CN205666800U - Suns voc testing arrangement - Google Patents
Suns voc testing arrangement Download PDFInfo
- Publication number
- CN205666800U CN205666800U CN201620532885.4U CN201620532885U CN205666800U CN 205666800 U CN205666800 U CN 205666800U CN 201620532885 U CN201620532885 U CN 201620532885U CN 205666800 U CN205666800 U CN 205666800U
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- CN
- China
- Prior art keywords
- test
- backing plate
- electrically
- conductive backing
- suns
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
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- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Abstract
The utility model provides a suns voc testing arrangement, includes test platform, still includes at least one test probes row, and every test probes arranges including an electrically -conductive backing plate, is provided with two piece at least test probes on the electrically -conductive backing plate, and each test probes is the interval arrangement on same straight line, on the electrically -conductive backing plate test probes distribution direction both ends with be provided with between the test platform and dismantle connection structure. The utility model discloses a test probes arranges the voltage of every grid line of test, a plurality of sampling the on the many test probes while alignment of grids lines on test probes rows, and the test result is more reliable.
Description
Technical field
This utility model relates to solar battery sheet field, particularly relates to a kind of Suns-Voc and tests device.
Background technology
Conventional Fossil fuel is the most depleted, and in all of sustainable energy, it is the most clear that solar energy is undoubtedly one
Clean, the most universal and most potential alternative energy source.At present, in all of solar cell, crystal-silicon solar cell is to obtain greatly
One of solaode that commerce is promoted, this is owing to silicon materials have extremely abundant reserves in the earth's crust, the most brilliant
Body silicon solar cell compares other kinds of solaode electric property and the mechanical performance of excellence, therefore, crystalline silicon
Solar cell at photovoltaic art in occupation of consequence.
Suns-Voc is the important instrument of test finished product crystalline silicon solar cell piece electrical property, and it is not shared the same light by test
Battery voltage value under Qiang, amasss the tube model a series of parameters that can characterize battery electrology characteristic of acquisition, such as combining double two
J01, J02 can characterize the combining case of cell piece zones of different respectively, and J01 characterizes battery emitter diffusion layer, front and rear surfaces
And silicon substrate is compound, and J02 can characterize the compound of battery emitter stage space-charge region；PFF can characterize deduction battery
The fill factor, curve factor size that can reach of series resistance.
The crystal silicon battery of industrialized production is the most large-area, and the minority carrier life time of polysilicon difference crystal grain is different, crystal boundary
Locating relatively low minority carrier life time, or diffusion is uneven, these are all likely to result in the photoelectric effect of battery device regional not
Uniformly.During Suns-Voc test, contact a point of the grid line of large-area battery device with a test probe, if battery
Device inside photoelectric respone is uneven, with the diverse location of piece test probe of Suns-Voc contact battery grid line, it is thus achieved that electricity
Pressure can be variant, and especially for polycrystalline battery, this species diversity can become apparent from, it may be assumed that the inhomogeneities within cell piece is led
The measurement result causing grid line diverse location is different, and the point every time being tested a grid line by a test probe can not be obtained
Data reliably.
Summary of the invention
The purpose of this utility model is to provide a kind of Suns-Voc to test device.
For reaching above-mentioned purpose, the technical solution adopted in the utility model is: a kind of Suns-Voc tests device, including surveying
Examination platform, also includes at least one test probe row, and each test probe package includes an electrically-conductive backing plate, electrically-conductive backing plate is provided with
At least two test probes, each test probe is spaced layout on the same line；
Test on described electrically-conductive backing plate to be provided with between two ends and the described test platform in probe distribution direction and detachably connect
Access node structure.
In such scheme, " the same straight line " of described " each test probe is spaced layout on the same line " is not the most straight
Line, the test probe in same test probe row can be on same grid line；Each test probe separation is arranged, adjacent survey
Souning out the spacing between pin can be different, it is also possible to identical, spacing can be arranged according to the actual distribution situation of cell piece.
In such scheme, described Detachable connection structure is magnetic connecting structure, and this magnetic connecting structure includes being located at survey
Trying two iron bars being parallel to each other on platform and be located at the Magnet at electrically-conductive backing plate two ends, magnetic connects can will test probe
It is pressed on grid line, uses reliable.
In such scheme, described Detachable connection structure is magnetic connecting structure, and this magnetic connecting structure includes being located at survey
Trying two bar magnets being parallel to each other on platform and be located at the iron block at electrically-conductive backing plate two ends, magnetic connects can will test
Probe is pressed on grid line, uses reliable.
In such scheme, the length that described electrically-conductive backing plate is tested probe is successively decreased to both sides by centre, because electrically-conductive backing plate
Two ends and test platform between be provided with attachment structure, and without attachment structure, institute in the middle part of electrically-conductive backing plate and between test platform
With in order to ensure effectively contacting reliably between test probe and the grid line in the middle part of electrically-conductive backing plate, by long for middle test probe
The test probe on the ratio both sides that degree is arranged is slightly longer；If it being applied pressure on whole electrically-conductive backing plate, it is also possible to each test is visited
Pin length is set to equal length.
In such scheme, the length that described electrically-conductive backing plate is tested probe is successively decreased to both sides by centre, adjacent test probe
Between length difference be 0.01 ~ 0.1 centimetre.
In such scheme, described test probe moves and is arranged on electrically-conductive backing plate, and the position of test probe is adjustable, in reality
During application, test probe location can be adjusted according to the concrete condition of cell piece, such as: position measurement uneven on cell piece is visited
Pin is more concentrated.
In such scheme, described electrically-conductive backing plate offers multiple pilot hole, in order to adjust test corresponding to test probe
Probe position on electrically-conductive backing plate.
In such scheme, a diameter of 0.2 ~ 3 centimetre of described test probe.
In such scheme, in addition to magnetic is connected, between electrically-conductive backing plate with test platform, may be used without detachably connecting of other
Connect mode, such as guide rail connection, clamping etc., as long as can arrange by corresponding grid line position mobile test probe, and ensure that test
Effectively contacting between probe with grid line.
Owing to technique scheme is used, this utility model compared with prior art has the advantage that
1. this utility model is visited by the voltage of test probe row's every grid line of test, many tests on test probe row
Multiple points on grid line are sampled by pin simultaneously, and test result is relatively reliable；
For removably connecting between test probe the most of the present utility model row and test platform, a test probe row can
Successively a plurality of grid line is tested, conveniently moving；
3. this utility model simple in construction, uses reliable, it is simple to safeguard.
Accompanying drawing explanation
Fig. 1 is that this utility model embodiment one uses status architecture schematic diagram.
Fig. 2 is this utility model embodiment one top view.
Wherein: 1, test platform；2, electrically-conductive backing plate；3, test probe；4, Magnet；5, iron bar；6, cell piece；7, wire；
8, grid line.
Detailed description of the invention
Below in conjunction with the accompanying drawings and this utility model is further described by embodiment:
Embodiment one:
Seeing shown in Fig. 1 ~ 2, a kind of Suns-Voc tests device, including test platform, also includes that at least one test is visited
Faller gill, each test probe package includes an electrically-conductive backing plate 2, electrically-conductive backing plate 2 is provided with at least two test probes 3, respectively tests
Probe 3 is spaced layout on the same line, and electrically-conductive backing plate 2 is provided with a wire 7；
Test on described electrically-conductive backing plate 2 and be provided with detachably between two ends and the described test platform 1 of probe 3 distribution arrangement
Attachment structure.
In actual applications, it is also possible to multiple test probe row is set simultaneously, a plurality of grid line 8 is tested simultaneously.
Described Detachable connection structure is magnetic connecting structure, and this magnetic connecting structure includes being located on test platform 1
Article two, the iron bar 5 being parallel to each other and the Magnet 4 being located at electrically-conductive backing plate 2 two ends, magnetic connects and can be pressed on by test probe 3
On grid line, use reliable；In actual applications, if magnetic connecting structure includes that two be located on test platform 1 are parallel to each other
Bar magnet and be located at the iron block at electrically-conductive backing plate 2 two ends, it is possible to reach same effect.
