CN205317828U - Probe - Google Patents
Probe Download PDFInfo
- Publication number
- CN205317828U CN205317828U CN201620039024.2U CN201620039024U CN205317828U CN 205317828 U CN205317828 U CN 205317828U CN 201620039024 U CN201620039024 U CN 201620039024U CN 205317828 U CN205317828 U CN 205317828U
- Authority
- CN
- China
- Prior art keywords
- probe
- probe body
- assist probes
- insulating interlayer
- utility
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000000523 sample Substances 0.000 title claims abstract description 214
- 239000011229 interlayer Substances 0.000 claims abstract description 34
- 239000004020 conductor Substances 0.000 claims abstract description 5
- 239000010410 layer Substances 0.000 claims description 14
- 238000010276 construction Methods 0.000 claims description 6
- 239000012774 insulation material Substances 0.000 claims description 6
- 239000000463 material Substances 0.000 claims description 6
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 3
- 229910052802 copper Inorganic materials 0.000 claims description 3
- 239000010949 copper Substances 0.000 claims description 3
- 239000004033 plastic Substances 0.000 claims description 3
- 229920003023 plastic Polymers 0.000 claims description 3
- 238000012360 testing method Methods 0.000 abstract description 16
- 238000005516 engineering process Methods 0.000 abstract description 6
- 230000007547 defect Effects 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 6
- 238000009413 insulation Methods 0.000 description 5
- 230000007423 decrease Effects 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- YNQLUTRBYVCPMQ-UHFFFAOYSA-N Ethylbenzene Chemical compound CCC1=CC=CC=C1 YNQLUTRBYVCPMQ-UHFFFAOYSA-N 0.000 description 2
- 230000004888 barrier function Effects 0.000 description 2
- OCKPCBLVNKHBMX-UHFFFAOYSA-N butylbenzene Chemical compound CCCCC1=CC=CC=C1 OCKPCBLVNKHBMX-UHFFFAOYSA-N 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000006073 displacement reaction Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- VEXZGXHMUGYJMC-UHFFFAOYSA-M Chloride anion Chemical compound [Cl-] VEXZGXHMUGYJMC-UHFFFAOYSA-M 0.000 description 1
- 239000004698 Polyethylene Substances 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- -1 polyethylene Polymers 0.000 description 1
- 229920000573 polyethylene Polymers 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
Abstract
The utility model relates to the field of electronic technology, in particular to probe for the insulating nature of probe of solving prior art test pad validity is relatively poor, results in easy erroneous judgement, and can only test the defect of the great pad of volume. The utility model discloses a probe is including having probe main part and the supplementary probe that elastic conducting material made, the probe main part with supplementary probe is separated by the insulating interlayer. Because the utility model discloses probe main part and supplementary probe among the probe are separated by the insulating interlayer, consequently both can guarantee the insulating nature between probe main part and the supplementary probe can appropriately reduce the distance between probe main part and the supplementary probe again for the test is than small -size's pad.
Description
Technical field
This utility model relates to electronic technology field, particularly to a kind of probe.
Background technology
Along with electronic technology develops rapidly, the complexity of circuit board is greatly improved, and yield explodes. Within 2014, circuit board yield is up to 2.35 billion cubic meters. The test to circuit board that produces of substantial amounts of circuit board proposes high requirement. Hand inspection board quality cost is high, and speed is not suitable with the development of electronic technology slowly, and circuit board detects automatically becomes industry main flow.
The circuit board produced at present is mainly PCB (PrintedCircuitBoard, printed circuit board). PAD (pad) is a kind of important unit on circuit board, it is possible to be rectangle, circle or other shapes. PAD requires have certain area, if PAD area deficiency can cause that not prison welding is leaned on, the performance of PCB is affected.
The method of the PAD of current test circuit board is to adopt two probes (as shown in Figure 1), two probes connect the both positive and negative polarity of power supply respectively, when two probes touch same PAD simultaneously, can be turned on by PAD, may determine that whether PAD is qualified by judging whether test circuit turns on. But two probes that this method adopts are it is possible that deform (as shown in Figure 2)), cause two probe short circuits together, it is thus desirable to ensure that certain distance is to ensure the insulating properties between two probes, is only used for the pad that test area is bigger. There is presently no a kind of suitable probe and both ensured insulating properties, reduced size pad can be tested again.
Utility model content
This utility model embodiment provides a kind of probe, does not have a kind of suitable probe both to ensure insulating properties in order to solve to exist in prior art, can test again reduced size pad problem.
This utility model embodiment provides a kind of probe, separates by insulating interlayer including having probe body and the assist probes that elastic conductive material is made, described probe body and described assist probes.
Owing to the probe body in the probe of this utility model embodiment and assist probes are separated by insulating interlayer, therefore both can ensure that the insulating properties between probe body and assist probes, by the suitable distance reduced between probe body and assist probes, can also be used for testing the pad of reduced size.
Optionally, described probe body is cylindric, and assist probes is the cylindric of hollow-core construction;
Described probe body outer layer is the insulating interlayer of sleeve-shaped;
Described insulating interlayer outer layer is described assist probes;
The axial line of described probe body and described assist probes overlaps.
The probe body of this utility model embodiment probe and the shape of assist probes and position so that the region that the probe of this utility model embodiment detects centered by probe body is relatively big, judge the non-existent probability of pad by accident less when pad exists.
Optionally, the interior diameter of the described assist probes of hollow-core construction is more than the diameter of the outer layer of described insulating interlayer.
Can separate move owing to there is space, probe body and assist probes between the assist probes of this utility model embodiment probe and the probe body being coated with by insulating barrier, more flexible measurement pad,
Optionally, the length of described probe body is more than the length of described assist probes.
This utility model embodiment highlights with probe body, when capture pad centered by probe body, it is possible to position more accurately.
Optionally, described probe body and described assist probes are cylindric;
Described probe body and/or assist probes outer layer are the insulating interlayer of sleeve-shaped;
The axial line of described probe body and described assist probes is parallel to each other.
Owing to having insulating barrier between probe body and the assist probes of this utility model embodiment, under the premise that thickness of insulating layer can be less, ensure the insulating properties between probe body and assist probes, therefore the distance between probe body and assist probes can be closer to, it is possible to is used for measuring smaller szie pad.
Optionally, the material of described probe body and described assist probes is copper.
Elastic properties of materials and the electric conductivity of this utility model embodiment probe body and assist probes are better.
Optionally, the material of described insulating interlayer is plastic insulation material or rubber insulation material.
The insulant that this utility model embodiment adopts can have bigger insulation resistance when thickness is less.
Optionally, the diameter of described probe body is less than 100 microns.
Accompanying drawing explanation
Fig. 1 is the probe schematic diagram testing PAD in prior art;
Fig. 2 is the probe deformations schematic diagram testing PAD in prior art;
Fig. 3 is the first probe schematic diagram of this utility model;
Fig. 4 is for utilizing this utility model the first probe test PAD schematic diagram;
Fig. 5 is this utility model the second probe schematic diagram;
Fig. 6 is the probe body coated insulation Mezzanine Map of this utility model the second probe
Fig. 7 is probe body and the assist probes coated insulation Mezzanine Map of this utility model the second probe;
Fig. 8 is the assist probes coated insulation Mezzanine Map of this utility model the second probe;
Fig. 9 is for utilizing this utility model the first probe test PAD schematic diagram.
Detailed description of the invention
The embodiment of the present application provides a kind of probe, separates by insulating interlayer including having probe body and the assist probes that elastic conductive material is made, described probe body and described assist probes. Owing to the probe body in the probe of this utility model embodiment and assist probes are separated by insulating interlayer, therefore both can ensure that the insulating properties between probe body and assist probes, the distance between reduction probe body and assist probes that again can be suitable. Owing to the distance between probe body and assist probes reduces, such that it is able to the pad of test reduced size.
For making the purpose of the embodiment of the present application, technical scheme and advantage clearly, below in conjunction with the accompanying drawing in the embodiment of the present application, technical scheme in the embodiment of the present application is clearly and completely described, obviously, described embodiment is some embodiments of the present application, rather than whole embodiments.Based on the embodiment in the application, the every other embodiment that those of ordinary skill in the art obtain under not making creative work premise, broadly fall into the scope of the application protection.
As it is shown on figure 3, this utility model embodiment provides a kind of probe, including having probe body 1 and the assist probes 2 that elastic conductive material is made, described probe body 1 and described assist probes 2 are separated by insulating interlayer 3.
Wherein, the material of probe body 1 and assist probes 2 is the good metal of electric conductivity, for instance copper. Insulating interlayer is made up of plastic insulation material or rubber insulation material. Such as, polyethylene, polrvinyl chloride, natural (butylbenzene) rubber, ethylbenzene rubber etc.
In practical application, probe body 1 and assist probes 2 connect a pole of power supply respectively, are insulation in an initial condition mutually. Under in working order, probe body 1 and assist probes 2 are all touched PAD and are turned on by PAD, it is mounted with that the PCB ATE of the probe of this utility model embodiment makes the probe body 1 of probe all contact pcb board with assist probes 2, if probe body 1 and assist probes 2 turn on, it is determined that PAD is effective; If being not turned on, it is determined that PAD lacks.
Probe in this utility model embodiment can be divided into two kinds according to the shape of assist probes 2:
One, assist probes 2 is sleeve-shaped
As shown in Figure 4, described probe body 1 is cylindric, and assist probes 2 is the cylindric of hollow-core construction;
Described probe body 1 outer layer is the insulating interlayer 3 of sleeve-shaped;
Described insulating interlayer 3 outer layer is described assist probes 2;
The axial line of described probe body 1 and described assist probes 2 overlaps.
Optionally, the interior diameter of the described assist probes 2 of hollow-core construction is more than the diameter of the outer layer of described insulating interlayer 3.
