CN106707138A - Test device applied to circuit board test - Google Patents

Test device applied to circuit board test Download PDF

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Publication number
CN106707138A
CN106707138A CN201611240231.5A CN201611240231A CN106707138A CN 106707138 A CN106707138 A CN 106707138A CN 201611240231 A CN201611240231 A CN 201611240231A CN 106707138 A CN106707138 A CN 106707138A
Authority
CN
China
Prior art keywords
circuit board
housing
temperature
test device
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201611240231.5A
Other languages
Chinese (zh)
Inventor
蒋吉强
叶博
刘应兵
罗蔺
梁平茂
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Guangdong Changhong Electronics Co Ltd
Original Assignee
Guangdong Changhong Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Guangdong Changhong Electronics Co Ltd filed Critical Guangdong Changhong Electronics Co Ltd
Priority to CN201611240231.5A priority Critical patent/CN106707138A/en
Publication of CN106707138A publication Critical patent/CN106707138A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2817Environmental-, stress-, or burn-in tests
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806Apparatus therefor, e.g. test stations, drivers, analysers, conveyors

Abstract

The invention relates to the field of electronic product development, and especially relates to a test device applied to circuit board test. The test device comprises a shell, a power supply communication window, a detection platform, a heating device, a thermal circulation fan, a liquid crystal display, and a temperature sensor. The shell is equipped with a movable door for placing a circuit board into the shell. A power supply communication line arranged on the circuit board extends out of the shell via the power supply communication window and is then connected with monitoring equipment. The detection platform is used for placing a circuit board to be tested. The heating device is used for heating the environment where the circuit board is located. The thermal circulation fan is used for accelerating the flow of air inside the shell to ensure that the temperature of the environment where the circuit board is located is constant. The liquid crystal display is used for displaying the environment temperature inside the shell. The temperature sensor is used for acquiring the environment temperature and displaying the environment temperature through the liquid crystal display. The test device provided by the invention can control and monitor the environment temperature inside the closed shell continuously or stepwise. Thus, problems of the circuit board card can be exposed ahead of time, and development is saved.

Description

It is applied to the test device of circuit board testing
Technical field:
The present invention relates to electronic product development field, more particularly to a kind of test device for being applied to circuit board testing.
Background technology:
Printed circuit board (PCB) (Printed Circuit Board, PCB) is quite extensive in all trades and professions application, and it is electronics The supporter of component, plays key effect in various electric equipments.In the development process of electronic product, electronic device High temperature reliability be an important ring of product reliability, and simulate high temperature test and generally require many test equipments and spend big The amount time, while needing a large amount of human resources so that testing cost increases, and the high temperature test of circuit board is sentenced with artificial sense organ in addition The situation of disconnected result is in the majority, easily erroneous judgement occurs and influences test quality.
The content of the invention:
In view of above-mentioned the deficiencies in the prior art, a kind of test device for being applied to circuit board testing of present invention offer, it is intended to Improve efficiency and improvement test quality of the circuit board when high temperature test is simulated.
The technical solution adopted for the present invention to solve the technical problems is:
The test device of circuit board testing is applied to, including:
One housing, which is provided with the movable switch door that power circuit board is placed to housing;
Powered communication window, it is opened on the movable switch door, and the powered communication line being arranged on the circuit board leads to Cross the powered communication window and stretch out the outer external monitoring device of the housing;
Detection platform, it is located in the housing for placing the circuit board to be detected;
Heater, it is located on the housing, for being heated to the environment temperature residing for the circuit board;
Thermal circulation fan, is built in the housing and is connected with the heater, for accelerating the sky in the housing Air-flow leads to, it is ensured that environment temperature residing for the circuit board it is constant;
LCDs, it is located at the housing one side, for showing the environment temperature in housing;
Temperature sensor, is built in the housing and is connected with the heater, for obtaining environment temperature and passing through The LCDs shows.
The heater is included being located at the temperature control knob of the housing side and is revolved by the temperature control Button selects the resistive heater of gear.
The detection platform include a support frame, support frame as described above include base plate, be arranged at it is on base plate and vertical with base plate Riser and the horizontal checkout plate that is arranged on the riser, be provided with the horizontal checkout plate for housing outside The wire and the deck for fixing circuit board of the monitoring device connection, the temperature sensor is located to be surveyed with the level On the support frame of test plate (panel) the same side.
The test device for being applied to circuit board testing also includes:
One timer, it is located on the housing positioned at the lower section of the LCDs, and the timer is by described LCDs is controlled, the heatproof testing time for setting the circuit board.
One alarm set, it is connected with the timer, and prompting letter is sent when the timer reaches the testing time Number.
The test device for being applied to circuit board testing also includes:
One memory, it is located on the housing positioned at the lower section of the LCDs, and the memory is by described LCDs is controlled, for recording simultaneously storage housing interior environment temperature.
One storage setting device, it is connected with the memory, and controls whether the memory starts in storage housing Portion's environment temperature.
The transparent sealing shell that the housing is made for exotic material.
Compared with prior art, the beneficial effects of the present invention are, the present invention provide test device, it can be to closed housing Internal environment temperature carries out continuous or steps temperature control and monitoring, so as to be carried out to the circuit-board card being placed in housing Continuous or steps hot intensifying impact experiment, exposes circuit-board card and there is problem in advance, saves the development time, improves Efficiency of the circuit board when high temperature test is simulated;Additionally, the test device that the present invention is provided is based on machinery equipment test, manually Supplemented by test, change and occur the situation of erroneous judgement based on manual testing before this, significantly improve the test matter of circuit board Amount.
Brief description of the drawings:
Technical scheme in order to illustrate more clearly the embodiments of the present invention, below will be to that will make needed for embodiment description Accompanying drawing is briefly described, it should be apparent that, drawings in the following description are only some embodiments of the present invention, for For those of ordinary skill in the art, on the premise of not paying creative work, other can also be obtained according to these accompanying drawings Accompanying drawing.
Fig. 1 is the structural representation of the test device for being applied to circuit board testing of the invention.
Specific embodiment:
In order that technical problem solved by the invention, technical scheme and beneficial effect become more apparent, below in conjunction with Drawings and Examples, the present invention will be described in further detail.
It should be appreciated that the specific embodiments described herein are merely illustrative of the present invention, it is not intended to limit the present invention.
Accompanying drawing 1 is refer to, the figure is the structure of the test device for being applied to circuit board testing provided in an embodiment of the present invention Schematic diagram, a kind of test device for being applied to circuit board testing, including housing 1, the powered communication window 5, liquid crystal on housing Display screen 2, the detection platform in housing, heater, thermal circulation fan and temperature sensor.Wherein:
Housing is provided with the movable switch door 4 that power circuit board is placed to housing.Specifically, the housing is high temperature resistant material The transparent closed shell that material is made, in the present embodiment, transparent containment housing is preferably high temp glass of the fusing point more than 1500 DEG C, With pressure-resistant exhausted thermal property, it is easy to circuit board testing.
