CN205323792U - High temperature test case - Google Patents

High temperature test case Download PDF

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Publication number
CN205323792U
CN205323792U CN201620093296.0U CN201620093296U CN205323792U CN 205323792 U CN205323792 U CN 205323792U CN 201620093296 U CN201620093296 U CN 201620093296U CN 205323792 U CN205323792 U CN 205323792U
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CN
China
Prior art keywords
test
high temperature
tray
movable tray
casing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201620093296.0U
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Chinese (zh)
Inventor
徐亮一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Inspur Electronic Information Industry Co Ltd
Original Assignee
Inspur Electronic Information Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Inspur Electronic Information Industry Co Ltd filed Critical Inspur Electronic Information Industry Co Ltd
Priority to CN201620093296.0U priority Critical patent/CN205323792U/en
Application granted granted Critical
Publication of CN205323792U publication Critical patent/CN205323792U/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Abstract

The utility model provides a high temperature test case belongs to computer hardware high temperature test equipment field. Its structure is including test box and test gate, the test box is internal be equipped with the heater, and with heater ferroelectric phase temperature controller even, the internal circulating fan that is equipped with of test box, test box middle part is equipped with movable tray and will tests the box and be divided into two upper and lower cavitys as test platform, activity tray, offers the trompil that feeds through two upper and lower cavitys on the movable tray. The utility model discloses a circulating fan starts the back, utilizes the rotation of flabellum, and the trompil of seting up on the cooperation activity tray makes the air of the internal portion of test box produce compulsory convection for each some temperature of the internal portion of test box equals, simultaneously, because the activity offers on the tray to be used for placing awaits measuring electrical assembly's indent and lead to the groove, the electrical assembly's that awaits measuring upper and lower surface just so makes the temperature simulated value more accurate under all being in same test temperature to it is more accurate to make the aging testing experimental result.

