CN205880059U - Inside insulation resistance's of thin -film solar cell testing arrangement - Google Patents
Inside insulation resistance's of thin -film solar cell testing arrangement Download PDFInfo
- Publication number
- CN205880059U CN205880059U CN201620188235.2U CN201620188235U CN205880059U CN 205880059 U CN205880059 U CN 205880059U CN 201620188235 U CN201620188235 U CN 201620188235U CN 205880059 U CN205880059 U CN 205880059U
- Authority
- CN
- China
- Prior art keywords
- test
- resistance
- electrode
- insulation resistance
- electrodes
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Landscapes
- Photovoltaic Devices (AREA)
Abstract
The utility model discloses an inside insulation resistance's of thin -film solar cell testing arrangement, install on the support frame and drive actuating cylinder, it is connected with the test electrode mounting bracket on actuating cylinder's the piston rod to drive, the parallelly connected test unit that sets up of a plurality of groups of fixed mounting on the test electrode mounting bracket, every group test unit includes two test electrodes, be connected with the resistance under test pilot lamp between two test electrodes of test unit, it has standard resistance to establish ties on one of them test electrode, this standard resistance goes up the parallelly connected standard resistance pilot lamp that has, a two test electrodes switch on with adjacent sub - electrode contact respectively for testing during insulation resistance value between the adjacent sub - electrode, the motion of cylinder drive test electrode mounting bracket makes the test unit. the utility model discloses can once only measure all insulation resistance and whether be greater than the requirement resistance, very big reduction test time and reduction intensity of labour can change the selective examination into and examining entirely, effectively reduce the defective products and flow to the rear end process, carry high yield.
Description
Technical field
This utility model relates to technical field of solar batteries, the test device of a kind of thin-film solar cells built-in electrical insulation resistance.
Background technology
It is deposition of transparent conductive film that silicon-base thin-film battery has a process steps in producing, as it is shown in figure 1, nesa coating is cut into a lot of sub-electrode, as shown in Figure 2 with laser afterwards.Need after cutting to test with the insulation resistance ensureing between adjacent sub-electrode more than a setting value, such as 1 megaohm (in order to discuss conveniently, tentative setting value is 1 megaohm to herein below, but actual value is not limited to 1 megaohm), as shown in Figure 3.Current thin film solar energy production line and SiGe solar energy production line are all to use circuit tester test resistance one by one, as shown in Figure 3, first bit test insulation resistance is tested at 1# with circuit tester, then bit test insulation resistance is tested at 2#, then bit test insulation resistance is tested at 3#, until all resistance tests are complete；As a example by Applied Materials's thin film solar production line, sub-electrode quantity is up to 218, needs to test 217 times, and labor intensity is the biggest；And owing to the testing time is long, the mode of sampling observation can only be used.
Copper indium gallium selenium solar cell needs to cut into molybdenum film tens sub-electrodes after deposition molybdenum film, there is also the problems referred to above.
Utility model content
The purpose of this utility model is to provide the test device of a kind of thin-film solar cells built-in electrical insulation resistance, solves prior art and uses circuit tester to test the technical problem that labor intensity is big, the testing time is long that internal series-connection set of cells insulation resistance brings one by one.
For solving above-mentioned technical problem, the technical solution adopted in the utility model is:
A kind of test device of thin-film solar cells built-in electrical insulation resistance, for testing the insulating resistance value between adjacent sub-electrode, including bracing frame, driving cylinder is installed on bracing frame, drive to connect on the piston rod of cylinder and have test electrode mount, the some groups of test cells being arranged in parallel are fixedly mounted on test electrode mount, often group test cell includes two test electrodes, insulate between test electrode with test electrode mount and be connected, two test electrodes are connected with the both positive and negative polarity of DC source respectively, connect between two test electrodes of test cell and have testing resistance display lamp, it is in series with measuring resistance on one of them test electrode, measuring resistance display lamp it is parallel with in this measuring resistance；During for testing the insulating resistance value between adjacent sub-electrode, air cylinder driven test electrode mount motion, make two test electrodes of test cell contact conducting with adjacent sub-electrode respectively.
Preferably, described testing resistance display lamp and measuring resistance display lamp are LED.
Principle of the present utility model, based on " electric resistance partial pressure principle ", i.e. acts on two resistance when a DC voltage, and ohmically applied voltage is directly proportional to resistance value.Such as DC voltage is 6V, and two resistance are respectively 1 megaohm, then acts on two ohmically voltages and is 3V.If two resistance one are 1 megaohm, another one is 2 megaohms, then acting on 1 megaohm of ohmically voltage is 2V, and acting on 2 megaohms of ohmically voltages is 4V.
This utility model uses technique scheme, has an effect will be apparent below:
1, this utility model can disposably measure all internal series-connection set of cells insulation resistances whether more than requiring resistance, is significantly reduced the testing time and reduces labor intensity.
2, sampling observation can be changed into entirely examining by this utility model, effectively reduces the flowing of defective products operation to the back-end, and can find laser board problem in time, improves yield rate.
3, this utility model test apparatus structure is simple, with low cost, and easily operated application.
4, in utility model test device, if sub-electrode width to be tested and quantity change, it is only necessary to test electrode mount is modified, and increase or reduce test electrode and display lamp.
Accompanying drawing explanation
In order to be illustrated more clearly that this utility model embodiment or technical scheme of the prior art, the accompanying drawing used required in embodiment or description of the prior art will be briefly described below, apparently, accompanying drawing in describing below is only embodiments more of the present utility model, for those of ordinary skill in the art, on the premise of not paying creative work, it is also possible to obtain other accompanying drawing according to these accompanying drawings.
Fig. 1 shows the structure of deposition of transparent conductive film in the production of this utility model hull cell.
Fig. 2 shows the structure that nesa coating cuts into some sub-electrodes.
Fig. 3 shows and tests the device of insulation resistance between adjacent sub-electrode in prior art.
Fig. 4 shows test device overall structure of the present utility model.
Structure when Fig. 5 shows test device of the present utility model for testing.
Detailed description of the invention
For making the purpose of this utility model and technical scheme clearer, below in conjunction with this utility model embodiment, the technical solution of the utility model is clearly and completely described.Obviously, described embodiment is a part of embodiment of the present utility model rather than whole embodiments.Based on described embodiment of the present utility model, the every other embodiment that those of ordinary skill in the art are obtained on the premise of without creative work, broadly fall into the scope of this utility model protection.
The test device of a kind of thin-film solar cells built-in electrical insulation resistance described in the utility model, including sub-electrode 112, glass substrate 113, nesa coating 114, bracing frame 1, drives the technical characteristics such as cylinder 2, test electrode mount 3, test electrode 4, DC source 5, testing resistance display lamp 6, measuring resistance 7, measuring resistance display lamp 8.
A kind of test device of thin-film solar cells built-in electrical insulation resistance, including bracing frame, driving cylinder is installed on bracing frame, drive to connect on the piston rod of cylinder and have test electrode mount, the some groups of test cells being arranged in parallel are fixedly mounted on test electrode mount, often group test cell includes two test electrodes, insulate between test electrode with test electrode mount and be connected, two test electrodes are connected with the both positive and negative polarity of DC source respectively, connect between two test electrodes of test cell and have testing resistance display lamp, it is in series with measuring resistance on one of them test electrode, measuring resistance display lamp it is parallel with in this measuring resistance；During for testing the insulating resistance value between adjacent sub-electrode, air cylinder driven test electrode mount motion, make two test electrodes of test cell contact conducting with adjacent sub-electrode respectively.
This utility model test philosophy, based on " electric resistance partial pressure principle ", i.e. acts on two resistance when a DC voltage, and ohmically applied voltage is directly proportional to resistance value.Such as DC voltage is 6V, and two resistance are respectively 1 megaohm, and the rated voltage of testing resistance display lamp and measuring resistance display lamp is 3V, then acts on two ohmically voltages and is 3V.If two resistance one are 1 megaohm, another one is 2 megaohms, then acting on 1 megaohm of ohmically voltage is 2V, and acting on 2 megaohms of ohmically voltages is 4V.
Test process of the present utility model:
Glass substrate to be tested is sent to the underface of bracing frame, driving cylinder is allowed to drive test electrode mount and test electrode to move downward, test electrode lower end includes spring needle, ensure to be fully contacted between test electrode and film layer to be tested, loose contact can cause resistance to increase, affecting megger test effect, electrode lower end to be tested motion puts in place and ensures, when test electrode is in close contact with sub-electrode, then to open the DC source of 6V.
Testing resistance display lamp and measuring resistance display lamp are LED, observe for convenience, and testing resistance indicating light sign can be set to green light by us, and measuring resistance indicating light sign is set to red light.
If the insulation resistance between resistance to be tested i.e. sub-electrode is more than 1 megaohm, then acting on the voltage on testing resistance display lamp and be more than 3V, green light lights, and the voltage acting on measuring resistance display lamp is less than 3V, and red light does not works, and insulation resistance is qualified.
Whereas if insulation resistance between resistance to be tested i.e. sub-electrode is less than 1 megaohm, then act on testing resistance display lamp, on voltage less than 3V, green light does not works, and acts on the voltage of measuring resistance display lamp more than 3V, and red light lights, and insulation resistance is defective.
If resistance to be tested is exactly 1 megaohm, then acting on the voltage on testing resistance display lamp and measuring resistance display lamp is all 3V, and two lamps light simultaneously, and insulation resistance is qualified.
More than in test device, requiring to be not limited to 1 megaohm to the resistance of insulation resistance, the voltage of DC source is also not limited to 6 volts, and the most any resistance is the most applicable.
Whether this utility model can disposably measure all insulation resistances more than standard value, it is significantly reduced the testing time and reduces labor intensity, and can change into sampling observation entirely examining, effectively reducing the flowing of defective products operation to the back-end, and laser board problem can be found in time, improve yield rate.
With above-mentioned according to desirable embodiment of the present utility model for enlightenment, by above-mentioned description, relevant staff can carry out various change and amendment completely in the range of without departing from this utility model technological thought.The content that the technical scope of this utility model is not limited in description, it is necessary to determine its technical scope according to right.
Claims (2)
1. the test device of a thin-film solar cells built-in electrical insulation resistance, for testing the insulating resistance value between adjacent sub-electrode, it is characterized in that, including bracing frame, driving cylinder is installed on bracing frame, drive to connect on the piston rod of cylinder and have test electrode mount, the some groups of test cells being arranged in parallel are fixedly mounted on test electrode mount, often group test cell includes two test electrodes, insulate between test electrode with test electrode mount and be connected, two test electrodes are connected with the both positive and negative polarity of DC source respectively, connect between two test electrodes of test cell and have testing resistance display lamp, it is in series with measuring resistance on one of them test electrode, measuring resistance display lamp it is parallel with in this measuring resistance；During for testing the insulating resistance value between adjacent sub-electrode, air cylinder driven test electrode mount motion, make two test electrodes of test cell contact conducting with adjacent sub-electrode respectively.
The test device of a kind of thin-film solar cells built-in electrical insulation resistance the most according to claim 1, it is characterised in that described testing resistance display lamp and measuring resistance display lamp are LED.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620188235.2U CN205880059U (en) | 2016-03-11 | 2016-03-11 | Inside insulation resistance's of thin -film solar cell testing arrangement |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620188235.2U CN205880059U (en) | 2016-03-11 | 2016-03-11 | Inside insulation resistance's of thin -film solar cell testing arrangement |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN205880059U true CN205880059U (en) | 2017-01-11 |
Family
ID=57687824
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201620188235.2U Active CN205880059U (en) | 2016-03-11 | 2016-03-11 | Inside insulation resistance's of thin -film solar cell testing arrangement |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN205880059U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2021106467A (en) * | 2019-12-26 | 2021-07-26 | 三星ダイヤモンド工業株式会社 | Inspection device and inspection method of solar cell |
| CN114325099A (en) * | 2021-11-29 | 2022-04-12 | 无锡极电光能科技有限公司 | Thin-film solar cell insulated wire resistance online testing device and method |
-
2016
- 2016-03-11 CN CN201620188235.2U patent/CN205880059U/en active Active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2021106467A (en) * | 2019-12-26 | 2021-07-26 | 三星ダイヤモンド工業株式会社 | Inspection device and inspection method of solar cell |
| JP7398097B2 (en) | 2019-12-26 | 2023-12-14 | 三星ダイヤモンド工業株式会社 | Solar cell inspection device and method |
| CN114325099A (en) * | 2021-11-29 | 2022-04-12 | 无锡极电光能科技有限公司 | Thin-film solar cell insulated wire resistance online testing device and method |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN105911446B (en) | IGBT ageing states monitoring method and device | |
| CN106290366A (en) | A kind of real-time observation device causing experiment for electric branch | |
| CN205880059U (en) | Inside insulation resistance's of thin -film solar cell testing arrangement | |
| CN104882094A (en) | OLED panel drive circuit, drive method and display device | |
| CN105445347A (en) | Vertical electrochemical battery device for in-situ photodynamic measurement | |
| CN104931830A (en) | Electronic cigarette host test fixture | |
| CN102288852A (en) | Wire testing device | |
| CN105807189A (en) | Test device and test method for local discharge development process of superconducting insulating material | |
| CN205898695U (en) | A real -time observation device that is used for initiation of electric branch to test | |
| CN204632314U (en) | A kind of oled panel | |
| CN203299358U (en) | Aging test device of LED street lamp | |
| CN201145730Y (en) | Device for detecting circuit board of vehicle mounted charger of electric automobile | |
| CN102393500B (en) | Test method for diode pair with common-cathode or common-anode packaging mode | |
| CN203299356U (en) | Aging test device of LED daylight lamp tube | |
| CN201514458U (en) | Automatic multi-core cable detection device | |
| CN202305770U (en) | Power supply ageing tester | |
| CN204705684U (en) | A kind of electronic cigarette host test tool | |
| CN202196134U (en) | 110V control circuit grounding monitoring device of diesel locomotive | |
| CN204462351U (en) | A kind of direct supply quality visual inspection device | |
| CN206945762U (en) | Probe unit test fixture | |
| CN204789917U (en) | Photovoltaic controller detecting system | |
| CN103760478A (en) | High-repeatability standard creeping discharge model device | |
| CN104749523A (en) | Device for acquiring electrical characteristics of lithium battery pack | |
| CN208350913U (en) | A kind of high temperature power-up aging equipment of photelectric receiver | |
| CN108303631B (en) | Silicon controlled rectifier testing device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant |