CN205263139U - Banded test socket of fingerprint identification chip - Google Patents

Banded test socket of fingerprint identification chip Download PDF

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Publication number
CN205263139U
CN205263139U CN201521127685.2U CN201521127685U CN205263139U CN 205263139 U CN205263139 U CN 205263139U CN 201521127685 U CN201521127685 U CN 201521127685U CN 205263139 U CN205263139 U CN 205263139U
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CN
China
Prior art keywords
probe
socket
fingerprint recognition
banded
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201521127685.2U
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Chinese (zh)
Inventor
史赛
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TWINSOLUTION TECHNOLOGY Ltd
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TWINSOLUTION TECHNOLOGY Ltd
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Publication date
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Priority to CN201521127685.2U priority Critical patent/CN205263139U/en
Application granted granted Critical
Publication of CN205263139U publication Critical patent/CN205263139U/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Abstract

The utility model relates to a testing arrangement of fingerprint identification chip especially relates to a banded test socket of fingerprint identification chip. The utility model discloses a banded test socket of fingerprint identification chip, including socket frame, socket, socket baffle and test probes, socket fixed mounting is provided with at least one chip assay position on the socket in the socket frame, lies in the chip assay position on the socket and is provided with the probe mounting hole, and the bottom fixed mounting socket baffle of socket is provided with the probe spacing hole corresponding with the probe mounting hole, the spacing downthehole test probes that is provided with of probe mounting hole and probe on the socket baffle. The utility model discloses a banded test socket of fingerprint identification chip realizes many chips and once only tests, effectively improves production efficiency jointly.

