CN205692084U - The forward current of a kind of diode test produces circuit - Google Patents
The forward current of a kind of diode test produces circuit Download PDFInfo
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- CN205692084U CN205692084U CN201620609531.5U CN201620609531U CN205692084U CN 205692084 U CN205692084 U CN 205692084U CN 201620609531 U CN201620609531 U CN 201620609531U CN 205692084 U CN205692084 U CN 205692084U
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Abstract
This utility model provides the forward current of a kind of diode test to produce circuit, including pulse signal source, first, second and third digital to analog converter, depositor, first and second amplifier chip, photoelectrical coupler, control chip and at least one forward current output control circuit；After pulse signal source is connected with depositor by first and second digital to analog converter respectively, also two inputs with the 3rd digital to analog converter are connected；Two outfans of the 3rd digital to analog converter and the positive-negative input end of the first amplifier chip are respectively connected with；The outfan of the first amplifier chip and the positive input terminal of the second amplifier chip are connected；Photoelectrical coupler is connected on negative input end and the outfan of the second amplifier chip, and the also input with forward current output control circuit is connected；Each forward current output control circuit is all connected with measured diode positive pole.Implement this utility model, it is possible to the voltage that output peak value is high, it is ensured that the real-time of measuring and control data reception process and reliability.
Description
Technical Field
The utility model relates to an electron measurement technical field especially relates to a forward current produces circuit that diode is experimental to be used.
Background
In recent years, diodes are widely used in the industrial and household electronic industries, and with the technological progress, the reliability of the diodes is required to be higher and higher.
In the prior art, relevant reports of diode forward current test research exist, but the output voltage peak value is low (only 2.5kV), the discharge gap is too small, and the real-time performance and the reliability of measurement and control data receiving processing cannot be guaranteed.
SUMMERY OF THE UTILITY MODEL
The embodiment of the utility model provides a technical problem that will solve provides a forward current production circuit of experimental usefulness of diode, can export the high voltage of peak value, ensures to observe and control real-time and the reliability that data reception handled.
The embodiment of the utility model provides a forward current produces circuit for diode test, including pulse signal source, first digital-to-analog converter, second digital-to-analog converter, register, third digital-to-analog converter, first operational amplifier chip, second operational amplifier chip, photoelectric coupler, control chip and at least one forward current output control circuit; wherein,
One end of the pulse signal source is connected with the input end of the first digital-to-analog converter, and the other end of the pulse signal source is connected with the input end of the second digital-to-analog converter;
the output end of the first digital-to-analog converter is connected with the first input end of the register;
the output end of the second digital-to-analog converter is connected with the second input end of the register;
the first output end of the register is connected with the first input end of the third digital-to-analog converter, and the second output end of the register is connected with the second input end of the third digital-to-analog converter;
a first output end of the third digital-to-analog converter is connected with a positive input end of the first operational amplifier chip, and a second output end of the third digital-to-analog converter is connected with a negative input end of the first operational amplifier chip;
the output end of the first operational amplifier chip is connected with the positive input end of the second operational amplifier chip;
the photoelectric coupler is connected in series with the negative input end and the output end of the second operational amplifier chip to form a current negative feedback circuit, and the photoelectric coupler is also connected with the input end of each positive current output control circuit;
the output end of each forward current output control circuit is connected with the anode of the diode to be tested, and the control end is connected with the control chip; each forward current output control circuit comprises a relay and a sampling resistor which are connected in sequence, and each relay is also connected with the control chip.
The forward current generating circuit further comprises a voltage division filter circuit and a current amplitude regulating circuit; wherein,
the input end of the voltage division filter circuit is connected with the photoelectric coupler, and the output end of the voltage division filter circuit is connected with the input end of the current amplitude regulating circuit;
and the output end of the current amplitude regulating circuit is connected with the input end of each forward current output control circuit.
Wherein the first digital-to-analog converter and the second digital-to-analog converter both adopt a D/A converter of a TLC5616CP type; the register adopts an HC4053 chip; the third digital-to-analog converter adopts a DAC0832 type D/A converter; the first operational amplifier chip adopts an LM358 type operational amplifier; the second operational amplifier chip adopts an LM412 type operational amplifier; the photoelectric coupler consists of a TIL300A type chip and a TIL117 type chip.
Implement the embodiment of the utility model provides a, following beneficial effect has:
the embodiment of the utility model provides an in, owing to adopt the modularized design, each module circuit autonomous working, mutual interference is less, has advantages such as small, light in weight, easy operation, precision height, safe and reliable, can export the high voltage of peak value, ensures to observe and control real-time and the reliability that data reception handled.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below. It is obvious that the drawings in the following description are only some embodiments of the invention, and that for a person skilled in the art, without inventive effort, other drawings are obtained from these drawings and still fall within the scope of the invention.
Fig. 1 is a system structure diagram of a forward current generating circuit for a diode test according to an embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention clearer, the present invention will be described in further detail with reference to the accompanying drawings.
As shown in fig. 1, in an embodiment of the present invention, a forward current generating circuit for a diode test is provided, including a pulse signal source 1, a first digital-to-analog converter 2, a second digital-to-analog converter 3, a register 4, a third digital-to-analog converter 5, a first operational amplifier chip 6, a second operational amplifier chip 7, a photoelectric coupler 8, a control chip 9, and at least one forward current output control circuit 10; wherein,
One end of a pulse signal source 1 is connected with the input end of a first digital-to-analog converter 2, and the other end of the pulse signal source is connected with the input end of a second digital-to-analog converter 3;
the output end of the first digital-to-analog converter 2 is connected with a first input end a1 of the register 4;
the output of the second digital-to-analog converter 3 is connected to the second input a2 of the register 4; wherein, the output signal of the second digital-to-analog converter 3 and the output signal of the first digital-to-analog converter 2 have opposite polarities; for example, if the output signal of the first digital-to-analog converter 2 is a current signal of a positive polarity reference voltage, the output signal of the second digital-to-analog converter 3 is a current signal of a negative polarity reference voltage;
the first output terminal b1 of the register 4 is connected to the first input terminal c1 of the third digital-to-analog converter 5, and the second output terminal b2 is connected to the second input terminal c2 of the third digital-to-analog converter 5; the register 4 converts the output signal of the first dac 2 and the output signal of the second dac 3, which have opposite polarities, into two square wave signals with corresponding polarities
The first output end c3 of the third dac 5 is connected to the positive input end (+) of the first operational amplifier chip 6, and the second output end c4 is connected to the negative input end (-) of the first operational amplifier chip 6; the third digital-to-analog converter 5 converts the two square wave signals with corresponding polarities into two corresponding sine full-wave signals;
The output end of the first operational amplifier chip 6 is connected with the positive input end (+) of the second operational amplifier chip 7; the first operational amplifier chip 6 converts the two sinusoidal full-wave signals into half-wave signals only with the positive half cycle of a sine wave;
the photoelectric coupler 8 is connected in series with the negative input end (-) and the output end of the second operational amplifier chip 7 to form a current negative feedback circuit, and the photoelectric coupler 8 is also connected with the input end of each positive current output control circuit 10; wherein, the photoelectric coupler 8 takes the half-wave signal of the sine wave positive half cycle as the forward current signal to output;
the output end of each forward current output control circuit 10 is connected with the anode of the tested diode DUT, and the control end is connected with the control chip 9; each forward current output control circuit 10 comprises a relay 101 and a sampling resistor 102 which are connected in sequence, and each relay 101 is also connected with the control chip 9; after any relay 101 receives the instruction for turning on the control chip 9, the forward current flowing through the corresponding forward current output control circuit 10 can be loaded on the diode under test DUT.
Furthermore, the forward current generating circuit further comprises a voltage division filter circuit 11 and a current amplitude adjusting circuit 12; wherein,
The input end of the voltage division filter circuit 11 is connected with the photoelectric coupler 8, and the output end is connected with the input end of the current amplitude adjusting circuit 12;
an output terminal of the current amplitude adjusting circuit 12 is connected to an input terminal of each forward current output control circuit 10.
In one embodiment, the first digital-to-analog converter and the second digital-to-analog converter both use a D/a converter of type TLC5616 CP; the register adopts an HC4053 chip; the third digital-to-analog converter adopts a DAC0832 type D/A converter; the first operational amplifier chip adopts an LM358 type operational amplifier; the second operational amplifier chip adopts an LM412 type operational amplifier; the photoelectric coupler consists of a TIL300A type chip and a TIL117 type chip.
Implement the embodiment of the utility model provides a, following beneficial effect has:
the embodiment of the utility model provides an in, owing to adopt the modularized design, each module circuit autonomous working, mutual interference is less, has advantages such as small, light in weight, easy operation, precision height, safe and reliable, can export the high voltage of peak value, ensures to observe and control real-time and the reliability that data reception handled.
It will be understood by those skilled in the art that all or part of the steps in the method for implementing the above embodiments may be implemented by relevant hardware instructed by a program, and the program may be stored in a computer-readable storage medium, such as ROM/RAM, magnetic disk, optical disk, etc.
The above disclosure is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the scope of the invention, which is defined by the appended claims.
Claims (3)
1. A forward current generating circuit for a diode test is characterized by comprising a pulse signal source, a first digital-to-analog converter, a second digital-to-analog converter, a register, a third digital-to-analog converter, a first operational amplifier chip, a second operational amplifier chip, a photoelectric coupler, a control chip and at least one forward current output control circuit; wherein,
one end of the pulse signal source is connected with the input end of the first digital-to-analog converter, and the other end of the pulse signal source is connected with the input end of the second digital-to-analog converter;
the output end of the first digital-to-analog converter is connected with the first input end of the register;
the output end of the second digital-to-analog converter is connected with the second input end of the register;
the first output end of the register is connected with the first input end of the third digital-to-analog converter, and the second output end of the register is connected with the second input end of the third digital-to-analog converter;
a first output end of the third digital-to-analog converter is connected with a positive input end of the first operational amplifier chip, and a second output end of the third digital-to-analog converter is connected with a negative input end of the first operational amplifier chip;
the output end of the first operational amplifier chip is connected with the positive input end of the second operational amplifier chip;
The photoelectric coupler is connected in series with the negative input end and the output end of the second operational amplifier chip to form a current negative feedback circuit, and the photoelectric coupler is also connected with the input end of each positive current output control circuit;
the output end of each forward current output control circuit is connected with the anode of the diode to be tested, and the control end is connected with the control chip; each forward current output control circuit comprises a relay and a sampling resistor which are connected in sequence, and each relay is also connected with the control chip.
2. The forward current generating circuit according to claim 1, wherein said forward current generating circuit further comprises a voltage dividing filter circuit and a current amplitude adjusting circuit; wherein,
the input end of the voltage division filter circuit is connected with the photoelectric coupler, and the output end of the voltage division filter circuit is connected with the input end of the current amplitude regulating circuit;
and the output end of the current amplitude regulating circuit is connected with the input end of each forward current output control circuit.
3. The forward current generating circuit as claimed in claim 2, wherein said first digital-to-analog converter and said second digital-to-analog converter each employ a D/a converter of the type TLC5616 CP; the register adopts an HC4053 chip; the third digital-to-analog converter adopts a DAC0832 type D/A converter; the first operational amplifier chip adopts an LM358 type operational amplifier; the second operational amplifier chip adopts an LM412 type operational amplifier; the photoelectric coupler consists of a TIL300A type chip and a TIL117 type chip.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620609531.5U CN205692084U (en) | 2016-06-18 | 2016-06-18 | The forward current of a kind of diode test produces circuit |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201620609531.5U CN205692084U (en) | 2016-06-18 | 2016-06-18 | The forward current of a kind of diode test produces circuit |
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| CN201620609531.5U Expired - Fee Related CN205692084U (en) | 2016-06-18 | 2016-06-18 | The forward current of a kind of diode test produces circuit |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108896897A (en) * | 2018-05-24 | 2018-11-27 | 温州大学 | A kind of two end transit time device Steady-state Parameters measuring devices |
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2016
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108896897A (en) * | 2018-05-24 | 2018-11-27 | 温州大学 | A kind of two end transit time device Steady-state Parameters measuring devices |
| CN108896897B (en) * | 2018-05-24 | 2019-08-30 | 温州大学 | A kind of two end transit time device Steady-state Parameters measuring devices |
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Granted publication date: 20161116 Termination date: 20170618 |