CN205049241U - Full spectral reflectivity short -term test appearance - Google Patents
Full spectral reflectivity short -term test appearance Download PDFInfo
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- CN205049241U CN205049241U CN201520728031.9U CN201520728031U CN205049241U CN 205049241 U CN205049241 U CN 205049241U CN 201520728031 U CN201520728031 U CN 201520728031U CN 205049241 U CN205049241 U CN 205049241U
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- full spectral
- integrating sphere
- reflectivity
- spectral reflectivity
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Abstract
The utility model provides a full spectral reflectivity short -term test appearance, including computer, spectrum appearance, total mark ball, light source, the light source process the total mark ball is through get into through optic fibre after the diffuse reflection many times the spectrum appearance turns into digital information and transmits to the computer, its characterized in that: still including a pallet, adjusting station, sample platform, dead lever, it lies in the bottom to prop up the pallet, the support bench is connected with the dead lever, adjusting station connect in on the dead lever, adjusting station is last still to be connected with the total mark ball, still include on the total mark ball the sample platform. The utility model discloses technical scheme's beneficial effect is: adopt the full spectrum detection technique of CCD, the reflectivity data that can each wavelength of accurate detection correspond show the reflectivity data that every wavelength corresponds in real time. The user can self -defined measurement scheme, and automatic judgement is carried out to the upper limit, lower limit, the average reflectivity isoparametric that can set up an arbitrary wavelength, makes the quality testing convenient more and swift.
Description
Technical field
The utility model relates to technical field of analytical instruments, is specifically related to a kind of full spectral reflectivity fast detector.
Background technology
Utilizing optical radiation measuring instrument to carry out optical measurement is conventional measurement means.In prior art, the detecting device of market reflectivity instrument and principles of construction thereof, can only survey the reflectivity of 90 ° of angle modes, can only show a mean value, can not Show Color value.
And in the optical measurement of reality, for different product, need to use different angles (0 °, 45 °, 90 °, 8 ° angles) metering system; For products such as similar catoptron, reflection filter, reflection gratings, all need full spectral measurement; For the product such as similar plastics, coating, need to measure its color value.
Therefore, a kind of full spectral reflectivity fast detector is needed badly.
Summary of the invention
The purpose of this utility model is: provide a kind of full spectral reflectivity fast detector.
In order to solve the problems of the technologies described above, the utility model provides a kind of full spectral reflectivity fast detector:
Include computing machine, spectrometer, integrating sphere, light source, described light source is by described integrating sphere, described spectrometer is entered by optical fiber after multiple reflections, be converted into digital information transmission to described computing machine, it is characterized in that: also comprise trestle table, regulating platform, sample stage, fixed bar, described trestle table is positioned at bottom, described trestle table is connected with described fixed bar, described regulating platform is connected on described fixed bar, described regulating platform is also connected with described integrating sphere, described integrating sphere also comprises described sample stage.
Preferably, described integrating sphere adopts 0 °, 90 °, 8 ° angles.
Preferably, described spectrometer also has USB interface.
Preferably, correction standard white plate is also included.
Relative to prior art, the beneficial effect of technical solutions of the utility model is:
1, the full spectrum detection technique of CCD is adopted, accurately can detect reflectivity data corresponding to each wavelength, heel-tap reflex rate spectrogram (traditional employing be photomultiplier receive mode, average reflectance data can only be detected, and reflectivity spectrogram can not be gone out)
2, CIE color coordinates detects, can the color (color of traditional immeasurability product) of measurement products
3, the reflectivity data that each wavelength of display is corresponding in real time.
4, user can customize measurement scheme, can arrange the parameters such as the upper limit of any one wavelength, lower limit, average reflectance and carry out automatic decision, make quality inspection convenient and quick.
5, CIE color parameter can be calculated, the parameters such as xy, Lab, predominant wavelength, saturation degree, excitation.
Accompanying drawing explanation
Fig. 1 is the structural representation of radiation survey meter in the utility model.
In figure, 1 is computing machine, and 2 is spectroanalysis instrument, and 3 is USB interface, and 7 is fibre-optical probe, and 8 is receiver.
Embodiment
Be further described of the present utility model below in conjunction with drawings and Examples.But therefore embodiment of the present utility model is not defined in following examples.Unless stated otherwise, the utility model adopt material and job operation be the art common used material and job operation.
As Fig. 1, include computing machine 1, spectrometer 2, integrating sphere 8, light source 9, described light source is by described integrating sphere 8, described spectrometer 2 is entered by optical fiber after multiple reflections, be converted into digital information transmission to described computing machine 1, it is characterized in that: also comprise trestle table 4, regulating platform 5, sample stage 7, fixed bar 6, described trestle table 4 is positioned at bottom, described trestle table 4 is connected with described fixed bar 6, described regulating platform 5 is connected on described fixed bar 6, described regulating platform 5 is also connected with described integrating sphere 8, described integrating sphere 8 also comprises described sample stage 7.
As the improvement of specific embodiment, described integrating sphere 8 adopts 0 °, 45 °, 90 °, 8 ° angles.
As the improvement of specific embodiment, on described spectrometer, 2 also have USB interface 3.
As the improvement of specific embodiment, also include correction standard white plate.
The spectroanalysis instrument that the utility model relates to is that this instrument meets various countries' standard completely for the chemical industries such as coating, pigment, ink carry out international standard, national standard and the instrumentation developed.Principle of work: this instrument is made up of pop one's head in (or integrating sphere), detection main frame, on-gauge plate etc.Probe (or integrating sphere) adopts 0 ° of 90 ° of 8 ° of angle to irradiate with record principle, and various different measuring mode is suitable for various product and detects and various countries' standard.Important technological parameters:
1, albedo measurement scope: 0-100%
2, repeatable accuracy: 0.3%
3, wavelength coverage: 400-1000nm
4, resolution: 0.3nm
5, signal to noise ratio (S/N ratio): 400:1
6, colorimetric parameter: CIExy, Lab, RGB
7, Measuring Time: <1s
8, input power: 200V50HZ
Range of application of the present utility model is: coating, pigment, ink, plastics, reflectance ratio eyeglass isoreflectance spectrogram are measured and colour sorting.
The announcement of book and instruction according to the above description, the utility model those skilled in the art can also change above-mentioned embodiment and revise.Therefore, the utility model is not limited to embodiment disclosed and described above, also should fall in the protection domain of claim of the present utility model modifications and changes more of the present utility model.In addition, although employ some specific terms in this instructions, these terms just for convenience of description, do not form any restriction to the utility model.
Claims (4)
1. a full spectral reflectivity fast detector, include computing machine, spectrometer, integrating sphere, light source, described light source is by described integrating sphere, described spectrometer is entered by optical fiber after repeatedly diffuse reflection, be converted into digital information transmission to described computing machine, it is characterized in that: also comprise trestle table, regulating platform, sample stage, fixed bar, described trestle table is positioned at bottom, described trestle table is connected with described fixed bar, described regulating platform is connected on described fixed bar, described regulating platform is also connected with described integrating sphere, described integrating sphere also comprises described sample stage.
2. full spectral reflectivity fast detector according to claim 1, is characterized in that: described integrating sphere adopts 0 °, 90 °, 8 ° angles.
3. full spectral reflectivity fast detector according to claim 1, is characterized in that: described spectrometer also has USB interface.
4. full spectral reflectivity fast detector according to claim 1, is characterized in that: also include correction standard white plate.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201520728031.9U CN205049241U (en) | 2015-09-18 | 2015-09-18 | Full spectral reflectivity short -term test appearance |
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CN201520728031.9U CN205049241U (en) | 2015-09-18 | 2015-09-18 | Full spectral reflectivity short -term test appearance |
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CN205049241U true CN205049241U (en) | 2016-02-24 |
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CN201520728031.9U Active CN205049241U (en) | 2015-09-18 | 2015-09-18 | Full spectral reflectivity short -term test appearance |
Country Status (1)
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2015
- 2015-09-18 CN CN201520728031.9U patent/CN205049241U/en active Active
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