CN205015414U - A general purpose system that is used for electronics testability to verify and evaluate - Google Patents
A general purpose system that is used for electronics testability to verify and evaluate Download PDFInfo
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- CN205015414U CN205015414U CN201520669178.5U CN201520669178U CN205015414U CN 205015414 U CN205015414 U CN 205015414U CN 201520669178 U CN201520669178 U CN 201520669178U CN 205015414 U CN205015414 U CN 205015414U
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Abstract
The utility model discloses a general purpose system that is used for electronics testability to verify and evaluate relates to electronic equipment's monitoring device technical field. Master control branch system is used for producing fault -signal, transmits the fault -signal who produces to fault injection branch system, condition monitoring branch system is used for the fault -signal control point according to user's settlement, gathers corresponding fault -signal information, and real -time passback divides the system for the master control, then shows, fault injection branch system is used for the control command that issues according to master control branch system, produces corresponding fault -signal, with the fault -signal that produces through the coupling input with the switching and through general adapter tested electronics on. The system provides sufficient fault mode, test resource and nimble hardware disposition, and various testabilities that can the actual electronics of accurate support are verified with the aassessment experimentally.
Description
Technical field
The utility model relates to the supervising device technical field of electronic equipment, particularly relates to a kind of general-purpose system for electronics testability demonstration and assessment.
Background technology
Testability, as a kind of design characteristics of equipment, has the position of equal importance with reliability maintainability and supportability, is the important component part of equipment universal qualities characteristic.By the design of good testability, the Combat readiness of equipment, Mission Success rate and security can be improved, reduce maintenance manpower, equipment and other Support Resources, reduce Life Cycle Cost.Can the checking of testability actual load and assessment refer to equipping the fault in kind or model machine injecting some, observe the reaction of equipment Test system, determine all kinds of faults that correctly detect and isolate injection, complete the checking to the actual testability index of equipment and assessment.This demonstration test carrys out with test figure the degree that checking equipment realizes testability designing requirement, is a very important link in equipment life cycle management process, become the important means of military field Complex electronic equipments testability ability evaluation and checking.
At present, the checking that weaponry testability is designed with validity is a difficult problem of generally acknowledging both at home and abroad, in the experiment of electronics testability actual load is implemented, also faces following insoluble problem: one is the effective technology means lacking support equipment testability validation & evaluation.Equipment Test checking needs to carry out under equipment failure state, need sufficient fault sample, but concerning new equipment, owing to being subject to the impact that direct fault location means lack, fault sample amount lacks, jeopardizes the factors such as equipment safety, many contents of the test can only rely on theory calculate or qualitative analysis to complete; Two is the Specification methods lacking support equipment testability validation & evaluation, is difficult to effectively instruct equipment Test to verify and evaluation work.
Failure Injection Technique is a kind of technology effectively for verifying the testability of equipment.Actual load direct fault location refers to according to selected fault model, and artificial simulated failure is also loaded into the inefficacy of accelerating system in specific real system, observes and Inspection and analysis the system after injecting fault meanwhile.On the one hand can the testability design level of comprehensive assessment equipment, also can find the design defect of equipping on the other hand, the testability for equipment improves and provides foundation.The principle of actual load direct fault location as shown in Figure 1.A system is made up of individual unit under test UUT, when carrying out direct fault location, according to the fault sample that testability demonstration testing program is determined, utilize fault injection system simulated failure by direct fault location to system appropriate section, to cause the fault of system, and then carry out every testability index of automatic test equipment (ATE)/built-in test equipment (BITE) of verification system.
Utility model content
Technical problem to be solved in the utility model is to provide a kind of general-purpose system for electronics testability demonstration and assessment, described system provides enough fault modes, test resource and hardware configuration flexibly, accurately can support various testability demonstration and the evaluation test of actual electronics.
For solving the problems of the technologies described above, technical solution adopted in the utility model is: a kind of general-purpose system for electronics testability demonstration and assessment, it is characterized in that comprising: master control subsystem, direct fault location subsystem and condition monitoring subsystem, described master control subsystem is connected with the LAN bus in direct fault location subsystem and the PXI bus in condition monitoring subsystem respectively by switch, described direct fault location subsystem is connected with direct fault location interface and condition monitoring interface by general-purpose interface adapter respectively with condition monitoring subsystem, direct fault location interface and condition monitoring interface are connected with the corresponding interface of tested electronic equipment.
Further technical scheme is: described master control subsystem comprises industrial control host and display.
Further technical scheme is: described direct fault location subsystem comprises digital signal fault injector, simulated fault signal injector, universal serial bus fault injector and parallel bus fault injector, described digital signal fault injector, simulated fault signal injector, universal serial bus fault injector and parallel bus fault injector are connected with LAN bus upper in described direct fault location subsystem, for receiving the control command that master control subsystem passes down, produce corresponding fault; And by the fault of generation by reaching under universal adapter in tested electronics.
Further technical scheme is: described condition monitoring subsystem comprises LAN oscillograph, PXI embedded controller, PXI digital multimeter, PXI numeral I/O module, PXI relay switch module and Signal-regulated kinase, the oscillographic input end of described LAN is connected with an interface of described switch, the oscillographic other end of LAN is connected with an interface of Signal-regulated kinase, PXI embedded controller respectively with an interface of switch, PXI bus in condition monitoring subsystem and Signal-regulated kinase connect, described PXI digital multimeter, PXI numeral I/O module, one end of PXI relay switch module is connected with the PXI bus in condition monitoring subsystem, described PXI digital multimeter, PXI numeral I/O module, the other end of PXI relay switch module is connected with the IO interface of signal conditioning circuit.
The beneficial effect adopting technique scheme to produce is: the utility model adopts hardware fault to inject, the method for monitoring in real time, automatically test and software Mathematical Statistics Analysis, and the checking designed for testability provides open test platform.This general-purpose system collection direct fault location, the functions such as analog simulation test and evaluation calculating are in one, the assessment of electronics testability and the test involved by checking are planned, test design, test prepares, test is implemented, test findings assessment overall process combines together so that the form of TT&C system is organic, solve the checking of Complex electronic equipments testability index and lack the difficult problem such as physical support means and method for normalizing, be conducive to push to test experimental work to be changed to the quantitative appraisal become more meticulous by the qualitative analysis of extensive style, accurately can support various testability demonstration and the evaluation test of actual electronics.
Accompanying drawing explanation
Fig. 1 is the ultimate principle figure of electronics testability demonstration;
Fig. 2 is the theory diagram of general-purpose system described in the utility model embodiment;
Fig. 3 is the software frame figure of general-purpose system described in the utility model embodiment;
Fig. 4 is the Principle of Synchronic Control block diagram of general-purpose system described in the utility model embodiment;
Fig. 5 is direct fault location and the monitoring theory diagram of general-purpose system described in the utility model embodiment;
Fig. 6 is the process flow diagram of method of testing described in the utility model embodiment.
Embodiment
Below in conjunction with the accompanying drawing in the utility model embodiment, be clearly and completely described the technical scheme in the utility model embodiment, obviously, described embodiment is only a part of embodiment of the present utility model, instead of whole embodiments.Based on the embodiment in the utility model, those of ordinary skill in the art are not making the every other embodiment obtained under creative work prerequisite, all belong to the scope of the utility model protection.
Set forth a lot of detail in the following description so that fully understand the utility model, but the utility model can also adopt other to be different from alternate manner described here to implement, those skilled in the art can when doing similar popularization without prejudice to when the utility model intension, and therefore the utility model is by the restriction of following public specific embodiment.
As shown in Figure 2, present embodiment discloses a kind of general-purpose system for electronics testability demonstration and assessment, comprise: master control subsystem, direct fault location subsystem and condition monitoring subsystem, described master control subsystem is connected with the LAN bus in direct fault location subsystem and the PXI bus in condition monitoring subsystem respectively by switch, described direct fault location subsystem is connected with direct fault location interface and condition monitoring interface by general-purpose interface adapter respectively with condition monitoring subsystem, direct fault location interface and condition monitoring interface are connected with the corresponding interface of tested electronic equipment, the fault-signal of generation, for generation of fault-signal, is transferred in direct fault location subsystem by described master control subsystem, described condition monitoring subsystem is used for, according to the fault-signal control point of user's setting, gathering corresponding fault-signal information, returning to master control subsystem in real time, then show, direct fault location subsystem is used for the control command that issues according to master control subsystem, produce corresponding fault-signal, is input in tested electronics by the fault-signal of generation through overcoupling and switching by universal adapter.
Master control subsystem provides master control, direct fault location, signal testing and monitoring three personal-machine interactive interface, and described master control subsystem comprises industrial control host and display.
Please refer to Fig. 2, described direct fault location subsystem comprises digital signal fault injector, simulated fault signal injector, universal serial bus fault injector and parallel bus fault injector, certainly can also comprise other various types of fault injector, those skilled in the art can select according to actual needs.Described digital signal fault injector, simulated fault signal injector, universal serial bus fault injector and parallel bus fault injector are connected with LAN bus upper in described direct fault location subsystem, for receiving the control command that master control subsystem passes down, produce corresponding fault; And by the fault of generation by reaching under universal adapter in tested electronics.Direct fault location subsystem builds based on LAN bus architecture, and all fault injectors all adopt 1U racking machine box structure, by LAN bus marco, is designed with external trigger input interface, for synchro control.
Please refer to Fig. 2, described condition monitoring subsystem comprises LAN oscillograph, PXI embedded controller, PXI digital multimeter, PXI numeral I/O module, PXI relay switch module and Signal-regulated kinase, certainly can also comprise the testing tool that other all kinds have PXI interface, those skilled in the art can select according to actual needs.The oscillographic input end of described LAN is connected with an interface of described switch, the oscillographic other end of LAN is connected with an interface of Signal-regulated kinase, PXI embedded controller respectively with an interface of switch, PXI bus in condition monitoring subsystem and Signal-regulated kinase connect, described PXI digital multimeter, PXI numeral I/O module, one end of PXI relay switch module is connected with the PXI bus in condition monitoring subsystem, described PXI digital multimeter, PXI numeral I/O module, the other end of PXI relay switch module is connected with the IO interface of signal conditioning circuit.Condition monitoring subsystem adopts PXI bus instrument module and LAN bus instrument integration realization, and all modules all adopt ripe shelf equipment.
The control of direct fault location subsystem is completed by industrial computer, and this industrial computer is also the controller of whole platform.The control of condition monitoring subsystem is completed by embedded controller, and industrial computer also can pass through LAN bus Long-distance Control condition monitoring system, when needs are tested measurand, is controlled condition monitoring system by PXI controller.
The software systems of described general-purpose system form primarily of 5 softwares that are mutually related, that is: fault mode and criticality analysis software, main control software, direct fault location software, automatic testing software, testability assessment software.Software systems adopt reconfigurable modular architecture, and user according to testability demonstration demand, can select software/functional module to mix into the software platform being applicable to network or local mode of operation, make software platform can adapt to different verification experimental verification environment.According to the mode of operation of user, the functional module of software platform is expanded or cutting, thus meet various testability demonstration mission requirements.Set up testability demonstration in the software subsystem of evaluating system framework as shown in Figure 3.
Synchro control between subsystem: for ensureing that Fault Insertion Equipment and monitoring instrument are according to the sequential automatic operation specified.In system, the equipment such as the fault injector in system, monitoring instrument are all as node access networks network, and the clock of LAN bus is as system clock.When system software runs, send instruction to each instrument by software, the clock of all appts equipment in system is unified.Meanwhile, Software for Design adopts hierarchical design means, Hierarchical Design, realize core layer and encapsulation is unified to operating system service, bottom communication agreement, data management, ensure that test and direct fault location synchro control, as shown in Figure 4.
The method of testing of above-mentioned general-purpose system is as follows:
1) master control subsystem sends control command to direct fault location subsystem by lan network, each failure mode information set user and fault-signal parameter are issued in corresponding fault injector, each fault injector controlled in direct fault location subsystem produces fault-signal, the fault-signal that fault injector produces is input in tested electronics by the road that is coupled and transfers through adapter, and an other road is input in condition monitoring subsystem;
2) condition monitoring subsystem receives the fault-signal that direct fault location subsystem produces, and according to the fault-signal control point that user sets, gather the corresponding fault-signal information of tested electronics, return to master control subsystem in real time, after the fault-signal information of the tested electronics of the condition monitoring subsystem fault-signal that condition monitoring subsystem receives by master control subsystem and collection is analyzed, above-mentioned information be presented on the display of master control subsystem in real time, the direct fault location of described general-purpose system and monitoring principle are as shown in Figure 5.
Further, please refer to Fig. 6, concrete testing procedure is as follows:
Start described general-purpose system, allow its initialization, carry out equipment self-inspection; After equipment self-inspection completes, the operation and control interface of described master control subsystem enters into model selection interface; There are two kinds of patterns to select, are respectively off-line injection way and online injection pattern; If select off-line injection way, then pass control command under master control subsystem to direct fault location subsystem, direct fault location subsystem fill order, produce fault; The fault produced sends tested electronics and condition monitoring subsystem respectively to, and condition monitoring subsystem is monitored the fault-signal produced, and whether detection failure is correctly injected in tested electronics; If inject incorrect, then continue to inject fault, until correctly; If inject correct, then perform test command, will carry out after test result analysis showing and printing;
If select online injection pattern, then master control subsystem first controls direct fault location subsystem and condition monitoring subsystem performs test command, then pass control command under master control subsystem to direct fault location subsystem, direct fault location subsystem fill order, produce fault; The fault produced sends tested electronics and condition monitoring subsystem respectively to, and condition monitoring subsystem is monitored the fault-signal produced, and whether detection failure is correctly injected in tested electronics; If inject incorrect, then continue to inject fault, until correctly; If inject correct, then continue test, will carry out after test result analysis showing and printing.
The utility model adopts hardware fault to inject, the method for monitoring in real time, automatically test and software Mathematical Statistics Analysis, and the checking designed for testability provides open test platform.This general-purpose system collection direct fault location, the functions such as analog simulation test and evaluation calculating are in one, the assessment of electronics testability and the test involved by checking are planned, test design, test prepares, test is implemented, test findings assessment overall process combines together so that the form of TT&C system is organic, solve the checking of Complex electronic equipments testability index and lack the difficult problem such as physical support means and method for normalizing, be conducive to push to test experimental work to be changed to the quantitative appraisal become more meticulous by the qualitative analysis of extensive style, accurately can support various testability demonstration and the evaluation test of actual electronics.
Claims (4)
1. the general-purpose system for electronics testability demonstration and assessment, it is characterized in that comprising: master control subsystem, direct fault location subsystem and condition monitoring subsystem, described master control subsystem is connected with the LAN bus in direct fault location subsystem and the PXI bus in condition monitoring subsystem respectively by switch, described direct fault location subsystem is connected with direct fault location interface and condition monitoring interface by general-purpose interface adapter respectively with condition monitoring subsystem, direct fault location interface and condition monitoring interface are connected with the corresponding interface of tested electronic equipment.
2., as claimed in claim 1 for the general-purpose system of electronics testability demonstration and assessment, it is characterized in that: described master control subsystem comprises industrial control host and display.
3. as claimed in claim 1 for the general-purpose system of electronics testability demonstration and assessment, it is characterized in that: described direct fault location subsystem comprises digital signal fault injector, simulated fault signal injector, universal serial bus fault injector and parallel bus fault injector, described digital signal fault injector, simulated fault signal injector, universal serial bus fault injector and parallel bus fault injector are connected with LAN bus upper in described direct fault location subsystem, for receiving the control command that master control subsystem passes down, produce corresponding fault; And by the fault of generation by reaching under universal adapter in tested electronics.
4. as claimed in claim 1 for the general-purpose system of electronics testability demonstration and assessment, it is characterized in that: described condition monitoring subsystem comprises LAN oscillograph, PXI embedded controller, PXI digital multimeter, PXI numeral I/O module, PXI relay switch module and Signal-regulated kinase, the oscillographic input end of described LAN is connected with an interface of described switch, the oscillographic other end of LAN is connected with an interface of Signal-regulated kinase, PXI embedded controller respectively with an interface of switch, PXI bus in condition monitoring subsystem and Signal-regulated kinase connect, described PXI digital multimeter, PXI numeral I/O module, one end of PXI relay switch module is connected with the PXI bus in condition monitoring subsystem, described PXI digital multimeter, PXI numeral I/O module, the other end of PXI relay switch module is connected with the IO interface of signal conditioning circuit.
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| CN201520669178.5U CN205015414U (en) | 2015-08-31 | 2015-08-31 | A general purpose system that is used for electronics testability to verify and evaluate |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105067933A (en) * | 2015-08-31 | 2015-11-18 | 中国人民解放军63908部队 | Universal system for electronic equipment testability validation and evaluation and testing method |
| CN108333987A (en) * | 2018-02-05 | 2018-07-27 | 北京龙坤盛达科技有限公司 | A kind of controlled failure injection device of polymorphic type multichannel |
| CN110174878A (en) * | 2019-05-20 | 2019-08-27 | 苏州肯博思智能科技有限公司 | A kind of unmanned intelligence equipment is healthy and ensures integrated management general-purpose system |
| CN116295584A (en) * | 2023-03-27 | 2023-06-23 | 中国人民解放军32181部队 | Motorized calibration and verification vehicle software system |
-
2015
- 2015-08-31 CN CN201520669178.5U patent/CN205015414U/en active Active
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105067933A (en) * | 2015-08-31 | 2015-11-18 | 中国人民解放军63908部队 | Universal system for electronic equipment testability validation and evaluation and testing method |
| CN108333987A (en) * | 2018-02-05 | 2018-07-27 | 北京龙坤盛达科技有限公司 | A kind of controlled failure injection device of polymorphic type multichannel |
| CN110174878A (en) * | 2019-05-20 | 2019-08-27 | 苏州肯博思智能科技有限公司 | A kind of unmanned intelligence equipment is healthy and ensures integrated management general-purpose system |
| CN116295584A (en) * | 2023-03-27 | 2023-06-23 | 中国人民解放军32181部队 | Motorized calibration and verification vehicle software system |
| CN116295584B (en) * | 2023-03-27 | 2023-12-19 | 中国人民解放军32181部队 | Motor-driven calibration vehicle control system |
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