Powered communication window 5, it is opened on the movable switch door 4, is arranged at the powered communication line on the circuit board The outer external monitoring device of the housing is stretched out by the powered communication window.Circuit board is influenceed to prevent the heat in housing to scatter and disappear Test, in the present embodiment, between movable switch door and housing and between the powered communication window and movable switch door Heat-insulated sealing ring is provided with, it is effectively heat-insulated, it is easy to test.
Detection platform, it is used to place the circuit board to be detected.In the present embodiment, the detection platform includes one Support, support frame as described above includes base plate, is arranged on base plate and the riser vertical with base plate and is arranged on the riser Horizontal checkout plate, is provided with the wire for being connected with the monitoring device outside housing and is used on the horizontal checkout plate The deck of fixing circuit board, the temperature sensor be located at the support frame of described horizontal checkout plate the same side on.
Heater, it is located on the housing, for being heated to the environment temperature residing for the circuit board.Specifically Ground, the heater is included being located at the temperature control knob 3 of the housing side and is selected by the temperature control knob Select the resistive heater of gear.
In the present embodiment, the resistive heater for selecting different gears by temperature control knob can be realized to shell vivo environment The change of temperature, constantly adjusts the temperature of adaptive circuit plate high temperature test.
Thermal circulation fan, when heater runs, accelerates the air circulation in the housing, it is ensured that the circuit board institute The environment temperature at place it is constant.
LCDs 2, for showing the environment temperature in housing 1.
Temperature sensor, it is connected with the heater, for obtaining environment temperature and passing through the LCDs Display.In the present embodiment, the temperature sensor is connected between the temperature control knob and resistive heater, by rotating Temperature control knob sends a temperature control signals to the temperature sensor, the environment temperature that temperature sensor will then be obtained with The corresponding design temperature of the temperature control signals is made comparisons, if the environment temperature for obtaining exceeds corresponding design temperature, institute State temperature sensor and then send the heating that a stopping heating signal stopping resistive heater to the resistive heater.Prevent housing Interior environment temperature is inconsistent with the test temperature of setting and influence the electronic component on circuit board, be prevented effectively from environment temperature It is too high and damage circuit board.Preferably, temperature sensor uses the sensor of model LM135, with fast response time, heatproof The advantages of, can also be replaced using the temperature sensor of other models in the specific implementation certainly, the present embodiment is not construed as limiting.
The present embodiment, by thermostable transparent sealing shell, heater, thermal circulation fan and temperature sensor and liquid crystal The simply assembling such as display screen coordinates the temperature control equipment that may make up under a set of closed system, can be to the ring in closed shell Border temperature carries out continuous or steps temperature control and monitoring, thus to the circuit-board card being placed in housing carry out it is continuous or Steps hot intensifying impact experiment, exposes circuit-board card and there is problem in advance, saves the development time, improves circuit board and exists Efficiency during simulation high temperature test.
Further, the test device for being applied to circuit board testing also includes:One timer, it is located at the housing The upper lower section positioned at the LCDs, and the timer is by LCDs control, for setting the circuit The heatproof testing time of plate;One alarm set, it is connected with the timer, and is sent out when the timer reaches the testing time Go out alerting signal.Equipment can voluntarily be run after setting run time, convenient and swift.Alarm set is conventional warning device, The operation of arrestment when the setting testing time is reached.
Further, the test device for being applied to circuit board testing also includes:One memory, it is located at the shell Positioned at the lower section of the LCDs on body, and the memory for recording and is stored by LCDs control Enclosure interior environment temperature;One storage setting device, it is connected with the memory, and controls whether the memory starts to deposit Storage enclosure interior environment temperature.In the present embodiment, the environment temperature of storage can be inquired about on LCDs, be easy to observe circuit Whether within the acceptable range temperature error of the plate in high temperature test.Storage setting device is set to be easy to store test on demand Required environment temperature, is conducive to the test of circuit board, at the same can also reduce test the information of unwanted environment temperature deposit Reserves, make equipment quickly run.
The course of work for being applied to circuit board testing of the embodiment of the present invention:
During test, it is positioned in closed shell by movable switch goalkeeper's circuit board under test, the powered communication on circuit board Line is stretched out by the powered communication window on movable switch door and connects monitoring and load equipment, by temperature control knob come Environment Temperature, while thermal circulation fan ensures the constant of environment temperature, the environment temperature that temperature sensor can be used to obtain in housing is simultaneously By the temperature in the real-time show case body of LCDs, design is simple, it is quick to install simple, convenient test.
It is as described above to combine one or more implementation method that particular content is provided, does not assert specific reality of the invention Apply and be confined to these explanations.It is all approximate with the method for the present invention, structure etc., identical, or for present inventive concept under the premise of Some technology deduction or replace are made, should all be considered as protection scope of the present invention.

