CN205317826U - Millimeter wave monolithic chip test fixture - Google Patents

Millimeter wave monolithic chip test fixture Download PDF

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Publication number
CN205317826U
CN205317826U CN201620031880.3U CN201620031880U CN205317826U CN 205317826 U CN205317826 U CN 205317826U CN 201620031880 U CN201620031880 U CN 201620031880U CN 205317826 U CN205317826 U CN 205317826U
Authority
CN
China
Prior art keywords
test fixture
tungsten copper
monolithic
copper carrier
millimeter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201620031880.3U
Other languages
Chinese (zh)
Inventor
胡张平
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hefei Ic Valley Microelectronics Co Ltd
Original Assignee
Hefei Ic Valley Microelectronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hefei Ic Valley Microelectronics Co Ltd filed Critical Hefei Ic Valley Microelectronics Co Ltd
Priority to CN201620031880.3U priority Critical patent/CN205317826U/en
Application granted granted Critical
Publication of CN205317826U publication Critical patent/CN205317826U/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Abstract

The utility model discloses a millimeter wave monolithic chip test fixture, including a well core plate, two end wafers, the top of well core plate is opened flutedly, and fixed mounting has tungsten copper carrier in the recess, and the monolithic microwave chip sintering that awaits measuring on tungsten copper carrier, lies in monolithic microwave chip both ends and still is equipped with microstrip transmission line respectively on the tungsten copper carrier, the lateral surface of end wafer is equipped with the radio frequency connector respectively, is equipped with the probe on the medial surface of end wafer respectively, two end wafer centre grippings fix on well core plate and two end wafers on the probe closely the laminating at two microstrip transmission line's tip. The utility model discloses an as far as possible miniaturized design, can relax adapt to monolithic microwave integrated circuit testing ring border complicated and changeable, can test fast by ideal reply monolithic multiport, and connector and radio frequency needle can be changed according to the negative and positive head is nimble if any wearing and tearing in the middle of daily use to reduce test cost, improved test accuracy and reliability.

Description

Millimeter-wave monolithic circuit chip test fixture
Technical field
The utility model relates generally to microwave chip and manufactures field, particularly relates to a kind of millimeter-wave monolithic circuit chip test fixture.
Background technology
Microwave chip manufacturing all can run into a same problem, is exactly high-power, a difficult problem for poor heat radiation and high-frequency resistance mismatch when high frequency monolithic integrated microwave circuit nude film is tested. In order to solve this difficult problem so that monolithic integrated microwave circuit test becomes more simply and accurately and reliably, for this reason, the utility model proposes the test fixture for monolithic integrated microwave circuit bare chip.
Practical novel content
The utility model object is exactly the defect in order to make up prior art, it is provided that a kind of millimeter-wave monolithic circuit chip test fixture.
The utility model is achieved through the following technical solutions:
Millimeter-wave monolithic circuit chip test fixture, it is characterized in that: include a centre slice, two end sheets, the top of described centre slice has groove, groove is installed with tungsten copper carrier, monolithic microwave chip to be measured sinters on tungsten copper carrier, tungsten copper carrier is positioned at monolithic microwave chip two ends and is also respectively equipped with micro-band transmission line; The outer side of described end sheet is respectively equipped with radio frequency junctor, and the interior side of end sheet is respectively equipped with probe; Described two end sheets are clamped on centre slice and probe on two end sheets fits tightly in the end of two micro-band transmission lines.
Described millimeter-wave monolithic circuit chip test fixture, it is characterised in that: described tungsten copper carrier is arranged on centre slice by four M1.5 screws.
Described millimeter-wave monolithic circuit chip test fixture, it is characterised in that: the two side of described groove is respectively equipped with DC Insulator.
Described millimeter-wave monolithic circuit chip test fixture, it is characterised in that: being vertically provided with U-type groove on described end sheet, centre slice is evenly provided with several threaded holes from top to bottom, end sheet screws fastening by the screw that several run through U-type groove and threaded hole.
Described millimeter-wave monolithic circuit chip test fixture, it is characterised in that: described screw adopts M3.0 screw.
The utility model has the advantages that:
The utility model have employed miniaturization Design as far as possible, can easily adapt to monolithic integrated microwave circuit test environment complicated and changeable, it is possible to the outspoken speed test of desirable reply monolithic multiterminal; In monolithic integrated microwave circuit high frequency is tested, it is that Designers well researches and develops instrument; And junctor and radio frequency needle can be changed flexibly according to negative and positive head if any abrasion in the middle of routine use, thus reduce testing cost, it is to increase test accuracy and reliability.
Adopt fixture of the present utility model, before and after test accuracy and reliability test, monolithic integrated circuit chip can be carried out direct current parameter testing, microwave index test, there is precision height, compatible good, excellent heat dissipation performance, operating frequency height, it may also be useful to the features such as convenience.
Accompanying drawing explanation
Fig. 1 is structural representation of the present utility model.
The assembling schematic diagram of sheet centered by Fig. 2.
Embodiment
As shown in Figure 1, 2, millimeter-wave monolithic circuit chip test fixture, include a centre slice 1, two end sheets 2, the top of centre slice 1 has groove, the two side of groove is respectively equipped with DC Insulator 3, being provided with tungsten copper carrier 4 by four M1.5 screws 6 in groove, monolithic microwave chip 5 to be measured sinters on tungsten copper carrier 4, tungsten copper carrier 4 is positioned at monolithic microwave chip 5 two ends and is also respectively equipped with micro-band transmission line 7; The outer side of described end sheet 2 is respectively equipped with radio frequency junctor 8, and the interior side of end sheet 2 is respectively equipped with probe 9; Described two end sheets 2 are clamped on centre slice 1 and probe 9 on two end sheets 2 fits tightly in the end of two micro-band transmission lines 7.
Vertically being provided with U-type groove 10 on end sheet 2, centre slice 1 is evenly provided with several threaded holes 11 from top to bottom, end sheet 2 screws fastening by the M3.0 screw 12 that several run through U-type groove 10 and threaded hole 11.
Turn and join test process:
1, first the tungsten copper carrier sintering chip is arranged on centre slice with four M1.5 screws;
2, the end sheet on both sides is fixed on centre slice by M3.0 screw, during installation, should be noted that end sheet probe accurately fits tightly at microstrip line surface metal;
3, DC Insulator pin is connected to chip power supply port, it is provided that corresponding biased condition;
4, connect relevant equipment, start test.
The utility model is particularly useful for monolithic integrated microwave circuit debugging, time in its test process as needed to change different product, only needing to unclamp the end sheet screw at two ends, four screws of immobilization carrier unload just easily can be changed variant production easily and start test assignment fast.

