CN205879067U - High -voltage ceramic capacitor porcelain medium rod chip thickness detection device - Google Patents
High -voltage ceramic capacitor porcelain medium rod chip thickness detection device Download PDFInfo
- Publication number
- CN205879067U CN205879067U CN201620730238.4U CN201620730238U CN205879067U CN 205879067 U CN205879067 U CN 205879067U CN 201620730238 U CN201620730238 U CN 201620730238U CN 205879067 U CN205879067 U CN 205879067U
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- China
- Prior art keywords
- dielectric chip
- ceramic dielectric
- diameter
- circuit orbit
- detection station
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Abstract
The utility model discloses a high -voltage ceramic capacitor porcelain medium rod chip thickness detection device, including automatic transmission line, electro -magnet, lifter, circular track, digital display dial gauge, telescopic blocking rod and computer, the last thickness size detection station that is provided with of automatic transmission line is located that automatic transmission line bottom under the thickness size detection station is fixed to be provided with the electro -magnet, is provided with circular track directly over the thickness size detection station, it is equipped with telescopic blocking rod on the automatic transmission line at the thickness size detection station upper reaches to be located, circular orbital diameter is less than the diameter of porcelain medium rod chip, circular orbital bottom sliding connection digital display dial gauge, circular track passes through the fixed setting of lifter and in one side of automatic transmission line, is provided with displacement sensor on the lifter, above -mentioned electro -magnet, lifter, digital display dial gauge and telescopic blocking rod all are connected with the computer. After adopting above -mentioned structure, real -time detection suppresses the thickness size of product on line, and detection efficiency is high, detects reliable data.
Description
Technical field
This utility model relates to ceramic capacitor production field verifying attachment, particularly a kind of high voltage ceramic capacitor porcelain
Dielectric chip thickness detection apparatus.
Background technology
Traditional discrete component ceramic capacitor based on disc, this shaping structures is simple, technical maturity, operation
Easy, it is simple to mass, large-scale production.
But the ceramic dielectric chip in ceramic capacitor, at molding pressing stage, gauge is that non-mould ensures size, also
It is compacting management and control size, due to powder packed weight, powder apparent density, powder particles degree, powder mobility, press self
Many reasons such as state, the ceramic dielectric chip thickness size difference after compacting is very big, needs constantly detection, finds chi in time
Very little defective products, and adjust in time.Therefore, the detection to ceramic dielectric chip thickness size seems extremely important with management and control.
At present, the gauge detection of ceramic dielectric chip is maked an inspection tour mainly by operation employee's self-inspection and inspection personnel, detection frequency
Rate interval is long, does not fixes Check-Out Time, and is post-hoc tests, it is impossible to find bad in time, when waiting detection to find bad phenomenon,
Having had batch to suppress bad product, product rejection rate is high.
Utility model content
The technical problems to be solved in the utility model is for above-mentioned the deficiencies in the prior art, and provides a kind of higfh-tension ceramics
Capacitor ceramic dielectric chip thickness detection apparatus, this high voltage ceramic capacitor ceramic dielectric chip thickness detection device can be the most real-time
The gauge of detection compacted products, detection efficiency is high, and detection data are reliable.
For solving above-mentioned technical problem, the technical solution adopted in the utility model is:
A kind of high voltage ceramic capacitor ceramic dielectric chip thickness detection device, including transfermatic, electric magnet, lifting
Bar, circuit orbit, digital display centimeter, expansion baffle rod and computer.
It is provided with gauge detection station on transfermatic, is positioned at the automatic biography immediately below gauge detection station
Be fixedly installed electric magnet bottom defeated line, gauge detection station be arranged above circuit orbit, this circuit orbit with
Electric magnet is coaxially disposed；It is positioned on the transfermatic of gauge detection station upstream and is provided with expansion baffle rod.
The diameter of circuit orbit is less than the diameter of ceramic dielectric chip, and the basal sliding of circuit orbit connects described digital display hundred
Divide table.
Circuit orbit is fixedly installed on the side of transfermatic by elevating lever, and elevating lever is provided with displacement sensing
Device.
