CN105807189B - The experimental rig and test method of superconducting insulation material shelf depreciation development process - Google Patents
The experimental rig and test method of superconducting insulation material shelf depreciation development process Download PDFInfo
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- CN105807189B CN105807189B CN201410838626.XA CN201410838626A CN105807189B CN 105807189 B CN105807189 B CN 105807189B CN 201410838626 A CN201410838626 A CN 201410838626A CN 105807189 B CN105807189 B CN 105807189B
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- 238000000034 method Methods 0.000 title claims abstract description 42
- 238000011161 development Methods 0.000 title claims abstract description 36
- 239000012774 insulation material Substances 0.000 title claims abstract description 28
- 238000010998 test method Methods 0.000 title claims abstract description 19
- 238000012360 testing method Methods 0.000 claims abstract description 122
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims abstract description 89
- 229910052757 nitrogen Inorganic materials 0.000 claims abstract description 45
- 150000001875 compounds Chemical class 0.000 claims abstract description 35
- 239000007788 liquid Substances 0.000 claims abstract description 35
- 239000011810 insulating material Substances 0.000 claims abstract description 12
- 238000012545 processing Methods 0.000 claims description 8
- 239000011521 glass Substances 0.000 claims description 7
- 229920001343 polytetrafluoroethylene Polymers 0.000 claims description 6
- 239000004810 polytetrafluoroethylene Substances 0.000 claims description 6
- 238000007405 data analysis Methods 0.000 claims description 4
- 238000001291 vacuum drying Methods 0.000 claims description 4
- 239000004642 Polyimide Substances 0.000 claims description 3
- 239000003822 epoxy resin Substances 0.000 claims description 3
- 238000005187 foaming Methods 0.000 claims description 3
- 229920000647 polyepoxide Polymers 0.000 claims description 3
- 229920001721 polyimide Polymers 0.000 claims description 3
- -1 polytetrafluoroethylene Polymers 0.000 claims description 3
- 239000013307 optical fiber Substances 0.000 claims description 2
- 230000000994 depressogenic effect Effects 0.000 claims 1
- 239000002131 composite material Substances 0.000 abstract description 4
- 238000013461 design Methods 0.000 abstract description 3
- 230000018109 developmental process Effects 0.000 description 23
- 208000028659 discharge Diseases 0.000 description 14
- 239000000243 solution Substances 0.000 description 8
- 230000007547 defect Effects 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 230000032683 aging Effects 0.000 description 3
- 230000015556 catabolic process Effects 0.000 description 3
- 238000002474 experimental method Methods 0.000 description 3
- 238000003745 diagnosis Methods 0.000 description 2
- 238000011156 evaluation Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- QJGQUHMNIGDVPM-UHFFFAOYSA-N nitrogen group Chemical group [N] QJGQUHMNIGDVPM-UHFFFAOYSA-N 0.000 description 1
- 238000011056 performance test Methods 0.000 description 1
- 238000004382 potting Methods 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 239000002887 superconductor Substances 0.000 description 1
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- Testing Electric Properties And Detecting Electric Faults (AREA)
- Containers, Films, And Cooling For Superconductive Devices (AREA)
Abstract
The present invention provides the experimental rig and test method of a kind of superconducting insulation material shelf depreciation development process, a kind of shelf depreciation platform connecting with normal electrode is devised, wherein normal electrode is used to connect the experimental rig of superconduction compound inslation test product and liquid nitrogen and nitrogen are added in low-temperature test special container, 2 normal electrodes for being connected to shelf depreciation platform both ends are connected to the both ends of superconduction compound inslation test product and carry out test and the test method of online record test result of shelf depreciation development process according to testing program.Compared to the prior art, experimental rig provided by the invention and test method meet the mechanism study requirement of low temperature insulation material in superconducting device.The experimental rig Functional Design is reasonable, the test method structure distribution is clear and accurate, can be very good the shelf depreciation development process test for realizing low temperature composite insulating material high voltage appearance grade under overfreezing liquid nitrogen warm area.
Description
Technical field
The present invention relates to low temperature and superconductor applications technical field, in particular to a kind of superconducting insulation material shelf depreciation hair
The experimental rig and test method of exhibition process.
Background technique
With the continuous development of Superconducting Power Technology, the voltage class of superconducting apparatus is also continuously improved, to superconducting insulation material
The requirement of material is also increasingly stringenter.The superiority and inferiority of superconducting insulation material decides the operating status of superconduction electrical equipment, if superconduction
There is locality defects on inside insulating materials or surface, partial discharge phenomenon will occur, in use so as to cause exhausted
The dielectric aging of edge reaches the breakdown and damage that will lead to superconduction electrical equipment afterwards to a certain degree.
Therefore, Partial Discharge Detection for discovery low temperature insulation material in invisible defect and failure mechanism have it is important
Effect.For the shelf depreciation test of overfreezing liquid nitrogen warm area, due to the particularity of superconducting power apparatus structure, superconducting insulation material
On-line checking and spare unit replace difficulty with higher, currently without relevant test device and test method, therefore can not
Obtain corresponding outcome evaluation and diagnosis scheme.
With the continuous development of Superconducting Power Technology, the invisible defect and failure mechanism in superconducting insulation material are found in time
Problem is more and more urgent, therefore, the partial discharge phenomenon in superconducting insulation material how is found in time, to avoid superconduction electrical
The breakdown and damage of equipment are those skilled in the art's technical problems urgently to be resolved.
Summary of the invention
In view of this, the present invention provides experimental rig and the test side of a kind of superconducting insulation material shelf depreciation development process
Method meets the mechanism study requirement of low temperature insulation material in superconducting device.The experimental rig Functional Design rationally, the test side
Method structure distribution is clear and accurate, can be very good to realize low temperature composite insulating material high voltage appearance grade under overfreezing liquid nitrogen warm area
Shelf depreciation development process test.
The experimental rig of superconducting insulation material shelf depreciation development process under liquid nitrogen temperature, the experimental rig include part
Discharge platform and low-temperature test special container, the shelf depreciation platform are connect with normal electrode；The normal electrode is for connecting
Connect superconduction compound inslation test product.
Preferably, one end of the shelf depreciation platform successively connects with earthing switch, ground terminal and a normal electrode
It connects, the other end is successively connect with disconnecting switch, high-field electrode and another normal electrode.
Preferably, the shelf depreciation platform includes testing transformer, capacitive divider, partial discharge test instrument, behaviour
Make platform, voltage adjusting device and data acquisition and processing system, the capacitive divider is in parallel with the shelf depreciation platform.
Preferably, the low-temperature test special container is foaming machine, and the upper end is equipped with the glass being flexibly connected with it and sees
Window is examined, outer wall is equipped with high-speed motion picture camera.
Preferably, the superconduction compound inslation test product is the film of polyimides, polytetrafluoroethylene (PTFE), epoxy resin and PPLP
One of type insulating materials insulating materials compound with liquid nitrogen；The normal electrode is circular arc to plate electrode, triangle pair
Plate electrode or plate are to plate electrode.
A kind of test method of liquid nitrogen temperature superconducting insulation material shelf depreciation development process, the test method include such as
Lower step:
1) by under overfreezing liquid nitrogen warm area the shelf depreciation platform being connect with normal electrode and low-temperature test special container put
It sets in screened room；
2) experimental enviroment of low-temperature test special container is debugged；
3) liquid nitrogen and nitrogen are added in low-temperature test special container；
4) 2 normal electrodes for being connected to shelf depreciation platform both ends are connected to the two of superconduction compound inslation test product
End；
5) the superconduction compound inslation test product after connecting with normal electrode is placed in the liquid nitrogen of low-temperature test special container；
6) glass window on the upper end cover of low-temperature test special container；
7) test and the online record test result of shelf depreciation development process are carried out according to testing program；
8) data analysis and printed report are carried out offline.
Preferably, in step 2), the mode for debugging the experimental enviroment of low-temperature test special container is to the low-temperature test
Special container carries out vacuum drying processing.
Preferably, in step 3), the volume of the liquid nitrogen and nitrogen that are added in low-temperature test special container is low temperature examination
Test the 1/2 of the volume of special container.
Preferably, it when step 7) carries out shelf depreciation development process test according to testing program, is tried according to setting in low temperature
It tests high-speed motion picture camera on special container outer wall test process is observed and recorded；
The concrete mode of the testing program are as follows: with uniform to superconduction compound inslation test product every 5 minutes time intervals
Boost 1kV, and records the partial discharge quantity after uniformly boosting, if continuing even if superconduction compound inslation test product does not puncture after five minutes
Speed, which is forced into after edge flashing occurs for superconduction compound inslation test product, stops test.
Preferably, the development process test result of online record shelf depreciation described in step 7) is in test carry out process
In, the local discharge signal obtained in test is sent to by computer by optical fiber, by the real-time log of computer.
It can be seen from the above technical scheme that the examination of superconducting insulation material shelf depreciation development process provided by the invention
Experiment device and test method devise a kind of shelf depreciation platform connecting with normal electrode, and wherein normal electrode is for connecting
The experimental rig of superconduction compound inslation test product and in low-temperature test special container be added liquid nitrogen and nitrogen, will be connected to part put
2 normal electrodes at level platform both ends are connected to the both ends of superconduction compound inslation test product and carry out part according to testing program
The test of electric discharge development process and the test method of online record test result.Compared to the prior art, examination provided by the invention
Experiment device and test method meet the mechanism study requirement of low temperature insulation material in superconducting device.The experimental rig function is set
Meter is reasonable, the test method structure distribution is clear and accurate, can be very good to realize low temperature composite insulating material in overfreezing liquid nitrogen temperature
The shelf depreciation development process test of high voltage appearance grade under area.
Compared with the latest prior art, the invention has the benefit that
1, technical solution provided by the invention, the shelf depreciation platform being connect with normal electrode in experimental rig, acceptance of the bid
Collimator electrode is used to connect the design of superconduction compound inslation test product, and the experimental rig is allowed accurately to obtain the examination of superconduction compound inslation
The shelf depreciation parameter of product, to avoid hitting for superconduction electrical equipment caused by the dielectric aging because of superconduction compound inslation test product
It wears and damages, ensure that the work safety and working life of superconduction electrical equipment.
2, technical solution provided by the invention, using in low-temperature test special container be added liquid nitrogen and nitrogen, will be connected to
2 normal electrodes at shelf depreciation platform both ends be connected to superconduction compound inslation test product both ends and according to testing program into
The test of row shelf depreciation development process and the test method of online record test result, allow to accurately find low-temperature insulation
Invisible defect and failure mechanism in material, and then available corresponding outcome evaluation and diagnosis scheme, to avoid because super
The breakdown and damage for leading superconduction electrical equipment caused by the dielectric aging of compound inslation test product, ensure that superconduction electrical equipment
Work safety and working life.
3, technical solution provided by the invention, the setting of capacitive divider increase the convenience of voltage detecting, save examination
The time cost tested and the accuracy for increasing test.
4, the use of technical solution provided by the invention, disconnecting switch and earthing switch can preferably control partial discharge test
Instrument ensure that the safety and high efficiency of experiment.
5, technical solution provided by the invention, all experimental tester devices are both placed in connection in screened room, can be effective
External interference is shielded, the accuracy of test is improved.
6, technical solution provided by the invention, the offline setting for carrying out data analysis are that the experimental result that will be obtained is taking off
It is analyzed in the case where from high-potting environment, ensure that the safety of experimenter.
7, technical solution provided by the invention, is widely used, and has significant Social benefit and economic benefit.
Detailed description of the invention
In order to more clearly explain the embodiment of the invention or the technical proposal in the existing technology, to embodiment or will show below
There is attached drawing needed in technical description briefly to introduce, it should be apparent that, the accompanying drawings in the following description is only this
Some embodiments of invention for those of ordinary skill in the art without creative efforts, can be with
It obtains other drawings based on these drawings.
Fig. 1 is the shelf depreciation platform signal of the experimental rig of superconducting insulation material shelf depreciation development process of the invention
Figure.
Fig. 2 is the low-temperature test test chamber of the experimental rig of superconducting insulation material shelf depreciation development process of the invention
Schematic diagram.
Fig. 3 is the schematic diagram of the test method of the invention using superconducting insulation material shelf depreciation development process.
Experimental provision when Fig. 4 is the test method of the invention using superconducting insulation material shelf depreciation development process shows
It is intended to.
Wherein, 1- superconduction compound inslation test product, 2- normal electrode, 3- low-temperature test special container, 4- glass window, 5-
High-speed camera, 6- high-field electrode, 7- ground terminal, 8- liquid nitrogen, 9- nitrogen, 10- partial discharge test platform, 11-capacitors point
Depressor, 12-disconnecting switch, 13-earthing switches.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete
Site preparation description, it is clear that described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.It is based on
The embodiment of the present invention, every other reality obtained by those of ordinary skill in the art without making creative efforts
Example is applied, shall fall within the protection scope of the present invention.
As shown in Fig. 1 to 2, the experimental rig of superconducting insulation material shelf depreciation development process under liquid nitrogen temperature of the invention
Including shelf depreciation platform 10 and low-temperature test special container 3, shelf depreciation platform 10 is connect with normal electrode 2；Normal electrode 2
For connecting superconduction compound inslation test product 1；One end of shelf depreciation platform 10 successively with earthing switch 13, ground terminal 7 and one
A normal electrode 2 connects, and the other end is successively connect with disconnecting switch 12, high-field electrode 6 and another normal electrode 2.
Wherein, shelf depreciation platform 10 include capacitive divider 11 and testing transformer not shown in the diagram, part puts
Electric test instrument, station, voltage adjusting device and data acquisition and processing system, capacitive divider 11 and shelf depreciation platform 10 are simultaneously
Connection；
Low-temperature test special container 3 is foaming machine, and the upper end is equipped with the glass window 4 being flexibly connected with it, outside
Wall is equipped with high-speed motion picture camera 5；
Superconduction compound inslation test product 1 is the film-type insulating materials of polyimides, polytetrafluoroethylene (PTFE), epoxy resin and PPLP
One of the insulating materials compound with liquid nitrogen；
Normal electrode 2 is using circular arc to plate electrode, triangle pair plate electrode or plate to plate electrode.
As shown in Figs. 3-4, the test method of liquid nitrogen temperature superconducting insulation material shelf depreciation development process of the invention,
Include the following steps:
1) by the shelf depreciation platform 10 being connect with normal electrode 2 and low-temperature test special container under overfreezing liquid nitrogen warm area
3 are placed in screened room not shown in the diagram；
2) experimental enviroment of low-temperature test special container 3 is debugged；
3) liquid nitrogen 8 and nitrogen 9 are added in low-temperature test special container 3；
4) 2 normal electrodes 2 for being connected to 10 both ends of shelf depreciation platform are connected to superconduction compound inslation test product 1
Both ends；
5) the superconduction compound inslation test product 1 after connecting with normal electrode 2 is placed in the liquid nitrogen of low-temperature test special container 3
In 8；
6) glass window 4 on the upper end cover of low-temperature test special container 3；
7) test and the online record test result of shelf depreciation development process are carried out according to testing program；
8) data analysis and printed report are carried out offline.
Wherein, in step 2), it is special to the low-temperature test for debugging the mode of the experimental enviroment of low-temperature test special container 3
Vacuum drying processing is carried out with container 3；Low-temperature test is subjected to vacuum drying processing with special container, liquid is added later
Nitrogen, injection nitrogen form positive pressure environment, cool down processing to superconduction composite insulating material, form the examination of overfreezing liquid nitrogen warm area
Test environment.Partial discharge performance test is carried out according to testing program；
In step 3), the volume of the liquid nitrogen 8 and nitrogen 9 that are added in low-temperature test special container 3 is that low-temperature test is special
With the 1/2 of the volume of container 3；
When step 7) carries out shelf depreciation development process test according to testing program, according to setting in the dedicated appearance of low-temperature test
5 pairs of test processes of high-speed motion picture camera are observed and are recorded on 3 outer wall of device；
The concrete mode of the testing program are as follows: with uniform to superconduction compound inslation test product 1 every 5 minutes time intervals
Boost 1kV, and records the partial discharge quantity after uniformly boosting, if continuing if superconduction compound inslation test product 1 does not puncture after five minutes
It is at the uniform velocity forced into after edge flashing occurs for superconduction compound inslation test product 1 and stops test；Wherein, the parameter of test is middle high voltage etc.
The partial discharge performance of grade low-temp compound inslation.
The development process test result of online record shelf depreciation described in step 7) is to pass through light during testing progress
The local discharge signal obtained in test is sent to computer by fibre, by the real-time log of computer.
The above embodiments are merely illustrative of the technical scheme of the present invention and are not intended to be limiting thereof, although referring to above-described embodiment pair
The present invention is described in detail, those of ordinary skill in the art still can to a specific embodiment of the invention into
Row modifies perhaps equivalent replacement and these exist without departing from any modification of spirit and scope of the invention or equivalent replacement
Apply within pending claims of the invention.
Claims (4)
1. the experimental rig of superconducting insulation material shelf depreciation development process under liquid nitrogen temperature, the experimental rig includes that part is put
Level platform and low-temperature test special container, which is characterized in that the shelf depreciation platform is connect with normal electrode；The standard electric
Pole is for connecting superconduction compound inslation test product；
One end of the shelf depreciation platform is successively connect with earthing switch, ground terminal, while being connected with a normal electrode,
Its other end is successively connect with disconnecting switch, high-field electrode and another normal electrode；
The shelf depreciation platform includes that testing transformer, capacitive divider, partial discharge test instrument, station, pressure regulation are set
Standby and data acquisition and processing system, the capacitive divider are in parallel with the shelf depreciation platform；
The low-temperature test special container is foaming machine, and the upper end is equipped with the glass window being flexibly connected with it, outer wall
It is equipped with high-speed motion picture camera；
The superconduction compound inslation test product is the film-type insulating materials of polyimides, polytetrafluoroethylene (PTFE), epoxy resin and PPLP
One of the insulating materials compound with liquid nitrogen；The normal electrode be circular arc to plate electrode, triangle pair plate electrode or
Plate is to plate electrode；
It is super that liquid nitrogen temperature is carried out using the experimental rig of superconducting insulation material shelf depreciation development process under the liquid nitrogen temperature
The test method for leading insulating materials shelf depreciation development process includes the following steps:
1) by under overfreezing liquid nitrogen warm area the shelf depreciation platform being connect with normal electrode and low-temperature test special container be placed on
In screened room；
2) experimental enviroment of low-temperature test special container is debugged；
3) liquid nitrogen and nitrogen are added in low-temperature test special container；
4) 2 normal electrodes for being connected to shelf depreciation platform both ends are connected to the both ends of superconduction compound inslation test product；
5) the superconduction compound inslation test product after connecting with normal electrode is placed in the liquid nitrogen of low-temperature test special container；
6) glass window on the upper end cover of low-temperature test special container；
7) test and the online record test result of shelf depreciation development process are carried out according to testing program；
8) data analysis and printed report are carried out offline；
The development process test result of online record shelf depreciation described in step 7) is to be incited somebody to action during testing progress by optical fiber
The local discharge signal obtained in test is sent to computer, by the real-time log of computer.
2. the experimental rig of superconducting insulation material shelf depreciation development process under liquid nitrogen temperature as described in claim 1, special
Sign is, in step 2), the mode for debugging the experimental enviroment of low-temperature test special container is to the low-temperature test special container
Carry out vacuum drying processing.
3. the experimental rig of superconducting insulation material shelf depreciation development process under liquid nitrogen temperature as described in claim 1, special
Sign is, in step 3), the volume of the liquid nitrogen and nitrogen that are added in low-temperature test special container is the dedicated appearance of low-temperature test
The 1/2 of the volume of device.
4. the experimental rig of superconducting insulation material shelf depreciation development process under liquid nitrogen temperature as described in claim 1, special
Sign is, when step 7) carries out shelf depreciation development process test according to testing program, according to setting in the dedicated appearance of low-temperature test
High-speed motion picture camera is observed and is recorded to test process on device outer wall；
The concrete mode of the testing program are as follows: uniformly to boost every 5 minutes time intervals to superconduction compound inslation test product
1kV, and the partial discharge quantity after uniformly boosting is recorded, if continuing at the uniform velocity to add if superconduction compound inslation test product does not puncture after five minutes
It is depressed into after edge flashing occurs for superconduction compound inslation test product and stops test.
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| CN105807189B true CN105807189B (en) | 2019-10-22 |
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| CN108241019A (en) * | 2018-01-15 | 2018-07-03 | 天津大学 | A kind of high-temperature superconductor insulating materials flashover property test device and method |
| CN108872804B (en) * | 2018-04-28 | 2020-09-29 | 海南电网有限责任公司电力科学研究院 | Device for detecting solid insulation discharge |
| CN108918977B (en) * | 2018-05-02 | 2024-02-06 | 沈阳工业大学 | Device and method for measuring dielectric gas-solid interface flashover characteristic under low temperature condition |
| CN111982735B (en) * | 2020-08-21 | 2023-05-23 | 广东电网有限责任公司电力科学研究院 | Testing method and device for high-voltage dry sleeve in cross-temperature zone and terminal equipment |
| CN117269697B (en) * | 2023-10-26 | 2024-05-31 | 国网上海市电力公司 | Dewar-mounted long-distance superconducting cable partial discharge ultrasonic detection system and method thereof |
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| CN101387672A (en) * | 2007-09-11 | 2009-03-18 | 上海电缆研究所 | High-temperature superconductive cable insulation electrical characteristic test device |
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| CN103424599A (en) * | 2013-07-16 | 2013-12-04 | 清华大学 | Improved thermally stimulated current measuring device |
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| US4715937A (en) * | 1986-05-05 | 1987-12-29 | The Board Of Trustees Of The Leland Stanford Junior University | Low-temperature direct nitridation of silicon in nitrogen plasma generated by microwave discharge |
| CN101387672A (en) * | 2007-09-11 | 2009-03-18 | 上海电缆研究所 | High-temperature superconductive cable insulation electrical characteristic test device |
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