CN205301215U - Memory high temperature test case - Google Patents
Memory high temperature test case Download PDFInfo
- Publication number
- CN205301215U CN205301215U CN201620058144.7U CN201620058144U CN205301215U CN 205301215 U CN205301215 U CN 205301215U CN 201620058144 U CN201620058144 U CN 201620058144U CN 205301215 U CN205301215 U CN 205301215U
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- test
- test platform
- platform
- internal memory
- slot
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- Expired - Fee Related
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- 238000012360 testing method Methods 0.000 title claims abstract description 143
- 238000003780 insertion Methods 0.000 claims description 15
- 230000037431 insertion Effects 0.000 claims description 15
- 238000007789 sealing Methods 0.000 claims description 8
- 239000000284 extract Substances 0.000 claims description 5
- 238000000034 method Methods 0.000 abstract description 4
- 230000000630 rising effect Effects 0.000 abstract 1
- 238000001514 detection method Methods 0.000 description 3
- 230000007812 deficiency Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
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- Tests Of Electronic Circuits (AREA)
Abstract
The utility model provides a memory high temperature test case, the slot that the mainboard has power supply circuit and inserts the memory that awaits measuring is tested including testing the box, having the test platform of test mainboard and the KVM switch of connection test platform and outside display to its structure, and the power pin and the power supply circuit of slot are connected. The test box body is divided into two at least test spaces, and test platform be drawer -type structure, and sealed testing ring border is enclosed into to the test box was inserted or extracted in the test platform cooperation the test space, and when the test space of test box is inserted in the test platform cooperation, test platform and the test space, when inserting the memory slot of testing the mainboard and memory receipt when coming from the voltage that power supply circuit provided, the memory intensification, test platform and outside display are connected to rethread KVM switch, look over the testing result, the parametric variation that has temperature rising in -process in the demonstration that whole testing process can be true, quick to avoid the trouble that causes in the memory in -service use, the practicality is strong.
Description
Technical field
The utility model relates to the test of cabinet inside internal memory, specifically a kind of internal memory high temperature test case.
Background technology
Machine in use easily produces a large amount of heats, and forms a hot environment at cabinet inside, inside exists in particular surroundings and uses, the fault not easily found under there will be a lot of normal temperature, and these faults all can expose the quality problems of entire machine; For the test of internal memory, carry out at normal temperatures often, the temperature comparisons produced when probe temperature cannot operate with machine, so hidden danger is difficult to be found.
Summary of the invention
Technical assignment of the present utility model solves the deficiencies in the prior art, it is provided that a kind of internal memory high temperature test case.
The technical solution of the utility model realizes in the following manner:
A kind of internal memory high temperature test case, comprise the KVM switcher of test casing, the test platform with testing host and connecting test platform and external display, described testing host has power source circuit and the slot of insertion internal memory to be measured, and the power pins of slot is connected with power source circuit with from power source circuit receiver voltage. Described test casing is divided at least two test spaces not being connected mutually, described test platform is drawer-type structure, the test platform of drawer-type structure coordinates insertion or extracts the test space of test casing, and when test platform coordinates the test space of insertion test casing, test platform and the test space surround the test environment of sealing.
Further, when described test platform inserts the test space completely, exposed surface is provided with handle, draws test platform to facilitate to take out.
Preferably, described test casing is divided into four test spaces by three pieces of dividing plates, and the quantity of test platform is four, four test platforms and four test space one_to_one corresponding level insertion or extract the test space.
Preferably, described testing host being provided with the slot that at least one inserts internal memory to be measured, the power pins of each slot is connected with power source circuit respectively with from power source circuit receiver voltage.
The useful effect that a kind of internal memory high temperature test case of the present utility model compared with prior art produces is:
1) the utility model is reasonable in design, and structure is simple, it is intended to provide a detection space sealed, and the working order of emulated memory, internally to deposit into the detection of row high temperature, certainly, temperature when " high temperature " herein is not in using state relative to internal memory;
2) testing host of existing structure is installed on test platform of the present utility model, by the test space of test platform level insertion test casing, owing to test platform and this test space surround the test environment of sealing, when slot and internal memory that internal memory inserts testing host receive the voltage from power source circuit offer, internal memory can heat up, namely be equivalent to simulate the interior detection existing under airtight hot conditions, again by KVM switcher connecting test platform and external display, carry out real time inspection with the performance parameters to internal memory; Whole testing process is true, quick, can effectively understand the performance parameter variations under interior existence sealing hot environment, and in the process that internal memory gradual temperature raises, Timeliness coverage also avoids the fault that internal memory may cause in actual use, practical.
Accompanying drawing explanation
Accompanying drawing 1 is the structural representation testing casing in the utility model;
Accompanying drawing 2 is the structural representation of test platform in the utility model; ;
Accompanying drawing 3 is the structural representation of the test space of test platform complete level insertion test casing in the utility model.
Mark in accompanying drawing represents respectively:
1, casing is tested, 2, dividing plate, 3, the test space, 4, test platform, 5, testing host,
6, slot, 7, handle.
Embodiment
Below in conjunction with accompanying drawing 1,2,3, a kind of internal memory high temperature test case of the present utility model is described in detail below.
As shown in drawings, a kind of internal memory high temperature test case of the present utility model, its structure comprises the KVM switcher of test casing 1, the test platform 4 with testing host 5 and connecting test platform 4 and external display, described testing host 5 has power source circuit and the slot 6 of insertion internal memory to be measured, and the power pins of slot 6 is connected with power source circuit with from power source circuit receiver voltage. Wherein, the KVM switcher of test casing 1, the test platform 4 with testing host 5 and connecting test platform 4 and external display is prior art, so not drawing KVM switcher and the schematic diagram of KVM switcher connecting test platform 4 and external display in accompanying drawing.
Described test casing 1 is divided into four test spaces 3 not being connected mutually by the dividing plate 2 of three pieces of horizontal positioned, described test platform 4 is drawer-type structure, quantity is four, test platform 4 and four test space 3 one_to_one corresponding of four drawer-type structures level insertion or extract four test spaces 3, and when test platform 4 coordinates the test space 3 of insertion test casing 1, test platform 4 and the test space 3 surround the test environment of sealing.
When described test platform 4 inserts the test space 3 completely, exposed surface is provided with handle 7, draws test platform 4 to facilitate to take out.
Preferably, described testing host 5 being provided with the slot 6 that at least one inserts internal memory to be measured, the power pins of each slot 6 is connected with power source circuit respectively with from power source circuit receiver voltage.
During use, internal memory is inserted the slot 6 of testing host 5, by the test space 3 of test platform 4 level insertion test casing 1, test platform 4 and this test space 3 is made to surround the test environment of sealing, power-on, makes the internal memory of insertion slot 6 receive the voltage provided from the power source circuit of testing host 5, now, in the test environment of sealing, internal memory heats up gradually. Simultaneously, due to KVM switcher connecting test platform 4 and external display, staff can understand the performance parameter variations under interior existence sealing hot environment truly, fast and effectively by external display, the fault avoiding internal memory in actual use because performance parameter variations may cause.
In description of the present utility model, it is necessary to explanation, unless otherwise clearly defined and limited, term " installation ", " connection " should be interpreted broadly, such as, it is possible to be fixedly connected with, it is also possible to be removably connect, or connect integratedly;Can be mechanically connected, it is also possible to be electrical connection; Can be direct connection, it is also possible to indirectly connected by intermediary, it is possible to be the connection of two element internals. For the ordinary skill in the art, it is possible to particular case understands the concrete implication of above-mentioned term in the utility model.
Finally should be noted that; above content is only in order to illustrate the technical scheme of the present invention; but not limiting the scope of the invention; although the present invention has been done to explain by this embodiment part; it will be understood by those within the art that; the technical scheme of the present invention can be modified or equivalent replacement, and not depart from essence and the scope of technical solution of the present invention.
Claims (4)
1. an internal memory high temperature test case, comprise test casing, there is the test platform of testing host, and the KVM switcher of connecting test platform and external display, described testing host has power source circuit and the slot of insertion internal memory to be measured, the power pins of slot is connected with from power source circuit receiver voltage with power source circuit, it is characterized in that, described test casing is divided at least two test spaces not being connected mutually, described test platform is drawer-type structure, the test platform of drawer-type structure coordinates insertion or extracts the test space of test casing, and when test platform coordinates the test space of insertion test casing, test platform and the test space surround the test environment of sealing.
2. a kind of internal memory high temperature test case according to claim 1, it is characterised in that, when described test platform inserts the test space completely, exposed surface is provided with handle.
3. a kind of internal memory high temperature test case according to claim 1 and 2, it is characterized in that, described test casing is divided into four test spaces by three pieces of dividing plates, and the quantity of test platform is four, four test platforms and four test space one_to_one corresponding level insertion or extract the test space.
4. a kind of internal memory high temperature test case according to claim 3, it is characterised in that, described testing host is provided with the slot that at least one inserts internal memory to be measured, the power pins of each slot is connected with power source circuit respectively with from power source circuit receiver voltage.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620058144.7U CN205301215U (en) | 2016-01-21 | 2016-01-21 | Memory high temperature test case |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620058144.7U CN205301215U (en) | 2016-01-21 | 2016-01-21 | Memory high temperature test case |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN205301215U true CN205301215U (en) | 2016-06-08 |
Family
ID=56430227
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201620058144.7U Expired - Fee Related CN205301215U (en) | 2016-01-21 | 2016-01-21 | Memory high temperature test case |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN205301215U (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106019114A (en) * | 2016-06-23 | 2016-10-12 | 上海战旗电子有限公司 | Test temperature box |
| CN106707138A (en) * | 2016-12-29 | 2017-05-24 | 广东长虹电子有限公司 | Test device applied to circuit board test |
| CN108446191A (en) * | 2017-12-31 | 2018-08-24 | 广东三木科技有限公司 | A kind of memory bar test system that can simulate varying environment |
| CN108761857A (en) * | 2018-05-18 | 2018-11-06 | 江苏中致显科技有限公司 | A kind of liquid crystal display die set test device and test method |
| CN111707933A (en) * | 2020-08-20 | 2020-09-25 | 浙江杭可仪器有限公司 | Aging test cabinet for memory |
-
2016
- 2016-01-21 CN CN201620058144.7U patent/CN205301215U/en not_active Expired - Fee Related
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106019114A (en) * | 2016-06-23 | 2016-10-12 | 上海战旗电子有限公司 | Test temperature box |
| CN106707138A (en) * | 2016-12-29 | 2017-05-24 | 广东长虹电子有限公司 | Test device applied to circuit board test |
| CN108446191A (en) * | 2017-12-31 | 2018-08-24 | 广东三木科技有限公司 | A kind of memory bar test system that can simulate varying environment |
| CN108761857A (en) * | 2018-05-18 | 2018-11-06 | 江苏中致显科技有限公司 | A kind of liquid crystal display die set test device and test method |
| CN108761857B (en) * | 2018-05-18 | 2023-12-05 | 江苏聚泰科技有限公司 | Liquid crystal display module testing device and testing method |
| CN111707933A (en) * | 2020-08-20 | 2020-09-25 | 浙江杭可仪器有限公司 | Aging test cabinet for memory |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20160608 Termination date: 20170121 |