CN205450810U - Semiconductor dehumidifier remote monitoring device - Google Patents
Semiconductor dehumidifier remote monitoring device Download PDFInfo
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- CN205450810U CN205450810U CN201620144317.7U CN201620144317U CN205450810U CN 205450810 U CN205450810 U CN 205450810U CN 201620144317 U CN201620144317 U CN 201620144317U CN 205450810 U CN205450810 U CN 205450810U
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Abstract
Semiconductor dehumidifier remote monitoring device, by voltage stabilizing circuit, humicap detection circuitry, semiconductor refrigeration piece detection circuitry, fan detection circuitry and warning circuit constitute, semiconductor refrigeration piece detection circuitry's temperature switch installs the end lower part that generates heat at the semiconductor refrigeration of semiconductor dehumidifier piece, fan detection circuitry's magnet mechanism installs on the fan pivot rear end of semiconductor dehumidifier, fan detection circuitry's tongue tube is installed in the plastic case, and install the plastic case inside the fan motor of semiconductor dehumidifier casing, voltage stabilizing circuit, humicap detection circuitry, semiconductor refrigeration piece detection circuitry's relay, fan detection circuitry's steady voltage unit and warning circuit install in the subassembly wrapper and fan detection circuitry's tongue tube, semiconductor refrigeration piece detection circuitry's temperature switch passes through the wire and connects. User phone number when the fan goes wrong, can be dialed through the warning circuit circulation to this novel humicap or semiconductor refrigeration piece at the semiconductor dehumidifier.
Description
Technical field
This utility model relates to the matching used monitoring facilities of semiconductor dehumidifier, a kind of sense at semiconductor dehumidifier wet element humicap goes wrong, or the semiconductor chilling plate of semiconductor dehumidifier goes wrong, the fan of semiconductor dehumidifier goes wrong when making complete machine cisco unity malfunction, the mobile phone energy Automatic Cycle of warning circuit dials a telephone number of owner, notify that owner's semiconductor dehumidifier goes wrong, so that owner takes counter-measure, prevent by the equipment of semiconductor dehumidifier cool-down dehumidification, due to semiconductor dehumidifier cisco unity malfunction, thus cause by heat dissipation equipment because temperature rise is too high, humidity is excessive and causes the semiconductor dehumidifier long-distance monitorng device of damage.
Background technology
Semiconductor dehumidifier is high due to efficiency, volume is little, it is widely used in electric power cabinet cool-down dehumidification, utilizing semiconductor chilling plate and fan to suck outside air, the electric power cabinet in work is carried out cool-down dehumidification, existing semiconductor dehumidifier does not has the facility of a kind of real-time monitoring, go wrong in semiconductor dehumidifier works, when user finds the most in time, can cause by the equipment of semiconductor dehumidifier cool-down dehumidification, because temperature rise is too high, humidity is excessive and causes damage.
Utility model content
nullIn order to overcome existing semiconductor dehumidifier there is no the facility of a kind of real-time monitoring，Go wrong in semiconductor dehumidifier works，When user finds the most in time，Can cause by the equipment of semiconductor dehumidifier cool-down dehumidification，Because temperature rise is too high、The excessive drawback causing damage of humidity，This utility model provides a kind of sense at semiconductor dehumidifier wet element humicap and goes wrong，Or the semiconductor chilling plate of semiconductor dehumidifier goes wrong、The fan of semiconductor dehumidifier goes wrong when making complete machine cisco unity malfunction，The mobile phone energy Automatic Cycle of warning circuit dials a telephone number of owner，Notify that owner's semiconductor dehumidifier goes wrong，So that owner takes counter-measure，Prevent by the equipment of semiconductor dehumidifier cool-down dehumidification，Due to semiconductor dehumidifier cisco unity malfunction，Thus cause by heat dissipation equipment because temperature rise is too high、Humidity is excessive and causes the semiconductor dehumidifier long-distance monitorng device of damage.
This utility model solves its technical problem and be the technical scheme is that
nullSemiconductor dehumidifier long-distance monitorng device，It is characterized in that by mu balanced circuit、Humicap testing circuit、Semiconductor chilling plate testing circuit、Fan testing circuit and warning circuit are constituted，Semiconductor chilling plate testing circuit is made up of temperature switch and relay，Fan testing circuit is by voltage regulation unit and tongue tube、Magnet mechanism forms，Mu balanced circuit、Humicap testing circuit、The relay of semiconductor chilling plate testing circuit、Voltage regulation unit and the warning circuit of fan testing circuit are arranged in subassembly wrapper，The temperature switch of semiconductor chilling plate testing circuit is arranged on the heating end bottom of the semiconductor chilling plate of semiconductor dehumidifier，The Magnet mechanism of fan testing circuit is arranged on the fan shaft rear end of semiconductor dehumidifier，The tongue tube of fan testing circuit is arranged in plastic casing，And plastic casing is arranged on inside the fan motor case of semiconductor dehumidifier，Mu balanced circuit power input and 220V alternating current power supply are connected by wire，Mu balanced circuit cathode power supply outfan and humicap testing circuit cathode power supply input、Semiconductor chilling plate testing circuit cathode power supply input、Warning circuit the first cathode power supply input is connected by wire，Wet element humicap two ends are connected by wire with the sense of semiconductor dehumidifier respectively at the signal input two ends of humicap testing circuit，Humicap testing circuit cathode power supply outfan、Semiconductor chilling plate testing circuit cathode power supply outfan、Fan testing circuit cathode power supply outfan and warning circuit the second cathode power supply input are connected by wire，Mu balanced circuit negative power supply outfan and humicap testing circuit negative power supply input、Semiconductor chilling plate testing circuit negative power supply input、Fan testing circuit negative power supply input、Warning circuit negative power supply input passes through wired earth.
