CN105807189A - Test device and test method for local discharge development process of superconducting insulating material - Google Patents
Test device and test method for local discharge development process of superconducting insulating material Download PDFInfo
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- CN105807189A CN105807189A CN201410838626.XA CN201410838626A CN105807189A CN 105807189 A CN105807189 A CN 105807189A CN 201410838626 A CN201410838626 A CN 201410838626A CN 105807189 A CN105807189 A CN 105807189A
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Abstract
The invention provides a test device and a test method for a local discharge development process of a superconducting insulating material. A local discharge platform connected with standard electrodes is designed, wherein the standard electrodes are used for connecting a test device for a superconducting composite insulating test product, liquid nitrogen and nitrogen are added to a container special for low-temperature test, the two standard electrodes connected to two ends of the local discharge platform are separately connected to two ends of the superconducting composite insulating test product, the local discharge development process is tested according to a test scheme and the test result is recorded on line. Compared with the prior art, the test device and the test method meet the mechanism study requirement of a low-temperature insulating material in a superconducting device. The test device is reasonable in functional design, the test method is clear and accurate in structural distribution, and the test device and the test method can well test the local discharge development process of medium and high voltage levels of the low-temperature composite insulating material in the overcool liquid nitrogen temperature zone.
Description
Technical field
The present invention relates to low temperature and superconductor applications technical field, in particular to assay device and the test method of a kind of superconducting insulation material shelf depreciation evolution.
Background technology
Along with the development of Superconducting Power Technology, the electric pressure of superconducting apparatus also improves constantly, and the requirement of superconducting insulation material is also more and more stricter.The quality of superconducting insulation material decides the running status of superconduction electrical equipment, if superconducting insulation material internal or surface also exist locality defect, partial discharge phenomenon in use will occur, thus causing the electrolyte of insulation aging, arriving and to a certain degree can cause puncturing and damaging of superconduction electrical equipment afterwards.
Therefore, Partial Discharge Detection has important effect for the invisible defect in discovery low temperature insulation material and failure mechanism.Shelf depreciation for overfreezing liquid nitrogen warm area is tested, particularity due to superconducting power apparatus structure, the on-line checking of superconducting insulation material and spare unit are changed has higher difficulty, currently without relevant test device and method of testing, therefore cannot obtain corresponding outcome evaluation and diagnosis scheme.
Development along with Superconducting Power Technology, find that the invisible defect in superconducting insulation material and failure mechanism problem are more and more urgent in time, therefore, how to find the partial discharge phenomenon in superconducting insulation material in time, thus avoiding puncturing and damaging of superconduction electrical equipment, it is those skilled in the art's technical problems urgently to be resolved hurrily.
Summary of the invention
In view of this, the present invention provides assay device and the test method of a kind of superconducting insulation material shelf depreciation evolution, meets the study mechanism requirement of low temperature insulation material in superconducting device.This assay device functional design is reasonable, this test method structure distribution is clearly accurate, it is possible to well realize the shelf depreciation evolution test of low temperature composite insulating material high voltage appearance grade under overfreezing liquid nitrogen warm area.
The assay device of superconducting insulation material shelf depreciation evolution under liquid nitrogen temperature, described assay device includes shelf depreciation platform and low-temperature test special container, and described shelf depreciation platform is connected with normal electrode；Described normal electrode is used for connecting superconduction compound inslation test product.
Preferably, one end of described shelf depreciation platform is connected with earthed switch, ground terminal and a normal electrode successively, and its other end is connected with isolation switch, high-field electrode and another normal electrode successively.
Preferably, described shelf depreciation platform includes testing transformer, capacitive divider, partial discharge test instrument, operating board, voltage adjusting device and data acquisition and process system, and described capacitive divider is in parallel with described shelf depreciation platform.
Preferably, described low-temperature test special container is foaming machine, and its upper end is provided with the glass window being flexibly connected with it, and its outer wall is provided with high-speed motion picture camera.
Preferably, described superconduction compound inslation test product is a kind of insulant with liquid nitrogen compound in the film type insulant of polyimides, politef, epoxy resin and PPLP；Described normal electrode be circular arc to plate electrode, triangle pair plate electrode or plate to plate electrode.
The test method of a kind of liquid nitrogen temperature superconducting insulation material shelf depreciation evolution, described test method comprises the steps:
1) the shelf depreciation platform being connected with normal electrode under overfreezing liquid nitrogen warm area and low-temperature test special container are placed in screened room；
2) experimental enviroment of low-temperature test special container is debugged；
3) in low-temperature test special container, liquid nitrogen and nitrogen are added；
4) 2 normal electrodes being connected to shelf depreciation platform two ends are connected to the two ends of superconduction compound inslation test product；
5) the superconduction compound inslation test product after being connected with normal electrode is positioned in the liquid nitrogen of low-temperature test special container；
6) glass window on the upper end cover of low-temperature test special container；
7) test the online record result of the test of shelf depreciation evolution is carried out according to testing program；
8) off-line carries out data analysis printed report.
Preferably, step 2) in, the mode of the experimental enviroment of debugging low-temperature test special container is for carry out evacuation dried to described low-temperature test special container.
Preferably, step 3) in, the liquid nitrogen added in low-temperature test special container and the volume of nitrogen are the 1/2 of the volume of low-temperature test special container.
Preferably, step 7) when carrying out shelf depreciation evolution test according to testing program, according to being arranged on low-temperature test special container outer wall, process of the test is observed and record by high-speed motion picture camera；
The concrete mode of described testing program is: superconduction compound inslation test product uniformly boosted 1kV with the interval every 5 minutes, and record the partial discharge quantity after uniformly boosting, if if superconduction compound inslation test product does not puncture after 5 minutes, continuation stops test after being at the uniform velocity forced into superconduction compound inslation test product generation edge flashing.
Preferably, step 7) described in online record shelf depreciation evolution result of the test be carry out in process in test, by optical fiber, the local discharge signal obtained in test is sent to computer, by computer real time record result of the test.
Can be seen that from above-mentioned technical scheme, the assay device of superconducting insulation material shelf depreciation evolution provided by the invention and test method, devising a kind of shelf depreciation platform being connected with normal electrode, wherein normal electrode is for connecting the assay device of superconduction compound inslation test product and adding liquid nitrogen and nitrogen in low-temperature test special container, 2 normal electrodes being connected to shelf depreciation platform two ends are connected to the two ends of superconduction compound inslation test product and carry out the test of shelf depreciation evolution the test method of online record result of the test according to testing program.Compared to the prior art, assay device provided by the invention and test method, meet the study mechanism requirement of low temperature insulation material in superconducting device.This assay device functional design is reasonable, this test method structure distribution is clearly accurate, it is possible to well realize the shelf depreciation evolution test of low temperature composite insulating material high voltage appearance grade under overfreezing liquid nitrogen warm area.
With immediate prior art ratio, the invention have the benefit that
1, technical scheme provided by the invention, the shelf depreciation platform being connected with normal electrode in assay device, wherein normal electrode is for connecting the design of superconduction compound inslation test product, this assay device is made can accurately to obtain the shelf depreciation parameter of superconduction compound inslation test product, thus avoiding puncturing and damaging because of the aging superconduction electrical equipment caused of the electrolyte of superconduction compound inslation test product, it is ensured that the work safety of superconduction electrical equipment and working life.
2, technical scheme provided by the invention, adopt and low-temperature test special container adds liquid nitrogen and nitrogen, the test method of the two ends that 2 normal electrodes being connected to shelf depreciation platform two ends are connected to superconduction compound inslation test product and the test carrying out shelf depreciation evolution according to testing program online record result of the test, allow to the invisible defect and the failure mechanism that accurately find in low temperature insulation material, and then corresponding outcome evaluation and diagnosis scheme can be obtained, thus avoiding puncturing and damaging because of the aging superconduction electrical equipment caused of the electrolyte of superconduction compound inslation test product, ensure that the work safety of superconduction electrical equipment and working life.
