CN205027872U - Voltage module of electromechanical survey system of needle test flies - Google Patents

Voltage module of electromechanical survey system of needle test flies Download PDF

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Publication number
CN205027872U
CN205027872U CN201520729891.4U CN201520729891U CN205027872U CN 205027872 U CN205027872 U CN 205027872U CN 201520729891 U CN201520729891 U CN 201520729891U CN 205027872 U CN205027872 U CN 205027872U
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China
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module
voltage
circuit
electrically connected
measuring system
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CN201520729891.4U
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Chinese (zh)
Inventor
欧阳书琴
谭艳萍
王星
翟学涛
杨朝辉
高云峰
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Shenzhen Hans CNC Technology Co Ltd
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Han s Laser Technology Industry Group Co Ltd
Shenzhen Hans CNC Technology Co Ltd
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Abstract

The utility model discloses a voltage module of electromechanical survey system of needle test flies, including the FPGA module, the FPGA module still is connected with a plurality of voltage control circuit electricity, the voltage control circuit includes digital analog conversion circuit, voltage driving circuit and the voltage follower circuit of electricity connection in proper order, every the digital analog conversion circuit all is connected with FPGA module electricity. The utility model discloses a voltage module has realized flying the voltage control of each chaining pin on the needle test machine, and it is stable to have a voltage output, and the output precision is high, and software hardware is adjustable, characteristics that scalability is very good, and the especially adapted constant voltage source that flies the needle test machine of doing, the subsidiary control source that also can regard as light source module is owing to improved the precision and the stability of voltage to the resistance method measuring accuracy that flies the needle test machine has been improved.

