CN206583987U - A kind of high-power parameter measurement system - Google Patents
A kind of high-power parameter measurement system Download PDFInfo
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- CN206583987U CN206583987U CN201720151852.XU CN201720151852U CN206583987U CN 206583987 U CN206583987 U CN 206583987U CN 201720151852 U CN201720151852 U CN 201720151852U CN 206583987 U CN206583987 U CN 206583987U
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Abstract
The utility model relate to a kind of high-power parameter measurement system, including booster output measuring circuit, temperature measuring circuit；Booster output measuring circuit includes the first signal generator, treats that amplifier places port, the first load, the first coupler, the second coupler, the first digital analog converter, the second digital analog converter and micro-control unit, temperature measuring circuit includes secondary signal generator, tested device and places port, the 3rd coupler, the 4th coupler, the first power sensor, the second power sensor, usb hub, thermometer, the second load, the 3rd load and the 4th load, thermometer is arranged on tested device, the temperature for detecting tested device.It is different from prior art, application requirement that tester can according to the test request of device and its in systems carries out various performance evaluations, is the design considerations that device and system design provide practicality.
Description
Technical field
The utility model is related to radio detection technical field, more particularly to a kind of high-power parameter measurement system.
Background technology
In the radio art of prior art, any radio frequency and microwave device, when being operated under high-power state, its
Some physical characteristics can change, the change of such as temperature, the change of amplifier operating point.These changes will cause device
The change of S parameter！S parameter, that is, scattering parameter, are defined as under conditions of given frequency and system impedance, Ren Hefei
The transmission of preferable multiport network and reflection characteristic.But prior art, it is impossible to effectively S parameter is accurately and effectively examined
Survey, lift some cases.
Case one：" power coefficient " of passive device
The 100W attenuators that one nominal decay amount is 30dB, the decay measured with Network Analyzer (measured power 1mW)
Measure as 30dB, but when operating at full capacity, its attenuation may be changed to 31dB, if this attenuator is used for into 100W
The smart power measurement of amplifier or emitter, only attenuator itself will produce 20.6% test error.
This variable quantity of attenuator is referred to as power coefficient, it is necessary to tested under the conditions of high-power.
Case two：The hot VSWR of power amplifier
Power amplifier can also occur under different power output states from VSWR of the output end as viewed from amplifier
Change, thus cause system effectiveness reduction and system work it is unstable.
It is referred to as hot VSWR (i.e. Hot S from the standing wave of the output end of amplifier as viewed from amplifier22), this parameter must
Must be under high power work state from the output end direct measurement of amplifier.
Case three：Ferrite device S12Change
Ferrite isolator is under high-power state, and reverse isolation degree may be reduced, so as to cause system work not
Stable and system Intermodulation Interference.
In above three case, all Network Analyzer of the prior art can not be used to measure.
Utility model content
For this reason, it may be necessary to provide a kind of high-power parameter measurement system, for solving, Network Analyzer can not in the prior art
The technical problem for S parameter accurately measure comprehensively.
To achieve the above object, a kind of high-power parameter measurement system, including booster output measurement are inventor provided
Circuit, temperature measuring circuit；
The booster output measuring circuit include the first signal generator, treat amplifier place port, first load,
First coupler, the second coupler, the first digital analog converter, the second digital analog converter and micro-control unit, first letter
Number generator is connected by the first coupler with treating that amplifier places one end of port, described to treat that amplifier places port
The other end by the second coupler with first load be connected, first coupler is connected with the first digital analog converter,
Second coupler is connected with the second digital analog converter, the micro-control unit respectively with the first digital analog converter, second
Digital analog converter is connected, and micro-control unit is handled for the data-signal being collected into be sent into analysis of outside data end
With analysis；
The temperature measuring circuit includes secondary signal generator, tested device and places port, the 3rd coupler, the 4th
Coupler, the first power sensor, the second power sensor, usb hub, thermometer, the second load, the 3rd load and the
Four loads, the secondary signal generator is connected by the 3rd coupler with one end that tested device places port, described
Tested device place port the other end by the 4th coupler with the 4th load is connected, the 3rd coupler respectively with
First power sensor, the second load are connected, and the 4th coupler is connected with the second power sensor, the 3rd load respectively
Connect, the usb hub is connected with the first power sensor, the second power sensor respectively, usb hub is used to collect
To data-signal be sent to analysis of outside data end and handled and analyzed；
The thermometer is arranged on tested device, the temperature for detecting tested device.
As a kind of preferred structure of the present utility model, in addition to housing, the booster output measuring circuit, temperature are surveyed
Amount circuit is arranged in housing.
As a kind of preferred structure of the present utility model, first coupler and the second coupler pass through power meter respectively
It is connected with the first digital analog converter, the second digital analog converter.
As a kind of preferred structure of the present utility model, the temperature measuring circuit also includes amplifier, wave filter, described
Secondary signal generator is connected with amplifier, and the amplifier is connected with wave filter, the wave filter and the 3rd coupler
It is connected.
Prior art is different from, above-mentioned technical proposal treats measuring by booster output measuring circuit, signal generator
Big device sends signal, and the data for treating amplifier are transported in micro-control unit by digital analog converter, according to the principle of S parameter,
The four elementses a of the S parameter under high-power state can be measured1、 b1、a2、b2, so as to calculate DUT (or AUT) insertion
The indexs such as (gain), input standing wave, output standing wave, reverse isolation are lost.By temperature measuring circuit, signal generator is by signal
Tested device is sent to, the input-output power of power sensor device under test is counted, thermometer detects device to be measured
The temperature of part.Tester can according to the test request of device and its in systems application requirement carry out various performances point
Analysis, change of such as temperature with power, S21Change with time.The design considerations of practicality is provided for device and system design.
Brief description of the drawings
Fig. 1 is the circuit diagram of the present embodiment booster output measuring circuit；
Fig. 2 is the circuit diagram of the booster output measuring circuit of another embodiment；
Fig. 3 is the circuit diagram of the present embodiment temperature measuring circuit；
Fig. 4 is the front view of the housing of the high-power parameter measurement system of the present embodiment.
Description of reference numerals：
10th, the first signal generator；
20th, treat that amplifier places port；
30th, the first load；
40th, the first coupler；
50th, the second coupler；
60th, the first digital analog converter；
70th, the second digital analog converter；
80th, micro-control unit；
90th, power meter；
100th, secondary signal generator；
110th, tested device places port；
120th, the 3rd coupler；
130th, the 4th coupler；
140th, the first power sensor；
150th, the second power sensor；
160th, usb hub；
170th, thermometer；
180th, the second load；
190th, the 3rd load；
200th, the 4th load；
210th, amplifier；
220th, wave filter.
Embodiment
To describe technology contents of the present utility model, construction feature, the objects and the effects in detail, below in conjunction with implementation
Mode simultaneously coordinates accompanying drawing to be explained in detail.
The measuring principle of the utility model S parameter is：
S parameter is scattering (Scattering) parameter, is defined as under conditions of given frequency and system impedance, any
The transmission of non-ideal multiport network and reflection characteristic.
S parameter describes the response for being input to the signal of a N-port to wherein each port.In S parameter subscript
One-bit digital represents responder, and second-order digit represents excitation end.Such as S21Represent sound of the port 2 relative to the input signal of port 1
Should；S11Represent the response of input signal of the port 1 relative to port 1.In general two-port network as shown in Figure 1, it is input to
The signal of network is labeled as a, and the signal for leaving network is labeled as b.
If signal generator is connected to port 1, port 2 connects matched load, then the incidence wave of two-port network is a1, from net
The back wave that network returns to port 1 is b1；Signal by network to port 2 is b2, the back wave for returning to network from load is a2
(for matched load, zero) this back wave numerical value be.The S parameter of the port 1 defined with these voltage waves is：
Wherein S11Represent when port 2 connects matched load, the voltage reflection coefficient of port 1；S21Represent when port 2 connects
During with load, the transmission coefficient from port 1 to port 2, i.e. gain or loss.
Signal generator is moved on to port 2, and port 1 connects matched load, then the incidence wave of two-port network is a2, from net
The back wave that network returns to port 2 is b2；Signal by network to port 1 is b1, the back wave for returning to network from load is b2。
The S parameter of the port 2 defined with these voltage waves is：
Wherein S22Represent when port 1 connects matched load, the voltage reflection coefficient of port 2；S12Represent when port 1 connects
During with load, the transmission coefficient from port 2 to port 1, i.e. reverse isolation or loss.
If measuring S11, we can be to the Injection Signal of port 1 and the reflected signal of measurement port 1, in this case, end
Mouth 2 is no signal input, so in formula 1.1, a2=0.If measuring S21, then to the Injection Signal of port 1, and measure
Appear in the signal of port 2.Equally, S is measured22When, can now it be held to the Injection Signal of port 2 and the reflected signal of measurement port 2
Mouth 1 is inputted without signal, so in formula 1.3, a1=0.If measuring S12, then to the Injection Signal of port 2, and appearance is measured
Signal in port 1.
Refer to Fig. 1 and Fig. 2, a kind of high-power parameter measurement system of the utility model, including booster output measurement
Circuit, temperature measuring circuit；The booster output measuring circuit includes the first signal generator 10, treats that amplifier places end
Mouth 20, first loads the 30, first coupler 40, the second coupler 50, the first digital analog converter 60, the second digital analog converter 70
And micro-control unit 80, first signal generator is by the first coupler with treating that amplifier places one end phase of port
Connection, the other end for treating amplifier placement port is connected by the second coupler with the first load, first coupling
Clutch is connected with the first digital analog converter, and second coupler is connected with the second digital analog converter, the microcontroller list
Member is connected with the first digital analog converter, the second digital analog converter respectively, and micro-control unit is used for the data-signal that will be collected into
Analysis of outside data end is sent to be handled and analyzed；
As shown in Figure 1 and Figure 2, in the present embodiment, first coupler and the second coupler pass through power meter and respectively
One digital analog converter, the second digital analog converter are connected.The quantity of digital analog converter is four, and the quantity of power meter 90 is also four
Individual, the first coupler is connected by two power meters with the cooperation of two digital analog converters with micro-control unit respectively, and second
Coupler is also connected by two power meters with the cooperation of two digital analog converters with micro-control unit respectively.Difference corresponding amount
Survey a of S parameter1、b1、a2、 b2Etc. data.
Circuit in Fig. 1 is the S for detecting device under test11、S21Circuit, the circuit in Fig. 2 is treated for detection
Survey the S of device22、S12Circuit.Likewise, the circuit in Fig. 3, can also enter secondary signal generator with the position loaded
Row is exchanged, and detects related S22、S12Parameter.The present embodiment can detect the related data of S parameter according to actual demand,
Meet the various demands of circuit design.
As shown in figure 3, in the present embodiment, the temperature measuring circuit includes secondary signal generator 100, tested device
Place port 110, the 3rd coupler 120, the 4th coupler 130, the first power sensor 140, the second power sensor 150,
Usb hub 160, the load 190 of the load of thermometer 170, second the 180, the 3rd and the 4th load 200, the secondary signal hair
Raw device is connected by the 3rd coupler with one end that tested device places port, and the tested device places the another of port
One end is connected by the 4th coupler with the 4th load, the 3rd coupler respectively with the first power sensor, second negative
Load is connected, and the 4th coupler is connected with the second power sensor, the 3rd load respectively, the usb hub difference
It is connected with the first power sensor, the second power sensor, usb hub is outer for the data-signal being collected into be sent to
Portion data analysis end is handled and analyzed；
The thermometer is arranged on tested device, the temperature for detecting tested device.
As shown in figure 3, the temperature measuring circuit also includes amplifier 210, wave filter 220, the secondary signal occurs
Device is connected with amplifier, and the amplifier is connected with wave filter, and the wave filter is connected with the 3rd coupler.
As shown in figure 4, in the present embodiment, in addition to housing, the booster output measuring circuit, temperature measuring circuit are set
Put in housing.
The index of correlation and its annex of the present embodiment are specifically described, and radio frequency interface is DIN716 (f), and control interface is
USB2.0, power supply is powered for USB, 80mA/5V, and operating temperature range is 0~+50 DEG C, and shell dimension (W × H × D) is 483mm
(W)×89mm(H)×360mm(D)；Including large power test cable, Nm-DIN716m, 1 meter, test cable, 3GHz, Nm-Nm,
1 meter, rf adapter, DIN716 (m)-N (f), thermometer, usb signal source, 0.5-2.2GHz, N, usb signal source, 1-4GHz,
N, radio-frequency power amplifier, 0.82-0.96GHz, 49dBm, radio-frequency power amplifier, 1.8-2.2GHz, 49dBm and load,
150W,4GHz,N(f)。
The present embodiment has following functions：
1st, S of the measurement power amplifier under different capacity grade11
When the input power change of amplifier, it inputs VSWR can also change therewith, and this change will influence amplification
Device is matched with previous stage circuit.
The present embodiment can with measuring amplifier under different capacity grade S11, final testing result can help designer to understand
Relevant parameter in the input characteristics of amplifier, correct design system.
2nd, power amplifier gain and its variable quantity in different output power are measured
Gain of the power amplifier in different output power can be easily and intuitively measured with the present embodiment, so that it is determined that
The P1dB power outputs of amplifier, can also provide design considerations for the automatic growth control of system.
3rd, S of the measurement passive device under different capacity grade21Parameter and its variable quantity
When passive device is operated under high-power state, its insertion loss (S21) can change.Such as a 50W/
30dB fixed attenuator, when input power increases from zero to 50W, its attenuation may change 1.1dB, testing and surveying
Occasion is measured, this error is very important；Other examples have micro belt board, the ferrite isolator for power amplifier
Deng.
4th, assess the change of passive device temperature under powerful continuous action and burn analysis
When passive device is operated under the critical condition of rated power, its temperature can gradually rise, if design is improper,
There may be burn phenomenon for passive device.
The present embodiment can be according to different judgment criteria (such as S21Variable quantity) come measure and record DUT temperature with
Power and the change of time, and final burn-through analysis.This functionality of the present embodiment contributes to passive large power assembly to design
The correct selection and assessment of middle material.
5th, measure and analyze the temperature and its variable quantity of power amplifier
The present embodiment, which can provide multiple temperature sensors, to be come while the temperature at each position of power amplifier is detected, for amplification
The heat dissipation design of device provides foundation.
6th, S of the measurement power amplifier under different output power grade22(Hot S22)
This functionality has great significance for the design and debugging of radio-frequency power amplifier.Power amplifier is in difference
Power output grade under, its export S22It is different, its variable quantity of correct measurement, contributes to amplifier output matching circuit
Correct design, to improve the job stability and efficiency of amplifier.
During use, principle of the present embodiment according to S parameter can measure four of the S parameters under high-power state
Individual key element a1、b1、a2、b2, so that calculate DUT (or AUT) insertion loss (gain), input standing wave, output standing wave, reversely
The indexs such as isolation.In addition, the present embodiment is also equipped with temperature survey and efficiency measurement function, can be that device and system design provide real
Design considerations.Tester can according to the test request of device and its in systems application requirement carry out various performances
Analysis, change of such as temperature with power, S21Change with time.
Embodiment of the present utility model is the foregoing is only, scope of patent protection of the present utility model is not thereby limited,
The equivalent structure transformation that every utilization the utility model specification and accompanying drawing content are made, or directly or indirectly it is used in other phases
The technical field of pass, is similarly included in scope of patent protection of the present utility model.
Claims (4)
1. a kind of high-power parameter measurement system, it is characterised in that：Including booster output measuring circuit, temperature measuring circuit；
The booster output measuring circuit includes the first signal generator, treats that amplifier places port, the first load, first
Coupler, the second coupler, the first digital analog converter, the second digital analog converter and micro-control unit, the first signal hair
Device is given birth to by the first coupler with treating that one end of amplifier placement port is connected, it is described to treat that amplifier places the another of port
One end is connected by the second coupler with the first load, and first coupler is connected with the first digital analog converter, described
Second coupler is connected with the second digital analog converter, the micro-control unit respectively with the first digital analog converter, the second digital-to-analogue
Converter is connected, and micro-control unit is handled with being divided for the data-signal being collected into be sent into analysis of outside data end
Analysis；
The temperature measuring circuit includes secondary signal generator, tested device and places port, the 3rd coupler, the 4th coupling
Device, the first power sensor, the second power sensor, usb hub, thermometer, the second load, the 3rd load and the 4th are negative
Carry, the secondary signal generator is connected by the 3rd coupler with one end that tested device places port, described to be measured
The other end that examination device places port is loaded with the 4th by the 4th coupler and is connected, and the 3rd coupler is respectively with first
Power sensor, the second load are connected, and the 4th coupler is connected with the second power sensor, the 3rd load respectively,
The usb hub is connected with the first power sensor, the second power sensor respectively, and usb hub is used to be collected into
Data-signal be sent to analysis of outside data end and handled and analyzed；
The thermometer is arranged on tested device, the temperature for detecting tested device.
2. high-power parameter measurement system according to claim 1, it is characterised in that：Also include housing, the amplifier
Power-measuring circuit, temperature measuring circuit are arranged in housing.
3. high-power parameter measurement system according to claim 1, it is characterised in that：First coupler and the second coupling
Clutch is connected by power meter with the first digital analog converter, the second digital analog converter respectively.
4. high-power parameter measurement system according to claim 1, it is characterised in that：The temperature measuring circuit also includes
Amplifier, wave filter, the secondary signal generator are connected with amplifier, and the amplifier is connected with wave filter, described
Wave filter is connected with the 3rd coupler.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201720151852.XU CN206583987U (en) | 2017-02-20 | 2017-02-20 | A kind of high-power parameter measurement system |
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| CN201720151852.XU CN206583987U (en) | 2017-02-20 | 2017-02-20 | A kind of high-power parameter measurement system |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108132384A (en) * | 2017-12-26 | 2018-06-08 | 北京无线电计量测试研究所 | A kind of device for generating standard nonlinear S parameter |
| CN111579874A (en) * | 2020-03-31 | 2020-08-25 | 杭州电子科技大学 | Thermal state impedance test system of high reflectance device |
| CN116430146A (en) * | 2023-04-17 | 2023-07-14 | 深圳市万兆通光电技术有限公司 | S parameter automatic measurement method and system based on loss factor |
-
2017
- 2017-02-20 CN CN201720151852.XU patent/CN206583987U/en active Active
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108132384A (en) * | 2017-12-26 | 2018-06-08 | 北京无线电计量测试研究所 | A kind of device for generating standard nonlinear S parameter |
| CN108132384B (en) * | 2017-12-26 | 2020-08-07 | 北京无线电计量测试研究所 | Device for generating standard nonlinear S parameter |
| CN111579874A (en) * | 2020-03-31 | 2020-08-25 | 杭州电子科技大学 | Thermal state impedance test system of high reflectance device |
| CN116430146A (en) * | 2023-04-17 | 2023-07-14 | 深圳市万兆通光电技术有限公司 | S parameter automatic measurement method and system based on loss factor |
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