Claims (8)

1. the test device of circuit board testing is applied to, it is characterised in that including:
One housing, which is provided with the movable switch door that power circuit board is placed to housing;
Powered communication window, it is opened on the movable switch door, and the powered communication line being arranged on the circuit board passes through institute State powered communication window and stretch out the outer external monitoring device of the housing;
Detection platform, it is located in the housing for placing the circuit board to be detected;
Heater, it is located on the housing, for being heated to the environment temperature residing for the circuit board;
Thermal circulation fan, is built in the housing and is connected with the heater, for accelerating the air stream in the housing It is logical, it is ensured that environment temperature residing for the circuit board it is constant;
LCDs, it is located at the housing one side, for showing the environment temperature in housing;
Temperature sensor, is built in the housing and is connected with the heater, for obtaining environment temperature and passing through described LCDs shows.
2. the test device for being applied to circuit board testing according to claim 1, it is characterised in that:The heater bag Include the resistive heater that gear is selected located at the temperature control knob of the housing side and by the temperature control knob.
3. the test device for being applied to circuit board testing according to claim 1, it is characterised in that:The detection platform bag Include a support frame, support frame as described above includes base plate, is arranged on base plate and the riser vertical with base plate and is arranged at described perpendicular Horizontal checkout plate on plate, be provided with the horizontal checkout plate for the wire being connected with the monitoring device outside housing with And for the deck of fixing circuit board, the temperature sensor be located at on the support frame of described horizontal checkout plate the same side.
4. the test device for being applied to circuit board testing according to claim 1, it is characterised in that:It is described to be applied to circuit The test device of board test also includes:
One timer, it is located on the housing positioned at the lower section of the LCDs, and the timer receives the liquid crystal Display screen is controlled, the heatproof testing time for setting the circuit board;
One alarm set, it is connected with the timer, and sends alerting signal when the timer reaches the testing time.
5. the test device for being applied to circuit board testing according to claim 1, it is characterised in that:It is described to be applied to circuit The test device of board test also includes:
One memory, it is located on the housing positioned at the lower section of the LCDs, and the memory receives the liquid crystal Display screen is controlled, for recording simultaneously storage housing interior environment temperature;
One storage setting device, it is connected with the memory, and controls whether the memory starts storage housing inner loop Border temperature.
6. the test device for being applied to circuit board testing according to claim 1, it is characterised in that:The housing is resistance to height The transparent sealing shell that adiabator is made.
7. the test device for being applied to circuit board testing according to claim 1, it is characterised in that:The movable switch door Heat-insulated sealing ring is equipped between housing and between the powered communication window and movable switch door.
8. the test device for being applied to circuit board testing according to claim 2, it is characterised in that:The temperature sensor It is connected between the temperature control knob and resistive heater, is sent out to the temperature sensor by rotating temperature control knob Go out a temperature control signals, the environment temperature design temperature corresponding with the temperature control signals that temperature sensor will then be obtained Make comparisons, if the environment temperature for obtaining exceeds corresponding design temperature, the temperature sensor then sends stopping heating letter Number to the resistive heater stop resistive heater heating.
CN201611240231.5A 2016-12-29 2016-12-29 Test device applied to circuit board test Pending CN106707138A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201611240231.5A CN106707138A (en) 2016-12-29 2016-12-29 Test device applied to circuit board test

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201611240231.5A CN106707138A (en) 2016-12-29 2016-12-29 Test device applied to circuit board test

Publications (1)

Publication Number Publication Date
CN106707138A true CN106707138A (en) 2017-05-24

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN201611240231.5A Pending CN106707138A (en) 2016-12-29 2016-12-29 Test device applied to circuit board test

Country Status (1)

Country Link
CN (1) CN106707138A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107884701A (en) * 2017-10-12 2018-04-06 中车青岛四方机车车辆股份有限公司 A kind of experimental provision and experimental method of circuit board tolerance overvoltage damage
CN107942226A (en) * 2017-11-13 2018-04-20 广东德众堂生物科技有限公司 A kind of wiring board aging test box
CN113791337A (en) * 2021-11-16 2021-12-14 江西卓驰商业运营管理有限公司 Data processing-based quality analysis monitoring system for circuit board

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CN205720546U (en) * 2016-04-27 2016-11-23 杭州华扬电子有限公司 A kind of baking box for thermal ageing test
CN205786997U (en) * 2016-06-23 2016-12-07 上海战旗电子有限公司 Test incubator
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JP2005175492A (en) * 2003-12-12 2005-06-30 Au Optronics Corp Method for measuring contact resistance of electronic equipment joined to liquid crystal display panel and liquid crystal display for measuring method
CN2775654Y (en) * 2005-01-28 2006-04-26 徐地华 Weldability detector
CN101852551A (en) * 2009-04-01 2010-10-06 辉达公司 Furnace for performing high-temperature test on electronic component
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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107884701A (en) * 2017-10-12 2018-04-06 中车青岛四方机车车辆股份有限公司 A kind of experimental provision and experimental method of circuit board tolerance overvoltage damage
CN107884701B (en) * 2017-10-12 2020-06-16 中车青岛四方机车车辆股份有限公司 Experimental device and experimental method for circuit board to withstand overvoltage damage
CN107942226A (en) * 2017-11-13 2018-04-20 广东德众堂生物科技有限公司 A kind of wiring board aging test box
CN113791337A (en) * 2021-11-16 2021-12-14 江西卓驰商业运营管理有限公司 Data processing-based quality analysis monitoring system for circuit board
CN113791337B (en) * 2021-11-16 2022-03-04 吉安县鑫盛电子有限公司 Data processing-based quality analysis monitoring system for circuit board

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Application publication date: 20170524