CN204679531U - A kind of sheet capacitor high-frequency parameter test fixture - Google Patents
A kind of sheet capacitor high-frequency parameter test fixture Download PDFInfo
- Publication number
- CN204679531U CN204679531U CN201520431853.0U CN201520431853U CN204679531U CN 204679531 U CN204679531 U CN 204679531U CN 201520431853 U CN201520431853 U CN 201520431853U CN 204679531 U CN204679531 U CN 204679531U
- Authority
- CN
- China
- Prior art keywords
- mounting plate
- main body
- upper mounting
- contact
- guide rail
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Landscapes
- Measuring Leads Or Probes (AREA)
Abstract
The utility model discloses a kind of sheet capacitor high-frequency parameter test fixture, comprise jig main body, main body is provided with the lower platform placing measured capacitance, main body is provided with guide rail, guide rail is provided with slide block, described slide block connect one on described lower platform with the upper mounting plate of described platform parallel, a drawing handle is arranged in main body, operating grip makes upper mounting plate move up and down along guide rail, described lower platform is arranged multiple containing capacity measurement slide glass collet, on described upper mounting plate, corresponding described multiple capacity measurement slide glass is provided with multiple spring contact.The utility model adopts elasticity inner wire to meet the structure of coaxial transmission requirement; sheet capacitor is connected, there is extremely low-loss feature, more can accurately test sheet capacitor microwave parameters; can stable connection be ensured, product surface to be measured can be protected again not receive damage.
Description
Technical field
The utility model relates to the instrument accurately measured, particularly a kind of sheet capacitor high-frequency parameter test fixture, and this fixture application, in microwave experiment room environmental, also may be used for thermometrically during microwave device batch production.
Background technology
Along with the development of microwave technology, microwave device volume is more and more less, application surface is more and more extensively sent out, in utilization, how to extract such micro devices microwave parameters just become a large difficult point, such electric capacity market, without the means accurately extracting microwave parameters, microstrip circuit and gold ball bonding can be adopted to tap into row and test, but after the test of these class methods, product cannot reuse and sell, and test accuracy is poor, there is suitable limitation.
Summary of the invention
The purpose of this utility model is to provide a kind of sheet capacitor high-frequency parameter test fixture, and test clip has extremely low-loss feature, more can accurately test sheet capacitor microwave parameters.
To achieve these goals, scheme of the present utility model is: a kind of sheet capacitor high-frequency parameter test fixture, comprise jig main body, main body is provided with the lower platform placing measured capacitance, main body is provided with the guide rail perpendicular to described platform, guide rail is provided with slide block, described slide block connect one on described lower platform with the upper mounting plate of described platform parallel, a drawing handle is arranged in main body, handle movable axis connects upper mounting plate, operating grip makes upper mounting plate move up and down along guide rail, wherein, described lower platform is arranged multiple containing capacity measurement slide glass collet, the electric signal being provided with the electric capacity pole be connected with capacity measurement slide glass in the bottom of lower platform draws interface, on described upper mounting plate, corresponding described multiple capacity measurement slide glass is provided with multiple spring contact, described spring contact and the surface of contact of measured capacitance are the surface of contact corresponding with measured capacitance surface size, be provided with in described upper mounting plate upper surface be connected with spring contact draw interface as another pole electric signal of electric capacity.
Scheme is further: described spring contact comprises contact stem and adapter sleeve, is provided with spring in adapter sleeve, and contact stem is stuck in adapter sleeve and withstands on spring.
Scheme is further: described contact stem is stepped stem shape.
The beneficial effects of the utility model are: the utility model is by improving 50 ohm of microwave coaxial transmission lines, elasticity inner wire is adopted to meet the structure of coaxial transmission requirement, sheet capacitor is connected, there is extremely low-loss feature, more can accurately test sheet capacitor microwave parameters.In order to this object, the coaxial inner conductor of 50 ohm transmission line has been accomplished the diameter corresponding to capacitor size, and inner wire has certain retractility, can stable connection be ensured, product surface to be measured can be protected again not receive damage.
Below in conjunction with drawings and Examples, the utility model is described in detail.
Accompanying drawing explanation
Fig. 1 is the utility model one-piece construction schematic diagram;
Fig. 2 is the utility model reference test bar structural representation.
Embodiment
A kind of sheet capacitor high-frequency parameter test fixture, as shown in Figure 1, comprise jig main body, main body is provided with the lower platform 1 placing measured capacitance, main body is provided with the guide rail 2 perpendicular to described platform, guide rail is provided with slide block 3, described slide block connect one on described lower platform with the upper mounting plate 4 of described platform parallel, a drawing handle 5 is arranged in main body, handle movable axis 501 connects upper mounting plate, operating grip makes upper mounting plate move up and down along guide rail, wherein, described lower platform is arranged multiple containing capacity measurement slide glass collet 6, the electric signal being provided with the electric capacity pole be connected with capacity measurement slide glass in the bottom of lower platform draws interface (not shown), on described upper mounting plate, corresponding described multiple capacity measurement slide glass is provided with multiple spring contact 7, described spring contact and the surface of contact of measured capacitance are the surface of contact corresponding with measured capacitance surface size, be provided with in described upper mounting plate upper surface be connected with spring contact draw interface (not shown) as another pole electric signal of electric capacity.
In embodiment: described spring contact comprises contact stem 701 and adapter sleeve 702, the front end face 7011 of contact stem is the face contacted with testing capacitor, and be provided with spring 703 in adapter sleeve, contact stem is stuck in adapter sleeve and withstands on spring.
In embodiment: described contact stem is stepped stem shape, and test analysis is known, in stepped stem shape coaxial transmission structure, inner wire adds chip capacity, standing wave and Insertion Loss more satisfactory, Electric Field Distribution is even.This structure meets high sheet transmission requirement.
The present embodiment equipment carries out batch testing because of client, does lot of experiments and screening to product, and therefore to measuring accuracy, especially repeatability requires higher.Therefore structure adopts vertical depression pattern, and use guide rail to locate from jig main body to test slides, when upper mounting plate is pressed down, transversal moving component is at micron order, ensure that each consistance connected.Adopt TRL calibration simultaneously, reference surface is calibrated to be measured two ends; The insulating material that the material selection specific inductive capacity of to be measured periphery is as far as possible low, is affected and is dropped to minimum, and carried out electrical property emulation to dependency structure.
The present embodiment structure relates to a large amount of tests and screening because of the product of test, therefore requires to be measured convenient and fast connection on fixture, can not make to be screwed or to weld.This structure can be placed directly in test slides to be measured, pulls handle, and the upper mounting plate as briquetting is sunk, and briquetting bottom resilient spring contact transmission line just can be pressed in test slides to be measured, completes radio frequency simultaneously and connects.Because testing capacitance size category is more, the contact stem specification in embodiment needs the electric capacity chip adapting to actual test, and the chip that contact end face will cover overall dimension scope is tested.When testing the electric capacity of different size specification, only need corresponding slide glass to rotate in front.
Claims (3)
1. a sheet capacitor high-frequency parameter test fixture, comprise jig main body, main body is provided with the lower platform placing measured capacitance, main body is provided with the guide rail perpendicular to described platform, guide rail is provided with slide block, described slide block connect one on described lower platform with the upper mounting plate of described platform parallel, a drawing handle is arranged in main body, handle movable axis connects upper mounting plate, operating grip makes upper mounting plate move up and down along guide rail, it is characterized in that, described lower platform is arranged multiple containing capacity measurement slide glass collet, the electric signal being provided with the electric capacity pole be connected with capacity measurement slide glass in the bottom of lower platform draws interface, on described upper mounting plate, corresponding described multiple capacity measurement slide glass is provided with multiple spring contact, described spring contact and the surface of contact of measured capacitance are the surface of contact corresponding with measured capacitance surface size, be provided with in described upper mounting plate upper surface be connected with spring contact draw interface as another pole electric signal of electric capacity.
2. a kind of sheet capacitor high-frequency parameter test fixture according to claim 1, it is characterized in that, described spring contact comprises contact stem and adapter sleeve, is provided with spring in adapter sleeve, and contact stem is stuck in adapter sleeve and withstands on spring.
3. a kind of sheet capacitor high-frequency parameter test fixture according to claim 2, it is characterized in that, described contact stem is stepped stem shape.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520431853.0U CN204679531U (en) | 2015-06-19 | 2015-06-19 | A kind of sheet capacitor high-frequency parameter test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520431853.0U CN204679531U (en) | 2015-06-19 | 2015-06-19 | A kind of sheet capacitor high-frequency parameter test fixture |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN204679531U true CN204679531U (en) | 2015-09-30 |
Family
ID=54179214
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201520431853.0U Active CN204679531U (en) | 2015-06-19 | 2015-06-19 | A kind of sheet capacitor high-frequency parameter test fixture |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN204679531U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106018975A (en) * | 2016-07-15 | 2016-10-12 | 吴江佳亿电子科技有限公司 | Measurement device capable of online automatically detecting capacitance of chip high-voltage ceramic dielectric capacitor |
| CN107167780A (en) * | 2017-05-27 | 2017-09-15 | 中国电子科技集团公司第四十研究所 | A kind of blindmate T/R module testing fixtures |
-
2015
- 2015-06-19 CN CN201520431853.0U patent/CN204679531U/en active Active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106018975A (en) * | 2016-07-15 | 2016-10-12 | 吴江佳亿电子科技有限公司 | Measurement device capable of online automatically detecting capacitance of chip high-voltage ceramic dielectric capacitor |
| CN106018975B (en) * | 2016-07-15 | 2018-10-09 | 吴江佳亿电子科技有限公司 | A kind of measuring device of energy online automatic detection chip high voltage ceramic capacitor capacitance |
| CN107167780A (en) * | 2017-05-27 | 2017-09-15 | 中国电子科技集团公司第四十研究所 | A kind of blindmate T/R module testing fixtures |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN202583262U (en) | Elastic probe | |
| CN110784270B (en) | BGA port radio frequency transmission performance detection device and detection method | |
| CN204679531U (en) | A kind of sheet capacitor high-frequency parameter test fixture | |
| CN202994854U (en) | Noise parameter testing clamp for microwave low noise packaging device | |
| CN101173970B (en) | Chip-based prober for high frequency measurements and methods of measuring | |
| CN205749844U (en) | A kind of power supply ripple test Apparatus and system | |
| CN107238505B (en) | A kind of fixture for SAW filter the high and low temperature test | |
| CN105445598A (en) | Portable device for testing conduction or insulation of cable, and method | |
| TW201439544A (en) | Semiconductor chip probe and the conducted EME measurement apparatus with the semiconductor chip probe | |
| CN204359822U (en) | A kind of test fixture for pcb board | |
| CN107850625B (en) | Radio frequency detection device | |
| CN107505567B (en) | High-speed signal detection device for electronic circuit board | |
| CN203069626U (en) | Clamping device for ammeter detection | |
| CN202333379U (en) | Microstrip line or SMD (surface mount device) circuit board microwave test adapter | |
| CN205384297U (en) | Individual layer piece formula ceramic dielectric capacitor high frequency S parameter testing anchor clamps | |
| CN208621655U (en) | Micro-strip device test fixture | |
| CN102608365A (en) | Elastic probe | |
| CN104267229A (en) | Micro capacitor test connection device | |
| CN202794249U (en) | Test probe for surface-mount discrete semiconductor device | |
| CN108957047B (en) | Microstrip device test fixture | |
| US6288555B1 (en) | Fixture for use in measuring an electrical characteristic of a pogo pin | |
| CN103293434B (en) | Automatic loopback test set for 2M cables | |
| CN209471158U (en) | A kind of radio-frequency devices test probe of embedded inductance | |
| CN203502446U (en) | Electrical performance gravity probe used for materials and devices | |
| CN219328853U (en) | Inductance test fixture of ferrite toroidal core |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |