CN205229359U - Device of quartz crystal piece polarity is measured chinese style - Google Patents
Device of quartz crystal piece polarity is measured chinese style Download PDFInfo
- Publication number
- CN205229359U CN205229359U CN201521095691.4U CN201521095691U CN205229359U CN 205229359 U CN205229359 U CN 205229359U CN 201521095691 U CN201521095691 U CN 201521095691U CN 205229359 U CN205229359 U CN 205229359U
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- China
- Prior art keywords
- conducting plate
- current conducting
- insulcrete
- insulating part
- carrying plate
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Abstract
The utility model discloses a device of quartz crystal piece polarity is measured chinese style, including base, support, fastening screw, push down insulating part, insulation board, go up the current conducting plate, current conducting plate down, the one end of support is fixed on the base, the other end and the fastening screw swing joint of support, the up end butt fastening screw who pushes down the insulating part, the lower terminal surface that pushes down the insulating part is opened has the blind hole, is provided with the block rubber in the blind hole, block rubber butt insulation board, the diameter of insulation board equal with the diameter of blind hole, insulation board below in proper order on butt current conducting plate, is surveyed quartzy wafer, current conducting plate and base down, still include the voltmeter, two electrode contacts of quartzy wafer are connected at last current conducting plate under and on the current conducting plate respectively. Still including insulating semi -ring spare, insulating semi -ring spare sets up on current conducting plate down, and goes up the current conducting plate and lain in the concave surface of insulating semi -ring spare by the quartzy wafer of survey. Can effectually prevent the disappearance owing to the experience in market operation, it is too big and damaged to make crystallization body atress.
Description
Technical field
The utility model relates to polarity measurement device, is specifically related to the device that centering type measures quartz crystal slice polarity.
Background technology
When crystal in some direction by the effect of external force time, inside just produces polarization, produces the contrary electric charge of equivalent on certain two surface simultaneously; After external force removes, crystal returns to again uncharged state; When External Force Acting direction changes, the polarity of electric charge also changes thereupon; Stressed the produced quantity of electric charge of crystal is directly proportional to the size of external force.When quartz wafer is in the effect being subject to shearing force, it also can produce polarization, but quartz wafer is when the effect being subject to shearing force, what kind of its polarity is on earth, this needs could be measured by instrument to obtain, traditional measurement is sheared sheet polarity and is adopted insulation lump and insulcrete top piezocrystal body, therefore, very high to the skill requirement of tester, otherwise when pressure is excessive, the breakage of crystal can be caused, in addition, in test process, also need to arrange current-carrying plate above tested quartz wafer, in the below of tested quartz wafer, lower conducting plate is set, generally need current-carrying plate and quartz wafer centering, auxiliary centering technology is not had in prior art, general is all operate by operating personnel's experience.
Utility model content
Technical problem to be solved in the utility model prevents crystal damaged at pressurized, and align tested quartz wafer and upper current-carrying plate simultaneously, and object is to provide centering type to measure the device of quartz crystal slice polarity.
Of the present utility modelly to be achieved through the following technical solutions:
Centering type measures the device of quartz crystal slice polarity, this device comprises base, support, trip bolt, press down insulating part, insulcrete, upper current-carrying plate, lower conducting plate, one end of described support is fixed on base, the other end of support is flexibly connected with trip bolt, the described upper surface pressing down insulating part abuts trip bolt, the lower surface pressing down insulating part has blind hole, block rubber is provided with in blind hole, block rubber abuts insulcrete, the diameter of insulcrete and the equal diameters of blind hole, upper current-carrying plate is abutted successively below described insulcrete, tested quartz wafer, lower conducting plate and base, also comprise voltage table, two electrode contacts of quartz wafer are connected on current-carrying plate and lower conducting plate.Also comprise insulation half ring, half ring that insulate is arranged on lower conducting plate, and upper current-carrying plate and tested quartz wafer are positioned at the inner concave of insulation half ring.
The utility model traditional insulation lump is replaced with there is blind hole press down insulating part, block rubber is set in blind hole simultaneously, insulcrete is made to free in and out blind hole, when pressing down insulating part and pressing down, insulcrete to enter in blind hole and extrudes block rubber, when block rubber reaches limit of elasticity, can press down by inoperation trip bolt, crystal can be avoided in this process stressed excessive, and cause breakage.Simultaneously, the utility model adopts insulation half ring as centering piece, before operation, the periphery of isodiametric upper current-carrying plate and tested quartz wafer is abutted against in the inner concave of insulation half ring, can easily upper current-carrying plate and tested quartz wafer be alignd on the same axis.
The described insulating part that presses down is plexiglass block.
Insulcrete is the insulcrete that teflon material is made.
Described upper current-carrying plate and lower conducting plate are copper coin.
The lower surface of described upper current-carrying plate overlaps with the upper surface of tested wafer.
The utility model compared with prior art, has following advantage and beneficial effect: 1, this apparatus structure is simple, practical, and does not commercially have same device to sell; 2, be specially adapted to short run measure, measurement accuracy is high, effectively can prevent the disappearance due to operating experience, causes crystal stressed excessive and damaged; Easily centering can also go up current-carrying plate and tested quartz wafer.
Accompanying drawing explanation
Accompanying drawing described herein is used to provide the further understanding to the utility model embodiment, forms a application's part, does not form the restriction to the utility model embodiment.In the accompanying drawings:
Fig. 1 is the utility model structural representation.
Fig. 2 is the plan structure schematic diagram that insulation half ring is arranged on lower conducting plate.
Mark and corresponding parts title in accompanying drawing:
1, base; 2, support; 3, lower conducting plate; 4, tested quartz wafer; 5, upper current-carrying plate; 6, insulcrete; 7, insulating part is pressed down; 8, trip bolt; 71, block rubber; 9, insulate half ring.
Embodiment
Clearly understand for making the purpose of this utility model, technical scheme and advantage, below in conjunction with embodiment and accompanying drawing, the utility model is described in further detail, exemplary embodiment of the present utility model and explanation thereof are only for explaining the utility model, and conduct is not to restriction of the present utility model.
Embodiment
As depicted in figs. 1 and 2, the utility model centering type measures the device of quartz crystal slice polarity, centering type measures the device of quartz crystal slice polarity, this device comprises base 1, support 2, trip bolt 8, press down insulating part 7, insulcrete 6, upper current-carrying plate 5, lower conducting plate 3, one end of described support 2 is fixed on base 1, the other end of support 2 is flexibly connected with trip bolt 8, the described upper surface pressing down insulating part 7 abuts trip bolt 8, the lower surface pressing down insulating part 7 has blind hole, block rubber 71 is provided with in blind hole, block rubber 71 abuts insulcrete, the diameter of insulcrete and the equal diameters of blind hole, upper current-carrying plate 5 is abutted successively below described insulcrete 6, tested quartz wafer 4, lower conducting plate 3 and base, also comprise voltage table, two electrode contacts of quartz wafer are connected on current-carrying plate and lower conducting plate.Also comprise insulation half ring 9, half ring that insulate is arranged on lower conducting plate, and upper current-carrying plate 5 and tested quartz wafer 4 are positioned at the inner concave of insulation half ring.
The utility model traditional insulation lump is replaced with there is blind hole press down insulating part 7, block rubber is set in blind hole simultaneously, insulcrete is made to free in and out blind hole, when pressing down insulating part and pressing down, insulcrete to enter in blind hole and extrudes block rubber, when block rubber reaches limit of elasticity, can press down by inoperation trip bolt, crystal can be avoided in this process stressed excessive, and cause breakage.Simultaneously, the utility model adopts insulation half ring 9 as centering piece, before operation, the periphery of isodiametric upper current-carrying plate and tested quartz wafer is abutted against in the inner concave of insulation half ring, can easily upper current-carrying plate and tested quartz wafer be alignd on the same axis.
Support 2 is in inverted " L " shape, and its lower end is fixed on base 1, and can be integral structure or welding between base 1 or is flexibly connected.The upper end of support 2 is flexibly connected with trip bolt 8; Concrete, the upper end of support 2 is provided with screw, and trip bolt 8 is arranged in screw.When detecting wafer, the upper surface pressing down insulating part 7 abuts the lower surface of trip bolt 8, and the lower surface pressing down insulating part 7 abuts insulcrete 6.Press down insulating part 7 and mainly play insulating effect, prevent from causing interference to the measurement of bottom wafer; Also need that there is certain degree of hardness, and volume is large a little, mainly for making bottom wafer uniform force, if do not have certain degree of hardness, when entirety being screwed by trip bolt 8, can cause pressing down insulating part 7 and being out of shape, thus making wafer unbalance stress, impact test simultaneously.Upper current-carrying plate 5, tested quartz wafer 4, lower conducting plate 3 and base 1 is abutted successively below insulcrete 6.Two electrode contacts of voltage table are connected on current-carrying plate and lower conducting plate.The effect of insulcrete 6 is insulated exactly, and the electric charge produced due to tested quartz wafer is less, and therefore it must adopt the good material of insulation effect to make, as the insulcrete that optional teflon material is made.Upper current-carrying plate 5, tested quartz wafer 4, lower conducting plate 3 and voltage table form measurement main body jointly, under shearing force effect, polarization is produced by tested quartz wafer 4, thus voltage signal is passed to voltage table by upper current-carrying plate 5, lower conducting plate 3, just can measure wafer by voltage table and be called for short shearing sheet polarity in the polarity being subject to producing under shearing force effect).Sensitiveer in order to measure, upper current-carrying plate 5, lower conducting plate 3 can adopt copper coin, also can adopt electric conductivity other sheet metals preferably.
In order to make tested quartz wafer 4 uniform force, the lower surface of upper current-carrying plate 5 overlaps with the upper surface of tested wafer 4.As when tested quartz wafer 4 is patty, upper current-carrying plate 5 is also patty, and both diameters are the same.Lower conducting plate 3 both played electric action, and also play a supportive role, therefore its upper surface area is more preferably greater than the lower surface area of tested quartz wafer 4 simultaneously.
During measurement, between the lower conducting plate 3 tested quartz wafer 4 being placed on upper current-carrying plate 5 (as position in Fig. 1), trip bolt 8 is screwed, draw lead-in wire in the side of upper current-carrying plate 5 and lower conducting plate 3, then give upper current-carrying plate 5 one shearing forces (horizontal direction thrust) from the side, due to the interaction of power, tested quartz wafer 4 also can form shearing force, thus tested wafer 4 surface produces electric charge, the lead-in wire on upper current-carrying plate 5 and lower conducting plate 3 exports, and namely voltage table measures polarity.
Above-described embodiment; the purpose of this utility model, technical scheme and beneficial effect are further described; be understood that; the foregoing is only embodiment of the present utility model; and be not used in restriction protection domain of the present utility model; all within spirit of the present utility model and principle, any amendment made, equivalent replacement, improvement etc., all should be included within protection domain of the present utility model.
Claims (5)
1. centering type measures the device of quartz crystal slice polarity, it is characterized in that, this device comprises base (1), support (2), trip bolt (8), press down insulating part (7), insulcrete (6), upper current-carrying plate (5), lower conducting plate (3), one end of described support (2) is fixed on base (1), the other end of support (2) is flexibly connected with trip bolt (8), the described upper surface pressing down insulating part (7) abuts trip bolt (8), the lower surface pressing down insulating part (7) has blind hole, block rubber (71) is provided with in blind hole, block rubber (71) abuts insulcrete, the diameter of insulcrete and the equal diameters of blind hole, described insulcrete (6) below abuts upper current-carrying plate (5) successively, tested quartz wafer (4), lower conducting plate (3) and base, also comprise voltage table, two electrode contacts of quartz wafer are connected on current-carrying plate and lower conducting plate, also comprise insulation half ring (9), half ring that insulate is arranged on lower conducting plate, and upper current-carrying plate (5) and tested quartz wafer (4) are positioned at the inner concave of insulation half ring.
2. centering type according to claim 1 measures the device of quartz crystal slice polarity, and it is characterized in that, the described insulating part (7) that presses down is plexiglass block.
3. centering type according to claim 1 measures the device of quartz crystal slice polarity, and it is characterized in that, insulcrete is the insulcrete that teflon material is made.
4. centering type according to claim 1 measures the device of quartz crystal slice polarity, and it is characterized in that, described upper current-carrying plate and lower conducting plate are copper coin.
5. centering type according to claim 1 measures the device of quartz crystal slice polarity, and it is characterized in that, the lower surface of described upper current-carrying plate overlaps with the upper surface of tested wafer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201521095691.4U CN205229359U (en) | 2015-12-25 | 2015-12-25 | Device of quartz crystal piece polarity is measured chinese style |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201521095691.4U CN205229359U (en) | 2015-12-25 | 2015-12-25 | Device of quartz crystal piece polarity is measured chinese style |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN205229359U true CN205229359U (en) | 2016-05-11 |
Family
ID=55904416
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201521095691.4U Expired - Fee Related CN205229359U (en) | 2015-12-25 | 2015-12-25 | Device of quartz crystal piece polarity is measured chinese style |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN205229359U (en) |
-
2015
- 2015-12-25 CN CN201521095691.4U patent/CN205229359U/en not_active Expired - Fee Related
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20160511 Termination date: 20181225 |