Being wrapped between the probe body 1 of insulating interlayer 3 and assist probes 2 has gap or gapless. If gapless between probe body 1 and assist probes 2, assist probes 2 can have displacement relative to probe body 1 under external force on direction of axis line. This structure can make probe body 1 and assist probes 2 be fully contacted with PAD. As it is shown in figure 5, when utilizing the first probe test, when whole probe moves downward, if first probe body 1 touches PAD, assist probes 2 can continue to move downward. Until assist probes 2 also touches PAD.
Optionally, the length of probe body 1 can be longer than the length of assist probes 2.
The diameter of probe body 1 can be less than 200 microns, and the diameter of sleeve-shaped assist probes 2 and thickness can between 100～200 microns.
Two, assist probes 2 is cylindric
Optionally, described probe body 1 and described assist probes 2 are cylindric;
Described probe body 1 and/or the insulating interlayer 3 that assist probes 2 outer layer is sleeve-shaped;
The axial line of described probe body 1 and described assist probes 2 is parallel to each other.
Described probe body 1 and/or the insulating interlayer that assist probes 2 outer layer is sleeve-shaped can include the one in following three situation:
This utility model embodiment probe body 1 can be wrapped up by sleeve-shaped insulating interlayer 3, and assist probes 2 is wrapped up by sleeve-shaped insulating interlayer 3, and probe body 1 and assist probes 2 are wrapped up by sleeve-shaped insulating interlayer 3 respectively.
The second probe of this utility model embodiment can be divided into three kinds according to the parcel situation of insulating interlayer: is coated with insulating interlayer (as shown in Figure 6) on probe body, probe body enter with assist probes on be all surrounded by insulating interlayer (as shown in Figure 7), assist probes is coated with insulating interlayer (as shown in Figure 8).
On probe body, it is coated with insulating interlayer, can have gap between assist probes and insulating interlayer, it is also possible to very close to each other. Assist probes 2 can have displacement relative to probe body 1 under external force on axial line.
As it is shown in figure 9, when utilizing the second probe test, probe body 1 and assist probes 2 decline simultaneously, if probe body 1 first contacts pcb board, then assist probes 2 continues to decline, until assist probes 2 contacts pcb board; If assist probes 2 first contacts pcb board, then probe body 1 continues to decline, until probe body 1 contacts pcb board.
The length of probe body 1 can be longer than the length of assist probes 2, and the length of probe body 1 can also be equal to the length of assist probes 2, and the length of probe body 1 can also be shorter than the length of assist probes 2.
Obviously, this utility model can be carried out various change and modification without deviating from spirit and scope of the present utility model by those skilled in the art. So, if these amendments of the present utility model and modification belong within the scope of this utility model claim and equivalent technologies thereof, then this utility model is also intended to comprise these change and modification.
Claims (8)
1. a probe, including having probe body and the assist probes that elastic conductive material is made, it is characterised in that described probe body and described assist probes are separated by insulating interlayer.
2. probe as claimed in claim 1, it is characterised in that
Described probe body is cylindric, and assist probes is the cylindric of hollow-core construction;
Described probe body outer layer is the insulating interlayer of sleeve-shaped;
Described insulating interlayer outer layer is described assist probes;
The axial line of described probe body and described assist probes overlaps.
3. probe as claimed in claim 2, it is characterised in that
The interior diameter of the described assist probes of hollow-core construction is more than the diameter of the outer layer of described insulating interlayer.
4. probe as claimed in claim 2, it is characterised in that the length of described probe body is more than the length of described assist probes.
5. probe as claimed in claim 1, it is characterised in that
Described probe body and described assist probes are cylindric;
Described probe body and/or assist probes outer layer are the insulating interlayer of sleeve-shaped;
The axial line of described probe body and described assist probes is parallel to each other.
6. the probe as described in as arbitrary in Claims 1 to 5, it is characterised in that
The material of described probe body and described assist probes is copper.
7. the probe as described in as arbitrary in Claims 1 to 5, it is characterised in that
The material of described insulating interlayer is plastic insulation material or rubber insulation material.
8. the probe as described in as arbitrary in Claims 1 to 5, it is characterised in that
The diameter of described probe body is less than 200 microns.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620039024.2U CN205317828U (en) | 2016-01-13 | 2016-01-13 | Probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620039024.2U CN205317828U (en) | 2016-01-13 | 2016-01-13 | Probe |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN205317828U true CN205317828U (en) | 2016-06-15 |
Family
ID=56204514
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201620039024.2U Expired - Fee Related CN205317828U (en) | 2016-01-13 | 2016-01-13 | Probe |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN205317828U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111969097A (en) * | 2020-10-20 | 2020-11-20 | 深圳市Tcl高新技术开发有限公司 | LED chip test fixture, method and system and manufacturing method of test fixture |
-
2016
- 2016-01-13 CN CN201620039024.2U patent/CN205317828U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111969097A (en) * | 2020-10-20 | 2020-11-20 | 深圳市Tcl高新技术开发有限公司 | LED chip test fixture, method and system and manufacturing method of test fixture |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20160615 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |