CN204903583U - Big power diode ageing tests anchor clamps of area heat dissipation function - Google Patents
Big power diode ageing tests anchor clamps of area heat dissipation function Download PDFInfo
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- CN204903583U CN204903583U CN201520643709.3U CN201520643709U CN204903583U CN 204903583 U CN204903583 U CN 204903583U CN 201520643709 U CN201520643709 U CN 201520643709U CN 204903583 U CN204903583 U CN 204903583U
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Abstract
The utility model discloses a big power diode ageing tests anchor clamps of area heat dissipation function, including metal soleplate, be provided with the installation tube hole of placing the diode on the bottom plate, lower terminal surface is provided with concave structures's both sides board, the both ends face is provided with the fence board about the board of both sides, the fence board by the polylith side by side spaced's sheet metal form, the bottom plate side end face is provided with the terminal. The utility model discloses in inserting the installation tube hole with the diode threaded positive terminal of DO encapsulation, it is fixed with it to adopt the nut, use the wire to be connected to testing arrangement with the anodal of diode and negative pole, independent mounting structure, performance and yin gaowen that the heat dissipation that can avoid the diode influences the test circuit board damage components and parts and PCB board, the heating panel of paling form, heat radiating area has been increased, can let the diode produce the radiating effect is showing, simple to operate swiftly can improve efficiency of software testing greatly, the measuring accuracy height still has, moreover, the steam generator is simple in structure, low cost, dismantle convenient characteristics.
Description
Technical field
The utility model belongs to electronic component testing apparatus technical field, relates to a kind of heavy-duty diode aging test fixture with heat sinking function.
Background technology
Its output average current of the diode of DO packing forms series is generally all greater than 10A, this series of diode thermal value in aging test process is large, the diode cathode exit of DO encapsulation series is bolt, negative pole exit is thicker lead-in wire, the breadboard of ageing testing equipment manufacturer design adopts tandem test, its mounting means is directly be fixed on pcb board by the bolt of diode cathode by nut, be that the other one end of crocodile clip is fixed on wire on pcb board by test Diode series by one end again, under this mounting means, diodes age test can be generated heat in a large number, often because the bad test device that causes that dispels the heat damages or burns out breadboard, and also can Yin Gaowen bis-disturbed test element function and affect measuring accuracy, packing forms is F-1 in addition, during the large power triode aging test of F-2 and TO series, triode is connected on pcb board, corresponding heat abstractor is not installed, identical problem is caused to occur equally.
Summary of the invention
The technical problems to be solved in the utility model is: provide a kind of heavy-duty diode aging test fixture with heat sinking function, with solve directly diode is arranged on pcb board occurs damage or burn out the problem of breadboard and measuring accuracy difference because of the bad test device caused that dispels the heat.
The technical scheme that the utility model is taked is: a kind of heavy-duty diode aging test fixture with heat sinking function, comprise metal base plate, described base plate is provided with the installation pore placing diode, lower surface is provided with the biside plate of concave structure, the left and right both ends of the surface of described biside plate are provided with barrier board, the thin plate that described barrier board is placed by polylith spacing side by side forms, and described base plate side end face is provided with binding post.
Preferably, above-mentioned installation pore comprises the heavy-duty diode pore of various series, can adapt to the test of different heavy-duty diode, and test specification is wide, thus greatly reduces testing cost.
Preferably, above-mentioned binding post can be connected with the crocodile clip of wire, is clamped by binding post by crocodile chuck, and this structure is simple, reliably easy to connect, easy to loading and unloading.
Preferably, above-mentioned sheet gauge is 1 ~ 2mm, and thin plate spacing is 2 ~ 3mm, can realize quick heat radiating, reaches radiating effect during time test, allows test component keep uniform temperature.
Preferably, above-mentioned base plate and barrier board and side plate adopt aluminum alloy materials, and aluminum alloy materials has that perfect heat-dissipating, electric conductivity are good, the feature of light structure, is particularly suitable for being applied in the high structure of cooling requirements.
The beneficial effects of the utility model: compared with prior art, the threaded positive terminal of the diode that DO encapsulates by the utility model is inserted into be installed in pore, employing nut is fixed, use wire that the positive pole of diode and negative pole are connected to proving installation, independently mounting structure, the heat radiation of diode can be avoided to affect the performance of testing circuit board and the pcb board because of high temperature failure components and parts, the heat sink of paliform is set, increase area of dissipation, the heat Quick diffusing that diode can be allowed to produce is gone out, radiating effect is remarkable, installation diode is convenient and swift, convenient disassembly, greatly can improve testing efficiency, and because good heat dissipation effect can improve measuring accuracy the utility model greatly, by adding this utility model, during heavy-duty diode aging test, its housing thermal value is more easily tested and controls, increase the reliability of shaker test, it is simple that the utility model also has structure, the feature that cost is low.
Accompanying drawing explanation
Fig. 1 is the utility model schematic top view;
Fig. 2 looks schematic diagram at the bottom of the utility model;
Fig. 3 is the utility model schematic side view.
In figure, 1-base plate, 2-installs pore, 3-side plate, 4-barrier board, 5-thin plate, 6-binding post.
Embodiment
Below in conjunction with accompanying drawing and specific embodiment, utility model is described further.
As shown in Fig. 1 ~ Fig. 3, a kind of heavy-duty diode aging test fixture with heat sinking function, comprise metal base plate 1, described base plate 1 is provided with the installation pore 2 placing diode, lower surface is provided with the biside plate 3 of concave structure, and the left and right both ends of the surface of described biside plate 3 are provided with barrier board 4, and the thin plate 5 that described barrier board 4 is placed by polylith spacing side by side forms, minimum two pieces of thin plates, described base plate 1 side end face is provided with binding post 6.
Preferably, above-mentioned installation pore 2 comprises the heavy-duty diode pore of DO, F series, can adapt to the test of different heavy-duty diode, and test specification is wide, thus greatly reduces testing cost.
Preferably, above-mentioned binding post 6 can be connected with the crocodile clip of wire, is clamped by binding post 6 by crocodile chuck, and this structure is simple, reliably easy to connect, easy to loading and unloading.
Preferably, above-mentioned thin plate 5 thickness is 1 ~ 2mm, and spacing is 2 ~ 3mm, can realize quick heat radiating, reaches radiating effect during time test, allows test component keep uniform temperature.
Preferably, above-mentioned base plate 1 and barrier board 4 and side plate 3 adopt aluminum alloy materials, and aluminum alloy materials has that perfect heat-dissipating, electric conductivity are good, the feature of light structure, is particularly suitable for being applied in the high structure of cooling requirements.
The above; be only embodiment of the present utility model; but protection domain of the present utility model is not limited thereto; anyly be familiar with those skilled in the art in the technical scope that the utility model discloses; change can be expected easily or replace; all should be encompassed within protection domain of the present utility model, therefore, protection domain of the present utility model should be as the criterion with the protection domain of described claim.
Claims (5)
1. the heavy-duty diode aging test fixture with heat sinking function, it is characterized in that: comprise metal base plate (1), described base plate (1) is provided with the installation pore (2) placing diode, lower surface is provided with the biside plate (3) of concave structure, the left and right both ends of the surface of described biside plate (3) are provided with barrier board (4), the thin plate (5) that described barrier board (4) is placed by polylith spacing side by side forms, and described base plate (1) side end face is provided with binding post (6).
2. a kind of heavy-duty diode aging test fixture with heat sinking function according to claim 1, is characterized in that: described installation pore comprises the heavy-duty diode pore installing DO, F series.
3. a kind of heavy-duty diode aging test fixture with heat sinking function according to claim 1, is characterized in that: described binding post (6) can be connected with the crocodile clip of wire, is clamped by binding post by crocodile chuck.
4. a kind of heavy-duty diode aging test fixture with heat sinking function according to claim 1, it is characterized in that: described thin plate (5) thickness is 1 ~ 2mm, spacing is 2 ~ 3mm.
5. a kind of heavy-duty diode aging test fixture with heat sinking function according to claim 1, is characterized in that: described base plate (1) and barrier board (4) and side plate (3) adopt aluminum alloy materials.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520643709.3U CN204903583U (en) | 2015-08-25 | 2015-08-25 | Big power diode ageing tests anchor clamps of area heat dissipation function |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520643709.3U CN204903583U (en) | 2015-08-25 | 2015-08-25 | Big power diode ageing tests anchor clamps of area heat dissipation function |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN204903583U true CN204903583U (en) | 2015-12-23 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201520643709.3U Active CN204903583U (en) | 2015-08-25 | 2015-08-25 | Big power diode ageing tests anchor clamps of area heat dissipation function |
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| CN (1) | CN204903583U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106405360A (en) * | 2016-06-01 | 2017-02-15 | 中国振华集团永光电子有限公司（国营第八七三厂） | Aging test method of semiconductor product with bolt profile |
| CN114324990A (en) * | 2021-12-09 | 2022-04-12 | 中国电子科技集团公司第二十九研究所 | Universal thermal test fixture device for electronic module unit |
-
2015
- 2015-08-25 CN CN201520643709.3U patent/CN204903583U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106405360A (en) * | 2016-06-01 | 2017-02-15 | 中国振华集团永光电子有限公司（国营第八七三厂） | Aging test method of semiconductor product with bolt profile |
| CN114324990A (en) * | 2021-12-09 | 2022-04-12 | 中国电子科技集团公司第二十九研究所 | Universal thermal test fixture device for electronic module unit |
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|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |