CN204694626U - Sample measuring device - Google Patents
Sample measuring device Download PDFInfo
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- CN204694626U CN204694626U CN201520389397.8U CN201520389397U CN204694626U CN 204694626 U CN204694626 U CN 204694626U CN 201520389397 U CN201520389397 U CN 201520389397U CN 204694626 U CN204694626 U CN 204694626U
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Abstract
The utility model discloses a kind of sample measuring device, comprise: light source, the first optical element, the second optical element, return optical element and detecting unit, wherein, the described light source optical radiation that sends forms main optical path through first, second optical element described successively; Described main optical path is divided into input section, transition section and measuring section by first, second optical element described; Described main optical path is formed reflected light path by after return optical element reflection, and described reflected light path is parallel with main optical path with measuring section at transition section; Along on described main optical path direction, during distance adjustment between described first optical element to the second optical element, or during distance adjustment between the second optical element to return optical element, reflected light path and main optical path keeping parallelism; Described detecting unit comprises the first detector, described first detector can receive main optical path and testing sample interact after optical radiation.Sample measuring device described in the utility model, it can meet versatility requirement.
Description
Technical field
The utility model relates to a kind of sample analysis detection field, particularly a kind of sample measuring device.
Background technology
Spectral technique can carry out analysis to sample and detect, its may be used for detecting comprise in gaseous state, liquid state, solid-state and two kinds and above potpourri physico-chemical property.Absorption spectrum is a kind of spectral technique that practicality is very strong, its ultimate principle is: supposing can under uncared-for prerequisite in the scattering process of light, by the testing sample of incident light by certain length, then measure the intensity of transmitted optical radiation, described transmitted light is defined as absorption relative to the decay of the intensity of incident light radiation.By can obtain the corresponding physico-chemical property of testing sample to light absorbing qualitative and quantitative analysis.The applicable field of spectral instrument manufactured and designed based on described absorption spectroscopy techniques is numerous, comprises the industries such as power plant, environmental protection, cement mill, petrochemical industry chemical industry, glass manufacture.
During the actual use of described spectral instrument, the light of a branch of certain frequency is radiated on testing sample, the medium in sample and Electromagnetic Field, the energy of media interior electromagnetic wave absorption radiation and quantized energy level transition occurs, transits to high level from low-lying level.Its energy that molecule (atom) the structure difference of different medium determines is differential also different, thus the frequency determining absorbable light is also different, by measuring wavelength and the intensity of absorbed light, the characteristic absorption spectrum of measured medium can be obtained, by carrying out qualitative and quantitative analysis to absorption spectrum, the information such as absolute concentration and absolute absorption cross section of molecule (atom) can be obtained.
In the industrial process of reality, because circumstance complication is changeable, require that spectral instrument has stronger versatility, meet the use of different platform with this.But it is poor to there is its versatility of spectral instrument in the market, for different measurement environment, usually need to manufacture different spectral instruments and carry out detection analysis respectively.
For this reason, be necessary to propose a kind of spectrum measurement instruments that can meet versatility requirement.
Utility model content
The purpose of this utility model is to provide a kind of sample measuring device, and it can meet versatility requirement.
Above-mentioned purpose of the present utility model can adopt following technical proposal to realize:
A kind of sample measuring device, comprising: light source, the first optical element, the second optical element, return optical element and detecting unit, and wherein, the optical radiation that described light source sends is successively through described first optical element, the second optical element form main optical path; Described main optical path is divided into input section, transition section and measuring section by described first optical element, the second optical element; Described main optical path is formed reflected light path by after return optical element reflection, and described reflected light path is parallel with main optical path with measuring section at transition section; Along on described main optical path direction, during distance adjustment between described first optical element to the second optical element, or during distance adjustment between the second optical element to return optical element, reflected light path and main optical path keeping parallelism; Described detecting unit comprises the first detector, described first detector can receive main optical path and testing sample interact after optical radiation.
In a preferred embodiment, described light source is any one or several combinations in laser, LED, xenon lamp, infrared light supply, super-radiation light source, SLED, wideband light source.
In a preferred embodiment, two logical light faces of described first optical element are non-parallel, and the optical radiation beam splitting that described light source can send by described logical light face is divided into the first light path, the second light path and main optical path.
In a preferred embodiment, described first light path is provided with the reference chamber of the accommodating standard model of energy;
Described detecting unit also comprises second detector suitable with described reference chamber, and described second detector is for the optical radiation after detecting described first light path and described standard model and interacting.
In a preferred embodiment, described detecting unit also comprises the 3rd detector, and it is arranged in described second light path, for receiving the optical radiation of described second light path.
In a preferred embodiment, described second optical element to be focal power be zero optical element, comprise any one or the multiple combination in sheet glass, meniscus lens, reflecting prism, single wedged window, double-wedge window, optics of telescope group.
In a preferred embodiment, the logical light face of described second optical element is plane.
