CN116699463B - MLCC capacitor leakage current measuring method, device, control device and medium - Google Patents
MLCC capacitor leakage current measuring method, device, control device and medium Download PDFInfo
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- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
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Abstract
The invention discloses a method, a device, a control device and a medium for measuring leakage current of an MLCC capacitor, which comprise the following steps: the first optocoupler MOS tube is conducted, the power supply module is started, the high-low internal resistance switching module is in a low internal resistance input state, and the MLCC capacitor is charged; when the charging time of the MLCC capacitor reaches a preset time, the first optocoupler MOS tube is cut off, and the first resistor of the high-low internal resistance switching module is conducted; switching on the second optocoupler MOS tube to zero the charge of the integrating capacitor, and switching off the second optocoupler MOS tube when the voltage output by the integrating operational amplification module is in the threshold comparison range and the control module is in a high level state; the ADC acquisition module sends the target voltage value to the control module; the control module measures the leakage current value of the MLCC capacitor according to the target voltage value and the voltage threshold range of the threshold comparison module. The high-low internal resistance switching module is adopted to dynamically input impedance, so that the measurement efficiency and the measurement precision are improved.
Description
Technical Field
The invention relates to the technical field of electronic application testing, in particular to a method, a device, a control device and a medium for measuring leakage current of an MLCC capacitor.
Background
The MLCC is a part for keeping the internal current of the electronic product stable, and in the mass production test of the MLCC high-speed measuring separator, the leakage current test of the MLCC capacitor is one of the most important parameters of the MLCC capacitor.
In order to reduce the influence of charging current during measurement and the requirement of high-speed measurement, a measuring circuit inputs low resistance (about 0 to 200 omega), but larger interference of the charging current exists in a test period, so that the measured leakage current of the MLCC capacitor contains more charging current components, and the accuracy of the leakage current is greatly influenced; the input high resistance (about 200Ω to 2000 Ω) of the measurement circuit needs to be precharged in advance, the charges of the measured MLCC capacitor are filled as much as possible, otherwise, the unfilled part forms charging current when measuring, so that the MLCC high-speed test separator must increase the number of Precharge (PC) stations and soaking (PS) stations, the leakage current measurement precision is lower, the design structure and the production are complex, the volume and the components of the MLCC high-speed test separator are increased due to the increase of the number of precharge stations and the soaking stations, the price is high, various customer requirements cannot be met at the same time, and the MLCC high-speed test separator is difficult to be widely applied.
Disclosure of Invention
The present invention aims to solve at least one of the technical problems existing in the prior art. Therefore, the invention provides a method, a device, equipment and a medium for measuring the leakage current of an MLCC capacitor, which are based on a high-low internal resistance switching module and an integral operational amplification module to realize dynamic switching of impedance so as to reduce the charge and discharge time in the process of the leakage current value of the MLCC capacitor, improve the measurement efficiency and improve the accuracy of the leakage current value.
In one aspect, the method for measuring the leakage current of the MLCC capacitor according to the embodiment of the invention comprises the following steps: the MLCC leakage current acceleration measurement device comprises a control module, a power supply module, an MLCC capacitor, an integral operational amplification module, an ADC acquisition module, a threshold comparison module and a high-low internal resistance switching module, wherein the high-low internal resistance switching module is respectively and electrically connected with the MLCC capacitor and the integral operational amplification module, the integral operational amplification module is electrically connected with the threshold comparison module, the high-low internal resistance switching module comprises a first resistor and a second resistor, the resistance value of the first resistor is smaller than that of the second resistor, the control module is respectively and electrically connected with the first resistor and the second resistor through a first optocoupler MOS tube, the control module is electrically connected with the integral operational amplification module through a second optocoupler MOS tube, and the ADC acquisition module is respectively and electrically connected with the control module and the integral operational amplification module, and the method comprises the following steps of:
the first optocoupler MOS tube is conducted, the power supply module is started, so that the first resistor and the second resistor of the high-low internal resistance switching module act together to enable the high-low internal resistance switching module to be in a low internal resistance input state, and the MLCC capacitor is in a charging state;
when the charging time of the MLCC capacitor reaches a preset time, the first optocoupler MOS tube is cut off, so that the first resistor of the high-low internal resistance switching module is in a conducting state;
the second optocoupler MOS tube is conducted, the charge of the integrating capacitor is cleared, and when the voltage of the integrating capacitor output by the integrating operational amplification module is in a threshold comparison range, an integrating capacitor clear signal of the control module is in a high level state, the second optocoupler MOS tube is cut off;
the ADC acquisition module sends a target voltage value to the control module, wherein the target voltage value is the voltage value of the MLCC capacitor in the process of integrating the MLCC capacitor by the integration operational amplification module;
and the control module measures the leakage current value of the MLCC capacitor according to the target voltage value and the voltage threshold range of the threshold comparison module.
According to some embodiments of the invention, after the control module measures the leakage current value of the MLCC capacitor according to the target voltage value and a voltage threshold of the threshold comparison module, the method further comprises:
and the control module turns off the power supply module, and turns on the second optocoupler MOS tube so as to clear the integral capacitance charge of the MLCC capacitor.
According to some embodiments of the present invention, a protection module is further connected between the internal resistance switching module and the integral operational amplification module, and a current limiting module is further connected between the ADC acquisition module and the integral operational amplification module.