Above-mentioned electric magnet, elevating lever, digital display centimeter are all connected with computer with expansion baffle rod.
2/3rds of described circuit orbit a diameter of ceramic dielectric chip diameter.
/ 2nd of described circuit orbit a diameter of ceramic dielectric chip diameter.
The area of described electric magnet is more than the area of ceramic dielectric chip.
Described electric magnet is circular, and the diameter of electric magnet is more than the diameter of ceramic dielectric chip, but is less than 1.5 times of ceramic dielectric cores
Sheet diameter.
After this utility model uses said structure, when ceramic dielectric chip transmission to gauge detection station, thickness gauge
Electric magnet energising on very little detection station, so that ceramic dielectric chip to be detected is fixed on gauge detection station.It is positioned at
Gauge detection station upstream expansion baffle rod and be positioned at gauge detection station downstream location bar all close, location
The position of pole pair ceramic dielectric chip positions, and makes ceramic dielectric chip corresponding with circuit orbit.Expansion baffle rod is to follow-up magnetic
Dielectric chip stops.
Then, elevating lever declines, and the lifting displacement of elevating lever is monitored by displacement transducer in real time, when reaching to set position
During shifting, elevating lever stop decline, digital display centimeter slides on circuit orbit one circle, complete circumference whole to magnetizing mediums chip thickness
The measurement of degree size, and test data are passed to computer, computer is analyzed judging according to setting value.
Whole measurement process, is all automatically performed, and automaticity is high, the thickness gauge of energy on-line real-time measuremen compacted products
Very little, detection efficiency is high, and detection data are reliable.
Accompanying drawing explanation
Fig. 1 is the structural representation of this utility model a kind of high voltage ceramic capacitor ceramic dielectric chip thickness detection device.
Detailed description of the invention
With concrete better embodiment, this utility model is described in further detail below in conjunction with the accompanying drawings.
As it is shown in figure 1, a kind of high voltage ceramic capacitor ceramic dielectric chip thickness detection device, wherein have transfermatic 1,
Gauge detection station 11, electric magnet 111, elevating lever 2, displacement transducer 21, circuit orbit 3, digital display centimeter 4, calculating
The technical characteristics such as machine 5, expansion baffle rod 6, ceramic dielectric chip 7 and location bar 8.
A kind of high voltage ceramic capacitor ceramic dielectric chip thickness detection device, including transfermatic, electric magnet, lifting
Bar, circuit orbit, digital display centimeter, expansion baffle rod and computer.
It is provided with gauge detection station on transfermatic, is positioned at the automatic biography immediately below gauge detection station
Be fixedly installed electric magnet bottom defeated line, gauge detection station be arranged above circuit orbit, this circuit orbit with
Electric magnet is coaxially disposed；It is positioned on the transfermatic of gauge detection station upstream and is provided with expansion baffle rod.
The diameter of circuit orbit is less than the diameter of ceramic dielectric chip, and the basal sliding of circuit orbit connects described digital display hundred
Divide table.
Circuit orbit is fixedly installed on the side of transfermatic by elevating lever, and elevating lever is provided with displacement sensing
Device.
Above-mentioned electric magnet, elevating lever, digital display centimeter are all connected with computer with expansion baffle rod.
2/3rds of described circuit orbit a diameter of ceramic dielectric chip diameter.
/ 2nd of described circuit orbit a diameter of ceramic dielectric chip diameter.
The area of described electric magnet is more than the area of ceramic dielectric chip.
Described electric magnet is circular, and the diameter of electric magnet is more than the diameter of ceramic dielectric chip, but is less than 1.5 times of ceramic dielectric cores
Sheet diameter.
After this utility model uses said structure, when ceramic dielectric chip transmission to gauge detection station, thickness gauge
Electric magnet energising on very little detection station, so that ceramic dielectric chip to be detected is fixed on gauge detection station.It is positioned at
Gauge detection station upstream expansion baffle rod and be positioned at gauge detection station downstream location bar all close, location
The position of pole pair ceramic dielectric chip positions, and makes ceramic dielectric chip corresponding with circuit orbit.Expansion baffle rod is to follow-up magnetic
Dielectric chip stops.
