CN105092429A - Double-color laser ore grinding particle size on-line analyzer - Google Patents

Double-color laser ore grinding particle size on-line analyzer Download PDF

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Publication number
CN105092429A
CN105092429A CN201410200101.3A CN201410200101A CN105092429A CN 105092429 A CN105092429 A CN 105092429A CN 201410200101 A CN201410200101 A CN 201410200101A CN 105092429 A CN105092429 A CN 105092429A
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CN
China
Prior art keywords
semiconductor laser
infrared semiconductor
light
particle size
laser diode
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Pending
Application number
CN201410200101.3A
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Chinese (zh)
Inventor
郝成
杨志刚
王建民
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Hebei United University
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Hebei United University
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Publication date
Application filed by Hebei United University filed Critical Hebei United University
Priority to CN201410200101.3A priority Critical patent/CN105092429A/en
Publication of CN105092429A publication Critical patent/CN105092429A/en
Pending legal-status Critical Current

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Abstract

The invention relates to a laser particle analyzer, and concretely relates to a double-color laser ore grinding particle size on-line analyzer. The analyzer comprises an emission unit, an optical system, a reception unit and a signal processing and controlling unit. The emission unit comprises two infrared semiconductor laser diodes, one is parallelly arranged and the other one is vertically arranged; light emitted from the parallelly arranged infrared semiconductor laser diode enters from a right angle surface of a rectangular prism and emits from an inclined plane, light emitted from the vertically arranged infrared semiconductor laser diode is reflected from the inclined plane of the rectangular prism, light emitted from the two infrared semiconductor laser diodes merge on the inclined plane of the rectangular prism, and light passes through a sample cell and a Fourier imaging lens in order. According to the double-color laser ore grinding particle size on-line analyzer provided by the invention, data of light signals with low signal to noise ratios are not needed to be acquired, and thereby simplifying the optical system structure and reducing cost.

Description

Two-color laser grinding particle size in-line analyzer
Technical field
The present invention relates to laser particle analyzer, be specially a kind of particle size analyzer utilizing laser light scattering principle to measure grinding particle size distribution, both two-color laser grinding particle size in-line analyzers.
Background technology
Grinding-classification operation has very important status in metallurgical mine, nonferrous mine, part gold and non-metal mine ore dressing plant produce.The method that the grinding particle size that current reality adopts detects is manual inspection, and process is loaded down with trivial details, and working condition is poor, and topmost shortcoming is that the cycle is long, can not meet real-time, the online requirement automatically controlled.
For general particle test, main method has microscopic method, sieve method, sedimentation, photon coherent method, mass spectroscopy and light scattering method etc., respectively have relative merits and the scope of application, comparatively speaking, most advanced, the most applicable method realizing the detection of grinding particle size real-time online is light scattering method.
The particle size analyzer of current light scattering method structure, owing to there being Physical Interference, the angular of the particle of some size corresponding is too large or too littlely all can not accept well or differentiate its light energy signal, signal to noise ratio (S/N ratio) is extremely low, so need complexity, expensive optical system and optical signal data acquisition system, thus cause the existing instrument can measuring size-grade distribution very expensive.
Summary of the invention
For above-mentioned technical matters, the invention provides the two-color laser grinding particle size in-line analyzer that a kind of structure is simple, with low cost, concrete technical scheme is:
A kind of two-color laser grinding particle size in-line analyzer, comprises transmitter unit, optical system, receiving element, signal transacting and control module successively;
Described transmitter unit comprises two infrared semiconductor laser diodes, is respectively the infrared semiconductor laser diode of parallel placement and the infrared semiconductor laser diode of vertical placement;
Described optical system comprises right-angle prism, sample cell and Fourier imaging len successively; The light that the infrared semiconductor laser diode of parallel placement sends enters from a right-angle surface of right-angle prism, penetrates from inclined-plane, the light that the infrared semiconductor laser diode of vertical placement sends is from the slant reflection of right-angle prism, the light that two infrared semiconductor laser diodes send converges on the inclined-plane of right-angle prism, more successively through sample cell and Fourier imaging len;
Described receiving element is ccd image sensor, accepts the light that Fourier imaging len transmits, and is transferred to signal transacting and control module.
Two-color laser grinding particle size in-line analyzer provided by the invention, owing to not needing the data acquisition of the light signal to signal to noise ratio (S/N ratio) lower part, simplifies optical system structure, reduces cost.
Accompanying drawing explanation
Fig. 1 is structural representation of the present invention.
Embodiment
Accompanying drawings the specific embodiment of the present invention, as shown in Figure 1, two-color laser grinding particle size in-line analyzer, comprises transmitter unit, optical system, receiving element, signal transacting and control module successively;
Described transmitter unit comprises two infrared semiconductor laser diodes, is respectively the infrared semiconductor laser diode 1 of parallel placement and the infrared semiconductor laser diode 2 of vertical placement;
Described optical system comprises right-angle prism 3, sample cell 4 and Fourier imaging len 5 successively; The light that the infrared semiconductor laser diode 1 of parallel placement sends enters from a right-angle surface of right-angle prism 3, penetrates from inclined-plane, the light that the infrared semiconductor laser diode 2 of vertical placement sends is from the slant reflection of right-angle prism 3, the light that two infrared semiconductor laser diodes send converges on the inclined-plane of right-angle prism 3, more successively through sample cell 4 and Fourier imaging len 5;
Described receiving element is ccd image sensor 6, accepts the light that Fourier imaging len 5 transmits, and is transferred to signal transacting and control module 7.
Infrared laser launched by the infrared semiconductor laser diode 1 of parallel placement, wavelength 850nm.Infrared laser launched by the infrared semiconductor laser diode 2 of vertical placement, wavelength 1064nm, parallel beam, spot diameter 5mm.
The sample cell that sample cell 4 is made for light transmissive material, after homogenizing, removal bubble, makes ore pulp grain flow freely flow through measured zone.The tested particle of incident beam directive, Fourier imaging len 5 receives the light after particle scattering and imaging, its image is circle spot and annulus, ccd image sensor 6 light-sensitive surface is positioned at picture plane, its photosensitive dot matrix radially distributes, and the light intensity signal of radial direction is converted to voltage signal and sends to signal transacting and control module 7 by ccd image sensor 6.

Claims (1)

1. a two-color laser grinding particle size in-line analyzer, comprises transmitter unit, optical system, receiving element, signal transacting and control module successively; It is characterized in that:
Described transmitter unit comprises two infrared semiconductor laser diodes, is respectively the infrared semiconductor laser diode of parallel placement and the infrared semiconductor laser diode of vertical placement;
Described optical system comprises right-angle prism, sample cell and Fourier imaging len successively; The light that the infrared semiconductor laser diode of parallel placement sends enters from a right-angle surface of right-angle prism, penetrates from inclined-plane, the light that the infrared semiconductor laser diode of vertical placement sends is from the slant reflection of right-angle prism, the light that two infrared semiconductor laser diodes send converges on the inclined-plane of right-angle prism, more successively through sample cell and Fourier imaging len;
Described receiving element is ccd image sensor, accepts the light that Fourier imaging len transmits, and is transferred to signal transacting and control module.
CN201410200101.3A 2014-05-13 2014-05-13 Double-color laser ore grinding particle size on-line analyzer Pending CN105092429A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201410200101.3A CN105092429A (en) 2014-05-13 2014-05-13 Double-color laser ore grinding particle size on-line analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201410200101.3A CN105092429A (en) 2014-05-13 2014-05-13 Double-color laser ore grinding particle size on-line analyzer

Publications (1)

Publication Number Publication Date
CN105092429A true CN105092429A (en) 2015-11-25

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CN201410200101.3A Pending CN105092429A (en) 2014-05-13 2014-05-13 Double-color laser ore grinding particle size on-line analyzer

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CN (1) CN105092429A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110441199A (en) * 2018-05-04 2019-11-12 长沙青波光电科技有限公司 A kind of laser measuring device for measuring
CN110441200A (en) * 2018-05-04 2019-11-12 长沙青波光电科技有限公司 A kind of laser measuring device for measuring
CN112268842A (en) * 2020-10-20 2021-01-26 华北理工大学 Double-channel dynamic particle size detection device

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6177994B1 (en) * 1998-08-22 2001-01-23 Malvern Instruments Limited Relating to the measurement of particle size distribution
GB2494733A (en) * 2011-09-14 2013-03-20 Malvern Instr Ltd Measuring particle size distribution by light scattering
CN203811510U (en) * 2014-05-13 2014-09-03 河北联合大学 Two-color laser ore grinding granularity on-line analyzer

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6177994B1 (en) * 1998-08-22 2001-01-23 Malvern Instruments Limited Relating to the measurement of particle size distribution
GB2494733A (en) * 2011-09-14 2013-03-20 Malvern Instr Ltd Measuring particle size distribution by light scattering
CN203811510U (en) * 2014-05-13 2014-09-03 河北联合大学 Two-color laser ore grinding granularity on-line analyzer

Non-Patent Citations (5)

* Cited by examiner, † Cited by third party
Title
刘炯天等: "《试验研究方法》", 31 May 2006 *
周仕学等: "《粉体工程导论》", 28 February 2010 *
王丽: "基于光谱消光法的颗粒粒径分布重建算法的研究", 《中国博士学位论文全文数据库 基础科学辑》 *
郑刚等: "颗粒浓度在线监测的双波长消光法", 《仪器仪表学报》 *
马凤斌等: "烟尘浓度和粒度的消光法测量研究", 《传感技术学报》 *

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110441199A (en) * 2018-05-04 2019-11-12 长沙青波光电科技有限公司 A kind of laser measuring device for measuring
CN110441200A (en) * 2018-05-04 2019-11-12 长沙青波光电科技有限公司 A kind of laser measuring device for measuring
CN112268842A (en) * 2020-10-20 2021-01-26 华北理工大学 Double-channel dynamic particle size detection device

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