According to some embodiments of the invention, the ADC acquisition module sends a target voltage value to the control module, comprising:
after the control module receives an integral capacitor charge zero clearing signal sent by the integral operational amplification module, the ADC acquisition module acquires a target voltage value of an MLCC capacitor in a target state in a preset time period, and the target state represents the integral operational amplification module to integrate the MLCC capacitor;
the ADC acquisition module sends the target voltage value to the control module through a preset communication interface;
according to some embodiments of the invention, the control module turns off the power module and turns on the second optocoupler MOS transistor, so that after the integrated capacitance charge of the MLCC capacitor is cleared, the method further includes:
and the first optocoupler MOS tube is conducted so that the first resistor and the second resistor of the high-low internal resistance switching module act together to be in a low internal resistance input state, and the MLCC capacitor enters a discharge state.
According to some embodiments of the invention, the threshold comparison module comprises a threshold comparison circuit, an inverting circuit and an amplifying circuit, wherein the threshold comparison circuit is respectively connected with the inverting circuit and the amplifying circuit, and the amplifying circuit is also connected with the control module.
According to some embodiments of the invention, the control module measures a leakage current value of the MLCC capacitor from the target voltage value and a voltage threshold range of the threshold comparison module, comprising:
when the target voltage value is within the voltage threshold range, the control module measures the leakage current value of the MLCC capacitor according to the target voltage value;
or,
when the target voltage value is not in the voltage threshold range, the second optocoupler MOS tube is turned on again, the charge of the integral capacitor is cleared, when the voltage of the integral capacitor output by the integral operational amplification module is in the threshold comparison range, and the integral capacitor clear signal of the control module is in a high level state, the second optocoupler MOS tube is cut off, the ADC acquisition module sends the target voltage value to the control module again, and the target voltage value is the voltage value of the MLCC capacitor in the process of re-integrating the MLCC capacitor by the integral operational amplification module, and the control module measures the leakage current value of the MLCC capacitor again according to the target voltage value and the voltage threshold range of the threshold comparison module.
In a second aspect, an embodiment of the present invention provides an MLCC leakage current acceleration measurement device, where the MLCC leakage current acceleration measurement device includes a control module, a power module, an MLCC capacitor, an integrating operational amplification module, an ADC acquisition module, a threshold comparison module, and a high-low internal resistance switching module, where the high-low internal resistance switching module is electrically connected to the MLCC capacitor and the integrating operational amplification module, the integrating operational amplification module is electrically connected to the threshold comparison module, the high-low internal resistance switching module includes a first resistor and a second resistor, a resistance value of the first resistor is smaller than a resistance value of the second resistor, the control module is electrically connected to the first resistor and the second resistor through a first optocoupler MOS tube, the control module is electrically connected to the integrating operational amplification module through a second optocoupler MOS tube, and the ADC acquisition module is electrically connected to the control module and the integrating operational amplification module, where the control module is configured to execute the leakage current measurement method of the MLCC capacitor according to the first aspect.
In a third aspect, an embodiment of the present invention provides a control apparatus, including at least one control processor and a memory for communicatively coupling with the at least one control processor; the memory stores instructions executable by the at least one control processor to enable the at least one control processor to perform the MLCC capacitor leakage current measurement method as described in the embodiment of the first aspect above.
In a fourth aspect, embodiments of the present invention provide a computer-readable medium storing computer-executable instructions for causing a computer to perform the MLCC capacitor leakage current measurement method according to the embodiments of the first aspect above.
The MLCC capacitor leakage current measuring method, device, equipment and medium based on the embodiment of the invention have at least the following beneficial effects: based on the internal resistance value input to the MLCC capacitor through the dynamic switching of the high internal resistance and the low internal resistance of the switching module, the leakage current flows through the high internal resistance, the integration operation amplifier performs integration to output the voltage value, the threshold comparison module judges whether the output voltage value exceeds a preset threshold value, when the output voltage value exceeds the preset threshold value, an alarm signal is sent to the control module, and when the output voltage value is within the preset threshold value, the ADC acquisition module acquires a target voltage value and sends the target voltage value to the control module, and the control module measures the leakage current value of the MLCC capacitor according to the target voltage value and the alarm signal.
The dynamic input impedance of the high-low internal resistance switching module is adopted, the low internal resistance is input to accelerate the charge and discharge, the charge and discharge time and the leakage current value measurement time are reduced, and the measurement efficiency is improved; the high internal resistance is input, the influence of a measured MLCC capacitor charging circuit in a measurement time period is reduced, and the accuracy of measuring the leakage current value is improved; the low internal resistance accelerates the discharge, accelerate the discharge after the measured MLCC capacitor leakage current value is measured, in the same discharge time, release the stored ground charge in the measured MLCC capacitor more rapidly, have avoided MLCC capacitor to continue discharging and spark burning the body or other supplies while placing; the MLCC high-speed test separator adopting the scheme does not need to increase the number of pre-charging stations and soaking stations, effectively reduces the volume of the high-speed test separator, saves space, reduces steps and components of an automatic test process, and meets various requirements of users while reducing the cost.
Additional aspects and advantages of the invention will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention.
Drawings
FIG. 1 is a block diagram showing the overall structure of an MLCC capacitor leakage current acceleration measurement device according to an embodiment of the invention;
FIG. 2 is a flowchart of a method for measuring leakage current of an MLCC capacitor according to an embodiment of the invention;
FIG. 3 is a flowchart of a method for measuring leakage current of an MLCC capacitor according to a second embodiment of the invention;
FIG. 4 is a flowchart of a method for measuring leakage current of an MLCC capacitor according to a third embodiment of the invention;
FIG. 5 is a diagram of an ideal MLCC capacitor leakage current measurement principle and an equivalent model of an MLCC capacitor leakage current acceleration measurement device according to an embodiment of the invention;
FIG. 6 is a schematic circuit diagram of a first embodiment of an MLCC capacitor leakage acceleration measurement device according to an embodiment of the invention;
FIG. 7 is a schematic circuit diagram of a second embodiment of an MLCC capacitor leakage acceleration measurement device according to an embodiment of the invention;
FIG. 8 is a schematic circuit diagram of a third embodiment of an MLCC capacitor leakage acceleration measurement device according to an embodiment of the invention;
fig. 9 is a graph of data of the charge-discharge voltage variation of the high and low internal resistances Ri of the measured MLCC capacitor C according to an embodiment of the present invention.
Detailed Description
Embodiments of the present invention are described in detail below, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to like or similar elements or elements having like or similar functions throughout. The embodiments described below by referring to the drawings are illustrative only and are not to be construed as limiting the invention.
In the description of the present invention, it should be understood that references to orientation descriptions such as upper, lower, front, rear, left, right, etc. are based on the orientation or positional relationship shown in the drawings, are merely for convenience of description of the present invention and to simplify the description, and do not indicate or imply that the apparatus or elements referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus should not be construed as limiting the present invention.
In the description of the present invention, a number means one or more, a number means two or more, and greater than, less than, exceeding, etc. are understood to not include the present number, and above, below, within, etc. are understood to include the present number. The description of the first and second is for the purpose of distinguishing between technical features only and should not be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated or implicitly indicating the precedence of the technical features indicated.
In the description of the present invention, unless explicitly defined otherwise, terms such as arrangement, installation, connection, etc. should be construed broadly and the specific meaning of the terms in the present invention can be reasonably determined by a person skilled in the art in combination with the specific contents of the technical scheme.
Embodiments of the present invention will be further described below with reference to the accompanying drawings.
Referring to fig. 1, the MLCC leakage current acceleration measurement device includes a control module, a power module, an MLCC capacitor, an integral operational amplification module, an ADC acquisition module, a threshold comparison module and a high-low internal resistance switching module, wherein the high-low internal resistance switching module is electrically connected with the MLCC capacitor and the integral operational amplification module, the integral operational amplification module is electrically connected with the threshold comparison module, the high-low internal resistance switching module includes a first resistor and a second resistor, the resistance value of the first resistor is smaller than that of the second resistor, the control module is electrically connected with the first resistor and the second resistor through a first optocoupler MOS tube, the control module is electrically connected with the integral operational amplification module through a second optocoupler MOS tube, the ADC acquisition module is electrically connected with the control module and the integral operational amplification module, a protection module is further connected between the high-low internal resistance switching module and the integral operational amplification module, a current limiting module is further connected between the ADC acquisition module and the integral operational amplification module, the high-low internal resistance switching module includes an internal resistance switching circuit and a driving circuit, and the threshold comparison module includes a threshold comparison circuit and an amplifying circuit.
Referring to fig. 2, based on the above-mentioned MLCC leakage current acceleration measurement device, an embodiment of the first aspect of the present invention provides a measurement method of the MLCC leakage current acceleration measurement device, including, but not limited to, steps S100 to S500:
s100, a first optocoupler MOS tube is conducted, a power supply module is started, so that the first resistor and the second resistor of the high-low internal resistance switching module act together to be in a low internal resistance input state, and an MLCC capacitor is in a charging state;
s200, when the charging time of the MLCC capacitor reaches a preset time, the first optocoupler MOS tube is cut off, so that the first resistor of the high-low internal resistance switching module is in a conducting state;
s300, conducting the second optocoupler MOS tube, resetting the charge of the integrating capacitor, and when the voltage of the integrating capacitor output by the integrating operational amplification module is in a threshold comparison range and the integrating capacitor resetting signal of the control module is in a high level state, cutting off the second optocoupler MOS tube;
s400, the ADC acquisition module sends a target voltage value to the control module, wherein the target voltage value is the voltage value of the MLCC capacitor in the process of integrating the MLCC capacitor by the integration operational amplification module;
s500, the control module measures the leakage current value of the MLCC capacitor according to the target voltage value and the voltage threshold range of the threshold comparison module.
S500, after the control module measures the leakage current value of the MLCC capacitor according to the target voltage value and the voltage threshold of the threshold comparison module, the measurement method further comprises the following steps:
s510, the control module turns off the power supply module, and turns on the second optocoupler MOS tube so as to clear the integral capacitance charge of the MLCC capacitor.
Referring to fig. 3, after the ADC acquisition module sends the target voltage value to the control module, including, but not limited to, the following steps:
s410, after the control module sends a signal to conduct the second optocoupler MOS tube integration capacitance charge clearing signal, the ADC acquisition module acquires a target voltage value of the MLCC capacitor in a target state in a preset time period, and the target state represents integration operation amplification module to integrate the MLCC capacitor;
and S420, the ADC acquisition module sends the target voltage value to the control module through a preset communication interface.
Referring to fig. 4, after the control module turns off the power module and turns on the second optocoupler MOS transistor in step S510, the measurement method further includes:
s511, the first resistor and the second resistor of the high-low internal resistance switching module are jointly acted in a low internal resistance input state, so that the MLCC capacitor enters a discharge state.
S500, after the control module measures the leakage current value of the MLCC capacitor according to the target voltage value and the voltage threshold of the threshold comparison module, the measurement method further comprises the following steps:
s512, when the target voltage value is within the voltage threshold range, the control module measures the leakage current value of the MLCC capacitor according to the target voltage value; or,
s513, when the target voltage value is not in the voltage threshold range, the second optocoupler MOS tube is turned on again, the charge of the integrating capacitor is cleared, and when the voltage of the integrating capacitor output by the integrating operational amplification module is in the threshold comparison range and the control module resends an integrating capacitor clear signal to be in a high level state, the second optocoupler MOS tube is cut off; and the ADC acquisition module sends a target voltage value to the control module again, wherein the target voltage value is the leakage current value of the MLCC capacitor measured by the control module again according to the target voltage value and the voltage threshold range of the threshold comparison module in the process of re-integrating the MLCC capacitor by the integration operation amplification module.
The equivalent model of the ideal measured MLCC capacitor is shown in FIG. 5, and the equivalent topological structure is formed by connecting a capacitor C1 and an insulation resistor R1 in parallel; when the MLCC capacitor C measures the electrical process, the current Ic of the structure flows through the capacitor C1 of the equivalent model, and meanwhile, the insulation resistor R1 of the equivalent model has tiny leakage current I0; the leakage current value I of the MLCC capacitor in the embodiment of the present application is measured as a first formula, as follows:
。
the MLCC capacitor leakage current measurement process time comprises a charging time period, a measurement time period and a discharging time period.
Referring to fig. 1 to 9, when measurement is not started, the charge clearing output port cap_on/OFF of the integrating capacitor of the control module is at a low level, a high level is output through the optocoupler MOS tube IC1 of the nand gate circuit, the MOS tube Q2 is turned ON, the second optocoupler MOS tube IC3 is turned ON, the charge of the integrating capacitor is released to zero, and preparation is made for the response of the integrating zero state.
In the charge-discharge time period shown in the schematic diagram of the MLCC capacitor leakage current acceleration measurement device shown in fig. 6, the input high-low internal resistance switching output disconnection r_sw of the control module is at a high level, the MOS transistor Q1 is turned on, the first optocoupler MOS transistor IC2 is turned on, and VCC4 = GND = 0V, then the input internal resistance Ri in the charge time period is as follows:
Ri=RL ；
in the charge-discharge time period shown in the schematic diagram of the MLCC capacitor leakage current acceleration measurement device as shown in FIG. 7, the input high-low internal resistance switching output of the control module is disconnected with R_SW to be high level, the MOS tube Q1 is started and conducted, the first optocoupler MOS tube IC2 is conducted, and the voltage on the 4 th pin of the first optocoupler MOS tube IC2 is GND; by applying the 'virtual short' working principle of the operational amplifier, the reverse input end of the operational amplifier is virtually short-circuited to GND, namely VCC 5=gnd; the charging period input internal resistance Ri is the parallel resistance value of the input low internal resistance RL and the input high internal resistance RH, i.e., ri is the third formula as follows: ri=rl// RH;
in the charge-discharge time period shown in the schematic diagram of the MLCC capacitor leakage current acceleration measurement device as shown in FIG. 8, the input high-low internal resistance switching output of the control module is disconnected from R_SW to be high level, the MOS transistor Q1 is started and conducted, the first optocoupler MOS transistor IC2 is conducted, and VCC3=VCC4; by applying the 'virtual short' working principle of the operational amplifier, the reverse input end of the operational amplifier is virtually short-circuited to GND, namely VCC 5=gnd; the charging period input internal resistance Ri is the parallel resistance value of the input low internal resistance RL and the input high internal resistance RH, i.e., ri is the fourth formula as follows: ri=rl// RH;
the input internal resistance of the acceleration charge-discharge stage obtained by the third formula and the fourth formula is a fifth formula:the method comprises the steps of carrying out a first treatment on the surface of the From the fifth formula, ri < RL, ri < RH;
the differential pressure of two ends of the measured MLCC capacitor C is Vec1 when the constant current charging is finished, and the two ends of the measured MLCC capacitor C are Vec2 when the constant current discharging is finished;
the difference Vec1 between two ends of the MLCC capacitor at the end of constant current charging is shown as the following formula:
；
the differential pressure Vec2 at the end of constant current discharge is represented by the seventh formula:
；
in the above sixth and seventh formulas, VCC1 is a constant voltage supplied by a high-precision voltage, I is a constant current supplied by the high-precision voltage, that is, a current flowing in the measured MLCC capacitor C, ro is an internal resistance value outputted by the high-precision voltage source, and Ri is an internal resistance value inputted by the embodiment of the MLCC capacitor leakage current testing apparatus;
the data graph of the charge-discharge voltage variation of the high internal resistance Ri and the low internal resistance Ri of the measured MLCC capacitor C is shown in FIG. 9;
when vcc1= V, I =50ma, ro=25Ω, measured MLCC capacitor c=10uf, and ri=10Ω:
the difference between the two ends of the measured capacitor C at the end of constant-current charging can be obtained by the above conditions and the sixth formula, and the difference is shown as follows:
Ve1=25V-50mA×(25Ω+100Ω)=23.25V；
the difference between the two ends of the measured capacitor C at the end of constant-current discharge can be obtained by the above conditions and the seventh formula as follows:
Ve2=50mA×(25Ω+200Ω)=1.75V；
the tenth formula for constant flow state charging time is as follows:
；
the eleventh formula for the constant flow discharge time is as follows:
。
therefore, the measured MLCC capacitor C is charged for a constant current of 50mA before the charging period Ve1 does not reach 23.25V, and the constant-current charging period is t2-t0; the measured MLCC capacitor C is discharged for a constant current of 50mA before the discharge time period Ve2 is not reduced to 1.75V, and the constant-current discharge time period is t6-t4;
after the constant current charging of the tested MLCC capacitor C is finished, the corresponding full response of the first-order circuit is generated in the circuit, the continuous charging current in the circuit is Ic1, the voltage on the tested MLCC capacitor C is Uc1, and the expressions of the tested MLCC capacitor C are a twelfth expression and a thirteenth expression, as follows:
；
；
in the twelfth and thirteenth formulas, t is a time period from t2 to t3, that is, 0.ltoreq.t.ltoreq.t.3-t 2;
after the constant current discharge of the tested MLCC capacitor C is finished, the zero input response of the first-order circuit is generated in the circuit, the continuous discharge current in the circuit is I2, the voltage on the tested MLCC capacitor C is Uc2, and the expressions of the zero input response and the continuous discharge current are respectively represented by a fourteenth expression and a fifteenth expression as follows:
；
；
in the fourteenth and fifteenth formulas, t is a time period from t6 to t7, that is, 0.ltoreq.t.ltoreq.t 7-t 6;
when vcc1= V, I =50ma, ro=25Ω, measured capacitance c=10uf, and ri=200Ω:
from the above conditions and the sixth formula, the differential pressure Ve5 between the two ends of the measured MLCC capacitor C at the end of the constant-current charging is shown as follows:
Ve5=25V-50mA×(25Ω+200Ω)=13.75V
the seventeenth formula of the differential pressure Ve6 at the two ends of the tested MLCC capacitor C at the end of constant-current discharge can be obtained by the seventh formula of the conditions and the formulas, wherein the seventeenth formula is as follows:
Ve6=50mA×(25Ω+200Ω)=11.25V
the eighteenth formula for constant flow state charging time is as follows:
。
the nineteenth formula for the constant-flow discharge time is as follows:
。
therefore, the measured MLCC capacitor C is charged for a constant current of 50mA before the charging period Ve1 does not reach 13.75V, and the constant-current charging period is t1-t0; the measured MLCC capacitor C is discharged for a constant current of 50mA before the discharge time period Ve2 is not reduced to 11.25V, and the constant-current discharge time period is t5-t4;
after the constant current charging of the measured MLCC capacitor C is finished, the generated full response of the circuit is corresponding to the first-order circuit, the continuous charging current in the circuit is Ic3, the upper voltage of the measured MLCC capacitor C is Uc3, and the expression of the measured MLCC capacitor C is shown as follows:
；
；
in the twentieth formula and the twentieth formula, t is a time period from t1 to t3, namely, t is more than or equal to 0 and less than or equal to (t 3-t 1);
after the constant current discharge of the tested MLCC capacitor C is finished, the zero input response of the first-order circuit is generated in the circuit, the continuous discharge current in the circuit is I4, the voltage on the tested MLCC capacitor C is Uc4, ic4 is obtained by a twenty-second formula, uc4 is obtained by a twenty-third formula, and the following steps are shown in the following formula:
；
；
t in the twenty-second formula and the twenty-third formula is a time period from t5 to t7, namely, t is more than or equal to 0 and less than or equal to (t 7-t 5);
in summary, in the charge-discharge time period in the MLCC capacitor leakage current acceleration measurement device, the lower the input internal resistance Ri, the shorter the charge amount charging or discharging time of the measured capacitor C; in the charging stage, the higher the voltage on the measured capacitor C is, the smaller the charging current is; in the discharging stage, the lower the power-on voltage of the capacitor C to be tested is, the smaller the discharging current is;
in the measurement time period, the measured MLCC capacitor C of FIG. 9 inputs a data graph of the change of the charge and discharge voltages of the high internal resistance Ri and the low internal resistance Ri;
in the measuring period shown in the schematic diagram of the MLCC capacitor leakage current acceleration measuring device in fig. 6, the input high-low internal resistance switching output disconnection r_sw of the control module is at a low level, the MOS transistor Q1 is turned off, the first optocoupler MOS transistor IC2 is turned off, and the input internal resistance Ri' in the measuring period is shown in a twenty-fourth formula as follows: ri' =rl+rh;
in the measuring time period shown in the schematic diagram of the MLCC capacitor leakage current acceleration measuring device in FIG. 7, the input high-low internal resistance switching output disconnection R_SW of the control module is low level, the MOS tube Q1 is cut off, and the first optocoupler MOS tube IC2 is cut off; by applying the 'virtual short' working principle of the operational amplifier, the reverse input end of the operational amplifier is virtually short-circuited to GND, namely VCC 5=gnd; the measurement period input internal resistance Ri' is represented as the twenty-fifth formula as follows: ri' =rh;
in the measuring time period shown in the schematic diagram of the MLCC capacitor leakage current acceleration measuring device in FIG. 8, the input high-low internal resistance switching output disconnection R_SW of the control module is low level, the MOS tube Q1 is cut off, and the first optocoupler MOS tube IC2 is cut off; by applying the 'virtual short' working principle of the operational amplifier, the reverse input end of the operational amplifier is virtually short-circuited to GND, namely VCC 5=gnd; the measurement period input internal resistance Ri 'is the twenty-sixth formula Ri' =rh as shown below;
when the measurement is started, the integrating capacitance charge zero clearing output port CAP_ON/OFF of the control module is high level, the low level is output through the optocoupler MOS tube IC1 of the NAND gate circuit, the MOS tube Q2 is cut OFF, the second optocoupler MOS tube IC3 is cut OFF, the measurement circuit starts integration, and the control unit counts t at the same time;
the moment the MLCC capacitor leakage current acceleration measurement circuit is switched from a charging time period to a measurement time period, the differential pressure of the two ends of the measured MLCC electrical appliance C is Ve3, and a twenty-seventh formula can be obtained by a thirteenth formula as follows:
；
the measured MLCC capacitor enters a measurement time period, the full response of the circuit corresponding to the first-order circuit is generated, the continuous charging current in the circuit is expressed as Ic, and the twenty eighth formula is as follows:
=/>×/>；
wherein t is a time period from t3 to t4, i.e., 0.ltoreq.t.ltoreq.t 4-t 3;
as described in the twenty-seventh and twenty-eighth formulas, in the measurement stage, the larger the input impedance of the MLCC capacitor leakage current acceleration measurement circuit is, the smaller the charging current is, and the smaller the influence on the whole measurement leakage current I is;
the I test outputs VCC6 through an integrating operational amplifier circuit, the VCC6 and time t data are collected through a current limiting resistor R9 to an ADC sampling circuit, and the measured current I test of the measured MLCC capacitor C is calculated to be I leakage;
the control unit calculates and outputs the threshold voltage of the DAC1 as DAC_VCC according to the configuration parameter table, and applies the 'virtual short' working principle of the operational amplifier:
the twenty-ninth formula of the output voltage of the amplifying circuit is as follows:
；
the output voltage of the resistor r12=r16 in the inverting circuit is shown by the thirty-first formula:
；
the negative sign in the above formula represents that the polarity of the voltage and the current is negative;
the first threshold comparison circuit and the second threshold comparison circuit form a window comparator, and the threshold range of the window comparator is from DAC_V1 to DAC_V2;
the integrating capacitor C2 is from 0 to time t, the voltage on the integrating capacitor is VCC6, and the control module starts the threshold comparison circuit to output the result:
when DAC_V2 is smaller than VCC6 and smaller than DAC_V1, the window comparator output signal over_CMP is high level H, which indicates that the output voltage of the integral operational amplifier is in a reasonable range;
when DAC_V2 > VCC6 or VCC6D > DAC_V1, window comparator output signal over_CMP is low, indicating that the integrating operational amplifier output voltage is in an Over-range;
the over_CMP is at a low level, and simultaneously informs the control unit MUC that the integrating capacitance charge zero clearing output port CAP_ON/OFF of the control module MCU is at a low level;
the over_CMP is low level or CAP_ON/OFF low level, the high level is output through the NAND gate optocoupler MOS tube IC1, the MOS tube Q2 is started to be conducted, the second optocoupler MOS tube IC3 is conducted, the charge of the integrating capacitor group is released to be zero, and preparation is made for the next integrating zero state response.
The second aspect of the present invention provides an MLCC leakage current acceleration measurement device, where the measurement device includes a control module, a power module, an MLCC capacitor, an integrating operational amplification module, an ADC acquisition module, a threshold comparison module, and a high-low internal resistance switching module, where the high-low internal resistance switching module is electrically connected to the MLCC capacitor and the integrating operational amplification module, the integrating operational amplification module is electrically connected to the threshold comparison module, the high-low internal resistance switching module includes a first resistor and a second resistor, the resistance of the first resistor is smaller than the resistance of the second resistor, the control module is electrically connected to the first resistor and the second resistor through a first optocoupler MOS tube, the control module is electrically connected to the integrating operational amplification module through a second optocoupler MOS tube, and the ADC acquisition module is electrically connected to the control module and the integrating operational amplification module, where the control module is configured to execute the MLCC capacitor leakage current measurement method of the first aspect. For example, the above-described method steps S100 to S500 in fig. 2, method steps S410 to S420 in fig. 3, and method steps S511 to S513 in fig. 4 are performed. Based on the internal resistance value which is input to the MLCC capacitor through the dynamic switching of the high internal resistance switching module and the low internal resistance switching module, the integrating operational amplification module integrates the time of the internal resistance value and adjusts the time to an output voltage value required by the threshold comparison module, the threshold comparison module judges whether the output voltage value exceeds a preset threshold value, when the output voltage value exceeds the preset threshold value, an alarm signal is sent to the control module, when the output voltage value is within a preset threshold range, the ADC acquisition module acquires a target voltage value and sends the target voltage value to the control module, and the control module measures the leakage current value of the MLCC capacitor according to the target voltage value and the alarm signal. The pre-charging station and the soaking station are not required to be increased, the volume of the high-speed test separator is effectively reduced, the space is saved, the steps and components of an automatic test process are reduced, and various requirements of users are met while the cost is reduced.
A third aspect of the present invention provides a control apparatus comprising at least one control processor and a memory for communication with the at least one control processor; the control processor and the memory may be connected by a bus or otherwise, the memory storing instructions executable by the at least one control processor to enable the at least one control processor to perform the MLCC capacitor leakage current measurement method as in the embodiment of the first aspect above. For example, the above-described method steps S100 to S500 in fig. 2, method steps S410 to S420 in fig. 3, and method steps S511 to S513 in fig. 4 are performed. The first optocoupler MOS tube is conducted, the power supply module is started, so that the first resistor and the second resistor of the high-low internal resistance switching module act together to be in a low internal resistance input state, and the MLCC capacitor is in a charging state; when the charging time of the MLCC capacitor reaches a preset time, the first optocoupler MOS tube is cut off, so that the first resistor of the high-low internal resistance switching module is in a conducting state; turning on the second optocoupler MOS tube, resetting the charge of the integrating capacitor, and turning off the second optocoupler MOS tube when the voltage of the integrating capacitor output by the integrating operational amplification module is in a threshold comparison range and the integrating capacitor resetting signal of the control module is in a high level state; the ADC acquisition module sends a target voltage value to the control module, wherein the target voltage value is the voltage value of the MLCC capacitor in the process of integrating the MLCC capacitor by the integration operational amplification module; the control module measures the leakage current value of the MLCC capacitor according to the target voltage value and the voltage threshold range of the threshold comparison module. The pre-charging station and the soaking station are not required to be increased, the volume of the high-speed test separator is effectively reduced, the space is saved, the steps and components of an automatic test process are reduced, and various requirements of users are met while the cost is reduced.
An embodiment of a fourth aspect of the present invention provides a computer-readable storage medium storing computer-executable instructions that can be used to cause a computer to perform the MLCC capacitor leakage current measurement method as the embodiment of the first aspect above. For example, the above-described method steps S100 to S500 in fig. 2, method steps S410 to S420 in fig. 3, and method steps S511 to S513 in fig. 4 are performed. The first optocoupler MOS tube is conducted, the power supply module is started, so that the first resistor and the second resistor of the high-low internal resistance switching module act together to be in a low internal resistance input state, and the MLCC capacitor is in a charging state; when the charging time of the MLCC capacitor reaches a preset time, the first optocoupler MOS tube is cut off, so that the first resistor of the high-low internal resistance switching module is in a conducting state; turning on the second optocoupler MOS tube, resetting the charge of the integrating capacitor, and turning off the second optocoupler MOS tube when the voltage of the integrating capacitor output by the integrating operational amplification module is in a threshold comparison range and the integrating capacitor resetting signal of the control module is in a high level state; the ADC acquisition module sends a target voltage value to the control module, wherein the target voltage value is the voltage value of the MLCC capacitor in the process of integrating the MLCC capacitor by the integration operational amplification module; the control module measures the leakage current value of the MLCC capacitor according to the target voltage value and the voltage threshold range of the threshold comparison module. The pre-charging station and the soaking station are not required to be increased, the volume of the high-speed test separator is effectively reduced, the space is saved, the steps and components of an automatic test process are reduced, and various requirements of users are met while the cost is reduced.
Those of ordinary skill in the art will appreciate that all or some of the steps, systems, and methods disclosed above may be implemented as software, firmware, hardware, and suitable combinations thereof. Some or all of the physical components may be implemented as software executed by a processor, such as a central processing unit, digital signal processor, or microprocessor, or as hardware, or as an integrated circuit, such as an application specific integrated circuit. Such software may be distributed on computer readable media, which may include computer storage media or non-transitory media and communication media or transitory media. The term computer storage media includes both volatile and nonvolatile, removable and non-removable media implemented in any method or technology for storage of information such as computer readable instructions, data structures, program modules or other data, as known to those skilled in the art. Computer storage media includes, but is not limited to, RAM, ROM, EEPROM, flash memory or other memory technology, CD-ROM, digital versatile disk DVD or other optical disk storage, magnetic cassettes, magnetic tape, magnetic disk storage or other magnetic storage devices, or any other medium which can be used to store the desired information and which can be accessed by a computer. Furthermore, as is well known to those of ordinary skill in the art, communication media typically embodies computer readable instructions, data structures, program modules or other data in a modulated data signal such as a carrier wave or other transport mechanism and includes any information delivery media.
The embodiments of the present invention have been described in detail with reference to the accompanying drawings, but the present invention is not limited to the above embodiments, and various changes can be made within the knowledge of one of ordinary skill in the art without departing from the spirit of the present invention.
Claims (10)
1. The utility model provides a MLCC condenser leakage current measurement method which characterized in that is applied to MLCC leakage current and accelerates measuring device, MLCC leakage current accelerates measuring device includes control module, power module, MLCC condenser, integration operational amplification module, ADC collection module, threshold value comparison module and high low internal resistance switching module, high low internal resistance switching module respectively with MLCC condenser with integration operational amplification module electricity is connected, integration operational amplification module with threshold value comparison module electricity is connected, high low internal resistance switching module includes first resistance and second resistance, the resistance of first resistance is less than the resistance of second resistance, control module respectively with first resistance with second resistance electricity is connected through first opto-coupler MOS pipe, control module is connected with integration operational amplification module electricity through second opto-coupler MOS pipe, ADC collection module respectively with control module with integration operational amplification module electricity is connected, wherein, integration operational amplification module is provided with integration capacitance, the method includes:
the first optocoupler MOS tube is conducted, the power supply module is started, so that the first resistor and the second resistor of the high-low internal resistance switching module are connected in parallel, the high-low internal resistance switching module is in a low internal resistance input state, and the MLCC capacitor is in a charging state;
when the charging time of the MLCC capacitor reaches a preset time, the first optocoupler MOS tube is cut off, so that the first resistor and the second resistor of the high-low internal resistance switching module are connected in series and connected to the integral operational amplification module to enter a high internal resistance input state;
the second optocoupler MOS tube is conducted, the charge of the integrating capacitor is started to be cleared, and when the voltage of the integrating capacitor output by the integrating operational amplifier module is in a threshold comparison range, the ADC acquisition module sends the output voltage of the integrating operational amplifier to the control module to judge whether the charge of the integrating capacitor is cleared; when the charge of the integrating capacitor is zero, an integrating capacitor zero clearing signal of the control module is in a high level state, and the second optocoupler MOS tube is cut off, wherein the integrating capacitor voltage is the output voltage of the integrating operational amplification module in the integrating process of the integrating operational amplification module;
the ADC acquisition module sends a target voltage value to the control module, the threshold comparison result of the voltage of the integral capacitor of the threshold comparison module is sent to the control module, and the target voltage value is the voltage value of the integral capacitor in the process of integrating the integral capacitor by the integral operational amplification module;
and the control module calculates the leakage current value of the MLCC capacitor according to the target voltage value and the threshold comparison result.
