CN203037741U - Device for testing resistivity of solar cell material under high temperature - Google Patents

Device for testing resistivity of solar cell material under high temperature Download PDF

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Publication number
CN203037741U
CN203037741U CN 201220588511 CN201220588511U CN203037741U CN 203037741 U CN203037741 U CN 203037741U CN 201220588511 CN201220588511 CN 201220588511 CN 201220588511 U CN201220588511 U CN 201220588511U CN 203037741 U CN203037741 U CN 203037741U
Authority
CN
China
Prior art keywords
testing
solar cell
resistivity
cell material
constant temperature
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
CN 201220588511
Other languages
Chinese (zh)
Inventor
王福生
张东晖
樊志罡
李璞
张红菊
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Guobiao Beijing Testing & Certification Co ltd
Original Assignee
Beijing General Research Institute for Non Ferrous Metals
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Beijing General Research Institute for Non Ferrous Metals filed Critical Beijing General Research Institute for Non Ferrous Metals
Priority to CN 201220588511 priority Critical patent/CN203037741U/en
Application granted granted Critical
Publication of CN203037741U publication Critical patent/CN203037741U/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Abstract

The utility model discloses a device for testing the resistivity of a solar cell material under high temperature, belonging to the field of material testing. The structure of the device provided by the utility model is as follows: a test frame (3) is located in a constant temperature box (1); a sample to be tested (6) is placed on the test frame (3); a four-point probe (4) can move in the vertical direction and are connected to the test frame (3) through a fixing device (8); the four-point probe (4) is in contact with the surface of the sample to be tested (6), and the other end is connected with a resistivity testing device (5) through a connection wire (7); the resistivity testing device (5) is arranged outside the constant temperature box (1); and a high temperature control system (2) is located in the lower part of the constant temperature box (1) and is in close contact with the constant temperature box (1). The device can accurately simulate the actual environment temperature, can make the solar cell material under any temperature between room temperature to 80 degrees and test the resistivity of the solar cell material.

Description

A kind of device of testing solar cell material resistivity at high temperature
Technical field
The utility model belongs to the testing of materials field, is specifically related to a kind of device of testing solar cell material resistivity at high temperature.
Background technology
Solar cell material is the no-bias electrooptical device that utilizes photovoltaic effect to make, photoelectric transformation efficiency is about 15% at present, photoelectric transformation efficiency is relevant with its electrical property, thermal behavior etc., studies the quality that these performances help to improve solar cell material.
Measure the resistive performance of solar cell material under hot environment, and compare with data under the room temperature condition, thereby draw the resistive performance of solar cell material under hot environment and the difference of resistive performance at ambient temperature, thereby for estimating the quality of solar cell material, the performance of improving solar cell material provides foundation.
The utility model content
The purpose of this utility model provides a kind of device of testing solar cell material resistivity at high temperature.
The apparatus structure of described test solar cell material resistivity at high temperature is as follows:
Described device comprises constant temperature oven 1, high-temperature control system 2, testing jig 3, Four probing pin probe 4, resistivity measurement device 5, testing sample 6, connects lead 7 and stationary installation 8;
Described testing jig 3 is positioned at constant temperature oven 1; Testing sample 6 is placed on the described testing jig 3; Four probing pin probe 4 can move in vertical direction, and is connected on the testing jig 3 by stationary installation 8; Four probing pin probe 4 contacts with described testing sample 6 surfaces, and the other end is connected with resistivity measurement device 5 by connecting lead 7;
Described resistivity measurement device 5 is positioned at outside the constant temperature oven 1; High-temperature control system 2 is positioned at the bottom of described constant temperature oven 1 and closely contacts with constant temperature oven 1.
The key technical indexes of the device of the test solar cell material resistivity at high temperature that the utility model provides is as follows:
(1) described device can make solar cell material be in the temperature range of room temperature~80 ℃, and the resistivity of test solar cell material in this temperature range;
(2) described device can be controlled the precision of temperature and is :≤± 0.5 ℃;
(3) but the precision of described device measuring resistance rate be: 0.0001~19000 Ω cm;
(4) sensitivity of described device is: 10 μ V.
The beneficial effects of the utility model are:
The device that the utility model provides can make solar cell material be under the high temperature of room temperature~80 ℃, and it is carried out resistivity measurement.Because solar cell material is generally all in outdoor application, therefore, the variation of outdoor temperature is that the researchist is concerned about to the influence of battery material, the device that the utility model provides can accurately be simulated the actual environment temperature, has solved under hot environment the test problem to solar cell material resistivity.
Description of drawings
Fig. 1 is the apparatus structure synoptic diagram of the test solar cell material resistivity at high temperature that provides of the utility model.
Embodiment
The utility model is described in more detail below in conjunction with accompanying drawing and specific embodiment.
Testing sample is that upper and lower surface is smooth, and planar dimension is no more than the rectangle sample of Φ 100mm circular sample or 100mm * 100mm, and thickness 10mm is with interior solar cell material.
Embodiment 1:
Testing jig 3 is put into constant temperature oven 1; Testing sample 6 is placed on the testing jig 3, and four probes of Four probing pin probe 4 are pressed on the upper surface with testing sample 6; Open high-temperature control system 2, make the temperature stabilization of testing sample 6 at 25 ℃; By connecting lead 7 voltage and current signal are transmitted to the resistivity measurement device 5 that is positioned at 1 outside, thereby obtain the resistivity of testing sample 6 under 25 ℃.
Embodiment 2:
Testing jig 3 is put into constant temperature oven 1; Testing sample 6 is placed on the testing jig 3, and four probes of Four probing pin probe 4 are pressed on the upper surface with testing sample 6; Open high-temperature control system 2, make the temperature stabilization of testing sample 6 at 50 ℃; By connecting lead 7 voltage and current signal are transmitted to the resistivity measurement device 5 that is positioned at 1 outside, thereby obtain the resistivity of testing sample 6 under 50 ℃.
Embodiment 3:
Testing jig 3 is put into constant temperature oven 1; Testing sample 6 is placed on the testing jig 3, and four probes of Four probing pin probe 4 are pressed on the upper surface with testing sample 6; Open high-temperature control system 2, make the temperature stabilization of testing sample 6 at 80 ℃; By connecting lead 7 voltage and current signal are transmitted to the resistivity measurement device 5 that is positioned at 1 outside, thereby obtain the resistivity of testing sample 6 under 80 ℃.
Above embodiment only is used for the technical solution of the utility model being described and unrestricted that all technical schemes that belongs under the utility model thinking all belong to protection domain of the present utility model.For those skilled in the art, some improvement of carrying out based on the technical solution of the utility model and/or be equal to replacement all should be considered as dropping among the protection domain of the present utility model.