Claims (5)

1. millimeter-wave monolithic circuit chip test fixture, it is characterized in that: include a centre slice, two end sheets, the top of described centre slice has groove, groove is installed with tungsten copper carrier, monolithic microwave chip to be measured sinters on tungsten copper carrier, tungsten copper carrier is positioned at monolithic microwave chip two ends and is also respectively equipped with micro-band transmission line; The outer side of described end sheet is respectively equipped with radio frequency junctor, and the interior side of end sheet is respectively equipped with probe; Described two end sheets are clamped on centre slice and probe on two end sheets fits tightly in the end of two micro-band transmission lines.
2. millimeter-wave monolithic circuit chip test fixture according to claim 1, it is characterised in that: described tungsten copper carrier is arranged on centre slice by four M1.5 screws.
3. millimeter-wave monolithic circuit chip test fixture according to claim 1, it is characterised in that: the two side of described groove is respectively equipped with DC Insulator.
4. millimeter-wave monolithic circuit chip test fixture according to claim 1, it is characterized in that: described end sheet is vertically provided with U-type groove, evenly being provided with several threaded holes on centre slice from top to bottom, end sheet screws fastening by the screw that several run through U-type groove and threaded hole.
5. millimeter-wave monolithic circuit chip test fixture according to claim 4, it is characterised in that: described screw adopts M3.0 screw.
CN201620031880.3U 2016-01-12 2016-01-12 Millimeter wave monolithic chip test fixture Expired - Fee Related CN205317826U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201620031880.3U CN205317826U (en) 2016-01-12 2016-01-12 Millimeter wave monolithic chip test fixture

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201620031880.3U CN205317826U (en) 2016-01-12 2016-01-12 Millimeter wave monolithic chip test fixture

Publications (1)

Publication Number Publication Date
CN205317826U true CN205317826U (en) 2016-06-15

Family

ID=56202289

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201620031880.3U Expired - Fee Related CN205317826U (en) 2016-01-12 2016-01-12 Millimeter wave monolithic chip test fixture

Country Status (1)

Country Link
CN (1) CN205317826U (en)

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Legal Events

Date Code Title Description
C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20160615

Termination date: 20190112

CF01 Termination of patent right due to non-payment of annual fee