to 75 DEG C, using common
Constant current constant voltage source docking line box provides rated current, and diode temperature is read after being powered 1 hour.Then electric current increases to 1.25 times
It is powered again after rated current one hour, then confirms the performance of diode and terminal box.Time-consuming for whole test, it is necessary to repeatedly really
Recognize conduction time, adjust power supply output parameter, test uniformity is difficult to ensure that testing efficiency is low, and the temperature tested in addition has
When may be higher, certain potential safety hazard be present in no longer control range.
Utility model content
In order to overcome above-mentioned technical problem.The purpose of this utility model is lifting temperature rise testing efficiency, ensures test condition
Uniformity, occur in test process temperature it is too high when, alarm can be sent and be automatically stopped test.
To achieve the above object, the utility model is realized according to following technical scheme:
A kind of solar energy bypass diode temperature rise test automation device, including MCU controllers, numeric keypad, constant current perseverance
Potential source, insulating box, temperature collecting cell, power-supply controller of electric;
Wherein, the MCU controllers respectively with the numeric keypad, the constant current constant voltage source, the power-supply controller of electric, institute
Temperature collecting cell, insulating box connection are stated, the numeric keypad is used to set test condition;
Thermocouple is fixed on the diode in terminal box to be measured, and is put into the insulating box;The MCU controllers will be set
Fixed temperature is sent to the insulating box;The temperature collecting cell transmits after the temperature signal that thermocouple gathers is handled
MCU controllers are given, meanwhile, the diodes inside terminal box to be measured that the MCU controllers real-time reception temperature collecting cell collects
Temperature and constant temperature the temperature inside the box;The MCU controllers set transmission parameter to be adjusted to the constant current constant voltage source according to test condition
Save output current.
In above-mentioned technical proposal, in addition to buzzer, the buzzer are driven by the MCU controllers and using triode
Move and be used to alarm.
In above-mentioned technical proposal, in addition to display, MCU controllers described in the display real-time reception are by collecting temperature
Result and show Current Temperatures.
In above-mentioned technical proposal, the display is LCD display or light-emitting diode display.
In above-mentioned technical proposal, in addition to LED light, the LED light are connected with the MCU controllers, are used for
Indicate test mode.
The utility model compared with prior art, has the advantages that:
The utility model can lift testing efficiency using the automatic testing equipment, discharge labour.Test condition numeral
Change control, ensure the uniformity of test condition.It is automatic to terminate test, and alarm when occurring abnormal, lift Security of test energy.
Brief description of the drawings
, below will be to embodiment in order to illustrate more clearly of the utility model embodiment or technical scheme of the prior art
Or the required accompanying drawing used is briefly described in description of the prior art, it should be apparent that, drawings in the following description are only
It is some embodiments of the utility model, for those of ordinary skill in the art, is not paying the premise of creative work
Under, other accompanying drawings can also be obtained according to these accompanying drawings.
Fig. 1 is the structural representation of solar energy bypass diode temperature rise test automation device of the present utility model.
Embodiment
It is new below in conjunction with this practicality to make the purpose, technical scheme and advantage of the utility model embodiment clearer
Accompanying drawing in type embodiment, the technical scheme in the embodiment of the utility model is clearly and completely described, it is clear that is retouched
The embodiment stated is the utility model part of the embodiment, rather than whole embodiments.
Fig. 1 is the structural representation of solar energy bypass diode temperature rise test automation device of the present utility model.Such as Fig. 1
It is shown, a kind of solar energy bypass diode temperature rise test automation device of the present utility model, including MCU controllers, numerical key
Disk, constant current constant voltage source, insulating box, temperature collecting cell, power-supply controller of electric;
Wherein, MCU controllers respectively with numeric keypad, constant current constant voltage source, power-supply controller of electric, temperature collecting cell, constant temperature
Case connects, and numeric keypad is used to set test condition;
Thermocouple is fixed on the diode in terminal box to be measured, and is put into insulating box;MCU controllers are by the temperature of setting
It is sent to the insulating box;Temperature collecting cell is transferred to MCU controllers after the temperature signal that thermocouple gathers is handled,
Meanwhile in the temperature of diodes inside terminal box to be measured that collects of MCU controller real-time reception temperature collecting cells and insulating box
Temperature;MCU controllers set transmission parameter to adjust output current to the constant current constant voltage source according to test condition.
Temperature collecting cell mainly passes through thermocouple collecting temperature data, and is transferred to MCU signal processing unit, main
To include thermocouple, optocoupler, relay, comparator, amplifying unit, those skilled in the art are readily able to obtain as needed
, it is the state of the art, here is omitted.
The utility model also includes buzzer, and buzzer is driven by MCU controllers and using triode and is used to alarm.
The utility model also includes display, and display real-time reception MCU controllers are by the result of collecting temperature and display
Current Temperatures.Display can be LCD display or light-emitting diode display.
The utility model also includes LED light, and the LED light is connected with the MCU controllers, for indicating to survey
Examination state.
The utility model controls condition of work and the time of each equipment using MCU controller coordinates, and by real-time
Communication acquisition test result.The voltage that temperature needed for setting and test in MCU controllers in advance, time, and power supply needs export/
The parameters such as electric current.After being provided with after control unit, which receives, starts test instruction, MCU controllers send instruction, open permanent
Preset temperature is simultaneously passed to insulating box by incubator.MCU controllers monitor constant temperature the temperature inside the box in real time, are positioned over connecing in insulating box
Line box temperature and to be tested every bypass diode temperature, when two pole the temperature inside the box and diode temperature reach default temperature
After degree, MCU controllers send instruction control power supply and provide output according to default parameter, and are surveyed according to the default testing time
Examination.After the completion of test, output is automatically shut power off, and pass test result back main frame.If there is temperature in test process
Abnormal high or low phenomenon, it is automatic to terminate test, and send alarm.
Operation principle of the present utility model:
Thermocouple wire is fixed on the diode in terminal box to be measured first, and is put into insulating box, open controller and
Miscellaneous equipment power supply.Test condition is set by numeric keypad, mainly there are several aspects:1. the environment temperature of terminal box to be measured,
I.e. the design temperature of insulating box, test voltage electric current are output voltage electric current, the test pattern in constant current constant voltage source, will according to test
The difference asked, select different timing modes:The first pattern is to limit terminal box energization length of testing speech to be measured;Second of pattern
It is to limit terminal box to be measured to be powered after test, the duration that diode keeping temperature balances in box;The third pattern be both controlled it is logical
The duration of electricity, also control the duration of equalized temperature.If it exceeds the nominal working range of equipment, will be unable to defeated during condition entry
Enter.
After the completion of condition entry, started working by the start button on numeric keypad.MCU controllers first are by the temperature of setting
Insulating box is sent to, makes its start-up operation.The terminal box to be measured that MCU controller real-time reception temperature collecting cells collect simultaneously
The temperature and constant temperature the temperature inside the box of interior diode, and display is sent to show Current Temperatures during by fructufy.Work as insulating box
When interior temperature and diodes inside terminal box temperature to be measured reach the temperature of setting, MCU controllers are by test voltage and current parameters
Constant current constant voltage source is sent to, and makes its work, test voltage electric current is provided to terminal box to be measured.
MCU controllers can now open clocking capability in good time according to the test pattern selected when setting test condition, and will
Time is sent to display and shown in real time.When timing time reaches the duration of setting, MCU controllers can be set according to test
Put, send parameter and adjust its output current to constant current constant voltage source, and again according to the test pattern selected when setting test condition
Clocking capability is opened in good time.After the duration for reaching setting again, output is closed in MCU controllers control constant current constant voltage source, is closed permanent
Incubator, stop test, LED light length is bright, and display shows length of testing speech and final temperature.
In test process, when the temperature anomaly collected, LED light flashes, and buzzer can send alarm, MCU controls
Device processed automatically controls constant current constant voltage source and insulating box is stopped.
Specific embodiment of the utility model is described above.It is to be appreciated that the utility model not office
It is limited to above-mentioned particular implementation, those skilled in the art can make a variety of changes or change within the scope of the claims,
This has no effect on substantive content of the present utility model.In the case where not conflicting, the spy in embodiments herein and embodiment
Sign can be arbitrarily mutually combined.
Claims (5)
1. a kind of solar energy bypass diode temperature rise test automation device, it is characterised in that including MCU controllers, numerical key
Disk, constant current constant voltage source, insulating box, temperature collecting cell, power-supply controller of electric;
Wherein, the MCU controllers respectively with the numeric keypad, the constant current constant voltage source, the power-supply controller of electric, the temperature
Collecting unit, insulating box connection are spent, the numeric keypad is used to set test condition;
Thermocouple is fixed on the diode in terminal box to be measured, and is put into the insulating box;The MCU controllers are by setting
Temperature is sent to the insulating box;The temperature collecting cell is transferred to after the temperature signal that thermocouple gathers is handled
MCU controllers, meanwhile, the diodes inside terminal box to be measured that the MCU controllers real-time reception temperature collecting cell collects
Temperature and constant temperature the temperature inside the box;The MCU controllers set transmission parameter to be adjusted to the constant current constant voltage source according to test condition
Output current.
2. a kind of solar energy bypass diode temperature rise test automation device according to claim 1, it is characterised in that also
Including buzzer, the buzzer is by the MCU controllers and is driven using triode and is used to alarm.
3. a kind of solar energy bypass diode temperature rise test automation device according to claim 1, it is characterised in that also
Including display, MCU controllers by the result of collecting temperature and show Current Temperatures described in the display real-time reception.
A kind of 4. solar energy bypass diode temperature rise test automation device according to claim 3, it is characterised in that institute
It is LCD display or light-emitting diode display to state display.
5. a kind of solar energy bypass diode temperature rise test automation device according to claim 3, it is characterised in that also
Including LED light, the LED light is connected with the MCU controllers, for indicating test mode.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201720809292.2U CN206945856U (en) | 2017-07-05 | 2017-07-05 | Solar energy bypass diode temperature rise test automation device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201720809292.2U CN206945856U (en) | 2017-07-05 | 2017-07-05 | Solar energy bypass diode temperature rise test automation device |
Publications (1)
Publication Number | Publication Date |
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CN206945856U true CN206945856U (en) | 2018-01-30 |
Family
ID=61367069
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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CN201720809292.2U Expired - Fee Related CN206945856U (en) | 2017-07-05 | 2017-07-05 | Solar energy bypass diode temperature rise test automation device |
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CN (1) | CN206945856U (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108802592A (en) * | 2018-08-24 | 2018-11-13 | 无锡市产品质量监督检验院 | A kind of bypass diode test device and test method |
-
2017
- 2017-07-05 CN CN201720809292.2U patent/CN206945856U/en not_active Expired - Fee Related
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108802592A (en) * | 2018-08-24 | 2018-11-13 | 无锡市产品质量监督检验院 | A kind of bypass diode test device and test method |
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Legal Events
Date | Code | Title | Description |
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GR01 | Patent grant | ||
GR01 | Patent grant | ||
CF01 | Termination of patent right due to non-payment of annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20180130 |