CN205691630U - The surge current of a kind of diode test produces circuit - Google Patents
The surge current of a kind of diode test produces circuit Download PDFInfo
- Publication number
- CN205691630U CN205691630U CN201620606513.1U CN201620606513U CN205691630U CN 205691630 U CN205691630 U CN 205691630U CN 201620606513 U CN201620606513 U CN 201620606513U CN 205691630 U CN205691630 U CN 205691630U
- Authority
- CN
- China
- Prior art keywords
- digital
- analog converter
- surge current
- circuit
- input end
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 13
- 238000005070 sampling Methods 0.000 claims abstract description 4
- 230000001105 regulatory effect Effects 0.000 claims 2
- 239000013256 coordination polymer Substances 0.000 claims 1
- 238000010998 test method Methods 0.000 abstract description 5
- 230000009286 beneficial effect Effects 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000001066 destructive effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000003252 repetitive effect Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
Description
技术领域technical field
本实用新型涉及电子测量技术领域，尤其涉及一种二极管试验用的浪涌电流产生电路。The utility model relates to the technical field of electronic measurement, in particular to a surge current generating circuit for a diode test.
背景技术Background technique
近年来，二极管在工业、家用电子行业得到了广泛的应用，且随着技术进步，对二极管的可靠性要求越来越高。二极管在实际应用中，除了可以通过额定电流外，还可能承受浪涌电流。浪涌电流是指二极管结温为某一温度时，正弦半波浪涌脉冲基波宽度为8.3mS或者10mS条件下，该管所能允许通过的最大不重复正弦半波电流。然而，测试二极管承受的浪涌电流是一种破坏性实验，目的是检测器件芯片本身以及接触引线能够承受的浪涌电流能力，并且验证该器件抗浪涌电流的等级。如果通过二极管的浪涌电流超过其允许范围，轻则会引起元器件的性能恶化，如伏安特性、通态峰值电压变化，重则将二极管毁坏，甚至整个电气系统报废。In recent years, diodes have been widely used in industry and household electronics, and with the advancement of technology, the requirements for the reliability of diodes are getting higher and higher. In practical applications, in addition to passing the rated current, the diode may also withstand the surge current. Surge current refers to the maximum non-repetitive sinusoidal half-wave current that can pass through the diode under the condition that the diode junction temperature is a certain temperature and the fundamental wave width of the sinusoidal half-wave surge pulse is 8.3mS or 10mS. However, testing the surge current a diode withstands is a destructive experiment, the purpose of which is to detect the surge current capability that the device chip itself and the contact wires can withstand, and to verify the level of surge current resistance of the device. If the surge current passing through the diode exceeds its allowable range, it will cause the performance of components to deteriorate, such as volt-ampere characteristics, on-state peak voltage changes, and in severe cases, the diode will be destroyed, or even the entire electrical system will be scrapped.
在现有技术中，已有二极管浪涌电流试验研究的相关报道，但测试方法复杂，仪器模块多。In the prior art, there have been related reports on diode surge current test research, but the test method is complicated and there are many instrument modules.
实用新型内容Utility model content
本实用新型实施例所要解决的技术问题在于，提供一种二极管试验用的浪涌电流产生电路，能够简化测试方法，简化电路模块，快速产生浪涌电流。The technical problem to be solved by the embodiment of the utility model is to provide a surge current generating circuit for diode test, which can simplify the test method, simplify the circuit module, and quickly generate the surge current.
本实用新型实施例提供了一种二极管试验用的浪涌电流产生电路，包括脉冲信号源、第一数模转换器、第二数模转换器、寄存器、第三数模转换器、运放芯片、控制芯片以及至少一浪涌电流输出控制电路；其中，The embodiment of the utility model provides a surge current generating circuit for a diode test, including a pulse signal source, a first digital-to-analog converter, a second digital-to-analog converter, a register, a third digital-to-analog converter, and an operational amplifier chip , a control chip, and at least one surge current output control circuit; wherein,
所述脉冲信号源的一端与所述第一数模转换器的输入端相连，另一端与所述第二数模转换器的输入端相连；One end of the pulse signal source is connected to the input end of the first digital-to-analog converter, and the other end is connected to the input end of the second digital-to-analog converter;
所述第一数模转换器的输出端与所述寄存器的第一输入端相连；The output terminal of the first digital-to-analog converter is connected to the first input terminal of the register;
所述第二数模转换器的输出端与所述寄存器的第二输入端相连；The output terminal of the second digital-to-analog converter is connected to the second input terminal of the register;
所述寄存器的第一输出端与所述第三数模转换器的第一输入端相连，第二输出端与所述第三数模转换器的第二输入端相连；The first output terminal of the register is connected to the first input terminal of the third digital-to-analog converter, and the second output terminal is connected to the second input terminal of the third digital-to-analog converter;
所述第三数模转换器的第一输出端与所述运放芯片的正输入端相连，第二输出端与所述运放芯片的负输入端相连；The first output terminal of the third digital-to-analog converter is connected to the positive input terminal of the operational amplifier chip, and the second output terminal is connected to the negative input terminal of the operational amplifier chip;
所述运放芯片的输出端与每一浪涌电流输出控制电路的输入端相连；The output terminal of the operational amplifier chip is connected with the input terminal of each surge current output control circuit;
所述每一浪涌电流输出控制电路的输出端与所述被测二极管的正极均相连，控制端与所述控制芯片均相连；其中，所述每一浪涌电流输出控制电路均包括依序连接的一继电器及一采样电阻，且每一继电器还均与所述控制芯片相连。The output terminal of each of the surge current output control circuits is connected to the anode of the diode under test, and the control terminal is connected to the control chip; wherein, each of the surge current output control circuits includes sequentially A relay and a sampling resistor are connected, and each relay is also connected with the control chip.
其中，所述浪涌电流产生电路还包括分压滤波电路和电流幅值调节电路；其中，Wherein, the surge current generating circuit also includes a voltage dividing filter circuit and a current amplitude adjusting circuit; wherein,
所述分压滤波电路的输入端与所述运放芯片的输出端相连，输出端与所述电流幅值调节电路的输入端相连；The input end of the voltage dividing filter circuit is connected to the output end of the operational amplifier chip, and the output end is connected to the input end of the current amplitude adjustment circuit;
所述电流幅值调节电路的输出端与每一浪涌电流输出控制电路的输入端相连。The output terminal of the current amplitude adjustment circuit is connected with the input terminal of each surge current output control circuit.
其中，所述第一数模转换器和所述第二数模转换器均采用TLC5616CP型D/A转换器；所述寄存器采用HC4053型芯片；所述第三数模转换器采用DAC0832型D/A转换器；所述运放芯片采用LM358型运算放大器。Wherein, the first digital-to-analog converter and the second digital-to-analog converter adopt TLC5616CP type D/A converter; the register adopts HC4053 type chip; the third digital-to-analog converter adopts DAC0832 type D/A converter A converter; the operational amplifier chip adopts LM358 operational amplifier.
实施本实用新型实施例，具有如下有益效果：Implementation of the utility model embodiment has the following beneficial effects:
在本实用新型实施例中，由于采用模块化设计，各个模块电路独立工作，相互干扰较小，具有体积小、重量轻、易操作、精度高、安全可靠等优点，能够简化测试方法，简化电路模块，快速产生浪涌电流。In the embodiment of the utility model, due to the modular design, each module circuit works independently, with less mutual interference, and has the advantages of small size, light weight, easy operation, high precision, safety and reliability, etc., which can simplify the test method and circuit module, quickly generates inrush current.
附图说明Description of drawings
为了更清楚地说明本实用新型实施例或现有技术中的技术方案，下面将对实施例或现有技术描述中所需要使用的附图作简单地介绍。显而易见地，下面描述中的附图仅仅是本实用新型的一些实施例，对于本领域普通技术人员来讲，在不付出创造性劳动的前提下，根据这些附图获得其他的附图仍属于本实用新型的范畴。In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following will briefly introduce the drawings required for the description of the embodiments or the prior art. Obviously, the accompanying drawings in the following description are only some embodiments of the present utility model. For those skilled in the art, on the premise of not paying creative work, obtaining other drawings according to these drawings still belongs to the present utility model. new category.
图1为本实用新型实施例提供的一种二极管试验用的浪涌电流产生电路的系统结构图。Fig. 1 is a system structure diagram of a surge current generating circuit for a diode test provided by an embodiment of the present invention.
具体实施方式detailed description
为使本实用新型的目的、技术方案和优点更加清楚，下面将结合附图对本实用新型作进一步地详细描述。In order to make the purpose, technical solution and advantages of the utility model clearer, the utility model will be further described in detail below in conjunction with the accompanying drawings.
如图1所示，为本实用新型实施例中，提供的一种二极管试验用的浪涌电流产生电路，包括脉冲信号源1、第一数模转换器2、第二数模转换器3、寄存器4、第三数模转换器5、运放芯片6、控制芯片7以及至少一浪涌电流输出控制电路8；其中，As shown in Figure 1, in the embodiment of the present utility model, a kind of surge current generation circuit for diode test is provided, including a pulse signal source 1, a first digital-to-analog converter 2, a second digital-to-analog converter 3, register 4, a third digital-to-analog converter 5, an operational amplifier chip 6, a control chip 7, and at least one surge current output control circuit 8; wherein,
脉冲信号源1的一端与第一数模转换器2的输入端相连，另一端与第二数模转换器3的输入端相连；One end of the pulse signal source 1 is connected to the input end of the first digital-to-analog converter 2, and the other end is connected to the input end of the second digital-to-analog converter 3;
第一数模转换器2的输出端与寄存器4的第一输入端a1相连；The output end of the first digital-to-analog converter 2 is connected to the first input end a1 of the register 4;
第二数模转换器3的输出端与寄存器4的第二输入端a2相连；其中，第二数模转换器3的输出信号与第一数模转换器2的输出信号极性相反；例如第一数模转换器2的输出信号为正极性基准电压的电流信号，则第二数模转换器3的输出信号为负极性基准电压的电流信号；The output terminal of the second digital-to-analog converter 3 is connected with the second input terminal a2 of the register 4; wherein, the output signal of the second digital-to-analog converter 3 is opposite in polarity to the output signal of the first digital-to-analog converter 2; for example, the first The output signal of a digital-to-analog converter 2 is a current signal of a positive polarity reference voltage, and the output signal of the second digital-to-analog converter 3 is a current signal of a negative polarity reference voltage;
寄存器4的第一输出端b1与第三数模转换器5的第一输入端c1相连，第二输出端b2与第三数模转换器5的第二输入端c2相连；其中，寄存器4将互为极性相反的第一数模转换器2的输出信号与第二数模转换器3的输出信号分别转换成极性对应的两个方波信号The first output terminal b1 of the register 4 is connected to the first input terminal c1 of the third digital-to-analog converter 5, and the second output terminal b2 is connected to the second input terminal c2 of the third digital-to-analog converter 5; wherein, the register 4 will The output signal of the first digital-to-analog converter 2 and the output signal of the second digital-to-analog converter 3 with opposite polarities are respectively converted into two square wave signals with corresponding polarities
第三数模转换器5的第一输出端c3与运放芯片6的正输入端(+)相连，第二输出端c4与运放芯片6的负输入端(-)相连；其中，第三数模转换器5将极性对应的两个方波信号为相应的两个正弦全波信号；The first output terminal c3 of the third digital-to-analog converter 5 is connected with the positive input terminal (+) of the operational amplifier chip 6, and the second output terminal c4 is connected with the negative input terminal (-) of the operational amplifier chip 6; wherein, the third The digital-to-analog converter 5 converts the two square-wave signals corresponding to the polarity into two corresponding sine full-wave signals;
运放芯片6的输出端与每一浪涌电流输出控制电路8的输入端相连；其中，第一运放芯片6将两个正弦全波信号转变成只有正弦波正半周的半波信号，并作为浪涌电流信号输出；The output end of the op-amp chip 6 is connected to the input end of each surge current output control circuit 8; wherein, the first op-amp chip 6 converts the two sine full-wave signals into a half-wave signal with only the positive half cycle of the sine wave, and Output as inrush current signal;
每一浪涌电流输出控制电路8的输出端与被测二极管DUT的正极均相连，控制端与控制芯片7均相连；其中，每一浪涌电流输出控制电路10均包括依序连接的一继电器81及一采样电阻82，且每一继电器81还均与控制芯片7相连；其中，当任一继电器81接收到控制芯片7输出让其实现导通的指令后，可实现其对应浪涌电流输出控制电路8上流过的浪涌电流加载至被测二极管DUT上。The output end of each inrush current output control circuit 8 is connected to the anode of the diode DUT under test, and the control end is connected to the control chip 7; wherein, each inrush current output control circuit 10 includes a relay connected in sequence 81 and a sampling resistor 82, and each relay 81 is also connected to the control chip 7; wherein, when any relay 81 receives the command output by the control chip 7 to allow it to be turned on, it can realize its corresponding surge current output The surge current flowing on the control circuit 8 is loaded on the diode under test DUT.
更进一步的，浪涌电流产生电路还包括分压滤波电路9和电流幅值调节电路10；其中，Furthermore, the surge current generating circuit also includes a voltage dividing filter circuit 9 and a current amplitude adjustment circuit 10; wherein,
分压滤波电路9的输入端与运放芯片6的输出端相连，输出端与电流幅值调节电路10的输入端相连；The input end of the voltage dividing filter circuit 9 is connected with the output end of the operational amplifier chip 6, and the output end is connected with the input end of the current amplitude adjustment circuit 10;
电流幅值调节电路10的输出端与每一浪涌电流输出控制电路8的输入端相连。The output terminal of the current amplitude adjustment circuit 10 is connected with the input terminal of each surge current output control circuit 8 .
在一个实施例中，第一数模转换器和第二数模转换器均采用TLC5616CP型D/A转换器；所述寄存器采用HC4053型芯片；所述第三数模转换器采用DAC0832型D/A转换器；所述第一运放芯片采用LM358型运算放大器；所述第二运放芯片采用LM412型运算放大器；所述光电耦合器由TIL300A型芯片及TIL117型芯片构成。In one embodiment, both the first digital-to-analog converter and the second digital-to-analog converter adopt TLC5616CP type D/A converter; the register adopts HC4053 type chip; the third digital-to-analog converter adopts DAC0832 type D/A converter A converter; the first operational amplifier chip adopts LM358 type operational amplifier; the second operational amplifier chip adopts LM412 operational amplifier; the photocoupler is composed of TIL300A type chip and TIL117 type chip.
实施本实用新型实施例，具有如下有益效果：Implementation of the utility model embodiment has the following beneficial effects:
在本实用新型实施例中，由于采用模块化设计，各个模块电路独立工作，相互干扰较小，具有体积小、重量轻、易操作、精度高、安全可靠等优点，能够简化测试方法，简化电路模块，快速产生浪涌电流。In the embodiment of the utility model, due to the modular design, each module circuit works independently, with less mutual interference, and has the advantages of small size, light weight, easy operation, high precision, safety and reliability, etc., which can simplify the test method and circuit module, quickly generates inrush current.
本领域普通技术人员可以理解实现上述实施例方法中的全部或部分步骤是可以通过程序来指令相关的硬件来完成，所述的程序可以存储于一计算机可读取存储介质中，所述的存储介质，如ROM/RAM、磁盘、光盘等。Those of ordinary skill in the art can understand that all or part of the steps in the method of the above-mentioned embodiments can be completed by instructing related hardware through a program, and the program can be stored in a computer-readable storage medium, and the storage Media such as ROM/RAM, magnetic disk, optical disk, etc.
以上所揭露的仅为本实用新型较佳实施例而已，当然不能以此来限定本实用新型之权利范围，因此依本实用新型权利要求所作的等同变化，仍属本实用新型所涵盖的范围。What is disclosed above is only a preferred embodiment of the utility model, and of course it cannot limit the scope of rights of the utility model. Therefore, equivalent changes made according to the claims of the utility model still fall within the scope of the utility model.
Claims (3)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620606513.1U CN205691630U (en) | 2016-06-18 | 2016-06-18 | The surge current of a kind of diode test produces circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620606513.1U CN205691630U (en) | 2016-06-18 | 2016-06-18 | The surge current of a kind of diode test produces circuit |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN205691630U true CN205691630U (en) | 2016-11-16 |
Family
ID=57415263
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201620606513.1U Expired - Fee Related CN205691630U (en) | 2016-06-18 | 2016-06-18 | The surge current of a kind of diode test produces circuit |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN205691630U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109239570A (en) * | 2018-10-31 | 2019-01-18 | 中国振华集团永光电子有限公司（国营第八七三厂） | A kind of diode forward current surge experimental circuit |
| CN110045199A (en) * | 2019-03-20 | 2019-07-23 | 杭州通鉴科技有限公司 | A kind of EFT/ESD/CS analysis of electromagnetic interference instrument |
| CN111025112A (en) * | 2019-12-07 | 2020-04-17 | 温州大学 | Terahertz time-of-flight device half-sine current pulse reliability test device |
-
2016
- 2016-06-18 CN CN201620606513.1U patent/CN205691630U/en not_active Expired - Fee Related
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109239570A (en) * | 2018-10-31 | 2019-01-18 | 中国振华集团永光电子有限公司（国营第八七三厂） | A kind of diode forward current surge experimental circuit |
| CN110045199A (en) * | 2019-03-20 | 2019-07-23 | 杭州通鉴科技有限公司 | A kind of EFT/ESD/CS analysis of electromagnetic interference instrument |
| CN110045199B (en) * | 2019-03-20 | 2024-05-03 | 杭州通鉴科技有限公司 | EFT/ESD/CS electromagnetic interference analyzer |
| CN111025112A (en) * | 2019-12-07 | 2020-04-17 | 温州大学 | Terahertz time-of-flight device half-sine current pulse reliability test device |
| CN111025112B (en) * | 2019-12-07 | 2020-09-29 | 温州大学 | Terahertz time-of-flight device half-sine current pulse reliability test device |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN103630729B (en) | The primary connection device and method of test 1000kV lightning arrester reference voltage and leakage current | |
| CN205691630U (en) | The surge current of a kind of diode test produces circuit | |
| CN203759106U (en) | Commercial power zero cross detection circuit | |
| CN206209088U (en) | Calibration device for zinc oxide arrester tester | |
| CN110118911B (en) | USBC cable test circuit | |
| CN203133266U (en) | Digital testing and evaluation platform used for optical-fiber-type current transformer | |
| CN104316896A (en) | Method for calibrating errors of electric energy meter under influence of direct currents and even-order harmonic | |
| CN106443549A (en) | Analog alternating current resistance device for calibrating battery internal resistance tester | |
| CN103439617B (en) | A kind of power module parallel method of testing of H-bridge circuit | |
| CN104698425A (en) | Automatic load matching method of DC even harmonic test of electric energy meter | |
| CN204228946U (en) | A kind of electric energy meter error calibrating installation | |
| CN101706564B (en) | Cable failure flash detector calibrating device | |
| CN204177858U (en) | A kind of three-phase electricity testing circuit | |
| CN204425272U (en) | A kind of solar cell properties testing equipment | |
| CN204347186U (en) | A kind of polarity testing device of current transformer | |
| CN205692084U (en) | The forward current of a kind of diode test produces circuit | |
| CN111308407A (en) | A wrong wiring device for energy metering | |
| CN105182068A (en) | System and method for testing adaptability of photovoltaic inverter to grid harmonic | |
| CN209895333U (en) | Power supply testing device for hard disk backboard of server | |
| CN203881406U (en) | Liquid level measurement instrument based on constant flow source | |
| CN114879080A (en) | Leakage current testing system and method for transient high-voltage suppressor tube | |
| CN108051737A (en) | A kind of switching device screening system and method | |
| CN204514973U (en) | A kind of AC electronic load device improving waveform distortion under rectification mode | |
| CN203287424U (en) | Surge current testing device | |
| US20160341787A1 (en) | Battery simulator |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20161116 Termination date: 20170618 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |