CN203811510U - Two-color laser ore grinding granularity on-line analyzer - Google Patents
Two-color laser ore grinding granularity on-line analyzer Download PDFInfo
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- CN203811510U CN203811510U CN201420242979.9U CN201420242979U CN203811510U CN 203811510 U CN203811510 U CN 203811510U CN 201420242979 U CN201420242979 U CN 201420242979U CN 203811510 U CN203811510 U CN 203811510U
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- semiconductor laser
- infrared semiconductor
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- laser diode
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Abstract
The utility model relates to a laser particle analyzer, and in particular relates to a two-color laser ore grinding granularity on-line analyzer. The analyzer sequentially comprises an emitting unit, an optical system, a receiving unit and a signal processing and controlling unit, wherein the emitting unit comprises two infrared semiconductor laser diodes which are respectively parallelly arranged and vertically arranged; the light ray emitted by the parallelly-arranged infrared semiconductor laser diode enters from a right-angle surface of a right-angle prism and is emitted from an oblique surface, the light ray emitted by the vertically-arranged infrared semiconductor laser diode is reflected from the oblique surface of the right-angle prism, the light rays emitted by the two infrared semiconductor laser diodes are joined on the oblique surface of the right-angle prism and then sequentially pass through a sample pool and a Fourier imaging lens. The two-color laser ore grinding granularity on-line analyzer provided by the utility model has the advantages that the data of optical signals with low signal to noise ratio do not needed to be collected, so that the optical system structure is simplified and the cost is reduced.
Description
Technical field
The utility model relates to laser particle analyzer, is specially a kind of laser light scattering principle of utilizing and measures the particle size analyzer that grinding particle size distributes, both two-color laser grinding particle size in-line analyzer.
Background technology
Grinding-classification operation has very important status in metallurgical mine, nonferrous mine, part gold and non-metal mine ore dressing plant produce.The method that the actual grinding particle size adopting detects is at present manual inspection, and process is loaded down with trivial details, and working condition is poor, and topmost shortcoming is that the cycle is long, can not meet real-time, the online requirement of automatic control.
For general particle test, main method has microscopic method, sieve method, sedimentation, photon coherent method, mass spectroscopy and light scattering method etc., respectively have relative merits and the scope of application, comparatively speaking, most advanced, the most applicable method that realizes the detection of grinding particle size real-time online is light scattering method.
The particle size analyzer of current light scattering method structure, owing to there being Physical Interference, the optic angle degree of the particle of corresponding some size is too large or too littlely all can not accept well or differentiate its light energy signal, signal to noise ratio (S/N ratio) is extremely low, so need complexity, expensive optical system and optical signalling data acquisition system (DAS), thereby cause the existing instrument that can measure size-grade distribution very expensive.
Utility model content
For above-mentioned technical matters, the utility model provides a kind of two-color laser grinding particle size in-line analyzer simple in structure, with low cost, and concrete technical scheme is:
A two-color laser grinding particle size in-line analyzer, comprises transmitter unit, optical system, receiving element, signal processing and control element (PCE) successively;
Described transmitter unit comprises two infrared semiconductor laser diodes, is respectively the infrared semiconductor laser diode of parallel placement and the infrared semiconductor laser diode of vertical placement;
Described optical system comprises right-angle prism, sample cell and Fourier imaging len successively; The light that the infrared semiconductor laser diode of parallel placement sends enters, from inclined-plane, penetrates from a right angle face of right-angle prism, the light that the vertical infrared semiconductor laser diode of placing sends is from the inclined-plane reflection of right-angle prism, the light that two infrared semiconductor laser diodes send converges on the inclined-plane of right-angle prism, then passes through successively sample cell and Fourier imaging len;
Described receiving element is ccd image sensor, accepts the light that Fourier imaging len transmits, and is transferred to signal processing and control element (PCE).
The two-color laser grinding particle size in-line analyzer that the utility model provides, due to the data acquisition not needing the light signal of signal to noise ratio (S/N ratio) lower part, has simplified optical system structure, has reduced cost.
Accompanying drawing explanation
Fig. 1 is structural representation of the present utility model.
Embodiment
Accompanying drawings embodiment of the present utility model, as shown in Figure 1, two-color laser grinding particle size in-line analyzer, comprises transmitter unit, optical system, receiving element, signal processing and control element (PCE) successively;
Described transmitter unit comprises two infrared semiconductor laser diodes, is respectively the infrared semiconductor laser diode 1 of parallel placement and the infrared semiconductor laser diode 2 of vertical placement;
Described optical system comprises right-angle prism 3, sample cell 4 and Fourier imaging len 5 successively; The light that the infrared semiconductor laser diode 1 of parallel placement sends enters, from inclined-plane, penetrates from a right angle face of right-angle prism 3, the light that the vertical infrared semiconductor laser diode 2 of placing sends is from the inclined-plane reflection of right-angle prism 3, the light that two infrared semiconductor laser diodes send converges on the inclined-plane of right-angle prism 3, then passes through successively sample cell 4 and Fourier imaging len 5;
Described receiving element is ccd image sensor 6, accepts the light that Fourier imaging len 5 transmits, and is transferred to signal processing and control element (PCE) 7.
The infrared semiconductor laser diode 1 transmitting infrared laser of parallel placement, wavelength 850nm.The vertical infrared semiconductor laser diode of placing 2 transmitting infrared lasers, wavelength 1064nm, parallel beam, spot diameter 5mm.
The sample cell that sample cell 4 is made for light transmissive material, after homogenizing, removal bubble, makes ore pulp grain flow Free-flow cross measured zone.The tested particle of incident beam directive, light imaging that Fourier imaging len 5 receives after particle scattering, its image is circle spot and annulus, ccd image sensor 6 light-sensitive surfaces are positioned at picture plane, its sensitization dot matrix radially distributes, and ccd image sensor 6 is converted to voltage signal by light intensity signal radially and sends to signal processing and control element (PCE) 7.
Claims (1)
1. a two-color laser grinding particle size in-line analyzer, comprises transmitter unit, optical system, receiving element, signal processing and control element (PCE) successively; It is characterized in that:
Described transmitter unit comprises two infrared semiconductor laser diodes, is respectively the infrared semiconductor laser diode of parallel placement and the infrared semiconductor laser diode of vertical placement;
Described optical system comprises right-angle prism, sample cell and Fourier imaging len successively; The light that the infrared semiconductor laser diode of parallel placement sends enters, from inclined-plane, penetrates from a right angle face of right-angle prism, the light that the vertical infrared semiconductor laser diode of placing sends is from the inclined-plane reflection of right-angle prism, the light that two infrared semiconductor laser diodes send converges on the inclined-plane of right-angle prism, then passes through successively sample cell and Fourier imaging len;
Described receiving element is ccd image sensor, accepts the light that Fourier imaging len transmits, and is transferred to signal processing and control element (PCE).
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201420242979.9U CN203811510U (en) | 2014-05-13 | 2014-05-13 | Two-color laser ore grinding granularity on-line analyzer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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CN201420242979.9U CN203811510U (en) | 2014-05-13 | 2014-05-13 | Two-color laser ore grinding granularity on-line analyzer |
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CN203811510U true CN203811510U (en) | 2014-09-03 |
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CN201420242979.9U Expired - Fee Related CN203811510U (en) | 2014-05-13 | 2014-05-13 | Two-color laser ore grinding granularity on-line analyzer |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105092429A (en) * | 2014-05-13 | 2015-11-25 | 河北联合大学 | Double-color laser ore grinding particle size on-line analyzer |
CN106066294A (en) * | 2015-04-22 | 2016-11-02 | 罗伯特·博世有限公司 | Particle sensor equipment |
-
2014
- 2014-05-13 CN CN201420242979.9U patent/CN203811510U/en not_active Expired - Fee Related
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105092429A (en) * | 2014-05-13 | 2015-11-25 | 河北联合大学 | Double-color laser ore grinding particle size on-line analyzer |
CN106066294A (en) * | 2015-04-22 | 2016-11-02 | 罗伯特·博世有限公司 | Particle sensor equipment |
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Date | Code | Title | Description |
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C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20140903 Termination date: 20160513 |
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CF01 | Termination of patent right due to non-payment of annual fee |