CN206113851U - To novel michelson interferometer appearance of measuring of refracting index - Google Patents
To novel michelson interferometer appearance of measuring of refracting index Download PDFInfo
- Publication number
- CN206113851U CN206113851U CN201621161998.4U CN201621161998U CN206113851U CN 206113851 U CN206113851 U CN 206113851U CN 201621161998 U CN201621161998 U CN 201621161998U CN 206113851 U CN206113851 U CN 206113851U
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- Prior art keywords
- splitter
- semi
- compensating plate
- transparent
- light source
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Abstract
The utility model relates to an optical experiment instrument, specifically speaking are to novel michelson interferometer appearance of measuring of refracting index, its characterized in that is equipped with light source, beam -splitter, compensation plate, speculum M2, screen, wherein beam -splitter and compensation plate are L type integral type structure, scribble transflective film on the beam -splitter, be close to on the left side light source the position be the beam -splitter, the another side be compensation plate, the right angle that two boards of beam -splitter and compensation plate formed points to the position of screen, compared with the prior art, the utility model, through the beam -splitter and compensation plate's novel michelson interferometer appearance that utilizes L type structure, the refracting index through principle of interference measurement transparent dielectric will become more effective in theory.
Description
Technical field：
This utility model is related to optical experiment instrument, specifically a kind of new Michelson of the measurement of refractive index
Interferometer.
Background technology：
Michelson's interferometer is the accurate instrument to produce two-beam interference of American physicist Michelson invention
Device.Michelson's interferometer has in history application widely, particularly has special at the aspect relevant with light path
Using.For example, the characteristics of one kind is based on Michelson's interferometer to light path accurate measurement goes to measure holographic dry plate film thickness；Also may be used
To measure elastic modelling quantity wiry.Just have before using michelson interferometer measurement transparency liquid refractive index and transparent membrane
Refractive index[4]Example, but utilize is traditional Michelson's interferometer, the measurement of traditional Michelson's interferometer
Precision it is relatively low, so measurement transparency material refractive index precision also than relatively low.
The content of the invention：
This utility model is for shortcoming and defect present in prior art, it is proposed that a kind of measurement of refractive index it is new
Type Michelson's interferometer.
This utility model can be reached by following measures：
A kind of new Michelson's interferometer of the measurement of refractive index, it is characterised in that be provided with light source, beam-splitter, compensation
Plate, reflecting mirror M2, optical screen, wherein the beam-splitter and compensating plate are L-type integral structure, scribble semi-transparent semi-reflecting on beam-splitter
Film, near the position of light source is beam-splitter on the left side, and in another side is compensating plate, and beam-splitter and the plate of compensating plate two are formed
Right angle point to optical screen position, when He-Ne laser sends directive beam-splitter from light source, be coated in semi-transparent on beam-splitter
This Shu Jiguang can be bisected into two beam laser by half anti-film, a branch of reflection directive reflecting mirror M2 through semi-transparent semi-reflecting film, after through
Through penetrating on optical screen after beam-splitter after the reflection of reflecting mirror M2, semi-transparent semi-reflecting film of the another beam of laser on beam-splitter it is saturating
The direction of rear directive compensating plate is penetrated, reflecting mirror M2 is reached after compensating plate, compensating plate is returned to after reflection at M2
And beam-splitter, this Shu Guang falls to forming interference circle on optical screen after the reflection of beam-splitter.
This utility model can make to improve the precision of the wavelength of Laser Measurement based on new Michelson's interferometer, utilize
Michelson interferometer measurement is transparent or refractive index of translucent medium becomes more have realistic meaning, using Michelson interference
Instrument determine transparent or semitransparent medium refraction index when, after the material for passing through different refractivity due to light light path be it is different,
Interference circle after optical path difference changes will disappear.This part optical path difference is exactly transparent or translucent Jie that we add
What matter caused, so having changed the transparent or translucent medium that how much can just calculate addition by calculating optical path difference
Refractive index.Position through adjusting reflecting mirror M1 after transparency material is added readjusts out interference circle, M1 movements away from
From the change that just correspond to the light path caused by the medium that we add.
Air refraction is set to into n0, dielectric thickness is set to l, and its refractive index is n, then optical path difference：Δ '=2l (n-n0).Adjust
Section M1Make to reappear interference of light annulus on optical screen.Now, by M1Displacement is set to d ', causes change in optical path length to be 2d ' n0With
Change in optical path length caused by medium is identical, then have：Δ '=2l (n-n0)=2d ' n0, i.e.,：In known film thickness
In the case of, the thickness of thin film can be substituted into the refractive index that formula tries to achieve thin film to be measured.
This utility model is relative to prior art, the beam-splitter constructed by using L-type and the new Michael of compensating plate
Inferior interferometer, will become in theory more efficient by the refractive index of principle of interference measurement transparent medium.
Description of the drawings：
Fig. 1 is structural representation of the present utility model.
Fig. 2 is measuring light path diagram of the present utility model.
Specific embodiment：
This utility model is further described below in conjunction with the accompanying drawings.
The beam-splitter and compensating plate in Michelson's interferometer is changed by original two plates being parallel to each other as shown in Figure 1
Enter the structure of the L-type being integrated, near the position of light source be beam-splitter on the left side, in another side is compensating plate, beam-splitter
The position of the right angle sensing optical screen formed with the plate of compensating plate two, when He-Ne laser sends directive beam-splitter from light source,
This Shu Jiguang can be bisected into two beam laser by the semi-transparent semi-reflecting film being coated on beam-splitter, and a branch of reflection through semi-transparent semi-reflecting film is penetrated
To reflecting mirror M2, after after the reflection of reflecting mirror through penetrating on optical screen after beam-splitter, another beam of laser is on beam-splitter
Semi-transparent semi-reflecting film transmission after directive compensating plate direction, reflecting mirror M2 is reached after compensating plate, through instead M2 at
Compensating plate and beam-splitter are returned to after penetrating, this Shu Guang falls to forming interference circle on optical screen after the reflection of beam-splitter.
Based on raising of the new Michelson's interferometer to the error of the precision of the wavelength of Laser Measurement, using Michelson
Interferometer measurement is transparent or refractive index of translucent medium becomes more have realistic meaning.We are surveyed using Michelson's interferometer
During fixed transparent or semitransparent medium refraction index, as shown in Figure 2, light path is not after the material for passing through different refractivity due to light
With, the interference circle after optical path difference changes will disappear.This part optical path difference is exactly our add transparent or half
What transparent medium caused, so having changed how much can just calculate the transparent or translucent of addition by calculating optical path difference
Medium refractive index.Position through adjusting reflecting mirror M1 after transparent or Ou Ming materials are added readjusts out interference
Annulus, the distance of M1 movements just correspond to the change of the light path caused by the medium of our additions.
As shown in Figure 2, air refraction is set to into n0, dielectric thickness is set to l, and its refractive index is n, then optical path difference：Δ′
=2l (n-n0).Adjust M1Make to reappear interference of light annulus on optical screen.Now, by M1Displacement is set to d ', causes light path
Change turns to 2d ' n0It is identical with the change in optical path length caused by medium, then have：Δ '=2l (n-n0)=2d ' n0, i.e.,：
It is known broadcast mill thickness in the case of, the thickness of thin film can be substituted into the refractive index that formula try to achieve thin film to be measured.
The beam-splitter constructed by using L-type and the new Michelson's interferometer of compensating plate, are measured by principle of interference
The refractive index of measurement transparent medium will become in theory more efficient.
Claims (1)
1. a kind of new Michelson's interferometer of the measurement of refractive index, it is characterised in that be provided with light source, beam-splitter, compensation
Plate, reflecting mirror M2, optical screen, wherein the beam-splitter and compensating plate are L-type integral structure, scribble semi-transparent semi-reflecting on beam-splitter
Film, near the position of light source is beam-splitter on the left side, and in another side is compensating plate, and beam-splitter and the plate of compensating plate two are formed
Right angle point to optical screen position, when He-Ne laser sends directive beam-splitter from light source, be coated in semi-transparent on beam-splitter
This Shu Jiguang can be bisected into two beam laser by half anti-film, a branch of reflection directive reflecting mirror M2 through semi-transparent semi-reflecting film, after through
Through penetrating on optical screen after beam-splitter after the reflection of reflecting mirror M2, semi-transparent semi-reflecting film of the another beam of laser on beam-splitter it is saturating
The direction of rear directive compensating plate is penetrated, reflecting mirror M2 is reached after compensating plate, compensating plate is returned to after reflection at M2
And beam-splitter, this Shu Guang falls to forming interference circle on optical screen after the reflection of beam-splitter.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201621161998.4U CN206113851U (en) | 2016-10-25 | 2016-10-25 | To novel michelson interferometer appearance of measuring of refracting index |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201621161998.4U CN206113851U (en) | 2016-10-25 | 2016-10-25 | To novel michelson interferometer appearance of measuring of refracting index |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN206113851U true CN206113851U (en) | 2017-04-19 |
Family
ID=58527186
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201621161998.4U Expired - Fee Related CN206113851U (en) | 2016-10-25 | 2016-10-25 | To novel michelson interferometer appearance of measuring of refracting index |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN206113851U (en) |
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2016
- 2016-10-25 CN CN201621161998.4U patent/CN206113851U/en not_active Expired - Fee Related
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20170419 Termination date: 20171025 |