CN110174633A - A kind of measurement method of device parameters, system and terminal device - Google Patents
A kind of measurement method of device parameters, system and terminal device Download PDFInfo
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- CN110174633A CN110174633A CN201910439434.4A CN201910439434A CN110174633A CN 110174633 A CN110174633 A CN 110174633A CN 201910439434 A CN201910439434 A CN 201910439434A CN 110174633 A CN110174633 A CN 110174633A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
Abstract
The present invention provides the measurement method of device parameters, system and terminal devices, method includes: the error parameter of the measurement data and load balance factor measuring system that obtain device under test, and the measurement data is the voltage wave that the internal receipt machine of vector network analyzer in the load balance factor measuring system is measured based on the device under test；Using the error parameter of the measurement data and the load balance factor measuring system, the parameter of the device under test is calculated.The real-time measuring data that device under test is measured by obtaining vector network analyzer, can calculate the parameter of device under test in real time, do not influenced by the mechanical repeatability of impedance tuner, improve the accuracy of measurement of the parameter of device under test.
Description
Technical field
The invention belongs to technical field of semiconductors more particularly to a kind of measurement method of device parameters, system and terminal to set
It is standby.
Background technique
Current load balance factor measuring system needs to use vector in self-calibration process due to its measurement model
Network Analyzer carries out pre-characterised to the source at each frequency point, load impedance state, software inhouse is then stored in, to actual test mistake
Impedance tuner is configured under identical impedance state, and canned data is recalled by Cheng Zhongzai.Currently, using load balance factor
Measuring system device under test measures, since the machinery repeatability of load balance factor measuring system influences very measuring accuracy
Greatly, the measurement inaccuracy for leading to load balance factor measuring system device under test, leads to the parameter of the device under test finally calculated not
Accurately.
Summary of the invention
In view of this, the embodiment of the invention provides a kind of measurement method of device parameters, system and terminal device, with solution
The problem of the parameter measurement inaccuracy of certainly current device.
The first aspect of the embodiment of the present invention provides a kind of measurement method of device parameters, comprising: obtains device under test
Measurement data and load balance factor measuring system error parameter, the measurement data be the load balance factor measuring system in swear
The voltage wave that the internal receipt machine of amount Network Analyzer is measured based on the device under test；
Using the error parameter of the measurement data and the load balance factor measuring system, the ginseng of the device under test is calculated
Number.
The second aspect of the embodiment of the present invention provides a kind of terminal device, including memory, processor and is stored in
In the memory and the computer program that can run on the processor, when the processor executes the computer program
The step of realizing the measurement method of device parameters as described above.
The third aspect of the embodiment of the present invention provides a kind of system, comprising: vector network analyzer, source termination impedance allotment
Device, load end impedance tuner, source dual directional coupler, load end dual directional coupler and above-described terminal device；
The first end of the source termination impedance tuner is for connecting source signal source, and the second of the source termination impedance tuner
End connects the first end of the source dual directional coupler, the second end of the source dual directional coupler be directly connected to it is coaxial or
Waveguide device under test, or the first probe of connection, first probe is for connecting device under test；
The first end of the load end impedance tuner is for connecting load end signal source, the load end impedance tuner
Second end connect the first end of the load end dual directional coupler, the second end of the load end dual directional coupler is direct
Coaxial or waveguide device under test, or the second probe of connection are connected, second probe is for connecting device under test；
The third end and the 4th end of the source dual directional coupler, the third end of the load end dual directional coupler and
4th end is separately connected the port of four internal receipt machines of the vector network analyzer；
The terminal device is connected with the vector network analyzer.
The fourth aspect of the embodiment of the present invention provides a kind of computer readable storage medium, the computer-readable storage
Media storage has computer program, and the computer program realizes the measurement side of device parameters as described above when being executed by processor
The step of method.
The present invention by obtain vector network analyzer measure device under test real-time measuring data, can calculate in real time to
The parameter of device is surveyed, is not influenced by the mechanical repeatability of impedance tuner, improves the accuracy of measurement of the parameter of device under test.
Detailed description of the invention
It to describe the technical solutions in the embodiments of the present invention more clearly, below will be to embodiment or description of the prior art
Needed in attached drawing be briefly described, it should be apparent that, the accompanying drawings in the following description is only of the invention some
Embodiment for those of ordinary skill in the art without any creative labor, can also be according to these
Attached drawing obtains other attached drawings.
Fig. 1 is the flow diagram of the measurement method for the device parameters that one embodiment of the present of invention provides；
Fig. 2 is the structural schematic diagram for the 8-term SYSTEM ERROR MODEL that one embodiment of the present of invention provides；
Fig. 3 is the structural schematic diagram for the input reflection coefficient measurement model that one embodiment of the present of invention provides；
Fig. 4 is the structural schematic diagram for the output end load reflection coefficient measurement model that one embodiment of the present of invention provides；
The structural schematic diagram of measurement of output end model when the calibration of power that Fig. 5 provides for one embodiment of the present of invention；
Fig. 6 is the structural schematic diagram for the system that one embodiment of the present of invention provides；
The structural schematic diagram of terminal device in the system that Fig. 7 provides for one embodiment of the present of invention；
Fig. 8 be another embodiment of the present invention provides system structural schematic diagram；
Fig. 9 is the schematic diagram for the terminal device that one embodiment of the present of invention provides.
Wherein: 1, vector network analyzer；2, source termination impedance tuner；3, load end impedance tuner；4, source is double fixed
To coupler；5, load end dual directional coupler；6, device under test；7, the first source isolator；8, the first source attenuator；9,
Source amplifier；10, the second source isolator；11, the second source attenuator；12, third source attenuator；13, the second load
Hold attenuator；14, third load end attenuator；15, the first load end isolator；16, the first load end attenuator；17, phase shift
Device；18, load end amplifier；19, circulator；20, power meter；21, terminal device；110, source connects circuit；120, it loads
End connection circuit.
Specific embodiment
In being described below, for illustration and not for limitation, the tool of such as particular system structure, technology etc is proposed
Body details, to understand thoroughly the embodiment of the present invention.However, it will be clear to one skilled in the art that there is no these specific
The present invention also may be implemented in the other embodiments of details.In other situations, it omits to well-known system, device, electricity
The detailed description of road and method, in case unnecessary details interferes description of the invention.
Description and claims of this specification and term " includes " and other any deformations in above-mentioned attached drawing are
Refer to " including but not limited to ", it is intended that cover and non-exclusive include.Such as the process, method comprising a series of steps or units
Or system, product or equipment are not limited to listed step or unit, but optionally further comprising the step of not listing
Or unit, or optionally further comprising other step or units intrinsic for these process, methods, product or equipment.In addition, art
Language " first ", " second " and " third " etc. is for distinguishing different objects, not for description particular order.
In order to illustrate technical solutions according to the invention, the following is a description of specific embodiments.
Embodiment 1:
Fig. 1 shows the implementation flow chart of the measurement method of device parameters provided by one embodiment of the invention, in order to just
In explanation, only parts related to embodiments of the present invention are shown, and details are as follows:
As shown in Figure 1, a kind of measurement method of device parameters provided by the embodiment of the present invention, comprising:
S101 obtains the measurement data of device under test and the error parameter of load balance factor measuring system, the measurement data
The voltage measured for the internal receipt machine of vector network analyzer in the load balance factor measuring system based on the device under test
Wave；
S102 calculates the device to be measured using the error parameter of the measurement data and the load balance factor measuring system
The parameter of part.
In the present embodiment, measurement data is the internal receipt of vector network analyzer in the load balance factor measuring system
The real-time voltage wave that machine is measured based on the device under test.
In an embodiment of the present invention, before S101 further include:
S1101 obtains the calibration parameter of the load balance factor measuring system and the error parameter of vector network analyzer, institute
Stating calibration parameter is to calibrate the load balance factor measuring system based on preset measurement model to obtain；
S1102 obtains the load balance factor using the error parameter of the calibration parameter and the vector network analyzer
The error parameter of measuring system.
In an embodiment of the present invention, the error parameter of vector network analyzer includes e00, e11, e01e10, e22, e33,
E23e32, e10e32；
The error parameter of the vector network analyzer is to calibrate the vector network analyzer using calibration component to obtain 8-
After term error model, e is obtained00, e11, e01e10, e22, e33, e23e32, e10e32。
As shown in Fig. 2, in the present embodiment, by being analyzed in piece vector error model routine, inside arrow net
8-term error model is established between receiver and measured piece (can be by 12-term solution or direct solution 8-term error mould
Type), X and Y are error quadrilateral, the error parameter in 8-term error model, not with the change of source/load end impedance tuner
And change, change is the voltage wave a for swearing net internal receipt machine and measuring in real time1m, b1m, a2m, b2m。
In an embodiment of the present invention, the error parameter of load balance factor measuring system includes e00, e11, e01e10, e22,e33,
e23e32, e10e32,|e32|2With | e10|2。
In an embodiment of the present invention, S1102 includes:
S2201 is based on e11, surveyed according to measurement of output end model when the preset calibration of power and preset input reflection coefficient
Model is measured, is obtained | e10|2；
S2202 is based on e10e32, according to preset measurement of output end model, obtain | e32|2, can also be according to the 8-term
Error model, in conjunction with described | e10|2Obtain | e32|2。
In an embodiment of the present invention, S2201 includes:
Such as Fig. 4 and Fig. 5, measurement of output end model can be equivalent to measurement of output end model and output end when the calibration of power
Load reflection coefficient measurement model two independent single port models.
When probe end connects straight-through Thru, and the output termination power meter of load terminal impedance allotment carries out the calibration of power, by
The letter flow figure of input reflection coefficient measurement model shown in Fig. 3,
It can obtain,
Wherein,The voltage of the receiver measurement at the third end of connection source dual directional coupler when for the calibration of power
Wave；a1To lead directly to input terminal input voltage wave；b1To lead directly to input terminal reflected voltage wave；It is straight for load termination power timing
The input reflection coefficient of logical input terminal.
In the present embodiment, a1For the voltage wave for leading directly to input port 1；b1For the voltage wave for leading directly to input port 4.Port 1
For the first probe and straight-through junction, port 4 is the second end (namely output end) and first of source dual directional coupler
The junction of probe.
As shown in Figure 5 when the calibration of power shown in the flow chart of measurement of output end model,
bt=S22cat+S21cb2；
|bt|2(1-|Γpm|2)=PCAL；
When connecting pass-through state,
It can obtain,
Wherein, btFor power meter input voltage wave；S22cFor the output reflection for exporting probe end face and power meter connecting end surface
Coefficient；atFor power meter end face reflection voltage wave；S21cSystem is reflected for the transmission of output probe end face and power meter connecting end surface
Number；b2To lead directly to output voltage wave；ΓpmFor the reflection coefficient of power meter probe；PCALThe reading of power meter when for the calibration of power；To lead directly to output voltage wave when the calibration of power.
In an embodiment of the present invention, S2202 includes:
When calibration, the letter flow figure of output end load reflection coefficient measurement model, can be obtained as shown in Figure 4
Wherein,The electricity of the receiver measurement at the third end of connection load end dual directional coupler when for the calibration of power
Press wave；The voltage wave of the receiver measurement at the 4th end of connection load end dual directional coupler when for the calibration of power；
To lead directly to output voltage wave when the calibration of power；
At this time it should be noted that | e32|2Also it can be solved by following formula:
In an embodiment of the present invention, the calibration parameter of load balance factor measuring system includesCompany when for the calibration of power
The voltage wave of the receiver measurement at the third end of source dual directional coupler is connect,For the straight-through input of load termination power timing
The input reflection coefficient at end, btFor power meter input voltage wave, S22cFor the output for exporting probe end face and power meter connecting end surface
Reflection coefficient；atFor power meter end face reflection voltage wave；S21cIt is reflected for the transmission of output probe end face and power meter connecting end surface
Coefficient, ΓpmFor the reflection coefficient of power meter probe；PCALThe reading of power meter when for the calibration of power；It is straight when for the calibration of power
Logical output voltage wave.
In an embodiment of the present invention, S102 includes:
S201, according to preset input reflection coefficient measurement model, the systematic error parameter and the measurement data, meter
Calculate the input reflection coefficient of device under test；
S202, according to preset output end load reflection coefficient measurement model, the systematic error parameter and the measurement
Data calculate the load reflection coefficient of device under test；
S203, according to the input reflection coefficient of the systematic error parameter, the measurement data and the device under test, meter
Calculate the input power of device under test；
S204, according to the load reflection coefficient of the systematic error parameter, the measurement data and device under test, calculate to
Survey the output power of device；
S205 calculates power gain according to the output power of the input power of the device under test and the device under test.
In an embodiment of the present invention, S201 includes:
It can derive
Wherein,Vector network analyzer internal receipt machine b when to place measured piece1m/a1m；ΓinFor device under test
Input reflection coefficient；a1For device under test input terminal input voltage wave；b1For device under test input terminal reflected voltage wave；a1mTo survey
The voltage wave of the receiver measurement at the third end of source dual directional coupler is connected when amount；b1mTo connect source amphiorentation when measurement
The voltage wave of the receiver measurement at the 4th end of coupler.
In an embodiment of the present invention, S202 includes:
Wherein, ΓLFor the load reflection coefficient of device under test；a2mThe of connection load end dual directional coupler when for measurement
The voltage wave of the receiver measurement at four ends；b2mIt is measured to connect the receiver at the third end of load end dual directional coupler when measurement
Voltage wave；a2For device under test output end input voltage wave；b2For device under test output end output voltage wave；e22, e33, e23,
e32For output end error parameter,
In the present embodiment, a2For the voltage wave of device under test output port 2.
In an embodiment of the present invention, S203 includes:
When accessing measured device, that is, when testing, the signal flow diagram of input reflection coefficient measurement model can as shown in Figure 3
Know,
a1me10+b1e11=a1；
Wherein, PinFor the input power of device under test.
In an embodiment of the present invention, S204 includes:
When probe end connects device under test, that is, tests, when being tested as Fig. 4 shown in measurement of output end model；
b2m=e33a2m+e32b2；
Wherein, PLFor the output power of device under test.
In an embodiment of the present invention, S205 includes:
Wherein, GOPFor power gain.
It should be understood that the size of the serial number of each step is not meant that the order of the execution order in above-described embodiment, each process
Execution sequence should be determined by its function and internal logic, the implementation process without coping with the embodiment of the present invention constitutes any limit
It is fixed.
Embodiment 2:
As shown in fig. 6, the system that one embodiment of the present of invention provides comprising:
Vector network analyzer 1, source termination impedance tuner 2, load end impedance tuner 3, source dual directional coupler 4,
Load end dual directional coupler 5 and terminal device 21；
The first end of the source termination impedance tuner 2 is for connecting source signal source, and the of the source termination impedance tuner 2
Two ends connect the first end of the source dual directional coupler 4, and the second end connection first of the source dual directional coupler 4 is visited
Needle, first probe is for connecting device under test 6；
The first end of the load end impedance tuner 3 is for connecting load end signal source, the load terminal impedance allotment
The second end of device 3 connects the first end of the load end dual directional coupler 5, and the second of the load end dual directional coupler 5
The second probe of end connection, second probe is for connecting device under test 6；
The third end of the source dual directional coupler 4 and the third end at the 4th end, the load end dual directional coupler 5
The port of four internal receipt machines of the vector network analyzer 1 is separately connected with the 4th end.
The terminal device 21 is connected with the vector network analyzer 1.
As shown in fig. 7, the terminal device 21 is used to execute the method and step in embodiment corresponding to Fig. 1, terminal is set
Standby 21 include: data acquisition module 2100 and computing module 2200；
Data acquisition module 2100, for obtaining the measurement data of device under test and the error ginseng of load balance factor measuring system
Number, the measurement data are the internal receipt machine of vector network analyzer in the load balance factor measuring system based on described to be measured
The voltage wave of device measurement；
Computing module 2200, for the error parameter using the measurement data and the load balance factor measuring system, meter
Calculate the parameter of the device under test.
In an embodiment of the present invention, the first end of the first end of source termination impedance tuner 2 and load end impedance tuner 3
It can be connected respectively with vector network analyzer 1, provide source signal and load end by 1 internal signal sources of vector network analyzer
Signal.
It further include source signal source device and load end signal source device as shown in figure 8, in an embodiment of the present invention,
The first end of source termination impedance tuner 2 is connected with source signal source device, the first end and load end of load end impedance tuner 3
Signal source device is connected.
It in an embodiment of the present invention, further include that source connection circuit 110, the second source attenuator 11 and third source decline
Subtract device 12；
The source termination impedance tuner 2 connects circuit 110 by the source and connects the source signal source, wherein source
The first end of the impedance tuner at end connects the second end of source connection circuit 110, and the of the source connection circuit 110
One end is for connecting source signal source；
Wherein, the source connection circuit 110 includes: the first source isolator 7, the first source attenuator 8, source amplification
Device 9 and the second source isolator 10；
The first end of the first source isolator 7 is the first end that the source connects circuit 110, for connecting source
Signal source；The second end of the first source isolator 7 connects the first end of the first source attenuator 8, first source
The second end of end attenuator 8 connects the first end of the source amplifier 9；Described in the second end connection of the source amplifier 9
The first end of second source isolator 10, the second end of the second source isolator 10 are that the source connects circuit 110
Second end；The first end of the second source attenuator 11 connects the third end of the source dual directional coupler 4, and described second
The port of first receiver of the inside of the second end connected vector Network Analyzer 1 of source attenuator 11, the third source
The first end of attenuator 12 connects the 4th end of the source dual directional coupler 4, and the second of the third source attenuator 12
Hold the port of the second receiver of the inside of connected vector Network Analyzer 1.
As shown in figure 8, further including load end connection circuit 120, the second load end attenuator in an embodiment of the present invention
13 and third load end attenuator 14；
The load end impedance tuner 3 connects circuit 120 by the load end and connects the load end signal source,
In, the first end of the impedance tuner of load end connects the second end of the load end connection circuit 120, the load end connection
The first end of circuit 120 is for connecting load end signal source；
Wherein, load end connection circuit 120 include: the first load end isolator 15, the first load end attenuator 16,
Phase shifter 17, load end amplifier 18 and circulator 19；
The first end of the first load end isolator 15 is the first end that the load end connects circuit 120, for connecting
Connect load end signal source；The second end of the first load end isolator 15 connects the first end of the first load end attenuator 16,
The second end of the first load end attenuator 16 connects the first end of the phase shifter 17, and the second end of the phase shifter 17 connects
The first end of the load end amplifier 18 is connect, the second end of the load end amplifier 18 connects the first of the circulator 19
End, the second end of the circulator 19 are the second end that the load end connects circuit 120, and the third end of the circulator 19 connects
Load is connect, the first end of the second load end attenuator 13 connects the third end of the load end dual directional coupler 5, described
The port of third receiver inside the second end connected vector Network Analyzer 1 of second load end attenuator 13, the third
The first end of load end attenuator 14 connects the 4th end of the load end dual directional coupler 5, the third load end decaying
The port of the 4th receiver inside the second end connected vector Network Analyzer 1 of device 14.
As shown in figure 8, further including the power meter for calibration load traction measuring system in an embodiment of the present invention
20, the power meter 20 is connected with the first end of the load end impedance tuner 3.
In the present embodiment, power meter 20 measure be 3 output end of load end impedance tuner power, power meter 20
It is the use in the calibration of power, is not used when not calibrating, device under test 6 is connected as leading directly at this time；
In the calibration of power, can also be calibrated by the power at the second end of measurement source dual directional coupler 4.
In an embodiment of the present invention, it is connected with data acquisition module 2100 further include:
Parameter acquisition module, for obtaining the calibration parameter and vector network analyzer of the load balance factor measuring system
Error parameter, the calibration parameter are to calibrate the load balance factor measuring system based on preset measurement model to obtain；
Error parameter computing module, for utilizing the error parameter of the calibration parameter and the vector network analyzer,
Obtain the error parameter of the load balance factor measuring system.
In an embodiment of the present invention, the error parameter of vector network analyzer includes e00, e11, e01e10, e22, e33,
E23e32, e10e32；
The error parameter of the vector network analyzer is to calibrate the vector network analyzer using calibration component to obtain 8-
After term error model, e is obtained00, e11, e01e10, e22, e33, e23e32, e10e32。
In an embodiment of the present invention, the error parameter of load balance factor measuring system includes e00, e11, e01e10, e22,e33,
e23e32, e10e32,|e32|2With | e10|2。
In an embodiment of the present invention, error parameter computing module includes:
First computing unit, for being based on e11, according to measurement of output end model when the preset calibration of power and preset defeated
Enter measurement of reflection-factor model, obtain | e10|2；
Second computing unit, for being based on e33, according to preset measurement of output end model, obtain | e32|2；
Wherein, measurement of output end model when the calibration of power are as follows:Institute
Measurement of output end model when stating test are as follows:
Wherein,The voltage of the receiver measurement at the third end of connection source dual directional coupler when for the calibration of power
Wave；The input reflection coefficient of input terminal is led directly to for load termination power timing；S22cConnect for output probe end face and power meter
The output reflection coefficient of contact surface；S21cFor the transmission reflection coefficient for exporting probe end face and power meter connecting end surface；ΓpmFor function
The reflection coefficient of rate meter probe；PCALThe reading of power meter when for the calibration of power.
In an embodiment of the present invention, computing module 2200 includes:
Third computing unit, for according to preset input reflection coefficient measurement model, the systematic error parameter and institute
Measurement data is stated, the input reflection coefficient of device under test is calculated；
4th computing unit, for according to measurement of output end model, the systematic error parameter and institute when preset test
Measurement data is stated, the load reflection coefficient of device under test is calculated；
5th computing unit, for according to the defeated of the systematic error parameter, the measurement data and the device under test
Enter reflection coefficient, calculates the input power of device under test；
6th computing unit, it is anti-for the load according to the systematic error parameter, the measurement data and device under test
Coefficient is penetrated, the output power of device under test is calculated；
7th computing unit, for according to the input power of the device under test and the output power of the device under test,
Calculate power gain.
In an embodiment of the present invention, third computing unit includes:
Wherein, a1mTo connect the voltage wave that the receiver at the third end of source dual directional coupler measures when measurement；b1mFor
The voltage wave of the receiver measurement at the 4th end of source dual directional coupler is connected when measurement；e00, e11, e01, e10For systematic error
Parameter；a1For device under test input terminal input voltage wave；b1For device under test input terminal reflected voltage wave；ΓinFor device under test
Input reflection coefficient.
In an embodiment of the present invention, the 4th computing unit includes:
Wherein, ΓLFor the load reflection coefficient of device under test；a2mThe of connection load end dual directional coupler when for measurement
The voltage wave of the receiver measurement at four ends；b2mIt is measured to connect the receiver at the third end of load end dual directional coupler when measurement
Voltage wave；a2For device under test output end input voltage wave；b2For device under test output end output voltage wave；e22, e33, e23,
e32For systematic error parameter,
In an embodiment of the present invention, the 5th computing unit includes:
Wherein, PinFor the input power of device under test.
In an embodiment of the present invention, the 6th computing unit includes:
Wherein, PLFor the output power of device under test.
In an embodiment of the present invention, the 7th computing unit includes:
Wherein, GOPFor power gain.
It is apparent to those skilled in the art that for convenience and simplicity of description, only with above-mentioned each function
The division progress of module can according to need and for example, in practical application by above-mentioned function distribution by different function moulds
Block is completed, i.e., the internal structure of the described terminal device is divided into different functional modules, with complete it is described above whole or
Partial function.Each functional module in embodiment can integrate in one processing unit, be also possible to the independent object of each unit
Reason exists, and can also be integrated in one unit with two or more units, above-mentioned integrated module can both use hardware
Form realize, can also realize in the form of software functional units.In addition, the specific name of each functional module is also only
Convenient for mutually distinguishing, the protection scope that is not intended to limit this application.The specific work process of module in above-mentioned terminal device,
Can be with reference to the corresponding process in preceding method embodiment 1, details are not described herein.
Embodiment 3:
Fig. 9 is the schematic diagram for the terminal device that one embodiment of the invention provides.As shown in figure 9, the terminal of the embodiment is set
Standby 21 include: processor 910, memory 911 and are stored in the memory 911 and can transport on the processor 910
Capable computer program 912.The processor 910 realizes as described in example 1 above each when executing the computer program 912
Step in embodiment, such as step S101 to S102 shown in FIG. 1.Alternatively, the processor 910 executes the computer journey
The function of the terminal device in each system embodiment as described in example 2 above, such as module shown in Fig. 7 are realized when sequence 912
2100 to 2200 function.
The terminal device 21 refers to the terminal with data-handling capacity, including but not limited to computer, work station, clothes
Business device, the smart phone more even haveing excellent performance, palm PC, tablet computer, personal digital assistant (PDA), intelligence electricity
Depending on (Smart TV) etc..Operating system is generally fitted on terminal device, including but not limited to: Windows operating system,
LINUX operating system, Android (Android) operating system, Symbian operating system, Windows mobile operating system, with
And iOS operating system etc..The specific example of terminal device 21 is enumerated in detail above, and those skilled in the art will be appreciated that
It arrives, terminal device is not limited to above-mentioned enumerate example.
The terminal device may include, but be not limited only to, processor 910, memory 911.Those skilled in the art can be with
Understand, Fig. 9 is only the example of terminal device 21, does not constitute the restriction to terminal device 21, may include more than illustrating
Or less component, certain components or different components are perhaps combined, such as the terminal device 21 can also include input
Output equipment, network access equipment, bus etc..
Alleged processor 910 can be central processing unit (Central Processing Unit, CPU), can also be
Other general processors, digital signal processor (Digital Signal Processor, DSP), specific integrated circuit
(Application Specific Integrated Circuit, ASIC), ready-made programmable gate array (Field-
Programmable Gate Array, FPGA) either other programmable logic device, discrete gate or transistor logic,
Discrete hardware components etc..General processor can be microprocessor or the processor is also possible to any conventional processor
Deng.
The memory 911 can be the internal storage unit of the terminal device 21, such as the hard disk of terminal device 21
Or memory.The memory 911 is also possible to the External memory equipment of the terminal device 21, such as on the terminal device 21
The plug-in type hard disk of outfit, intelligent memory card (Smart Media Card, SMC), secure digital (Secure Digital, SD)
Card, flash card (Flash Card) etc..Further, the memory 911 can also be both interior including the terminal device 21
Portion's storage unit also includes External memory equipment.The memory 911 is for storing the computer program and the terminal
Other programs and data needed for equipment 21.The memory 911, which can be also used for temporarily storing, have been exported or will
The data of output.
Embodiment 4:
The embodiment of the invention also provides a kind of computer readable storage medium, computer-readable recording medium storage has meter
Calculation machine program is realized the step in each embodiment as described in example 1 above, such as is schemed when computer program is executed by processor
Step S101 shown in 1 to step S102.Alternatively, realizing when the computer program is executed by processor such as institute in embodiment 2
The function for the terminal device in each system embodiment stated, such as the function of module 2100 to 2200 shown in Fig. 7.
The computer program can be stored in a computer readable storage medium, and the computer program is by processor
When execution, it can be achieved that the step of above-mentioned each embodiment of the method.Wherein, the computer program includes computer program code,
The computer program code can be source code form, object identification code form, executable file or certain intermediate forms etc..Institute
State computer-readable medium may include: can carry the computer program code any entity or device, recording medium,
USB flash disk, mobile hard disk, magnetic disk, CD, computer storage, read-only memory (ROM, Read-Only Memory), arbitrary access
Memory (RAM, Random Access Memory), electric carrier signal, telecommunication signal and software distribution medium etc..
In the above-described embodiments, it all emphasizes particularly on different fields to the description of each embodiment, embodiment 1 to 4 can in any combination, group
The new embodiment formed after conjunction is also within the scope of protection of this application.There is no the portion for being described in detail or recording in some embodiment
Point, it may refer to the associated description of other embodiments.
Those of ordinary skill in the art may be aware that list described in conjunction with the examples disclosed in the embodiments of the present disclosure
Member and algorithm steps can be realized with the combination of electronic hardware or computer software and electronic hardware.These functions are actually
It is implemented in hardware or software, the specific application and design constraint depending on technical solution.Professional technician
Each specific application can be used different methods to achieve the described function, but this realization is it is not considered that exceed
The scope of the present invention.
In embodiment provided by the present invention, it should be understood that disclosed terminal device and method can pass through it
Its mode is realized.For example, system described above/terminal device embodiment is only schematical, for example, the module
Or the division of unit, only a kind of logical function partition, there may be another division manner in actual implementation, such as multiple lists
Member or component can be combined or can be integrated into another system, or some features can be ignored or not executed.Another point,
Shown or discussed mutual coupling or direct-coupling or communication connection can be through some interfaces, device or unit
INDIRECT COUPLING or communication connection, can be electrical property, mechanical or other forms.
Embodiment described above is merely illustrative of the technical solution of the present invention, rather than its limitations；Although referring to aforementioned reality
Applying example, invention is explained in detail, those skilled in the art should understand that: it still can be to aforementioned each
Technical solution documented by embodiment is modified or equivalent replacement of some of the technical features；And these are modified
Or replacement, the spirit and scope for technical solution of various embodiments of the present invention that it does not separate the essence of the corresponding technical solution should all
It is included within protection scope of the present invention.
Claims (10)
1. a kind of measurement method of device parameters characterized by comprising
The measurement data of device under test and the error parameter of load balance factor measuring system are obtained, the measurement data is the load
The voltage wave that the internal receipt machine of vector network analyzer is measured based on the device under test in traction measuring system；
Using the error parameter of the measurement data and the load balance factor measuring system, the parameter of the device under test is calculated.
2. the measurement method of device parameters as described in claim 1, which is characterized in that in the measurement data for obtaining device under test
Before the error parameter of load balance factor measuring system, further includes:
Obtain the calibration parameter of the load balance factor measuring system and the error parameter of vector network analyzer, the calibration parameter
It is to calibrate the load balance factor measuring system based on preset measurement model to obtain；
Using the error parameter of the calibration parameter and the vector network analyzer, the load balance factor measuring system is obtained
Error parameter.
3. the measurement method of device parameters as claimed in claim 2, which is characterized in that the error of the vector network analyzer
Parameter includes e00, e11, e01e10, e22, e33, e23e32, e10e32；
The error parameter of the vector network analyzer is to calibrate the vector network analyzer using calibration component to obtain 8-term
After error model, e is obtained00, e11, e01e10, e22, e33, e23e32, e10e32。
4. the measurement method of device parameters as claimed in claim 3, which is characterized in that the mistake of the load balance factor measuring system
Poor parameter includes e00, e11, e01e10, e22,e33, e23e32, e10e32, | e32|2With | e10|2；
The error parameter using the calibration parameter and the vector network analyzer, obtains load balance factor measuring system
Error parameter, comprising:
Based on e11, according to measurement of output end model when the preset calibration of power and preset input reflection coefficient measurement model, obtain
Arrive | e10|2；
Based on e33Or e10e32, according to preset measurement of output end model, obtain | e32|2；
Wherein, measurement of output end model when the calibration of power are as follows:It is described
Measurement of output end model are as follows:
Can also be by 8-term error model in conjunction with described | e10|2, it acquires,
Wherein,The voltage wave of the receiver measurement at the third end of connection source dual directional coupler when for the calibration of power；The input reflection coefficient of input terminal is led directly to for load termination power timing；S22cIt is connect for output probe end face with power meter
The output reflection coefficient of end face；S21cFor the transmission reflection coefficient for exporting probe end face and power meter connecting end surface；ΓpmFor power
Count the reflection coefficient of probe；PCALThe reading of power meter when for the calibration of power,Connection load end when for the calibration of power is double fixed
The voltage wave measured to the receiver at the third end of coupler；Connection load end dual directional coupler when for the calibration of power
The 4th end receiver measurement voltage wave；To lead directly to output voltage wave when the calibration of power.
5. the measurement method of device parameters as described in claim 1, which is characterized in that described to utilize the measurement data and institute
Systematic error parameter is stated, the parameter of device under test is calculated, comprising:
According to preset input reflection coefficient measurement model, the systematic error parameter and the measurement data, device to be measured is calculated
The input reflection coefficient of part；
According to preset measurement of output end model, the systematic error parameter and the measurement data, the negative of device under test is calculated
Carry reflection coefficient；
According to the input reflection coefficient of the systematic error parameter, the measurement data and the device under test, device to be measured is calculated
The input power of part；
According to the load reflection coefficient of the systematic error parameter, the measurement data and device under test, device under test is calculated
Output power；
According to the output power of the input power of the device under test and the device under test, power gain is calculated.
6. the measurement method of device parameters as claimed in claim 5, which is characterized in that the input for calculating device under test is anti-
Penetrate coefficient, comprising:
Wherein, a1mTo connect the voltage wave that the receiver at the third end of source dual directional coupler measures when measurement；b1mFor measurement
When connection source dual directional coupler the 4th end receiver measurement voltage wave；e00, e11, e01e10For systematic error parameter；
a1For device under test input terminal input voltage wave；b1For device under test input terminal reflected voltage wave；ΓinFor the input of device under test
Reflection coefficient；
Calculate the load reflection coefficient of device under test, comprising:
Wherein, ΓLFor the load reflection coefficient of device under test；a2mFor the 4th end for connecting load end dual directional coupler when measurement
Receiver measurement voltage wave；b2mTo connect the electricity that the receiver at the third end of load end dual directional coupler measures when measurement
Press wave；a2For device under test output end input voltage wave；b2For device under test output end output voltage wave；e22, e33, e23e32For
Systematic error parameter,
The input power for calculating device under test, comprising:
Wherein, PinFor the input power of device under test；
Calculate the output power of device under test, comprising:
Wherein, PLFor the output power of device under test.
7. the measurement method of device parameters as claimed in claim 6, which is characterized in that the calculating power gain, comprising:
Wherein, GOPFor power gain.
8. a kind of terminal device, which is characterized in that in the memory and can be in institute including memory, processor and storage
The computer program run on processor is stated, the processor realizes such as claim 1 to 7 times when executing the computer program
The step of measurement method of one device parameters.
9. a kind of system characterized by comprising vector network analyzer, source termination impedance tuner, load terminal impedance allotment
Device, source dual directional coupler, load end dual directional coupler and terminal device as claimed in claim 8；
The first end of the source termination impedance tuner connects for connecting source signal source, the second end of the source termination impedance tuner
The first end of the source dual directional coupler is connect, the second end of the source dual directional coupler is directly connected to coaxial or waveguide
Device under test, or the first probe of connection, first probe is for connecting device under test；
The first end of the load end impedance tuner is for connecting load end signal source, and the of the load end impedance tuner
Two ends connect the first end of the load end dual directional coupler, and the second end of the load end dual directional coupler is directly connected to
Coaxial or waveguide device under test, or the second probe of connection, second probe is for connecting device under test；
The third end of the source dual directional coupler and the third end and the 4th at the 4th end, the load end dual directional coupler
End is separately connected the port of four internal receipt machines of the vector network analyzer；
The terminal device is connected with the vector network analyzer.
10. a kind of computer readable storage medium, which is characterized in that the computer-readable recording medium storage has computer journey
Sequence realizes the measurement method of the device parameters as described in any one of claim 1 to 7 when the computer program is executed by processor
The step of.
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110806555A (en) * | 2019-11-14 | 2020-02-18 | 中电科仪器仪表有限公司 | Method for improving reflection parameter measurement capability of through-type power meter |
| CN110855260A (en) * | 2019-10-25 | 2020-02-28 | 中国电子科技集团公司第十三研究所 | Load adjusting method and device in transmission network and terminal equipment |
| CN111025213A (en) * | 2019-11-27 | 2020-04-17 | 中国电子科技集团公司第十三研究所 | Method for measuring traction output power of on-chip load and terminal equipment |
| CN111025214A (en) * | 2019-11-27 | 2020-04-17 | 中国电子科技集团公司第十三研究所 | Method for obtaining power calibration model and terminal equipment |
| CN113899998A (en) * | 2021-09-03 | 2022-01-07 | 深圳供电局有限公司 | IGBT parameter testing method and device, computer equipment and storage medium |
| CN114035016A (en) * | 2021-11-23 | 2022-02-11 | 河北博威集成电路有限公司 | Power device transmission parameter determination method, device, terminal and storage medium |
Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1296148A1 (en) * | 2001-09-25 | 2003-03-26 | Agilent Technologies, Inc. (a Delaware corporation) | An apparatus for collecting signal measurement data at signal ports of an RF and microwave device-under-test |
| US20090174415A1 (en) * | 2008-01-05 | 2009-07-09 | Jan Verspecht | Method for Calibrating a Real-Time Load-Pull System |
| CN103576071A (en) * | 2013-11-22 | 2014-02-12 | 中国电子科技集团公司第四十一研究所 | Precise representation method of matching characteristics of power transistor |
| CN105846784A (en) * | 2016-03-21 | 2016-08-10 | 天津大学 | Design method for GaN HEMT multistage radio frequency power amplifier and amplifier |
| CN106932701A (en) * | 2017-03-31 | 2017-07-07 | 成都海威华芯科技有限公司 | A kind of Performance Characteristics method of testing of Microwave Power Tubes |
| CN108268705A (en) * | 2017-12-30 | 2018-07-10 | 中国电子科技集团公司第十三研究所 | Microwave circuit Building Nonlinear Model method, measuring system and terminal device |
| CN108614152A (en) * | 2016-12-09 | 2018-10-02 | 中国科学院苏州纳米技术与纳米仿生研究所 | The measurement method of the input end face power of load balance factor system and its measured piece |
| CN109444786A (en) * | 2018-12-13 | 2019-03-08 | 中国电子科技集团公司第十三研究所 | Improve the method, system and terminal device in piece load balance factor accuracy of measurement |
| CN109444721A (en) * | 2018-12-19 | 2019-03-08 | 中国电子科技集团公司第十三研究所 | Detect the method and terminal device of S parameter |
| CN109581259A (en) * | 2018-11-22 | 2019-04-05 | 南京中电芯谷高频器件产业技术研究院有限公司 | The calibration structure design and test method that device is tested in piece load balance factor |
-
2019
- 2019-05-24 CN CN201910439434.4A patent/CN110174633B/en active Active
Patent Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1296148A1 (en) * | 2001-09-25 | 2003-03-26 | Agilent Technologies, Inc. (a Delaware corporation) | An apparatus for collecting signal measurement data at signal ports of an RF and microwave device-under-test |
| US6812714B2 (en) * | 2001-09-25 | 2004-11-02 | Agilent Technologies, Inc. | Apparatus for collecting signal measurement data at signal ports of an RF and microwave device-under-test, under different impedance load conditions |
| US20090174415A1 (en) * | 2008-01-05 | 2009-07-09 | Jan Verspecht | Method for Calibrating a Real-Time Load-Pull System |
| CN103576071A (en) * | 2013-11-22 | 2014-02-12 | 中国电子科技集团公司第四十一研究所 | Precise representation method of matching characteristics of power transistor |
| CN105846784A (en) * | 2016-03-21 | 2016-08-10 | 天津大学 | Design method for GaN HEMT multistage radio frequency power amplifier and amplifier |
| CN108614152A (en) * | 2016-12-09 | 2018-10-02 | 中国科学院苏州纳米技术与纳米仿生研究所 | The measurement method of the input end face power of load balance factor system and its measured piece |
| CN106932701A (en) * | 2017-03-31 | 2017-07-07 | 成都海威华芯科技有限公司 | A kind of Performance Characteristics method of testing of Microwave Power Tubes |
| CN108268705A (en) * | 2017-12-30 | 2018-07-10 | 中国电子科技集团公司第十三研究所 | Microwave circuit Building Nonlinear Model method, measuring system and terminal device |
| CN109581259A (en) * | 2018-11-22 | 2019-04-05 | 南京中电芯谷高频器件产业技术研究院有限公司 | The calibration structure design and test method that device is tested in piece load balance factor |
| CN109444786A (en) * | 2018-12-13 | 2019-03-08 | 中国电子科技集团公司第十三研究所 | Improve the method, system and terminal device in piece load balance factor accuracy of measurement |
| CN109444721A (en) * | 2018-12-19 | 2019-03-08 | 中国电子科技集团公司第十三研究所 | Detect the method and terminal device of S parameter |
Non-Patent Citations (5)
| Title |
|---|
| C. CHARBONNIAUD等: "VNA Based Load Pull Harmonic Measurement De-embedding Dedicated to Waveform Engineering", 《IEEE INTERNATIONAL CONFERENCE ON MICROWAVES, COMMUNICATIONS, ANTENNAS AND ELECTRONIC SYSTEMS》 * |
| VALERIA TEPPATI等: "Accuracy Improvement of Real-Time Load-Pull Measurements", 《IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT》 * |
| Y. ROLAIN等: "A VNA based broadband load-pull for non-parametric 2-port Best Linear Approximation Modeling", 《IEEE》 * |
| Z. MOKHTI等: "Correlation Analysis between a VNA-based Passive Load Pull System and an Oscilloscope-based Active Load Pull System: A Case Study", 《IEEE》 * |
| 邢靖等: "基于负载牵引测试系统的功率管参数提取", 《微波学报》 * |
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110855260A (en) * | 2019-10-25 | 2020-02-28 | 中国电子科技集团公司第十三研究所 | Load adjusting method and device in transmission network and terminal equipment |
| CN110806555A (en) * | 2019-11-14 | 2020-02-18 | 中电科仪器仪表有限公司 | Method for improving reflection parameter measurement capability of through-type power meter |
| CN110806555B (en) * | 2019-11-14 | 2021-10-15 | 中电科思仪科技股份有限公司 | Method for improving reflection parameter measurement capability of through-type power meter |
| CN111025213A (en) * | 2019-11-27 | 2020-04-17 | 中国电子科技集团公司第十三研究所 | Method for measuring traction output power of on-chip load and terminal equipment |
| CN111025214A (en) * | 2019-11-27 | 2020-04-17 | 中国电子科技集团公司第十三研究所 | Method for obtaining power calibration model and terminal equipment |
| CN111025213B (en) * | 2019-11-27 | 2022-04-01 | 中国电子科技集团公司第十三研究所 | Method for measuring traction output power of on-chip load and terminal equipment |
| CN111025214B (en) * | 2019-11-27 | 2022-06-07 | 中国电子科技集团公司第十三研究所 | Method for obtaining power calibration model and terminal equipment |
| CN113899998A (en) * | 2021-09-03 | 2022-01-07 | 深圳供电局有限公司 | IGBT parameter testing method and device, computer equipment and storage medium |
| CN114035016A (en) * | 2021-11-23 | 2022-02-11 | 河北博威集成电路有限公司 | Power device transmission parameter determination method, device, terminal and storage medium |
| CN114035016B (en) * | 2021-11-23 | 2024-03-12 | 河北博威集成电路有限公司 | Power device transmission parameter determination method, device, terminal and storage medium |
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