CN204740291U - Automatic test conducting slip ring contact resistance's device - Google Patents
Automatic test conducting slip ring contact resistance's device Download PDFInfo
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- CN204740291U CN204740291U CN201520368325.5U CN201520368325U CN204740291U CN 204740291 U CN204740291 U CN 204740291U CN 201520368325 U CN201520368325 U CN 201520368325U CN 204740291 U CN204740291 U CN 204740291U
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Abstract
The utility model discloses an automatic test conducting slip ring contact resistance's device, the outside is provided with hangs down resistance meter, including conducting slip ring, a plurality of relay, relay drive circuit, automatic control equipment, a plurality of wire. The number N of relay with 2 times of the passageway way M of conducting slip ring. A N relay with each way that conducting slip ring M sweetgum fruit was said links to each other, constitutes the switching of a 2N test passageway, and wherein the switching that the passageway was measured to two four -wires is accomplished to per 4 adjacent relays. The relay drive circuit output with the relay is connected, its input with automatic control equipment is connected. The utility model discloses a set up simple relay switching circuit, utilize external low resistance meter can realize multichannel contact resistance's quick test, eliminate individual test error.
Description
Technical Field
The utility model relates to a low resistance test technical field, concretely relates to automatic test electrically conducts slip ring contact resistance's device.
Background
The conductive slip ring is a precise power transmission device for realizing signal and current transmission between two opposite rotating mechanisms. Applications are in locations where unlimited, continuous or intermittent rotation is required, while power or data needs to be transferred from a fixed position to a rotating position. The dynamic contact resistance variation is a key parameter index of the conductive device in the test process, and is represented by the difference between the maximum value and the minimum value of the maximum variation of the contact resistance when the brush and the ring rotate relatively, namely, the so-called range difference value, and the smaller the range difference value is, the better the range difference value is.
The general test method of the conductive slip ring is that a tester tests the wire ends of the contact points of the conductive slip ring through a special low-resistance test instrument respectively, and then reads the numerical values of the test instrument to carry out manual recording, the method is easy to generate measurement errors due to individual differences of the tester, and common slip ring products are provided with multiple channels (the number of the wind power conductive slip ring is up to 29 channels), so that the test efficiency is extremely low, and the large-scale production requirements cannot be met.
SUMMERY OF THE UTILITY MODEL
In view of this, the present application provides an apparatus for automatically testing a contact resistance of a conductive slip ring, which can realize a fast test of a multi-path contact resistance by using an external low resistance tester through setting a simple relay switching circuit, and eliminate an individual test error.
For solving above technical problem, the utility model provides a technical scheme is an automatic electrically conductive sliding ring contact resistance's of test device, the outside is provided with the low resistance tester, include: the device comprises a conductive slip ring, a plurality of relays, a relay driving circuit, automatic control equipment and a plurality of leads;
the number of channels of the conductive slip ring is M, and the number of the relays is 2M;
the relays are divided into two groups: the serial number of the group A is 2M-1, and the serial number of the group B is 2M;
the N relays are connected with each of M paths of channels of the conductive slip ring to form the switching of 2N testing channels, and each adjacent 4 relays complete the switching of two four-wire measuring channels; the pin 1 of each relay is connected with the conductive slip ring, the A group of relays are shorted together to form a 'test point 1', and the B group of relays are shorted together to form a 'test point 2';
the output end of the relay driving circuit is connected with the relay, and the input end of the relay driving circuit is connected with the automatic control equipment;
the test input end of the low resistance tester is respectively connected with the test point 1 and the test point 2 and is connected with the automatic control equipment through an RS232 interface.
Preferably, the relay is an electromagnetic relay.
Preferably, the contact resistance of the relay is less than 10m Ω.
Preferably, the electronic device is a micro control unit MCU or a PCI controller.
Preferably, the relays No. 2M-1 in the relay group A and the relays No. 2(M +1) in the relay group B are communicated to form 1 total test loop; the 2(M +1) -1 relays in the relay A group are communicated with the 2M +1 relays in the relay B group to form 1 total test loop; the total test loop resistance includes a conductive slip ring contact resistance.
Preferably, the relay No. 2M-1 in the relay group A is communicated with the relay No. 2M in the relay group B, so that 2 test loops are formed, and the loop resistance does not comprise a conductive slip ring contact resistance.
It can be seen from the above technical solution that: the utility model relates to an automatic test device of conductive slip ring contact resistance, including conductive slip ring, a plurality of relay, relay drive circuit, automatic control equipment, a plurality of wire, low resistance tester. The number N of the relays is the same as the number N of the channels of the conductive slip ring. The N relays are connected with each of the N paths of the conductive slip ring to form the switching of 2N testing channels, wherein each 4 adjacent relays complete the switching of two four-wire measuring channels. The output end of the relay driving circuit is connected with the relay, and the input end of the relay driving circuit is connected with the automatic control equipment. The utility model discloses a set up simple relay switching circuit, utilize external low resistance tester can realize multichannel contact resistance's quick test. The automatic control equipment adopts a working mode of controlling and switching twice, the relay switches and selects the test channel to form a loop, and the test is realized by the low-resistance tester.
Compared with the prior art, the detailed description of the application is as follows:
the method is simple and convenient to operate, stable and reliable, accurate testing of the contact resistance of the multi-channel conductive slip ring can be met, and the number of channels is not limited. In addition, according to the application, a simple relay switching circuit is built, a ready-made low-resistance tester is utilized, the rapid test of the multi-path contact resistance can be realized, individual test errors are eliminated, and the speed requirement of factory inspection of a large batch of conductive slip rings can be met.
Drawings
Fig. 1 is a block diagram illustrating an apparatus for automatically testing contact resistance of a conductive slip ring according to the present invention;
fig. 2 is a schematic structural diagram of an apparatus for automatically testing contact resistance of a conductive slip ring according to the present invention;
fig. 3 is a flow chart of the method for automatically testing the contact resistance of the conductive slip ring according to the present invention.
Detailed Description
In order to make those skilled in the art better understand the technical solution of the present invention, the present invention will be further described in detail with reference to the accompanying drawings and specific embodiments.
As shown in fig. 1, the utility model relates to an automatic test device of conductive slip ring contact resistance, including being surveyed conductive slip ring 1, relay 2, low resistance tester 3, automatic control equipment 4, relay driver 5. The tested conductive slip ring 1 is connected with the relay 2, the output end of the relay 2 is connected with the test input end of the low resistance tester 3, the low resistance tester 3 is connected with the automatic control equipment 4 through the RS232, and the automatic control equipment 4 is connected with the relay 2 through the relay driver 5 and controls the relay 2.
As shown in fig. 2, the present invention provides an apparatus for automatically testing contact resistance of conductive slip ring, which takes a conductive slip ring with 3 channels as an example.
In the figure, Rc1, Rc2 and Rc3 are contact resistances of the conductive slip ring 1 to be tested, (Ka1, Kb1, Ka2, Kb2, Ka3 and Kb3) are 6 electromagnetic relays (contact resistance <10m Ω). Wherein, the relays (Ka1, Ka2 and Ka3) are a group A, and the serial numbers are (1, 3 and 5) in sequence; the relays (Kb1, Kb2 and Kb3) are a group B, and the numbers are (2, 4 and 6) in sequence. The leading-out wires of the group A of the relays (Ka1, Ka2 and Ka3) are shorted together to form a test point 1, the leading-out wires of the group B of the relays (Kb1, Kb2 and Kb3) are shorted together to form a test point 2, and a pin 1 of each relay is connected with the conductive slip ring. The above connection mode can constitute the switching of 12 test channels, wherein every 4 adjacent relays complete the switching of two four-wire measurement channels.
The test input end of the low resistance tester 3 is respectively connected with the test point 1 and the test point 2 and is connected with the automatic control equipment 4 through an RS232 interface. The automatic control device 4 controls the relay 2 through a relay driver.
As shown in fig. 3, a method for automatically testing a conductive sliding ring contact resistance tests a flow, the method is based on the device for automatically testing a conductive sliding ring contact resistance, an automatic control device in the whole testing process adopts a working mode of controlling and switching twice, and a relay switches and selects a testing channel, so as to realize leading out the 'testing point 1' and the 'testing point 2' for testing; the method specifically comprises the following steps:
and S101, controlling 2 communicated relays to switch and select test channels by the automatic control equipment to form a total test loop, and testing the total resistance value of the formed total test loop by using the low-resistance tester.
As shown in fig. 2, the automatic control device 4 controls the relays 2 to communicate the 2M-1 th relay in the relay a group with the 2(M +1) th relay in the relay B group to form 1 total test loop; and communicating the 2(M +1) -1 relay in the relay A group with the 2M +1 relay in the relay B group to form 1 total test loop.
The relays (Ka1 and Kb2) are closed, namely the relays No. 1 in the group A are communicated with the relays No. 4 in the group B, and the contact resistors (Rc1 and Rc2) and the low-resistance tester 3 form a total test loop through the relays (Ka1 and Kb 2); the relays (Ka2 and Kb1) are closed, namely, the No. 3 relays in the group A are communicated with the No. 2 relays in the group B, and the contact resistors (Rc1 and Rc2) and the low-resistance tester 3 form another total test loop through the relays (Ka2 and Kb 1). The total resistance value of the formed total test loop can be directly tested by the low-resistance tester. The total resistance value is the sum of the contact resistance (Rc1, Rc2) values and the relay (Ka1, Kb1, Ka2, Kb2) values.
And S102, controlling 2 communicating relays to switch and select the testing channels by the automatic control equipment to form a branch testing loop, and testing the resistance value of the formed branch testing loop by the low-resistance tester.
As shown in fig. 2, the automatic control device 4 controls the relay 2 to communicate the relay 2M-1 in the relay group a with the relay 2M in the relay group B, thereby forming 2 test loops.
The relays (Ka1 and Kb1) are closed, namely the relay No. 1 in the group A is communicated with the relay No. 2 in the group B to form a test loop with the low-resistance tester 3; and the relays (Ka2 and Kb2) are closed, namely the relay No. 3 in the group A is communicated with the relay No. 4 in the group B to form another test loop with the low-resistance tester 3. The internal resistance value of the formed branch test loop can be directly tested by the low resistance tester 3. The resistance values are the resistance values of the relays (Ka1, Kb1, Ka2, Kb 2).
The automatic control equipment 4 controls the on-off of the relay 2, and the resistance of all loops which can be formed by the channels in the conductive sliding ring to be tested and the relay is tested by the low resistance tester.
And step S103, calculating the contact resistance value of the conductive slip ring according to the resistance values obtained in the steps S101 and S102.
Taking fig. 2 as an example, the calculation process is as follows:
the test contact resistances Rc1 and Rc2 form 4 test loops, which are respectively as follows, and the sum of the contact resistances Rc1 and Rc2 is Rc 12:
closing Kb2 and Ka1, and obtaining a low resistance tester reading value R11 which is Rc1+ Rc2+ RKa1+ RKb 2;
closing Kb1 and Ka2, and obtaining a low resistance tester reading value R21 which is Rc1+ Rc2+ RKa2+ RKb 1;
the Ka1 and Kb1 are closed, and the read value R31 of the low resistance tester is RKa1+ RKb 1;
the Ka2 and Kb2 are closed, and the read value R41 of the low resistance tester is RKa2+ RKb 2;
the sum of the slip-ring contact resistances Rc1 and Rc2 is Rc12 ═ Rc1+ Rc2 ═ R11+ R21-R31-R41.
The test contact resistances Rc2 and Rc3 form 4 test loops, which are respectively as follows, and the sum of the contact resistances Rc2 and Rc3 is Rc 23:
closing Kb3 and Ka2, and obtaining a low resistance tester reading value R12 which is Rc2+ Rc3+ RKa2+ RKb 3;
closing Kb2 and Ka3, and obtaining a low resistance tester reading value R22 which is Rc2+ Rc3+ RKa3+ RKb 2;
the Ka2 and Kb2 are closed, and the read value R32 of the low resistance tester is RKa2+ RKb 2;
the Ka3 and Kb3 are closed, and the read value R42 of the low resistance tester is RKa3+ RKb 3;
the sum of the slip-ring contact resistances Rc2 and Rc3 is Rc23 ═ Rc2+ Rc3 ═ R12+ R22-R32-R42.
The test contact resistances Rc1 and Rc3 form 4 test loops, which are respectively as follows, and the sum of the contact resistances Rc1 and Rc3 is Rc 13:
closed Kb3, Ka1, tester read value R13 ═ Rc1+ Rc3+ RKa1+ RKb 3;
closed Kb1, Ka3, tester read value R23 ═ Rc1+ Rc3+ RKa3+ RKb 1;
the Ka1 and Kb1 are closed, and the tester reading value R33 is RKa1+ RKb 1;
the Ka3 and Kb3 are closed, and the tester reading value R43 is RKa3+ RKb 3;
the sum of the slip-ring contact resistances Rc1 and Rc3 is Rc13 ═ Rc1+ Rc3 ═ R13+ R23-R33-R43.
Finally, slip ring contact resistances Rc1, Rc2 and Rc3 are obtained:
Rc1＝(Rc12+Rc23+Rc13)/2-Rc23；
Rc2＝(Rc12+Rc23+Rc13)/2-Rc13；
Rc3＝(Rc12+Rc23+Rc13)/2-Rc12；
the utility model discloses can satisfy the electrically conductive sliding ring contact resistance's of multichannel test, its relay can make up the resistance value that makes special low resistance tester can test different passageways for arbitrary topological structure. Additionally the utility model discloses can also connect computer terminal can read the return circuit resistance through the serial ports from the low resistance tester and synthesize the operation, finally can reach the contact resistance value of sliding ring. And the computer terminal generates a report form according to the final result and outputs the report form through a printer. The utility model discloses a set up simple relay switching circuit, utilize ready-made low resistance tester (take the serial ports), can realize multichannel contact resistance's quick test, eliminate individual test error, can satisfy the speed requirement that the big batch electrically conducts the sliding ring and dispatches from the factory inspection.
