CN206573684U - A kind of high speed circuit board intelligent test device - Google Patents
A kind of high speed circuit board intelligent test device Download PDFInfo
- Publication number
- CN206573684U CN206573684U CN201720150065.3U CN201720150065U CN206573684U CN 206573684 U CN206573684 U CN 206573684U CN 201720150065 U CN201720150065 U CN 201720150065U CN 206573684 U CN206573684 U CN 206573684U
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- Prior art keywords
- test
- circuit board
- module
- circuit
- probe
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- Test And Diagnosis Of Digital Computers (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The utility model discloses a kind of high speed circuit board intelligent test device, it includes:PC, circuit board under test, test circuit, network data transceiver module, gateway module and server.PC is connected by netting twine with test circuit, network data transceiver module and gateway module;Test circuit obtains voltage signal, frequency signal and network data on circuit board under test by probe, and network data is transferred to network data transceiver module by the network interface of test circuit.Described test circuit includes power module, MCU module, frequency measurement circuit, two gigabit ethernet interfaces, a 100 m ethernet interface, probe and jtag interface.The utility model provides the scheme of intelligence test by carrying out hardware fault test and functional test to circuit board under test for the production in enormous quantities of high speed circuit board.Program code needed for circuit board under test realizes function is all deposited on the server, isolates outer net by gateway module, and the data in high speed circuit board production process that solves such as leaks at the safety problem.
Description
Technical field
The utility model is related to circuit board automatic test means, network security technology, the network communications technology, embedded system
Multiple technical fields such as system, particularly a kind of high speed circuit board intelligent test device is produced in enormous quantities available for high speed circuit board
When, the normality of intelligence test circuit board hardware circuit and function.
Background technology
In PCBA(Actual load circuit board)Batch production process in, due to equipment and the various possible factors of operator,
It is entirely intact product that the PCBA produced, which can not be can guarantee that,.This requires to add various test equipments in the end of production
And testing tool, to ensure that all actual load circuit boards dispatched from the factory and all size and parameter that design are completely the same.This is just produced
The various means of testing such as ICT, AOI, X-Ray, Boundary-Scan, FCT.
In FCT test process, control mode generally has MCU control modes, embedded type CPU control mode, PC
Control mode, PLC control modes etc..MCU control modes can be regarded as simple embedded Control.MCU and embedded Control side
The characteristics of formula, is:Test execution speed is fast;Test operation is simply direct;Display and data output need special special circuit and
Program;Testing scheme is with strong points;Test software modification is convenient.PC control mode is a kind of present most popular FCT
Development scheme.This is primarily due to:PC technologies have turned into basic technology now;PC is cheap;PC is on an operating system
It is very convenient in terms of the file process of test result, data output;Test software is closer in user;Software programming is slightly
It is complicated.
Means of testing universal at present, hardware circuit fault test and functional test are all carried out separately, and various
Control mode also respectively has quality.
Utility model content
The purpose of this utility model be in view of the shortcomings of the prior art, and for high speed circuit board produce in enormous quantities and propose
A kind of high speed circuit board intelligent test device, workman only need on PC operate, solve what manual debugging was wasted time and energy
Problem simultaneously can solve the problem that in high speed circuit board production process that data such as leaks at the safety problem.
What the purpose of this utility model was realized in:
A kind of high speed circuit board intelligent test device, feature is that the device includes PC, test circuit, network data transmitting-receiving
Module, gateway module and server, PC are connected by netting twine with test circuit, network data transceiver module, gateway module;Survey
Examination circuit is connected with network data transceiver module, obtains voltage signal, frequency signal and the network data on circuit board under test, and
Network data is transferred to network data transceiver module by the network interface of test circuit;Gateway module is connected with server, isolation
Outer net, ensures the data safety in server;Wherein:
The test circuit includes power module, MCU module, frequency measurement circuit, two gigabit ethernet interfaces, one 100,000,000
Ethernet interface, probe and jtag interface, power module and MCU module, frequency measurement circuit, two gigabit ethernet interfaces, 100,000,000 with
Too network interface and jtag interface are connected;MCU module is connected with frequency measurement circuit, 100 m ethernet interface;Power module, MCU module,
Frequency measurement circuit, gigabit ethernet interface and jtag interface are connected to several probes.
The frequency measurement circuit includes several voltage followers and a fpga chip, and probe is connected to the defeated of voltage follower
Enter end, the output end of voltage follower connects several I/O pins of fpga chip respectively;The frequency signal that probe is obtained passes through voltage
Follower carries out impedance matching and shaping pulse.