On described electrically-conductive backing plate 2 test probe 3 length successively decreased to both sides by centre because the two ends of electrically-conductive backing plate 2 with
Attachment structure it is provided with between test platform 1, and without attachment structure in the middle part of electrically-conductive backing plate 2 and between test platform 1, so in order to
Ensure effectively contacting reliably between test probe 3 and grid line 8 in the middle part of electrically-conductive backing plate 2, by middle test probe 3 length
The test probe 3 on the ratio both sides arranged is slightly longer；If it being applied pressure on whole electrically-conductive backing plate 2, it is also possible to each test is visited
Pin length 3 is set to equal length.
The length testing probe 3 on described electrically-conductive backing plate 2 is successively decreased to both sides by centre, length between adjacent test probe 3
Difference is 0.05 centimetre.
Described test probe 3 moves and is arranged on electrically-conductive backing plate 2, and the position of test probe 3 is adjustable, when reality is applied,
Test probe 3 position can be adjusted, such as: position measurement probe 3 uneven on cell piece 6 according to the concrete condition of cell piece 6
More concentrate.
Visit 3 pins corresponding to test on described electrically-conductive backing plate 2 and offer multiple pilot hole, leading in order to adjust test probe 3
Position on electric substrate 2.
A diameter of 0.5 centimetre of described test probe 3.
Claims (8)
1. Suns-Voc tests a device, including test platform, it is characterised in that: also include at least one test probe row,
Each test probe package includes an electrically-conductive backing plate, and electrically-conductive backing plate is provided with at least two test probes, and each test probe is same
On one straight line, interval is arranged；
Test on described electrically-conductive backing plate and be provided with, between two ends and the described test platform in probe distribution direction, the knot that removably connects
Structure.
Suns-Voc the most according to claim 1 tests device, it is characterised in that: described Detachable connection structure is magnetic
Attachment structure, this magnetic connecting structure includes be located on test platform two iron bars being parallel to each other and is located at electrically-conductive backing plate
The Magnet at two ends.
Suns-Voc the most according to claim 1 tests device, it is characterised in that: described Detachable connection structure is magnetic
Attachment structure, this magnetic connecting structure includes be located on test platform two bar magnets being parallel to each other and is located at conduction
The iron block at substrate two ends.
Suns-Voc the most according to claim 1 tests device, it is characterised in that: test probe on described electrically-conductive backing plate
Length is successively decreased to both sides by centre.
Suns-Voc the most according to claim 4 tests device, it is characterised in that: test probe on described electrically-conductive backing plate
Length is successively decreased to both sides by centre, and between adjacent test probe, length difference is 0.01 ~ 0.1 centimetre.
Suns-Voc the most according to claim 1 tests device, it is characterised in that: described test probe moves to be arranged at leads
On electric substrate.
Suns-Voc the most according to claim 1 tests device, it is characterised in that: corresponding to test on described electrically-conductive backing plate
Probe offers multiple pilot hole, in order to adjust test probe position on electrically-conductive backing plate.
Suns-Voc the most according to claim 1 tests device, it is characterised in that: described test probe a diameter of 0.2 ~
3 centimetres.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620532885.4U CN205666800U (en) | 2016-06-03 | 2016-06-03 | Suns voc testing arrangement |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620532885.4U CN205666800U (en) | 2016-06-03 | 2016-06-03 | Suns voc testing arrangement |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN205666800U true CN205666800U (en) | 2016-10-26 |
Family
ID=57158666
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201620532885.4U Expired - Fee Related CN205666800U (en) | 2016-06-03 | 2016-06-03 | Suns voc testing arrangement |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN205666800U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109347437A (en) * | 2018-09-17 | 2019-02-15 | 江西展宇新能源股份有限公司 | A kind of more main grid test equipment of solar cells |
| WO2019041965A1 (en) * | 2017-08-30 | 2019-03-07 | 米亚索乐装备集成（福建）有限公司 | Support apparatus and test method for flexible solar cell performance test |
-
2016
- 2016-06-03 CN CN201620532885.4U patent/CN205666800U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2019041965A1 (en) * | 2017-08-30 | 2019-03-07 | 米亚索乐装备集成（福建）有限公司 | Support apparatus and test method for flexible solar cell performance test |
| CN109347437A (en) * | 2018-09-17 | 2019-02-15 | 江西展宇新能源股份有限公司 | A kind of more main grid test equipment of solar cells |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20161026 Termination date: 20170603 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |