CN205067638U - Guide electronic component test system of foot - Google Patents
Guide electronic component test system of foot Download PDFInfo
- Publication number
- CN205067638U CN205067638U CN201520856192.6U CN201520856192U CN205067638U CN 205067638 U CN205067638 U CN 205067638U CN 201520856192 U CN201520856192 U CN 201520856192U CN 205067638 U CN205067638 U CN 205067638U
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- cylinder
- track
- electronic component
- fixedly connected
- testing
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- 238000012360 testing method Methods 0.000 title claims abstract description 116
- 239000000523 sample Substances 0.000 claims abstract description 36
- 239000000463 material Substances 0.000 claims description 29
- 230000005540 biological transmission Effects 0.000 claims description 8
- 238000007599 discharging Methods 0.000 claims description 8
- 238000004519 manufacturing process Methods 0.000 abstract description 7
- 230000008520 organization Effects 0.000 abstract 2
- 238000010586 diagram Methods 0.000 description 3
- 238000004140 cleaning Methods 0.000 description 2
- 239000000428 dust Substances 0.000 description 2
- 238000007373 indentation Methods 0.000 description 2
- 239000002699 waste material Substances 0.000 description 2
- FGRBYDKOBBBPOI-UHFFFAOYSA-N 10,10-dioxo-2-[4-(N-phenylanilino)phenyl]thioxanthen-9-one Chemical compound O=C1c2ccccc2S(=O)(=O)c2ccc(cc12)-c1ccc(cc1)N(c1ccccc1)c1ccccc1 FGRBYDKOBBBPOI-UHFFFAOYSA-N 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000000977 initiatory effect Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000000452 restraining effect Effects 0.000 description 1
- 239000011435 rock Substances 0.000 description 1
Abstract
The utility model discloses a guide electronic component test system of foot, including frame, track, drive mechanism and 2 at least accredited testing organization, track fixed connection is in the frame, drive mechanism locates orbital one side, drive mechanism includes driving plate, first cylinder and second cylinder, the driving plate is located the track top, the one side and the first cylinder fixed connection of driving plate, the opposite side of driving plate is equipped with 2 at least breachs, accredited testing organization includes test machine, probe group and third cylinder, the fixed connection of probe group is on the fixed plate, probe group is including 2 piece at least probes, the utility model discloses a test system is automatic to be accomplished the test and beats mark, labour saving and time saving, reduction in production cost.
Description
Technical field
The utility model relates to electronic component testing machine tool technical field, in particular to a kind of electronic components test system with pin.
Background technology
Along with social development, increasing field realizes intellectuality, and wherein the most basic be also that very part and parcel is exactly electronic component, the test that the production of electronic component is current is by manually completing, need operating personnel to use test machine to test electronic component one by one, test the test that repeatedly just can complete this electronic component, cause the production efficiency of electronic component low, hand labor intensity is large, and production cost is high.
Utility model content
For above-mentioned problems of the prior art, the utility model provides a kind of electronic components test system with pin, and this test macro completes test, time saving and energy saving, reduction production cost automatically.
For achieving the above object, the utility model provides following technical scheme:
A kind of electronic components test system with pin, comprise frame, track, gear train and at least 2 mechanism for testing, described track is fixedly connected in frame, the side of track is located at by described gear train, described gear train comprises driver plate, first cylinder and the second cylinder, described driver plate is positioned at above described track, the side of described driver plate is fixedly connected with the first cylinder, the opposite side of described driver plate is provided with at least 2 breach, the shape of described breach and the matching form of electronic component close, adjacent described breach spacing is d, described first cylinder is connected with frame by slide rail, described slide rail is parallel with driver plate, described second cylinder is vertical with the telescopic direction of the first cylinder, the expansion link of described second cylinder is fixedly connected with the first cylinder, described second cylinder is fixedly connected with frame, described mechanism for testing comprises test machine, probe groups and the 3rd cylinder, described probe groups is fixedly connected on fixed head, described probe groups comprises at least 2 probes, described 3rd cylinder is fixedly connected with described fixed head, described probe groups is connected with test machine, described 3rd cylinder is fixedly connected in described frame, described probe groups is relative with described breach, described mechanism for testing is symmetrically arranged amongst the both sides of described track, the pin of described electronic component lays respectively at the both sides of described track.
Further, described probe groups is 2 groups, and described in 2 groups, the distance of probe groups is d.
Further, described test macro also comprises marking machine, and described marking machine is fixedly connected in frame, and described marking machine is relative with described breach, and along the transmission direction of electronic component, described mechanism for testing and described marking machine are arranged in order.
Further, described track comprises material loading end and discharging end, described test macro also comprises flitch and four-cylinder, described upper flitch is obliquely installed, described upper flitch is fixedly connected with described frame, one end of described upper flitch is fixedly connected with material loading end, described driver plate is provided with material loading pawl near one end of described material loading end, the distance of described material loading pawl and adjacent gap is d, described four-cylinder is fixedly connected in frame, the expansion link of described four-cylinder is perpendicular to the pin of described track and electronic component, the expansion link of described four-cylinder is positioned at the top of described track, the expansion link of described four-cylinder stops the electronic component slided by described upper flitch, electronic component and nearest breach distance is made to be d.
Further, described material loading pawl comprises 3 cones, and 3 described cones are fixedly connected on driver plate, and 3 described cones are arranged in parallel along driver plate, and described cone is positioned at the below of described track, and the top of described cone is towards described track.
Further, described test macro also comprises the 5th cylinder, described 5th cylinder is fixedly connected with described frame, the expansion link of described 5th cylinder is perpendicular to described track, the expansion link of described 5th cylinder is parallel to the pin of electronic component, the expansion link of described 5th cylinder is relative with the head of electronic component, and described 5th cylinder is positioned at above described material loading end.
Further, described test macro also comprises the 6th cylinder, and described 6th vertical cylinder is in described track, and described 6th cylinder is between described mechanism for testing and marking machine, described track comprises autonomous block, and described autonomous block is fixedly connected with the expansion link of described 6th cylinder.
Further, described mechanism for testing is 4, the transmission direction along electronic component be arranged in order for: 2 mechanism for testing, the 6th cylinder, marking machine and 2 mechanism for testing are arranged in order.
Further, described test macro also comprises control system, and described mechanism for testing, the 6th cylinder are connected with described control system respectively with marking machine.
Further, hairbrush is provided with above the discharging end of described track.
The beneficial effects of the utility model are as follows:
1, gear train and mechanism for testing match, and complete the test of the electronic component to band pin one by one, do not need manual control test machine, save labour, reduce production cost;
2, the setting of upper flitch, four-cylinder and the 5th cylinder, achieves robotization and the ordering of material loading, without the need to manually putting to indentation, there by electronic component, time saving and energy saving;
3, the 6th cylinder matches with autonomous block, and before making substandard product arrival autonomous block, autonomous block is pulled out by the 6th cylinder, causes track to disconnect, and when underproof electronic component is transmitted mechanism's drive to autonomous block place, falls, realize automatic discharge from track;
4, marking machine is to the electronic component mark of test passes, automatically carries out, does not need manual operation;
5, according to the requirement to electronic component, 2-4 test can be set, improve the accuracy of test;
6, the hairbrush of track discharging end can clear away the dust of electronic component head, saves the operation of labor cleaning.
Accompanying drawing explanation
Fig. 1 is one-piece construction schematic diagram of the present utility model;
Fig. 2 is frame upper surface partial, detailed view of the present utility model;
Fig. 3 is gear train schematic diagram of the present utility model;
Fig. 4 is mechanism for testing schematic diagram of the present utility model;
Fig. 5 is material loading end partial, detailed view of the present utility model;
Fig. 6 is the structural representation of the 6th cylinder of the present utility model and autonomous block.
In figure: 1-frame, 2-track, 21-autonomous block, 3-gear train, 31-driver plate, 32-the first cylinder, 33-slide rail, 34-breach, 35-driver plate, 36-material loading pawl, 37-cone, 41-mechanism for testing, 42-mechanism for testing, 43-mechanism for testing, 44-mechanism for testing, 45-probe groups, 451-probe, 46-the three cylinder, 47-fixed head, 5-marking machine, 6-the six cylinder, 7-upper flitch, 71-the four-cylinder, 72-the five cylinder, 8-rewinding box, 9-electronic component, 91-electronic component, 92-electronic component, 93-pin, 11-hairbrush.
Embodiment
The technical solution of the utility model is understood better in order to make those skilled in the art; below in conjunction with accompanying drawing of the present utility model; clear, complete description is carried out to the technical solution of the utility model; based on the embodiment in the application; other roughly the same embodiment that those of ordinary skill in the art obtain under the prerequisite not making creative work, all should belong to the scope of the application's protection.
Embodiment one:
As depicted in figs. 1 and 2, a kind of electronic components test system with pin 93, comprise frame 1, track 2, gear train 3, mechanism for testing 41, mechanism for testing 42, mechanism for testing 43, mechanism for testing 44, marking machine 5, the 6th cylinder 6, upper flitch 7, rewinding box 8 and control system, track 2 is linear, be fixedly connected in frame 1, the side of track 2 is located at by gear train 3, the transmission direction along electronic component 9 be arranged in order for: 2 mechanism for testing 4, the 6th cylinder 6, marking machine 5,2 mechanism for testing 4 and the 6th cylinders 6 are arranged in order.Marking machine 5 is fixedly connected in frame 1, and marking machine 5 is relative with breach 34, and marking machine 5 is positioned at same plane, by the head mark of marking machine 5 pairs of electronic components 9 with the head of electronic component 9.Mechanism for testing 4, the 6th cylinder 6 are connected with control system respectively with marking machine 5.Be provided with hairbrush 11 above the discharging end of track 2, carry out cleaning dust to obtaining electronic component 9 after test and mark, hairbrush 11 is circular, and by motor driving, it rotates.
As shown in Figure 3, gear train 3 comprises driver plate 31, first cylinder 32 and the second cylinder, driver plate 31 is positioned at above track 2, the side of driver plate 31 is fixedly connected with the first cylinder 32, the opposite side of driver plate 31 is provided with multiple breach 34, the shape of breach 34 and the matching form of electronic component 9 close, breach is " U " shape, at least can the half of the head of electronic component 9 be contained in breach 34, and electronic component 9 can not rock along transmission direction in breach 34, adjacent breach 34 spacing is d, first cylinder 32 is connected with frame 1 by slide rail 33, slide rail 33 is parallel with driver plate 31, first cylinder 32 slides along slide rail 33, second cylinder (not shown) is vertical with the telescopic direction of the first cylinder 32, the expansion link of the second cylinder is fixedly connected with the first cylinder 32, second cylinder is fixedly connected with frame 1.First cylinder 32 and the second cylinder coordinate, and make the movement locus of driver plate 31 be rectangle.
As shown in Figure 4, mechanism for testing 41, mechanism for testing 42, mechanism for testing 43 or mechanism for testing 44 comprise test machine (not shown), probe groups 45 and the 3rd cylinder 46, probe groups 45 is fixedly connected on fixed head 47, each group probe groups 45 comprises 4 probes 451, probe 451 number that the number of probe groups 45 and each group probe groups 45 comprise is determined according to pin 93 number of electronic component 9, the present embodiment is described for the electronic component 9 of 4 pins 93, electronic component 9 is across on track 2, respectively there are 2 pins 93 both sides of track 2, mechanism for testing 41, mechanism for testing 42, respectively there are 2 probes relative with 1 pin 93 in mechanism for testing 43 or mechanism for testing 44, 3rd cylinder 46 is fixedly connected with fixed head 47, probe groups 45 is connected with test machine, 3rd cylinder 46 is fixedly connected in frame 1, mechanism for testing 41 and mechanism for testing 42 are symmetrically arranged amongst the both sides of track 2, mechanism for testing 43 and mechanism for testing 44 are symmetrically arranged amongst the both sides of track 2, when testing, electronic component 9 is transported to mechanism for testing 41 and the right position of mechanism for testing 42 by driver plate 31, the expansion link of the 3rd cylinder 46 stretches out, probe 451 is driven to offset with the pin 93 of electronic component 9, the pin 93 of electronic component 9 is tested.The probe groups 45 of mechanism for testing 41 and mechanism for testing 42 is 2 groups, and the distance of 2 groups of probe groups 45 is d, once tests and second test respectively to adjacent electronic component 9, improves the accuracy of test.The number of times of test can be selected by control system, can only once test, and also can carry out 2 tests or 3 tests.Gear train 3 and mechanism for testing match, and complete the test of the pin 93 to electronic component 9 one by one, do not need manual control test machine, save labour, reduce production cost.
