CN204424617U - A kind of semiconductor device synchronism detection aligning gear - Google Patents
A kind of semiconductor device synchronism detection aligning gear Download PDFInfo
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- CN204424617U CN204424617U CN201420871750.1U CN201420871750U CN204424617U CN 204424617 U CN204424617 U CN 204424617U CN 201420871750 U CN201420871750 U CN 201420871750U CN 204424617 U CN204424617 U CN 204424617U
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- semiconductor device
- testing needle
- aligning gear
- supporting bracket
- synchronism detection
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Abstract
The utility model discloses a kind of semiconductor device synchronism detection aligning gear, comprise for the rotating disk of the semiconductor device that goes forward one by one and drive unit thereof, correction supporting bracket and the motor, testing needle device, two correcting sheets that are fixed in described correction supporting bracket, two correcting sheet upper ends are connected to described motor output shaft both sides by carriage horizontal slip, the bottom of two correcting sheets is connected by the first extension spring, and the top of described testing needle device is connected with correction supporting bracket by the second extension spring; The output shaft of described motor is fixed with for promoting cam that two correcting sheets open and for promoting the eccentric wheel that described testing needle device declines.Semiconductor device synchronism detection aligning gear disclosed in the utility model adopts the same power source to realize aligning gear and mechanism for testing synchronization action, both simplifies the structure, has saved cost, the efficiency turn improving test and correct.
Description
[technical field]
The utility model relates to semiconductor device testing apparatus technical field, is specifically related to a kind of semiconductor device synchronism detection aligning gear.
background technology]
The encapsulation of LED is requisite link in semiconductor device production process, the capital equipment of encapsulation has bonder, bonding equipment, point gum machine, light splitting machine, automatic taping-machine etc., the positioner of components and parts is one of principal organ of automatic light splitting machine, major function is corrected the position of product before testing electronic component products, the quality of correction mass directly affects the electrical quantity of light splitting machine test and the accuracy of optical parameter, correction mechanism for testing in the past, correct and adopt motor or cylinder to drive, test adopts motor to drive, that is the power source of aligning gear and mechanism for testing is separate, this mode complex structure, cost is high.
summary of the invention]
For above-mentioned defect of the prior art, the utility model discloses a kind of semiconductor device synchronism detection aligning gear, adopt the same power source to realize aligning gear and mechanism for testing synchronization action, both simplified the structure, saved cost, the efficiency turn improving test and correct.
The technical solution of the utility model is as follows:
A kind of semiconductor device synchronism detection aligning gear, comprise for the rotating disk of the semiconductor device that goes forward one by one and drive unit thereof, correction supporting bracket and the motor, testing needle device, two correcting sheets that are fixed in described correction supporting bracket, two correcting sheet upper ends are connected to described motor output shaft both sides by carriage horizontal slip, the bottom of two correcting sheets is connected by the first extension spring, and the top of described testing needle device is connected with correction supporting bracket by the second extension spring; The output shaft of described motor is fixed with for promoting cam that two correcting sheets open and for promoting the eccentric wheel that described testing needle device declines.
In semiconductor device synchronism detection aligning gear of the present utility model, the output shaft of motor is fixed with for promoting cam that two correcting sheets open and for promoting the eccentric wheel that described testing needle device declines, when motor rotates forward, two correcting sheets move to electrical axis under the first extension spring active force, two correcting sheets are closed to be corrected, and testing needle device moves down test under the eccentric active force of driven by motor simultaneously; When motor reverse rotation, two correcting sheets deviate from electrical axis and move under cam action forces, and two correcting sheets open, and testing needle device moves up under the active force of the second extension spring, and testing needle device leaves the rotatable feeding of rear rotating disk; Repeat test and correction work that said process continuously, synchronously can complete semiconductor device; Semiconductor device synchronism detection aligning gear of the present utility model adopts the same power source to realize aligning gear and mechanism for testing synchronization action, both simplifies the structure, has saved cost, the efficiency turn improving test and correct.
accompanying drawing illustrates]
Fig. 1 is the structural representation of the utility model embodiment;
Fig. 2 is the structural representation at another visual angle of Fig. 1;
Fig. 3 is the vertical view of Fig. 1;
Fig. 4 is the partial view of Fig. 1;
Fig. 5 is the partial view of Fig. 2.
embodiment]
Below in conjunction with accompanying drawing, embodiment of the present utility model is elaborated.
As shown in Figures 1 to 5, semiconductor device synchronism detection aligning gear of the present utility model comprises for the rotating disk 15 of the semiconductor device that goes forward one by one and drive unit thereof, correction supporting bracket 1 and the motor 2, testing needle device, two correcting sheets 7 that are fixed in described correction supporting bracket 1, the upper end of two correcting sheets 7 is connected to the output shaft both sides of described motor 2 by carriage horizontal slip, the bottom of two correcting sheets 7 is connected by the first extension spring 14, and the top of described testing needle device is connected with correction supporting bracket 1 by the second extension spring 16; The output shaft of described motor 2 is fixed with for promoting cam 4 that two correcting sheets open and for promoting the eccentric wheel 13 that described testing needle device declines;
In semiconductor device synchronism detection aligning gear of the present utility model, the output shaft of motor 2 is fixed with for promoting cam 4 that two correcting sheets 7 open and for promoting the eccentric wheel 13 that described testing needle device declines, when motor 2 rotates forward, two correcting sheets 7 move to the axle center of motor 2 under the active force of the first extension spring 14, two correcting sheets 7 are closed to be corrected, and testing needle device moves down test under the active force of motor 2 with movable eccentric wheel 13 simultaneously; When motor 2 reverse rotation, the axle center that two correcting sheets 7 deviate from motor 2 under the active force of cam 4 is moved, and two correcting sheets 7 open, and testing needle device moves up under the active force of the second extension spring 16, and testing needle device leaves the rotatable feeding of rear rotating disk 15; Repeat test and correction work that said process continuously, synchronously can complete semiconductor device; It should be noted that, in the present embodiment, the comparative descriptions course of work is just convenient in the forward of motor 2 and reverse rotation, does not form concrete restriction; In concrete enforcement, deflecting relationship on motor output shaft ensures by cam 4 and eccentric wheel 13 for aligning gear and mechanism for testing synchronous; Semiconductor device synchronism detection aligning gear of the present utility model adopts the same power source to realize aligning gear and mechanism for testing synchronization action, both simplifies the structure, has saved cost, the efficiency turn improving test and correct.
Preferably, described correction supporting bracket 1 is fixed with first line slideway 3 corresponding with described two correcting sheets 7, described first line slideway 3 is provided with two slide blocks corresponding with two correcting sheets 7 and installs connecting plate 5, and two correcting sheets 7 are respectively installed connecting plate 5 with a slide block and are fixedly connected with; By arranging the first line slideway 3 and two slide blocks installation connecting plate 5, being both convenient to the slip realizing two correcting sheets 7, the direction of two correcting sheet 7 movements can have been ensured again, and be conducive to realizing synchronously;
Further, the top that described slide block installs connecting plate 5 is provided with the tangent bearing 6 that contact outside with described cam 4, the sliding friction that cam 4 and slide block are installed between connecting plate 5 becomes rolling friction, reduce frictional force, reduce the resistance of relative motion between cam 5 and installation connecting plate 5, semiconductor device synchronism detection aligning gear of the present utility model is run more smooth;
Preferably, the second line slideway 9 that semiconductor device synchronism detection aligning gear of the present utility model also comprises test supporting bracket 8 and is fixed in test supporting bracket 8, described testing needle device is fixed on the slide block on the second line slideway 9, ensure the direction of testing needle device movement, be conducive to realizing synchronous accurate;
Further, described testing needle device comprises testing needle 11 and testing needle fixed head 10, and described testing needle fixed head 10 is fixedly connected with described slide block, and described testing needle 11 slides along the second line slideway 9 under the drive of testing needle fixed head 10 and slide block;
Further, also comprise the eccentric wheel contact block 12 for transmission be located between described slide block and eccentric wheel 13, so that implementation space layout.
Above-described embodiment of the present invention, does not form limiting the scope of the present invention.Any amendment done within the spirit and principles in the present invention, equivalent replacement and improvement etc., all should be included within claims of the present invention.
Claims (6)
1. a semiconductor device synchronism detection aligning gear, it is characterized in that: comprise for the rotating disk of the semiconductor device that goes forward one by one and drive unit thereof, correction supporting bracket and the motor, testing needle device, two correcting sheets that are fixed in described correction supporting bracket, two correcting sheet upper ends are connected to described motor output shaft both sides by carriage horizontal slip, the bottom of two correcting sheets is connected by the first extension spring, and the top of described testing needle device is connected with correction supporting bracket by the second extension spring; The output shaft of described motor is fixed with for promoting cam that two correcting sheets open and for promoting the eccentric wheel that described testing needle device declines.
2. semiconductor device synchronism detection aligning gear as claimed in claim 1, it is characterized in that: described correction supporting bracket is fixed with first line slideway corresponding with described two correcting sheets, described first line slideway is provided with two slide blocks corresponding with two correcting sheets and installs connecting plate, and two correcting sheets are respectively installed connecting plate with a slide block and are fixedly connected with.
3. semiconductor device synchronism detection aligning gear as claimed in claim 2, is characterized in that: the top that described slide block installs connecting plate is provided with the tangent bearing that contact outside with described cam.
4. semiconductor device synchronism detection aligning gear as claimed in claim 1, is characterized in that: also comprise test supporting bracket and be fixed on the second line slideway in test supporting bracket, described testing needle device is fixed on the slide block on the second line slideway.
5. semiconductor device synchronism detection aligning gear as claimed in claim 4, it is characterized in that: described testing needle device comprises testing needle and testing needle fixed head, described testing needle fixed head is fixedly connected with described slide block.
6. semiconductor device synchronism detection aligning gear as claimed in claim 5, is characterized in that: also comprise the eccentric wheel contact block for transmission be located between described slide block and eccentric wheel.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420871750.1U CN204424617U (en) | 2014-12-31 | 2014-12-31 | A kind of semiconductor device synchronism detection aligning gear |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420871750.1U CN204424617U (en) | 2014-12-31 | 2014-12-31 | A kind of semiconductor device synchronism detection aligning gear |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN204424617U true CN204424617U (en) | 2015-06-24 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201420871750.1U Active CN204424617U (en) | 2014-12-31 | 2014-12-31 | A kind of semiconductor device synchronism detection aligning gear |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105467877A (en) * | 2015-12-09 | 2016-04-06 | 珠海市运泰利自动化设备有限公司 | A high precision optical deviation rectifying apparatus based on an eccentric wheel platform |
| CN113770042A (en) * | 2021-09-13 | 2021-12-10 | 深圳市标谱半导体科技有限公司 | Light splitter and sorting method thereof |
| CN115214923A (en) * | 2022-07-26 | 2022-10-21 | 深圳市良机自动化设备有限公司 | LED test braid all-in-one |
-
2014
- 2014-12-31 CN CN201420871750.1U patent/CN204424617U/en active Active
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105467877A (en) * | 2015-12-09 | 2016-04-06 | 珠海市运泰利自动化设备有限公司 | A high precision optical deviation rectifying apparatus based on an eccentric wheel platform |
| CN105467877B (en) * | 2015-12-09 | 2018-11-16 | 珠海市运泰利自动化设备有限公司 | High-precision optical deviation correcting device based on eccentric wheel platform |
| CN113770042A (en) * | 2021-09-13 | 2021-12-10 | 深圳市标谱半导体科技有限公司 | Light splitter and sorting method thereof |
| CN115214923A (en) * | 2022-07-26 | 2022-10-21 | 深圳市良机自动化设备有限公司 | LED test braid all-in-one |
| CN115214923B (en) * | 2022-07-26 | 2023-09-26 | 深圳市良机自动化设备有限公司 | LED test braid all-in-one |
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