Claims (1)

1. device of testing solar cell material resistivity at high temperature, it is characterized in that described device comprises constant temperature oven (1), high-temperature control system (2), testing jig (3), Four probing pin probe (4), resistivity measurement device (5), testing sample (6), connects lead (7) and stationary installation (8);
Described testing jig (3) is positioned at constant temperature oven (1); Four probing pin probe (4) can move in vertical direction, and is connected on the testing jig (3) by stationary installation (8); Four probing pin probe (4) contacts with testing sample (6) surface, and the other end is connected with resistivity measurement device (5) by connecting lead (7); Described resistivity measurement device (5) is positioned at outside the constant temperature oven (1); High-temperature control system (2) is positioned at the bottom of described constant temperature oven (1) and closely contacts with constant temperature oven (1).
CN 201220588511 2012-11-09 2012-11-09 Device for testing resistivity of solar cell material under high temperature Expired - Lifetime CN203037741U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN 201220588511 CN203037741U (en) 2012-11-09 2012-11-09 Device for testing resistivity of solar cell material under high temperature

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN 201220588511 CN203037741U (en) 2012-11-09 2012-11-09 Device for testing resistivity of solar cell material under high temperature

Publications (1)

Publication Number Publication Date
CN203037741U true CN203037741U (en) 2013-07-03

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN 201220588511 Expired - Lifetime CN203037741U (en) 2012-11-09 2012-11-09 Device for testing resistivity of solar cell material under high temperature

Country Status (1)

Country Link
CN (1) CN203037741U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104275485A (en) * 2013-10-16 2015-01-14 济南大学 Method for rapidly optimizing sintering schedule of powder metallurgical material
CN106707025A (en) * 2016-12-06 2017-05-24 河北工业大学 Micro-area resistivity measurement device having temperature control function

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104275485A (en) * 2013-10-16 2015-01-14 济南大学 Method for rapidly optimizing sintering schedule of powder metallurgical material
CN106707025A (en) * 2016-12-06 2017-05-24 河北工业大学 Micro-area resistivity measurement device having temperature control function

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Legal Events

Date Code Title Description
C14 Grant of patent or utility model
GR01 Patent grant
C41 Transfer of patent application or patent right or utility model
TR01 Transfer of patent right

Effective date of registration: 20160811

Address after: Yang Yanlu 101407 Beijing city Huairou District Yanqi Economic Development Zone No. 88

Patentee after: GUOBIAO (BEIJING) TESTING & CERTIFICATION CO.,LTD.

Address before: 100088, 2, Xinjie street, Beijing, Beijing, Xicheng District

Patentee before: General Research Institute for Nonferrous Metals

CX01 Expiry of patent term

Granted publication date: 20130703

CX01 Expiry of patent term