The above is only a preferred embodiment of the present invention, and it should be noted that the above preferred embodiment should not be considered as limiting the present invention, and the protection scope of the present invention should be subject to the scope defined by the claims. It will be apparent to those skilled in the art that various modifications and enhancements can be made without departing from the spirit and scope of the invention, and such modifications and enhancements are intended to be within the scope of the invention.
Claims (6)
1. The utility model provides an automatic device of electrically conductive sliding ring contact resistance of test, the outside is provided with low resistance tester, its characterized in that includes: the device comprises a conductive slip ring, a plurality of relays, a relay driving circuit, automatic control equipment and a plurality of leads; wherein,
the number of channels of the conductive slip ring is M, and the number of the relays is 2M;
the relays are divided into two groups: the serial number of the group A is 2M-1, and the serial number of the group B is 2M;
the N relays are connected with each of M paths of channels of the conductive slip ring to form the switching of 2N testing channels, and each adjacent 4 relays complete the switching of two four-wire measuring channels; the pin 1 of each relay is connected with the conductive slip ring, the A group of relays are shorted together to form a 'test point 1', and the B group of relays are shorted together to form a 'test point 2';
the output end of the relay driving circuit is connected with the relay, and the input end of the relay driving circuit is connected with the automatic control equipment;
the test input end of the low resistance tester is respectively connected with the test point 1 and the test point 2 and is connected with the automatic control equipment through an RS232 interface.
2. The apparatus of claim 1, wherein the relay is an electromagnetic relay.
3. The apparatus of claim 2, wherein the contact resistance of the relay is less than 10m Ω.
4. The apparatus of claim 1, wherein the electronic device is a Micro Control Unit (MCU) or a PCI controller.
5. The device for automatically testing the contact resistance of the conductive slip ring according to claim 1, wherein the relays No. 2M-1 in the relay group A and the relays No. 2(M +1) in the relay group B are communicated to form 1 total test loop; the 2(M +1) -1 relays in the relay A group are communicated with the 2M +1 relays in the relay B group to form 1 total test loop; the total test loop resistance includes a conductive slip ring contact resistance.
6. The apparatus of claim 1, wherein relays No. 2M-1 of relay group a are connected to relays No. 2M of relay group B to form 2 test loops, and the loop resistance does not include conductive slip ring contact resistance.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201520368325.5U CN204740291U (en) | 2015-06-01 | 2015-06-01 | Automatic test conducting slip ring contact resistance's device |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201520368325.5U CN204740291U (en) | 2015-06-01 | 2015-06-01 | Automatic test conducting slip ring contact resistance's device |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104849559A (en) * | 2015-06-01 | 2015-08-19 | 绵阳市维博电子有限责任公司 | Apparatus and method for testing contact resistance of conductive slip ring automatically |
| CN106680630A (en) * | 2016-12-29 | 2017-05-17 | 北京金风科创风电设备有限公司 | Fault testing device and method for conductive slip ring |
| CN110411628A (en) * | 2019-07-01 | 2019-11-05 | 东南大学 | A kind of sliding ring type wheel force snesor dynamic transmission error correcting system and its bearing calibration |
-
2015
- 2015-06-01 CN CN201520368325.5U patent/CN204740291U/en not_active Expired - Fee Related
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104849559A (en) * | 2015-06-01 | 2015-08-19 | 绵阳市维博电子有限责任公司 | Apparatus and method for testing contact resistance of conductive slip ring automatically |
| CN106680630A (en) * | 2016-12-29 | 2017-05-17 | 北京金风科创风电设备有限公司 | Fault testing device and method for conductive slip ring |
| CN106680630B (en) * | 2016-12-29 | 2019-11-19 | 北京金风科创风电设备有限公司 | Conducting slip ring fault testing apparatus and test method |
| CN110411628A (en) * | 2019-07-01 | 2019-11-05 | 东南大学 | A kind of sliding ring type wheel force snesor dynamic transmission error correcting system and its bearing calibration |
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Granted publication date: 20151104 Termination date: 20180601 |
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| CF01 | Termination of patent right due to non-payment of annual fee |