In a preferred embodiment, described return optical element is any one or the multiple combination in return prism, right-angle prism, prism of corner cube, internal reflection film catoptron, internal reflection film prism square, internal reflection film three mirror contact lens.
In a preferred embodiment, described return optical element comprises testing sample surface of contact and optical reflection face, and described testing sample surface of contact is structurally separated with optical reflection face.
In a preferred embodiment, the optical reflection face of described return optical element is fully reflecting surface and/or is coated with internal reflection film.
Feature of the present utility model and advantage are: sample measuring device described in the utility model is by arranging light source, the first optical element, the second optical element, return optical element and detecting unit.The optical radiation that described light source sends is successively through described first optical element, the second optical element form main optical path, described first optical element, described main optical path is divided into input section by the second optical element, transition section and measuring section, described main optical path is formed reflected light path by after return optical element reflection, described reflected light path is parallel with main optical path along on described main optical path direction at transition section and measuring section, distance between described first optical element to the second optical element, or the distance of the second optical element extremely between return optical element is adjustable, when regulating the distance between described first optical element to the second optical element, or second optical element to distance between return optical element time, described reflected light path is at transition section and measuring section and corresponding main optical path keeping parallelism, when the optical element making described sample measuring device be positioned at main optical path moves along the direction of described main optical path, any impact can not be had to whole light path, it can arrange distance between described first optical element to the second optical element according to practical service environment, or the distance of the second optical element extremely between return optical element is to adapt to different testing environments, thus whole sample measuring device has good versatility.
The utility model also has an additional feature with advantage to be: the sample contacting face withstand corrosion anti-pollution of the second optical element described in the utility model and the sample contacting face of described return optical element are structurally separated with reflecting surface, the sample contacting face also withstand corrosion anti-pollution of described return optical element.Thus whole sample measuring device has extremely strong environmental suitability, can be applied in industrial process field reliably and with long-term.
Accompanying drawing explanation
Figure 1A is the paths front view of a kind of sample measuring device in the utility model embodiment;
Figure 1B is the paths vertical view of a kind of sample measuring device in the utility model embodiment;
Fig. 2 is the paths schematic diagram of a kind of catoptron in prior art;
Fig. 3 is the paths schematic diagram of return optical element in a kind of sample measuring device in the utility model embodiment;
Fig. 4 is the structural representation of return optical element in a kind of sample measuring device in the utility model embodiment;
Fig. 4 .1 is total reflection principle schematic diagram;
Fig. 5 A is the front view of the second optical element in a kind of sample measuring device in the utility model embodiment;
Fig. 5 B is the left view of the second optical element in a kind of sample measuring device in the utility model embodiment;
Fig. 6 is the paths schematic diagram of the second optical element inside in a kind of sample measuring device in the utility model embodiment;
Fig. 7 is the paths schematic diagram of the second optical element inside in a kind of sample measuring device in the utility model embodiment;
Fig. 8 is the paths schematic diagram of the second optical element inside in a kind of sample measuring device in the utility model embodiment;
Fig. 9 is the paths schematic diagram of the second optical element inside in a kind of sample measuring device in the utility model embodiment;
Figure 10 is the paths schematic diagram of the second optical element inside in a kind of sample measuring device in the utility model embodiment;
Figure 11 is the paths schematic diagram of the second optical element inside in a kind of sample measuring device in the utility model embodiment;
Figure 12 A is that in the utility model embodiment, in a kind of sample measuring device, the second optical element arranges schematic diagram;
Figure 12 B is the paths schematic diagram of the second optical element inside in a kind of sample measuring device in the utility model embodiment;
Figure 13 A is that in the utility model embodiment, in a kind of sample measuring device, the second optical element arranges schematic diagram;
Figure 13 B is the paths schematic diagram of the second optical element inside in a kind of sample measuring device in the utility model embodiment;
Figure 14 is the paths schematic diagram of the second optical element inside in a kind of sample measuring device in the utility model embodiment;
Figure 15 is the paths schematic diagram of the second optical element inside in a kind of sample measuring device in the utility model embodiment;
Figure 16 A is the second optical element front view in a kind of sample measuring device in the utility model embodiment;
Figure 16 B is the second optical element vertical view in a kind of sample measuring device in the utility model embodiment;
Figure 17 A is the second optical element front view in a kind of sample measuring device in the utility model embodiment;
Figure 17 B is the second optical element vertical view in a kind of sample measuring device in the utility model embodiment;
Figure 18 is a kind of sample measurement system arrangenent diagram in the utility model embodiment.
Embodiment
Below in conjunction with the drawings and specific embodiments, the technical solution of the utility model is elaborated, these embodiments should be understood and be only not used in restriction scope of the present utility model for illustration of the utility model, after having read the utility model, the amendment of those skilled in the art to the various equivalent form of value of the present utility model has all fallen in the application's claims limited range.
The purpose of this utility model is to provide a kind of sample measuring device, and it can meet versatility requirement.
Referring to Figure 1A and Figure 1B, is a kind of in the utility model embodiment paths front view and vertical view of sample measuring device.Described sample measuring device comprises: light source 2, first optical element 3, second optical element 4, return optical element 6 and detecting unit.Wherein, described light source 2 optical radiation that sends forms main optical path Z through described first optical element 3, second optical element 4 successively.Concrete, as shown in Figure 1B, the optical radiation that light source 2 sends is transmitted to described first optical element 3 along light path 20, then transmit from described first optical element 3, be transmitted to described second optical element 4 along light path 23, then transmit from described second optical element 4, be transmitted to described return optical element 6 along light path 24, after described return optical element 6 reflects, return along the direction paralleled with original light path.In described main optical path Z-direction.Described main optical path Z is divided into input section, transition section and measuring section by described first optical element 3, second optical element 4.Described input section is the region between light source 2 to described first optical element 3; Described transition section is the region between described first optical element 3 to the second optical element 4; Described measuring section is the region between described second optical element 4 to return optical element 6, and described measuring section position is provided with testing sample.Described main optical path Z forms reflected light path after being reflected by return optical element 6, and described reflected light path is parallel with main optical path Z with measuring section at transition section.Concrete, light path 24 forms the light path 25 paralleled with described light path 24 after described return optical element 6 reflects, when optical radiation is transmitted to described second optical element 4 along light path 25, transmits from described second optical element 4, be then transmitted to the first optical element 3 along light path 26.Described reflected light path and main optical path Z are nominal parallel at transition section with the parallel of measuring section, and that particularly ignores after rigging error, foozle equal error is opposing parallel.Along in described main optical path Z-direction, during distance adjustment between described first optical element 3 to the second optical element 4, or during the second distance adjustment between optical element 4 to return optical element 6, reflected light path 25, with main optical path 23 keeping parallelism, and reflected light path 26 and main optical path 24 keeping parallelism; Described detecting unit comprises the first detector 51, described first detector 51 can receive main optical path Z and testing sample interact after optical radiation.
Sample measuring device described in the utility model, along in described main optical path Z-direction, distance L1 between described first optical element 3 to the second optical element 4, or second distance L2 between optical element 4 to return optical element 6 adjustable, when regulating the distance L1 between described first optical element 3 to the second optical element 4, or during the second distance L2 between optical element 4 to return optical element 6, described reflected light path is parallel with corresponding main optical path with measuring section at transition section, make sample measuring device described in transition section and measuring section be positioned at the optical element of main optical path Z move along the direction of described main optical path Z time, any impact can not be had to whole light path, it can arrange distance between described first optical element 3 to the second optical element 4 according to practical service environment, or second distance between optical element 4 to return optical element 6 to adapt to different testing environments, thus whole sample measuring device has good versatility.
Device such as light source 2 grade can be provided with in described input fragment position.Described measuring section is used for accommodating testing sample, and described measuring section can be open measurement environment, also can be closed measurement.The condition that high temperature, high pressure, high dust etc. are severe is generally in described measuring section, corrosion can be produced to optical device such as light source 2 grade in a lot of situation of described testing sample, therefore between described input section and described measuring section, described transition section is provided with, for by described measuring section and described input section isolated, thus safety when ensureing that whole sample measuring device uses, reliable.Under practical service environment, according to concrete environmental parameter difference and/or the difference measuring sample, the length of required transition section is not identical yet.Such as, arranged by dismountable mode or moveable mode between described first optical element 3, second optical element 4.
The concrete form of described light source 2 can be selected according to the difference of the Detection Techniques used and request for utilization, and concrete its can be that any one or several in laser, LED, xenon lamp, infrared light supply, super-radiation light source, SLED, wideband light source combine.
Described first optical element 3 has two logical light faces, is respectively the plane of incidence 31 and exit facet 32, and described two logical light faces are non-parallel.The normal of the optical radiation that described light source 1 sends on the plane of incidence 31 and exit facet 32 has angle, and described angle is greater than 0 degree.Described first optical element 3 can be has at least two nonparallel wedges of logical optical plane.Light splitting is carried out in the optical radiation that light source 2 can send by described first optical element 3, is divided into the first light path 21, second light path 22 and main optical path 23.Described first light path 21, second light path 22 is reference path, concrete, and described first light path 21 is reflected light, and it is reflected back described input section on described plane of incidence 31; Described second light path 22, its plane of incidence 31 through described first optical element 3 returns in described input section from its exit facet 32.Described main optical path 23 is transmitted to described transition section along main optical path Z-direction.Described main optical path 23 is coupled into described measuring section by described second optical element 4.