nullDescribed mu balanced circuit is by mains transformer、Silicon rectifier diode、Electrochemical capacitor、Three ends fix output voltage stabilizer and ceramic disc capacitor composition，Silicon rectifier diode has four，Ceramic disc capacitor has two，It is 7805 that three ends fix output voltage stabilizer model，Mains transformer secondary windings wherein one end and first silicon rectifier diode negative pole、Second silicon rectifier diode positive pole is connected by wire，The mains transformer secondary windings other end and the 3rd silicon rectifier diode negative pole、4th silicon rectifier diode positive pole is connected by wire，Second silicon rectifier diode negative pole and the 4th silicon rectifier diode negative pole、Electrochemical capacitor positive pole、First ceramic disc capacitor one end、Three ends are fixed cathode power supply input 1 foot of output voltage stabilizer and are connected by wire，First silicon rectifier diode positive pole and the 3rd silicon rectifier diode positive pole、Electrochemical capacitor negative pole、First ceramic disc capacitor other end、Three ends fix negative power supply input 2 foot of output voltage stabilizer、Wired earth is passed through in second ceramic disc capacitor one end，Three ends fix cathode power supply outfan 3 foot of output voltage stabilizer and second ceramic disc capacitor other end is connected by wire.
nullDescribed humicap testing circuit is by resistance、Adjustable resistance、Germanium detector diode、Ceramic disc capacitor、Time-base integrated circuit、Relay and NPN audion composition，Germanium detector diode has two，Ceramic disc capacitor has four，Reset terminal 4 foot of adjustable resistance one end and time-base integrated circuit and cathode power supply input 8 foot、Relay cathode power supply input、Relay one normally-closed contact end is connected by wire，Discharge end 7 foot of the adjustable resistance other end and time-base integrated circuit、Resistance one end is connected by wire，Triggering end 2 foot of time-base integrated circuit is connected by wire with threshold values end 6 foot and the resistance other end，Outfan 3 foot of time-base integrated circuit and first ceramic disc capacitor one end、Second ceramic disc capacitor one end is connected by wire，First ceramic disc capacitor other end and first germanium detector diode positive pole、Second germanium detector diode negative pole is connected by wire，First germanium detector diode negative pole and the 3rd ceramic disc capacitor one end、NPN transistor base is connected by wire，NPN transistor collector and relay negative power supply input are connected by wire，Control end 5 foot of time-base integrated circuit and the 4th ceramic disc capacitor one end are connected by wire，Negative power supply input 1 foot of time-base integrated circuit and the 4th the ceramic disc capacitor other end、Second ceramic disc capacitor other end、Second germanium detector diode negative pole、3rd the ceramic disc capacitor other end、NPN transistor emitter passes through wired earth.
The time-base integrated circuit model of described humicap testing circuit is NE555.
The temperature switch of described semiconductor chilling plate testing circuit is electric-contact mercury temp meter, and the relay cathode power supply input of temperature switch one end and semiconductor chilling plate testing circuit, relay one normally opened contact end are connected by wire.
nullThe voltage regulation unit of described fan testing circuit is by decompression capacitor、Resistance、Zener diode、Commutation diode、Electrochemical capacitor and relay composition，Zener diode has two，Commutation diode has four，Electrochemical capacitor has two，Decompression capacitor one end and first Zener diode negative pole、First silicon rectifier diode positive pole、Second silicon rectifier diode positive pole is connected by wire，Resistance one end and second Zener diode negative pole、3rd silicon rectifier diode positive pole、4th silicon rectifier diode positive pole is connected by wire，First Zener diode positive pole and second Zener diode positive pole、First electrochemical capacitor negative pole、Second electrochemical capacitor negative pole、Relay negative power supply input passes through wired earth，First silicon rectifier diode negative pole and the 3rd silicon rectifier diode negative pole、First electrochemical capacitor positive pole、Second silicon rectifier diode negative pole、4th silicon rectifier diode negative pole、Second electrochemical capacitor positive pole、Tongue tube one end of fan testing circuit is connected by wire，The tongue tube other end of fan testing circuit and relay cathode power supply input、Relay one normally-closed contact end is connected by wire.
nullThe Magnet mechanism of described fan testing circuit is by base plate、Chute、Upper Magnet、Lower magnet and return spring composition，There is a perforate at the center of base plate，Chute has four，Four chutes are arranged on base plate，Upper Magnet、Medial extremity the right and left of lower magnet is respectively arranged with a slide bar，Upper Magnet、The slide bar of lower magnet is respectively fitted in four chutes，Return spring has two，Wherein one end of a return spring is arranged on base plate upper end，The other end is arranged on Magnet medial extremity，One end of another return spring is arranged on base plate lower end，The other end is arranged on lower magnet medial extremity，Magnet mechanism is arranged on the fan shaft rear end of semiconductor dehumidifier by base plate center drilling，Magnet mechanism is arranged on the fan shaft rear end of semiconductor dehumidifier，The tongue tube of fan testing circuit is arranged in plastic casing，After plastic casing is arranged on the fan motor case inside of semiconductor dehumidifier，When the fan shaft of semiconductor dehumidifier rotates，Under centrifugal action，Upper Magnet、Lower magnet can be displaced outwardly along chute，Upper Magnet、The magnetic action power of lower magnet can make tongue tube internal actions contact connect with stationary contact.
nullDescribed warning circuit is by single-chip microcomputer、Resistance、Crystal oscillator、Electrochemical capacitor、Relay、Silicon rectifier diode and mobile phone composition，Silicon rectifier diode has two，Mobile phone is the button mobile phone with signal-key dialing function，Reset terminal the 1st foot of single-chip microcomputer and resistance one end、Electrochemical capacitor negative pole is connected by wire，External crystal oscillator end the 4th foot of single-chip microcomputer and crystal oscillator one end are connected by wire，External crystal oscillator end the 5th foot of single-chip microcomputer and the crystal oscillator other end are connected by wire，Negative power supply input the 10th foot of single-chip microcomputer and the resistance other end pass through wired earth，Cathode power supply input the 20th foot of single-chip microcomputer and electrochemical capacitor positive pole are connected by wire，First low level output end 19 foot and first relay negative power supply input of single-chip microcomputer are connected by wire，Second low level output end 18 foot and second relay negative power supply input of single-chip microcomputer are connected by wire，Two normally opened contact ends of first relay are connected by wire with two power contacts under numeral keys on mobile phone 2 key respectively，Two normally opened contact ends of second relay are connected by wire with two power contacts under switch switch key on mobile phone respectively，Mobile phone negative power supply input passes through wired earth，Mobile phone cathode power supply input and first silicon rectifier diode negative pole are connected by wire，First silicon rectifier diode positive pole and second silicon rectifier diode negative pole are connected by wire.
The single-chip microcomputer model of described warning circuit is AT89C2051/24PI.
This utility model provides the benefit that: by humicap testing circuit, and the sense wet element humicap at semiconductor dehumidifier goes wrong when making complete machine cisco unity malfunction, can dial one telephone number of user by warning circuit circulation；By semiconductor chilling plate testing circuit, the semiconductor chilling plate at semiconductor dehumidifier goes wrong when making complete machine cisco unity malfunction, can dial one telephone number of user by warning circuit circulation；By fan testing circuit, the fan at semiconductor dehumidifier goes wrong when making complete machine cisco unity malfunction, can dial one telephone number of user by warning circuit circulation.More than by, this New Energy is when semiconductor dehumidifier breaks down, by the handset dialing remote notification user of warning circuit, so that owner takes counter-measure, prevent by the equipment of semiconductor dehumidifier cool-down dehumidification, due to semiconductor dehumidifier cisco unity malfunction, thus cause by heat dissipation equipment because temperature rise is too high, humidity is excessive and causes damage.More than based on, so this novel application prospect having had.
Accompanying drawing explanation
With embodiment, this utility model is described further below in conjunction with the accompanying drawings.
Fig. 1 is this utility model structural representation.
Fig. 2 is the Magnet mechanism structural representation of this utility model fan testing circuit.
The circuit diagram that Fig. 3 is the control circuit in this utility model and semiconductor dehumidifier, feel between wet element humicap, semiconductor chilling plate, fan electromotor.
Detailed description of the invention
nullShown in Fig. 1 and Fig. 2，Semiconductor dehumidifier long-distance monitorng device，By mu balanced circuit 101、Humicap testing circuit 102、Semiconductor chilling plate testing circuit 103、Fan testing circuit 104 and warning circuit 105 are constituted，Semiconductor chilling plate testing circuit 103 is made up of temperature switch 103-1 and relay，Fan testing circuit 104 is by voltage regulation unit and tongue tube 104-1、Magnet mechanism forms，Mu balanced circuit 101、Humicap testing circuit 102、The relay of semiconductor chilling plate testing circuit 103、Voltage regulation unit and the warning circuit 105 of fan testing circuit 104 are arranged in subassembly wrapper 106，The temperature switch 103-1 of semiconductor chilling plate testing circuit 103 is arranged on the heating end bottom of the semiconductor chilling plate of semiconductor dehumidifier，The Magnet mechanism of fan testing circuit 104 is arranged on the fan shaft rear end of semiconductor dehumidifier，The tongue tube 104-1 of fan testing circuit is arranged in plastic casing 107，And plastic casing 107 is arranged on inside the fan motor case of semiconductor dehumidifier，Mu balanced circuit 101 power input and 220V alternating current power supply are connected by wire，Mu balanced circuit 101 cathode power supply outfan and humicap testing circuit 102 cathode power supply input、Semiconductor chilling plate testing circuit 103 cathode power supply input、Warning circuit 105 first cathode power supply input is connected by wire，Wet element humicap two ends are connected by wire with the sense of semiconductor dehumidifier respectively at the signal input two ends of humicap testing circuit 102，Humicap testing circuit 102 cathode power supply outfan、Semiconductor chilling plate testing circuit 103 cathode power supply outfan、Fan testing circuit 104 cathode power supply outfan and warning circuit 105 second cathode power supply input are connected by wire，Mu balanced circuit 101 negative power supply outfan and humicap testing circuit 102 negative power supply input、Semiconductor chilling plate testing circuit 103 negative power supply input、Fan testing circuit 104 negative power supply input、Warning circuit 105 negative power supply input passes through wired earth.nullThe Magnet mechanism of fan testing circuit is by base plate 201、Chute 202、Upper Magnet 203、Lower magnet 204 and return spring 205 form，There is a perforate 201-1 at the center of base plate 201，Chute 202 has four，Four chutes 202 are arranged on base plate 201，Upper Magnet 203、Medial extremity the right and left of lower magnet 204 is respectively arranged with a slide bar，Upper Magnet 203、The slide bar of lower magnet 204 is respectively fitted in four chutes 202，Return spring 205 has two，Wherein one end of a return spring 205 is arranged on base plate 201 upper end，The other end is arranged on Magnet 203 medial extremity，One end of another return spring 205 is arranged on base plate 201 lower end，The other end is arranged on lower magnet 204 medial extremity，Magnet mechanism is arranged on the fan shaft rear end of semiconductor dehumidifier by base plate 201 center drilling 201-1，Magnet mechanism is arranged on the fan shaft rear end of semiconductor dehumidifier，The tongue tube of fan testing circuit is arranged in plastic casing，After plastic casing is arranged on the fan motor case inside of semiconductor dehumidifier，When the fan shaft of semiconductor dehumidifier rotates，Under centrifugal action，Upper Magnet 203、Lower magnet 204 can be displaced outwardly along chute 202，Upper Magnet 203、The magnetic action power of lower magnet 204 can make tongue tube internal actions contact connect with stationary contact.In mu balanced circuit 101: when after 220V alternating current power supply input stabilizing circuit 101 power input, mu balanced circuit 101 power output end can export stable 5V DC source to subsequent conditioning circuit, then, follow-up humicap testing circuit 102, semiconductor chilling plate testing circuit 103 and warning circuit 105 obtain electric, user hands pushes for emergency the switch switch on circuit 105 mobile phone, makes warning circuit 105 mobile phone power-on be in holding state.In humicap testing circuit 102 and warning circuit 105: after humicap testing circuit 102 obtains electric work, when the sense of semiconductor dehumidifier wet element humicap breaks down (such as open circuit), when causing semiconductor dehumidifier internal circuit cisco unity malfunction, under humicap testing circuit 102 internal circuit effect, warning circuit 105 can obtain electric work, under warning circuit 105 internal circuit effect, the mobile phone of warning circuit 105 can circulate dials the telephone number that user is stored in advance on hand-set digit key 2 key, and notice user semiconductor dehumidifier goes wrong.In semiconductor chilling plate testing circuit 103 and warning circuit 105: semiconductor chilling plate testing circuit 103 electric after, cause its heating one end temperature rise too high when the semiconductor chilling plate of semiconductor dehumidifier goes wrong, when causing semiconductor dehumidifier cisco unity malfunction, under semiconductor chilling plate testing circuit 103 internal circuit effect, warning circuit 105 can obtain electric work, under warning circuit 105 internal circuit effect, the mobile phone of warning circuit 105 can circulate dials the telephone number that user is stored in advance on hand-set digit key 2 key, notice user semiconductor dehumidifier goes wrong.In fan testing circuit 104 and warning circuit 105: in use, when the fan of semiconductor dehumidifier normally works, the fan testing circuit Magnet mechanism being arranged in fan electromotor rotating shaft can rotate clockwise with the fan electromotor rotating shaft of semiconductor dehumidifier with speed faster, at upper Magnet 203, lower magnet 204 rotates under the centrifugal action produced, upper Magnet 203, lower magnet 204 can overcome the pulling force of return spring 205, it is displaced outwardly along four chutes 202, and close to the tongue tube 104-1 of fan testing circuit 104, the magnetic action power of upper Magnet 203 and lower magnet 204 acts on tongue tube 104-1, make internal two contactings of tongue tube 104-1, then, fan testing circuit 104 not out-put supply is to warning circuit 105；When the rotating shaft that goes wrong of the fan of semiconductor dehumidifier can not operate, upper Magnet 203, lower magnet 204 are under the pulling force effect of return spring 205, along chute 202 inward, the magnetic action power of upper Magnet 203 and lower magnet 204 no longer acts on tongue tube 104-1, then, fan testing circuit 104 out-put supply is to warning circuit 105, under warning circuit 105 internal circuit effect, the mobile phone of warning circuit 105 can circulate dials the telephone number that user is stored in advance on hand-set digit key 2 key, and notice user semiconductor dehumidifier goes wrong.More than by, this New Energy is when semiconductor dehumidifier breaks down, by the handset dialing remote notification user of warning circuit 105, so that owner takes counter-measure, prevent by the equipment of semiconductor dehumidifier cool-down dehumidification, due to semiconductor dehumidifier cisco unity malfunction, thus cause by heat dissipation equipment because temperature rise is too high, humidity is excessive and causes damage.
Shown in Fig. 3, A2 is the control circuit in semiconductor dehumidifier, and C4 is the wet element humicap of the sense in semiconductor dehumidifier, and BT is the semiconductor chilling plate in semiconductor dehumidifier, and M is the fan electromotor in semiconductor dehumidifier.nullBy mains transformer T，Silicon rectifier diode VD1、VD2、VD3、VD4，Electrochemical capacitor C1，Three ends fix output voltage stabilizer A1 and ceramic disc capacitor C2、C3 forms mu balanced circuit，Silicon rectifier diode has four，Ceramic disc capacitor has two，It is 7805 that three ends fix output voltage stabilizer A1 model，Mains transformer T secondary windings wherein one end and first silicon rectifier diode VD1 negative pole、Second silicon rectifier diode VD2 positive pole is connected by wire，The mains transformer T secondary windings other end and the 3rd silicon rectifier diode VD3 negative pole、4th silicon rectifier diode VD4 positive pole is connected by wire，Second silicon rectifier diode VD2 negative pole and the 4th silicon rectifier diode VD4 negative pole、Electrochemical capacitor C1 positive pole、First ceramic disc capacitor C2 one end、Three ends are fixed cathode power supply input 1 foot of output voltage stabilizer A1 and are connected by wire，First silicon rectifier diode VD1 positive pole and the 3rd silicon rectifier diode VD3 positive pole、Electrochemical capacitor C1 negative pole、First ceramic disc capacitor C2 other end、Three ends fix negative power supply input 2 foot of output voltage stabilizer A1、Wired earth is passed through in second ceramic disc capacitor C3 one end，Three ends fix cathode power supply outfan 3 foot of output voltage stabilizer A1 and second ceramic disc capacitor C3 other end is connected by wire.nullBy resistance R1，Adjustable resistance RP，Germanium detector diode VD5、VD6，Ceramic disc capacitor C5、C6、C7、C8，Time-base integrated circuit A3，Relay K 1 and NPN audion VT1 forms humicap testing circuit，Germanium detector diode has two，Ceramic disc capacitor has four，Reset terminal 4 foot of adjustable resistance RP one end and time-base integrated circuit A3 and cathode power supply input 8 foot、Relay K 1 cathode power supply input、Relay K 1 one normally-closed contact end is connected by wire，Discharge end 7 foot of the adjustable resistance RP other end and time-base integrated circuit A3、Resistance R1 one end is connected by wire，Triggering end 2 foot of time-base integrated circuit A3 is connected by wire with threshold values end 6 foot and the resistance R1 other end，Outfan 3 foot of time-base integrated circuit A3 and first ceramic disc capacitor C5 one end、Second ceramic disc capacitor C6 one end is connected by wire，First ceramic disc capacitor C5 other end and first germanium detector diode VD5 positive pole、Second germanium detector diode VD6 negative pole is connected by wire，First germanium detector diode VD5 negative pole and the 3rd ceramic disc capacitor C7 one end、NPN audion VT1 base stage is connected by wire，NPN audion VT1 colelctor electrode and relay K 1 negative power supply input are connected by wire，Control end 5 foot of time-base integrated circuit A3 and the 4th ceramic disc capacitor C8 one end are connected by wire，Negative power supply input 1 foot of time-base integrated circuit A3 and the 4th the ceramic disc capacitor C8 other end、Second ceramic disc capacitor C6 other end、Second germanium detector diode VD6 negative pole、3rd the ceramic disc capacitor C7 other end、NPN audion VT1 emitter stage passes through wired earth.The time-base integrated circuit model of humicap testing circuit is NE555.The temperature switch RT of semiconductor chilling plate testing circuit is electric-contact mercury temp meter, and the relay K 4 cathode power supply input of temperature switch RT one end and semiconductor chilling plate testing circuit, relay K 4 one normally opened contact end are connected by wire.nullBy decompression capacitor C10，Resistance R3，Zener diode VZ1、VZ2，Commutation diode VD7、VD8、VD9、VD10，Electrochemical capacitor C11、C12 and relay K 5 form the voltage regulation unit of fan testing circuit，Zener diode has two，Commutation diode has four，Electrochemical capacitor has two，Decompression capacitor C10 one end and first Zener diode VZ1 negative pole、First silicon rectifier diode VD7 positive pole、Second silicon rectifier diode VD8 positive pole is connected by wire，Resistance R3 one end and second Zener diode VZ2 negative pole、3rd silicon rectifier diode VD9 positive pole、4th silicon rectifier diode VD10 positive pole is connected by wire，First Zener diode VZ1 positive pole and second Zener diode VZ2 positive pole、The negative pole of first electrochemical capacitor C11、The negative pole of second electrochemical capacitor C12、Relay K 5 negative power supply input passes through wired earth，First silicon rectifier diode VD7 negative pole and the 3rd silicon rectifier diode VD9 negative pole、First electrochemical capacitor C11 positive pole、Second silicon rectifier diode VD8 negative pole、4th silicon rectifier diode VD10 negative pole、Second electrochemical capacitor C12 positive pole、Tongue tube GH one end of fan testing circuit is connected by wire，The tongue tube GH other end of fan testing circuit and relay K 5 cathode power supply input、Relay K 5 one normally-closed contact end is connected by wire.nullBy Chip Microcomputer A 4，Resistance R2，Crystal oscillator B，Electrochemical capacitor C9，Relay K 2、K3，Silicon rectifier diode VD11、VD12 and mobile phone A 5 form warning circuit，Silicon rectifier diode has two，Mobile phone A 5 is to have the button mobile phone of signal-key dialing function，Reset terminal the 1st foot of Chip Microcomputer A 4 and resistance R2 one end、Electrochemical capacitor C9 negative pole is connected by wire，External crystal oscillator end the 4th foot of Chip Microcomputer A 4 and crystal oscillator B one end are connected by wire，External crystal oscillator end the 5th foot of Chip Microcomputer A 4 and the crystal oscillator B other end are connected by wire，Negative power supply input the 10th foot and the resistance R2 other end of Chip Microcomputer A 4 pass through wired earth，Cathode power supply input the 20th foot and the electrochemical capacitor C9 positive pole of Chip Microcomputer A 4 are connected by wire，First low level output end 19 foot and first relay K 2 negative power supply input of Chip Microcomputer A 4 are connected by wire，Second low level output end 18 foot and second relay K 3 negative power supply input of Chip Microcomputer A 4 are connected by wire，Two normally opened contact ends of first relay K 2 are connected by wire with two power contacts under numeral keys 2 key in mobile phone A 5 respectively，Two normally opened contact ends of second relay K 3 are connected by wire with two power contacts under switch switch KG key on mobile phone respectively，Mobile phone A 5 negative power supply input passes through wired earth，Mobile phone A 5 cathode power supply input and first silicon rectifier diode VD11 negative pole are connected by wire，First silicon rectifier diode VD11 positive pole and second silicon rectifier diode VD12 negative pole are connected by wire.Chip Microcomputer A 4 model of warning circuit is AT89C2051/24PI.Mu balanced circuit power input mains transformer T armature winding two ends and 220V alternating current power supply are connected by wire；Mu balanced circuit cathode power supply outfan three end fixes 3 feet of output voltage stabilizer A1 and 4 feet of humicap testing circuit cathode power supply input time-base integrated circuit A3 and 8 feet, the other end of semiconductor chilling plate testing circuit cathode power supply input temperature switch RT, warning circuit the first cathode power supply input silicon rectifier diode VD12 positive pole are connected by wire；The signal of humicap testing circuit inputs the two ends resistance R1 other end, wet element humicap C4 two ends are connected the ceramic disc capacitor C8 other end by wire with the sense of semiconductor dehumidifier respectively；Humicap another normally-closed contact end of testing circuit cathode power supply outfan relay K 1, semiconductor chilling plate another normally opened contact end of testing circuit cathode power supply outfan relay K 4, another normally-closed contact end of cathode power supply outfan relay K 5 of fan testing circuit and 20 feet of warning circuit the second cathode power supply input Chip Microcomputer A 4 are connected by wire, mu balanced circuit negative power supply outfan three end is fixed 3 feet of output voltage stabilizer A1 and is become 1 foot of circuit A3 with base during humicap testing circuit negative power supply input, semiconductor chilling plate testing circuit negative power supply input relay K 4 negative power supply input, the negative pole of fan testing circuit negative power supply input electrochemical capacitor C12, 10 feet of warning circuit negative power supply input Chip Microcomputer A 4 pass through wired earth.
