CN204405586U - A kind of semiconductor refrigerating assembly rosin joint tester - Google Patents
A kind of semiconductor refrigerating assembly rosin joint tester Download PDFInfo
- Publication number
- CN204405586U CN204405586U CN201520068922.6U CN201520068922U CN204405586U CN 204405586 U CN204405586 U CN 204405586U CN 201520068922 U CN201520068922 U CN 201520068922U CN 204405586 U CN204405586 U CN 204405586U
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- CN
- China
- Prior art keywords
- rosin joint
- refrigerating assembly
- semiconductor refrigerating
- branch road
- voltge surge
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Abstract
A kind of semiconductor refrigerating assembly rosin joint tester, it is characterized in that, comprise voltge surge circuit and resistance testing device, wherein: described voltge surge circuit possesses three branch roads, the first branch road is in series with several tested cooling elements and time relay contact; Second branch road is provided with the time relay, for controlling the trip time of described time relay contact; 3rd branch road has been arranged in series power supply and switch, for providing voltage for described voltge surge circuit; Described resistance testing device is ohmmeter, for testing the resistance variations of each described tested cooling element after voltge surge.Utilize semiconductor refrigerating assembly rosin joint tester of the present utility model, can detect the rosin joint phenomenon of semiconductor cooling element, improve product reliability in use, circuit is simple, convenient realization.
Description
Technical field
The utility model relates to a kind of semiconductor refrigerating assembly rosin joint tester.
Background technology
Conductor refrigeration is also called thermoelectric (al) cooling or thermoelectric cooling.There is the material of thermoelectric energy conversion characteristic, having refrigerating function by during direct current.Fig. 1 is the structural drawing of existing semiconductor refrigerating assembly, and Fig. 2 is the STRUCTURE DECOMPOSITION figure of existing semiconductor refrigerating assembly.Existing semiconductor refrigerating assembly is the loop that multiple N-type semiconductor element and P-type semiconductor element are in series, as shown in Figure 2, the structure of existing semiconductor refrigerating assembly is huyashi-chuuka (cold chinese-style noodles) porcelain plate 1, flow deflector 3, cooling element 2, flow deflector 3 and hot side porcelain plate 4 from top to bottom, draw two extension lines in addition, be respectively positive outside wire 5 and negative outside wire 6.
Wherein some cooling elements 2 form loop by scolding tin welding, each cooling element 2 has two solder joints, and whole like this refrigerating assembly has tens, a hundreds of solder joint, as long as rosin joint appears in a solder joint, will affect the life-span of whole refrigerating assembly, even refrigerating assembly can not work.And most of solder joint is inner at refrigerating assembly, solder joint whether rosin joint cannot be observed directly.
Utility model content
In view of above-mentioned technical matters, the utility model provides a kind of semiconductor refrigerating assembly rosin joint tester, can test rosin joint phenomenon easily, improves the reliability of semiconductor refrigerating assembly.
The utility model provides a kind of semiconductor refrigerating assembly rosin joint tester, comprises voltge surge circuit and resistance testing device, wherein:
Described voltge surge circuit possesses three branch roads, and the first branch road is in series with several tested cooling elements and time relay contact;
Second branch road is provided with the time relay, for controlling the trip time of described time relay contact;
3rd branch road has been arranged in series power supply and switch, for providing voltage for described voltge surge circuit;
Described resistance testing device is ohmmeter, for testing the resistance variations of each described tested cooling element after voltge surge.
Preferably, described voltge surge circuit also comprises voltage table, and described voltage table is connected in parallel on the two ends of the some tested cooling element of series connection mutually.
Preferably, described supply voltage meets: the voltage at each tested cooling element two ends is 6 ~ 8 times of its rated operational voltage.
Preferably, described first branch road is in series with two tested cooling elements.
Preferably, described supply voltage 220V.
Utilize semiconductor refrigerating assembly rosin joint tester of the present utility model, can detect the rosin joint phenomenon of semiconductor cooling element, improve product reliability in use, circuit is simple, convenient realization.
Accompanying drawing explanation
Fig. 1 is the structural drawing of existing semiconductor refrigerating assembly;
Fig. 2 is the STRUCTURE DECOMPOSITION figure of existing semiconductor refrigerating assembly;
Fig. 3 is the circuit structure diagram of the voltge surge circuit of semiconductor refrigerating assembly rosin joint tester of the present utility model.
Embodiment
Below in conjunction with accompanying drawing 3, semiconductor refrigerating assembly rosin joint tester of the present utility model is described in detail.As shown in the figure, comprise the three Tiao Zhi roads be in parallel, concrete, the first tested cooling element 21 and the second tested cooling element 22 and time relay contact 73 are connected, forms the first branch road; Second branch road is provided with the time relay 71, for the opening and closing of control time relay contact 73, the time relay 71 arranges the time of voltge surge, in order to avoid cause irreversible lesion to tested cooling element.3rd branch road is in series with 220V alternating voltage 75 and switch 74.Also possessing voltage table 72 in addition, for detecting the voltage of the first tested cooling element 21 and the second tested cooling element 22 two ends, determining that circuit normally works.According to above-mentioned impact circuit, the voltage at each tested cooling element two ends is about 110V, is 7 times of its rated voltage.If there is rosin joint, after voltge surge, there will be resistance raise or open circuit, utilize the resistance of ohmmeter to cooling element to detect subsequently, raise if there is resistance, then judge that rosin joint has appearred in this element.
Detect after refrigerating assembly through this tester, originally embodied by the rosin joint phenomenon covered, and prevented product from occurring the phenomenon of indivedual poor reliability after a procedure.
In addition; protection domain of the present utility model is not limited to the content of the present embodiment; according to the difference of the rated voltage of refrigerating assembly, wherein the first branch road can be connected 1,3 or 4 cooling elements, and the voltage that the voltage provided meets each cooling element two ends is 6 ~ 8 times of its rated voltage.
Claims (5)
1. a semiconductor refrigerating assembly rosin joint tester, is characterized in that, comprises voltge surge circuit and resistance testing device, wherein:
Described voltge surge circuit possesses three branch roads parallel with one another, and the first branch road is in series with several tested cooling elements and time relay contact;
Second branch road is provided with the time relay, for controlling the trip time of described time relay contact;
3rd branch road has been arranged in series power supply and switch, for providing voltage for described voltge surge circuit;
Described resistance testing device is ohmmeter, for testing the resistance variations of each described tested cooling element after voltge surge.
2. semiconductor refrigerating assembly rosin joint tester as claimed in claim 1, it is characterized in that, described voltge surge circuit also comprises voltage table, and described voltage table is connected in parallel on the two ends of the some tested cooling element of described mutual series connection.
3. semiconductor refrigerating assembly rosin joint tester as claimed in claim 1, it is characterized in that, described supply voltage meets: the voltage at described each tested cooling element two ends is 6 ~ 8 times of its rated operational voltage.
4. semiconductor refrigerating assembly rosin joint tester as claimed in claim 1, it is characterized in that, described first branch road is in series with two tested cooling elements.
5. semiconductor refrigerating assembly rosin joint tester as claimed in claim 4, is characterized in that, described supply voltage 220V.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520068922.6U CN204405586U (en) | 2015-01-30 | 2015-01-30 | A kind of semiconductor refrigerating assembly rosin joint tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520068922.6U CN204405586U (en) | 2015-01-30 | 2015-01-30 | A kind of semiconductor refrigerating assembly rosin joint tester |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN204405586U true CN204405586U (en) | 2015-06-17 |
Family
ID=53429436
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201520068922.6U Expired - Fee Related CN204405586U (en) | 2015-01-30 | 2015-01-30 | A kind of semiconductor refrigerating assembly rosin joint tester |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN204405586U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106067761A (en) * | 2016-08-15 | 2016-11-02 | 天津英利新能源有限公司 | A kind of method detecting photovoltaic component terminal box and welding quality |
| CN111024778A (en) * | 2018-10-10 | 2020-04-17 | 中铁一局集团有限公司 | Tunnel secondary lining preventive cavity detection system and operation control method thereof |
-
2015
- 2015-01-30 CN CN201520068922.6U patent/CN204405586U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106067761A (en) * | 2016-08-15 | 2016-11-02 | 天津英利新能源有限公司 | A kind of method detecting photovoltaic component terminal box and welding quality |
| CN111024778A (en) * | 2018-10-10 | 2020-04-17 | 中铁一局集团有限公司 | Tunnel secondary lining preventive cavity detection system and operation control method thereof |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20150617 Termination date: 20190130 |