CN206362859U - A kind of MLCC capacitor ESR test devices under high and low temperature environment - Google Patents

Abstract

The utility model is related to electronic component test device technical field, and in particular to a kind of MLCC capacitor ESR test devices under high and low temperature environment, including breadboard A and breadboard B, and electric capacity to be tested is welded with breadboard A and breadboard B；Breadboard A, which is placed on inside high/low temperature test box, carries out high/low temperature test, and breadboard B is located at outside high-low temperature test chamber；Breadboard A and breadboard B are connected with ripple current testing stand；Capacitive surface to be tested on breadboard B is bonded with thermocouple.ESR minor variations are showed by the amplification of temperature rise, its is simple in construction, simple operation, good test effect.

Description

A kind of MLCC capacitor ESR test devices under high and low temperature environment

Technical field

The utility model is related to electronic component test device technical field, and in particular to a kind of under high and low temperature environment MLCC capacitor ESR test devices.

Background technology

Chip multilayer ceramic capacitor (MLCC) is a kind of common Passive components, with small volume, capacity be big, moisture-proof The features such as good in thermal property, high cost performance.The fields such as computer, various electronic equipments, Aero-Space are had been widely used at present, As indispensable parts in electronic equipment.But, due to the limitation of current production processing technology, MLCC capacitors It is not ideal capacitor in actual applications.According to the difference of its frequency of use, can be accompanied by parasitic parameter, such as capacitive reactance, Induction reactance, equivalent series resistance (ESR) etc., wherein capacitive reactance and induction reactance part does not produce power consumption, and ESR parameters can produce power consumption, directly Connect and cause the temperature of capacitor to raise.So, changed by the temperature rise of test capacitors, its ESR change can be studied indirectly, For us reference is provided in the practical application of capacitor.

In actual applications, sometimes we only it should be understood that MLCC capacitors under high and low temperature environment (such as -55 DEG C~ 125 DEG C) ESR changing rules, and specific ESR values are unimportant.In this case, the method that we generally use is to try Electrical verification is received in high-low temperature test chamber, and then exporting to outside case connecting test equipment by cable is tested.Due to MLCC Capacitor ESR minimum (Ω grades of m), adds the correction of larger error and test equipment that the longer cable drawn from case is caused Function restriction, can cause test result error very big, or even negative value phenomenon occurs, so as to cause ESR variation tendencies indeterminable Situation occurs.

Utility model content

Weak point present in regarding to the issue above, the utility model provides a kind of MLCC electricity under high and low temperature environment Container ESR test devices.

To achieve the above object, the utility model provides a kind of MLCC capacitors ESR test dresses under high and low temperature environment Put, including：

Breadboard A and breadboard B, electric capacity to be tested is welded with the breadboard A and the breadboard B；

The breadboard A, which is placed on inside high/low temperature test box, carries out high/low temperature test, and the breadboard B is located at the height Outside low-temperature test chamber；

The breadboard A and the breadboard B are connected with ripple current testing stand；

Capacitive surface to be tested on the breadboard B is bonded with thermocouple.

In the above-mentioned MLCC capacitor ESR test devices under high and low temperature environment, it is preferably, on the breadboard A Electric capacity to be tested and the breadboard B electric capacity to be tested are parallel connection.

In the above-mentioned technical solutions, the MLCC capacitors ESR under high and low temperature environment that the utility model embodiment is provided Test device, compared with prior art, by being welded with electric capacity to be tested on breadboard A and breadboard B, breadboard A is put The progress high/low temperature test inside high/low temperature test box is put, breadboard B is located at outside high-low temperature test chamber, breadboard A and experiment Plate B is connected with ripple current testing stand, and the capacitive surface to be tested on breadboard B is bonded with thermocouple, between the change of temperature rise The ESR changes of analysis MLCC capacitors are connect, temperature rise and electric current and ESR are proportional, for MLCC capacitors, because its Quality m smaller (milligram level), so the ESR changes of very little can just cause larger temperature change.So, electric capacity can be passed through " amplification " of device temperature rise shows ESR minor variations.Its is simple in construction, simple operation, good test effect.

Brief description of the drawings

Fig. 1 is the knot of MLCC capacitor ESR test devices under high and low temperature environment in the utility model one embodiment Structure schematic diagram.

Description of reference numerals：

1st, ripple current testing stand；2nd, breadboard B；3rd, breadboard A；4th, high-low temperature test chamber；5th, thermocouple.

Embodiment

The utility model is described in further detail below by specific embodiment combination accompanying drawing.

Embodiment 1：

MLCC capacitor ESR test devices under high and low temperature environment, as shown in figure 1, by the to be measured of two same specifications Examination electric capacity is welded on breadboard A3 and breadboard B2, and breadboard is two pieces of identical.Breadboard A3 is put into high-low temperature test chamber 4 In, breadboard B2 is placed on to be measured outside high-low temperature test chamber 4.Above-mentioned two pieces of breadboards are connected with ripple current testing stand 1, and by heat Galvanic couple 5 is bonded in the testing capacitor surface outside case.Start high-low temperature test chamber 4 and keep the temperature at design temperature, a timing Between after start ripple testing stand 1, set after the parameters such as electric current, voltage, frequency, retention time, the outer MLCC of high-low temperature test chamber 4 is electric The surface temperature of appearance, exports it with applying the relation data of electric current.Tested by above-mentioned same steps under other condition of different temperatures Electric capacity temperature rise and current relationship, and then analyze under same electric current and retention time, the electric capacity temperature rise at a temperature of varying environment Change.Because the electric capacity in high-low temperature test chamber 4 and outside high-low temperature test chamber 4 is parallel relationship, it is total that ripple testing stand 1 applies Electric current is constant, and the ESR of electric capacity can change with environment temperature in high-low temperature test chamber 4, and under the outer normal temperature of high-low temperature test chamber 4 Electric capacity ESR it is then constant.This necessarily causes the shunt current of the outer electric capacity of high-low temperature test chamber 4 to change, so as to pass through Temperature rise change to the outer electric capacity of high-low temperature test chamber 4, calculates the ESR of electric capacity in high-low temperature test chamber 4 with high-low temperature test chamber 4 The rate of change of environment temperature, and then learn the ESR variation tendencies of electric capacity in high-low temperature test chamber 4.As needed, and then it can lead to The ESR data values of electric capacity (25 DEG C) at normal temperatures are crossed, ESR values at different temperatures are estimated.

The ESR of certain model electric capacity is estimated with the changing rule of temperature (- 55 DEG C, -25 DEG C, 25 DEG C, 85 DEG C, 125 DEG C).

Step is as follows：

1. when test high-low temperature test chamber temperature is 25 DEG C of normal temperature, the outer testing capacitance of case is under the conditions of 8A, 1min, 100KHz Temperature rise versus time curve, take 8A, temperature rise during 1min be T1；

2. other the above-mentioned temperature rise curves of four temperature spots under the same conditions are tested respectively, and 8A is taken respectively, during 1min Temperature rise is T2, T3, T4, T5；

3. because electric capacity temperature rise T=(Q_{Heat production}-Q_Radiating)/cm (wherein c is the specific heat capacity of capacitance material, and m is capacitor quality)；Again Q_{Heat production}=I²R_ESRt；So T=(I²R_ESRt-Q_Radiating)/cm (formula 1).When electric current I is very big, conduction time t long enough and airtight space When, Q_{Heat production}》Q_Radiating, so T ≈ I²R_ESRT/cm (formula 2).Under electric capacity outside for case, same experimental conditions, R_ESR, t, c and m be fixed Value, so temperature rise T is proportional to experiment electric current I；

4. experiment condition is constant current I again_{It is real}=8A, i.e. I_{It is real}=I_Outside+I_{It is interior}=8A；And I_OutsideESR_Outside=I_{It is interior}ESR_{It is interior}, so I_Outside=I_{It is real} ESR_{It is interior}/(ESR_{It is interior}+ESR_Outside) (formula 3).Formula 3 is substituted into formula 2 and obtains electric capacity temperature rise T ≈ (I outside case² _{It is real}ESR² _{It is interior}/(ESR_{It is interior}+ESR_Outside)²)* ESR_Outsidet/cm.Wherein I_{It is real}、ESR_Outside, t, c and m parameter be all definite value, so the outer electric capacity temperature rise T of case and case inner capacitor ESR_{It is interior}Become Law is consistent, i.e., same to increase same subtract；

5. it can be drawn by above rule, by the temperature rise value T1-T5 of capacitor packages outside test box, draw curve, you can Reflect the ESR variation with temperature curves of capacitor packages in case.

The ESR of certain model (25 DEG C of normal temperature, under 100KHz, ESR standard values are 3m Ω) electric capacity of the estimation of embodiment 2 is in certain temperature ESR values during point (such as -55 DEG C, -25 DEG C, 85 DEG C, 125 DEG C).Step is as follows：

1. when test high-low temperature test chamber temperature is 25 DEG C of normal temperature, the outer testing capacitance of case is under the conditions of 8A, 1min, 100KHz Temperature rise versus time curve, take 8A, temperature rise during 1min be T1；

2. other the above-mentioned temperature rise curves of four temperature spots under the same conditions are tested respectively, and 8A is taken respectively, during 1min Temperature rise is T2, T3, T4, T5；Temperature rise rate of change Δ T when can then calculate each temperature spot relative to 25 DEG C；

3. because electric capacity temperature rise T=(Q_{Heat production}-Q_Radiating)/cm (wherein c is the specific heat capacity of capacitance material, and m is capacitor quality)；Again Q_{Heat production}=I²R_ESRt；So T=(I²R_ESRt-Q_Radiating)/cm (formula 1).When electric current I is very big, during conduction time t long enough, Q_{Heat production}》Q_Radiating, So T ≈ I²R_ESRT/cm (formula 2).Under electric capacity outside for case, same experimental conditions, R_ESR, t, c and m be definite value, so temperature rise T is proportional to experiment electric current I；

4. experiment condition is constant current I again_{It is real}=8A, i.e. I_{It is real}=I_Outside+I_{It is interior}=8A；And I_OutsideESR_Outside=I_{It is interior}ESR_{It is interior}, so I_Outside=I_{It is real} ESR_{It is interior}/(ESR_{It is interior}+ESR_Outside) (formula 3).Formula 3 is substituted into formula 2 and obtains electric capacity temperature rise T=(I outside case² _{It is real}ESR² _{It is interior}/(ESR_{It is interior}+ESR_Outside)²)* ESR_Outsidet/cm；

5. by taking -55 DEG C of situations as an example, compared to the temperature rise rate of change under normal temperature And at 25 DEG C, RSR_{Interior 1}=RSR_{Outer 1}=RSR_{Outer 2}=3m Ω, it is possible to by formula 4 Obtain ESR rate of change of the electric capacity at -55 DEG C in outlet

6. by that analogy, it can be deduced that the ESR rates of change under each temperature spot, can be with the basis of 25 DEG C of ESR standard values Estimate the RSR values under each temperature spot.

Preferred embodiment of the present utility model is the foregoing is only, the utility model is not limited to, for this For the technical staff in field, the utility model can have various modifications and variations.It is all it is of the present utility model spirit and principle Within, any modification, equivalent substitution and improvements made etc. should be included within protection domain of the present utility model.

Claims (2)

1. a kind of MLCC capacitor ESR test devices under high and low temperature environment, it is characterised in that including：

Breadboard A and breadboard B, electric capacity to be tested is welded with the breadboard A and the breadboard B；

The breadboard A, which is placed on inside high/low temperature test box, carries out high/low temperature test, and the breadboard B is located at the high/low temperature Outside chamber；

The breadboard A and the breadboard B are connected with ripple current testing stand；

Capacitive surface to be tested on the breadboard B is bonded with thermocouple.

2. the MLCC capacitor ESR test devices according to claim 1 under high and low temperature environment, it is characterised in that：Institute It is parallel connection to state the electric capacity to be tested and the breadboard B electric capacity to be tested on breadboard A.