CN205175927U - Appearance is examined to spinneret mirror - Google Patents
Appearance is examined to spinneret mirror Download PDFInfo
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- CN205175927U CN205175927U CN201521018616.8U CN201521018616U CN205175927U CN 205175927 U CN205175927 U CN 205175927U CN 201521018616 U CN201521018616 U CN 201521018616U CN 205175927 U CN205175927 U CN 205175927U
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- spinning jet
- light source
- spinneret
- image
- mirror head
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- Spinning Methods And Devices For Manufacturing Artificial Fibers (AREA)
Abstract
The utility model provides an appearance is examined to spinneret mirror, include to be used for shooing the primary mirror head of spinneret image in order to detect the micropore state, still include: the secondary mirror head, the three -dimensional movable installation of relative spinneret, on secondary mirror head focus can drop on the spinneret in the ascending moving range in the axle side of perpendicular to spinneret, the secondary mirror head was used for taking spinneret first spinneret image under the light source under the nothing, the light source cooperates down the installation of secondary mirror head sets up in the spinneret below for thereby it can shoot to provide light source secondary mirror head the spinneret is the second spinneret image under the light source under having, second spinneret image be used for with first spinneret image is compared. The utility model discloses a twin -lens cooperation work can be used to the micropore that the detection has the spinneret of locating hole and no locating hole.
Description
Technical field
The utility model relates to spinneret plate detecting device, particularly be spinneret plate microscopic examination instrument.
Background technology
Spinning jet is the parent (mould) of synthon.Produce the raw material of synthon after the different micropore of spinning jet, just can obtain ultra-fine, bionical, different fiber precursor, the equivalent diameter of these fibers is usually between 0.1-2.0 millimeter.The yarn of the fiber product that we are usually seen, is made up of several thousand strands of such fiber precursors, for some senior bionical chemical fibre products, by per share yarn be made up of several ten thousand strands of such precursor.The direct dimensional accuracy also having fiber precursor affecting the shape except fiber precursor of the attractive in appearance of textile and comfort level.Therefore, the form and dimensional precision of the spinneret orifice (micropore) of spinning jet is required it is quite high.
Existing spinneret plate microscopic examination instrument is used for detecting spinning jet micropore state and forms micropore data, according to pilot hole on spinning jet and position, micropore hole file, determine the coordinate position of each micropore on spinneret plane on spinning jet, then, above lens moving to hole site, image is taken to spinning jet thus carries out micropore state-detection.The defect of above-mentioned spinneret plate microscopic examination instrument is, require that spinning jet must have pilot hole, spinning jet 1 as shown in Figure 1, it has pilot hole 11, the aperture of pilot hole 11 is much larger than micropore (not shown) aperture, but existing spinneret plate microscopic examination instrument then cannot locate micropore to not having the spinning jet of pilot hole, also just cannot realize the detection of micropore state.
Utility model content
Technical problem to be solved in the utility model is to provide a kind of spinneret plate microscopic examination instrument, twin-lens cooperating, can be used for the micropore detecting pilot hole and the spinning jet without pilot hole.
For solving the problem, the utility model proposes a kind of spinneret plate microscopic examination instrument, comprising taking spinning jet image to detect the main lens of micropore state, also comprising:
Secondary mirror head, the three-dimensional removable installation of relative spinning jet, can drop on spinning jet perpendicular to lens focus secondary in the moving range on the direction of principal axis of spinning jet, secondary mirror head is in order to take the first spinning jet image of spinning jet under light source under nothing;
Lower light source, described secondary mirror head is coordinated to install, be arranged on below spinning jet, in order to provide light source thus secondary mirror head is taken described spinning jet and had the second spinning jet image under lower light source, described second spinning jet image is used for and described first spinning jet image ratio pair.
According to an embodiment of the present utility model, also comprise detection control apparatus, in order to: receive described first spinning jet image and the second spinning jet image, and carry out image ratio to determining described spinning jet micro well locations and spinning jet marginal position.
