CN205081124U - Compound high -pressure semiconductor device - Google Patents
Compound high -pressure semiconductor device Download PDFInfo
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- CN205081124U CN205081124U CN201520810731.2U CN201520810731U CN205081124U CN 205081124 U CN205081124 U CN 205081124U CN 201520810731 U CN201520810731 U CN 201520810731U CN 205081124 U CN205081124 U CN 205081124U
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Abstract
The utility model provides a compound high -pressure semiconductor device, its domain include that the straight flange part is provided with the enhancement device along sharp straight flange part of arranging, and the enhancement device includes: semiconductor substrate, lie in semiconductor substrate's first high -pressure trap and second high pressure trap side by side, a field oxide lies in first high -pressure trap, first drain electrode ohmic contact distinguishes, lies in the first high -pressure trap of the first side of a field oxide, first source electrode ohmic contact district is located second high pressure trap, the first grid covers the semiconductor substrate between first source electrode ohmic contact district and the field oxide second side at least, and second high pressure trap is kept away from to a field oxide's first side, and second high pressure trap is close to to a field oxide's second side, wherein, the doping concentration of second high pressure trap is less than the doping concentration of first high -pressure trap. The utility model discloses be favorable to improving the reliability of device.
Description
Technical field
The utility model relates to semiconductor device, particularly relates to a kind of composite high pressure semiconductor device.
Background technology
BCD (Bipolar-CMOS-DMOS) technology is a kind of monolithic integration process technology.This technology can make diode (Bipolar), CMOSFET pipe (CMOS) and double-diffusion metal-oxide-semiconductor field effect transistor (DMOS) device on the same chip, therefore referred to as BCD technology.
High pressure BCD technology generally refers to the BCD technology of device withstand voltage at more than 100V, and high pressure BCD technology is widely used in the field such as AC-DC power supply, LED driving at present, and what usually require power device does not withstand voltagely reach 500V to 800V not etc.
LDMOS (lateraldoublediffusionMOS) device and LIGBT (LateralInsulatedGateBipolar) device all belong to high voltage lateral semiconductor device, the driving element generally as subsequent module in AC AC applications.Usually, all electrodes of LDMOS device and LIGBT device, all at device surface, are convenient to the partly integrated design with low-voltage circuit.
RESURF (ReduceSurfaceField) technology is a kind of technology being applied to high voltage lateral semiconductor device, and this technology can obtain well balance and optimization between withstand voltage and conducting resistance.
D.R.Disney etc. propose a kind of LDMOS device with two conductive channel in calendar year 2001, and this device architecture was otherwise known as " TripleResurf structure " afterwards.But the shortcoming of this structure is: the p type buried layer current potential floating of this structure, device P buried regions when puncturing is not exhausted, the electric field near beak becomes large, thus reduces the reliability of device.
S.H.Lee etc. proposed a kind of source finger tip chamfering prioritization scheme of TripleResurf structure in 2008, under as far as possible little loss conducting efficiency, can reduce the area of device.But the shortcoming of this structure is as follows: one is that P buried regions remains floating structure, the shortcoming of the device architecture that its shortcoming proposes as above-mentioned D.R.Disney etc., two is that source finger tip chamfering technology needs to use lightly doped additional masks plate, which increases manufacturing cost.
Utility model content
The technical problems to be solved in the utility model is to provide a kind of composite high pressure semiconductor device, is conducive to the reliability improving device.
For solving the problems of the technologies described above, the utility model provides a kind of composite high pressure semiconductor device, the domain of described composite high pressure semiconductor device comprises the straight portion of linearly arranging, described straight portion is provided with enhancement device, on the profile direction of described straight portion, described enhancement device comprises:
Semiconductor substrate;
Be positioned at the first high pressure trap and the second high pressure trap of described Semiconductor substrate side by side, described first high pressure trap and the second high pressure trap have the first doping type;
First field oxide, is positioned at described first high pressure trap;
First drain ohmic contact district, be positioned at the first high pressure trap of described first field oxide first side, described first drain ohmic contact district has the first doping type or the second doping type, and described second doping type is contrary with the first doping type;
First source electrode ohmic contact regions, is positioned at described second high pressure trap, and described first source electrode ohmic contact regions has the first doping type;
First grid, at least cover the Semiconductor substrate between described first source electrode ohmic contact regions and described first field oxide second side, first side of described first field oxide is away from described second high pressure trap, and the second side of described first field oxide is near described second high pressure trap.
According to embodiment of the present utility model, the doping content of described second high pressure trap is less than the doping content of described first high pressure trap.
According to embodiment of the present utility model, on the profile direction of described straight portion, described enhancement device also comprises: the first low pressure trap, is positioned at described second high pressure trap, described first low pressure trap has the second doping type, and described first source electrode ohmic contact regions is positioned at described first low pressure trap.
According to embodiment of the present utility model, on the profile direction of described straight portion, described enhancement device also comprises:
First buried regions of the second doping type, is positioned at described first high pressure trap;
Second buried regions of the second doping type, is positioned at the second high pressure trap below described first low pressure trap.
According to an embodiment of the present utility model, described straight portion comprises multiple straight flange current-carrying part and multiple straight flange coupling part, described straight flange current-carrying part and straight flange coupling part spaced, wherein,
In described straight flange current-carrying part, between described first buried regions and the second buried regions, there is interval;
In described straight flange coupling part, described first buried regions and the second buried regions connect.
According to an embodiment of the present utility model, also have body contact zone in described first low pressure trap, the first buried regions in described straight flange coupling part and the second buried regions are connected to earth potential by described body contact zone.
According to an embodiment of the present utility model, described first grid is only drawn by interconnection line in described straight flange coupling part, and does not draw in described straight flange current-carrying part.
According to an embodiment of the present utility model, described first buried regions and/or the second buried regions are linear varied doping structure.
According to an embodiment of the present utility model, the degree of depth of described first high pressure trap is greater than the degree of depth of described second high pressure trap.
According to an embodiment of the present utility model, the domain of described high-voltage semi-conductor device also comprises the leakage finger tip chamfered part of bending arrangement, described leakage finger tip chamfered part connects with described straight portion, and described leakage finger tip chamfered part is provided with depletion device.
According to an embodiment of the present utility model, on the profile direction of described leakage finger tip chamfered part, described depletion device comprises:
Described Semiconductor substrate;
Be positioned at third high pressure trap and the 4th high pressure trap of described Semiconductor substrate side by side, described third high pressure trap and the 4th high pressure trap have the first doping type;
Second field oxide, is positioned at described third high pressure trap;
Second drain ohmic contact district, be positioned at the third high pressure trap of described second field oxide first side, described second drain ohmic contact district has the first doping type, and the first side of described second field oxide is the side away from described 4th high pressure trap;
Second low pressure trap, is positioned at described 4th high pressure trap, and described second low pressure trap has the second doping type, and described second low pressure trap is as the grid of JFET device;
3rd low pressure trap, is positioned at described 4th high pressure trap side by side with described second low pressure trap, and described 3rd low pressure trap has the first doping type;
JFET ohmic contact regions, be positioned at described 3rd low pressure trap, described JFET ohmic contact regions is as the source electrode of described JFET device;
Wherein, the doping content of described 4th high pressure trap is less than the doping content of described third high pressure trap.
According to an embodiment of the present utility model, on the profile direction of described leakage finger tip chamfered part, described depletion device also comprises:
3rd buried regions of the second doping type, is positioned at described third high pressure trap;
4th buried regions of the second doping type, is positioned at the 4th high pressure trap below described second low pressure trap.
According to an embodiment, described enhancement device and depletion device common drain of the present utility model.
According to an embodiment of the present utility model, the degree of depth of described third high pressure trap is greater than the degree of depth of described 4th high pressure trap.
According to an embodiment of the present utility model, the domain of described high-voltage semi-conductor device also comprises the source finger tip chamfered part of bending arrangement, described source finger tip chamfered part connects with described straight portion, described source finger tip chamfered part is provided with enhancement device, on the profile direction of described source finger tip chamfered part, described enhancement device comprises:
Described Semiconductor substrate;
Be positioned at the 5th high pressure trap of described Semiconductor substrate, described 5th high pressure trap has the first doping type, and described 5th high pressure trap comprises the first area and second area that connect, and the doping content of described second area is less than the doping content of first area;
3rd field oxide, is positioned at described 5th high pressure trap;
4th low pressure trap, is positioned at described Semiconductor substrate side by side with described 5th high pressure trap;
3rd drain ohmic contact district, be positioned at the first area of the 5th high pressure trap of described first field oxide first side, described 3rd drain ohmic contact district has the first doping type or the second doping type;
Second source electrode ohmic contact regions, is positioned at described 4th low pressure trap, and described second source electrode ohmic contact regions has the first doping type;
Second grid, at least cover the Semiconductor substrate between described second source electrode ohmic contact regions and described 3rd field oxide second side, first side of described 3rd field oxide is away from described 4th low pressure trap, and the second side of described 3rd field oxide is near described 4th low pressure trap.
According to an embodiment of the present utility model, on the profile direction of described source finger tip chamfered part, described enhancement device also comprises:
5th buried regions of the second doping type, is positioned at the first area of described 5th high pressure trap;
6th buried regions of the second doping type, is positioned at the Semiconductor substrate below described 4th low pressure trap.
According to an embodiment of the present utility model, the degree of depth of described first area is greater than the degree of depth of described second area.
Compared with prior art, the utility model has the following advantages:
In the composite high pressure semiconductor device of the utility model embodiment; be arranged in the enhancement device of straight portion; the doping content being positioned at the second high pressure trap of source is less than the doping content of the first high pressure trap of drift region portion; thus effective low pressure trap floating current potential can be obtained; the integrity problem punctured or leakage current inflow Semiconductor substrate causes can be prevented; be conducive to protecting source, thus be conducive to the reliability improving whole device.
Further, in the composite high pressure semiconductor device of the utility model embodiment, be arranged in the enhancement device of straight portion, first buried regions of the first high pressure trap and the first high pressure trap that are arranged in drift region portion forms " TripleResurf " structure jointly, thus makes device have the good characteristics such as high withstand voltage, low on-resistance.In addition, the second buried regions being positioned at the second high pressure trap is positioned at below low pressure trap, increases the junction depth of low pressure trap on the one hand, thus reduces the electric field of source beak part, reduce the dead resistance of low pressure trap on the other hand, thus improve safety operation area and the reliability of device.
In addition, in the composite high pressure semiconductor device of the utility model embodiment, straight portion comprises spaced straight flange current-carrying part and straight flange coupling part, in straight flange coupling part, first buried regions and the second buried regions are interconnected (being preferably connected to earth potential), and in straight flange current-carrying part, interval is there is between first buried regions and the second buried regions, also namely the two is isolated from each other, adopt in such a way, make the first buried regions in whole device and the electrical connection of the second buried regions, thus device can enough be exhausted and can the reliability of protected birds mouth structure when puncturing.In addition, grid can only be drawn by interconnection line in straight flange coupling part, the conductive capability of interconnection line can be ensured on the one hand, the integrity problem that the phenomenons such as electromigration when reducing or avoid big current cause, the integrity problem that the delay that can reduce Dynamic Signal on the other hand brings.
Accompanying drawing explanation
Fig. 1 is the domain schematic diagram of the composite high pressure semiconductor device according to the utility model first embodiment;
Fig. 2 is the cross-sectional view of Fig. 1 along AA ' direction;
Fig. 3 A and Fig. 3 B shows the forming process of the first high pressure trap according to the composite high pressure semiconductor device of the utility model first embodiment and the second high pressure trap;
Fig. 4 is that Fig. 1 is along AA " cross-sectional view in direction;
Fig. 5 is the cross-sectional view of Fig. 1 along BB ' direction;
Fig. 6 is the cross-sectional view of Fig. 1 along CC ' direction;
Fig. 7 is the cross-sectional view of the straight flange current-carrying part of composite high pressure semiconductor device according to the utility model second embodiment;
Fig. 8 is the cross-sectional view of the straight flange current-carrying part of composite high pressure semiconductor device according to the utility model the 3rd embodiment;
Fig. 9 is the cross-sectional view of the straight flange current-carrying part of composite high pressure semiconductor device according to the utility model the 4th embodiment.
Embodiment
Below in conjunction with specific embodiments and the drawings, the utility model is described in further detail, but should not limit protection range of the present utility model with this.
First embodiment
With reference to figure 1, Fig. 1 shows the domain structure of this composite high pressure semiconductor device, comprise straight portion 101, leak finger tip chamfered part 102 and source finger tip chamfered part 103, leakage finger tip chamfered part 102, source finger tip chamfered part 103 are connected with straight portion 101 respectively.Wherein, straight portion 101 is linearly arranged; Leak finger tip chamfered part 102 and the bending arrangement of source finger tip chamfered part 103, such as, the two can have suitable chamfer shape.Wherein, straight portion 101 comprises spaced multiple straight flange current-carrying part and multiple straight flange coupling part, and the region residing for hatching AA ' is one of them straight flange current-carrying part, hatching AA " residing for region be one of them straight flange coupling part.Hatching BB ' is in source finger tip chamfered part 102, hatching CC ' and is in Lou finger tip chamfered part 103.
In addition, this domain is distributed with the drain electrode 11 of composite high pressure semiconductor device, grid 12, source electrode 13 and ground electrode 10 etc.
Be integrated with enhancement device and depletion device in this composite high pressure semiconductor device, enhancement device can be positioned at straight portion 101 and source finger tip chamfered part 103, and depletion device can be positioned at and leak finger tip chamfered part 102.
Wherein, enhancement device can be such as LDMOS device or LIGBT device, but is not limited to this; Depletion device can be JFET device but be not limited to this.Enhancement device and depletion device can common drains 11, make domain compacter, thus are conducive to reducing chip area.
