CN104297604A - Test system and method for influences of harmonic waves on temperature rise and loss of parallel capacitors - Google Patents

Abstract

The invention discloses a test system and method for influences of harmonic waves on the temperature rise and the loss of parallel capacitors. The method is characterized by including the following steps that first, a harmonic source is adjusted so that the harmonic source can give out a fundamental wave voltage equal to the rated voltage of the capacitors and harmonic voltages different in time number and content, and the temperature and the voltage and current values of the capacitors are observed and recorded; second, it is guaranteed that the total voltage effective value output by the harmonic source is equal to the rated voltage of the capacitors according to the constant-voltage method calculation formula, and the temperature and the voltage and current values of the capacitors are observed and recorded; third, it is guaranteed that the total fundamental wave and harmonic current effective value output by the harmonic source is equal to the rated current of the capacitors according to the constant-current calculation formula, and the temperature and the voltage and current values of the capacitors are observed and recorded. Through the system and method, the influences of harmonic waves on the temperature rise and the loss of the parallel capacitors can be scientifically and effectively tested, the change conditions of the temperature rise and the loss of the parallel capacitors under the condition of different harmonic waves are obtained, and test data are comprehensive and high in accuracy.

Description

A kind of harmonic wave on shnt capacitor temperature rise and loss impact pilot system and method

Technical field

The present invention relates to electric system and electrical equipment technical field, particularly relating to a kind of harmonic wave affects pilot system and test method to shnt capacitor temperature rise and loss.

Background technology

Current high power electronic equipment is one of important pollution source of electric system, a large amount of harmonic voltages and harmonic current can be produced in electrical network, this can produce many harmful effects to the operation of electric system, make the production of electric energy, the efficiency of transmission and use declines, added losses increase, and can cause fault or the damage of electrical equipment time serious.In addition, have when installing reactive power compensation capacitor in the electric system of harmonic wave, Harmonics amplification can be made under certain conditions, even cause electric system particular resonance, cause harmonic current in power capacitor excessive, electric current time serious in capacitor may exceed its rated current, so that cause fault or the damage of power capacitor.

Therefore, analyze there being the running status of capacitor in harmonic source electric system, determine the impact of harmonic current on capacitor and the relation of systematic parameter, specifying capacitor and transship the measure that should take because of harmonic current, is very necessary to the safe operation of guarantee capacitor under harmonic condition.And researching and analysing instantly for the parallel power condenser heating, major part is in the theoretical analysis stage, test method at present for temperature rise merely specify and should apply to be not less than rated voltage to device, and makes installed capacity equal 1.35Q in process of the test _n, do not have the test method that clear and definite harmonic wave affects temperature rise and loss.Existing test method intuitively can not provide the relation of harmonic wave and power capacitor temperature rise, loss, this is because do not have the method that suitable harmonic wave is measured for power capacitor temperature rise, loss test.

Prior art processing mode has two kinds, is respectively to apply 1.2Un power-frequency voltage, and applying is not less than the voltage of Un and makes installed capacity equal 1.35Qn in experimentation.Existing two kinds of methods only give the limit value of power-frequency voltage, or only give capacity when device is tested.

As conventionally scheme is tested, only can obtain the temperature rise of capacitor under power-frequency voltage and damage curve, all can not solve the problem that proposed harmonic wave affects temperature rise.According to this method, the temperature rise of capacitor under various harmonic condition and damage curve can be drawn.Shown in seeing the following form this method and art methods specifically comparing in main method, acquired results and relative merits:

Summary of the invention

In order to solve the problem of the test method of the parallel power condenser temperature rise and loss in prior art, the invention provides a kind of system and method that scientificlly and effectively can carry out harmonic wave and shnt capacitor temperature rise and loss impact are tested.

In order to solve the problem, the technical solution used in the present invention is:

The pilot system that a kind of harmonic wave affects shnt capacitor temperature rise and loss, comprise harmonic source, voltage current transformer and multiple capacitor, it is characterized in that: also comprise power quality analyzer, wave tracer and infrared thermography, described harmonic source can send the first-harmonic of different amplitude and phase place and each harmonic is transferred to voltage current transformer, described voltage current transformer is connected with capacitor by data line, described power quality analyzer carries out Real-Time Monitoring by voltage current transformer to the voltage and electric current that flow through capacitor, wave tracer receiver voltage current transducer signal, record the analysis that real voltage current waveform data are used for carrying out loss, described infrared thermography is to pseudocapacitor, the infared spectrum of record capacitor is used for sensing capacitor surface temperature.

The pilot system that aforesaid a kind of harmonic wave affects shnt capacitor temperature rise and loss, is characterized in that: also comprise mercury thermometer, and three mercury thermometers, as filling in the container of oil, are got its mean value and are used for recording environment temperature.

The test method that a kind of harmonic wave affects shnt capacitor temperature rise and loss, it is characterized in that: adopt permanent first-harmonic method, constant voltage method and galvanostatic method to test and record temperature rise value and loss, permanent first-harmonic method keeps the constant increase harmonic voltage of fundamental voltage to carry out temperature rise and loss test; Constant voltage method reduces fundamental voltage, increase harmonic voltage, temperature rise and loss test is carried out when the total voltage that harmonic source is exported is consistent with rated capacitor voltage, galvanostatic method reduces fundamental voltage, increase harmonic voltage, carry out temperature rise and loss test when making the total current flowing through capacitor equal rated capacitor electric current, added by three kinds of methods, harmonic voltage is identical with fundamental voltage initial phase.

The test method that aforesaid a kind of harmonic wave affects shnt capacitor temperature rise and loss, is characterized in that: described permanent first-harmonic method, specifically comprises the following steps:

Step S101: regulate harmonic source, the fundamental voltage U that harmonic source is sent ₁equal the rated voltage U of capacitor _n;

Step S102: regulate harmonic source, make harmonic source send the harmonic voltage U of different number of times and different content _h, the temperature variation of observed and recorded capacitor, records the electric current and voltage actual value in often kind of situation;

Step S103: repeat step S102, obtains more data.

The test method that aforesaid a kind of harmonic wave affects shnt capacitor temperature rise and loss, is characterized in that: described constant voltage method, specifically comprises the following steps:

Step S201: regulate harmonic source, the fundamental voltage U that harmonic source is exported ₁equal the rated voltage U of capacitor _n;

Step S202: according to constant voltage method computing formula, regulates harmonic source, the fundamental voltage U that harmonic source is sent ₁reduce, each experiment only applies single subharmonic voltage U _h, ensure the total voltage effective value U that harmonic source exports _Σbe constantly equal to the rated voltage U of capacitor _n, the temperature variation of observed and recorded capacitor, records the electric current and voltage actual value in often kind of situation;

Step S203: according to constant voltage method computing formula, regulates harmonic source, the fundamental voltage U that harmonic source is sent ₁reduce, each experiment applies aliasing subharmonic voltage U _m, ensure the total voltage effective value U that harmonic source exports _Σbe constantly equal to the rated voltage U of capacitor _n, the temperature variation of observed and recorded capacitor, records the electric current and voltage actual value in often kind of situation; Step S204: repeat step S202 and S203, obtains more data.

The test method that aforesaid a kind of harmonic wave affects shnt capacitor temperature rise and loss, is characterized in that: described galvanostatic method, specifically comprises the following steps:

Step S301: regulate harmonic source, the fundamental voltage U that harmonic source is sent ₁equal the rated voltage U of capacitor _n, obtain by voltage-current sensor measurement the rated current I flowing through capacitor _n;

Step S302: according to galvanostatic method total current computing formula, regulates harmonic source, the fundamental voltage U that harmonic source is sent ₁reduce, each experiment only applies single subharmonic voltage U _h, make the total current effective value I flowing through capacitor _Σequal capacitor (rated current I _n, then fundamental voltage U ₁with single subharmonic voltage U _hmeet galvanostatic method voltage computing formula, the temperature variation of observed and recorded capacitor, record the electric current and voltage actual value in often kind of situation;

Step S303: according to galvanostatic method total current computing formula, regulates harmonic source, the fundamental voltage U that harmonic source is sent ₁reduce, each experiment applies aliasing subharmonic voltage U _m, make to flow through capacitor total current effective value I _Σequal rated capacitor electric current I _n, then fundamental voltage U ₁with each harmonic voltage U _hmeet galvanostatic method voltage computing formula, the temperature variation of observed and recorded capacitor, record the electric current and voltage actual value in often kind of situation;

Step S304: repeat step S302 and S303 and obtain more data.

The test method that aforesaid a kind of harmonic wave affects shnt capacitor temperature rise and loss, is characterized in that: described constant voltage method, and in step S202, S203, application constant voltage method computing formula, regulates fundamental voltage U ₁with h subharmonic voltage U _hcomputing formula be:

$U_{\mathrm{\Σ}}=U_N=\sqrt{U_1^2+\mathrm{\Σ}\left(U_h^2\right)}$

Wherein U _Σfor total voltage, U that harmonic source exports ₁for fundamental voltage, U that harmonic source exports _hfor h subharmonic voltage, U that harmonic source exports _nfor the rated voltage of capacitor.

The test method that aforesaid a kind of harmonic wave affects shnt capacitor temperature rise and loss, is characterized in that: described galvanostatic method, and in step S302, S303, application galvanostatic method total current computing formula, regulates fundamental voltage U ₁with h subharmonic voltage U _hcomputing formula be:

$I_{\mathrm{\Σ}}=\sqrt{I_1^2+\mathrm{\Σ}\left(I_h^2\right)}={\mathrm{\ω}}_0{C}_N\sqrt{U_1^2+\mathrm{\Σ}{\left(h{U}_h\right)}^2}$

Wherein I _Σfor circuit total current, I ₁for circuit fundamental current, I _hfor circuit h subharmonic current, ω ₀for angular frequency, C _nfor the rated capacity of capacitor, h are h subharmonic numbering, U ₁for fundamental voltage, U that harmonic source exports _hfor the h subharmonic voltage that harmonic source exports.

The test method that aforesaid a kind of harmonic wave affects shnt capacitor temperature rise and loss, is characterized in that: described galvanostatic method, and in step S302, S303, application galvanostatic method voltage computing formula, regulates fundamental voltage U ₁with h subharmonic voltage U _hcomputing formula be:

$\sqrt{U_1^2+\mathrm{\Σ}{\left(h{U}_h\right)}^2}=U_N$

Wherein h is h subharmonic numbering, U ₁for fundamental voltage, U that harmonic source exports _hfor h subharmonic voltage, U that harmonic source exports _nfor the rated voltage of capacitor.

The beneficial effect that the present invention reaches:

This method scientificlly and effectively can carry out harmonic wave to shnt capacitor temperature rise and loss impact test, and obtain the situation of change of temperature rise and loss in different harmonic wave situation, the comprehensive accuracy of test figure is high.

Accompanying drawing explanation

Fig. 1 is the test system architecture schematic diagram that harmonic wave of the present invention affects shnt capacitor temperature rise and loss.

Below each Reference numeral is described in detail:

(1) be harmonic source, (2) are voltage current transformer, and (3) are power quality analyzer, (4) be wave tracer, (5) be infrared thermography, (6) mercury thermometer, (7) are capacitor.

Embodiment

Below in conjunction with accompanying drawing, the invention will be further described.

Each module is pressed electrical wiring Fig. 1 correct wiring, be connected harmonic source with 3 single-phase electricity containers composition test macro.

The pilot system that described harmonic wave affects shnt capacitor temperature rise and loss, comprise harmonic source (1), voltage current transformer (2), multiple capacitor (7), power quality analyzer (3), wave tracer (4), infrared thermography (5) and draw together mercury thermometer (6), described harmonic source (1) can send the first-harmonic of different amplitude and phase place and each harmonic is transferred to voltage current transformer (2), described voltage current transformer (2) is connected with capacitor (7) by data line, described power quality analyzer (3) carries out Real-Time Monitoring by voltage current transformer (2) to the voltage and electric current that flow through capacitor (7), wave tracer (4) receiver voltage current transformer (2) signal, record the analysis that real voltage current waveform data are used for carrying out loss, described infrared thermography (5) is to pseudocapacitor (7), the infared spectrum of record capacitor (7) is used for sensing capacitor (7) surface temperature, three mercury thermometers (6) are as filling in the container of oil, get its mean value to be used for recording environment temperature.

The test method that harmonic wave of the present invention affects shnt capacitor temperature rise and loss, adopt permanent first-harmonic method, constant voltage method and galvanostatic method to test and record temperature rise value and loss, permanent first-harmonic method keeps the constant increase harmonic voltage of fundamental voltage to carry out temperature rise and loss test; Constant voltage method reduces fundamental voltage, increase harmonic voltage, temperature rise and loss test is carried out when the total voltage that harmonic source (1) is exported is consistent with capacitor (7) rated voltage, galvanostatic method reduces fundamental voltage, increase harmonic voltage, carry out temperature rise and loss test when making the total current flowing through capacitor (7) equal capacitor (7) rated current, added by three kinds of methods, harmonic voltage is identical with fundamental voltage initial phase.

Wherein permanent first-harmonic method, specifically comprises the following steps with reference to Fig. 1:

Step S101: regulate harmonic source (1), the first-harmonic output amplitude of harmonic source (1) is set, makes fundamental voltage U ₁equal the rated voltage U of capacitor (7) _n, determine rated voltage U by power quality analyzer (3) _n, record now voltage current waveform, capacitor infared spectrum and ambient temperature value.

Step S102: regulate harmonic source (1), the first-harmonic output amplitude arranging harmonic source (1) equals the rated voltage U of capacitor (7) _n, regulate harmonic source (1) to send the harmonic voltage U of different number of times and different content _h, determine rated voltage U by power quality analyzer (3) _n, record now voltage current waveform, capacitor infared spectrum and ambient temperature value.

Step S103: repeat step S102, obtains more data.

Wherein constant voltage method, specifically comprises the following steps with reference to Fig. 1:

Step S201: regulate harmonic source (1), first-harmonic output amplitude and the initial phase of harmonic source (1) are set, make fundamental voltage U ₁equal the rated voltage U of capacitor (7) _n, determine rated voltage U by power quality analyzer (3) _n, record now voltage current waveform, capacitor infared spectrum and ambient temperature value.

Step S202: according to constant voltage method computing formula, regulates harmonic source (1), makes the fundamental voltage U that harmonic source (1) sends ₁reduce, each experiment applies single subharmonic voltage U _h, ensure the total voltage effective value U that harmonic source (1) exports _Σbe constantly equal to the rated voltage U of capacitor (7) _n.Magnitude of voltage U is determined by power quality analyzer (3) _Σ, record now voltage current waveform, capacitor infared spectrum and ambient temperature value.

Step S203: according to constant voltage method computing formula, regulates harmonic source (1), makes the fundamental voltage U that harmonic source (1) sends ₁reduce, each experiment applies aliasing subharmonic voltage U _m, ensure the total voltage effective value U that harmonic source (1) exports _Σbe constantly equal to the rated voltage U of capacitor (7) _n.Magnitude of voltage U is determined by power quality analyzer (3) _Σ, record now voltage current waveform, capacitor infared spectrum and ambient temperature value.

Step S204: repeat step S202, S203, obtains more data.

In wherein said step S202, S203, application constant voltage method computing formula, regulates fundamental voltage U ₁with h subharmonic voltage U _hcomputing formula be:

$U_{\mathrm{\Σ}}=U_N=\sqrt{U_1^2+\mathrm{\Σ}\left(U_h^2\right)}$

Wherein U _Σfor total voltage, U that harmonic source (1) exports ₁for fundamental voltage, U that harmonic source (1) exports _hfor h subharmonic voltage, U that power quality analyzer (3) records _nfor the rated voltage of capacitor (7).

Wherein galvanostatic method, specifically comprises the following steps with reference to Fig. 1:

Step S301: regulate harmonic source (1), first-harmonic output amplitude and the initial phase of harmonic source (1) are set, make fundamental voltage U ₁equal the rated voltage U of capacitor (7) _n, now capacitor electrode flow valuve equals rated current I _n.Rated current I is determined by power quality analyzer (3) _n, record now voltage current waveform, capacitor infared spectrum and ambient temperature value.

Step S302: according to galvanostatic method total current computing formula, regulates harmonic source (1) to change fundamental voltage U ₁with single subharmonic voltage U _h, make fundamental voltage U ₁with single subharmonic voltage U _hmeet galvanostatic method voltage computing formula, now total current I _Σequal capacitor (7) rated current I _n.Rated current I is determined by power quality analyzer (3) _n, record now voltage current waveform, capacitor infared spectrum and ambient temperature value.

Step S303: according to galvanostatic method total current computing formula, regulates harmonic source (1) to change fundamental voltage U ₁with each harmonic voltage U _h, make fundamental voltage U ₁with each harmonic voltage U _hmeet galvanostatic method voltage computing formula, now total current I _Σequal capacitor (7) rated current I _n.Rated current I is determined by power quality analyzer (3) _n, record now voltage current waveform, capacitor infared spectrum and ambient temperature value.

Step S304: repeat step S302, S303, obtains more data.

In wherein said step S302, S303, application galvanostatic method total current computing formula, regulates fundamental voltage U ₁with h subharmonic voltage U _hcomputing formula be:

$I_{\mathrm{\Σ}}=\sqrt{I_1^2+\mathrm{\Σ}\left(I_h^2\right)}={\mathrm{\ω}}_0{C}_N\sqrt{U_1^2+\mathrm{\Σ}{\left(h{U}_h\right)}^2}$

Wherein I _Σfor total current, I ₁for circuit fundamental current, I _hfor circuit h subharmonic current, ω ₀for angular frequency, C _nfor the rated capacity of capacitor (7), h are h subharmonic, U ₁for fundamental voltage, U that harmonic source (1) exports _hfor the h subharmonic voltage that harmonic source (1) exports.

In wherein said step S302, S303, application galvanostatic method voltage computing formula, regulates fundamental voltage U ₁with h subharmonic voltage U _hcomputing formula be:

$\sqrt{U_1^2+\mathrm{\Σ}{\left(h{U}_h\right)}^2}=U_N$

Wherein h is h subharmonic numbering, U ₁for fundamental voltage, U that harmonic source (1) exports _hfor h subharmonic voltage, U that harmonic source (1) exports _nfor the rated voltage of capacitor (7).

More than show and describe ultimate principle of the present invention, principal character and advantage.The technician of the industry should understand; the present invention is not restricted to the described embodiments; what describe in above-described embodiment and instructions just illustrates principle of the present invention; without departing from the spirit and scope of the present invention; the present invention also has various changes and modifications, and these changes and improvements all fall in the claimed scope of the invention.Application claims protection domain is defined by appending claims and equivalent thereof.

Claims (9)

1. a harmonic wave is on the pilot system of shnt capacitor temperature rise and loss impact, comprise harmonic source (1), voltage current transformer (2) and multiple capacitor (7), it is characterized in that: also comprise power quality analyzer (3), wave tracer (4) and infrared thermography (5), described harmonic source (1) can send the first-harmonic of different amplitude and phase place and each harmonic is transferred to voltage current transformer (2), described voltage current transformer (2) is connected with capacitor (7) by data line, described power quality analyzer (3) carries out Real-Time Monitoring by voltage current transformer (2) to the voltage and electric current that flow through capacitor (7), wave tracer (4) receiver voltage current transformer (2) signal, record the analysis that real voltage current waveform data are used for carrying out loss, described infrared thermography (5) is to pseudocapacitor (7), the infared spectrum of record capacitor (7) is used for sensing capacitor (7) surface temperature.

2. a kind of harmonic wave according to claim 1 on shnt capacitor temperature rise and loss impact pilot system, it is characterized in that: also comprise mercury thermometer (6), three mercury thermometers (6), as filling in the container of oil, are got its mean value and are used for recording environment temperature.

3. a harmonic wave is on the test method of shnt capacitor temperature rise and loss impact, it is characterized in that: adopt permanent first-harmonic method, constant voltage method and galvanostatic method to test and record temperature rise value and loss, permanent first-harmonic method keeps the constant increase harmonic voltage of fundamental voltage to carry out temperature rise and loss test; Constant voltage method reduces fundamental voltage, increases harmonic voltage, carries out temperature rise and loss test when the total voltage that harmonic source (1) is exported is consistent with capacitor (7) rated voltage; Galvanostatic method reduces fundamental voltage, increases harmonic voltage, makes the total current I flowing through capacitor (7) _Σcarry out temperature rise and loss test when equaling capacitor (7) rated current, added by three kinds of methods, harmonic voltage is identical with fundamental voltage initial phase.

4. a kind of harmonic wave according to claim 3 on shnt capacitor temperature rise and loss impact test method, it is characterized in that: described permanent first-harmonic method, specifically comprises the following steps:

Step S101: regulate harmonic source (1), make the fundamental voltage U that harmonic source (1) sends ₁equal the rated voltage U of capacitor (7) _n;

Step S102: regulate harmonic source (1), make harmonic source (1) send the harmonic voltage U of different number of times and different content _h, the temperature variation of observed and recorded capacitor (7) and electric current and voltage value;

Step S103: repeat step S102, obtains more data.

5. a kind of harmonic wave according to claim 4 on shnt capacitor temperature rise and loss impact test method, it is characterized in that: described constant voltage method, specifically comprises the following steps:

Step S201: regulate harmonic source (1), make the fundamental voltage U that harmonic source (1) exports ₁equal the rated voltage U of capacitor (7) _n;

Step S202: according to constant voltage method computing formula, regulates harmonic source (1), makes the fundamental voltage U that harmonic source (1) sends ₁reduce, each experiment only applies single subharmonic voltage U _h, ensure the total voltage effective value U that harmonic source (1) exports _Σbe constantly equal to the rated voltage U of capacitor (7) _n, the temperature variation of observed and recorded capacitor (7) and electric current and voltage value;

Step S203: according to constant voltage method computing formula, regulates harmonic source (1), makes the fundamental voltage U that harmonic source (1) sends ₁reduce, each experiment applies aliasing subharmonic voltage U _m, ensure the total voltage effective value U that harmonic source (1) exports _Σbe constantly equal to the rated voltage U of capacitor (7) _n, the temperature variation of observed and recorded capacitor (7) and electric current and voltage value;

Step S204: repeat step S202 and S203, obtains more data.

6. a kind of harmonic wave according to claim 5 on shnt capacitor temperature rise and loss impact test method, it is characterized in that: described galvanostatic method, specifically comprises the following steps:

Step S301: regulate harmonic source (1), make the fundamental voltage U that harmonic source (1) sends ₁equal the rated voltage U of capacitor (7) _n, measured by current sensor (2) and obtain the rated current I flowing through capacitor _n;

Step S302: according to galvanostatic method total current computing formula, regulates harmonic source (1), makes the fundamental voltage U that harmonic source (1) sends ₁reduce, each experiment only applies single subharmonic voltage U _h, make the total current effective value I flowing through capacitor (7) _Σequal capacitor (7) rated current I _n, then fundamental voltage U ₁with single subharmonic voltage U _hmeet galvanostatic method voltage computing formula, the temperature variation of observed and recorded capacitor (7) and electric current and voltage value;

Step S303: according to galvanostatic method total current computing formula, regulates harmonic source (1), makes the fundamental voltage U that harmonic source (1) sends ₁reduce, each experiment applies aliasing subharmonic voltage U _m, make to flow through capacitor (7) total current effective value I _Σequal capacitor (7) rated current I _n, then fundamental voltage U ₁with each harmonic voltage U _hmeet galvanostatic method voltage computing formula; The temperature variation of observed and recorded capacitor (7) and electric current and voltage value;

Step S304: repeat step S302 and S303 and obtain more data.

7. a kind of harmonic wave according to claim 6 is on the test method of shnt capacitor temperature rise and loss impact, and it is characterized in that: described constant voltage method, in step S202, S203, application constant voltage method computing formula, regulates fundamental voltage U ₁with h subharmonic voltage U _hcomputing formula be:

$U_{\mathrm{\Σ}}=U_N=\sqrt{U_1^2+\mathrm{\Σ}\left(U_h^2\right)}$

Wherein U _Σfor total voltage, U that harmonic source (1) exports ₁for fundamental voltage, U that harmonic source (1) exports _hfor h subharmonic voltage, U that harmonic source (1) exports _nfor the rated voltage of capacitor (7).

8. a kind of harmonic wave according to claim 7 is on the test method of shnt capacitor temperature rise and loss impact, and it is characterized in that: described galvanostatic method, in step S302, S303, application galvanostatic method total current computing formula, regulates fundamental voltage U ₁with h subharmonic voltage U _hcomputing formula be:

$I_{\mathrm{\Σ}}=\sqrt{I_1^2+\mathrm{\Σ}\left(I_h^2\right)}={\mathrm{\ω}}_0{C}_N\sqrt{U_1^2+\mathrm{\Σ}{\left({\mathrm{hU}}_h\right)}^2}$

Wherein I _Σfor circuit total current, I ₁for circuit fundamental current, I _hfor circuit h subharmonic current, ω ₀for angular frequency, C _nfor the rated capacity of capacitor (7), h are h subharmonic numbering, U ₁for fundamental voltage, U that harmonic source (1) exports _hfor the h subharmonic voltage that harmonic source (1) exports.

9. a kind of harmonic wave according to claim 8 is on the test method of shnt capacitor temperature rise and loss impact, and it is characterized in that: described galvanostatic method, in step S302, S303, application galvanostatic method voltage computing formula, regulates fundamental voltage U ₁with h subharmonic voltage U _hcomputing formula be:

$\sqrt{U_1^2+\mathrm{\Σ}{\left({\mathrm{hU}}_h\right)}^2}=U_N$

Wherein h is h subharmonic numbering, U ₁for fundamental voltage, U that harmonic source (1) exports _hfor h subharmonic voltage, U that harmonic source (1) exports _nfor the rated voltage of capacitor (7).