CN205844782U - The controller of a kind of High-Speed Automatic calibration chip inner loop vibration frequency and test device - Google Patents
The controller of a kind of High-Speed Automatic calibration chip inner loop vibration frequency and test device Download PDFInfo
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- CN205844782U CN205844782U CN201620708090.4U CN201620708090U CN205844782U CN 205844782 U CN205844782 U CN 205844782U CN 201620708090 U CN201620708090 U CN 201620708090U CN 205844782 U CN205844782 U CN 205844782U
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Abstract
A kind of controller of High-Speed Automatic calibration chip inner loop vibration frequency, described controller also includes the first frequency divider, second frequency divider, frequency initial value register, digital frequency meter, dispensing unit, check value adjustment unit and comparator, the output terminal of clock mouth that built-in ring shakes, first frequency divider, frequency initial value register, digital frequency meter, comparator, check value adjustment unit, dispensing unit is sequentially connected with, described built-in ring shakes and is connected with dispensing unit, described frequency initial value register is connected with check value adjustment unit, described dispensing unit is connected with comparator, described second frequency divider is connected with digital frequency meter.Providing the benefit that: use this controller, can realize prover time and shorten at double, prover time is the 1/10 of traditional test, reduces time and Material Cost that calibration needs；This controller and device；Calibration accuracy is high, operability is good, economy is strong.
Description
Technical field
This utility model relates to controller and the test device of a kind of High-Speed Automatic calibration chip inner loop vibration frequency.
Background technology
Stable, high-precision clock input is the premise of chip steady operation, generally encapsulates out crystal oscillator when chip designs
Foot, by external passive/active crystal oscillator of this crystal oscillator foot, is provided clock source by the crystal oscillator of chip exterior.Along with electronic product is to more
Small size, more high integration develop, and a lot of application cannot provide the paster space of external crystal-controlled oscillation, such as SIM/bank IC card
Series products, mobile phone application product etc..The function of external crystal-controlled oscillation can be realized at chip internal for this kind of application, design chips
Interior crystal oscillator (ROSC), is provided the clock of chip by this agitator.Crystal oscillator in chip is a simulation group
Part, as easy as rolling off a log by chip production manufacturer process deviation, ambient temperature, running voltage influence of fluctuations so that crystal oscillator
Output frequency produces deviation (different from standard frequency), and these deviations can make the disabler of chip.It is thus desirable to dispatching from the factory it
The front crystal oscillator to chip internal does accurate calibration.
The thick calibration generally shaken built-in ring realizes in test mode: the most in test mode, built-in chip type ring shakes
Rate-adaptive pacemaker is connected with certain GPIO, and test machine can be tested the frequency of this GPIO and calculate the deviation value with standard frequency；2.
According to deviation value above, the calibration register that built-in ring is shaken by test machine by the GPIO control controller specified is joined
Putting, after configuring new calibration value, the rate-adaptive pacemaker that built-in ring shakes will change；3. circulation operation 1,2, until test machine is measured
The rate-adaptive pacemaker arrived is consistent with standard frequency；4. test machine controls the calibration value write non-volatile memories that controller obtains 3
The appointment region of device, completes internally to replace the calibration of standard.In the operational mode, will be at test mould by functional circuit after chip powers on
Being stored in nonvolatile memory under formula specifies the calibration value in region to read and configure the calibration register that built-in ring shakes, by built-in
The rate-adaptive pacemaker that ring shakes is adjusted to consistent with expected frequency.
Under normal conditions, in order to improve sampling precision, reducing interference, it is all that tens KHZ are low that tester table pours into clock
Frequently, such as input 32K is as the criterion, and the actual alignment time once is about 400 milliseconds.In test process in order to get rid of test machine or
Person's external interference, all can carry out repeatedly frequency calibration, then maximum and minima be removed the calibration value every time measured,
It is averaged after remaining measured value.Typically can carry out 10 calibrations, that is, 400*10=4000 millisecond, about 4 seconds.Some
The ring of chip shakes to design and the most also can do different calibrations, the most a chip for different frequencies, and ring vibration frequency is divided into 4
Shelves, 12M, 48M, 96M, 144M, different frequency calibrations must be done by each gear for these 4 gears, at that time between be exactly 4*4=
16 seconds.For the test machine of " gold of very little second cun ", this testing time is oversize really, and testing cost is the biggest.To built-in ring
The calibration accuracy shaken depends on the test machine frequency measurement accuracy to general I/O port (GPIO), the test machine of low precision
Platform can occur calibration to lose efficacy, and high-precision tester table can cause the increase of testing cost；Whole calibration process needs repeatedly to weigh
Multiple, cause the increase of testing time, improve testing cost.
Summary of the invention
This utility model is in order to solve the problem that the testing time is long, testing cost is high of existing test device, it is provided that one
Plant controller and the test device of High-Speed Automatic calibration chip inner loop vibration frequency.
This utility model is by the following technical solutions:
The controller of a kind of High-Speed Automatic calibration chip inner loop vibration frequency, it is characterised in that described controller also includes
First frequency divider, the second frequency divider, frequency initial value register, digital frequency meter, dispensing unit, check value adjustment unit and ratio
Relatively device, output terminal of clock mouth that built-in ring shakes, the first frequency divider, frequency initial value register, digital frequency meter, comparator, school
Test value adjustment unit, dispensing unit is sequentially connected with, and described built-in ring shakes and is connected with dispensing unit, described frequency initial value register
Being connected with check value adjustment unit, described dispensing unit is connected with comparator, and described second frequency divider is connected with digital frequency meter.
The mode that this controller uses frequency initial value register to combine check value adjustment unit achieves what built-in ring next time shook
Frequency initial value is last calibration value, counts on the basis of upper calibration value once；And without as traditional method one
The output frequency that built-in ring is shaken by sample the most again carries out frequency counting, according to count results, successive adjustment calibration value；Use
Digital frequency meter realizes function, and calibration process is full-automatic, convenient test, only needs to wait for calibrating end mark after starting calibration,
Calibration process is automatically obtained by the controller in chip.
Further, described first frequency divider, the second frequency divider use the frequency divider of 50% dutycycle.By reference clock and quilt
Survey clock and be shaped into the clock of 50% dutycycle.
Further, a kind of test device using controller noted above, including tester table, it is characterised in that described test
Device also include built-in ring shake, nonvolatile memory, described built-in ring shakes, tester table is connected with controller respectively, described
Controller is connected with nonvolatile memory.
Further, described test device also includes that functional circuit, described nonvolatile memory are specified in reading it
Region store data inside also configures the functional circuit connection that built-in ring shakes, and the configuration port of described functional circuit and built-in ring shake
Input port connects.
Further, described functional circuit and the configuration port of controller are all by data selector (MUX) and built-in ring
The input port shaken connects.
Further, data selector uses CMOS-type, can be four bilateral analog switch.
This utility model compared with prior art, provides the benefit that:
1 uses this controller and device, can realize prover time and shorten at double, and prover time is the 1/10 of traditional test,
Reduce time and Material Cost that calibration needs；
2. this controller and device；
3. calibration accuracy is high, operability is good, economy is strong.
Accompanying drawing explanation
Fig. 1 is the schematic diagram of this controller；
Fig. 2 is the principle schematic of the realization of this controller；
Fig. 3 is to use this controller to carry out the device connection diagram tested；
Fig. 4 is the schematic diagram of digital frequency meter.
Detailed description of the invention
Below by specific embodiment, the technical solution of the utility model is further described explanation.
Embodiment 1
As Figure 1-3, controller includes the dispensing unit as control unit, and described dispensing unit connects foundation
Calibration value is adjusted and exports to its calibration value adjustment unit, described calibration value adjustment unit by the comparative result of comparator
Upper connection has the comparator standard value received and count value being compared and being exported comparative result to it, described comparator
It is connected to outputting standard value and allowable error value respectively its dispensing unit and output count results to its digital frequency meter,
Connecting on described digital frequency meter and have two-way frequency divider, wherein the first frequency divider shakes even to its built-in ring with output measured clock
Connecing, the second frequency divider is connected with the tester table of output reference clock, described built-in ring shake with output adjust after calibration value to
Its dispensing unit connects, and the comparative result (calibration value after i.e. having calibrated) through comparator is exported by calibration value adjustment unit
To frequency initial value register.
The test philosophy of this test device is:
1) tester table pours into, to controller, the low-frequency clock that frequency is tens KHz by general I/O port GPIO,
The reference clock shaken as calibration ring；
2) output that built-in ring shakes provides the first frequency divider of controller as measured clock；
3) controller is under the reference clock that tester table pours into, and the output frequency shaking built-in ring carries out frequency counting,
According to count results, successive adjustment calibration value, the calibration value after controller will adjust is allocated to the frequency initial value that built-in ring shakes
Depositor；During Gai, the frequency initial value of frequency counting be the output frequency that built-in ring shakes for the first time, from starting for the second time
Frequency initial value each time is the calibration value that previous calibration completes, and this calibration value is stored in frequency initial value register；
Often adjusting primary calibration value, controller re-starts a frequency counting, until frequency counting result is consistent with expected value；
4) the appointment district of the final calibration value write nonvolatile memory that step (3) is obtained by tester table from controller
Territory, completes the calibration shaking built-in ring.
Data selector uses CMOS-type, can use four bilateral analog switch CD4066, it would however also be possible to employ double four road moulds
Intend switch CD4052, or three group of two path analoging switch CD4053.
Nonvolatile memory uses ROM or EPROM or Flash Memory (flash memory) or complete static non-volatile
The storage devices such as SRAM.
Embodiment 2
As it is shown on figure 3, concrete example numbers illustrated.The frequency targets of the calibration of the most a certain chip is 48M, corresponding frequency
Rate calibration value is 450, and for the first time during calibration, the starting point of hardware default frequency calibration value starts calibration from 0, and stepping is 1, that calibration
450 steps are needed, it is assumed that time-consuming 1 millisecond of each stepping to 450, due to precision and the external interference of test machine, most feelings
Condition, will not be accurate to 450, it is assumed that be considered as at 439 hardware that frequency is the most calibrated to be completed.After having calibrated for the first time,
Carrying out calibration next time, the starting point of that now frequency calibration value is the calibration value of last time, i.e. 439, due to this value the most closely
Real calibration value, so the stepping of calibration may only have 1,2 steps, by that analogy, to the 10th time.
If according to conventional calibration method, prover time takes around 439*10 millisecond=4.4 second.If but according to this reality
If realizing calibration with the novel controller automatically updating frequency initial value, it is only necessary to 439+1*9=448 millisecond, time
On almost differed 10 times.
Embodiment 3
As shown in Figure 4, as different from Example 1, the digital frequency meter of this programme include AT89C51 chip, amplify whole
Shape module and frequency division module, power module, described amplification Shaping Module is connected with frequency division module, and the signal after amplifying shaping passes
To frequency division module；Frequency division module is connected with AT89C51 chip, is timed passing to chip after the letter after frequency dividing, counts；Described
AT89C51 chip electrically connects with comparator, the second frequency divider, frequency initial value register, power module.AT89C51 chip bag
Include reset circuit and crystal oscillating circuit, reset circuit and crystal oscillating circuit electrical connection；Reset circuit is mainly by switch, resistance and electric capacity even
Connecing and form, on-off control high level resets；Crystal oscillating circuit is mainly formed by connecting with electric capacity by crystal oscillator, provides to AT89C51 chip
Frequency of oscillation.NE555 intervalometer selected by shaping circuit.
Digital frequency meter also includes that display module, display module are connected with AT89C51 chip.Described AT89C51 chip can
To replace with AT89S51 chip, described frequency division module can use 74HC151 data selector.
If no special instructions, circuit and element employed in embodiment of the present utility model are unit commonly used in the art
Part.
It is more than preferred implementation of the present utility model, does not limit protection domain of the present utility model, for ability
Deformation that field technique personnel make according to mentality of designing of the present utility model and improvement, all should be considered as protection of the present utility model
Within the scope of.
Claims (6)
1. the controller of a High-Speed Automatic calibration chip inner loop vibration frequency, it is characterised in that described controller also includes
One frequency divider, the second frequency divider, frequency initial value register, digital frequency meter, dispensing unit, check value adjustment unit and compare
Device, output terminal of clock mouth that built-in ring shakes, the first frequency divider, frequency initial value register, digital frequency meter, comparator, verification
Value adjustment unit, dispensing unit are sequentially connected with, and described built-in ring shakes and is connected with dispensing unit, described frequency initial value register with
Check value adjustment unit connects, and described dispensing unit is connected with comparator, and described second frequency divider is connected with digital frequency meter.
The controller of High-Speed Automatic calibration chip inner loop vibration frequency the most according to claim 1, it is characterised in that described
First frequency divider, the second frequency divider use the frequency divider of 50% dutycycle.
3. use a test device for controller as claimed in claim 1, including tester table, it is characterised in that described
Test device also include built-in ring shake, nonvolatile memory, described built-in ring shakes, tester table is connected with controller respectively,
Described controller is connected with nonvolatile memory.
Test device the most according to claim 3, it is characterised in that described test device also includes functional circuit, described
Nonvolatile memory and reading is specified region store data inside in it and configures the functional circuit that built-in ring shakes and be connected, described merit
The input port that the configuration port of energy circuit shakes with built-in ring is connected.
Test device the most according to claim 4, it is characterised in that described functional circuit is equal with the configuration port of controller
The input port shaken with built-in ring by data selector is connected.
Test device the most according to claim 3, it is characterised in that described nonvolatile memory uses ROM or EPROM
Or flash memory or complete static non-volatile SRAM.
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| CN201620708090.4U CN205844782U (en) | 2016-06-30 | 2016-06-30 | The controller of a kind of High-Speed Automatic calibration chip inner loop vibration frequency and test device |
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| CN201620708090.4U CN205844782U (en) | 2016-06-30 | 2016-06-30 | The controller of a kind of High-Speed Automatic calibration chip inner loop vibration frequency and test device |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109324281A (en) * | 2018-11-08 | 2019-02-12 | 珠海格力电器股份有限公司 | IC chip test system and method |
| CN109342928A (en) * | 2018-11-01 | 2019-02-15 | 南京工业大学 | Chip testing device and method |
| CN111948931A (en) * | 2020-08-07 | 2020-11-17 | 上海芯跳科技有限公司 | Clock rapid correction method for electronic detonator |
| CN112015229A (en) * | 2020-08-24 | 2020-12-01 | 合肥智芯半导体有限公司 | Circuit capable of realizing chip internal clock calibration by using debugger |
| CN112202507A (en) * | 2020-11-19 | 2021-01-08 | 深圳市友华通信技术有限公司 | WIFI production measurement and calibration method and computer-readable storage medium |
| CN112557876A (en) * | 2020-12-10 | 2021-03-26 | 苏州英嘉通半导体有限公司 | Device for calibrating chip simulation parameters and test method thereof |
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2016
- 2016-06-30 CN CN201620708090.4U patent/CN205844782U/en active Active
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109342928A (en) * | 2018-11-01 | 2019-02-15 | 南京工业大学 | Chip testing device and method |
| CN109324281A (en) * | 2018-11-08 | 2019-02-12 | 珠海格力电器股份有限公司 | IC chip test system and method |
| CN111948931A (en) * | 2020-08-07 | 2020-11-17 | 上海芯跳科技有限公司 | Clock rapid correction method for electronic detonator |
| CN112015229A (en) * | 2020-08-24 | 2020-12-01 | 合肥智芯半导体有限公司 | Circuit capable of realizing chip internal clock calibration by using debugger |
| CN112015229B (en) * | 2020-08-24 | 2023-02-03 | 合肥智芯半导体有限公司 | Circuit capable of realizing chip internal clock calibration by using debugger |
| CN112202507A (en) * | 2020-11-19 | 2021-01-08 | 深圳市友华通信技术有限公司 | WIFI production measurement and calibration method and computer-readable storage medium |
| CN112202507B (en) * | 2020-11-19 | 2022-07-29 | 深圳市友华通信技术有限公司 | WIFI production measurement and calibration method and computer-readable storage medium |
| CN112557876A (en) * | 2020-12-10 | 2021-03-26 | 苏州英嘉通半导体有限公司 | Device for calibrating chip simulation parameters and test method thereof |
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