It will be appreciated by those skilled in the art that in AC AC applications, the work of drive circuit needs a start-up circuit usually.In this start-up circuit, traditional start-up circuit directly to be connected a large resistance from rectification bridge output end, and rectifier bridge is charged to shunt capacitance, until start-up circuit is started working by this large resistance.The shortcoming of this mode is: after drive circuit normally works, and starting resistance still will waste certain power consumption, and needs increase resistive element in peripheral scheme, the cost of the complete machine of increase.Adopt the composite high pressure semiconductor device of the present embodiment, enhancement device can as driving element, and depletion device as the high voltage startup device in start-up circuit, can be conducive to simplifying circuit, reduce costs.
The cross-section structure of straight flange current-carrying part along AA ' is shown with reference to figure 2, Fig. 2.As a nonrestrictive example, enhancement device integrated is herein the LDMOS device of N-type, and this LDMOS device comprises: the Semiconductor substrate 1 of P type doping; The high pressure trap 2A of N-type doping and high pressure trap 2B, be positioned at Semiconductor substrate 1 side by side, preferably, the border of high pressure trap 2A and high pressure trap 2B connects; The low pressure trap 3 of P type doping, is positioned at high pressure trap 2B; Field oxide 6, is positioned at high pressure trap 2A; The drain ohmic contact district 8B of N-type doping, be positioned at the high pressure trap 2A of field oxide 6 first side, the first side of field oxide 6 is the side away from high pressure trap 2B; The body contact zone 9A of N-type impure source ohmic contact regions 8A and the doping of P type, is positioned at low pressure trap 3; Grid 7, at least cover the Semiconductor substrate 1 between source electrode ohmic contact regions 8A and field oxide 6 second side, the second side of field oxide 6 is near high pressure trap 2B; Interconnection line 10, is electrically connected with drain ohmic contact district 8B and source electrode ohmic contact regions 8A respectively.Buried regions 5A and the buried regions 5B of the doping of P type can be formed respectively in high pressure trap 2A and high pressure trap 2B.Wherein, buried regions 5B is positioned at the below of low pressure trap 3, more preferably, buried regions 5B can with the bottom connection of low pressure trap 3.
In addition, with high pressure trap 2A, 2B side by side, be also formed in Semiconductor substrate another P type doping low pressure trap 3 ', be formed with earth potential contact zone 9B in this low pressure trap 3 '.
Buried regions 5A in high pressure trap 2A and high pressure trap 2A form " TripleResurf " structure, thus make device can obtain the good characteristics such as high withstand voltage, low on-resistance; The buried regions 5B being arranged in high pressure trap 2B is positioned at below low pressure trap 3, can increase the junction depth of low pressure trap 3 on the one hand thus the electric field of reduction source beak part, can reduce the dead resistance of low pressure trap 3 on the other hand, thus improve safety operation area and the reliability of device
More specifically, the gate electrode that grid 7 can comprise gate dielectric layer and be positioned on gate dielectric layer, wherein, the material of gate dielectric layer can be silica, and the material of gate electrode can be polysilicon.Grid 7 can extend to the part covering field oxide 6, forms gate field plate structures.The material of interconnection line 10 can be aluminium or other conductive metallic materials.A part for interconnection line 10 also can extend to the part covering field oxide 6, as Metal field plate, with optimised devices surface field, improves device withstand voltage.
The doping content of high pressure trap 2B is less than the doping content of high pressure trap 2A.More preferably, the degree of depth of high pressure trap 2B is less than the degree of depth of high pressure trap 2A.Adopt such structure, the floating current potential of effective low pressure trap 3 can be obtained, prevent from puncturing or Leakage Current flows into the integrity problem of the whole device that Semiconductor substrate causes.
High pressure trap 2A and high pressure trap 2B can adopt the mode of linear varying doping to be formed.With reference to figure 3A and Fig. 3 B, when carrying out ion implantation, mask 300 (can be such as graphical after photoresist) is larger single window in the region of high pressure trap 2A, in the region of high pressure trap 2B, then there is multiple less window, less window has width w and spacing d, and width w and spacing d is adjustable.Adopt in such a way, effective dose in high pressure trap 2B region is less than the effective dose in high pressure trap 2A region, after injection knot is completed, the doping content of the high pressure trap 2A of formation is greater than the doping content of high pressure trap 2B, and the degree of depth of high pressure trap 2A is also greater than the degree of depth of high pressure trap 2B.
The mode of above-mentioned linear varying doping can use single mask to adopt a step ion implantation to form high pressure trap 2A and high pressure trap 2B.It should be noted that, multiple mask and/or multistep ion implantation also can be used to form high pressure trap 2A and high pressure trap 2B.
Show straight flange coupling part along AA with reference to figure 4, Fig. 4 " cross-section structure.The cross-section structure of straight flange coupling part is substantially identical with the cross-section structure of the straight flange current-carrying part shown in Fig. 2, difference is mainly: the buried regions 5A in high pressure trap 2A connects with the buried regions 5B in high pressure trap 2B, preferably, earth potential can be connected to by body contact zone 9A; The grid 7 of source is drawn via interconnection line 10.
Wherein, buried regions 5A and buried regions 5B connects, and buried regions 5A and buried regions 5B can be made in whole device to there is electrical connection, thus can enough exhaust when making to puncture, and be conducive to the reliability of protected birds mouth structure.It should be noted that because buried regions 5A and buried regions 5B connect, the partially conductive path that high pressure trap 2A is positioned at below buried regions 5A is cut off, therefore, the straight flange coupling part in the present embodiment and straight flange current-carrying part spaced.In other words, every suitable distance (such as 100 μm ~ 300 μm), buried regions 5A and buried regions 5B connects.
The integrity problem that the phenomenons such as the grid 7 of source is drawn via interconnection line 10, can ensure the conductive capability of interconnection line 10 on the one hand, electromigration during reduction big current are brought; On the other hand, grid 7 is drawn, the integrity problem that the delay that can reduce Dynamic Signal brings every suitable distance (such as 100 μm ~ 300 μm).
Show the cross-section structure of the depletion device of Lou finger tip chamfered part with reference to figure 5, Fig. 5, as a nonrestrictive example, this depletion device is JFET device.This JFET device comprises: the Semiconductor substrate 1 of P type doping; The high pressure trap 2A of N-type doping and high pressure trap 2B, be positioned at Semiconductor substrate 1 side by side, preferably, the border of high pressure trap 2A and high pressure trap 2B connects; The low pressure trap 3 of P type doping, is positioned at high pressure trap 2B; Field oxide 6, is positioned at high pressure trap 2A; The drain ohmic contact district 8B of N-type doping, be positioned at the high pressure trap 2A of field oxide 6 first side, the first side of field oxide 6 is the side away from high pressure trap 2B; The body contact zone 9A of N-type impure source ohmic contact regions 8A and the doping of P type, is positioned at low pressure trap 3; Grid 7, at least cover the Semiconductor substrate 1 between source electrode ohmic contact regions 8A and field oxide 6 second side, the second side of field oxide 6 is near high pressure trap 2B; Interconnection line 10, is electrically connected with drain ohmic contact district 8B and source electrode ohmic contact regions 8A respectively; The low pressure trap 4 of N-type doping, is positioned at high pressure trap 2B side by side with low pressure trap 3; JFET ohmic contact regions 8C, is positioned at low pressure trap 4.Buried regions 5A and the buried regions 5B of the doping of P type can be formed respectively in high pressure trap 2A and high pressure trap 2B.Wherein, buried regions 5B is positioned at the below of low pressure trap 3, more preferably, buried regions 5B can with the bottom connection of low pressure trap 3.
In addition, with high pressure trap 2A, 2B side by side, be also formed in Semiconductor substrate another P type doping low pressure trap 3 ', be formed with earth potential contact zone 9B in this low pressure trap 3 '.
It should be noted that, in above-mentioned JFET device, source electrode ohmic contact regions 8A and body contact zone 9A is pseudo electrode contact zone.In fact, drain ohmic contact district 8B is as the drain terminal electrode contact district of JFET device, high pressure trap 2A, 2B are as the drift region of JFET device, and low pressure trap 4 and JFET ohmic contact regions are as the source ohmic contact regions of JFET device, and low pressure trap 3 and buried regions 5 are as the grid of JFET device.
In addition, the difference of structure shown in the JFET device structure of leakage finger tip chamfered part and Fig. 2 is also: because the radius of curvature of leaking finger tip chamfered part diminishes, so electric field can be concentrated to drain terminal, in order to reduce drain terminal electric field, compared to the straight flange current-carrying part shown in Fig. 2, leak the length of the JFET device drift region in finger tip chamfered part, the lateral separation between Ye Ji drain ohmic contact district 8B and low pressure trap 3 becomes larger; In addition, the length (also namely, the lateral length of the interconnection line 10 be electrically connected with drain ohmic contact district 8B) of drain electrode field plate 10 also increases distance △ X, and the ratio of distance △ X can be optimized according to the device architecture of reality.
Wherein, the doping content of high pressure trap 2B is less than the doping content of high pressure trap 2A, and the degree of depth of high pressure trap 2B also can be less than the degree of depth of high pressure trap 2A, and has buried regions 5B below low pressure trap 3, JFET device is had and larger opens electric current, and there is less cut-off current.The parameters such as the On current of this JFET device and shutoff voltage such as can be regulated by the injection mode shown in Fig. 3 A and Fig. 3 B, also be, when using the mode of linear varying doping to inject formation high pressure trap 2A and high pressure trap 2B, can be regulated by the window width w and window pitch d regulating high pressure trap 2B region.
Show the device profile structure of source finger tip chamfered part with reference to figure 6, Fig. 6, comprising: the Semiconductor substrate 1 of P type doping; The high pressure trap 2A of N-type doping, high pressure trap 2A comprises the first area 2A ' and second area 2A that connect "; Field oxide 6, is positioned at high pressure trap 2A; The low pressure trap 3 of P type doping, is positioned at Semiconductor substrate 1 side by side with high pressure trap 2A; The drain ohmic contact district 8B of N-type doping, be positioned at the first area 2A ' of the high pressure trap 2A of field oxide 6 first side, the first side of field oxide 6 is the side away from low pressure trap 3; The body contact zone 9A of N-type impure source ohmic contact regions 8A and the doping of P type, is positioned at low pressure trap 3; Grid 7, at least cover the Semiconductor substrate 1 between source electrode ohmic contact regions 8A and field oxide 6 second side, the second side of field oxide 6 is near low pressure trap 3; Interconnection line 10, is electrically connected with drain ohmic contact district 8B and source electrode ohmic contact regions 8A respectively.Be formed with the buried regions 5A of P type doping in the first area 2A ' of high pressure trap 2A, in the Semiconductor substrate 1 below low pressure trap 3, be formed with the buried regions 5B of P type doping.Preferably, buried regions 5B can with the bottom connection of low pressure trap 3.
The difference of structure shown in the device architecture of source finger tip chamfered part and Fig. 2 is also: at source finger tip chamfered part, because radius of curvature diminishes, electric field can be concentrated to source, in order to reduce source electric field, compared with straight portion, the length of device drift region, eliminates the high pressure trap 2B of source; High pressure trap in drift region is reduced into first area 2A ' to drain terminal, and the part near source is then second area 2A ".To sample such structure, the curvature effect of device at source finger tip chamfered part can be reduced on the one hand, improve device withstand voltage and reliability; On the other hand the conductive path of this part is retained, thus more effectively utilize chip area.
It should be noted that, in a first embodiment, straight flange current-carrying part as shown in Fig. 2, Fig. 4, Fig. 5, straight flange coupling part, leakage finger tip chamfered part, the high pressure trap 2A of various piece synchronously can be formed in same processing step or identical multiple processing steps, similarly, high pressure trap 2B, field oxide 6, buried regions 5, low pressure trap 3, grid 7, drain ohmic contact district 8B, source electrode ohmic contact regions 8A, body contact zone 9A also synchronously can be formed in same processing step or identical multiple processing steps.
Second embodiment
With reference to figure 7, Fig. 7 shows the cross-section structure of the composite high pressure semiconductor device straight flange current-carrying part of the second embodiment, also be that domain shown in Fig. 1 is along the cross-section structure in AA ' direction, structure shown in its structure with Fig. 2 is substantially identical, difference is only that the doping type of each doped region is contrary with Fig. 2, thus forms the LDMOS structure of P type.
Correspondingly, the structure of straight flange coupling part is also same as shown in Figure 4, is only that the doping type of each doped region is contrary.For source finger tip chamfered part and leakage finger tip chamfered part, the doping type of its each doped region can be identical with the first embodiment (see Fig. 5 with Fig. 6), also can be contrary.
3rd embodiment
With reference to figure 8, Fig. 8 shows the cross-section structure of the composite high pressure semiconductor device straight flange current-carrying part of the 3rd embodiment, also be that domain shown in Fig. 1 is along the cross-section structure in AA ' direction, structure shown in its structure with Fig. 2 is substantially identical, difference is only that the doping type of drain ohmic contact district 8B is contrary with embodiment illustrated in fig. 2, also be the doping of P type, the doping type of other doped regions is identical with embodiment illustrated in fig. 2, thus defines LIGBT device.
Correspondingly, the structure of straight flange coupling part is also same as shown in Figure 4, is only that the doping type of drain ohmic contact district 8B is contrary.For source finger tip chamfered part and leakage finger tip chamfered part, the doping type of its each doped region can be identical with the first embodiment (see Fig. 5 with Fig. 6), or get suitable doping type according to the needs of type of device.
4th embodiment
With reference to figure 8, Fig. 8 shows the cross-section structure of the composite high pressure semiconductor device straight flange current-carrying part of the 4th embodiment, also be that domain shown in Fig. 1 is along the cross-section structure in AA ' direction, structure shown in its structure with Fig. 2 is substantially identical, difference is only that buried regions 5A adopts linear varied doping structure, also namely the zones of different of buried regions 5A has different doping types, and can separate between different regions.
Correspondingly, one or more in buried regions 5A, 5B of straight flange coupling part, drain electrode finger tip chamfered part, source electrode finger tip chamfered part also can adopt similar linear varied doping structure.
It should be noted that, buried regions 5A, buried regions 5B in other multiple embodiments above-mentioned also can adopt linear varied doping structure, are not limited to the 4th embodiment.
It is to be understood that above-described embodiment is just to explanation of the present utility model; instead of to restriction of the present utility model; any utility model do not exceeded in the utility model spirit is created; include but not limited to the replacement of the change to local structure, the type to components and parts or model; and the replacement of other unsubstantialities or amendment, all fall within the utility model protection range.
Claims (17)
1. a composite high pressure semiconductor device, it is characterized in that, the domain of described composite high pressure semiconductor device comprises the straight portion of linearly arranging, and described straight portion is provided with enhancement device, on the profile direction of described straight portion, described enhancement device comprises:
Semiconductor substrate;
Be positioned at the first high pressure trap and the second high pressure trap of described Semiconductor substrate side by side, described first high pressure trap and the second high pressure trap have the first doping type;
First field oxide, is positioned at described first high pressure trap;
First drain ohmic contact district, be positioned at the first high pressure trap of described first field oxide first side, described first drain ohmic contact district has the first doping type or the second doping type, and described second doping type is contrary with the first doping type;
First source electrode ohmic contact regions, is positioned at described second high pressure trap, and described first source electrode ohmic contact regions has the first doping type;
First grid, at least cover the Semiconductor substrate between described first source electrode ohmic contact regions and described first field oxide second side, first side of described first field oxide is away from described second high pressure trap, and the second side of described first field oxide is near described second high pressure trap.
2. composite high pressure semiconductor device according to claim 1, is characterized in that, the doping content of described second high pressure trap is less than the doping content of described first high pressure trap.
3. composite high pressure semiconductor device according to claim 1, is characterized in that, on the profile direction of described straight portion, described enhancement device also comprises:
First low pressure trap, is positioned at described second high pressure trap, and described first low pressure trap has the second doping type, and described first source electrode ohmic contact regions is positioned at described first low pressure trap.
4. composite high pressure semiconductor device according to claim 3, is characterized in that, on the profile direction of described straight portion, described enhancement device also comprises:
First buried regions of the second doping type, is positioned at described first high pressure trap;
Second buried regions of the second doping type, is positioned at the second high pressure trap below described first low pressure trap.
5. composite high pressure semiconductor device according to claim 4, is characterized in that, described straight portion comprises multiple straight flange current-carrying part and multiple straight flange coupling part, described straight flange current-carrying part and straight flange coupling part spaced, wherein,
In described straight flange current-carrying part, between described first buried regions and the second buried regions, there is interval;
In described straight flange coupling part, described first buried regions and the second buried regions connect.
6. composite high pressure semiconductor device according to claim 5, is characterized in that, also has body contact zone in described first low pressure trap, and the first buried regions in described straight flange coupling part and the second buried regions are connected to earth potential by described body contact zone.
7. composite high pressure semiconductor device according to claim 5, is characterized in that, described first grid is only drawn by interconnection line in described straight flange coupling part, and does not draw in described straight flange current-carrying part.
8. composite high pressure semiconductor device according to claim 5, is characterized in that, described first buried regions and/or the second buried regions are linear varied doping structure.
9. composite high pressure semiconductor device according to claim 1, is characterized in that, the degree of depth of described first high pressure trap is greater than the degree of depth of described second high pressure trap.
10. composite high pressure semiconductor device according to claim 1, it is characterized in that, the domain of described high-voltage semi-conductor device also comprises the leakage finger tip chamfered part of bending arrangement, described leakage finger tip chamfered part connects with described straight portion, and described leakage finger tip chamfered part is provided with depletion device.
11. composite high pressure semiconductor device according to claim 10, is characterized in that, on the profile direction of described leakage finger tip chamfered part, described depletion device comprises:
Described Semiconductor substrate;
Be positioned at third high pressure trap and the 4th high pressure trap of described Semiconductor substrate side by side, described third high pressure trap and the 4th high pressure trap have the first doping type;
Second field oxide, is positioned at described third high pressure trap;
Second drain ohmic contact district, be positioned at the third high pressure trap of described second field oxide first side, described second drain ohmic contact district has the first doping type, and the first side of described second field oxide is the side away from described 4th high pressure trap;
Second low pressure trap, is positioned at described 4th high pressure trap, and described second low pressure trap has the second doping type, and described second low pressure trap is as the grid of JFET device;
3rd low pressure trap, is positioned at described 4th high pressure trap side by side with described second low pressure trap, and described 3rd low pressure trap has the first doping type;
JFET ohmic contact regions, be positioned at described 3rd low pressure trap, described JFET ohmic contact regions is as the source electrode of described JFET device;
Wherein, the doping content of described 4th high pressure trap is less than the doping content of described third high pressure trap.
12. composite high pressure semiconductor device according to claim 11, is characterized in that, on the profile direction of described leakage finger tip chamfered part, described depletion device also comprises:
3rd buried regions of the second doping type, is positioned at described third high pressure trap;
4th buried regions of the second doping type, is positioned at the 4th high pressure trap below described second low pressure trap.
13. composite high pressure semiconductor device according to claim 10, is characterized in that, described enhancement device and depletion device common drain.
14. composite high pressure semiconductor device according to claim 11, is characterized in that, the degree of depth of described third high pressure trap is greater than the degree of depth of described 4th high pressure trap.
15. composite high pressure semiconductor device according to claim 1, it is characterized in that, the domain of described high-voltage semi-conductor device also comprises the source finger tip chamfered part of bending arrangement, described source finger tip chamfered part connects with described straight portion, described source finger tip chamfered part is provided with enhancement device, on the profile direction of described source finger tip chamfered part, described enhancement device comprises:
Described Semiconductor substrate;
Be positioned at the 5th high pressure trap of described Semiconductor substrate, described 5th high pressure trap has the first doping type, and described 5th high pressure trap comprises the first area and second area that connect, and the doping content of described second area is less than the doping content of first area;
3rd field oxide, is positioned at described 5th high pressure trap;
4th low pressure trap, is positioned at described Semiconductor substrate side by side with described 5th high pressure trap;
3rd drain ohmic contact district, be positioned at the first area of the 5th high pressure trap of described first field oxide first side, described 3rd drain ohmic contact district has the first doping type or the second doping type;
Second source electrode ohmic contact regions, is positioned at described 4th low pressure trap, and described second source electrode ohmic contact regions has the first doping type;
Second grid, at least cover the Semiconductor substrate between described second source electrode ohmic contact regions and described 3rd field oxide second side, first side of described 3rd field oxide is away from described 4th low pressure trap, and the second side of described 3rd field oxide is near described 4th low pressure trap.
16. composite high pressure semiconductor device according to claim 15, is characterized in that, on the profile direction of described source finger tip chamfered part, described enhancement device also comprises:
5th buried regions of the second doping type, is positioned at the first area of described 5th high pressure trap;
6th buried regions of the second doping type, is positioned at the Semiconductor substrate below described 4th low pressure trap.
17. composite high pressure semiconductor device according to claim 15, is characterized in that, the degree of depth of described first area is greater than the degree of depth of described second area.
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| CN201520810731.2U CN205081124U (en) | 2015-10-19 | 2015-10-19 | Compound high -pressure semiconductor device |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105185834A (en) * | 2015-10-19 | 2015-12-23 | 杭州士兰微电子股份有限公司 | Composite high voltage semiconductor device |
| CN110571271A (en) * | 2018-06-05 | 2019-12-13 | 世界先进积体电路股份有限公司 | Semiconductor device and method for manufacturing the same |
| TWI686872B (en) * | 2018-05-23 | 2020-03-01 | 世界先進積體電路股份有限公司 | Semiconductor device and method of manufacturing the same |
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2015
- 2015-10-19 CN CN201520810731.2U patent/CN205081124U/en active Active
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105185834A (en) * | 2015-10-19 | 2015-12-23 | 杭州士兰微电子股份有限公司 | Composite high voltage semiconductor device |
| CN105185834B (en) * | 2015-10-19 | 2018-01-26 | 杭州士兰微电子股份有限公司 | Composite high pressure semiconductor devices |
| TWI686872B (en) * | 2018-05-23 | 2020-03-01 | 世界先進積體電路股份有限公司 | Semiconductor device and method of manufacturing the same |
| CN110571271A (en) * | 2018-06-05 | 2019-12-13 | 世界先进积体电路股份有限公司 | Semiconductor device and method for manufacturing the same |
| CN110571271B (en) * | 2018-06-05 | 2023-08-18 | 世界先进积体电路股份有限公司 | Semiconductor device and method for manufacturing the same |
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