Then, elevating lever declines, and the lifting displacement of elevating lever is monitored by displacement transducer in real time, when reaching to set position
During shifting, elevating lever stop decline, digital display centimeter slides on circuit orbit one circle, complete circumference whole to magnetizing mediums chip thickness
The measurement of degree size, and test data are passed to computer, computer is analyzed judging according to setting value.
Whole measurement process, is all automatically performed, and automaticity is high, the thickness gauge of energy on-line real-time measuremen compacted products
Very little, detection efficiency is high, and detection data are reliable.
Preferred implementation of the present utility model described in detail above, but, this utility model is not limited to above-mentioned reality
Execute the detail in mode, in technology concept of the present utility model, the technical solution of the utility model can be entered
The multiple equivalents of row, these equivalents belong to protection domain of the present utility model.
Claims (5)
1. a high voltage ceramic capacitor ceramic dielectric chip thickness detection device, it is characterised in that: include transfermatic, electromagnetism
Ferrum, elevating lever, circuit orbit, digital display centimeter, expansion baffle rod and computer；
It is provided with gauge detection station on transfermatic, is positioned at the transfermatic immediately below gauge detection station
Bottom is fixedly installed electric magnet, gauge detection station be arranged above circuit orbit, this circuit orbit and electromagnetism
Ferrum is coaxially disposed；It is positioned on the transfermatic of gauge detection station upstream and is provided with expansion baffle rod；
The diameter of circuit orbit is less than the diameter of ceramic dielectric chip, and the basal sliding of circuit orbit connects described digital display percentage
Table；
Circuit orbit is fixedly installed on the side of transfermatic by elevating lever, and elevating lever is provided with displacement transducer；
Above-mentioned electric magnet, elevating lever, digital display centimeter are all connected with computer with expansion baffle rod.
High voltage ceramic capacitor ceramic dielectric chip thickness the most according to claim 1 detection device, it is characterised in that: described
2/3rds of circuit orbit a diameter of ceramic dielectric chip diameter.
High voltage ceramic capacitor ceramic dielectric chip thickness the most according to claim 1 detection device, it is characterised in that: described
/ 2nd of circuit orbit a diameter of ceramic dielectric chip diameter.
High voltage ceramic capacitor ceramic dielectric chip thickness the most according to claim 1 detection device, it is characterised in that: described
The area of electric magnet is more than the area of ceramic dielectric chip.
High voltage ceramic capacitor ceramic dielectric chip thickness the most according to claim 4 detection device, it is characterised in that: described
Electric magnet is circular, and the diameter of electric magnet is more than the diameter of ceramic dielectric chip, but is less than 1.5 times of ceramic dielectric chip diameters.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620730238.4U CN205879067U (en) | 2016-07-12 | 2016-07-12 | High -voltage ceramic capacitor porcelain medium rod chip thickness detection device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620730238.4U CN205879067U (en) | 2016-07-12 | 2016-07-12 | High -voltage ceramic capacitor porcelain medium rod chip thickness detection device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN205879067U true CN205879067U (en) | 2017-01-11 |
Family
ID=57695008
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201620730238.4U Expired - Fee Related CN205879067U (en) | 2016-07-12 | 2016-07-12 | High -voltage ceramic capacitor porcelain medium rod chip thickness detection device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN205879067U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106017269A (en) * | 2016-07-12 | 2016-10-12 | 苏州宏泉高压电容器有限公司 | High-voltage ceramic capacitor ceramic dielectric chip thickness detection device |
| CN110361056A (en) * | 2019-08-22 | 2019-10-22 | 中车青岛四方车辆研究所有限公司 | Super capacitor comprehensive parameters detection system |
-
2016
- 2016-07-12 CN CN201620730238.4U patent/CN205879067U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106017269A (en) * | 2016-07-12 | 2016-10-12 | 苏州宏泉高压电容器有限公司 | High-voltage ceramic capacitor ceramic dielectric chip thickness detection device |
| CN110361056A (en) * | 2019-08-22 | 2019-10-22 | 中车青岛四方车辆研究所有限公司 | Super capacitor comprehensive parameters detection system |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20170111 Termination date: 20170712 |