CN204925169U - Novel CSP device test fixture - Google Patents

Novel CSP device test fixture Download PDF

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Publication number
CN204925169U
CN204925169U CN201520622251.3U CN201520622251U CN204925169U CN 204925169 U CN204925169 U CN 204925169U CN 201520622251 U CN201520622251 U CN 201520622251U CN 204925169 U CN204925169 U CN 204925169U
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China
Prior art keywords
led component
test fixture
thimble
device test
led device
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Active
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CN201520622251.3U
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Chinese (zh)
Inventor
吴灿标
李宏浩
李宗涛
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Foshan NationStar Optoelectronics Co Ltd
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Foshan NationStar Optoelectronics Co Ltd
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Abstract

The utility model provides a novel CSP device test fixture, include: LED device plummer and set up in the tucking that is used for contacting the LED device on the LED device plummer, wherein, the district is laid including the LED device that is used for laying the LED device to LED device plummer, LED device bottom electrode department has the thimble, LED device plummer inside has the inner chamber that is used for receiving the thimble, the top of thimble with LED device bottom electrode contacts. The contact jaw of tucking sets up to hemispherical, can reduce the area of contact of tucking and LED device, reduces the tucking to the influence of test result, the tucking adopts the strong extinction material of black to make, guarantees the tucking uniformity of extinction at every turn, under the condition that the extinction volume is unanimous at every turn, compensates the test result, can accurately measure the spectrum parameter of LED device.

Description

A kind of CSP device test fixture
Technical field
The utility model relates to a kind of LED test fixture, particularly relates to a kind of test fixture of CSP device.
Background technology
CSP and chip size packages, refer to package area and be less than 1:1.14 with the ratio of chip area, the size of devices after encapsulation is close to chip size.CSP device has top and adds surrounding totally five light-emitting areas, and most of bright dipping concentrates on top, but due to material, the impact of the factors such as technique, surrounding goes out photo-labile, and consistance is not good, thus affects test result.
Traditional method of testing is fixed by adding a cover glass on device, but cover glass has serious extinction problem, and cover glass is easily subject to dust, the pollution of fingerprint etc., and cause the stability of test result, degree of accuracy is poor.
In view of the defect of prior art, be badly in need of a kind of stability of research and development and the high CSP device test fixture of degree of accuracy.
Utility model content
The purpose of this utility model is, provides a kind of CSP device test fixture, effectively can carry out the performance tests such as spectrum to CSP device, reduces test fixture to the impact of test result.
For solving the problems of the technologies described above, the technical solution of the utility model is:
A kind of CSP device test fixture, comprise: LED component plummer and the pressing for contacting LED component be arranged on described LED component plummer, wherein, the LED component that described LED component plummer comprises for laying LED component lays district, described LED component bottom electrode place has thimble, described LED component plummer inside has the inner chamber receiving thimble, and the top of described thimble contacts with described LED component bottom electrode.
Preferably, the bottom of described thimble also has the first spring.
Preferably, the number of described first spring and the number of described thimble match.
Preferably, the diameter at described thimble top is less than the diameter bottom it.
Preferably, described thimble is inverted T-shaped structure, is namely provided with boss bottom described thimble.
Preferably, the inner chamber of described thimble is provided with gear platform, and described gear platform is used for propping up described boss.
Preferably, described pressing comprises the connecting portion that is connected with LED component plummer and the contact jaw with LED component surface contact.
Preferably, the contact jaw of described pressing and LED component surface contact is hemispherical.
Preferably, the contact jaw of described pressing and LED component surface contact is plane.
Preferably, the connecting portion of described pressing stretches into the inside of described LED component plummer and is connected with the second spring.
A kind of CSP device test fixture disclosed in the utility model, has the following advantages:
1, a kind of CSP device test fixture of providing of the utility model, pressing adopts the strong light absorbent of black to make, and can ensure the consistance of each extinction amount, reduces the undulatory property of test result; When each extinction amount is consistent, test result is compensated, accurately can measure the spectrum parameter of LED component.
2, a kind of CSP device test fixture of providing of the utility model, be fixed LED component with pressing, the contact jaw of pressing and LED component surface contact is hemispherical, can reduce the contact area of pressing and LED component, reduce the impact on test result.
3, a kind of CSP device test fixture of providing of the utility model, easy to operate simple and easy.
Accompanying drawing explanation
Fig. 1 is a kind of CSP device test fixture schematic diagram of the utility model embodiment one;
Fig. 2 is a kind of CSP device test fixture schematic diagram of the utility model embodiment two.
Embodiment
For making the technical solution of the utility model clearly, below in conjunction with accompanying drawing and specific embodiment, the utility model is described in detail.
Composition graphs 1, introduces a kind of CSP device test fixture described in the utility model.
As shown in Figure 1, a kind of CSP device test fixture that the present embodiment provides, comprising: LED component plummer 1 and the pressing 2 for contacting LED component be arranged on described LED component plummer 1.
Described LED component plummer 1 comprises that LED component lays district 11, described LED component lays district 11 for laying LED component 3, described LED component 3 bottom electrode place has thimble 12, described LED component plummer 1 inside has the inner chamber 13 receiving thimble, the top of described thimble 12 contacts with described LED component 3 bottom electrode, and the bottom of described thimble 12 also has the first spring 14.
The described number of the first spring 14 and the number of described thimble 12 match, in the present embodiment, described LED component bottom electrode place has two thimbles and two springs, mutually insulated between described two thimbles, two thimble tops contact with LED component bottom electrode respectively, be connected with the first spring bottom it, utilize the elastic property of spring can the lifting height of flexible LED component, ensure the effectively fixing of LED component.
Wherein, the top diameter of described thimble is less than the diameter bottom it, the top of thimble is hemispherical, in the present embodiment, described thimble is inverted T shape structure, is namely provided with boss 121 bottom described thimble, and the inner chamber 13 of described thimble is provided with gear platform 131, described gear platform 131 for propping up described boss 121 so that effectively prevent regulate LED component height time two thimbles depart from described LED component carrier-table surface.In the present embodiment, be communicated with power supply bottom described thimble by wire, after switching on power, electric current lights LED component by two thimbles, and utilizes lighting equipment to test light intensity and the wavelength of the LED component after lighting.
Described pressing 2 comprises the connecting portion 21 that is connected with LED component plummer and the contact jaw 22 with LED component surface contact.
Wherein, in the present embodiment, the contact jaw 22 that described pressing 2 contacts with LED component upper surface in hemispherical, and acts on the center of LED component upper surface, by the interaction of described thimble and pressing, ensure effectively fixing of LED component electrode and test fixture.The contact jaw contacted with LED component due to pressing is hemispherical, when testing the LED component of different-thickness, the LED component of different-thickness is identical with the contact area of described pressing and contact area is less, and the contact jaw of pressing and LED component is the packing colloid surface of hemispherical not fragile LED component, because the luminescence of LED component mainly concentrates on top, the contact jaw on pressing and LED component surface is utilized to be hemispherical design, the contact area at pressing and LED component top can be reduced, thus reduce pressing to the impact of test result.
Described pressing 2 adopts strong light absorbent to make, and described strong light absorbent can be alloy, wolfram steel etc., and in the present embodiment, pressing is preferably the wolfram steel material of black.Because black strong light absorbent extinction amount is stablized, little by the pollutant effect such as dust, fingerprint, the pressing therefore adopting the strong light absorbent of black to make, can ensure that each extinction amount of pressing is consistent, by compensating test result, can accurately draw required spectrum parameter.
In other embodiments, as shown in Figure 2, described pressing 2 is plane with the contact jaw 22 of LED component surface contact, the connecting portion 21 of described pressing stretches into the inside of described LED component plummer 1 and is connected with the second spring 15, utilize the elasticity of the second spring 15 can regulate the height of pressing, the upper surface making pressing can be adjusted to LED component 3 contacts with it.Described pressing adopts the strong light absorbent of black, can ensureing that each extinction amount of pressing is consistent, by compensating test result, can accurately draw required spectrum parameter.
LED encapsulation structure disclosed in the utility model, has the following advantages:
1, a kind of CSP device test fixture of providing of the utility model, pressing adopts the strong light absorbent of black to make, and can ensure the consistance of each extinction amount, reduces the undulatory property of test result; When each extinction amount is consistent, test result is compensated, accurately can measure the spectrum parameter of LED component.
2, a kind of CSP device test fixture of providing of the utility model, be fixed LED component with pressing, the contact jaw of pressing and LED component surface contact is hemispherical, can reduce the contact area of pressing and LED component, reduce the impact on test result.
3, a kind of CSP device test fixture of providing of the utility model, easy to operate simple and easy.
Be described in detail the utility model above, apply specific case and set forth principle of the present utility model and embodiment in literary composition, the explanation of above embodiment just understands method of the present utility model and core concept thereof for helping.Should be understood that; for those skilled in the art; under the prerequisite not departing from the utility model principle, can also carry out some improvement and modification to the utility model, these improve and modify and also fall in the protection domain of the utility model claim.

Claims (10)

1. a CSP device test fixture, comprise: LED component plummer and the pressing for contacting LED component be arranged on described LED component plummer, wherein, the LED component that described LED component plummer comprises for laying LED component lays district, described LED component bottom electrode place has thimble, described LED component plummer inside has the inner chamber receiving thimble, and the top of described thimble contacts with described LED component bottom electrode.
2. a kind of CSP device test fixture according to claim 1, is characterized in that: the bottom of described thimble also has the first spring.
3. a kind of CSP device test fixture according to claim 2, is characterized in that: the number of described first spring and the number of described thimble match.
4. a kind of CSP device test fixture according to claim 1, is characterized in that: the diameter at described thimble top is less than the diameter bottom it.
5. a kind of CSP device test fixture according to claim 4, is characterized in that: described thimble is inverted T-shaped structure, is namely provided with boss bottom described thimble.
6. a kind of CSP device test fixture according to claim 5, it is characterized in that: the inner chamber of described thimble is provided with gear platform, described gear platform is used for propping up described boss.
7. a kind of CSP device test fixture according to claim 1, is characterized in that: described pressing comprises the connecting portion that is connected with LED component plummer and the contact jaw with LED component surface contact.
8. a kind of CSP device test fixture according to claim 7, is characterized in that: the contact jaw of described pressing and LED component surface contact is hemispherical.
9. a kind of CSP device test fixture according to claim 7, is characterized in that: the contact jaw of described pressing and LED component surface contact is plane.
10. a kind of CSP device test fixture according to claim 9, is characterized in that: the connecting portion of described pressing stretches into the inside of described LED component plummer and is connected with the second spring.
CN201520622251.3U 2015-08-18 2015-08-18 Novel CSP device test fixture Active CN204925169U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201520622251.3U CN204925169U (en) 2015-08-18 2015-08-18 Novel CSP device test fixture

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201520622251.3U CN204925169U (en) 2015-08-18 2015-08-18 Novel CSP device test fixture

Publications (1)

Publication Number Publication Date
CN204925169U true CN204925169U (en) 2015-12-30

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN201520622251.3U Active CN204925169U (en) 2015-08-18 2015-08-18 Novel CSP device test fixture

Country Status (1)

Country Link
CN (1) CN204925169U (en)

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