Described first detector 51 can be positioned at described input fragment position, and the light that described light source 2 sends is along the main optical path Z-direction outgoing running through described first optical element 3, second optical element 4.Described measuring section position is provided with return optical element 6, incident light can be deflected back reflection by described return optical element 6, nominally reflected back reflection light and incident light keeping parallelism by return optical element 6, described return optical element 6 comprises testing sample surface of contact 61 and optical reflection face 62, and described testing sample surface of contact 61 is structurally separated with optical reflection face 62.Such as can comprise, right-angle prism, prism of corner cube, internal reflection film catoptron, internal reflection film prism square, any one or multiple combination in internal reflection film three mirror contact lens.Obviously, the sample contacting face of right-angle prism, prism of corner cube is structurally separated with reflecting surface.
Referring to Fig. 2, is a kind of in prior art paths schematic diagram of catoptron.In prior art, common catoptron 8 is the catoptron 8 of plating external reflection film, it reflectance coating 81 comprising matrix 80 and be plated on described matrix 80 outside surface.As shown in Figure 2, optical radiation is at a certain angle described in directive during catoptron 8, and it is directly reflected by described reflectance coating 81.Actual when using, due to described reflectance coating 81 for sample contacting face is also optical reflection face simultaneously, namely sample contacting face with optical reflection face structure is non-ly be separated setting.Under normal circumstances, the environment residing for catoptron 8 is the rugged environments such as high temperature, high humidity, high dust, high corrosion, when described reflectance coating 81 is directly exposed in such rugged environment, and easily contaminated, corrosion, thus affect reflecting properties.
Referring to Fig. 3, is the paths schematic diagram of return optical element in sample measuring device a kind of in the utility model embodiment.The internal reflection film 600 that described return optical element 6 comprises matrix 60 and is plated on described matrix 60 inside surface, namely described return optical element 6 is internal reflection film catoptron.When described return optical element 6 is for internal reflection film catoptron, it has sample contacting face 61 and optical reflection face 62 that structure is separated, internal reflection film 600 is coated with in described optical reflection face 62, described internal reflection film 600 can be deielectric-coating or the metal film of high reflectance, for strengthening reflecting effect.Because described internal reflection film 600 is for being arranged on the rear plated film inside described optical reflection face 62, when described return optical element 6 be arranged in high temperature, high humidity, high dust, highly corrosive sample time, impurity in described testing sample and/or testing sample can not enter the junction in the optical reflection face 62 of internal reflection film 600 inner and internal reflection film 600 and return optical element 6, therefore the internal reflection film 600 of described return optical element 6 can not be subject to polluting, damaging, and its reflecting properties also can not be affected.So, the environmental suitability of sample measuring device described in the utility model obtains great lifting.
The reflecting surface of described return optical element 6 can also arrange operator guards; such as, when described return optical element 6 is specially right-angle prism, described reflecting prism is that the right angle reflecting surface of right-angle prism is provided with operator guards; concrete, described operator guards is physical construction.By arranging physical construction to protect reflecting surface to avoid scratch, to stop the impurity such as gas and moisture content to contact with reflecting surface.Also can place drying agent near described reflecting surface in addition, or be set to high vacuum between reflecting surface and physical construction or be filled with the modes such as inert gas protect described return optical element 6, prevent its contaminated or damage.Incident ray can reflect by described return optical element 6, the light after reflection and incident ray keeping parallelism, and has certain distance between incident ray and reflection ray, such as 2 millimeters.
Referring to Fig. 4, is the structural representation of return optical element in sample measuring device a kind of in the utility model embodiment.What described return optical element 6 was concrete can be internal reflection film prism square, and it has orthogonal two optical reflection faces and is respectively the first optical reflection face 63 and the second optical reflection face 64.Light path 24, after described first optical reflection face 63 is reflected, is transmitted to described second optical reflection face 64, and again reflect through described second optical reflection face 64 and form light path 25, described light path 24, light path 25 can keep being parallel to each other.
Described return optical element 6 can be plating internal reflection film three mirror contact lens, and it has orthogonal three optical reflection faces between two.Light path 24 forms light path 25 successively after three optical reflection face reflections, and described light path 24, light path 25 can keep being parallel to each other.
Described return optical element 6 also can be made up of with the form of array arrangement the three mirror contact lens of the prism square or plating internal reflection film that plate internal reflection film and/or internal reflection film prism square, sample contacting face is separated with reflecting surface, reflecting surface is coated with internal reflection film, but its concrete form is not restricted.
The optical reflection face of described return optical element 6 can be fully reflecting surface.As shown in Fig. 4 .1, it is total reflection principle schematic diagram.Total reflection refers to that light is from optically denser medium (its refractive index is n1), (its refractive index is n2 to incide optically thinner medium, wherein n1>n2), when incident angle α is greater than critical angle β, wherein β=arcsin (n2/n1), luminous energy all returns the phenomenon of optically denser medium, and now, the interface X of optically denser medium and optically thinner medium is called fully reflecting surface.Light can nondestructively return by described fully reflecting surface.
In addition, the optical reflection face of described return optical element 6 both can be coated with internal reflection film for fully reflecting surface simultaneously.Make incident angle α be greater than critical angle β, now can not only protect reflectance coating and can return harmless for light.
Described reference chamber 54 is arranged in described first light path 21, and it can interact with described first light path 21 and it outwards be transmitted; Described detecting unit also comprises second detector 52 suitable with described reference chamber 54, and described second detector 52 is for the optical radiation after detecting described first light path 21 and interacting with described standard model.Described standard model can be gas, during actual detection, by scanning the absorption peak position of described standard model, the condition of work (such as working current, working temperature etc.) of laser instrument is changed by algorithm, can the wavelength of light source 2 described in real time calibration online, because the wavelength of light source 2 is with environment, particularly temperature very easily changes.When arranging described second detector 52, after making it calibrate the wavelength of described light source 2, measurement result can be made to stablize, and precision is high, reproducible.Further, if when certain parameter of standard model (kind, concentration, temperature or pressure) is known, such as when standard model is gas, and the concentration of gas known time, the photosignal that described second detector receives can be used as reference signal, by algorithm, what can realize sample measuring device carries out on-line proving.
In addition, described detecting unit also comprises the 3rd detector 53, and it is arranged in described second light path 22, for receiving the optical radiation of described second light path 22.The optical radiation of the second light path 22 that described 3rd detector 53 receives can as the reference data of described light source 2 size, thus the problem such as duty, light intensity change of light source 2 can be improved according to the optical radiation information of described second light path 22, substantially increase measuring accuracy and the reliability of whole sample measuring device.Device in described first light path 21 and the second light path 22 can exchange, and namely described reference chamber 54 also can be arranged in the second light path 22.Concrete, when reality uses, only can use wherein road reference light and a main optical path, or only use main optical path without reference light.
Referring to Fig. 5 A and 5B, is the structural representation of the second optical element in sample measuring device a kind of in the utility model embodiment.Described second optical element 4 can be optical element or the system that focal power is zero, also can be the optical element or system with focal power.As shown in Figure 5 B, the shape of the clear aperture of described second optical element 4 is also not construed as limiting, and can be the various shape such as rectangle, circle.The shape of the clear aperture of same described first optical element 3 is also not construed as limiting, and can be the various shape such as rectangle, circle.
When described second optical element 4 is optical element or the optical system of zero for focal power, described second optical element 4 can be any one or multiple combination in sheet glass, meniscus lens, reflecting prism, single wedged window, double-wedge window, optics of telescope group.
Referring to Fig. 6, is the paths schematic diagram of the second optical element inside in sample measuring device a kind of in the utility model embodiment.Concrete, described second optical element 4 can be sheet glass.After light path 23 enters described second optical element 4, directly penetrate described second optical element 4, along light path 24 outgoing, after return optical element 6, return along light path 25 direction parallel with described light path 24, again enter described second optical element 4, after being perforated through described second optical element 4, along light path 26 outgoing.
Referring to Fig. 7, is the paths schematic diagram of the second optical element inside in sample measuring device a kind of in the utility model embodiment.Concrete, described second optical element 4 can be without burnt meniscus lens, and the direction of propagation of its light path is as shown in Figure 7, similar with the sheet glass in described Fig. 6.
Referring to Fig. 8, is the paths schematic diagram of the second optical element inside in sample measuring device a kind of in the utility model embodiment.Concrete, described second optical element 4 can be parallelogram prism, and the direction of propagation of its light path is as shown in Figure 8, similar with the sheet glass in described Fig. 6.
Referring to Fig. 9, is the paths schematic diagram of the second optical element inside in sample measuring device a kind of in the utility model embodiment.Concrete, described second optical element 4 can be right-angle prism, and the direction of propagation of its light path is as shown in Figure 9, after light path 23 is transmitted to described second optical element 4, within it reflectance coating is launched, and transmit from described second optical element 4, the light path 24 that it transmits is perpendicular with light path 23.Light path 24, after return optical element 6, returns along light path 25 direction parallel with described light path 24, again enters described second optical element 4, after being perforated through described second optical element 4, along light path 26 outgoing.
Referring to Figure 10, is the paths schematic diagram of the second optical element inside in sample measuring device a kind of in the utility model embodiment.Concrete, described second optical element 4 can be dove prism, and the direction of propagation of its light path is as shown in Figure 10.
Referring to Figure 11, is the paths schematic diagram of the second optical element inside in sample measuring device a kind of in the utility model embodiment.Concrete, described second optical element 4 can be rhombic prism, and the direction of propagation of its light path is as shown in figure 11.
Refer to Figure 12 A and 12B, in sample measuring device a kind of in the utility model embodiment, the second optical element arranges the paths schematic diagram of schematic diagram and inside.Concrete, described second optical element 4 can be single wedged window group, and namely described second optical element 4 comprises two single wedged windows.As illustrated in fig. 12, two windows with lozenges are parallel to each other placement, and light path 23, light path 24 can be paralleled with light path 25, light path 26 respectively.
Refer to Figure 13 A and 13B, in sample measuring device a kind of in the utility model embodiment, the second optical element arranges the paths schematic diagram of schematic diagram and inside.Concrete, described second optical element 4 can be double-wedge window group, and namely described second optical element 4 comprises two double-wedge windows.As shown in FIG. 13A, two windows with lozenges are parallel to each other placement, and light path 23, light path 24 can be paralleled with light path 25, light path 26 respectively.
Referring to Figure 14, is the paths schematic diagram of the second optical element inside in sample measuring device a kind of in the utility model embodiment.Concrete, described second optical element 4 can be a kind of telescopic system, comprises two convex lens be arranged in parallel, and as shown in figure 14, light path 23, light path 24 can parallel with light path 25, light path 26 respectively in the direction of propagation of its light path.
Referring to Figure 15, is the paths schematic diagram of the second optical element inside in sample measuring device a kind of in the utility model embodiment.Concrete, described second optical element 4 can be another kind of telescopic system, comprises the convex lens and concavees lens that be arranged in parallel, and as shown in figure 15, light path 23, light path 24 can parallel with light path 25, light path 26 respectively in the direction of propagation of its light path.
Can find out from these embodiments, the concrete form of above-mentioned second optical element 4 is also not construed as limiting, under the inspiration of the utility model embodiment, existing also have other optical device or optical system all to can be applicable in the utility model, meets the requirement of versatility with this.
In sample measuring device described in the utility model, described due to described second optical element 4 for focal power be zero optical element or optical system, it makes when adjusting light path, without the need to carrying out special aligning measuring beam or calibration focus to described second optical element 4, described first optical element 3, second optical element 4, the return optical element of return optical element 6 can move in parallel along described main optical path Z-direction according to actual measurement need for environment, thus sample measuring device described in the utility model can according to actual measurement Environmental adjustments the distance L1 of the first optical element 3 to the second optical element 4, and described second optical element 4 is to the distance L2 of the return optical element 6 of return optical element, substantially increase the versatility of whole sample measuring device.
Under an environment specifically used, such as, when detecting the gas in chimney, described second optical element 4 to the distance L1 of described first optical element 3 and the wall thickness of chimney suitable.Described first optical element 3 and the 4th optical element 4 such as, arrange flange respectively and described chimney is connected and sealed.When described chimney wall wall thickness is relatively thick, described L1 can correspondingly increase, when described chimney wall body amass relatively thick relatively thick time, described L1, L2 can correspondingly increase, and on the light path of whole sample measuring device without any impact, therefore sample measuring device versatility described in the utility model is good, is specially adapted to measurement environment complicated and changeable.
In the present embodiment, described first optical element 3, second optical element 4, the manufactured materials of return optical element 6 can be glass, comprise: vitreosil, sapphire, calcium fluoride, adamas, yttrium aluminum garnet (YAG), Si3N4, ZrO2, Al2O3, HfO2 etc., and other are transparent medium within the scope of frequency of light wave, but not as limit, because such material has chemical inertness, its sample contacting face of return optical element 6 that such material makes can not by testing sample, testing sample impurities destroyed, but not as limit, such as sample contacting face is attached with testing sample, impurity in testing sample has chemically inert material.
In sum, sample measuring device described in the utility model is by arranging light source 2, first optical element 3, second optical element 4 and detecting unit, due to along in described main optical path Z-direction, distance L1 between described first optical element 3 to the second optical element 4, or second distance L2 between optical element 4 to the return optical element of return optical element 6 adjustable, when regulating the distance L1 between described first optical element 3 to the second optical element 4, or during the second distance L2 between optical element 4 to the return optical element 6 of return optical element, described reflected light path on transition section and measuring section with main optical path Z keeping parallelism, when the optical element making described sample measuring device be positioned at main optical path Z moves along the direction of described main optical path Z, any impact can not be had to whole light path, it can arrange distance between described first optical element 3 to the second optical element 4 according to practical service environment, or second distance between optical element 4 to the return optical element of return optical element 6 to adapt to different testing environments, thus whole sample measuring device has good versatility.
In addition, light splitting is carried out in the optical radiation that light source 2 can send by described first optical element 3, optical radiation after described light splitting is as reference light path, by corresponding detecting unit, it is detected, the wavelength of its energy automatic calibration light source 2 and/or the reference data as light source intensity size, thus ensure that measuring accuracy and the long-time stability of whole device.
As shown in Figure 1, when the second optical element 4 is the optical element that can change optical path direction, after described second optical element 4, can there is certain deviation with former main optical path Z in light path 23, penetrates along the direction Z1 with the certain angle of former main optical path Z.
Concrete, refer to Figure 16 A, 16B, to be respectively in the utility model embodiment the second optical element front view and vertical view in a kind of sample measuring device.Described second optical element 4 can be single wedged window, and it can change the exit direction of incident light, and the concrete plane of incidence is perpendicular with light path, exit facet and light path out of plumb.As shown in Figure 16 A, through described second optical element 4, there is certain deviation in light path 23, along light path 24 outgoing; When after return optical element 6, return along light path 25 direction being parallel to light path 24, through described second optical element 4, form the light path 26 paralleled with light path 23.
Refer to Figure 17 A, 17B, to be respectively in the utility model embodiment the second optical element front view and vertical view in a kind of sample measuring device.Described second optical element 4 can be double-wedge window, and it can change the exit direction of incident light, and concrete incident light is non-normal incidence.As shown in Figure 17 A, through described second optical element 4, there is certain deviation in light path 23, along light path 24 outgoing; When after return optical element 6, return along light path 25 direction being parallel to light path 24, through described second optical element 4, form the light path 26 paralleled with light path 23.
To sum up, when described second optical element 4 be single wedge shape or double-wedge optical element time, the optical radiation that described light source 2 sends is along successively through described first optical element 3, during the main optical path Z-direction outgoing of the second optical element 4, the deviation of certain angle can be there is in the main optical path Z1 wherein transmitted from described second optical element 4 relative to the main optical path Z transmitted from the first optical element 3, the light path transmitted from described second optical element 4 is along return optical element 6 described in its main optical path Z1 directive, the described optical radiation through sample returns along the direction that main optical path is contrary by described return optical element 6 again.
The main optical path direction of described first optical element 3, second optical element 4 is determined jointly by the structural parameters of the wavelength of light source, incident angle, the first optical element 3 and the second optical element 4 and refractive index, the actual restrictive condition etc. used, for concrete problem, by the knowledge and geometry etc. of applied optics, can conveniently design the embodiment meeting request for utilization.
In the present embodiment, described sample measuring device is by arranging light source 2, first optical element 3, second optical element 4 and detecting unit, light splitting is carried out in the optical radiation that light source 2 can send by described first optical element 3, optical radiation after described light splitting is as reference light path, by corresponding detecting unit, it is detected, the wavelength of its energy automatic calibration light source 2 and/or the reference data as light source intensity size, thus ensure that measuring accuracy and the long-time stability of whole device.
As a kind of preferred implementation of the present embodiment, described first optical element 3 can be identical with the second optical element 4.The first concrete optical element 3 and the second optical element 4 can be wedged window.Due to no matter from individual devices or whole light path, all there is not the logical light face be parallel to each other, therefore greatly reduce optical noise, improve measuring accuracy.Simultaneously because the first optical element 3 is identical with the second optical element 4, the cost of whole instrument is also relatively low.
In addition, when the distance L1 described in actual environment between the first optical element 3 to the second optical element 4 needs to change, the distance L1 of described first optical element 3 to described second optical element 4 can be changed along the direction of main optical path Z equally; When if desired regulating the distance L2 between described second optical element 4 to the return optical element 6 of described return optical element, the direction of the return optical element of described return optical element 6 along described main optical path Z1 can be realized near described second optical element 4 or away from described second optical element 4.Thus, whole sample measuring device has good versatility.
Referring to Figure 18, is sample measurement system arrangenent diagram a kind of in the utility model embodiment.During use, described sample measurement system comprises: the light source control module A that Electricity Federation is logical mutually, outer light path adjusting module B, sample measuring device C, sample measure monitoring modular D, sample Survey control module E, photoelectric detection module F, data acquisition and processing (DAP) module G, data and image output module H.
Described light source control module A, for controlling the opening or closing of described light source 2, frequency modulation (PFM), electric current tuning, thermal tuning etc.
Described outer light path adjusting module B, for changing the signal of the light property that described light source 2 sends, and gives described light source control module A by described signal feedback.
Described sample is measured monitoring modular D, described in monitoring, is accommodated the duty of the 3rd chamber 30 of testing sample, the equivalent absorption light path of fault warning, online sample measuring device C described in real-time calibration, and provides monitor signal to sample Survey control module E.
Described sample Survey control module E, for the relative position relation of optical device in the monitor signal online real time correction sample measuring device C that measuring cell monitoring modular 13 per sample provides.
Described photoelectric detection module F, for receiving and detect the light signal that sample measuring device C exports, and changes into electric signal by light signal, carries out the process such as the filtering of signal, amplification, analog to digital conversion.
Described data acquisition and processing (DAP) module G, the photoelectric figure signal after transforming for photoelectric detection module F described in production wells, and be averaged, the spectral signal process such as concentration calculating.
Described data and image output module H, for exporting data and the image information such as spectrum line, molecular spectrum absorption intensity, concentration value of sample.
In addition, described sample measurement system also can comprise sample pretreatment module I, and it is for carrying out pre-service to testing sample.Described sample pretreatment module I can be used in heating in testing sample, moisture in filtering sample, filtering sample with measure irrelevant other impurity, filtering dusts etc.
The foregoing is only several embodiment of the present utility model, although the embodiment disclosed by the utility model as above, the embodiment that described content just adopts for the ease of understanding the utility model, is not intended to limit the utility model.Any the utility model person of ordinary skill in the field; under the prerequisite not departing from the spirit and scope disclosed by the utility model; any amendment and change can be done on the formal of embodiment and details; but scope of patent protection of the present utility model, the scope that still must define with appended claims is as the criterion.
Claims (10)
1. a sample measuring device, is characterized in that, comprising: light source, the first optical element, the second optical element, return optical element and detecting unit, wherein,
The optical radiation that described light source sends is successively through described first optical element, the second optical element form main optical path;
Described main optical path is divided into input section, transition section and measuring section by described first optical element, the second optical element;
Described main optical path is formed reflected light path by after return optical element reflection, and described reflected light path is parallel with main optical path with measuring section at transition section;
Along on described main optical path direction, during distance adjustment between described first optical element to the second optical element, or during distance adjustment between the second optical element to return optical element, reflected light path and main optical path keeping parallelism;
Described detecting unit comprises the first detector, and described first detector can receive the optical radiation of main optical path.
2. sample measuring device as claimed in claim 1, is characterized in that: described light source is any one or several combinations in laser, LED, xenon lamp, infrared light supply, super-radiation light source, SLED, wideband light source.
3. sample measuring device as claimed in claim 1, it is characterized in that: two logical light faces of described first optical element are non-parallel, the optical radiation beam splitting that described light source can send by described logical light face is divided into the first light path, the second light path and main optical path.
4. sample measuring device as claimed in claim 3, is characterized in that: the reference chamber described first light path being provided with the accommodating standard model of energy;
Described detecting unit also comprises second detector suitable with described reference chamber, and described second detector is for the optical radiation after detecting described first light path and described standard model and interacting.
5. sample measuring device as claimed in claim 3, it is characterized in that: described detecting unit also comprises the 3rd detector, it is arranged in described second light path, for receiving the optical radiation of described second light path.
6. the sample measuring device as described in as arbitrary in claim 1 to 5, it is characterized in that: described second optical element to be focal power be zero optical element, comprise any one or the multiple combination in sheet glass, meniscus lens, reflecting prism, single wedged window, double-wedge window, optics of telescope group.
7. sample measuring device as claimed in claim 6, is characterized in that: the logical light face of described second optical element is plane.
8. sample measuring device as claimed in claim 6, is characterized in that: described return optical element is any one or multiple combination in return prism, right-angle prism, prism of corner cube, internal reflection film catoptron, internal reflection film prism square, internal reflection film three mirror contact lens.
9. sample measuring device as claimed in claim 8, it is characterized in that: described return optical element comprises testing sample surface of contact and optical reflection face, described testing sample surface of contact is structurally separated with optical reflection face.
10. sample measuring device as claimed in claim 9, is characterized in that: the optical reflection face of described return optical element is fully reflecting surface and/or is coated with internal reflection film.
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| CN201520389397.8U CN204694626U (en) | 2015-06-08 | 2015-06-08 | Sample measuring device |
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| CN201520389397.8U CN204694626U (en) | 2015-06-08 | 2015-06-08 | Sample measuring device |
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| CN104897591A (en) * | 2015-06-08 | 2015-09-09 | 苏州谱道光电科技有限公司 | Sample measuring device |
| CN105259125A (en) * | 2015-11-10 | 2016-01-20 | 上海禾赛光电科技有限公司 | Indoor air telemetering device and method |
| CN105305213A (en) * | 2015-12-01 | 2016-02-03 | 苏州谱道光电科技有限公司 | Reflector applied to optical resonator, optical resonator and spectral measurement device |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN104897591A (en) * | 2015-06-08 | 2015-09-09 | 苏州谱道光电科技有限公司 | Sample measuring device |
| CN104897591B (en) * | 2015-06-08 | 2018-09-21 | 苏州谱道光电科技有限公司 | Sample measuring device |
| CN105259125A (en) * | 2015-11-10 | 2016-01-20 | 上海禾赛光电科技有限公司 | Indoor air telemetering device and method |
| CN105259125B (en) * | 2015-11-10 | 2018-10-19 | 上海禾赛光电科技有限公司 | The telemetering equipment and method of indoor gas |
| CN108918441A (en) * | 2015-11-25 | 2018-11-30 | 上海禾赛光电科技有限公司 | A kind of gas remote measurement method and device |
| CN108918441B (en) * | 2015-11-25 | 2020-11-03 | 上海禾赛科技股份有限公司 | Gas remote measuring method and device |
| CN105305213A (en) * | 2015-12-01 | 2016-02-03 | 苏州谱道光电科技有限公司 | Reflector applied to optical resonator, optical resonator and spectral measurement device |
| WO2017092614A1 (en) * | 2015-12-01 | 2017-06-08 | 苏州谱道光电科技有限公司 | Mirror for optical resonator, optical resonator, and spectrometer |
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