CN204631133U - A kind of compression impedance test device - Google Patents

A kind of compression impedance test device Download PDF

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Publication number
CN204631133U
CN204631133U CN201520393643.7U CN201520393643U CN204631133U CN 204631133 U CN204631133 U CN 204631133U CN 201520393643 U CN201520393643 U CN 201520393643U CN 204631133 U CN204631133 U CN 204631133U
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China
Prior art keywords
probe
compression
test device
conducting foam
support bar
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CN201520393643.7U
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Chinese (zh)
Inventor
张东琴
陈先锋
衡先梅
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Longyang Electronics (Kunshan) Co.,Ltd.
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LONG YOUNG ELECTRONICS (KUNSHAN) CO Ltd
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Abstract

The utility model discloses a kind of compression impedance test device, for the compression impedance of testing conductive foam, this device comprise base, support bar, be located on support bar for coordinate the first probe of clamping conducting foam and the second probe, for show the pressure that conducting foam bears pressure meter, respectively pop one's head in first and second pop one's head in the compression impedance for measuring conducting foam that circuitry phase is connected the first measurement mechanism, be located on base for measuring conducting foam by the second measurement mechanism of the height after compressing.The utility model device is compressed conducting foam by the first probe and the second probe, by conducting foam can be measured by the height after compressing with the second synchronization-moving read-out display of popping one's head in, the compression resistance value of conducting foam under this height can be measured by microhmmeter, and can repeated measurement compare.This apparatus structure is simple, and convenient test is quick.

Description

A kind of compression impedance test device
Technical field
the utility model relates to a kind of compression impedance test device.
Background technology
the conducting foam that solution electronic product electromagnetic wave shielding anti-interference problem is often selected in the market has: the conducting foam of conducting foam, Copper Foil or the aluminium foil parcel that conductive fibre fabric is wrapped up and all-directional conductive sponge etc.Wherein all-directional conductive foam XYZ tri-spindle guide leads to, performance is more excellent, required shape be can directly be die-cut into, electronic product and military project, the space industries such as PDP TV, LCD display, LCD TV, mobile phone, notebook, MP3, communication cabinet, Medical Instruments have been widely used in.Because its pressure and Electromagnetic Interference problem in different applications are all not quite similar, therefore require deviser or manufacturer before manufacture, carry out the ratio of compression resistance value test of different-thickness under multiple different pressures, to solve Electromagnetic Interference problem in practical application.Current Normal practice is: product is die-cut complete after test its thickness and resistance value respectively, then practical set draws conclusion on probation.Test period is longer, and cannot obtain the measured object compression conductive resistance value that presents of different-thickness at various pressures fast, and work efficiency is lower.
Utility model content
the purpose of this utility model is to provide a kind of compression impedance test device for testing conductive foam, and this apparatus structure is simple, and convenient test is quick.
for achieving the above object, the technical solution adopted in the utility model is:
a kind of compression impedance test device, for the compression impedance of testing conductive foam, described compression impedance test device comprises base, be located at the support bar on described base, be located at the first probe and the second probe for coordinating the described conducting foam of clamping on described support bar, to pop one's head in the pressure meter for showing the pressure that described conducting foam bears be connected with described first, pop one's head in described first respectively and the described second first measurement mechanism of popping one's head in the compression impedance for measuring described conducting foam that circuitry phase is connected, be located at being popped one's head in and rear the second measurement mechanism highly of described second probe compression by described first for measuring described conducting foam on described base.
preferably, described pressure meter is located on described support bar, and described pressure meter and described first is popped one's head in and is fixedly connected, and described first probe and described second probe vertically distribute and described first probe is located at the described second top of popping one's head in.
more preferably, described pressure meter is vertically movable to be located on described support bar, and described compression impedance test device also comprises the first driving handle for driving described pressure meter movable on described support bar.
preferably, described compression impedance test device also comprises vertically movablely is located at the support platform on described support bar, the second driving handle for driving described support platform movable on described support bar, and described second probe is fixedly arranged in described support platform.
more preferably, described second measurement mechanism is vernier caliper, described vernier caliper comprises blade and read-out display, described blade vertically distributes and is fixedly arranged on described base, what described read-out display slided be sheathed on described blade and be fixedly connected with described support platform, described read-out display, for showing the distance that its in the vertical direction moved.
preferably, described first probe and described second probe are copper coin.
preferably, described first measurement mechanism is microhmmeter.
due to the utilization of technique scheme, the utility model compared with prior art has following advantages: the utility model device is compressed conducting foam by the first probe and the second probe, can the pressure that is subject to of Real-Time Monitoring conducting foam by being located at pressure meter on the first probe, by conducting foam can be measured by the height after compressing with the second synchronization-moving read-out display of popping one's head in, conducting foam can be measured by the compression resistance value under compression certain altitude by microhmmeter, and can repeated measurement to compare.This apparatus structure is simple, and convenient test is quick.
Accompanying drawing explanation
accompanying drawing 1 is the utility model apparatus structure schematic diagram.
wherein: 1, base; 2, support bar; 3, the first probe; 4, the second probe; 5, conducting foam; 6, pressure meter; 7, the first measurement mechanism; 8, the second measurement mechanism; 81, blade; 82, read-out display; 9, the first driving handle; 10, support platform; 11, the second driving handle.
Embodiment
below in conjunction with accompanying drawing, the technical solution of the utility model is further elaborated.
shown in Figure 1, above-mentioned one compression impedance test device, for the compression impedance of testing conductive foam 5.This compression impedance test device comprises base 1, be located at the support bar 2 vertically distributed on base 1, movable the first probe 3 and the second probe 4 for coordinating clamping conducting foam 5 be located on support bar 2, to pop one's head in the 3 pressure meters 6 for showing the pressure that conducting foam 5 bears be connected with first, to pop one's head in first respectively 3 and second first measurement mechanisms 7 of popping one's head in the compression impedance for measuring conducting foam 5 that 4 circuitry phases are connected, be located on base 1 for measure conducting foam 5 by first probe 3 and second probe 4 compression after height the second measurement mechanism 8.This first probe 3 and the second probe 4 are copper coin, and its outside surface is through gold-plated process, can prevent from scratching and oxidation.This first measurement mechanism 7 is microhmmeter, during test compression impedance, this microhmmeter is transferred to ohms range.
in the present embodiment, this pressure meter 6 is vertically movable to be located on support bar 2, and compression impedance test device also comprises the first driving handle 9 for driving pressure meter 6 movable on support bar 2.Pop one's head in and 3 to be fixedly connected in the lower end of this pressure meter 6 and first, the first probe 3 and the vertically distribution of the second probe 4 and the first probe 3 are located at the top of the second probe 4, and the conducting foam 5 of test is placed on the second probe 4.By this first driving handle 9, when the second probe 4 is fixing, the first probe 3 can be ordered about and compress conducting foam 5 downwards.
this compression impedance test device also comprises vertically movablely is located at the support platform 10 on support bar 2, the second driving handle 11 for driving this support platform 10 movable on support bar 2, this second probe 4 is fixedly arranged on 10 upper surfaces of support platform, by this second driving handle 11, when the first probe 3 is fixing, the second probe 4 can be ordered about and upwards compress the first probe 3 with conducting foam 5.
in the present embodiment, this second measurement mechanism 8 is vernier caliper, and this vernier caliper comprises blade 81 and read-out display 82.Blade 81 vertically distributes and its lower end is fixedly arranged on base 1, and what this read-out display 82 slided to be sheathed on blade 81 and to be fixedly connected with support platform 10.This read-out display 82 follows for showing its in the vertical direction the distance that support platform 10 moved together.
the concrete course of work setting forth lower the present embodiment below:
when needing 70% compression impedance of testing conductive foam 5, first regulating the first driving handle 9 to make pressure meter 6 promote the first probe 3 to vacant state, pressure meter 6 is made zero; Then the second driving handle 11 is regulated to make the second probe 4 move up with support platform 10 and compress the first probe 3, substantially seamless to guarantee between the first probe 3 and the second probe 4,, now microhmmeter and read-out display 82 are made zero for standard in reading display 5kg on pressure 6.
then the second driving handle 11 is regulated to make the second probe 4 move down certain distance, conducting foam 5 is placed on the second probe 4, the height of this conducting foam 5 is d, continue adjustment second driving handle 11, conducting foam 5 is pressed to the first probe 3, until when read-out display 82 reading is shown as 0.7d, this conducting foam 5 is 0.3d by the height compressed, and now microhmmeter can read 70% compression resistance value of conducting foam 5.
repeatedly repeat above-mentioned steps, under same compression height condition, read multiple compression resistance value, after contrast, can learn whether the compression resistance value of conducting foam 5 after being compressed to certain altitude is stablized.
when needing to measure conducting foam 5 compression impedance under a certain pressure, when only need demonstrate the force value needing test on pressure meter, directly read the compression resistance value of this conducting foam 5 from microhmmeter.
above-described embodiment is only for illustrating technical conceive of the present utility model and feature; its object is to person skilled in the art can be understood content of the present utility model and be implemented; protection domain of the present utility model can not be limited with this; all equivalences done according to the utility model Spirit Essence change or modify, and all should be encompassed in protection domain of the present utility model.