2. The MLCC capacitor leakage current measurement method of claim 1, wherein after the control module measures the leakage current value of the MLCC capacitor from the target voltage value and a voltage threshold of the threshold comparison module, the method further comprises:
and the control module turns off the power supply module, and turns on the second optocoupler MOS tube so as to clear the integrating capacitance charge in the integrating operational amplification module.
3. The MLCC capacitor leakage current measurement method of claim 1, wherein a protection module is further connected between the internal resistance switching module and the integrating operational amplification module, and a current limiting module is further connected between the ADC acquisition module and the integrating operational amplification module.
4. The MLCC capacitor leakage current measurement method of claim 1, wherein the ADC acquisition module sends a target voltage value to the control module, comprising:
the ADC acquisition module acquires a target voltage value of an integral capacitor in a target state in a preset time period, and the target state represents the integral operation amplification module to integrate the integral capacitor;
and the ADC acquisition module sends the target voltage value to the control module through a preset communication interface.
5. The method of claim 2, wherein the control module turns off the power module and turns on the second optocoupler MOS transistor to zero the integrating capacitance charge in the integrating operational amplifier module, the method further comprising:
and conducting the first optocoupler MOS tube so as to enable the first resistor and the second resistor of the high-low internal resistance switching module to be connected in parallel, so that the high-low internal resistance switching module is in a low internal resistance input state, and enabling the MLCC capacitor to enter a discharge state when the high-low internal resistance switching module is in the low internal resistance input state.
6. The MLCC capacitor leakage current measurement method of claim 1, wherein the threshold comparison module comprises a threshold comparison circuit, an inverting circuit, and an amplifying circuit, the threshold comparison circuit is respectively connected with the inverting circuit and the amplifying circuit, and the amplifying circuit is further connected with the control module.
7. The MLCC capacitor leakage current measurement method of claim 1, wherein the control module calculates a leakage current value of the MLCC capacitor from the target voltage value and a voltage threshold range of the threshold comparison module, comprising:
when the target voltage value is within the voltage threshold range, the control module calculates the leakage current value of the MLCC capacitor according to the target voltage value;
or,
when the target voltage value is not in the voltage threshold range, the second optocoupler MOS tube is turned on again, and the integrating capacitor charge starts a zero clearing process, and when the integrating capacitor voltage output by the integrating operational amplifier module is in the threshold comparison range, the ADC acquisition module sends the integrating operational amplifier output voltage to the control module to judge whether the zero clearing of the integrating capacitor charge is completed; when the charge of the integrating capacitor is zero, an integrating capacitor zero clearing signal of the control module is in a high level state, the second optocoupler MOS tube is cut off, the ADC acquisition module sends a target voltage value to the control module again, the target voltage value is the voltage value of the integrating capacitor in the process that the integrating operational amplification module carries out integration on the integrating capacitor again, and the control module calculates the leakage current value of the MLCC capacitor again according to the target voltage value and the voltage threshold range of the threshold comparison module.
8. An MLCC leakage current acceleration measurement device, wherein the MLCC leakage current acceleration measurement device comprises a control module, a power module, an MLCC capacitor, an integrating operational amplification module, an ADC acquisition module, a threshold comparison module and a high-low internal resistance switching module, wherein the high-low internal resistance switching module is electrically connected with the MLCC capacitor and the integrating operational amplification module respectively, the integrating operational amplification module is electrically connected with the threshold comparison module, the high-low internal resistance switching module comprises a first resistor and a second resistor, the resistance value of the first resistor is smaller than that of the second resistor, the control module is electrically connected with the first resistor and the second resistor respectively through a first optocoupler MOS tube, the control module is electrically connected with the integrating operational amplification module through a second optocoupler MOS tube, the ADC acquisition module is electrically connected with the control module and the integrating operational amplification module respectively, and the integrating operational amplification module is provided with an integrating capacitor, and the control module is used for executing the leakage current measurement method of the MLCC capacitor according to any one of claims 1 to 7.
9. A control device comprising at least one control processor and a memory for communication with the at least one control processor; the memory stores instructions executable by the at least one control processor to enable the at least one control processor to perform the MLCC capacitor leakage current measurement method as claimed in any one of claims 1 to 7.
10. A computer-readable medium storing computer-executable instructions for causing a computer to perform the MLCC capacitor leakage current measurement method of any one of claims 1 to 7.
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