CN203704861U - Optical measurement device for chamfer dimension - Google Patents
Optical measurement device for chamfer dimension Download PDFInfo
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- CN203704861U CN203704861U CN201320870277.0U CN201320870277U CN203704861U CN 203704861 U CN203704861 U CN 203704861U CN 201320870277 U CN201320870277 U CN 201320870277U CN 203704861 U CN203704861 U CN 203704861U
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- 238000005259 measurement Methods 0.000 title claims abstract description 24
- 230000003287 optical effect Effects 0.000 title claims abstract description 22
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims description 15
- 238000010205 computational analysis Methods 0.000 claims description 3
- 238000001514 detection method Methods 0.000 abstract description 4
- 230000007547 defect Effects 0.000 abstract 1
- 238000000034 method Methods 0.000 description 5
- 238000012360 testing method Methods 0.000 description 4
- 230000007115 recruitment Effects 0.000 description 3
- 238000013461 design Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000007405 data analysis Methods 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000003908 quality control method Methods 0.000 description 1
- 238000011179 visual inspection Methods 0.000 description 1
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- Length Measuring Devices By Optical Means (AREA)
Abstract
The utility model relates to the technical field of optical measurement, and specifically relates to an automatic non-contact optical measurement device for chamfer dimensions. The device comprises a rack, an upper measuring device, a lower measuring device, a positioning device, and an industrial control system. The upper end of the rack is provided with a workbench. The upper measuring device is disposed on the workbench, and the lower measuring device is disposed under the workbench. The positioning device is disposed on the workbench. The industrial control system is disposed in the rack. The device overcomes defects of an existing chamfer dimension detection method, and is characterized by high precision, low man-made interference factor, low cost, and high efficiency.
Description
Technical field
The utility model relates to field of optical measuring technologies, is specifically related to a kind of robotization, contactless chamfer dimesion optical measuring apparatus.
Background technology
In the production run of the electronic products such as mobile phone and accessory thereof, need to detect the chamfer dimesion of workpiece.Traditional manual detection mode, can only measure by visual inspection and scale, competency profiling to staff is higher, recruitment cost is high, but efficiency is very low, and people is that the error ratio causing is larger, degree of accuracy is low, even in measuring process, contact with workpiece, may cause scratch, distortion or distortion to workpiece, cause workpiece to be scrapped.This cannot meet far away and develops rapidly electron trade for the tight demand of high-level quality control and low production cost.
Utility model content
The object of the utility model embodiment is for above-mentioned the deficiencies in the prior art, and a kind of robotization, contactless chamfer dimesion optical measuring apparatus are provided.
A kind of chamfer dimesion optical measuring apparatus, is characterized in that:
Comprise frame, described frame upper end is provided with worktable;
Upper level measuring arrangement, is arranged at described worktable top, for measuring the chamfering of workpiece for measurement upper surface;
Lower level measuring arrangement, is arranged at described worktable below, for measuring the chamfering of workpiece for measurement lower surface;
Locating device, is arranged on described worktable, for fixing workpiece for measurement;
Industrial control system, is arranged in described frame, for controlling described upper level measuring arrangement, lower level measuring arrangement and locating device, and the data of upper level measuring arrangement and lower level measuring arrangement feedback described in computational analysis.
Further illustrate, described upper level measuring arrangement, comprises the first camera assembly, the first adjusting part and the first driven unit; Described the first camera assembly is fixed on described the first adjusting part; Described the first adjusting part is fixedly connected with described the first driven unit.
Further illustrate, described worktable is provided with gantry structure frame, and described gantry structure frame comprises two pillars and crossbeam, and described pillar is fixed on the left and right sides of worktable, and described beam erection is in the upper end of two pillars; Described the first driven unit is arranged on crossbeam; Described crossbeam is arranged with square frame, and described square frame is fixedly connected with the first driven unit; Described the first adjusting part is arranged on square frame.
Further illustrate, described lower level measuring arrangement, comprises the second camera assembly, the second adjusting part and the second driven unit; Described the second camera assembly is fixed on described the second adjusting part; Described the second adjusting part is fixedly connected with described the second driven unit.
Further illustrate, in described frame, be provided with back up pad, described the second driven unit is arranged in described back up pad; Described worktable offers through hole, and described the second camera assembly wears in the inner.
Further illustrate, described the first adjusting part is identical with the second adjusting part structure, comprises pedestal, knob, camera installing plate and base plate; Described pedestal is flexibly connected with described base plate; Described knob is arranged at a side of described pedestal; The both sides up and down in described camera installing plate front offer respectively two and arrange through hole one to one, and its screw that is through side through hole is fixed on the front of described pedestal.
Further illustrate, described the first camera assembly is identical with the second camera assembly structure, comprises tuning plate, CCD camera, camera lens, annular light source and light source installing plate; Described annular light source is fixed on light source installing plate; Described annular light source is formed centrally the ring texture of through hole in being, also offer a through hole and in contrast should on described light source installing plate; Described light source installing plate is fixed on the lower end of described camera installing plate; Described tuning plate is provided with a pair of slotted hole, and described slotted hole is corresponding with the through hole of described camera installing plate downside, and described tuning plate is fixed on described camera installing plate through the screw of slotted hole and through hole in succession; Described CCD camera is fixed on described tuning plate; Described camera lens is fixedly connected with described CCD camera, and towards the through hole of described annular light source.
Further illustrate, described locating device comprises flitch, refraction frame and the 3rd driven unit; Described refraction frame is fixed on one end of described upper flitch; Described refraction frame inner side surrounds supporting region with described upper flitch; The relative both sides that described upper flitch is positioned at supporting region are provided with reference column; In supporting region, described upper flitch has the discontinuous openwork part of a circle along the edge of described refraction frame; Described upper flitch is fixedly connected with described the 3rd driven unit away from one end of refraction frame; Described the 3rd driven unit is arranged on described worktable.
Further illustrate, described the first driven unit, the second driven unit and the 3rd driven unit are electric drive axle.
Further illustrate, described locating device has two, and each locating device is supporting level measuring arrangement and lower level measuring arrangement on one group.
The beneficial effect that the utility model embodiment brings is: chamfer dimesion optical measuring apparatus is by industrial control system control, obtain the data of workpiece surface chamfering by upper level measuring arrangement, lower level measuring arrangement obtains the data of workpiece lower surface chamfering, whole process can not come in contact with workpiece, stops workpiece by the possibility of scratch, stress deformation or distortion; The view data that upper level measuring arrangement and lower level measuring arrangement obtain calculates position degree numerical value by industrial control system, and degree of accuracy is high, almost there is no error; The testing of upper level measuring arrangement and lower level measuring arrangement is carried out simultaneously, and its data that obtain are also calculated at industrial control system simultaneously, have greatly improved the work efficiency of equipment; Except needs staff is placed on locating device by workpiece, whole testing process is carried out automatically by equipment, has at utmost got rid of artificial disturbing factor, simultaneously not high to staff's competency profiling, has reduced recruitment cost; Equipment is provided with two locating devices, and each locating device is supporting level measuring arrangement and a lower level measuring arrangement on one group, and this double mode material loading and detecting simultaneously, significantly improves work efficiency; Upper level measuring arrangement and lower level measuring arrangement can be according to the shape sizes of workpiece for measurement, and flexible is the position of relative workpiece separately, is conducive to obtain best image quality.
Accompanying drawing explanation
Fig. 1 is the structural representation of the utility model embodiment;
Fig. 2 is upper level measuring arrangement embodiment illustrated in fig. 1 and the structural representation of lower level measuring arrangement;
Fig. 3 is adjusting part embodiment illustrated in fig. 1 and the structural representation of camera assembly;
Fig. 4 is the structural representation of locating device embodiment illustrated in fig. 1;
Fig. 5 is the stereographic map of another embodiment of the utility model;
Embodiment
In order to make the purpose of this utility model, technical scheme and advantage clearer, below in conjunction with drawings and Examples, the utility model is further elaborated.Should be appreciated that specific embodiment described herein is only in order to explain the utility model, and be not used in restriction the utility model.
As shown in Figure 1, a kind of chamfer dimesion optical measuring apparatus,
Comprise frame 1, frame 1 upper end is provided with worktable 11;
Upper level measuring arrangement 2, is arranged at worktable 11 tops, for measuring the chamfering of workpiece for measurement upper surface;
Lower level measuring arrangement 3, is arranged at worktable 11 belows, for measuring the chamfering of workpiece for measurement lower surface;
Locating device 4, is arranged on worktable 11, for fixing workpiece for measurement;
Industrial control system (not shown), is arranged in frame 1, for controlling upper level measuring arrangement 2, lower level measuring arrangement 3 and locating device 4, and the data that in computational analysis, level measuring arrangement 2 and lower level measuring arrangement 3 feed back.
Staff is placed on workpiece for measurement on locating device 4 and fixes; Industrial control system sends a signal to level measuring arrangement 2 and lower level measuring arrangement 3, and both detect workpiece for measurement simultaneously, and by the data feedback obtaining to industrial control system; Industrial control system, to the data analysis receiving, is determined the chamfer dimesion of workpiece.Whole testing process, equipment can not come in contact with workpiece, stops workpiece by the possibility of scratch, stress deformation or distortion.
As shown in Figure 2, upper level measuring arrangement 2, comprises the first camera assembly 21, the first adjusting part 22 and the first driven unit 23; The first camera assembly 21 is fixed on the first adjusting part 22; The first adjusting part 22 is fixedly connected with the first driven unit 23.
Particularly, worktable 11 is provided with gantry structure frame 12, and gantry structure frame 12 comprises pillar 121,122 and crossbeam 123, and pillar 121 and 122 is fixed on the left and right sides of worktable 11, and crossbeam 123 is set up in the upper end of pillar 121 and 122; The first driven unit 23 is arranged on crossbeam 123; Crossbeam 123 is arranged with square frame 13, and square frame 13 is fixedly connected with the first driven unit 23; The first adjusting part 22 is arranged on square frame 13.For the utility model, gantry structure frame can substitute with cantilever design frame.Cantilever design frame comprises support and cantilever, and support is fixed on a side of worktable 11, and cantilever is fixed on the upper end of support, and both are " 7 " font, and the first driven unit 23 is arranged on cantilever.
In the present embodiment, the first driven unit 23 is electric drive axle, is arranged on crossbeam 123, can drive the first camera assembly 21 and the first adjusting part 22 to move around along X-direction.
As shown in Figure 2, lower level measuring arrangement 3, comprises the second camera assembly 31, the second adjusting part 32 and the second driven unit 33; The second camera assembly 31 is fixed on the second adjusting part 32; The second adjusting part 32 is fixedly connected with the second driven unit 33.
In frame 1, being provided with back up pad 14, the second driven units 33 is arranged in back up pad 14; Worktable 11 offers through hole, and the second camera assembly 31 wears in the inner.
In the present embodiment, the second driven unit 33 comprises electric drive axle A(331) and electric drive axle B(332); Electric drive axle A(331) be arranged in back up pad 14; Electric drive axle B(332) be fixed on electric drive axle A(331) upper surface, both are cross-shaped.The second driven unit 33 can drive the second camera assembly 31 and the second adjusting part 32 in the scope of the through hole of worktable 11, moves freely along X-axis and Y-axis.
The first adjusting part 22 is identical with the second adjusting part 32 structures, and this sentences the first adjusting part 22 and describes for example.As shown in Figure 3, the first adjusting part 22 comprises pedestal 221, knob 222, camera installing plate 223 and base plate 224; Pedestal 221 is flexibly connected with base plate 224; Knob 222 is arranged at a side of pedestal 221; The both sides up and down in camera installing plate 223 fronts offer respectively two and arrange through hole one to one, and its screw that is through side through hole is fixed on the front of pedestal 221.Need to carry out fine position time, turning knob 222, makes pedestal 221 and the camera installing plate 223 that is fixedly connected with it can carry out upper and lower rectilinear motion on base plate 224.
The first camera assembly 21 is identical with the second camera assembly 31 structures, and this sentences the first camera assembly 21 and describes for example.As shown in Figure 3, the first camera assembly 21 comprises tuning plate 211, CCD camera 212, camera lens 213, annular light source 214 and light source installing plate 215; Annular light source 214 is fixed on light source installing plate 215; Annular light source 214 is formed centrally the ring texture of through hole in being, also offer a through hole and in contrast should on light source installing plate 215; Light source installing plate 215 is fixed on the lower end of camera installing plate 222; Tuning plate 211 is provided with a pair of slotted hole, and slotted hole is corresponding with the through hole on camera installing plate 222, and tuning plate 211 is fixed on camera installing plate 222 through the screw of slotted hole and through hole in succession; CCD camera 212 is fixed on tuning plate 211; Camera lens 213 is fixedly connected with CCD camera 212, and towards the through hole of annular light source 214.
The equipment that the utility model provides can be according to the shape size of workpiece for measurement, and the position of flexible the first camera assembly and the second camera assembly is conducive to obtain best image quality.Particularly, need to regulate the distance between CCD camera and annular light source time, by unclamping the screw on tuning plate, adjust its position on camera installing plate; Need to regulate the distance between annular light source and workpiece for measurement time, by unclamping the screw on camera installing plate, adjust its position on pedestal; Need to carry out fine adjustments time, adjust the position of pedestal by turning knob and realize.
As shown in Figure 4, locating device 4 comprises flitch 41, refraction frame 42 and the 3rd driven unit (in figure, not marking); Refraction frame 42 is fixed on one end of flitch 41; Refraction frame 42 inner sides and upper flitch 41 surround supporting region 43; The relative both sides that upper flitch 41 is positioned at supporting region 43 are provided with reference column 44 and 45; In supporting region 43, upper flitch 41 has the discontinuous openwork part 46 of a circle along refraction frame 42 edges; Upper flitch 41 is fixedly connected with the 3rd driven unit away from one end of refraction frame 42; The 3rd driven unit is arranged on worktable 11.In the present embodiment, the 3rd driven unit is electric drive axle, can drive flitch 41 to move around along Y direction.Refraction frame 42 is made up of reflectorized material, and in the time that annular light source is radiated at workpiece for measurement surface, by the reflection of refraction frame, the light of compensation workpiece for measurement edge, improves the quality of imaging.
Staff is placed on workpiece for measurement in supporting region, fixes by reference column 44 and 45; Industrial control system sends a signal to the 3rd driven unit, allows it drive the workpiece for measurement of upper flitch 41 and carrying thereof to move to from front to back the central authorities of worktable 11; Upper level measuring arrangement 2 is got a detection automatically at the upper surface of workpiece for measurement; The openwork part 46 that lower level measuring arrangement 3 sees through on upper flitch 41, gets a detection automatically to the lower surface of workpiece for measurement; Detect completely, the 3rd driven unit drives upper flitch 41 and workpiece to get back to back to front original place, waits for that staff takes off workpiece and material loading again.Visible, except needs staff is placed on locating device 4 by workpiece for measurement, whole testing process is carried out automatically by equipment, has at utmost got rid of artificial disturbing factor, simultaneously not high to staff's competency profiling, has reduced recruitment cost.
As the replacement scheme of the present embodiment, locating device 4 can not comprise the 3rd driven unit, be directly fixed on worktable 11, and between upper level measuring arrangement 2 and lower level measuring arrangement 3.When work, industrial control system orders about level measuring arrangement 2 and lower level measuring arrangement 3 detects in the above and below of locating device 4 respectively.
In the present embodiment, chamfer dimesion optical measuring apparatus forms double by two locating devices, each locating device is supporting level measuring arrangement and a lower level measuring arrangement on one group, and this double mode material loading and detecting simultaneously, significantly improves work efficiency.
As shown in Figure 5, chamfer dimesion optical measuring apparatus also comprises upper cover 5, and upper cover 5 is arranged on worktable 11, and upper level measuring arrangement 3 is positioned at upper cover 5 inside; Display 6 is installed on the panel of upper cover 5.Upper cover 5 is for dustproof, level measuring arrangement 3 in protection.Display 6 is for showing that industrial control system is through processing the chamfering work piece size results obtaining.
The foregoing is only preferred embodiment of the present utility model; not in order to limit the utility model; all any modifications of doing within spirit of the present utility model and principle, be equal to and replace and improvement etc., within all should being included in protection domain of the present utility model.
Claims (10)
1. a chamfer dimesion optical measuring apparatus, is characterized in that:
Comprise frame, described frame upper end is provided with worktable;
Upper level measuring arrangement, is arranged at described worktable top, for measuring the chamfering of workpiece for measurement upper surface;
Lower level measuring arrangement, is arranged at described worktable below, for measuring the chamfering of workpiece for measurement lower surface;
Locating device, is arranged on described worktable, for fixing workpiece for measurement;
Industrial control system, is arranged in described frame, for controlling described upper level measuring arrangement, lower level measuring arrangement and locating device, and the data of upper level measuring arrangement and lower level measuring arrangement feedback described in computational analysis.
2. chamfer dimesion optical measuring apparatus according to claim 1, is characterized in that: described upper level measuring arrangement, comprises the first camera assembly, the first adjusting part and the first driven unit; Described the first camera assembly is fixed on described the first adjusting part; Described the first adjusting part is fixedly connected with described the first driven unit.
3. chamfer dimesion optical measuring apparatus according to claim 2, it is characterized in that: described worktable is provided with gantry structure frame, described gantry structure frame comprises two pillars and crossbeam, and described pillar is fixed on the left and right sides of worktable, and described beam erection is in the upper end of two pillars; Described the first driven unit is arranged on crossbeam; Described crossbeam is arranged with square frame, and described square frame is fixedly connected with the first driven unit; Described the first adjusting part is arranged on square frame.
4. according to the chamfer dimesion optical measuring apparatus described in claims 1 to 3 any one, it is characterized in that: described lower level measuring arrangement, comprises the second camera assembly, the second adjusting part and the second driven unit; Described the second camera assembly is fixed on described the second adjusting part; Described the second adjusting part is fixedly connected with described the second driven unit.
5. chamfer dimesion optical measuring apparatus according to claim 4, is characterized in that: in described frame, be provided with back up pad, described the second driven unit is arranged in described back up pad; Described worktable offers through hole, and described the second camera assembly wears in the inner.
6. chamfer dimesion optical measuring apparatus according to claim 5, is characterized in that: described the first adjusting part is identical with the second adjusting part structure, comprises pedestal, knob, camera installing plate and base plate; Described pedestal is flexibly connected with described base plate; Described knob is arranged at a side of described pedestal; The both sides up and down in described camera installing plate front offer respectively two and arrange through hole one to one, and its screw that is through side through hole is fixed on the front of described pedestal.
7. chamfer dimesion optical measuring apparatus according to claim 6, is characterized in that: described the first camera assembly is identical with the second camera assembly structure, comprises tuning plate, CCD camera, camera lens, annular light source and light source installing plate; Described annular light source is fixed on light source installing plate; Described annular light source is formed centrally the ring texture of through hole in being, also offer a through hole and in contrast should on described light source installing plate; Described light source installing plate is fixed on the lower end of described camera installing plate; Described tuning plate is provided with a pair of slotted hole, and described slotted hole is corresponding with the through hole of described camera installing plate downside, and described tuning plate is fixed on described camera installing plate through the screw of slotted hole and through hole in succession; Described CCD camera is fixed on described tuning plate; Described camera lens is fixedly connected with described CCD camera, and towards the through hole of described annular light source.
8. chamfer dimesion optical measuring apparatus according to claim 4, is characterized in that: described locating device comprises flitch, refraction frame and the 3rd driven unit; Described refraction frame is fixed on one end of described upper flitch; Described refraction frame inner side surrounds supporting region with described upper flitch; The relative both sides that described upper flitch is positioned at supporting region are provided with reference column; In supporting region, described upper flitch has the discontinuous openwork part of a circle along the edge of described refraction frame; Described upper flitch is fixedly connected with described the 3rd driven unit away from one end of refraction frame; Described the 3rd driven unit is arranged on described worktable.
9. chamfer dimesion optical measuring apparatus according to claim 8, is characterized in that: described the first driven unit, the second driven unit and the 3rd driven unit are electric drive axle.
10. according to the chamfer dimesion optical measuring apparatus described in claim 1 or 8, it is characterized in that: described locating device has two, each locating device is supporting level measuring arrangement and lower level measuring arrangement on one group.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320870277.0U CN203704861U (en) | 2013-12-26 | 2013-12-26 | Optical measurement device for chamfer dimension |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320870277.0U CN203704861U (en) | 2013-12-26 | 2013-12-26 | Optical measurement device for chamfer dimension |
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| Publication Number | Publication Date |
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| CN203704861U true CN203704861U (en) | 2014-07-09 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201320870277.0U Expired - Fee Related CN203704861U (en) | 2013-12-26 | 2013-12-26 | Optical measurement device for chamfer dimension |
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| Country | Link |
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| CN (1) | CN203704861U (en) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104534995A (en) * | 2014-12-26 | 2015-04-22 | 大族激光科技产业集团股份有限公司 | Optical measuring equipment |
| CN105606024A (en) * | 2015-12-31 | 2016-05-25 | 深圳富强智能系统科技有限公司 | Detection apparatus and detection method for mobile phone dimension |
| CN106041638A (en) * | 2016-07-25 | 2016-10-26 | 深圳市博视科技有限公司 | Automatic alignment device of numerical control equipment |
| CN106442552A (en) * | 2016-08-29 | 2017-02-22 | 宁波永信精密管业有限公司 | Sleeve cylinder surface inspection device |
| CN107096682A (en) * | 2017-04-28 | 2017-08-29 | 上海为寻视自动化科技有限公司 | Dispensing valve mounting assembly |
| CN107097103A (en) * | 2017-04-28 | 2017-08-29 | 上海为寻视自动化科技有限公司 | Dispensing valve system |
| CN108775868A (en) * | 2018-08-17 | 2018-11-09 | 厦门攸信信息技术有限公司 | A kind of testing agency |
-
2013
- 2013-12-26 CN CN201320870277.0U patent/CN203704861U/en not_active Expired - Fee Related
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104534995A (en) * | 2014-12-26 | 2015-04-22 | 大族激光科技产业集团股份有限公司 | Optical measuring equipment |
| CN104534995B (en) * | 2014-12-26 | 2018-01-05 | 大族激光科技产业集团股份有限公司 | Optical measuring apparatus |
| CN105606024A (en) * | 2015-12-31 | 2016-05-25 | 深圳富强智能系统科技有限公司 | Detection apparatus and detection method for mobile phone dimension |
| CN105606024B (en) * | 2015-12-31 | 2018-07-27 | 深圳富强智能系统科技有限公司 | A kind of handset size detection device and detection method |
| CN106041638A (en) * | 2016-07-25 | 2016-10-26 | 深圳市博视科技有限公司 | Automatic alignment device of numerical control equipment |
| CN106041638B (en) * | 2016-07-25 | 2018-04-10 | 深圳市博视科技有限公司 | Numerical control device automatic contraposition device |
| CN106442552A (en) * | 2016-08-29 | 2017-02-22 | 宁波永信精密管业有限公司 | Sleeve cylinder surface inspection device |
| CN107096682A (en) * | 2017-04-28 | 2017-08-29 | 上海为寻视自动化科技有限公司 | Dispensing valve mounting assembly |
| CN107097103A (en) * | 2017-04-28 | 2017-08-29 | 上海为寻视自动化科技有限公司 | Dispensing valve system |
| CN108775868A (en) * | 2018-08-17 | 2018-11-09 | 厦门攸信信息技术有限公司 | A kind of testing agency |
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| C14 | Grant of patent or utility model | ||
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| CP03 | Change of name, title or address |
Address after: 518000 No. 9988 Shennan Road, Nanshan District, Shenzhen, Guangdong Patentee after: HAN'S LASER TECHNOLOGY INDUSTRY GROUP Co.,Ltd. Address before: 518055 No. 9 West West Road, Nanshan District hi tech park, Shenzhen, Guangdong Patentee before: HAN'S LASER TECHNOLOGY Co.,Ltd. |
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| TR01 | Transfer of patent right | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20220801 Address after: 518000 101, building 6, Wanyan Industrial Zone, Qiaotou community, Fuhai street, Bao'an District, Shenzhen City, Guangdong Province Patentee after: Shenzhen Han's Semiconductor Equipment Technology Co.,Ltd. Address before: 518000 No. 9988 Shennan Road, Nanshan District, Shenzhen, Guangdong Patentee before: HAN'S LASER TECHNOLOGY INDUSTRY GROUP Co.,Ltd. |
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| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20140709 |