CN203643477U - Integrated circuit test positioner - Google Patents
Integrated circuit test positioner Download PDFInfo
- Publication number
- CN203643477U CN203643477U CN201320673621.7U CN201320673621U CN203643477U CN 203643477 U CN203643477 U CN 203643477U CN 201320673621 U CN201320673621 U CN 201320673621U CN 203643477 U CN203643477 U CN 203643477U
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- Prior art keywords
- test
- test chip
- chip
- installing plate
- integrated circuit
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- Expired - Lifetime
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- 238000012360 testing method Methods 0.000 title claims abstract description 94
- 238000000034 method Methods 0.000 description 7
- 230000000694 effects Effects 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000003111 delayed effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
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Abstract
The utility model discloses an integrated circuit test positioner comprising a mounting plate; a surface of the mounting plate is detachably provided with a mounting bolt; two sides of the mounting plate are respectively provided with a positioning clamp plate used for fixing a test chip; the positioning clamp plate is provided with a clamp bolt connected with the mounting plate; the test chip is clamped and fixed between the positioning clamp plate and the mounting plate. The test chip is fixed and clamped by the positioning clamp plate and the clamping bolt, two test chips are consistent in a mounting height, so excellent contact performance is ensued between the test chip and a tested chip, thereby fundamentally solving the problems that large amount of time is used to debug and adjust the test chip when the test chip is replaced in each time, ensuring testing accuracy and high test efficiency, simultaneously effectively preventing damage to the test chip because of poor test contact, prolonging service life of the test chip, and saving cost.
Description
Technical field
The utility model relates to a kind of integrated circuit testing locating device.
Background technology
Integrated circuit is after having encapsulated, need to use special ATE (automatic test equipment) to check one by one, see whether its function and performance meet the requirement of regulation, and integrated circuit testing can comprise very many-sided content, but dissimilar integrated circuit has different requirements to test.
Kelvin test is one of test item of integrated circuit, in the time carrying out this test, require test chip up and down two all must corresponding pin, and keep its good contact, the accuracy of guarantee test.If guarantee test chip up and down two contact with pin well, will utilize test fixture to grip test chip, formation accurately locate.Traditional method of operating is the draw-in groove by cutting away test chip bottom, makes test chip can be lifted to certain height, and size of this height by actual ic pin, the height and position in separator slide rail determines.Because both sides test chip all will be adjusted, and can only rule of thumb there is no unified reference standard while adjustment, so while changing test chip at every turn, debug very difficult, and the effect of different operating personnel debugging is all different, delayed a large amount of test durations, testing efficiency is low for this reason, and result is inaccurate.
Summary of the invention
Technical problem to be solved in the utility model is to provide a kind of good fixing effect, and test result is integrated circuit testing locating device accurately.
For solving the problems of the technologies described above, the technical solution of the utility model is: integrated circuit testing locating device, comprise installing plate, described installing plate surface is detachably provided with erection bolt, described installing plate both sides are respectively equipped with the positioning splint for fixing test chip, described positioning splint is provided with the fishbolt that connects described installing plate, and described test chip sandwiched is fixed between described positioning splint and described installing plate.
As preferred technical scheme, described positioning splint is set to " recessed " font plate, and the notch width of described " recessed " font plate is corresponding with the thickness of described test chip, and described fishbolt lays respectively at described " recessed " font plate two ends.
Owing to having adopted technique scheme, integrated circuit testing locating device, comprise installing plate, described installing plate surface is detachably provided with erection bolt, described installing plate both sides are respectively equipped with the positioning splint for fixing test chip, described positioning splint is provided with the fishbolt that connects described installing plate, and described test chip sandwiched is fixed between described positioning splint and described installing plate; The beneficial effects of the utility model are: by positioning splint and fishbolt, test chip fixed clamp is lived, make two test chip setting height(from bottom)s consistent, guarantee the contact performance that itself and tested chip are good, while fundamentally having solved each replacing test chip, all to spend the difficulty of plenty of time processing debugging test chip, and the accuracy of test and higher testing efficiency are guaranteed, effectively avoid the damage of test chip being carried out because of test loose contact simultaneously, in the serviceable life that has extended test chip, provide cost savings.
accompanying drawing explanation
The following drawings is only intended to the utility model to schematically illustrate and explain, does not limit scope of the present utility model.Wherein:
Fig. 1 is the structural representation of the utility model embodiment;
Fig. 2 is the side view of the utility model embodiment;
In figure: 1-installing plate; 2-erection bolt; 3-positioning splint; 4-fishbolt; 5-test chip.
Embodiment
Below in conjunction with drawings and Examples, further set forth the utility model.In the following detailed description, only by the mode of explanation, some one exemplary embodiment of the present utility model has been described.Undoubtedly, those of ordinary skill in the art can recognize, in the situation that not departing from spirit and scope of the present utility model, can revise described embodiment by various mode.Therefore, accompanying drawing is illustrative with being described in essence, rather than for limiting the protection domain of claim.
As depicted in figs. 1 and 2, integrated circuit testing locating device, comprises installing plate 1, described installing plate 1 surface is detachably provided with erection bolt 2, this device removably can be installed and is fixed on test machine by installing plate 1 and erection bolt 2, and dismounting is simple, be convenient to safeguard.Described installing plate 1 both sides are respectively equipped with the positioning splint 3 for fixing test chip 5, and described positioning splint 3 is provided with the fishbolt 4 that connects described installing plate 1, and described test chip 5 sandwicheds are fixed between described positioning splint 3 and described installing plate 1.
Positioning splint 3 described in the present embodiment is set to " recessed " font plate, described fishbolt lays respectively at described " recessed " font plate two ends, and the notch width of described " recessed " font plate is corresponding with the thickness of described test chip 5, for the ease of diagram, in Fig. 1, the size of test chip 5 is than the undersized setting of described " recessed " font plate recess.Described test chip 5 sandwicheds are fixed in the recess of described " recessed " font plate, to facilitate test to use.
Consistent for guaranteeing the height at test chip tip and the height of tested ic pin, guarantee that pin tightly coincide with the upper and lower two-layer of test chip simultaneously, to reach test effect as scheduled, there is simple operability simultaneously, while now no longer taking to change test chip at every turn, all to process the method for test chip, but adopt the method for fine processing test fixture.Concrete disposal route is:
1, prepare the original brand-new test chip of standard set.
2, test chip is arranged between installing plate and positioning splint by normal running standard.
3, installing plate is contained on Test handler together with test chip.
4, the integrated circuit of a standard is slipped in the guide rail of Test handler, make it to rest in test chip place.
5, operational testing separator, clamps test chip, can find that the height at test chip tip and the height of tested ic pin are inconsistent, and the height of test chip is lower than the height of pin.
6, carefully measure above-mentioned difference in height.
7, installing plate is carried out to meticulous grinding process, grind off the thickness of this difference in height, reach test chip and the inconsistent impact of tested ic pin height of effectively avoiding this difference in height to bring.
8, upper machine checking.The mount pad carrying out after meticulous grinding process is assembled and packs Test handler into together with test chip, the tested integrated circuit of getting q.s carries out testing authentication, it is suitable to judge whether to install according to the height of preliminary survey yield, as on the low side in yield, the preliminary survey yield of finely tuning to guarantee contact parameter is more than 99.5%.
The utility model is lived test chip fixed clamp by positioning splint and fishbolt, make two test chip setting height(from bottom)s consistent, guarantee the contact performance that itself and tested chip are good, while fundamentally having solved each replacing test chip, all to spend the difficulty of plenty of time processing debugging test chip, and the accuracy of test and higher testing efficiency are guaranteed, effectively avoid the damage of test chip being carried out because of test loose contact simultaneously, in the serviceable life that has extended test chip, provide cost savings.
More than show and described ultimate principle of the present utility model, principal character and advantage of the present utility model.The technician of the industry should understand; the utility model is not restricted to the described embodiments; that in above-described embodiment and instructions, describes just illustrates principle of the present utility model; do not departing under the prerequisite of the utility model spirit and scope; the utility model also has various changes and modifications, and these changes and improvements all fall within the scope of claimed the utility model.The claimed scope of the utility model is defined by appending claims and equivalent thereof.
Claims (2)
1. integrated circuit testing locating device, it is characterized in that: comprise installing plate, described installing plate surface is detachably provided with erection bolt, described installing plate both sides are respectively equipped with the positioning splint for fixing test chip, described positioning splint is provided with the fishbolt that connects described installing plate, and described test chip sandwiched is fixed between described positioning splint and described installing plate.
2. integrated circuit testing locating device as claimed in claim 1, it is characterized in that: described positioning splint is set to " recessed " font plate, and the notch width of described " recessed " font plate is corresponding with the thickness of described test chip, described fishbolt lays respectively at described " recessed " font plate two ends.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320673621.7U CN203643477U (en) | 2013-10-30 | 2013-10-30 | Integrated circuit test positioner |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320673621.7U CN203643477U (en) | 2013-10-30 | 2013-10-30 | Integrated circuit test positioner |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203643477U true CN203643477U (en) | 2014-06-11 |
Family
ID=50874712
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201320673621.7U Expired - Lifetime CN203643477U (en) | 2013-10-30 | 2013-10-30 | Integrated circuit test positioner |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203643477U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104459220A (en) * | 2014-11-05 | 2015-03-25 | 东晶锐康晶体（成都）有限公司 | Testing pressure head positioning mechanism |
| CN105547076A (en) * | 2015-12-11 | 2016-05-04 | 昌河飞机工业（集团）有限责任公司 | Blade foam integrated inspection device |
-
2013
- 2013-10-30 CN CN201320673621.7U patent/CN203643477U/en not_active Expired - Lifetime
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104459220A (en) * | 2014-11-05 | 2015-03-25 | 东晶锐康晶体（成都）有限公司 | Testing pressure head positioning mechanism |
| CN105547076A (en) * | 2015-12-11 | 2016-05-04 | 昌河飞机工业（集团）有限责任公司 | Blade foam integrated inspection device |
| CN105547076B (en) * | 2015-12-11 | 2018-07-13 | 昌河飞机工业（集团）有限责任公司 | A kind of integrated verifying attachment of blade foam |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CX01 | Expiry of patent term | ||
| CX01 | Expiry of patent term |
Granted publication date: 20140611 |