CN206114812U - A full automatic checkout device for opto -electronic device high low temperature test - Google Patents
A full automatic checkout device for opto -electronic device high low temperature test Download PDFInfo
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- CN206114812U CN206114812U CN201621185578.XU CN201621185578U CN206114812U CN 206114812 U CN206114812 U CN 206114812U CN 201621185578 U CN201621185578 U CN 201621185578U CN 206114812 U CN206114812 U CN 206114812U
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- electronic device
- industrial computer
- control circuit
- optoelectronic device
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- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The utility model discloses a full automatic checkout device for opto -electronic device high low temperature test, including the industrial computer and place opto -electronic device's environmental test case, the industrial computer pass test the line connection and have ON -OFF control circuit, ON -OFF control circuit pass test the line and be connected with the environmental test case, the environmental test case pass through the net twine and be connected with the industrial computer, ON -OFF control circuit on be connected with DC power supply, the utility model discloses can be for a long time carry out full automated inspection to opto -electronic device's high low temperature characteristics, saved greatly and criticized the manpower resources of producing the opto -electronic device high low temperature test process and consuming, can effectively reduce opto -electronic device's experimentation cost, and the utility model discloses a running state of automatic acquisition analysis environmental test case, reasonable controlgear's running state provides assessment analysis to opto -electronic device's running state after the off -test, really realizes the automatic function that detects, adopts man -machine interface moreover, easy operation.
Description
Technical field
This utility model belongs to optoelectronic device technical field, and in particular to a kind of for the complete of optoelectronic device thermocycling
Automatic detection device.
Background technology
Optoelectronic device is to ensure its reliability dispatched from the factory, it usually needs carry out strict environmental test, wherein high/low temperature work
It is an important indicator as characteristic.When being produced in batches, it is one very loaded down with trivial details that thermocycling is carried out to every equipment
Work, except need determine whether there is electric fault, in addition it is also necessary to the working condition of each equipment is judged, pair therefore
Barrier or working condition are unsatisfactory for the equipment of index to be needed to reject in time.
The time of thermocycling mostly was between a few houres to tens hours, if artificially going to enter each equipment successively
The time-consuming inefficiency again of performing check, it is therefore necessary to design a set of fully-automated synthesis for optoelectronic device thermocycling and fill
Put.
Utility model content
The purpose of this utility model is that, according to the deficiencies in the prior art, design is a kind of to be used for optoelectronic device thermocycling
Full-automatic detection apparatus, the device can carry out Aulomatizeted Detect to the environmental work characteristic of batch optoelectronic device.
This utility model solves the technical scheme that its technical problem adopted：One kind is used for optoelectronic device thermocycling
Full-automatic detection apparatus, including industrial computer and place the environmental test chamber of optoelectronic device, described industrial computer passes through one
P-wire is connected with ON-OFF control circuit, and described ON-OFF control circuit is connected by many p-wires with environmental test chamber, institute
The environmental test chamber stated is connected by netting twine with industrial computer, and in described ON-OFF control circuit DC source is connected with.
A kind of described full-automatic detection apparatus for optoelectronic device thermocycling, its ON-OFF control circuit includes supplying
The collecting of electrical controls, current monitoring part and communication management part.
A kind of described full-automatic detection apparatus for optoelectronic device thermocycling, its ON-OFF control circuit is by polylith
Singlechip group into.
A kind of described full-automatic detection apparatus for optoelectronic device thermocycling, are provided with control on its industrial computer
Panel.
The beneficial effects of the utility model are：
1st, this utility model can carry out fully-automated synthesis to the property at high and low temperature of optoelectronic device for a long time, greatly save
The human resourcess that product optoelectronic device thermocycling process is consumed are criticized, the experimentation cost of optoelectronic device can be effectively reduced.
2nd, this utility model can be tentatively judged the electric fault of every optoelectronic device, can in process of the test from
It is dynamic to reject faulty equipment.
3rd, this utility model can treat the result of the test of testing photoelectronic equipment and carry out statistical analysiss.
4th, this utility model adopts human-computer interaction interface, simple to operate.
Description of the drawings
Fig. 1 is structural representation of the present utility model；
Fig. 2 is workflow schematic diagram of the present utility model；
Fig. 3 is controlling interface schematic diagram of the present utility model；
Fig. 4 is process of self-test flow chart of the present utility model；
Fig. 5 is operation detection process flow diagram flow chart of the present utility model.
Each reference is：1-industrial computer, 2-DC source, 3-ON-OFF control circuit, 4-environmental test chamber.
Specific embodiment
This utility model is described in further detail below in conjunction with the accompanying drawings.
With reference to shown in Fig. 1, the utility model discloses a kind of fully-automated synthesis for optoelectronic device thermocycling are filled
Put, including industrial computer 1 and place the environmental test chamber 4 of optoelectronic device, described industrial computer 1 is connected with by a p-wire
ON-OFF control circuit 3, described ON-OFF control circuit 3 is connected by many p-wires with environmental test chamber 4, described environment examination
Tryoff 4 is connected by netting twine with industrial computer 1, and the control to the mode of operation of environmental test chamber 4 is realized by the interactive program for compiling
And the monitoring to its working condition, DC source 2 is connected with described ON-OFF control circuit 3, wherein industrial computer 1 is used as this
The core of detection means（Brain）, by netting twine control and the running status of monitoring of environmental proof box 4, and running status is carried out
Discriminatory analysis, sends to ON-OFF control circuit 3 when running status reaches test request and instructs, and controls the work shape of optoelectronic device
State, ON-OFF control circuit 3 receives the instruction sent by control software on industrial computer 1, according to the operation shape of instruction device under test
State is controlled.
Described ON-OFF control circuit 3 includes power supply control part, current monitoring part and communication management part, effect
For：The break-make electricity condition of optoelectronic device to be measured is controlled, the operating current of optoelectronic device to be measured is monitored and is judged, controlled to be measured
The information exchange of optoelectronic device and industrial computer 1.
Described ON-OFF control circuit 3 is by polylith singlechip group into respectively to the power supply control and communication pipe of each passage
Reason, is capable of achieving multichannel power supply control simultaneously, also can all the way carry out independent power supply control to certain.
Control panel is provided with described industrial computer 1, described control panel is write by graphical author language, can
Temperature bound, temperature interval, temperature retention time and channel number to environmental test is configured, can be real to test result
When show.
This detection means is also provided with self-checking function, and can treat the failure of light-metering electric equipment carries out preliminary judgement process.
Fig. 2 is the workflow diagram of full-automatic detection apparatus, and the workflow of this monitoring device is as follows：
Industrial computer 1 is connected by netting twine with environmental test chamber 4, can control and detect the operation work of environmental test chamber 4
State.Test parameter is configured first, temperature bound, temperature retention time, the temperature of thermocycling are arranged by industrial computer 1
Degree interval and number of active lanes（That is optoelectronic device number）, after completing the setting to test parameter, click on the beginning of control panel
Button, full-automatic detection apparatus operation, light-metering electric equipment was treated before this carries out self-inspection, it is therefore an objective to detect the electricity of optoelectronic device to be measured
Stream it is whether normal and whether can normal work, ON-OFF control circuit 3 monitors the operating current of optoelectronic device to be measured, to failure
Equipment is judged that failure is designated as respectively error1 and error2, then failure cause is sent to industrial computer 1, and cuts off event
Barrier equipment is powered；Complete the control of industrial computer 1 environmental test chamber 4 after self-inspection to run, and the operation by network interface to environmental test chamber 4
Status real time monitor, when temperature meets test condition, treats light-metering electric equipment and is tested successively, and result of the test is carried out
Record, is outputed test result after off-test by industrial computer 1.
Fig. 3 is the schematic diagram of this detection means control panel, and it is write by graphical author language, is installed on industrial computer
On, effect is：Test parameterss are configured, testing process is controlled, result of the test is recorded.
Fig. 4 is this detection means process of self-test flow chart, and industrial computer 1 carries out logical judgment, on-off control to self-checking command
Circuit 3 is controlled except the power supply state and running status for the treatment of light-metering electric equipment, while being also required to treat light-metering electric equipment
Operating current be monitored, failure cause is judged, and send result to industrial computer 1, remembered by industrial computer 1
Record.After program operation, current channel is set to 1 by industrial computer 1, and sends an instruction to ON-OFF control circuit 3, on-off control electricity
Road 3 is opened respective channel optoelectronic device to be measured and is powered and data communication facility, and whether monitor electric current under the state normal, if
Electric current is abnormal, continues executing with the self-checking command of next passage, if electric current is normal, time delay 3s, and industrial computer 1 is to photoelectricity to be measured
Equipment sends work order, and ON-OFF control circuit 3 detects whether that communication is normal, and communication normally then performs the self-inspection of next passage and refers to
Order, if communication is abnormal, failure is sent to after industrial computer 1 self-inspection for continuing executing with next passage, until whole passages are complete
Into self-inspection and make a record.
Fig. 5 is this detection means operation detection process flow diagram flow chart, and industrial computer 1 carries out logical judgment to operation detection, is switched
Control circuit 3 carries out state control and hardware monitoring to equipment.Program operation after, industrial computer 1 to enumerator, channel statuses and
State of temperature is initialized, while whether the temperature for inquiring about environmental test chamber 4 reaches assigned temperature state, environmental test chamber 4
Temperature is not up to assigned temperature and then waits 5min, continues to inquire about until meeting temperature conditionss, afterwards wait 10min causes environment to try
The temperature of tryoff 4 reaches to be stablized, and starts test, first inquires about whether current channel is faulty channel during test, if faulty channel
The passage is then jumped out, next lane testing is carried out, if the corresponding optoelectronic device electric current to be measured of the passage and communication are normal
Then open passage optoelectronic device to be measured by ON-OFF control circuit 3 to power and data communication facility, industrial computer 1 sends instruction and makes light
Electric equipment normal work, and working condition is recorded, abnormal feedback states are recorded, until all passages are held
Row is finished, and the test of next temperature spot is then carried out again, until all temperature tests are completed.
Above-described embodiment only illustrative principle of the present utility model and its effect, and the embodiment that part uses,
For the person of ordinary skill of the art, on the premise of design is created without departing from this utility model, if can also make
Dry deformation and improvement, these belong to protection domain of the present utility model.
Claims (4)
1. a kind of full-automatic detection apparatus for optoelectronic device thermocycling, it is characterised in that：Including industrial computer（1）And
Place the environmental test chamber of optoelectronic device（4）, described industrial computer（1）ON-OFF control circuit is connected with by p-wire（3）, institute
The ON-OFF control circuit stated（3）By p-wire and environmental test chamber（4）Connection, described environmental test chamber（4）By netting twine
With industrial computer（1）Connection, described ON-OFF control circuit（3）On be connected with DC source（2）.
2. a kind of full-automatic detection apparatus for optoelectronic device thermocycling according to claim 1, its feature exists
In described ON-OFF control circuit（3）Including power supply control part, current monitoring part and communication management part.
3. a kind of full-automatic detection apparatus for optoelectronic device thermocycling according to claim 2, its feature exists
In described ON-OFF control circuit（3）By polylith singlechip group into.
4. a kind of full-automatic detection apparatus for optoelectronic device thermocycling according to claim 3, its feature exists
In described industrial computer（1）On be provided with control panel.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201621185578.XU CN206114812U (en) | 2016-11-04 | 2016-11-04 | A full automatic checkout device for opto -electronic device high low temperature test |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201621185578.XU CN206114812U (en) | 2016-11-04 | 2016-11-04 | A full automatic checkout device for opto -electronic device high low temperature test |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN206114812U true CN206114812U (en) | 2017-04-19 |
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ID=58524898
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201621185578.XU Active CN206114812U (en) | 2016-11-04 | 2016-11-04 | A full automatic checkout device for opto -electronic device high low temperature test |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109960236A (en) * | 2017-12-25 | 2019-07-02 | 新智数字科技有限公司 | The test method and system of gas meter controller |
| CN110275146A (en) * | 2019-07-18 | 2019-09-24 | 北京道锐达科技有限公司 | A kind of radar the high and low temperature test system and method |
| CN111693803A (en) * | 2020-05-26 | 2020-09-22 | 日立楼宇技术（广州）有限公司 | High-low temperature damp-heat test system, test control method and fault protection method |
| CN112230121A (en) * | 2020-10-13 | 2021-01-15 | 中国电子科技集团公司第四十四研究所 | High and low temperature test system for photoelectric coupler |
| CN117310352A (en) * | 2023-11-30 | 2023-12-29 | 长春电子科技学院 | Big data analysis system and method for monitoring photoelectric equipment |
-
2016
- 2016-11-04 CN CN201621185578.XU patent/CN206114812U/en active Active
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109960236A (en) * | 2017-12-25 | 2019-07-02 | 新智数字科技有限公司 | The test method and system of gas meter controller |
| CN110275146A (en) * | 2019-07-18 | 2019-09-24 | 北京道锐达科技有限公司 | A kind of radar the high and low temperature test system and method |
| CN111693803A (en) * | 2020-05-26 | 2020-09-22 | 日立楼宇技术（广州）有限公司 | High-low temperature damp-heat test system, test control method and fault protection method |
| CN112230121A (en) * | 2020-10-13 | 2021-01-15 | 中国电子科技集团公司第四十四研究所 | High and low temperature test system for photoelectric coupler |
| CN117310352A (en) * | 2023-11-30 | 2023-12-29 | 长春电子科技学院 | Big data analysis system and method for monitoring photoelectric equipment |
| CN117310352B (en) * | 2023-11-30 | 2024-02-06 | 长春电子科技学院 | Big data analysis system and method for monitoring photoelectric equipment |
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