According to an embodiment of the present utility model, also comprise image synthesizer, in order to: being described first spinning jet image by repeatedly taking the Images uniting of described spinning jet under gauge without light source, is described second spinning jet image by repeatedly taking described spinning jet there being the Images uniting under light source.
According to an embodiment of the present utility model, in described detection control apparatus, be preset with position, spinning jet micropore hole file, according to spinning jet micro well locations, spinning jet marginal position, position, hole fine position carried out to position, spinning jet micropore hole file.
According to an embodiment of the present utility model, also comprise three-dimensional moving device, secondary mirror head and/or spinning jet is removable is arranged on an axle of three-dimensional moving device, adjustment three-dimensional moving device can make secondary mirror head and spinning jet position corresponding.
According to an embodiment of the present utility model, described main lens and secondary mirror head removable be arranged on three-dimensional moving device perpendicular on the Z axis slide unit of spinning jet.
According to an embodiment of the present utility model, described main lens is fixedly connected with by web member with secondary mirror head.
According to an embodiment of the present utility model, also comprise main light source, the light source detected in order to provide main lens.
According to an embodiment of the present utility model, also comprise blow needle, be fixedly connected with described main lens, in order to aim at the micropore after detecting and to carry out air blowing process.
According to an embodiment of the present utility model, also comprise laser lamp, be fixedly connected with described main lens, in order to indicator hole position.
After adopting technique scheme, the utility model has following beneficial effect compared to existing technology: when detecting spinning jet, secondary mirror head moves to above spinning jet, spinning jet image is taken without in lower light source situation, take spinning jet image under opening lower light source situation, because two images exist shade distinctions, particularly micro well locations place shade distinctions is larger, thus these micro well locations can be obtained by contrast two image, main lens just can carry out state-detection according to micro well locations to these micropores.Coordinated by twin-lens and realize micropore location, detection, can be used for detecting pilot hole and the spinning jet without pilot hole.
Accompanying drawing explanation
Fig. 1 is the perspective view of existing spinning jet;
Fig. 2 is the structural representation of the spinneret plate microscopic examination instrument of the utility model one embodiment;
Fig. 3 is the structural representation of the spinneret plate microscopic examination instrument of another embodiment of the utility model.
Embodiment
For enabling above-mentioned purpose of the present utility model, feature and advantage become apparent more, are described in detail embodiment of the present utility model below in conjunction with accompanying drawing.
Set forth a lot of detail in the following description so that fully understand the utility model.But the utility model can be much different from alternate manner described here to implement, those skilled in the art can when doing similar popularization without prejudice to when the utility model intension, and therefore the utility model is by the restriction of following public concrete enforcement.
Fig. 2 illustrates a kind of spinneret plate microscopic examination instrument of the utility model embodiment, comprises main lens 21, secondary mirror head 23 and lower light source 24.Main lens 21 is in order to take spinning jet image (after micropore location) to detect micropore state, spinneret plate microscopic examination instrument of the present utility model takes the image of different brightness by secondary mirror head 23 and corresponding lower light source 24, realize micropore location on spinning jet, spinning jet micropore state is detected by main lens 21 again after location, form micropore status data, the data such as aperture, area, girth, circularity, dirt are comprised to circular hole micropore status data, to profiled holes, the micropore status data that different profiled holes is corresponding different.The mode that main lens 21 detects spinning jet micropore state can adopt the main lens micropore detection mode of spinneret plate microscopic examination instrument of the prior art, does not repeat them here.
Wherein, the secondary mirror head 23 three-dimensional removable installation of spinning jet relatively, spinning jet is fixed by spinning jet stationary installation 4, fixing on each hole 41 specifically each spinning jet being arranged in spinning jet stationary installation 4, can drop on spinning jet perpendicular to secondary mirror head 23 focal length in the moving range on the direction of principal axis of spinning jet.Referring to Fig. 3, in one embodiment, spinneret plate microscopic examination instrument also comprises three-dimensional moving device (31, 32 and 33), spinning jet three-dimensional is removable relatively to realize secondary mirror head 23, this three-dimensional moving device has X-axis slide unit 32, Y-axis slide unit 33 and Z axis slide unit 31, X-axis slide unit 32, Y-axis slide unit 33 is on spinneret plane, mounting means can be, secondary mirror head 23 is removable to be arranged on an axle of three-dimensional moving device, this axle can move relative to all the other diaxons, spinning jet is fixedly mounted in spinning jet stationary installation 4, thus moving sets camera lens 23 is to spinning jet relevant position, or, spinning jet is removable to be arranged on an axle of three-dimensional moving device, this axle is removable relative to other diaxons, thus adjustment spinning jet is to secondary mirror head 23 relevant position, or, spinning jet is removable to be arranged on an axle of three-dimensional moving device, secondary mirror head 23 is removable is arranged on three-dimensional moving device, this diaxon is removable relative to a remaining axle, thus adjust secondary mirror head 23 and spinning jet to relevant position simultaneously, in other words, the installation site of secondary mirror head 23 and spinning jet makes adjustment three-dimensional moving device can make secondary mirror head 23 and spinning jet position correspondence, concrete installation site is not as restriction.
Lower light source 24 matching pair camera lens 23 is installed, and referring to Fig. 3, lower light source 23 arranges spinning jet lower position, simultaneously corresponding to secondary mirror head 23, and follows secondary mirror head 23 and move, in order to provide light source.When lower light source 24 is not opened, secondary mirror head 23 takes the first spinning jet image of spinning jet under gauge without light source; When lower light source 24 is opened, secondary mirror head 23 takes spinning jet the second spinning jet image under light source, and the second spinning jet image is used for and the first spinning jet image ratio pair.Because the first spinning jet image is different with the brightness of the second spinning jet image, thus can be highlighted at the edge of spinning jet and micropore position after contrast, be rendered as bright spot, aperture, so bright spot position is micro well locations, and aperture position is spinning jet edge.Image ratio is to being image comparison technology in conventional images process, and detecting bright spot, aperture can be then feature detection techniques in conventional images process.
In one embodiment, referring to Fig. 2, spinneret plate microscopic examination instrument also comprises a secondary light source 30, is arranged on the lower end of secondary mirror head 23, is used for, when surround lighting is strong not, carrying out light filling.
Further, spinneret plate microscopic examination instrument also comprises detection control apparatus (not shown), and detection control apparatus can be computerized equipment.This detection control apparatus is connected with main lens 21, secondary mirror head 23, and receive the first spinning jet image and the second spinning jet image, and carry out image ratio to determining spinning jet micro well locations and spinning jet marginal position, the mode that in image alignments and image, bright spot, aperture detect is prior art, does not repeat again.
In a preferred embodiment, in order to prevent the first spinning jet image and the second spinning jet anamorphose, two images can be takes the synthesising picture repeatedly respectively, such as during gauge without light source, the starting point projected at Y-axis slide unit 33 from spinning jet gets five width pictures to end points, and synthesizes a width as the first spinning jet image, when opening lower light source 24, the starting point projected at Y-axis slide unit 33 from spinning jet gets five width pictures to end points, and synthesizes a width as the second spinning jet image.Accordingly, spinneret plate microscopic examination instrument also comprises image synthesizer (not shown), in order to, being described first spinning jet image by repeatedly taking the Images uniting of described spinning jet under gauge without light source, is described second spinning jet image by repeatedly taking described spinning jet there being the Images uniting under light source.
Preferably, position, spinning jet micropore hole file is preset with in detection control apparatus, after detection control apparatus determination spinning jet micro well locations, spinning jet marginal position, according to spinning jet micro well locations, spinning jet marginal position, position, hole fine position is carried out to position, spinning jet micropore hole file, and record.
After determining spinning jet micro well locations, main lens is started working, and carries out state-detection to spinning jet micropore, mainly by shooting image, then transfer in detection control apparatus and detect, determine micropore status data, thus determine to do process how further to micropore.
Continue referring to Fig. 3, main lens 21 and secondary mirror head 23 removable be arranged on three-dimensional moving device perpendicular on the Z axis slide unit 31 of spinning jet, main lens 21 and secondary mirror head 23 can be CCD (charge coupled cell) imageing sensors, also can be other image pickup section, the zoom lens 22 of main lens 21 is also show in Fig. 2 and Fig. 3, be arranged on below main lens 21, with main lens 21 synchronizing moving, in order to focusing, certain secondary mirror head 21 also can arrange a zoom lens to focus when needed.Main lens 21 is fixedly connected with by web member 26 with secondary mirror head 23, and web member 26 is also connected on the Z axis slide unit 31 of three-dimensional moving device by fixture 29, main lens 21 and secondary mirror head 23 synchronizing moving.In one embodiment, spinneret plate microscopic examination instrument also comprises main light source 25, and in order to the light source providing main lens 21 to detect, main light source 21 is arranged on below zoom lens 22.Main light source 25 and lower light source 24 are arranged on the position near spinning jet, can provide good light.
Further, referring to Fig. 2, spinneret plate microscopic examination instrument also comprises blow needle 27, blow needle 27 is fixedly connected with main lens 21, in Fig. 2, blow needle 27 is arranged on main light source 21 side, and blow needle 27 is in order to aim at the micropore after detecting and to carry out air blowing process, blow needle 27 can control work by detection control apparatus, needs to be plugged for non-compliant micropore.Preferably, spinneret plate microscopic examination instrument also comprises laser lamp 28, is fixedly connected with main lens 21, in order to indicator hole position.
Although the utility model with preferred embodiment openly as above; but it is not for limiting claim; any those skilled in the art are not departing from spirit and scope of the present utility model; can make possible variation and amendment, the scope that therefore protection domain of the present utility model should define with the utility model claim is as the criterion.
Claims (10)
1. a spinneret plate microscopic examination instrument, comprises taking spinning jet image to detect the main lens of micropore state, it is characterized in that, also comprise:
Secondary mirror head, the three-dimensional removable installation of relative spinning jet, can drop on spinning jet perpendicular to lens focus secondary in the moving range on the direction of principal axis of spinning jet, secondary mirror head is in order to take the first spinning jet image of spinning jet under light source under nothing;
Lower light source, described secondary mirror head is coordinated to install, be arranged on below spinning jet, in order to provide light source thus secondary mirror head is taken described spinning jet and had the second spinning jet image under lower light source, described second spinning jet image is used for and described first spinning jet image ratio pair.
2. spinneret plate microscopic examination instrument as claimed in claim 1, it is characterized in that, also comprise detection control apparatus, in order to: receive described first spinning jet image and the second spinning jet image, and carry out image ratio to determining described spinning jet micro well locations and spinning jet marginal position.
3. spinneret plate microscopic examination instrument as claimed in claim 2, it is characterized in that, also comprise image synthesizer, in order to: being described first spinning jet image by repeatedly taking the Images uniting of described spinning jet under gauge without light source, is described second spinning jet image by repeatedly taking described spinning jet there being the Images uniting under light source.
4. spinneret plate microscopic examination instrument as claimed in claim 2, is characterized in that, be preset with position, spinning jet micropore hole file in described detection control apparatus, carry out position, hole fine position according to spinning jet micro well locations, spinning jet marginal position to position, spinning jet micropore hole file.
5. spinneret plate microscopic examination instrument as claimed in claim 1, is characterized in that, also comprise three-dimensional moving device, secondary mirror head and/or spinning jet is removable is arranged on an axle of three-dimensional moving device, adjustment three-dimensional moving device can make secondary mirror head and spinning jet position corresponding.
6. spinneret plate microscopic examination instrument as claimed in claim 5, is characterized in that, described main lens and secondary mirror head removable be arranged on three-dimensional moving device perpendicular on the Z axis slide unit of spinning jet.
7. the spinneret plate microscopic examination instrument as described in claim 1 or 6, is characterized in that, described main lens is fixedly connected with by web member with secondary mirror head.
8. spinneret plate microscopic examination instrument as claimed in claim 1, is characterized in that, also comprise main light source, the light source detected in order to provide main lens.
9. spinneret plate microscopic examination instrument as claimed in claim 1, is characterized in that, also comprise blow needle, be fixedly connected with described main lens, in order to aim at the micropore after detecting and to carry out air blowing process.
10. spinneret plate microscopic examination instrument as claimed in claim 1, is characterized in that, also comprise laser lamp, be fixedly connected with described main lens, in order to indicator hole position.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201521018616.8U CN205175927U (en) | 2015-12-09 | 2015-12-09 | Appearance is examined to spinneret mirror |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201521018616.8U CN205175927U (en) | 2015-12-09 | 2015-12-09 | Appearance is examined to spinneret mirror |
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| Publication Number | Publication Date |
|---|---|
| CN205175927U true CN205175927U (en) | 2016-04-20 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201521018616.8U Active CN205175927U (en) | 2015-12-09 | 2015-12-09 | Appearance is examined to spinneret mirror |
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Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106841205A (en) * | 2016-12-13 | 2017-06-13 | 无锡南方声学工程有限公司 | A kind of non-woven fabrics spinneret plate microscopic examination instrument |
| CN107037054A (en) * | 2016-12-13 | 2017-08-11 | 无锡南方声学工程有限公司 | A kind of mirror holder walking mechanism of non-woven fabrics spinneret plate microscopic examination instrument |
| CN112129762A (en) * | 2020-09-08 | 2020-12-25 | 武汉纺织大学 | Spinneret plate defect detection method |
| CN112365442A (en) * | 2020-10-13 | 2021-02-12 | 江苏恒力化纤股份有限公司 | Image analysis-based rectangular spinneret hole residual impurity detection method |
| CN112986271A (en) * | 2019-12-02 | 2021-06-18 | 东华大学 | Detection apparatus for spinneret |
| CN112986272A (en) * | 2019-12-02 | 2021-06-18 | 东华大学 | Detection equipment and method for foreign matters in guide hole |
| CN117804386A (en) * | 2024-02-29 | 2024-04-02 | 常州喷丝板厂有限公司 | Inner hole detection equipment and method for processing wool type fiber spinneret plate |
-
2015
- 2015-12-09 CN CN201521018616.8U patent/CN205175927U/en active Active
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106841205A (en) * | 2016-12-13 | 2017-06-13 | 无锡南方声学工程有限公司 | A kind of non-woven fabrics spinneret plate microscopic examination instrument |
| CN107037054A (en) * | 2016-12-13 | 2017-08-11 | 无锡南方声学工程有限公司 | A kind of mirror holder walking mechanism of non-woven fabrics spinneret plate microscopic examination instrument |
| CN112986271A (en) * | 2019-12-02 | 2021-06-18 | 东华大学 | Detection apparatus for spinneret |
| CN112986272A (en) * | 2019-12-02 | 2021-06-18 | 东华大学 | Detection equipment and method for foreign matters in guide hole |
| CN112129762A (en) * | 2020-09-08 | 2020-12-25 | 武汉纺织大学 | Spinneret plate defect detection method |
| CN112365442A (en) * | 2020-10-13 | 2021-02-12 | 江苏恒力化纤股份有限公司 | Image analysis-based rectangular spinneret hole residual impurity detection method |
| CN112365442B (en) * | 2020-10-13 | 2023-06-02 | 江苏恒力化纤股份有限公司 | Rectangular spinneret hole residual impurity detection method based on image analysis |
| CN117804386A (en) * | 2024-02-29 | 2024-04-02 | 常州喷丝板厂有限公司 | Inner hole detection equipment and method for processing wool type fiber spinneret plate |
| CN117804386B (en) * | 2024-02-29 | 2024-04-30 | 常州喷丝板厂有限公司 | Inner hole detection equipment and method for processing wool type fiber spinneret plate |
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