Description

A kind of high temperature test chamber
Technical field
This utility model relates to computer hardware high temperature test apparatus field, specifically a kind of high temperature test chamber。
Background technology
Electrical equipment in use can produce heat, thus forming hot environment, electrical equipment runs the as easy as rolling off a log potential problem exposing electric appliance component existence in hot environment, badly influences the operation of a machine。Obtaining stability at present under test electrical equipment high-temperature condition is by carrying out the aging of complete machine after being assembled by machine, keeping in repair again, can cause the wasting of resources on time, human and material resources after mistake occurs in machine。Another in carrying out the repetition measurement after material changes, maintenance work, it is impossible to the reproduction material phenomenon that reports an error in machine running status and high temperature ageing environment。
Summary of the invention
Technical assignment of the present utility model is to solve the deficiencies in the prior art, a kind of high temperature test chamber is provided, mainly for the hidden danger that test electric appliance component is easily made mistakes in severe hot environment, can find and solve the potential problem that material exists before producing, and material cannot the defect of simulated production ageing environment in repetition measurement, maintenance link。
Mentality of designing of the present utility model is that material is before producing, and repetition measurement after reporting an error, maintenance link utilize high temperature test chamber to simulate the electric appliance component to be measured state when complete machine runs and high temperature ageing environment, find or reappear the hidden danger that material exists in advance, and solve this type of hidden danger in time。
This utility model solves its technical problem and be the technical scheme is that
A kind of high temperature test chamber, including test casing and test gate, test gate is movably connected in the front side of test casing, heater and the temperature controller being electrically connected with heater it is provided with in described test box body, it is provided with circulating fan in test box body, for forming forced convertion, it is provided with movable tray as test platform in the middle part of test casing, test casing is divided into upper and lower two cavitys by movable tray, movable tray is offered the perforate connecting upper and lower two cavitys, movable tray is offered the indent groove for placing electric appliance component to be measured。
Preferably, described test casing is reserved with cable hole near the Yi Jiaochu of temperature controller position。
Preferably, described movable tray is provided with tray handle towards the side of test gate。
Preferably, described test gate is provided with doors body handle。
Preferably, described test gate is provided with door seal towards the side of test casing。
A kind of high temperature test chamber of the present utility model, provides the benefit that produced by compared with prior art:
1, this utility model movable tray is as test platform, slides and is located at the middle part of test casing, it is simple to building of electric appliance component to be measured;It is provided with circulating fan in test box body, after circulating fan starts, utilizes the rotation of flabellum, coordinate the perforate offered on movable tray, make the air of test box house produce forced convertion so that test box house every bit temperature is equal;Simultaneously as offer the indent groove for placing electric appliance component to be measured on movable tray, the upper and lower surface of electric appliance component to be measured is all at same test temperature, thus makes temperature simulation value more accurate, so that burn-in test experimental result is more accurate;
2, test casing is reserved with cable hole near the Yi Jiaochu of temperature controller position, in order to placing various cable, it is to avoid in test box body, cabling is in disorder;
3, test gate is provided with door seal towards the side of test casing, has been effectively ensured and extraneous isolation, it is to avoid test box house and extraneous heat exchange, reduces the energy consumption of heater, energy-conserving and environment-protective。
Accompanying drawing explanation
Accompanying drawing 1 is structural representation of the present utility model;
Accompanying drawing 2 is vertical profile structural representation of the present utility model。
In figure, 1, doors body handle, 2, test gate, 3, door seal, 4, circulating fan, 5, test casing, 6, heater, 7, temperature controller, 8, guide rail, 9, movable tray, 10, tray handle, 11, indent groove, 12, perforate, 13, upper plenum, 14, lower cavity。
Detailed description of the invention
Below in conjunction with accompanying drawing 1-2, a kind of high temperature test chamber of the present utility model is described in detail below。
As shown in accompanying drawing 1,2, a kind of high temperature test chamber of the present utility model, its structure includes test casing 5 and test gate 2, and test gate 2 is hinged on the front side of test casing 5 by rotating shaft, test gate 2 is provided with doors body handle 1, and test gate 2 is provided with door seal 3 towards the side of test casing 5。
Test casing 5 inner roof wall is fixed with heater 6, test casing 5 medial wall is provided with the temperature controller 7 being electrically connected with heater 6, is provided with circulating fan 4 in test casing 5, is used for forming forced convertion。The middle part of the test left and right sidewall of casing 5 is each provided with guide rail 8, movable tray 9 slides as test platform and is located on arranged on left and right sides guide rail 8, test casing 5 is divided into upper and lower two cavitys 13,14 by movable tray 9, movable tray 9 is offered the perforate 12 connecting upper and lower two cavitys 13,14, movable tray 9 is offered the indent groove 11 for placing electric appliance component to be measured。
On the basis of said structure, in order to avoid the confusion of cabling in test casing 5, it is reserved with cable hole at test casing 5 near the Yi Jiaochu of temperature controller 7 position, in order to place various cable。For the ease of the pull of movable tray 9, at the movable tray 9 fixing connecting trays handle 10 in side towards test gate 2。
A kind of high temperature test chamber of the present utility model, it tests casing 5 five face closure, and one side is opened the door, the top of test casing 5 is provided with heater 6, carry out High Temperature Simulation for treating electricity measurer assembly, in test casing 5, a Telescopic movable pallet 9 is installed, as high temperature test platform。During use, heater 6 is connected on temperature controller 7, then temperature controller 7 is switched to external power source, by electric appliance component to be measured being placed in indent groove 11, after having built movable tray 9, movable tray 9 is pushed in test casing 5, close test gate 2, open temperature controller 7, regulated to predetermined temperature by control panel, set warm-up time, make temperature in test casing 5 raise, the test platform carried on movable tray 9 runs the scheduled time in high temperature, thus playing aging action。It is located at the middle part of test casing 5 owing to movable tray 9 slides, it is provided with circulating fan 4 in test casing 5, after circulating fan 7 starts, utilize the rotation of flabellum, coordinate the perforate 12 offered on movable tray 9, the air within test casing 5 is made to produce forced convertion, make the internal every bit temperature of test casing 5 equal, simultaneously, owing to movable tray 9 being offered the indent groove 11 for placing electric appliance component to be measured, the upper and lower surface of electric appliance component to be measured is all at same test temperature, thus makes burn-in test experimental result more accurate。
A kind of high temperature test chamber of the present utility model, its processing and fabricating is simple and convenient, processing and fabricating shown in by specification accompanying drawing。
Except the technical characteristic described in description, it is the known technology of those skilled in the art。