Claims (7)

1. a compression impedance test device, for the compression impedance of testing conductive foam, it is characterized in that: described compression impedance test device comprises base, be located at the support bar on described base, be located at the first probe and the second probe for coordinating the described conducting foam of clamping on described support bar, to pop one's head in the pressure meter for showing the pressure that described conducting foam bears be connected with described first, pop one's head in described first respectively and the described second first measurement mechanism of popping one's head in the compression impedance for measuring described conducting foam that circuitry phase is connected, be located at being popped one's head in and rear the second measurement mechanism highly of described second probe compression by described first for measuring described conducting foam on described base.
2. one compression impedance test device according to claim 1, it is characterized in that: described pressure meter is located on described support bar, described pressure meter and described first is popped one's head in and is fixedly connected, and described first probe and described second probe vertically distribute and described first probe is located at the described second top of popping one's head in.
3. one compression impedance test device according to claim 2, it is characterized in that: described pressure meter is vertically movable to be located on described support bar, and described compression impedance test device also comprises the first driving handle for driving described pressure meter movable on described support bar.
4. one compression impedance test device according to claim 1, it is characterized in that: described compression impedance test device also comprises vertically movablely is located at the support platform on described support bar, the second driving handle for driving described support platform movable on described support bar, and described second probe is fixedly arranged in described support platform.
5. one compression impedance test device according to claim 4, it is characterized in that: described second measurement mechanism is vernier caliper, described vernier caliper comprises blade and read-out display, described blade vertically distributes and is fixedly arranged on described base, what described read-out display slided be sheathed on described blade and be fixedly connected with described support platform, described read-out display, for showing the distance that its in the vertical direction moved.
6. one compression impedance test device according to claim 1, is characterized in that: described first probe and described second probe are copper coin.
7. one compression impedance test device according to claim 1, is characterized in that: described first measurement mechanism is microhmmeter.
CN201520393643.7U 2015-06-09 2015-06-09 A kind of compression impedance test device Active CN204631133U (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104914311A (en) * 2015-06-09 2015-09-16 隆扬电子(昆山)有限公司 Compression impedance test device
CN105115547A (en) * 2015-10-10 2015-12-02 深圳鸿泽自动化科技有限公司 Conductive foam testing method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104914311A (en) * 2015-06-09 2015-09-16 隆扬电子(昆山)有限公司 Compression impedance test device
CN105115547A (en) * 2015-10-10 2015-12-02 深圳鸿泽自动化科技有限公司 Conductive foam testing method

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CP01 Change in the name or title of a patent holder

Address after: 215300 No.99, Shunchang Road, Zhoushi Town, Kunshan City, Suzhou City, Jiangsu Province

Patentee after: Longyang Electronics (Kunshan) Co.,Ltd.

Address before: 215300 No.99, Shunchang Road, Zhoushi Town, Kunshan City, Suzhou City, Jiangsu Province

Patentee before: LONG YOUNG ELECTRONICS (KUNSHAN) Co.,Ltd.

CP01 Change in the name or title of a patent holder