CN204903463U - Multifrequency formation of image eddy current inspection appearance - Google Patents
Multifrequency formation of image eddy current inspection appearance Download PDFInfo
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- CN204903463U CN204903463U CN201520653249.2U CN201520653249U CN204903463U CN 204903463 U CN204903463 U CN 204903463U CN 201520653249 U CN201520653249 U CN 201520653249U CN 204903463 U CN204903463 U CN 204903463U
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- eddy current
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- 230000015572 biosynthetic process Effects 0.000 title abstract 2
- 238000007689 inspection Methods 0.000 title abstract 2
- 238000012360 testing method Methods 0.000 claims description 26
- 238000003384 imaging method Methods 0.000 claims description 8
- 230000002093 peripheral effect Effects 0.000 claims description 3
- 238000001514 detection method Methods 0.000 abstract description 6
- 239000000523 sample Substances 0.000 abstract description 2
- 238000000034 method Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000005672 electromagnetic field Effects 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
Abstract
The utility model discloses a multifrequency formation of image eddy current inspection appearance, including signal generator, multichannel signal input part, drive circuit, detecting coil, multichannel signal output part, detection circuit, AD converting circuit, magnetic field signal acquisition circuit, multifrequency signal switching circuit, display and microprocessor, the utility model discloses an adopt the design of multichannel array, the coil of compensateing over probe is the limitation of a direction singly, can acquire the three -dimensional detection data of multi -angle the same moment, utilize three -dimensional data to restore the situation that detects the work piece, reach the detection requirement of high speed, multichannel array.
Description
Technical field
The utility model relates to a kind of detector, refers more particularly to a kind of multifrequency imaging eddy current testing instrument.
Background technology
Past, the method that multifrequency imaging eddy current testing instrument generally adopts single channel to detect, coil probe can only carry out unidirectional detection, its limitation testing result has very limitation, be unfavorable for judging workpiece, not only will repeatedly testing, but also there is subjective factor of judgment, not reach at a high speed, the testing requirement of multichannel array.
Utility model content
The purpose of this utility model is just to provide a kind of multichannel array to design to solve the problem, the multifrequency imaging eddy current testing instrument of the testing requirement that detection speed is fast.
The utility model is achieved through the following technical solutions above-mentioned purpose:
The utility model comprises signal generator, multiple signals input end, driving circuit, magnetic test coil, multiple signals output terminal, detecting circuit, A/D change-over circuit, field signal Acquisition Circuit, multiple-frequency signal commutation circuit, display and microprocessor, the output terminal of described signal generator is connected with described multiple signals input end, described multiple signals input end is connected with the input end of described driving circuit, the output terminal of described driving circuit is connected with the input end of described magnetic test coil, the output terminal of described magnetic test coil is connected with described multiple signals output terminal, described multiple signals output terminal is connected with the input end of described detecting circuit, the output terminal of described detecting circuit is connected with the input end of described A/D change-over circuit, the output terminal of described A/D change-over circuit is connected with the input end of described field signal Acquisition Circuit, the output terminal of described field signal Acquisition Circuit is connected with the input end of described multiple-frequency signal commutation circuit, the output terminal of described multiple-frequency signal commutation circuit is connected with the input end of described microprocessor, the input end of described microprocessor is connected with the input end of described display.
Particularly, the output terminal of described magnetic test coil is provided with differential amplifier circuit and gain adjusting circuit.
Further, the output terminal of described microprocessor is provided with I/O peripheral circuit and warning circuit.
Particularly, the input end of described microprocessor is connected with the output terminal of touch-screen.
The beneficial effects of the utility model are:
The utility model is by adopting multichannel array design, and the coil of making up over is popped one's head in the limitation in single direction; The detection data of multi-angle three-dimensional can be obtained by synchronization, utilize three-dimensional data to carry out reducing the situation detecting workpiece, reach at a high speed, the testing requirement of multichannel array.
Accompanying drawing explanation
Fig. 1 is structured flowchart of the present utility model.
Embodiment
Below in conjunction with accompanying drawing, the utility model is described in further detail:
As shown in Figure 1, the utility model comprises signal generator, multiple signals input end, driving circuit, magnetic test coil, multiple signals output terminal, detecting circuit, A/D change-over circuit, field signal Acquisition Circuit, multiple-frequency signal commutation circuit, display and microprocessor, the output terminal of signal generator is connected with multiple signals input end, multiple signals input end is connected with the input end of driving circuit, the output terminal of driving circuit is connected with the input end of magnetic test coil, the output terminal of magnetic test coil is connected with multiple signals output terminal, multiple signals output terminal is connected with the input end of detecting circuit, the output terminal of detecting circuit is connected with the input end of A/D change-over circuit, the output terminal of A/D change-over circuit is connected with the input end of field signal Acquisition Circuit, the output terminal of field signal Acquisition Circuit is connected with the input end of multiple-frequency signal commutation circuit, the output terminal of multiple-frequency signal commutation circuit is connected with the input end of microprocessor, the input end of microprocessor is connected with the input end of display.Field signal Acquisition Circuit gathers as ac magnetic field induced signal, carries out the Fourier transform, digital band pass filtering process etc. of the complex impedance conversion of electromagnetic field; Multiple-frequency signal commutation circuit is the signal switching that magnetic test coil realizes passage, frequency.
The output terminal of magnetic test coil is provided with differential amplifier circuit and gain adjusting circuit, and the output terminal of microprocessor is provided with I/O peripheral circuit and warning circuit, and the input end of microprocessor is connected with the output terminal of touch-screen.
These are only preferred embodiment of the present utility model, not in order to limit the utility model, all do within spirit of the present utility model and principle any amendment, equivalent to replace and improvement etc., all should be included in protection domain of the present utility model.
Claims (4)
1. a multifrequency imaging eddy current testing instrument, it is characterized in that: comprise signal generator, multiple signals input end, driving circuit, magnetic test coil, multiple signals output terminal, detecting circuit, A/D change-over circuit, field signal Acquisition Circuit, multiple-frequency signal commutation circuit, display and microprocessor, the output terminal of described signal generator is connected with described multiple signals input end, described multiple signals input end is connected with the input end of described driving circuit, the output terminal of described driving circuit is connected with the input end of described magnetic test coil, the output terminal of described magnetic test coil is connected with described multiple signals output terminal, described multiple signals output terminal is connected with the input end of described detecting circuit, the output terminal of described detecting circuit is connected with the input end of described A/D change-over circuit, the output terminal of described A/D change-over circuit is connected with the input end of described field signal Acquisition Circuit, the output terminal of described field signal Acquisition Circuit is connected with the input end of described multiple-frequency signal commutation circuit, the output terminal of described multiple-frequency signal commutation circuit is connected with the input end of described microprocessor, the input end of described microprocessor is connected with the input end of described display.
2. a kind of multifrequency imaging eddy current testing instrument according to claim 1, is characterized in that: the output terminal of described magnetic test coil is provided with differential amplifier circuit and gain adjusting circuit.
3. a kind of multifrequency imaging eddy current testing instrument according to claim 1, is characterized in that: the output terminal of described microprocessor is provided with I/O peripheral circuit and warning circuit.
4. a kind of multifrequency imaging eddy current testing instrument according to claim 1, is characterized in that: the input end of described microprocessor is connected with the output terminal of touch-screen.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520653249.2U CN204903463U (en) | 2015-08-27 | 2015-08-27 | Multifrequency formation of image eddy current inspection appearance |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520653249.2U CN204903463U (en) | 2015-08-27 | 2015-08-27 | Multifrequency formation of image eddy current inspection appearance |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN204903463U true CN204903463U (en) | 2015-12-23 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201520653249.2U Active CN204903463U (en) | 2015-08-27 | 2015-08-27 | Multifrequency formation of image eddy current inspection appearance |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN204903463U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105548350A (en) * | 2016-01-26 | 2016-05-04 | 江苏理工学院 | Pulsed eddy-current defect detection imaging system based on filleted-corner rectangular array probe |
-
2015
- 2015-08-27 CN CN201520653249.2U patent/CN204903463U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105548350A (en) * | 2016-01-26 | 2016-05-04 | 江苏理工学院 | Pulsed eddy-current defect detection imaging system based on filleted-corner rectangular array probe |
| CN105548350B (en) * | 2016-01-26 | 2018-12-25 | 江苏理工学院 | Impulse eddy current defects detection imaging system based on round rectangle array probe |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CB03 | Change of inventor or designer information | ||
| CB03 | Change of inventor or designer information |
Inventor after: Chen Jingui Inventor before: Fan Mengbao |
|
| CP01 | Change in the name or title of a patent holder | ||
| CP01 | Change in the name or title of a patent holder |
Address after: Room 3011, Xuan building, Pioneer Park, torch hi tech Zone, Fujian, Xiamen 361000 Patentee after: VSCAN (XIAMEN) INTELLIGENT TECHNOLOGY CO.,LTD. Address before: Room 3011, Xuan building, Pioneer Park, torch hi tech Zone, Fujian, Xiamen 361000 Patentee before: VSCAN (XIAMEN) INSPECTION TECHNOLOGY CO.,LTD. |
|
| TR01 | Transfer of patent right | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20231007 Address after: 215000 North 2nd Floor, Building 3, Listing Science and Technology Innovation Park, No. 19 Yong'an Road, High tech Zone, Suzhou City, Jiangsu Province Patentee after: Suzhou weishiken Testing Technology Co.,Ltd. Address before: 361000 room 3011, Xuanye building, Pioneer Park, torch hi tech Zone, Xiamen City, Fujian Province Patentee before: VSCAN (XIAMEN) INTELLIGENT TECHNOLOGY CO.,LTD. |