Description

The banded test jack of fingerprint recognition chip
Technical field
The utility model relates to a kind of testing arrangement of fingerprint recognition chip, relates in particular to a kind of fingerprint recognition coreThe banded test jack of sheet.
Background technology
Along with fingerprint chip is in the application of the product such as mobile phone, computer, market to the demand of fingerprint recognition chip moreCome greatlyr, chip producer need to increase substantially production efficiency, to meet market demand. Fingerprint chip qualityDetect as a ring very important in chip production process, owing to being subject to the restriction of method of testing, become and carryThe bottleneck of high efficiency. In prior art, for the test of fingerprint recognition chip, with manual test the mostExtensively, minority adopts the automatic test taking single chips as unit; But, these fingerprint recognition chips, all there is the problem that efficiency is too low, cost of labor is too high in method of testing, is difficult to meet the need of market.
Utility model content
For solving the problems of the technologies described above, the purpose of this utility model is to provide one, and to realize multiple chips disposableThe banded test jack of the common fingerprint recognition chip of testing, effectively enhance productivity.
The banded test jack of fingerprint recognition chip of the present utility model, comprises receptacle boxes, socket, socketBaffle plate and test probe, described socket is fixedly mounted in described receptacle boxes, on described socket, arrangesThere is at least one chip detection position, on described socket, be positioned at described chip detection position and be provided with probe installationHole, the bottom of described socket fixedly mounts described socket baffle plate, on described socket baffle plate, is provided with describedThe probe spacing hole that probe installing hole is corresponding, described in being provided with in described probe installing hole and probe spacing holeTest probe.
Further, the both sides of described socket are provided with installing plate, and described installing plate is fixed by fixtureBe arranged on described receptacle boxes.
Concrete, described fixture is shop bolt.
Further, described socket baffle plate is arranged on described socket by screw.
Further, on described socket, be provided with two row's chip detection hytes, each row's chip detection hyteComprise 4 chip detection positions.
Further, described test probe comprises probe and lower probe, and described lower probe is describedRelative sliding in upper probe, the aperture of described lower probe and described probe spacing hole matches, described onThe aperture of probe and described probe installing hole matches.
Further, the bottom margin of described upper probe is provided with annular protuberance, and described probe is installedThe bottom in hole is provided with stopper slot, and the internal diameter of described stopper slot and the external diameter of described protuberance match, described inStopper slot is for limiting the relative motion of probe aperture towards probe installing hole top-direction.
By such scheme, the utility model at least has the following advantages: 1) human cost has been saved in this design;2) the automatic test jack testing efficiency of monolithic efficiency improves tens times relatively.
Above-mentioned explanation is only the general introduction of technical solutions of the utility model, new in order to better understand this practicalityThe technological means of type, and can being implemented according to the content of description, below with better reality of the present utility modelExecute example and coordinate accompanying drawing to be described in detail as follows.
Brief description of the drawings
Fig. 1 is upward view of the present utility model;
Fig. 2 is top view of the present utility model;
Fig. 3 is structural representation of the present utility model;
Fig. 4 is the banded structural representation that does not cut fingerprint recognition chip;
Fig. 5 is that the banded test jack of the utility model fingerprint recognition chip is at the knot of test probe test modeStructure schematic diagram;
Fig. 6 is that the banded test jack of the utility model fingerprint recognition chip is at the knot of test probe free stateStructure schematic diagram;
Fig. 7 is the automatic detection system that adopts the banded test jack of the utility model fingerprint recognition chipStructural representation;
Fig. 8 is that the banded test jack of the utility model fingerprint recognition chip is descended in working order and band shape is not cutCut the cutaway view of the position relationship of fingerprint recognition chip.
Detailed description of the invention
Below in conjunction with drawings and Examples, detailed description of the invention of the present utility model is described in further detail.Following examples are used for illustrating the utility model, but are not used for limiting scope of the present utility model.
Embodiment mono-
Referring to Fig. 1 to Fig. 3, the band shape test of a kind of fingerprint recognition chip of the utility model one preferred embodimentSocket, comprises receptacle boxes 1, socket 2, socket baffle plate 3 and test probe 4, the fixing peace of socket 2Be contained in receptacle boxes 1, on socket 2, be provided with at least one chip detection position 5, on socket 2, be positioned at coreIn sheet detecting position 5, be provided with probe installing hole 6, the bottom fixed installation socket baffle plate 3 of socket 2, socketOn baffle plate 3, be provided with the probe spacing hole 7 corresponding with probe installing hole 6, probe installing hole 6 and probe limitPosition is provided with test probe 4 in hole 7. The both sides of socket 2 are provided with installing plate 9, and installing plate 9 is by solidDetermining part is fixedly mounted on receptacle boxes; Comparatively simple, fixture is shop bolt. Socket baffle plate 3 passes throughScrew is arranged on socket.
As shown in Figure 4, in figure, be the banded structural representation that does not cut fingerprint recognition chip 30, this chip beltUpper each row has 4 fingerprint recognition chips, does not cut fingerprint recognition chip, socket in order to detect band shape simultaneouslyOn body 2, be provided with two row's chip detection hytes, each row's chip detection hyte comprises 4 chip detection positions 5,Can test like this 8 chips simultaneously. Test probe arrange and not diced chip tape be consistent, ensure everyIndividual chip has corresponding test position. Test jack upper and lower surface keeps extraordinary flatness and the depth of parallelism,Ensure that each position chip testing state is identical.
As shown in Figure 5 and Figure 6, test probe 4 comprises probe 10 and lower probe 11, lower probe11 at the interior relative sliding of upper probe 10, and lower probe 11 matches with the aperture of probe spacing hole 7, onProbe 10 matches with the aperture of probe installing hole 6.
The bottom margin of upper probe 10 is provided with annular protuberance 12, and the bottom of probe installing hole is provided withStopper slot 8, the internal diameter of stopper slot 8 and the external diameter of protuberance match, and stopper slot 8 is for limiting upper probe apertureTowards the relative motion of probe installing hole top-direction.
Embodiment bis-
As Fig. 7 and Fig. 8, the utility model also provides a kind of banded test jack that adopts fingerprint recognition chipAutomatic checkout equipment, comprises that banded test jack 20, band shape do not cut fingerprint recognition chip 30 and transportThe banded automatic transfer equipment 40 that does not cut fingerprint recognition chip 30, has realized the chip testing stage by finished productTest phase changes to chip substrate test (the not shearing) stage, and test jack is arranged feelings according to chip substrateCondition is designed to multiple chips and tests simultaneously. Be responsible for feed by automation transfer equipment, (band shape is not for chip substrateCutting fingerprint recognition chip 30) advance two groups, the row of two in corresponding test jack test point position at every turn. Often completeBecome once test, continue to advance two groups.
The above is only preferred embodiment of the present utility model, is not limited to the utility model, shouldWhen pointing out, for those skilled in the art, do not departing from the utility model know-whyPrerequisite under, can also make some improvement and modification, these improve and modification also should be considered as the utility modelProtection domain.

Claims (7)

1. a banded test jack for fingerprint recognition chip, is characterized in that: comprise receptacle boxes, socket,Socket baffle plate and test probe, described socket is fixedly mounted in described receptacle boxes, on described socketBe provided with at least one chip detection position, on described socket, be positioned at described chip detection position and be provided with probeInstalling hole, the bottom of described socket fixedly mounts described socket baffle plate, on described socket baffle plate, be provided withThe probe spacing hole that described probe installing hole is corresponding, is provided with in described probe installing hole and probe spacing holeDescribed test probe.
2. the banded test jack of fingerprint recognition chip according to claim 1, is characterized in that: instituteThe both sides of stating socket are provided with installing plate, and described installing plate is fixedly mounted on described receptacle boxes by fixtureOn.
3. the banded test jack of fingerprint recognition chip according to claim 2, is characterized in that: instituteStating fixture is shop bolt.
4. the banded test jack of fingerprint recognition chip according to claim 1, is characterized in that: instituteState on socket and be provided with two row's chip detection hytes, each row's chip detection hyte comprises 4 chip detectionPosition.
5. the banded test jack of fingerprint recognition chip according to claim 1, is characterized in that: instituteState test probe and comprise probe and lower probe, described lower probe is relatively sliding in probe on describedMoving, the aperture of described lower probe and described probe spacing hole matches, described upper probe and described probeThe aperture of installing hole matches.
6. the banded test jack of fingerprint recognition chip according to claim 5, is characterized in that: instituteThe bottom margin of stating probe is provided with annular protuberance, and the bottom of described probe installing hole arranges limitedPosition groove, the internal diameter of described stopper slot and the external diameter of described protuberance match, and described stopper slot is for restrictionProbe aperture is towards the relative motion of probe installing hole top-direction.
7. the banded test jack of fingerprint recognition chip according to claim 1, is characterized in that: instituteStating socket baffle plate is arranged on described socket by screw.
CN201521127685.2U 2015-12-30 2015-12-30 Banded test socket of fingerprint identification chip Active CN205263139U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201521127685.2U CN205263139U (en) 2015-12-30 2015-12-30 Banded test socket of fingerprint identification chip

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201521127685.2U CN205263139U (en) 2015-12-30 2015-12-30 Banded test socket of fingerprint identification chip

Publications (1)

Publication Number Publication Date
CN205263139U true CN205263139U (en) 2016-05-25

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN201521127685.2U Active CN205263139U (en) 2015-12-30 2015-12-30 Banded test socket of fingerprint identification chip

Country Status (1)

Country Link
CN (1) CN205263139U (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106483453A (en) * 2016-12-14 2017-03-08 江苏凯尔生物识别科技有限公司 Electrical detection device for fingerprint chip
CN107329078A (en) * 2017-08-29 2017-11-07 中科芯集成电路股份有限公司 Fingerprint recognition chip testing devices
TWI608238B (en) * 2016-10-14 2017-12-11 Probe type electrical connection assembly

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI608238B (en) * 2016-10-14 2017-12-11 Probe type electrical connection assembly
CN106483453A (en) * 2016-12-14 2017-03-08 江苏凯尔生物识别科技有限公司 Electrical detection device for fingerprint chip
CN106483453B (en) * 2016-12-14 2023-12-01 江苏凯尔生物识别科技有限公司 Electrical property detection device for fingerprint chip
CN107329078A (en) * 2017-08-29 2017-11-07 中科芯集成电路股份有限公司 Fingerprint recognition chip testing devices
CN107329078B (en) * 2017-08-29 2024-02-09 中科芯集成电路有限公司 Fingerprint identification chip test equipment

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