Claims (5)

1. a high temperature test chamber, including test casing and test gate, test gate is movably connected in the front side of test casing, it is characterized in that, heater and the temperature controller being electrically connected with heater it is provided with in described test box body, it is provided with circulating fan in test box body, for forming forced convertion, it is provided with movable tray as test platform in the middle part of test casing, test casing is divided into upper and lower two cavitys by movable tray, movable tray is offered the perforate connecting upper and lower two cavitys, movable tray is offered the indent groove for placing electric appliance component to be measured。
2. a kind of high temperature test chamber according to claim 1, it is characterised in that described test casing is reserved with cable hole near the Yi Jiaochu of temperature controller position。
3. a kind of high temperature test chamber according to claim 1 and 2, it is characterised in that described movable tray is provided with tray handle towards the side of test gate。
4. a kind of high temperature test chamber according to claim 1 and 2, it is characterised in that described test gate is provided with doors body handle。
5. a kind of high temperature test chamber according to claim 1 and 2, it is characterised in that described test gate is provided with door seal towards the side of test casing。
CN201620093296.0U 2016-01-30 2016-01-30 High temperature test case Expired - Fee Related CN205323792U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201620093296.0U CN205323792U (en) 2016-01-30 2016-01-30 High temperature test case

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201620093296.0U CN205323792U (en) 2016-01-30 2016-01-30 High temperature test case

Publications (1)

Publication Number Publication Date
CN205323792U true CN205323792U (en) 2016-06-22

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN201620093296.0U Expired - Fee Related CN205323792U (en) 2016-01-30 2016-01-30 High temperature test case

Country Status (1)

Country Link
CN (1) CN205323792U (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106707138A (en) * 2016-12-29 2017-05-24 广东长虹电子有限公司 Test device applied to circuit board test
TWI650661B (en) * 2016-12-06 2019-02-11 仁寶電腦工業股份有限公司 Thermal simulation system
CN113281227A (en) * 2021-07-07 2021-08-20 淮南联合大学 Fiber array dynamic imbibition tester convenient to operate and use
CN113499809A (en) * 2021-08-11 2021-10-15 广州克莱美特科技股份有限公司 Liftable portable high temperature test case
CN116338358A (en) * 2023-03-29 2023-06-27 无锡美科微电子技术有限公司 High-low temperature aging test method and equipment for display module

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI650661B (en) * 2016-12-06 2019-02-11 仁寶電腦工業股份有限公司 Thermal simulation system
CN106707138A (en) * 2016-12-29 2017-05-24 广东长虹电子有限公司 Test device applied to circuit board test
CN113281227A (en) * 2021-07-07 2021-08-20 淮南联合大学 Fiber array dynamic imbibition tester convenient to operate and use
CN113281227B (en) * 2021-07-07 2023-09-15 淮南联合大学 Optical fiber array dynamic imbibition tester convenient to operate and use
CN113499809A (en) * 2021-08-11 2021-10-15 广州克莱美特科技股份有限公司 Liftable portable high temperature test case
CN116338358A (en) * 2023-03-29 2023-06-27 无锡美科微电子技术有限公司 High-low temperature aging test method and equipment for display module
CN116338358B (en) * 2023-03-29 2024-06-04 无锡美科微电子技术有限公司 High-low temperature aging test method and equipment for display module

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Date Code Title Description
C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20160622

Termination date: 20170130