Fig. 3, in mu balanced circuit: after 220V alternating current power supply inputs, 220V alternating current power supply drops to 12V alternating current power supply in the effect of mains transformer T, is converted to DC source through silicon rectifier diode VD1, VD2, VD3, VD4 rectification, electrochemical capacitor C1 filtering；Through the filtered DC source of electrochemical capacitor C1, enter after three ends fix output voltage stabilizer A1 and peripheral cell ceramic disc capacitor C2, C3, the 3rd foot fixing output voltage stabilizer A1 from three ends exports stable 5V DC source, the effect of ceramic disc capacitor C2 is the ripple characteristics improving power supply, the effect of ceramic disc capacitor C3 is the transient response improving load, 5V DC source enters subsequent conditioning circuit, and then, follow-up humicap testing circuit, semiconductor chilling plate testing circuit and warning circuit obtain electric；During 5V DC supply input warning circuit, due to, silicon rectifier diode VD11, VD12 every of warning circuit have the voltage drop of about 0.7V, mobile phone A 5 running voltage of warning circuit is 3.7V, so, through silicon rectifier diode VD11, VD12 voltage drop effect, just reach the running voltage of mobile phone A 5, user hands pushes for emergency the switch switch KG in circuit mobile phone A 5, makes warning circuit mobile phone A 5 start be in holding state.nullIn humicap testing circuit and warning circuit: humicap testing circuit obtain electric after，By adjustable resistance RP、Resistance R1、Time-base integrated circuit A3、The self-excited multivibrator feeling wet element humicap C4 composition in ceramic disc capacitor C8 and semiconductor dehumidifier obtains electric work，When wet element humicap C4 of the sense in semiconductor dehumidifier is not damaged，Multivibrator normally works，3 foot output continuous print square waves of time-base integrated circuit A3 foot，This square wave couples through ceramic disc capacitor C5、High level signal is converted to after germanium detector diode VD5 rectification and ceramic disc capacitor C7 filtering，And enter NPN audion VT1 base stage，Through NPN audion VT1 power amplification、Paraphase，Enter relay K 1 negative power supply input，Then，Relay K 1 obtains two normally-closed contact end of electric adhesive and disconnects，Subsequent alarms circuit will not obtain electric work；When wet element humicap C4 of the sense in semiconductor dehumidifier breaks down (such as open circuit), by adjustable resistance RP, resistance R1, time-base integrated circuit A3, the self-excited multivibrator feeling wet element humicap C4 composition in ceramic disc capacitor C8 and semiconductor dehumidifier, owing to wet element humicap C4 of the sense in semiconductor dehumidifier damages no longer oscillatory work, then, relay K 1 dead electricity disconnects two normally-closed contact end Guan Bi, due to, warning circuit cathode power supply input and another normally-closed contact end of relay K 1 are connected by wire, so now, warning circuit can obtain electric work；nullAfter warning circuit obtains electric work，Chip Microcomputer A 4 is at its peripheral cell crystal oscillator B、Resistance R2 and electrochemical capacitor C9 acts on down jointly，Chip Microcomputer A 4 can be from its 19th foot 2 seconds low levels of output to relay K 2 negative power supply input，Then，Relay K 2 obtains two normally opened contact end of electric adhesive Guan Bi，Due to，Under two normally opened contact ends of relay K 2 and numeral keys 2 key of mobile phone A 5, two power contacts are connected by wire，So，In relay K 2 obtains 2 seconds of two normally opened contact end of electric adhesive Guan Bi，The telephone number that user is stored in mobile phone A 5 numeral keys 2 can be dialed away，Notice user semiconductor dehumidifier goes wrong，19 foot 2 seconds low levels of output of Chip Microcomputer A 4，After being spaced 30 seconds，18 foot 2 seconds low levels of output of Chip Microcomputer A 4 are to relay K 3 negative power supply input，Then，Relay K 3 obtains two normally opened contact end of electric adhesive Guan Bi，Due to，Under switch switch KG key on two normally opened contact ends of relay K 3 and mobile phone A 5, two power contacts are connected by wire，So，After relay K 3 obtains two normally opened contact end of electric adhesive Guan Bi，Mobile phone A 5 can stop dialing，18 foot 2 seconds low levels of output of Chip Microcomputer A 4，After being spaced 2 seconds，19 feet of Chip Microcomputer A 4 export again 2 seconds low levels，After 19 foot 2 seconds low levels of output of Chip Microcomputer A 4，After being spaced 30 seconds，18 feet of Chip Microcomputer A 4 export again 2 seconds low levels，Constantly circulate with this，Mobile phone A 5 will constantly circulate dials user phone，Until user reaches on-the-spot by power-off.In semiconductor chilling plate testing circuit and warning circuit: semiconductor chilling plate testing circuit obtain electric after, cause its heating one end temperature rise too high when the semiconductor chilling plate RT of semiconductor dehumidifier goes wrong, when causing semiconductor dehumidifier cisco unity malfunction, temperature switch RT internal water silvering solution face can raise, two contacts within temperature switch RT can be connected by hydrargyrum, followed by relay K 4 obtains two normally opened contact end of electric adhesive Guan Bi, due to, warning circuit cathode power supply input and another normally opened contact end of relay K 4 are connected by wire, so, now, warning circuit can obtain electric work and dial user phone.nullIn fan testing circuit and warning circuit: when control circuit A2 in semiconductor dehumidifier exports the fan electromotor M operating that 220V alternating current power supply makes semiconductor dehumidifier，The 220V alternating current power supply of the control circuit A2 output in semiconductor dehumidifier also can input to fan testing circuit，Then，Fan testing circuit obtains electric work，220V alternating current power supply is through decompression capacitor C10 blood pressure lowering，It is added to the Zener diode VZ1 of two differential concatenations、On VZ2，When power supply is positive half cycle，Zener diode VZ1 obtains the DC pulse moving voltage of about 5V，This voltage is respectively through silicon rectifier diode VD7、VD8 is to electrochemical capacitor C11、C12 charges，When power supply is negative half period，Zener diode VZ2 obtains the DC pulse moving voltage of about 5V，This voltage is the most respectively through silicon rectifier diode VD9、VD10 is to electrochemical capacitor C11、C12 charges，Through above effect，From electrochemical capacitor C11、The DC source of about 5V will be exported at C12；When fan electromotor M rotating shaft normal rotation, the Magnet mechanism upper and lower Magnet CT magnetic action power being arranged in fan electromotor rotating shaft acts on tongue tube GH, then, internal two contactings of tongue tube GH, relay K 5 obtains two normally-closed contact end of electric adhesive and disconnects, and warning circuit will not obtain electric；When the fan electromotor M of the semiconductor dehumidifier rotating shaft that goes wrong can not operate, when the magnetic action power of upper and lower Magnet CT no longer acts on tongue tube GH, tongue tube GH inner contact can disconnect, followed by, relay K 5 dead electricity disconnects two normally-closed contact end Guan Bi, due to, warning circuit cathode power supply input and another normally-closed contact end of relay K 5 are connected by wire, so, now, warning circuit can obtain electric work and dial user phone.More than by, this New Energy is when semiconductor dehumidifier breaks down, user is notified by mobile phone A 5 dial-up remote of warning circuit, so that owner takes counter-measure, prevent by the equipment of semiconductor dehumidifier cool-down dehumidification, due to semiconductor dehumidifier cisco unity malfunction, thus cause by heat dissipation equipment because temperature rise is too high, humidity is excessive and causes damage.
At Fig. 3, in mu balanced circuit: T-shaped number of mains transformer is 220V/12V/3W, silicon rectifier diode VD1, VD2, VD3, VD4 model is 1N4001, and electrochemical capacitor C1 specification is 470UF/25V, ceramic disc capacitor C2 specification is 0.33UF, and ceramic disc capacitor C3 specification is 0.1UF.In humicap testing circuit: resistance R1 resistance is 100K, adjustable resistance RP specification is 5K, germanium detector diode VD5, VD6 model is 2AP9, ceramic disc capacitor C5 specification is 0.01UF, ceramic disc capacitor C6 specification is 5.6PF, and ceramic disc capacitor C7 specification is 0.1UF, and ceramic disc capacitor C8 specification is 0.01UF, relay K 1 model is JRC/21F/YG4100/DC5V, and NPN audion VT1 model is 9013.The temperature switch RT of semiconductor chilling plate testing circuit is electric-contact mercury temp meter, and model is WXG/11T；Relay K 4 model of semiconductor chilling plate testing circuit is JRC/21F/YG4100/DC5V.In the voltage regulation unit of fan testing circuit: decompression capacitor C10 specification is 2UF/400V, resistance R3 resistance 51 Ω, power are 1W, Zener diode VZ1, VZ2 are 5V Zener diodes, commutation diode VD7, VD8, VD9, VD10 model is 1N4001, electrochemical capacitor C11, C12 specification is 470UF/25V, and relay K 5 model is JRC/21F/YG4100/DC5V；The tongue tube GH of fan testing circuit is glass shell normally opened contact type tongue tube.In warning circuit: resistance R2 resistance is 1K, crystal oscillator B specification is 11.0597MHZ, and electrochemical capacitor C9 model is 100UF/25V, and relay K 2, K3 model are JRC/21F/YG4100/DC5V, and silicon rectifier diode VD11, VD12 model is 1N4001.
Claims (9)
- null1. semiconductor dehumidifier long-distance monitorng device，It is characterized in that by mu balanced circuit、Humicap testing circuit、Semiconductor chilling plate testing circuit、Fan testing circuit and warning circuit are constituted，Semiconductor chilling plate testing circuit is made up of temperature switch and relay，Fan testing circuit is by voltage regulation unit and tongue tube、Magnet mechanism forms，Mu balanced circuit、Humicap testing circuit、The relay of semiconductor chilling plate testing circuit、Voltage regulation unit and the warning circuit of fan testing circuit are arranged in subassembly wrapper，The temperature switch of semiconductor chilling plate testing circuit is arranged on the heating end bottom of the semiconductor chilling plate of semiconductor dehumidifier，The Magnet mechanism of fan testing circuit is arranged on the fan shaft rear end of semiconductor dehumidifier，The tongue tube of fan testing circuit is arranged in plastic casing，And plastic casing is arranged on inside the fan motor case of semiconductor dehumidifier，Mu balanced circuit power input and 220V alternating current power supply are connected by wire，Mu balanced circuit cathode power supply outfan and humicap testing circuit cathode power supply input、Semiconductor chilling plate testing circuit cathode power supply input、Warning circuit the first cathode power supply input is connected by wire，Wet element humicap two ends are connected by wire with the sense of semiconductor dehumidifier respectively at the signal input two ends of humicap testing circuit，Humicap testing circuit cathode power supply outfan、Semiconductor chilling plate testing circuit cathode power supply outfan、Fan testing circuit cathode power supply outfan and warning circuit the second cathode power supply input are connected by wire，Mu balanced circuit negative power supply outfan and humicap testing circuit negative power supply input、Semiconductor chilling plate testing circuit negative power supply input、Fan testing circuit negative power supply input、Warning circuit negative power supply input passes through wired earth.
- nullSemiconductor dehumidifier long-distance monitorng device the most according to claim 1，It is characterized in that mu balanced circuit is by mains transformer、Silicon rectifier diode、Electrochemical capacitor、Three ends fix output voltage stabilizer and ceramic disc capacitor composition，Silicon rectifier diode has four，Ceramic disc capacitor has two，It is 7805 that three ends fix output voltage stabilizer model，Mains transformer secondary windings wherein one end and first silicon rectifier diode negative pole、Second silicon rectifier diode positive pole is connected by wire，The mains transformer secondary windings other end and the 3rd silicon rectifier diode negative pole、4th silicon rectifier diode positive pole is connected by wire，Second silicon rectifier diode negative pole and the 4th silicon rectifier diode negative pole、Electrochemical capacitor positive pole、First ceramic disc capacitor one end、Three ends are fixed cathode power supply input 1 foot of output voltage stabilizer and are connected by wire，First silicon rectifier diode positive pole and the 3rd silicon rectifier diode positive pole、Electrochemical capacitor negative pole、First ceramic disc capacitor other end、Three ends fix negative power supply input 2 foot of output voltage stabilizer、Wired earth is passed through in second ceramic disc capacitor one end，Three ends fix cathode power supply outfan 3 foot of output voltage stabilizer and second ceramic disc capacitor other end is connected by wire.
- nullSemiconductor dehumidifier long-distance monitorng device the most according to claim 1，It is characterized in that humicap testing circuit is by resistance、Adjustable resistance、Germanium detector diode、Ceramic disc capacitor、Time-base integrated circuit、Relay and NPN audion composition，Germanium detector diode has two，Ceramic disc capacitor has four，Reset terminal 4 foot of adjustable resistance one end and time-base integrated circuit and cathode power supply input 8 foot、Relay cathode power supply input、Relay one normally-closed contact end is connected by wire，Discharge end 7 foot of the adjustable resistance other end and time-base integrated circuit、Resistance one end is connected by wire，Triggering end 2 foot of time-base integrated circuit is connected by wire with threshold values end 6 foot and the resistance other end，Outfan 3 foot of time-base integrated circuit and first ceramic disc capacitor one end、Second ceramic disc capacitor one end is connected by wire，First ceramic disc capacitor other end and first germanium detector diode positive pole、Second germanium detector diode negative pole is connected by wire，First germanium detector diode negative pole and the 3rd ceramic disc capacitor one end、NPN transistor base is connected by wire，NPN transistor collector and relay negative power supply input are connected by wire，Control end 5 foot of time-base integrated circuit and the 4th ceramic disc capacitor one end are connected by wire，Negative power supply input 1 foot of time-base integrated circuit and the 4th the ceramic disc capacitor other end、Second ceramic disc capacitor other end、Second germanium detector diode negative pole、3rd the ceramic disc capacitor other end、NPN transistor emitter passes through wired earth.
- Semiconductor dehumidifier long-distance monitorng device the most according to claim 3, it is characterised in that the time-base integrated circuit model of humicap testing circuit is NE555.
- Semiconductor dehumidifier long-distance monitorng device the most according to claim 1, the temperature switch that it is characterized in that semiconductor chilling plate testing circuit is electric-contact mercury temp meter, and the relay cathode power supply input of temperature switch one end and semiconductor chilling plate testing circuit, relay one normally opened contact end are connected by wire.
- nullSemiconductor dehumidifier long-distance monitorng device the most according to claim 1，It is characterized in that the voltage regulation unit of fan testing circuit is by decompression capacitor、Resistance、Zener diode、Commutation diode、Electrochemical capacitor and relay composition，Zener diode has two，Commutation diode has four，Electrochemical capacitor has two，Decompression capacitor one end and first Zener diode negative pole、First silicon rectifier diode positive pole、Second silicon rectifier diode positive pole is connected by wire，Resistance one end and second Zener diode negative pole、3rd silicon rectifier diode positive pole、4th silicon rectifier diode positive pole is connected by wire，First Zener diode positive pole and second Zener diode positive pole、First electrochemical capacitor negative pole、Second electrochemical capacitor negative pole、Relay negative power supply input passes through wired earth，First silicon rectifier diode negative pole and the 3rd silicon rectifier diode negative pole、First electrochemical capacitor positive pole、Second silicon rectifier diode negative pole、4th silicon rectifier diode negative pole、Second electrochemical capacitor positive pole、Tongue tube one end of fan testing circuit is connected by wire，The tongue tube other end of fan testing circuit and relay cathode power supply input、Relay one normally-closed contact end is connected by wire.
- nullSemiconductor dehumidifier long-distance monitorng device the most according to claim 1，It is characterized in that the Magnet mechanism of fan testing circuit is by base plate、Chute、Upper Magnet、Lower magnet and return spring composition，There is a perforate at the center of base plate，Chute has four，Four chutes are arranged on base plate，Upper Magnet、Medial extremity the right and left of lower magnet is respectively arranged with a slide bar，Upper Magnet、The slide bar of lower magnet is respectively fitted in four chutes，Return spring has two，Wherein one end of a return spring is arranged on base plate upper end，The other end is arranged on Magnet medial extremity，One end of another return spring is arranged on base plate lower end，The other end is arranged on lower magnet medial extremity，Magnet mechanism is arranged on the fan shaft rear end of semiconductor dehumidifier by base plate center drilling，Magnet mechanism is arranged on the fan shaft rear end of semiconductor dehumidifier，The tongue tube of fan testing circuit is arranged in plastic casing，After plastic casing is arranged on the fan motor case inside of semiconductor dehumidifier，When the fan shaft of semiconductor dehumidifier rotates，Under centrifugal action，Upper Magnet、Lower magnet can be displaced outwardly along chute，Upper Magnet、The magnetic action power of lower magnet can make tongue tube internal actions contact connect with stationary contact.
- nullSemiconductor dehumidifier long-distance monitorng device the most according to claim 1，It is characterized in that warning circuit is by single-chip microcomputer、Resistance、Crystal oscillator、Electrochemical capacitor、Relay、Silicon rectifier diode and mobile phone composition，Silicon rectifier diode has two，Mobile phone is the button mobile phone with signal-key dialing function，Reset terminal the 1st foot of single-chip microcomputer and resistance one end、Electrochemical capacitor negative pole is connected by wire，External crystal oscillator end the 4th foot of single-chip microcomputer and crystal oscillator one end are connected by wire，External crystal oscillator end the 5th foot of single-chip microcomputer and the crystal oscillator other end are connected by wire，Negative power supply input the 10th foot of single-chip microcomputer and the resistance other end pass through wired earth，Cathode power supply input the 20th foot of single-chip microcomputer and electrochemical capacitor positive pole are connected by wire，First low level output end 19 foot and first relay negative power supply input of single-chip microcomputer are connected by wire，Second low level output end 18 foot and second relay negative power supply input of single-chip microcomputer are connected by wire，Two normally opened contact ends of first relay are connected by wire with two power contacts under numeral keys on mobile phone 2 key respectively，Two normally opened contact ends of second relay are connected by wire with two power contacts under switch switch key on mobile phone respectively，Mobile phone negative power supply input passes through wired earth，Mobile phone cathode power supply input and first silicon rectifier diode negative pole are connected by wire，First silicon rectifier diode positive pole and second silicon rectifier diode negative pole are connected by wire.
- Semiconductor dehumidifier long-distance monitorng device the most according to claim 8, it is characterised in that the single-chip microcomputer model of warning circuit is AT89C2051/24PI.
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| CN201620144317.7U CN205450810U (en) | 2016-02-26 | 2016-02-26 | Semiconductor dehumidifier remote monitoring device |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106200510A (en) * | 2016-09-19 | 2016-12-07 | 淮阴工学院 | The device of remote controlled student computer use at home |
| CN109444605A (en) * | 2018-12-14 | 2019-03-08 | 厦门市百岗电气有限公司 | A kind of the on-line monitoring circuit and monitoring method of semiconductor chilling plate |
-
2016
- 2016-02-26 CN CN201620144317.7U patent/CN205450810U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106200510A (en) * | 2016-09-19 | 2016-12-07 | 淮阴工学院 | The device of remote controlled student computer use at home |
| CN109444605A (en) * | 2018-12-14 | 2019-03-08 | 厦门市百岗电气有限公司 | A kind of the on-line monitoring circuit and monitoring method of semiconductor chilling plate |
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