3, technical scheme provided by the invention, the setting of capacitive divider adds the convenience of voltage detecting, saves the time cost of test and adds the accuracy of test.
4, technical scheme provided by the invention, the use of isolation switch and earthed switch better control office can put test instrunment, it is ensured that the safety of experiment and high efficiency.
5, technical scheme provided by the invention, all experiment test instruments are both placed in screened room to connect, it is possible to effectively shield external interference, improve the accuracy of test.
6, technical scheme provided by the invention, off-line carries out the setting of data analysis, is the experimental result of acquirement be analyzed when departing from high-potting environment, it is ensured that the safety of experimenter.
7, technical scheme provided by the invention, is widely used, and has significant Social benefit and economic benefit.
Accompanying drawing explanation
In order to be illustrated more clearly that the embodiment of the present invention or technical scheme of the prior art, the accompanying drawing used required in embodiment or description of the prior art will be introduced briefly below, apparently, accompanying drawing in the following describes is only some embodiments of the present invention, for those of ordinary skill in the art, under the premise not paying creative work, it is also possible to obtain other accompanying drawing according to these accompanying drawings.
Fig. 1 is the shelf depreciation platform schematic diagram of the assay device of the superconducting insulation material shelf depreciation evolution of the present invention.
Fig. 2 is the low-temperature test test chamber schematic diagram of the assay device of the superconducting insulation material shelf depreciation evolution of the present invention.
Fig. 3 is the schematic diagram of the test method using superconducting insulation material shelf depreciation evolution of the present invention.
Fig. 4 is the experimental provision schematic diagram during test method using superconducting insulation material shelf depreciation evolution of the present invention.
Wherein, 1-superconduction compound inslation test product, 2-normal electrode, 3-low-temperature test special container, 4-glass window, 5-high-speed camera, 6-high-field electrode, 7-ground terminal, 8-liquid nitrogen, 9-nitrogen, 10-partial discharge test platform, 11 capacitive dividers, 12 isolation switches, 13 earthed switches.
Detailed description of the invention
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is clearly and completely described, it is clear that described embodiment is only a part of embodiment of the present invention, rather than whole embodiments.Based on embodiments of the invention, the every other embodiment that those of ordinary skill in the art obtain under not making creative work premise, broadly fall into the scope of protection of the invention.
If Fig. 1 is to shown in 2, under the liquid nitrogen temperature of the present invention, the assay device of superconducting insulation material shelf depreciation evolution includes shelf depreciation platform 10 and low-temperature test special container 3, and shelf depreciation platform 10 is connected with normal electrode 2；Normal electrode 2 is used for connecting superconduction compound inslation test product 1；One end of shelf depreciation platform 10 is connected with earthed switch 13, ground terminal 7 and a normal electrode 2 successively, and its other end is connected with isolation switch 12, high-field electrode 6 and another normal electrode 2 successively.
Wherein, shelf depreciation platform 10 include capacitive divider 11 and testing transformer not shown in the diagram, partial discharge test instrument, operating board, voltage adjusting device and data acquisition and process system, capacitive divider 11 is in parallel with shelf depreciation platform 10；
Low-temperature test special container 2 is foaming machine, and its upper end is provided with the glass window 4 being flexibly connected with it, and its outer wall is provided with high-speed motion picture camera 5；
Superconduction compound inslation test product 1 is the insulant of a kind of and liquid nitrogen compound in the film type insulant of polyimides, politef, epoxy resin and PPLP；
Normal electrode 2 adopts circular arc to plate electrode, triangle pair plate electrode or plate to plate electrode.
As shown in Figs. 3-4, the test method of the liquid nitrogen temperature superconducting insulation material shelf depreciation evolution of the present invention, comprise the steps:
1) the shelf depreciation platform 10 being connected with normal electrode 2 under overfreezing liquid nitrogen warm area and low-temperature test special container 3 are placed in screened room not shown in the diagram；
2) experimental enviroment of low-temperature test special container 3 is debugged；
3) in low-temperature test special container 3, liquid nitrogen 8 and nitrogen 9 are added；
4) 2 normal electrodes 2 being connected to shelf depreciation platform 10 two ends are connected to the two ends of superconduction compound inslation test product 1；
5) the superconduction compound inslation test product 1 after being connected with normal electrode 2 is positioned in the liquid nitrogen 8 of low-temperature test special container 3；
6) glass window 4 on the upper end cover of low-temperature test special container 3；
7) test the online record result of the test of shelf depreciation evolution is carried out according to testing program；
8) off-line carries out data analysis printed report.
Wherein, step 2) in, the mode of the experimental enviroment of debugging low-temperature test special container 3 is for carry out evacuation dried to described low-temperature test special container 3；Low-temperature test special container being carried out evacuation dried, adds liquid nitrogen afterwards, nitrogen injection forms positive pressure environment, and cool process to superconduction composite insulating material, forms overfreezing liquid nitrogen warm area experimental enviroment.Partial discharge performance test is carried out according to testing program；
Step 3) in, the liquid nitrogen 8 added in low-temperature test special container 3 and the volume of nitrogen 9 are the 1/2 of the volume of low-temperature test special container 3；
Step 7) according to testing program carry out shelf depreciation evolution test time, according to being arranged on low-temperature test special container 3 outer wall, process of the test is observed and record by high-speed motion picture camera 5；
The concrete mode of described testing program is: superconduction compound inslation test product 1 uniformly boosted 1kV with the interval every 5 minutes, and record the partial discharge quantity after uniformly boosting, if if superconduction compound inslation test product 1 does not puncture after 5 minutes, continue at the uniform velocity to be forced into stopping after edge flashing occurs superconduction compound inslation test product 1 and test；Wherein, the parameter of test is the pressure partial discharge performance waiting grade low-temp compound inslation of middle height.
Step 7) described in online record shelf depreciation evolution result of the test be carry out in process in test, by optical fiber, the local discharge signal that obtains in test is sent to computer, by computer real time record result of the test.
Above example is only in order to illustrate that technical scheme is not intended to limit; although the present invention being described in detail with reference to above-described embodiment; the specific embodiment of the present invention still can be modified or equivalent replacement by those of ordinary skill in the field; and these without departing from any amendment of spirit and scope of the invention or equivalent are replaced, within the claims of its present invention all awaited the reply in application.
Claims (10)
1. the assay device of superconducting insulation material shelf depreciation evolution under liquid nitrogen temperature, described assay device includes shelf depreciation platform and low-temperature test special container, it is characterised in that described shelf depreciation platform is connected with normal electrode；Described normal electrode is used for connecting superconduction compound inslation test product.
2. assay device as claimed in claim 1, it is characterised in that one end of described shelf depreciation platform is connected with earthed switch, ground terminal and a normal electrode successively, its other end is connected with isolation switch, high-field electrode and another normal electrode successively.
3. assay device as claimed in claim 1, it is characterized in that, described shelf depreciation platform includes testing transformer, capacitive divider, partial discharge test instrument, operating board, voltage adjusting device and data acquisition and process system, and described capacitive divider is in parallel with described shelf depreciation platform.
4. assay device as claimed in claim 1, it is characterised in that described low-temperature test special container is foaming machine, and its upper end is provided with the glass window being flexibly connected with it, and its outer wall is provided with high-speed motion picture camera.
5. assay device as claimed in claim 1, it is characterised in that described superconduction compound inslation test product is the insulant of a kind of and liquid nitrogen compound in the film type insulant of polyimides, politef, epoxy resin and PPLP；Described normal electrode be circular arc to plate electrode, triangle pair plate electrode or plate to plate electrode.
6. the test method of a liquid nitrogen temperature superconducting insulation material shelf depreciation evolution, it is characterised in that described test method comprises the steps:
1) the shelf depreciation platform being connected with normal electrode under overfreezing liquid nitrogen warm area and low-temperature test special container are placed in screened room；
2) experimental enviroment of low-temperature test special container is debugged；
3) in low-temperature test special container, liquid nitrogen and nitrogen are added；
4) 2 normal electrodes being connected to shelf depreciation platform two ends are connected to the two ends of superconduction compound inslation test product；
5) the superconduction compound inslation test product after being connected with normal electrode is positioned in the liquid nitrogen of low-temperature test special container；
6) glass window on the upper end cover of low-temperature test special container；
7) test the online record result of the test of shelf depreciation evolution is carried out according to testing program；
8) off-line carries out data analysis printed report.
7. test method as claimed in claim 6, it is characterised in that step 2) in, the mode of the experimental enviroment of debugging low-temperature test special container is for carry out evacuation dried to described low-temperature test special container.
8. test method as claimed in claim 6, it is characterised in that step 3) in, the liquid nitrogen added in low-temperature test special container and the volume of nitrogen are the 1/2 of the volume of low-temperature test special container.
9. test method as claimed in claim 6, it is characterised in that step 7) when carrying out shelf depreciation evolution test according to testing program, according to being arranged on low-temperature test special container outer wall, process of the test is observed and record by high-speed motion picture camera；
The concrete mode of described testing program is: superconduction compound inslation test product uniformly boosted 1kV with the interval every 5 minutes, and record the partial discharge quantity after uniformly boosting, if if superconduction compound inslation test product does not puncture after 5 minutes, continuation stops test after being at the uniform velocity forced into superconduction compound inslation test product generation edge flashing.
10. test method as claimed in claim 6, it is characterized in that, step 7) described in online record shelf depreciation evolution result of the test be carry out in process in test, by optical fiber, the local discharge signal that obtains in test is sent to computer, by computer real time record result of the test.
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Cited By (5)
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| CN108241019A (en) * | 2018-01-15 | 2018-07-03 | 天津大学 | A kind of high-temperature superconductor insulating materials flashover property test device and method |
| CN108872804A (en) * | 2018-04-28 | 2018-11-23 | 海南电网有限责任公司电力科学研究院 | A kind of device to discharge for detecting solid insulation |
| CN108918977A (en) * | 2018-05-02 | 2018-11-30 | 沈阳工业大学 | Dielectric gas-solid interface flashover property measuring device and method under a kind of cryogenic conditions |
| CN111982735A (en) * | 2020-08-21 | 2020-11-24 | 广东电网有限责任公司电力科学研究院 | Testing method and device for cross-temperature-zone high-voltage dry-type sleeve and terminal equipment |
| CN117269697A (en) * | 2023-10-26 | 2023-12-22 | 国网上海市电力公司 | Ultrasonic detection system and method for partial discharge of superconducting cable installed in Dewar |
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Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN108241019A (en) * | 2018-01-15 | 2018-07-03 | 天津大学 | A kind of high-temperature superconductor insulating materials flashover property test device and method |
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| CN111982735A (en) * | 2020-08-21 | 2020-11-24 | 广东电网有限责任公司电力科学研究院 | Testing method and device for cross-temperature-zone high-voltage dry-type sleeve and terminal equipment |
| CN111982735B (en) * | 2020-08-21 | 2023-05-23 | 广东电网有限责任公司电力科学研究院 | Testing method and device for high-voltage dry sleeve in cross-temperature zone and terminal equipment |
| CN117269697A (en) * | 2023-10-26 | 2023-12-22 | 国网上海市电力公司 | Ultrasonic detection system and method for partial discharge of superconducting cable installed in Dewar |
| CN117269697B (en) * | 2023-10-26 | 2024-05-31 | 国网上海市电力公司 | Dewar-mounted long-distance superconducting cable partial discharge ultrasonic detection system and method thereof |
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