CN206321903U - A kind of probe member, probe block and detection means - Google Patents
A kind of probe member, probe block and detection means Download PDFInfo
- Publication number
- CN206321903U CN206321903U CN201720017211.5U CN201720017211U CN206321903U CN 206321903 U CN206321903 U CN 206321903U CN 201720017211 U CN201720017211 U CN 201720017211U CN 206321903 U CN206321903 U CN 206321903U
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- Prior art keywords
- probe
- insulating barrier
- connecting line
- probe member
- utility
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- 239000000523 sample Substances 0.000 title claims abstract description 169
- 238000001514 detection method Methods 0.000 title claims abstract description 24
- 230000004888 barrier function Effects 0.000 claims abstract description 43
- 239000000463 material Substances 0.000 claims description 7
- 239000004642 Polyimide Substances 0.000 claims description 5
- 229920001721 polyimide Polymers 0.000 claims description 5
- 239000011521 glass Substances 0.000 abstract description 8
- 238000000034 method Methods 0.000 abstract description 6
- 238000010586 diagram Methods 0.000 description 6
- 238000004519 manufacturing process Methods 0.000 description 4
- 238000012986 modification Methods 0.000 description 4
- 230000004048 modification Effects 0.000 description 4
- 238000005299 abrasion Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000005457 optimization Methods 0.000 description 1
- 229920000139 polyethylene terephthalate Polymers 0.000 description 1
- 230000008054 signal transmission Effects 0.000 description 1
- 210000001138 tear Anatomy 0.000 description 1
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- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Liquid Crystal (AREA)
Abstract
The utility model is related to a kind of probe member, probe block and detection means, and to solve current probe member in lighting detection process, the durability of probe is poor, the problem of foreign matter such as glass chip of residual can draw disconnection wiring.The probe member includes：Insulating barrier, probe, and connecting line；Wherein, insulating barrier is provided with via；Connecting line is arranged at a surface of insulating barrier；Probe is set in the vias, and one end protrudes from via, the other end and is connected with connecting line.The utility model sets probe into the via of insulating barrier, and the side of probe can be supported, and alleviates the positive pressure of probe, improves probe by force intensity, and then improve the height for making probe；Connecting line is set to the side for protruding from via away from probe on the insulating layer simultaneously, connecting line can be avoided to draw disconnected by foreign matter, so as to improve the service life of probe member.
Description
Technical field
The utility model is related to display, detection technique field, more particularly to a kind of probe member, probe block and detection dress
Put.
Background technology
At present, it is necessary to which Multi-channel detection process next check in time produces not in engineering in liquid crystal panel manufacturing process
Good, to reduce cost, most producer's selections are in the counter plate progress lighting detection into after box, before patch light polarizing film.Existing probe block
Structure be made up of flexible circuit, drive integrated circult and film probe part；, it is necessary to by before during lighting test
Each signal input terminal precise contact on film probe part and display panel is held, so as to by each data wire and grid
Line signal is individually passed on display panel on corresponding signal input terminal, realizes the transmission of signal.
As shown in figure 1, be the structural side view of existing probe member, including multiple probes 01, it is corresponding with each probe
Connecting line 02, and insulating barrier 03.In daily production process, the probe on probe block needs to contact with different display panels
Reperformance test is carried out, thus easily causes probe abrasion, and the height of probe is relatively low can influence the service life of probe block.
In addition, the panel surface of preceding process production often can residual glass chip, glass chip is easy to draw the company of disconnected probe block
Wiring, causes probe block to damage.For example, the probe block of model 55 often tests 10000 display panels, 3-5 spy is just had
Pin is damaged, and also often occurs insulating barrier and the local burnout phenomenon of connecting line in production process.
In summary, current probe member is in lighting detection process, and not only probe can cause resistance to because of contact wear
It is poor with property, and the foreign matter such as the glass chip remained on display panel signal input terminal can draw disconnection wiring, and then reduce
The service life of probe member.
Utility model content
A kind of probe member, probe block and detection means that the utility model embodiment is provided, to solve current probe
Part is in lighting detection process, and not only probe can cause poor durability because of contact wear, and display panel signal is defeated
Disconnection wiring can be drawn by entering the foreign matters such as the glass chip that is remained on terminal, and then reduce the service life of probe member, meanwhile, absolutely
The heat resistance of edge layer is poor, the problem of being easily caused local burn out.
Based on above mentioned problem, the utility model embodiment provides a kind of probe member, including：Insulating barrier, probe, and
Connecting line；Wherein,
The insulating barrier is provided with via；The connecting line is arranged at a surface of the insulating barrier；The probe is set
In the via, and one end protrudes from the via, the other end and is connected with the connecting line.
Preferably, the material of the insulating barrier is polyimides.
Preferably, the height that the probe protrudes from the via is 0.015mm-0.03mm.
Preferably, the probe is rectangle in the cross sectional shape on the surface of insulating layer direction, it is or trapezoidal.
If preferably, including multiple vias, the multiple via is on the insulating barrier according to the first spaced and parallel arrangement.
Preferably, the probe member include multiple vias, the multiple via on the insulating barrier according to second between
The Heterogeneous Permutation between every continuous two or more vias in arrangement, and the multiple via.
Preferably, the contour shape of the via is rectangle, circular or ellipse.
Preferably, via corresponding with the connecting line is completely covered in each connecting line.
The utility model embodiment provides a kind of probe block, including：Flexible circuit, drive integrated circult, and this reality
The above-mentioned probe member provided with new embodiment.
The utility model embodiment provides a kind of detection means, including chromacoder, and the detection means is also wrapped
The above-mentioned probe block of the utility model embodiment offer is provided.
The beneficial effects of the utility model：
The probe member that the utility model embodiment is provided, probe is set into the via on insulating barrier, thus via
The insulating barrier at place can play certain supporting role to the side of probe, alleviate the positive pressure of probe, improve probe stress strong
Degree, and then improve the height for making probe；Meanwhile, connecting line is set and protrudes from the one of via away from probe on the insulating layer
Side, can avoid the foreign matters such as the glass chip remained on display panel signal input terminal from drawing disconnection wiring, so as to improve spy
The service life of needle part.Meanwhile, the material of insulating barrier is changed into high temperature resistant by the probe member that the utility model embodiment is provided
Polyimides, can effectively prevent that insulating barrier and connecting line from occurring the phenomenon burnt out due to hot-spot.
Brief description of the drawings
Fig. 1 is the side structure schematic view of probe member in the prior art；
The side structure schematic view for the probe member that Fig. 2 provides for the utility model embodiment；
Fig. 3 A are via that the utility model embodiment is provided overlooking the structure diagram arranged in parallel；
The overlooking the structure diagram for the via Heterogeneous Permutation that Fig. 3 B provide for the utility model embodiment；
The overlooking the structure diagram for the probe member bottom that Fig. 4 provides for the utility model embodiment.
Embodiment
Below in conjunction with the accompanying drawing in the utility model embodiment, the technical scheme in the utility model embodiment is carried out
Clearly and completely describe, it is clear that described embodiment is only a part of embodiment of the utility model, be not whole realities
Apply example.Based on the embodiment in the utility model, those of ordinary skill in the art institute under the premise of creative work is not made
The every other embodiment obtained, belongs to the scope of the utility model protection.
Wherein, the size and shape of each structure does not reflect its actual proportions in accompanying drawing, and purpose is schematically illustrate reality
With new content.
Probe in the probe member that the utility model embodiment is related to refer to the need for on display panel to be detected
Signal input terminal directly contact, for its provide detection signal body sections；Connecting line refer in lighting detection process
In, detection signal and the signal conductor being connected with probe can be transmitted for display panel to be detected；What insulating barrier referred to is used to hold
Carry probe and connecting line and the film for playing certain insulating effect；Above-mentioned probe, connecting line and insulating barrier are simply according to its effect
The title risen, can also make other titles into.
A kind of probe member that the utility model embodiment is provided, is existing primarily directed to the probe member of film-type
On the basis of some probe members, redesign optimization is carried out to its structure, and then the height of probe member middle probe can be increased
Structure in degree, the utility model is applied to be provided with any probe member of insulating barrier.Its concrete structure is carried out below detailed
Thin explanation.
As shown in Fig. 2 the side structure schematic view of the probe member provided for the utility model embodiment；The probe member
Including：Insulating barrier 201, probe 202, and connecting line 203；Wherein, insulating barrier 201 is provided with via 204；Connecting line 203 is set
It is placed in a surface of insulating barrier 201；Probe 202 is arranged in via 204, and one end protrudes from via 204, the other end and connection
Line 203 is connected.
In the specific implementation, due to the probe and connecting line of probe member in the prior art be respectively provided with it is close on the insulating layer
The side of display panel to be detected, therefore the limited height that probe can be set, have impact on probe member service life.Thus originally
The probe member that utility model embodiment is provided, probe is set into the via on insulating barrier, and insulating barrier at via can be with
Certain supporting role is played to the side of probe, alleviates the positive pressure of probe, probe is improved by force intensity, and then improve making
The height of probe；Meanwhile, connecting line is set to the side for protruding from via away from probe on the insulating layer, display surface can be avoided
The foreign matters such as the glass chip remained on partitioned signal input terminal draw disconnection wiring, so as to improve the service life of probe member.
Wherein, number of vias and position on the insulating layer is set, can be according to required for display panel to be detected
Number of probes and position are adjusted and set.
In the specific implementation, the probe member that the utility model embodiment is provided, insulating barrier 201 has been arranged on by probe
In via 204, as shown in Fig. 2 probe 202 protrudes from the side of via 204, that is, need directly to contact with display panel to be detected
One end a, its structure protrudes from the upper surface of insulating barrier 201 in Fig. 2；The bottom of probe 202, that is, need what is be connected with connecting line
One end b, its structure is flushed with the lower surface of insulating barrier 201, and is connected with the connecting line 203 for being arranged on the lower surface of insulating barrier 201.
Due in the prior art, the height of probe is generally located on 0.006mm-0.012mm, thus from different display surfaces
During plate contact carries out reperformance test, thus probe abrasion is easily caused, and then influence the use longevity of probe member
Life.
Further, in order to improve the service life of probe member, the probe member that the utility model embodiment is provided
Structure, can increase the height of probe setting.Preferably, the height that probe protrudes from via is 0.015mm-0.03mm.Thus
In use, even if there is the situation that probe weares and teares, the higher probe of height can also test more number of times, and then extend
The service life of probe member.
In addition, although probe member middle probe and the structure of connecting line that the utility model embodiment is provided improve to some extent,
But it makes material used and does not have particular/special requirement.
However, the material of insulating barrier is generally polyethylene terephtalate in the prior art, its heat resistance is
80 DEG C, in order to improve the heat resistance of insulating barrier, preferably, the material of insulating barrier is polyimides.It can have 300 DEG C
Heat resistance, can effectively prevent that insulating barrier and connecting line from occurring the phenomenon burnt out due to hot-spot.
In the specific implementation, the height of probe is uprised, and its specific cross sectional shape can be configured as needed.Compared with
Good, probe is rectangle in the cross sectional shape on surface of insulating layer direction, or trapezoidal.As shown in Fig. 2 probe 202
Shape is the cross sectional shape on surface of insulating layer direction, can be rectangle as depicted, it can also be provided that visiting
Pin protrudes from wider trapezoidal of the narrower of via, low side, naturally it is also possible to be arranged as required to as other arbitrary shapes.
In the specific implementation, multiple probes can be typically set on each probe member, and accordingly, the utility model is implemented
The probe member that example is provided can include multiple vias for being used to set probe.Because via is for setting probe, thus
Spacing and lead between the position of via and arrangement mode, the lead that can be inputted according to signal on display panel to be detected
The parameter such as line width be configured.
For example, the spacing that the spacing between two probes is depended between two leads again.In order to prevent due to probe mistake
Width, and cause a probe while touching the lead that signal on two display panels to be detected is inputted, the width of probe is (i.e.
The width in hole) it is necessarily less than the spacing between two leads.
It is described below the arrangement mode of two kinds of vias, but the via in the utility model is not limited in both arrangement sides
Formula, can also be arranged as required to as other arrangement modes.
The first, it is arranged in parallel.
Preferably, probe member includes multiple vias, multiple vias are on the insulating layer according to the first predetermined interval parallel
Row.
Specifically, in order to easy to make, the spacing between two probes is met require on the premise of, as shown in Figure 3A,
The via that there is provided for the utility model embodiment overlooking the structure diagram arranged in parallel；The figure protrudes from via from probe member
Structural representation when side (i.e. when lighting is detected close to one end of display panel to be detected) is overlooked, can be by multiple vias
It is evenly distributed according to the first predetermined interval d1, and multiple vias are parallel to each other, then it is corresponding to set probe in the vias also to put down
Row arrangement.
But via shown in Fig. 3 A mode arranged in parallel, due to the width limit by the corresponding connecting line of via
System, thus need to keep a determining deviation between via, it is typically at least equal with the width of via.It can thus be made between via
The minimum spacing (i.e. the first predetermined interval d1) of work is generally capable of up to 9-11 μm, accordingly, via probe portion arranged in parallel
Part, can only also detect display panel of the minimum spacing between the lead for treating signal input between 9-11 μm.
If wanting to realize the detection of the display panel of the smaller spacing of lead of signal input, the arrangement of via can be suitably adjusted
Mode.
Second, Heterogeneous Permutation.
Preferably, probe member includes multiple vias, multiple vias are arranged according to the second predetermined interval d2 on the insulating layer,
And per Heterogeneous Permutation between continuous two or more vias in multiple vias.
Specifically, the detection of the display panel in order to realize the smaller spacing of lead that signal is inputted is, it is necessary to reduce two spies
Spacing between pin, that is, need to reduce the spacing between two vias.
As shown in Figure 3 B, the overlooking the structure diagram of the via Heterogeneous Permutation provided for the utility model embodiment；The figure
It is also to be protruded from from probe member when via side (i.e. when lighting is detected close to one end of display panel to be detected) is overlooked
Structural representation, can be by continuous two vias according to the second predetermined interval d2 Heterogeneous Permutations, the second predetermined interval now
What d2 can be set is less than the first predetermined interval d1, accordingly, sets probe in the vias also Heterogeneous Permutation.Meanwhile, dislocation
It is arranged in parallel between via afterwards, that is, form in Fig. 3 parallel two and be drained through hole.
(i.e. second presets the level interval that can be made between the mode of via Heterogeneous Permutation as shown in Figure 3 B, via
Interval d2) it may be generally less than 9 μm, it might even be possible to 4.5 μm are reached, accordingly, the probe member of via Heterogeneous Permutation can also
For detecting the display panel for being smaller than 9 μm between the lead for treating signal input.
Further, it can also be arranged as required to carry out Heterogeneous Permutation between continuous three or multiple vias,
And the later via that misplaces can be arranged in parallel as Fig. 3 B, not parallel it can also arrange, the mode of specific Heterogeneous Permutation
There can be a variety of forms, not limit herein.
Further, the shape for the via seen in the contour shape of via, i.e. Fig. 3 A and Fig. 3 B, can set as needed
The probe shape put is configured.Preferably, the contour shape of via is rectangle, circular or ellipse.
As shown in figure 4, the overlooking the structure diagram of the probe member bottom provided for the utility model embodiment；From probe
203 are in structural representation when component bottom ends (i.e. one end away from display panel to be detected when lighting is detected) are overlooked, figure
The figure of connecting line, connecting line is arranged on a side surface of insulating barrier 201, a plurality of connecting line is included shown in figure, wherein connecting
The corresponding dotted line frame in wiring lower end represents the position of via 204.
Typically multiple probes can be set on each probe member, accordingly, each probe is correspondingly arranged on a company
Wiring.In order that connecting line preferably can detect signal for probe transmission, preferably, each connecting line is completely covered and the company
The corresponding via of wiring.I.e. as shown in figure 4, connecting line is completely covered by the profile of via 204, and then make the bottom of probe can be with
Completely attached to connecting line.
Based on same design, a kind of probe block is additionally provided in the utility model embodiment, including：Flexible circuit, driving
Integrated circuit, and the above-mentioned probe member that the utility model embodiment is provided.Due to the probe block solve problem principle with
Any of the above-described probe member that the utility model embodiment is provided is similar, and therefore, the implementation of the probe block may refer to above-mentioned
The implementation of one probe member, repeats part and repeats no more.
Based on same design, a kind of detection means, including chromacoder are additionally provided in the utility model embodiment,
Detection means also includes the above-mentioned probe block that the utility model embodiment is provided.Due to the detection means solve problem principle with
Any of the above-described probe block that the utility model embodiment is provided is similar, and therefore, the implementation of the detection means may refer to above-mentioned
The implementation of one probe block, repeats part and repeats no more.
In summary, the probe member that the utility model embodiment is provided, probe is set into the via on insulating barrier,
Thus the insulating barrier at via can play certain supporting role to the side of probe, alleviate the positive pressure of probe, improve and visit
Pin is improved the height for making probe by force intensity；Meanwhile, connecting line is set and protruded from the insulating layer away from probe
The side in hole, can avoid the foreign matters such as the glass chip remained on display panel signal input terminal from drawing disconnection wiring, so as to carry
The high service life of probe member.Meanwhile, the material of insulating barrier is changed into by the probe member that the utility model embodiment is provided
Resistant to elevated temperatures polyimides, can effectively prevent that insulating barrier and connecting line from occurring the phenomenon burnt out due to hot-spot.
Obviously, those skilled in the art can carry out various changes and modification without departing from this practicality to the utility model
New spirit and scope.So, if it is of the present utility model these modification and modification belong to the utility model claim and
Within the scope of its equivalent technologies, then the utility model is also intended to comprising including these changes and modification.
Claims (10)
1. a kind of probe member, it is characterised in that including：Insulating barrier, probe, and connecting line；Wherein,
The insulating barrier is provided with via；The connecting line is arranged at a surface of the insulating barrier；The probe is arranged on institute
State in via, and one end protrudes from the via, the other end and is connected with the connecting line.
2. probe member as claimed in claim 1, it is characterised in that the material of the insulating barrier is polyimides.
3. probe member as claimed in claim 1, it is characterised in that the height that the probe protrudes from the via is
0.015mm-0.03mm。
4. probe member as claimed in claim 1, it is characterised in that the probe is perpendicular to the surface of insulating layer direction
On cross sectional shape be rectangle, it is or trapezoidal.
5. probe member as claimed in claim 1, it is characterised in that the probe member includes multiple vias, the multiple
Via is on the insulating barrier according to the first spaced and parallel arrangement.
6. probe member as claimed in claim 1, it is characterised in that the probe member includes multiple vias, the multiple
Via is spaced on the insulating barrier according to second, and per between continuous two or more vias in the multiple via
Heterogeneous Permutation.
7. probe member as claimed in claim 1, it is characterised in that the contour shape of the via is rectangle, circular or ellipse
It is circular.
8. probe member as claimed in claim 1, it is characterised in that each connecting line is completely covered with being connected this described
The corresponding via of line.
9. a kind of probe block, it is characterised in that including：Flexible circuit, drive integrated circult, and as appointed in claim 1-8
Probe member described in one.
10. a kind of detection means, including chromacoder, it is characterised in that the detection means also includes such as claim 9
Described probe block.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201720017211.5U CN206321903U (en) | 2017-01-05 | 2017-01-05 | A kind of probe member, probe block and detection means |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201720017211.5U CN206321903U (en) | 2017-01-05 | 2017-01-05 | A kind of probe member, probe block and detection means |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN206321903U true CN206321903U (en) | 2017-07-11 |
Family
ID=59261119
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201720017211.5U Expired - Fee Related CN206321903U (en) | 2017-01-05 | 2017-01-05 | A kind of probe member, probe block and detection means |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN206321903U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106773178A (en) * | 2017-01-05 | 2017-05-31 | 合肥鑫晟光电科技有限公司 | A kind of probe member and preparation method thereof and probe block and detection means |
| CN109425818A (en) * | 2017-09-04 | 2019-03-05 | 中华精测科技股份有限公司 | Probe card device and its rectangular probe |
-
2017
- 2017-01-05 CN CN201720017211.5U patent/CN206321903U/en not_active Expired - Fee Related
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106773178A (en) * | 2017-01-05 | 2017-05-31 | 合肥鑫晟光电科技有限公司 | A kind of probe member and preparation method thereof and probe block and detection means |
| CN106773178B (en) * | 2017-01-05 | 2023-06-09 | 合肥鑫晟光电科技有限公司 | Probe part, manufacturing method thereof, probe block and detection device |
| CN109425818A (en) * | 2017-09-04 | 2019-03-05 | 中华精测科技股份有限公司 | Probe card device and its rectangular probe |
| CN109425818B (en) * | 2017-09-04 | 2020-09-08 | 中华精测科技股份有限公司 | Probe card device and rectangular probe thereof |
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| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20170711 |
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| CF01 | Termination of patent right due to non-payment of annual fee |