CN205353261U - Measure device of quartz crystal piece polarity - Google Patents
Measure device of quartz crystal piece polarity Download PDFInfo
- Publication number
- CN205353261U CN205353261U CN201521095865.7U CN201521095865U CN205353261U CN 205353261 U CN205353261 U CN 205353261U CN 201521095865 U CN201521095865 U CN 201521095865U CN 205353261 U CN205353261 U CN 205353261U
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- China
- Prior art keywords
- insulation board
- conducting plate
- insulating part
- blind hole
- current conducting
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
The utility model discloses a measure device of quartz crystal piece polarity, the device include base, support, fastening screw, push down the insulating part, the insulation board, go up current conducting plate, current conducting plate down, the one end of support is fixed on the base, the other end and the fastening screw swing joint of support, the up end butt fastening screw who pushes down the insulating part, the lower terminal surface that pushes down the insulating part is opened has the blind hole, is provided with the block rubber in the blind hole, block rubber butt insulation board, the diameter of insulation board equal with the diameter of blind hole, insulation board below in proper order on butt current conducting plate, is surveyed quartzy wafer, current conducting plate and base down, still include the voltmeter, two electrode contacts of quartzy wafer are connected at last current conducting plate under and on the current conducting plate respectively. Can effectually prevent the disappearance owing to the experience in market operation, it is too big and damaged to make crystallization body atress.
Description
Technical field
This utility model relates to polarity measurement device, is specifically related to measure the device of quartz crystal slice polarity.
Background technology
When crystal in some direction by the effect of external force time, inside just produces polarization, produces equivalent opposite charge on certain two surface simultaneously；After external force removes, crystal returns to again uncharged state；When External Force Acting direction changes, the polarity of electric charge also changes therewith；Produced by crystal stress, the quantity of electric charge is directly proportional to the size of external force.When quartz wafer is when the effect being subject to shearing force, also polarization can be produced, but quartz wafer is when the effect being subject to shearing force, its polarity is how on earth, and this requires over instrument and could measure and obtain, and traditional measurement is sheared sheet polarity and adopted insulation lump and insulation board top piezocrystal body, therefore, the skill requirement of tester is significantly high, otherwise when pressure is excessive, the breakage of crystal can be caused.
Utility model content
Technical problem to be solved in the utility model is to prevent crystal damaged at pressurized, it is therefore intended that provide the device measuring quartz crystal slice polarity.
Of the present utility model it is achieved through the following technical solutions:
Measure the device of quartz crystal slice polarity, this device includes base, support, trip bolt, under press insulating part, insulation board, upper conductive plate, lower conducting plate, one end of described support is fixed on base, the other end of support is flexibly connected with trip bolt, the described upper surface pressing down insulating part abuts trip bolt, the lower surface pressing down insulating part has blind hole, block rubber it is provided with in blind hole, block rubber abuts insulation board, the diameter of insulation board and the equal diameters of blind hole, upper conductive plate is abutted successively below described insulation board, tested quartz wafer, lower conducting plate and base, also include voltmeter, two electrode contacts of quartz wafer are connected on conductive plate and lower conducting plate.
Traditional insulation lump is replaced with the pressure insulating part down with blind hole by this utility model, block rubber is set in blind hole simultaneously, make insulation board can free in and out blind hole, under press under insulating part pressure time, insulation board enters in blind hole and extrudes block rubber, when block rubber reaches elastic limit, can not operate under trip bolt and press, this process can be avoided crystal stress excessive, and cause breakage.
Described pressure insulating part down is plexiglass block.
Insulation board is the insulation board that politef material is made.
Described upper conductive plate and lower conducting plate are copper coin.
The lower surface of described upper conductive plate overlaps with the upper surface of tested wafer.
This utility model compared with prior art, has such advantages as and beneficial effect: 1, this apparatus structure is simple, practical, and does not commercially have same device to sell；2, being particularly well-suited to small lot measure, measurement accuracy is high, can effectively prevent the disappearance due to operating experience, cause crystal stress excessive and damaged.
Accompanying drawing explanation
Accompanying drawing described herein is used for providing being further appreciated by this utility model embodiment, constitutes the part of the application, is not intended that the restriction to this utility model embodiment.In the accompanying drawings:
Fig. 1 is this utility model structural representation.
Labelling and corresponding parts title in accompanying drawing:
1, base；2, support；3, lower conducting plate；4, tested quartz wafer；5, upper conductive plate；6, insulation board；7, insulating part is pressed down；8, trip bolt；71, block rubber.
Detailed description of the invention
For making the purpose of this utility model, technical scheme and advantage clearly understand, below in conjunction with embodiment and accompanying drawing, the utility model is described in further detail, exemplary embodiment of the present utility model and explanation thereof are only used for explaining this utility model, are not intended as restriction of the present utility model.
Embodiment
As shown in Figure 1, this utility model measures the device of quartz crystal slice polarity, measure the device of quartz crystal slice polarity, this device includes base 1, support 2, trip bolt 8, lower pressure insulating part 7, insulation board 6, upper conductive plate 5, lower conducting plate 3, one end of described support 2 is fixed on base 1, the other end of support 2 is flexibly connected with trip bolt 8, the described upper surface pressing down insulating part 7 abuts trip bolt 8, the lower surface of lower pressure insulating part 7 has blind hole, block rubber 71 it is provided with in blind hole, block rubber 71 abuts insulation board, the diameter of insulation board and the equal diameters of blind hole, upper conductive plate 5 is abutted successively below described insulation board 6, tested quartz wafer 4, lower conducting plate 3 and base, also include voltmeter, two electrode contacts of quartz wafer are connected on conductive plate and lower conducting plate.
Traditional insulation lump is replaced with the pressure insulating part 7 down with blind hole by this utility model, block rubber is set in blind hole simultaneously, make insulation board can free in and out blind hole, under press under insulating part pressure time, insulation board enters in blind hole and extrudes block rubber, when block rubber reaches elastic limit, can not operate under trip bolt and press, this process can be avoided crystal stress excessive, and cause breakage.
Support 2 is in inverted " L " shape, and its lower end is fixed on base 1, and can be integral type structure or welding between base 1 or be flexibly connected.The upper end of support 2 is flexibly connected with trip bolt 8；Concrete, the upper end of support 2 is provided with screw, and trip bolt 8 is arranged in screw.When wafer is detected, the upper surface of lower pressure insulating part 7 abuts the lower surface of trip bolt 8, and the lower surface of lower pressure insulating part 7 abuts insulation board 6.Lower pressure insulating part 7 acts primarily as insulating effect, it is prevented that the measurement of bottom wafer is interfered；Also need to have certain degree of hardness simultaneously, and volume is slightly larger, mainly for making bottom wafer uniform force, without certain degree of hardness, when screwing entirely through trip bolt 8, can cause that pressure insulating part 7 deforms down, so that wafer unbalance stress, impact test.Upper conductive plate 5, tested quartz wafer 4, lower conducting plate 3 and base 1 is abutted successively below insulation board 6.Two electrode contacts of voltmeter are connected on conductive plate and lower conducting plate.The effect of insulation board 6 is insulated exactly, and the electric charge produced due to tested quartz wafer is less, and therefore it must adopt the good material of insulation effect to make, such as the insulation board that optional politef material is made.Upper conductive plate 5, tested quartz wafer 4, lower conducting plate 3 and voltmeter collectively constitute measurement main body, under shear action, polarization is produced by tested quartz wafer 4, thus voltage signal is passed to voltmeter by upper conductive plate 5, lower conducting plate 3, just can be measured the polarity abbreviation shearing sheet polarity that wafer produces under being subject to shear action by voltmeter).Sensitiveer in order to measure, upper conductive plate 5, lower conducting plate 3 can adopt copper coin, it is possible to adopt electric conductivity other metallic plates preferably.
In order to make tested quartz wafer 4 uniform force, the lower surface of upper conductive plate 5 overlaps with the upper surface of tested wafer 4.As when tested quartz wafer 4 is patty, upper conductive plate 5 is also patty, and both diameters are the same.Lower conducting plate 3 had both played electric action, also played a supportive role simultaneously, and therefore its upper surface area is more preferably greater than the lower surface area of tested quartz wafer 4.
During measurement, tested quartz wafer 4 is placed between the lower conducting plate 3 of upper conductive plate 5 (in Fig. 1 position), trip bolt 8 is screwed, draw lead-in wire in the side of upper conductive plate 5 and lower conducting plate 3, then give 5 one shearing forces of upper conductive plate (horizontal direction thrust) from the side, due to the interaction of power, tested quartz wafer 4 also can be formed shearing force, thus tested wafer 4 surface produces electric charge, the lead-in wire output on upper conductive plate 5 and lower conducting plate 3, namely voltmeter measures polarity.
Above-described detailed description of the invention; the purpose of this utility model, technical scheme and beneficial effect have been further described; it is it should be understood that; the foregoing is only detailed description of the invention of the present utility model; it is not used to limit protection domain of the present utility model; all within spirit of the present utility model and principle, any amendment of making, equivalent replacement, improvement etc., should be included within protection domain of the present utility model.
Claims (5)
1. measure the device of quartz crystal slice polarity, it is characterized in that, this device includes base (1), support (2), trip bolt (8), under press insulating part (7), insulation board (6), upper conductive plate (5), lower conducting plate (3), one end of described support (2) is fixed on base (1), the other end of support (2) is flexibly connected with trip bolt (8), the upper surface of described pressure insulating part down (7) abuts trip bolt (8), the lower surface pressing down insulating part (7) has blind hole, block rubber (71) it is provided with in blind hole, block rubber (71) abuts insulation board, the diameter of insulation board and the equal diameters of blind hole, described insulation board (6) lower section abuts upper conductive plate (5) successively, tested quartz wafer (4), lower conducting plate (3) and base, also include voltmeter, two electrode contacts of quartz wafer are connected on conductive plate and lower conducting plate.
2. the device of measurement quartz crystal slice polarity according to claim 1, it is characterised in that described pressure insulating part down (7) is plexiglass block.
3. the device of measurement quartz crystal slice polarity according to claim 1, it is characterised in that insulation board is the insulation board that politef material is made.
4. the device of measurement quartz crystal slice polarity according to claim 1, it is characterised in that described upper conductive plate and lower conducting plate are copper coin.
5. the device of measurement quartz crystal slice polarity according to claim 1, it is characterised in that the lower surface of described upper conductive plate overlaps with the upper surface of tested wafer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201521095865.7U CN205353261U (en) | 2015-12-25 | 2015-12-25 | Measure device of quartz crystal piece polarity |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201521095865.7U CN205353261U (en) | 2015-12-25 | 2015-12-25 | Measure device of quartz crystal piece polarity |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN205353261U true CN205353261U (en) | 2016-06-29 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201521095865.7U Expired - Fee Related CN205353261U (en) | 2015-12-25 | 2015-12-25 | Measure device of quartz crystal piece polarity |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN205353261U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107505257A (en) * | 2017-08-02 | 2017-12-22 | 北京石晶光电科技股份有限公司济源分公司 | A kind of quartz water chip X is to positive-negative polarity recognition detection instrument |
-
2015
- 2015-12-25 CN CN201521095865.7U patent/CN205353261U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107505257A (en) * | 2017-08-02 | 2017-12-22 | 北京石晶光电科技股份有限公司济源分公司 | A kind of quartz water chip X is to positive-negative polarity recognition detection instrument |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20160629 Termination date: 20181225 |