The acp chip of MCU module is the K60 based on ARM-M4 kernels, and probe, which is connected to K60 chips, has ADC sampling work(
On the I/O pin of energy, test number road voltage signal.
Probe is connected on each signal wire of the gigabit ethernet interface and jtag interface.
Compared with prior art, the beneficial effects of the utility model are:
1)The utility model test process controls man-machine boundary by the MCU module co- controlling in PC and test circuit, PC
Friend is good, easy to operate;MCU controls perform speed soon, and test program is portable, scalability is strong.Both combine so that survey
Examination process is more intelligent, and test effect is more perfect.
2)Data after circuit board under test is successfully tested by the utility model are all deposited on the server, and pass through gateway mould
Block isolates outer net, and the data in high speed circuit board production process that solves such as leaks at the safety problem.
3)The utility model completeness is strong, first carries out hardware circuit fault test, then carries out circuit board download program, finally
Carry out circuit board function test, it is not necessary to carry out other cumbersome tests and debugging again.The signal of circuit board under test various pieces
Measurement and switching are very convenient without plug all by probe.
Brief description of the drawings
Fig. 1 is the utility model structural representation;
Fig. 2 is test circuit structure block diagram of the present utility model;
Fig. 3 is the utility model example structure schematic diagram;
Fig. 4 is utility model works flow chart.
Embodiment
Pass through netting twine and test circuit 2, network data transceiver module 3, gateway module refering to Fig. 1, the utility model PC A
Solid line in 4 connections, figure represents netting twine, and gateway module 4 is connected by netting twine with server B;Test circuit 2 passes through netting twine and net
Network data transmit-receive module 3 is connected, and used herein is two gigabit ethernet interfaces in test circuit.Test circuit 2 passes through
Jtag interface is connected with PC A, is connected by probe with circuit board under test 1.
Refering to Fig. 2, the utility model test circuit 2 include power module 21, MCU module 22, frequency measurement circuit 23, two thousand
Mbit ethernet interface 24,100 m ethernet interface 25, probe 27 and jtag interface 26, power module 21, MCU module 22,
Frequency measurement circuit 23, gigabit ethernet interface 24 and jtag interface 26 are connected to a number of probe 27.
Power module 1 and MCU module 22, frequency measurement circuit 23, gigabit ethernet interface 24,100 m ethernet interface 25,
Jtag interface 26 and probe 27 are connected, and are that test circuit and circuit board under test are powered.The power supply of circuit board under test is by power supply
What the probe power-up in module was realized.
MCU module 22 is connected with frequency measurement circuit 23,100 m ethernet interface 25 and probe 27, the electricity for circuit board under test
Signal measurement is pressed, and the test result of voltage signal, frequency signal is analyzed.MCU module 22 can test number road voltage
Signal, the acp chip of MCU module 22 is the K60 based on ARM-M4 kernels.Probe 27, which is connected to K60 chips, has ADC samplings
On the I/O pin of function.
Frequency measurement circuit 23 is connected with probe 27, and the frequency signal for circuit board under test 1 is measured, and measurement result is sent
To MCU module 22.Described frequency measurement circuit 22 can test number road frequency signal, and frequency measurement circuit 22 includes several voltage followers
With one piece of fpga chip.Probe 27 is connected to the input of voltage follower, and the output end of voltage follower connects FPGA cores respectively
Four several I/O pins of piece.The effect of voltage follower is exactly that the frequency signal progress impedance matching and pulse for obtaining probe are whole
Shape.Wherein probe is connected on each signal wire of gigabit ethernet interface and jtag interface.
Probe 27 is connected on each signal wire of gigabit ethernet interface 24, the network number for circuit board under test 1 of transferring
According to.
100 m ethernet interface 25 is communicated with PC, and test data and result are sent into PC.
Probe 27 is all connected on the signal wire of jtag interface 26, is that circuit board under test 1 downloads by visiting 27.
The course of work of the present utility model is described in detail with reference to embodiment:
Embodiment
There is network address translation using circuit board under test as one(NAT)Exemplified by the high speed circuit board of function, have on circuit board
Test point, the test point of gigabit network interface of voltage signal and frequency signal, the test point of jtag interface.Voltage signal and frequency letter
Number test point be used for circuit hardware fault test, the test point of gigabit network interface is used for the test of circuit nat feature, jtag interface
Test point is used to download for circuit board under test.
Refering to Fig. 3-4, the utility model so works:
The connection of Fig. 1 finishing devices each several part is first according to, starts test.Probe by power module in test circuit is
Electric on circuit board under test, the MCU module in test circuit is obtained by probe and measures the voltage signal on circuit board under test, is surveyed
Frequency measurement module in examination circuit is obtained by probe and measures the frequency signal on circuit board under test, and frequency values are sent to
MCU module.MCU module judges whether voltage amplitude and frequency values are normal, and result is issued into PC by 100 m ethernet interface.
Next step is carried out if PC obtains normal outcome, if obtaining abnormal result, terminates test.
Send and ask from PC to server, after being verified, server mandate PC can be downloaded for circuit board under test
Program.Allow request if not gateway module, then verify and do not pass through, terminate test.The jtag interface of test circuit passes through
J-Link downloaders are connected with PC, and jtag interface is equipped with probe, can be by the signal converting downloaded to circuit board under test
On, it is that circuit board under test downloads.
Two gigabit ethernet interfaces in test circuit are connected by netting twine with network data transceiver module, pass through probe
It is connected with circuit board under test, the network data of circuit board under test is transferred to network data transceiver module, carries out circuit board under test
Nat feature test.The whether normal result of circuit board under test nat feature is sent to by network data transceiver module by netting twine
PC.Next step is carried out if PC obtains the result that nat feature is normally realized, if obtaining the irrealizable result of nat feature,
Then terminate test.
The circuit board being successfully tested is numbered on PC, the MCU module of test circuit is by test data and result
PC is sent to by 100 m ethernet interface, is uploaded onto the server by PC and is stored in database.So far, one piece of circuit under test
The test process of plate terminates, after power-off, takes another piece of circuit board under test to be tested.
Claims (4)
1. a kind of high speed circuit board intelligent test device, it is characterised in that:The device includes PC, test circuit, network data
Transceiver module, gateway module and server, PC are connected by netting twine and test circuit, network data transceiver module, gateway module
Connect;Test circuit is connected with network data transceiver module, and gateway module is connected with server, isolates outer net, is ensured in server
Data safety;Wherein:
The test circuit includes power module, MCU module, frequency measurement circuit, two gigabit ethernet interfaces, 100,000,000 ether
Network interface, probe and jtag interface, power module and MCU module, frequency measurement circuit, two gigabit ethernet interfaces, 100 m ethernet
Interface and jtag interface connection;MCU module is connected with frequency measurement circuit, 100 m ethernet interface;Power module, MCU module, frequency measurement
Circuit, gigabit ethernet interface and jtag interface are connected to several probes.
2. high speed circuit board intelligent test device according to claim 1, it is characterised in that:The frequency measurement circuit includes number
Individual voltage follower and a fpga chip, probe are connected to the input of voltage follower, the output end point of voltage follower
Several I/O pins of fpga chip are not connect;The frequency signal that probe is obtained carries out impedance matching by voltage follower and pulse is whole
Shape.
3. high speed circuit board intelligent test device according to claim 1, it is characterised in that:The core of the MCU module
Chip is the K60 based on ARM-M4 kernels, and probe, which is connected to K60 chips, to be had on the I/O pin of ADC sampling functions, test number road
Voltage signal.
4. high speed circuit board intelligent test device according to claim 1, it is characterised in that:The gigabit ethernet interface
Probe is connected to on each signal wire of jtag interface.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201720150065.3U CN206573684U (en) | 2017-02-20 | 2017-02-20 | A kind of high speed circuit board intelligent test device |
Applications Claiming Priority (1)
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CN201720150065.3U CN206573684U (en) | 2017-02-20 | 2017-02-20 | A kind of high speed circuit board intelligent test device |
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CN201720150065.3U Expired - Fee Related CN206573684U (en) | 2017-02-20 | 2017-02-20 | A kind of high speed circuit board intelligent test device |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106771984A (en) * | 2017-02-20 | 2017-05-31 | 华东师范大学 | A kind of high speed circuit board intelligent test device |
CN112738230A (en) * | 2020-12-29 | 2021-04-30 | 成都三零瑞通移动通信有限公司 | Automatic network gate testing system and working method thereof |
-
2017
- 2017-02-20 CN CN201720150065.3U patent/CN206573684U/en not_active Expired - Fee Related
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106771984A (en) * | 2017-02-20 | 2017-05-31 | 华东师范大学 | A kind of high speed circuit board intelligent test device |
CN112738230A (en) * | 2020-12-29 | 2021-04-30 | 成都三零瑞通移动通信有限公司 | Automatic network gate testing system and working method thereof |
CN112738230B (en) * | 2020-12-29 | 2023-02-28 | 成都三零瑞通移动通信有限公司 | Automatic network gate testing system and working method thereof |
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Date | Code | Title | Description |
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GR01 | Patent grant | ||
GR01 | Patent grant | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20171020 Termination date: 20190220 |
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CF01 | Termination of patent right due to non-payment of annual fee |