Description

A kind of voltage module of flying probe tester electric measuring system
Technical field
The utility model relates to flying probe tester electric measuring system technical field, more particularly, and particularly a kind of voltage module of flying probe tester electric measuring system.
Background technology
Circuit board is as the important component part of modern electronic equipment, its quality directly has influence on the performance of product, and flying probe tester is the checkout equipment as wiring board, the quality of its test performance directly affects the quality of circuit board, and the electric measuring system of flying probe tester determines the Detection job of machine, the common sub-resistance method of electric measuring system and capacitance method, different according to the technique that the circuit board of test adopts, the test source needed is also different, for the requirement that adaptive testing source is different, the electric-resistivity method of general electric measuring system can adopt variable voltage source, and adjustable voltage source price general charged is all higher, and volume is larger, although precision is very high, but function is complicated, impracticable, a kind of easy expansion succinctly, software, the voltage module that hardware is adjustable, more meet its demand.
Utility model content
The purpose of this utility model is the voltage module of that provide a kind of easy expansion succinctly, that software, hardware are adjustable flying probe tester electric measuring system.
In order to achieve the above object, the technical solution adopted in the utility model is as follows:
A kind of voltage module of flying probe tester electric measuring system, comprise FPGA module, described FPGA module is also electrically connected with multiple voltage control circuit, described voltage control circuit comprises the D/A converting circuit, Voltag driving circuit and the voltage follower circuit that are electrically connected successively, and each described D/A converting circuit is all electrically connected with FPGA module.
Further, described FPGA module comprises data allocation module, data reception module, data transmission blocks and multiple communication module, described data allocation module is electrically connected with data reception module, data transmission blocks, communication module respectively, and multiple described communication module is connected one to one with multiple D/A converting circuit.
Further, described data transmission blocks and described data reception module are all electrically connected with baud rate clock module.
Further, described FPGA module is also electrically connected with key circuit, and described data allocation module is electrically connected with key circuit by button data distribution module.
Further, described FPGA module is also electrically connected with voltage display circuit, and described button data distribution module is electrically connected with voltage display circuit by numeral method module.
Further, described FPGA module is also electrically connected with external interface by level shifting circuit.
Further, multiple described D/A converting circuit is co-located in a digital-to-analog conversion assembly, and multiple described Voltag driving circuit is co-located in a voltage driven assembly, and multiple described voltage follower circuit is co-located in a voltage output precision.
Further, described FPGA module, digital-to-analog conversion assembly, voltage driven assembly, voltage output precision are connected by data integration interface each other.
Compared with prior art, the utility model has the advantage of: receive host computer order by FPGA module, and FPGA module is by the signal distinguishing of each passage, is driven the change in voltage of each passage by each signal respectively by voltage control circuit.Voltage module of the present utility model achieves the Control of Voltage of each chaining pin on flying probe tester, there is voltage stable output, output accuracy is high, hardware and software is adjustable, the extraordinary feature of extensibility, is applicable to the constant pressure source doing flying probe tester very much, and attaching also can as the control source of light source module, owing to improve the precision and stability of voltage, thus improve the electric-resistivity method measuring accuracy of flying probe tester.
Accompanying drawing explanation
Fig. 1 is the structural representation of the voltage module of flying probe tester electric measuring system of the present utility model;
Fig. 2 is the structural representation of FPGA module in the utility model.
Embodiment
For the ease of understanding the utility model, below with reference to relevant drawings, the utility model is described more fully.Preferred embodiment of the present utility model is given in accompanying drawing.But the utility model can realize in many different forms, is not limited to embodiment described herein.On the contrary, provide the object of these embodiments be make the understanding of disclosure of the present utility model more comprehensively thorough.
Unless otherwise defined, all technology used herein and scientific terminology are identical with belonging to the implication that those skilled in the art of the present utility model understand usually.The object of the term used in instructions of the present utility model herein just in order to describe specific embodiment, is not intended to be restriction the utility model.
Consult shown in Fig. 1, the voltage module of the flying probe tester electric measuring system that the utility model provides, comprise FPGA module 1, FPGA module 1 is also electrically connected with multiple voltage control circuit 2, voltage control circuit 2 comprises the D/A converting circuit 21, Voltag driving circuit 22 and the voltage follower circuit 23 that are electrically connected successively, and each D/A converting circuit 21 is all electrically connected with FPGA module 1.Receive host computer order by FPGA module 1, and FPGA module 1 is by the signal distinguishing of each passage, is driven the change in voltage of each passage by each signal respectively by voltage control circuit 2.Voltage module of the present utility model achieves the Control of Voltage of each chaining pin on flying probe tester, there is voltage stable output, output accuracy is high, hardware and software is adjustable, the extraordinary feature of extensibility, is applicable to the constant pressure source doing flying probe tester very much, and attaching also can as the control source of light source module, owing to improve the precision and stability of voltage, thus improve the electric-resistivity method measuring accuracy of flying probe tester.D/A converting circuit 21 is mainly converted into simulating signal digital signal, and Voltag driving circuit 22 is mainly used in the amplification of voltage.Voltage follower circuit 23 facilitates voltage module to be connected with other circuit.This D/A converting circuit 21 can be analog-digital chip.
Consult shown in Fig. 2, FPGA module 1 comprises data allocation module 11, data reception module 12, data transmission blocks 13 and multiple communication module 14, data allocation module 11 is electrically connected with data reception module 12, data transmission blocks 13, communication module 14 respectively, and multiple communication module 14 is connected one to one with multiple D/A converting circuit 21.FPGA module is the core circuit of voltage module, the data of data reception module 12 primary recipient serial ports, data transmission blocks 13 mainly sends data to host computer, data allocation module 11 mainly identifies the order of host computer, the order of host computer is mainly divided into the data register order of reading D/A converting circuit 21, the data register order of write D/A converting circuit 21, the order of display channel magnitude of voltage.
Concrete, the reading data register order of analog-digital chip and the form of display channel magnitude of voltage order are command code+channel number, and the form of the data register order of write analog-digital chip is command code+channel number+data.SPI digital module writes the FPGA code module of data mainly to the data register of analog-digital chip, and the FPGA code module of button data distribution module mainly key range order, how display word modules mainly shows the FPGA code module of magnitude of voltage.
Data transmission blocks 13 and data reception module 12 are all electrically connected with baud rate clock module 15.
FPGA module 1 is also electrically connected with key circuit 3, and data allocation module 11 is electrically connected with key circuit 3 by button data distribution module 16.Key circuit 3 uses for during manual fine-tuning voltage, and each voltage output channel has a button.
In a specific embodiment of the present utility model, twice is pressed fast when FPGA module 1 detects corresponding passage button, represent and forward manual adjustment mode to, and now button is often by next time, the data register data of original D/A converting circuit 21 are added 1 to be written in D/A converting circuit 21, reach the effect that voltage slowly increases, if now button 3 times fast, the data register data of original D/A converting circuit 21 are once subtracted 1 and are written in D/A converting circuit by every button below, reach the effect that voltage slowly reduces.
FPGA module 1 is also electrically connected with voltage display circuit 4, and button data distribution module 16 is electrically connected with voltage display circuit 4 by numeral method module 17.Voltage display circuit 4 is mainly used for the hardware circuit of voltage display, can show the magnitude of voltage of 0.001V.
FPGA module 1 is also electrically connected with external interface 6 by level shifting circuit 5, and external interface 6 is mainly used in docking with PC interface, and level shifting circuit 5 effect is mainly used in FPGA module 1 and PC holds level incompatibility problem.This external interface 6 can be RS232 interface.
Multiple D/A converting circuit 21 is co-located in a digital-to-analog conversion assembly 7, and multiple Voltag driving circuit 22 is co-located in a voltage driven assembly 8, and multiple voltage follower circuit 23 is co-located in a voltage output precision 9.FPGA module 1, digital-to-analog conversion assembly 7, voltage driven assembly 8, voltage output precision 9 are connected by data integration interface 10 each other.Each module in voltage control circuit 2, integration degree is high, compact conformation, produces easy to assembly.
Above-described embodiment is the utility model preferably embodiment; but embodiment of the present utility model is not restricted to the described embodiments; change, the modification done under other any does not deviate from Spirit Essence of the present utility model and principle, substitute, combine, simplify; all should be the substitute mode of equivalence, be included within protection domain of the present utility model.

Claims (8)

1. the voltage module of a flying probe tester electric measuring system, it is characterized in that: comprise FPGA module (1), described FPGA module (1) is also electrically connected with multiple voltage control circuit (2), described voltage control circuit (2) comprises the D/A converting circuit (21), Voltag driving circuit (22) and the voltage follower circuit (23) that are electrically connected successively, and each described D/A converting circuit (21) is all electrically connected with FPGA module (1).
2. the voltage module of flying probe tester electric measuring system according to claim 1, it is characterized in that: described FPGA module (1) comprises data allocation module (11), data reception module (12), data transmission blocks (13) and multiple communication module (14), described data allocation module (11) is electrically connected with data reception module (12), data transmission blocks (13), communication module (14) respectively, and multiple described communication module (14) is connected one to one with multiple D/A converting circuit (21).
3. the voltage module of flying probe tester electric measuring system according to claim 2, is characterized in that: described data transmission blocks (13) and described data reception module (12) are all electrically connected with baud rate clock module (15).
4. the voltage module of flying probe tester electric measuring system according to claim 3, it is characterized in that: described FPGA module (1) is also electrically connected with key circuit (3), described data allocation module (11) is electrically connected with key circuit (3) by button data distribution module (16).
5. the voltage module of flying probe tester electric measuring system according to claim 4, it is characterized in that: described FPGA module (1) is also electrically connected with voltage display circuit (4), described button data distribution module (16) is electrically connected with voltage display circuit (4) by numeral method module (17).
6. the voltage module of flying probe tester electric measuring system according to claim 5, is characterized in that: described FPGA module (1) is also electrically connected with external interface (6) by level shifting circuit (5).
7. the voltage module of flying probe tester electric measuring system according to claim 1, it is characterized in that: multiple described D/A converting circuit (21) is co-located in a digital-to-analog conversion assembly (7), multiple described Voltag driving circuit (22) is co-located in a voltage driven assembly (8), and multiple described voltage follower circuit (23) is co-located in a voltage output precision (9).
8. the voltage module of flying probe tester electric measuring system according to claim 7, is characterized in that: described FPGA module (1), digital-to-analog conversion assembly (7), voltage driven assembly (8), voltage output precision (9) are connected by data integration interface (10) each other.
CN201520729891.4U 2015-09-21 2015-09-21 Voltage module of electromechanical survey system of needle test flies Active CN205027872U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201520729891.4U CN205027872U (en) 2015-09-21 2015-09-21 Voltage module of electromechanical survey system of needle test flies

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201520729891.4U CN205027872U (en) 2015-09-21 2015-09-21 Voltage module of electromechanical survey system of needle test flies

Publications (1)

Publication Number Publication Date
CN205027872U true CN205027872U (en) 2016-02-10

Family

ID=55260394

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201520729891.4U Active CN205027872U (en) 2015-09-21 2015-09-21 Voltage module of electromechanical survey system of needle test flies

Country Status (1)

Country Link
CN (1) CN205027872U (en)

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Effective date of registration: 20200721

Address after: 518000 workshop 5 / F, 1 / 2 / F, 14 / F, 17 / F, antuoshan hi tech Industrial Park, Xinsha Road, Shajing street, Bao'an District, Shenzhen City, Guangdong Province

Patentee after: SHENZHEN HAN'S CNC SCIENCE AND TECHNOLOGY Co.,Ltd.

Address before: 518000, No. 9 West West Road, Nanshan District hi tech park, Shenzhen, Guangdong

Co-patentee before: SHENZHEN HAN'S CNC SCIENCE AND TECHNOLOGY Co.,Ltd.

Patentee before: HAN'S LASER TECHNOLOGY INDUSTRY GROUP Co.,Ltd.

TR01 Transfer of patent right
CP01 Change in the name or title of a patent holder

Address after: 518000 5 / F, 1 / 2 / F, 14 / F, 17 / F, No.3 Factory building, antuoshan hi tech Industrial Park, Xinsha Road, Shajing street, Bao'an District, Shenzhen City, Guangdong Province

Patentee after: Shenzhen Han's CNC Technology Co.,Ltd.

Address before: 518000 5 / F, 1 / 2 / F, 14 / F, 17 / F, No.3 Factory building, antuoshan hi tech Industrial Park, Xinsha Road, Shajing street, Bao'an District, Shenzhen City, Guangdong Province

Patentee before: SHENZHEN HAN'S CNC SCIENCE AND TECHNOLOGY Co.,Ltd.

CP01 Change in the name or title of a patent holder