As shown in Figure 5, track 2 comprises material loading end and discharging end, the initiating terminal of namely electronic component 9 transmission and clearing end, test macro also comprises four-cylinder 71 and the 5th cylinder 72, upper flitch 7 is obliquely installed, form a slope, upper flitch 7 is fixedly connected with frame 1, one end of upper flitch 7 is fixedly connected with material loading end, driver plate 31 is provided with material loading pawl 36 near one end of material loading end, the distance of material loading pawl 36 and adjacent gap 34 is d, four-cylinder 71 is fixedly connected in frame 1, the expansion link of four-cylinder 71 is perpendicular to the pin 93 of track 2 and electronic component 91, the expansion link of four-cylinder 71 is positioned at the top of track 2, the expansion link of four-cylinder 71 stretches out the electronic component 91 that rear stop is slided by upper flitch 7, make electronic component 91 and nearest breach 34 apart from being d.5th cylinder 72 is fixedly connected with frame 1, the expansion link of the 5th cylinder 72 is perpendicular to track 2, the expansion link of the 5th cylinder 72 is parallel to the pin 93 of electronic component 92, the expansion link of the 5th cylinder 72 is relative with the head of electronic component 92, pushes down the head of electronic component 92 when the expansion link of the 5th cylinder 72 stretches out from top.Material loading pawl 36 comprises 3 cones 37,3 cones 37 are fixedly connected on driver plate 35, and driver plate 35 is fixedly connected with driver plate 31, and 3 cones 37 are arranged in parallel along driver plate 35, cone 37 is positioned at the below of track 2, and the top of cone 37 is towards track 2.The setting of upper flitch 7, four-cylinder 71 and the 5th cylinder 72, achieves robotization and the ordering of material loading, without the need to manually putting to indentation, there by electronic component, time saving and energy saving.
As shown in Figure 6, test macro also comprises the 6th cylinder 6,6th cylinder 6 is perpendicular to track 2,6th cylinder 6 is between mechanism for testing 42 and marking machine 5, track 2 comprises autonomous block 21, autonomous block 21 is not connected with the track 2 of both sides, autonomous block 21 is fixedly connected with the expansion link of the 6th cylinder 6, when the expansion link of the 6th cylinder 6 stretches out, autonomous block 21 and track 2 are positioned at same straight line, and track 2 is complete, when the expansion link of the 6th cylinder 6 is retracted, autonomous block 21 is pulled out by expansion link, causes track 2 to disconnect.
As shown in Figure 5, during specific works, electronic component 9 slides to the material loading end of track 2 along upper flitch 7, under the expansion link barrier effect of four-cylinder 71, multiple electronic component 9 is arranged in order at material loading end, the expansion link of the 5th cylinder 72 stretches out pushes down electronic component 92, the expansion link of the first cylinder 32 stretches out, the material loading pawl 36 of driver plate 35 end is driven to insert between the pin 93 of electronic component 91, second cylinder promotes the first cylinder 32, thus drive whole driver plate 31 along track 2 displacement d, electronic component 91 is transported to first breach 34 position, then the expansion link of the first cylinder 32 is retracted, drive driver plate 31 and driver plate 35 away from track 2, second cylinder drives the first cylinder 32 afterwards, transmission 31 and driver plate 35 return distance d again, material loading pawl 36 is retracted into the position relative with material loading end, the expansion link of the 5th cylinder 72 is retracted, electronic component 92 is clashed into the expansion link restraining position to four-cylinder 71 by follow-up electronic component 9, repeat above-mentioned steps again, electronic component 92 is transported to the position of first breach 34.And be originally positioned at the electronic component 91 of first breach 34 position, in the process of transporting electronic component 92, along with the movement of driver plate 31 and driver plate 35 is transported to next breach 34 position.When electronic component 9 arrives the position relative with probe 451,3rd cylinder 46 of mechanism for testing drives probe 451 to offset with the pin 93 of electronic component 9, test machine is tested electronic component 9, and test result is transferred to control system, if electronic component 9 is qualified, being transported to the relative position of marking machine 5 by continuing, carrying out mark; If electronic component 9 is defective, the expansion link that control system controls the 6th cylinder 6 is retracted, drive autonomous block 21 disorbit 2, cause the disconnection of track 2, when underproof electronic component 9 is transported to gap, will fall in waste product box, the expansion link of the 6th cylinder 6 stretches out again, autonomous block 21 is pushed back to track 2 place, track 2 becomes complete.Before electronic component 9 arrives the discharging end of track 2, the head of the hairbrush 11 pairs of electronic components 9 above track 2 is cleared up, and removing surface dirt, then falls into rewinding box 8.6th cylinder 6 matches with autonomous block 21, realizes automatically getting rid of waste product.
In addition, be to be understood that, although this instructions is described according to embodiment, but not each embodiment only comprises an independently technical scheme, this narrating mode of instructions is only for clarity sake, those skilled in the art should by instructions integrally, and the technical scheme in each embodiment also through appropriately combined, can form other embodiments that it will be appreciated by those skilled in the art that.
Claims (10)
1. the electronic components test system with pin, it is characterized in that, comprise frame, track, gear train and at least 2 mechanism for testing, described track is fixedly connected in frame, the side of track is located at by described gear train, described gear train comprises driver plate, first cylinder and the second cylinder, described driver plate is positioned at above described track, the side of described driver plate is fixedly connected with the first cylinder, the opposite side of described driver plate is provided with at least 2 breach, the shape of described breach and the matching form of electronic component close, adjacent described breach spacing is d, described first cylinder is connected with frame by slide rail, described slide rail is parallel with driver plate, described second cylinder is vertical with the telescopic direction of the first cylinder, the expansion link of described second cylinder is fixedly connected with the first cylinder, described second cylinder is fixedly connected with frame, described mechanism for testing comprises test machine, probe groups and the 3rd cylinder, described probe groups is fixedly connected on fixed head, described probe groups comprises at least 2 probes, described 3rd cylinder is fixedly connected with described fixed head, described probe groups is connected with test machine, described 3rd cylinder is fixedly connected in described frame, described probe groups is relative with described breach, described mechanism for testing is symmetrically arranged amongst the both sides of described track, the pin of described electronic component lays respectively at the both sides of described track.
2. the electronic components test system of band pin according to claim 1, is characterized in that, described probe groups is 2 groups, and described in 2 groups, the distance of probe groups is d.
3. the electronic components test system of band pin according to claim 1, it is characterized in that, described test macro also comprises marking machine, described marking machine is fixedly connected in frame, described marking machine is relative with described breach, along the transmission direction of electronic component, described mechanism for testing and described marking machine are arranged in order.
4. the electronic components test system of band pin according to claim 3, it is characterized in that, described track comprises material loading end and discharging end, described test macro also comprises flitch and four-cylinder, described upper flitch is obliquely installed, described upper flitch is fixedly connected with described frame, one end of described upper flitch is fixedly connected with material loading end, described driver plate is provided with material loading pawl near one end of described material loading end, the distance of described material loading pawl and adjacent gap is d, described four-cylinder is fixedly connected in frame, the expansion link of described four-cylinder is perpendicular to the pin of described track and electronic component, the expansion link of described four-cylinder is positioned at the top of described track, the expansion link of described four-cylinder stops the electronic component slided by described upper flitch, electronic component and nearest breach distance is made to be d.
5. the electronic components test system of band pin according to claim 4, it is characterized in that, described material loading pawl comprises 3 cones, 3 described cones are fixedly connected on driver plate, 3 described cones are arranged in parallel along driver plate, described cone is positioned at the below of described track, and the top of described cone is towards described track.
6. the electronic components test system of band pin according to claim 5, it is characterized in that, described test macro also comprises the 5th cylinder, described 5th cylinder is fixedly connected with described frame, the expansion link of described 5th cylinder is perpendicular to described track, the expansion link of described 5th cylinder is parallel to the pin of electronic component, and the expansion link of described 5th cylinder is relative with the head of electronic component, and described 5th cylinder is positioned at above described material loading end.
7. the electronic components test system of band pin according to claim 6, it is characterized in that, described test macro also comprises the 6th cylinder, described 6th vertical cylinder is in described track, described 6th cylinder is between described mechanism for testing and marking machine, described track comprises autonomous block, and described autonomous block is fixedly connected with the expansion link of described 6th cylinder.
8. the electronic components test system of band pin according to claim 7, is characterized in that, described mechanism for testing is 4, the transmission direction along electronic component be arranged in order for: 2 mechanism for testing, the 6th cylinder, marking machine and 2 mechanism for testing are arranged in order.
9. the electronic components test system of band pin according to claim 8, is characterized in that, described test macro also comprises control system, and described mechanism for testing, the 6th cylinder are connected with described control system respectively with marking machine.
10., according to the electronic components test system of the arbitrary described band pin of claim 9, it is characterized in that, above the discharging end of described track, be provided with hairbrush.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520856192.6U CN205067638U (en) | 2015-10-29 | 2015-10-29 | Guide electronic component test system of foot |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520856192.6U CN205067638U (en) | 2015-10-29 | 2015-10-29 | Guide electronic component test system of foot |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN205067638U true CN205067638U (en) | 2016-03-02 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201520856192.6U Expired - Fee Related CN205067638U (en) | 2015-10-29 | 2015-10-29 | Guide electronic component test system of foot |
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| Country | Link |
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| CN (1) | CN205067638U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105242161A (en) * | 2015-10-29 | 2016-01-13 | 青岛海智半导体有限公司 | Testing system of electronic element with pins |
-
2015
- 2015-10-29 CN CN201520856192.6U patent/CN205067638U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105242161A (en) * | 2015-10-29 | 2016-01-13 | 青岛海智半导体有限公司 | Testing system of electronic element with pins |
| CN105242161B (en) * | 2015-10-29 | 2018-01-23 | 青岛海智半导体有限公司 | A kind of electronic components test system with pin |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| PE01 | Entry into force of the registration of the contract for pledge of patent right |
Denomination of utility model: Testing system of electronic element with pins Effective date of registration: 20161207 Granted publication date: 20160302 Pledgee: Qingdao high technology financing Company limited by guarantee Pledgor: QINGDAO HAIZHI SEMICONDUCTOR CO., LTD. Registration number: 2016990001086 |
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| PLDC | Enforcement, change and cancellation of contracts on pledge of patent right or utility model | ||
| PC01 | Cancellation of the registration of the contract for pledge of patent right |
Date of cancellation: 20171012 Granted publication date: 20160302 Pledgee: Qingdao high technology financing Company limited by guarantee Pledgor: QINGDAO HAIZHI SEMICONDUCTOR CO., LTD. Registration number: 2016990001086 |
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| PC01 | Cancellation of the registration of the contract for pledge of patent right | ||
| PE01 | Entry into force of the registration of the contract for pledge of patent right | ||
| PE01 | Entry into force of the registration of the contract for pledge of patent right |
Denomination of utility model: Testing system of electronic element with pins Effective date of registration: 20171031 Granted publication date: 20160302 Pledgee: Qingdao high technology financing Company limited by guarantee Pledgor: QINGDAO HAIZHI SEMICONDUCTOR CO., LTD. Registration number: 2017370010070 |
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| PC01 | Cancellation of the registration of the contract for pledge of patent right |
Date of cancellation: 20181015 Granted publication date: 20160302 Pledgee: Qingdao high technology financing Company limited by guarantee Pledgor: QINGDAO HAIZHI SEMICONDUCTOR CO., LTD. Registration number: 2017370010070 |
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| PC01 | Cancellation of the registration of the contract for pledge of patent right | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20200219 Address after: 256300 221 the Yellow River Road, Tian Zhen Street, Gaoqing County, Zibo, Shandong Patentee after: Shandong Bao Cheng Electronics Co., Ltd. Address before: 266000. 100 meters South Road, three Yang Qing Road, Jiangshan Town, Qingdao City, Shandong, Laixi Patentee before: QINGDAO HAIZHI SEMICONDUCTOR CO., LTD. |
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| TR01 | Transfer of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20160302 Termination date: 20191029 |
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| CF01 | Termination of patent right due to non-payment of annual fee |