CN203595764U - Non-destructive testing device for LIV low temperature performance of lasers - Google Patents
Non-destructive testing device for LIV low temperature performance of lasers Download PDFInfo
- Publication number
- CN203595764U CN203595764U CN201320771527.5U CN201320771527U CN203595764U CN 203595764 U CN203595764 U CN 203595764U CN 201320771527 U CN201320771527 U CN 201320771527U CN 203595764 U CN203595764 U CN 203595764U
- Authority
- CN
- China
- Prior art keywords
- test
- refrigeration
- lasers
- laser instrument
- liv
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000009659 non-destructive testing Methods 0.000 title abstract 4
- 238000012360 testing method Methods 0.000 claims abstract description 80
- 238000005057 refrigeration Methods 0.000 claims abstract description 47
- 238000009413 insulation Methods 0.000 claims abstract description 18
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims description 3
- 239000012774 insulation material Substances 0.000 claims description 3
- 239000000463 material Substances 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000004064 recycling Methods 0.000 description 2
- 238000004891 communication Methods 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 238000011835 investigation Methods 0.000 description 1
- 230000014759 maintenance of location Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
- 238000007639 printing Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Images
Landscapes
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Abstract
The utility model discloses a non-destructive testing device for LIV low temperature performance of lasers. The non-destructive testing device includes a refrigeration box, an insulation platform, a refrigeration contact test seat, an upper cover and a plurality of test units. The upper cover is rotatably disposed on the insulation platform. An accommodating chamber is formed between the insulation platform and the upper cover. The accommodating chamber conducts rapid heat transfer via the built-in refrigeration contact test socket. Each test unit is disposed in the accommodating chamber. The plurality of test units are provided with a common refrigeration contact test seat and circuit boards disposed beneath the refrigeration contact test seat and corresponding to each test unit. A refrigeration contact socket and a power supply socket respectively for the plugging of a laser and a power line are formed on each test unit. Compared with the prior art, the non-destructive testing device can quickly heat up the lasers in a test on the low temperature performance of the lasers and requires no movement of the lasers to ensure that the lasers are tested under high temperature environment and that no damage is done to the appearance of the lasers after the test is completed.
Description
Technical field
The utility model relates to the product detection field of laser instrument, relates in particular a kind of nondestructive test device of laser instrument LIV cryogenic property.
Background technology
Along with the development of photoelectron technology and infotech, semiconductor laser is widely used in fields such as optical fiber communication, information storages.As the light source of system, the inferior position of laser characteristic directly affects the performance of system.Therefore,, in production and use procedure, need to accurately test its LIV family curve and correlation parameter.
Thus, various laser diode LIV test macros on market, are developed, it can integrate microcomputer control, data acquisition, data processing, chart demonstration, data backup importing and data drawing list printing function, and can be by visual in image the showing of chart for test result.
But, because the application region of laser instrument is very extensive, it unavoidably can work under cold region, so to also extremely urgent while producing test request in enormous quantities (be particularly badly in need of meeting on market) of the test request of its cryogenic property, but in existing system, do not provide concrete solution for this, really have improved space.
In view of this, the inventor, for above-mentioned defect further investigation of the prior art, has this case to produce then.
Utility model content
The purpose of this utility model is to provide a kind of nondestructive test device of laser instrument LIV cryogenic property, cannot carry out specially the problem of cryogenic property test to solve prior art.
In order to reach above-mentioned purpose, solution of the present utility model is:
A kind of nondestructive test device of laser instrument LIV cryogenic property, wherein, comprise refrigeration case, insulation platform, refrigeration engaged test seat, upper cover and several test cells, this upper cover rotates and is arranged on insulation platform, between this insulation platform and upper cover, form container cavity, this container cavity carries out quick heat conduction by the refrigeration engaged test seat by built-in, each test cell is all arranged in container cavity, several test cells have same refrigeration engaged test seat and are positioned at refrigeration engaged test seat below and the circuit board corresponding with each test cell, on each test cell, be formed with respectively and contact socket and supply electrical outlet for the refrigeration that laser instrument is planted and power lead is planted.
Further, this insulation platform is embedded above refrigeration case, and this insulation platform adopts insulation material to make, and this refrigeration engaged test seat adopts Heat Conduction Material to make.
Further, on the scolding tin in each test cell and pin, be coated with insulating gel.
Adopt after said structure, the nondestructive test device of a kind of laser instrument LIV cryogenic property that the utility model relates to, in the time that needs carry out the test of LIV cryogenic property to laser instrument, first laser instrument is inserted to refrigeration contact socket, laser instrument base bottom surface is contacted completely with refrigeration engaged test seating face, rotary upper cover and seal up container cavity, regulate refrigeration case temperature to allow whole container cavity at temperature to be tested, after a period of time, open upper cover, recycling test macro is tested laser instrument, to reach effect of test for low temperature performance.
Compared with prior art, the utility model, in the time laser instrument being carried out to cryogenic property test, can make the rapid refrigeration of laser instrument, and without mobile laser instrument, tested under low temperature environment to guarantee laser instrument, and be completed rear laser instrument and can be subject in appearance any damage.
Accompanying drawing explanation
The one-piece construction schematic diagram of Fig. 1 when to be the utility model nondestructive test device of relating to a kind of laser instrument LIV cryogenic property all configure laser instrument and connection line of optic fibre;
Fig. 2 is nondestructive test device that the utility model the relates to a kind of laser instrument LIV cryogenic property schematic diagram while testing.
In figure:
Refrigeration case 1 is incubated platform 2
Upper cover 3 test cells 4
Refrigeration engaged test seat 41 refrigeration contact sockets 411
For electrical outlet 412 container cavities 5
Embodiment
In order further to explain the technical solution of the utility model, below by specific embodiment, the utility model is elaborated.
As depicted in figs. 1 and 2, the nondestructive test device of a kind of laser instrument LIV cryogenic property that the utility model relates to, comprise refrigeration case 1, insulation platform 2, refrigeration engaged test seat 41, upper cover 3 and several test cells 4, this upper cover 3 rotates and is arranged on insulation platform 2, between this insulation platform 2 and upper cover 3, form container cavity 5, this container cavity 5 carries out quick heat conduction by the refrigeration engaged test seat 41 by built-in, and make itself and refrigeration case 1 produce heat interchange, thereby reach the object of being controlled fast container cavity 5 temperature by refrigeration case 1.
Each test cell 4 is all arranged in container cavity 5, and in the present embodiment, each test cell 4 body (particularly, its share same refrigeration engaged test seat 41) that is all square, as Fig. 1 and Fig. 2, is provided with 10 test cells 4 in this container cavity 5.
Particularly, each test cell 4 all has a part for refrigeration engaged test seat 41 and is positioned at the independent circuits plate (not shown) of each test cell of refrigeration engaged test seat 41 belows, on this refrigeration engaged test seat 41, be formed with 10 411 and 10 of refrigeration contact sockets and supply electrical outlet 412, this refrigeration contact socket 411 is for planting and can be connected with circuit board easily for laser instrument 6, and 412 of this confession electrical outlet can be planted and supply with for circuit board provides power supply by power supply source line.
Preferably, the built-in refrigeration engaged test seat 41 of this insulation platform 2, is embedded above refrigeration case 1, and this insulation platform 2 adopts insulation material to make, and this refrigeration engaged test seat 41 adopts Heat Conduction Material to make.Under low-temperature condition, airborne water vapor can be condensed into the globule, for fear of the carrying out that has influence on test because of the relation of the globule, on scolding tin in each test cell 4 and pin, be coated with insulating gel, itself and air are isolated completely, and guaranteeing can be because produced steam make feed circuit short circuit in the time of low-temperature test.
The utility model is in the time that needs carry out the test of LIV cryogenic property to laser instrument 6, first laser instrument 6 is inserted to refrigeration contact socket 411, laser instrument 6 base bottom surfaces are contacted completely with refrigeration engaged test seat 41 surfaces, rotary upper cover 3 and seal up container cavity 5, regulate refrigeration case 1 temperature to allow whole container cavity 5 at temperature to be tested, after a period of time, open upper cover 3, recycling test macro is tested laser instrument, to reach effect of test for low temperature performance.
Compared with prior art, the utility model, in the time laser instrument 6 being carried out to cryogenic property test, can make the rapid refrigeration of laser instrument 6, and without mobile laser instrument 6, tested under low temperature environment to guarantee laser instrument 6, and be completed rear laser instrument 6 and can be subject in appearance any damage.
Above-described embodiment and graphic and non-limiting product form of the present utility model and style, suitable variation or modification that any person of an ordinary skill in the technical field does it, all should be considered as not departing from patent category of the present utility model.
Claims (3)
1. the nondestructive test device of a laser instrument LIV cryogenic property, it is characterized in that, comprise refrigeration case, insulation platform, refrigeration engaged test seat, upper cover and several test cells, this upper cover rotates and is arranged on insulation platform, between this insulation platform and upper cover, form container cavity, this container cavity carries out quick heat conduction by the refrigeration engaged test seat by built-in, each test cell is all arranged in container cavity, several test cells have same refrigeration engaged test seat and are positioned at refrigeration engaged test seat below and the circuit board corresponding with each test cell, on each test cell, be formed with respectively and contact socket and supply electrical outlet for the refrigeration that laser instrument is planted and power lead is planted.
2. the nondestructive test device of a kind of laser instrument LIV cryogenic property as claimed in claim 1, is characterized in that, this insulation platform is embedded above refrigeration case, and this insulation platform adopts insulation material to make, and this refrigeration engaged test seat adopts Heat Conduction Material to make.
3. the nondestructive test device of a kind of laser instrument LIV cryogenic property as claimed in claim 1, is characterized in that, on the scolding tin in each test cell and pin, is coated with insulating gel.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320771527.5U CN203595764U (en) | 2013-11-29 | 2013-11-29 | Non-destructive testing device for LIV low temperature performance of lasers |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320771527.5U CN203595764U (en) | 2013-11-29 | 2013-11-29 | Non-destructive testing device for LIV low temperature performance of lasers |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203595764U true CN203595764U (en) | 2014-05-14 |
Family
ID=50676633
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201320771527.5U Expired - Lifetime CN203595764U (en) | 2013-11-29 | 2013-11-29 | Non-destructive testing device for LIV low temperature performance of lasers |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203595764U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107976561A (en) * | 2016-10-24 | 2018-05-01 | 豪威科技股份有限公司 | There is the test bench of high temperature test |
| CN111366830A (en) * | 2020-03-17 | 2020-07-03 | 苏州长光华芯光电技术有限公司 | Semiconductor laser low temperature testing arrangement |
-
2013
- 2013-11-29 CN CN201320771527.5U patent/CN203595764U/en not_active Expired - Lifetime
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107976561A (en) * | 2016-10-24 | 2018-05-01 | 豪威科技股份有限公司 | There is the test bench of high temperature test |
| CN111366830A (en) * | 2020-03-17 | 2020-07-03 | 苏州长光华芯光电技术有限公司 | Semiconductor laser low temperature testing arrangement |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN202471764U (en) | Test seat for automatic chip test machine, with temperature heating test function | |
| CN203595764U (en) | Non-destructive testing device for LIV low temperature performance of lasers | |
| CN205679554U (en) | A kind of test coating, the device of thin-film material thermal and insulating performance | |
| WO2013009689A8 (en) | Temperature measurement of active device under test on strip tester | |
| CN101699235A (en) | Analysis and test system and test method for junction temperature of semiconductor lamp | |
| CN204359928U (en) | A kind of intelligent electric energy meter Auto-Test System | |
| CN103868613A (en) | LabVIEW-based LED junction temperature measurement method | |
| CN110596745B (en) | Electric heating simulated heat source of general isotope heat source | |
| CN204145412U (en) | A kind of solar cell detects fixture | |
| CN206460091U (en) | A kind of power monitoring equipment | |
| CN202471286U (en) | Testing system for electrified environment temperature test of solar photovoltaic junction box | |
| CN207541242U (en) | A kind of lamps and lanterns test box with reference | |
| CN207440603U (en) | A kind of control system test device peculiar to vessel | |
| CN103323053B (en) | Environment monitoring data acquisition system based on satellite fix | |
| CN203595763U (en) | Non-destructive testing device for LIV high temperature performance of lasers | |
| CN102437233A (en) | Laser reticle detecting system and method of solar battery board | |
| CN201917399U (en) | Remote infrared temperature measuring system of high-voltage power distribution cabinet | |
| CN104048992A (en) | Device for measuring thermal resistance from bottom shell of semiconductor device to air under thermal coupling effect | |
| CN203037741U (en) | Device for testing resistivity of solar cell material under high temperature | |
| CN203061198U (en) | Heating and cooling structure for integrated circuit test | |
| CN207490867U (en) | A kind of multichannel solar cell temperature coefficient test equipment | |
| CN207380080U (en) | A kind of visual device for testing half-cell constant temperature | |
| CN218065552U (en) | Energy-saving device of environmental test chamber | |
| CN207336427U (en) | A kind of integrated constant temperature electrode assembly | |
| CN204831552U (en) | Phase transition fabrics surface temperature testing arrangement |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CX01 | Expiry of patent term |
Granted publication date: 20140514 |
|
| CX01 | Expiry of patent term |