CN203037741U - Device for testing resistivity of solar cell material under high temperature - Google Patents
Device for testing resistivity of solar cell material under high temperature Download PDFInfo
- Publication number
- CN203037741U CN203037741U CN 201220588511 CN201220588511U CN203037741U CN 203037741 U CN203037741 U CN 203037741U CN 201220588511 CN201220588511 CN 201220588511 CN 201220588511 U CN201220588511 U CN 201220588511U CN 203037741 U CN203037741 U CN 203037741U
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- testing
- solar cell
- resistivity
- cell material
- constant temperature
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- Photovoltaic Devices (AREA)
Abstract
The utility model discloses a device for testing the resistivity of a solar cell material under high temperature, belonging to the field of material testing. The structure of the device provided by the utility model is as follows: a test frame (3) is located in a constant temperature box (1); a sample to be tested (6) is placed on the test frame (3); a four-point probe (4) can move in the vertical direction and are connected to the test frame (3) through a fixing device (8); the four-point probe (4) is in contact with the surface of the sample to be tested (6), and the other end is connected with a resistivity testing device (5) through a connection wire (7); the resistivity testing device (5) is arranged outside the constant temperature box (1); and a high temperature control system (2) is located in the lower part of the constant temperature box (1) and is in close contact with the constant temperature box (1). The device can accurately simulate the actual environment temperature, can make the solar cell material under any temperature between room temperature to 80 degrees and test the resistivity of the solar cell material.
Description
Technical field
The utility model belongs to the testing of materials field, is specifically related to a kind of device of testing solar cell material resistivity at high temperature.
Background technology
Solar cell material is the no-bias electrooptical device that utilizes photovoltaic effect to make, photoelectric transformation efficiency is about 15% at present, photoelectric transformation efficiency is relevant with its electrical property, thermal behavior etc., studies the quality that these performances help to improve solar cell material.
Measure the resistive performance of solar cell material under hot environment, and compare with data under the room temperature condition, thereby draw the resistive performance of solar cell material under hot environment and the difference of resistive performance at ambient temperature, thereby for estimating the quality of solar cell material, the performance of improving solar cell material provides foundation.
The utility model content
The purpose of this utility model provides a kind of device of testing solar cell material resistivity at high temperature.
The apparatus structure of described test solar cell material resistivity at high temperature is as follows:
Described device comprises constant temperature oven 1, high-temperature control system 2, testing jig 3, Four probing pin probe 4, resistivity measurement device 5, testing sample 6, connects lead 7 and stationary installation 8;
Described testing jig 3 is positioned at constant temperature oven 1; Testing sample 6 is placed on the described testing jig 3; Four probing pin probe 4 can move in vertical direction, and is connected on the testing jig 3 by stationary installation 8; Four probing pin probe 4 contacts with described testing sample 6 surfaces, and the other end is connected with resistivity measurement device 5 by connecting lead 7;
Described resistivity measurement device 5 is positioned at outside the constant temperature oven 1; High-temperature control system 2 is positioned at the bottom of described constant temperature oven 1 and closely contacts with constant temperature oven 1.
The key technical indexes of the device of the test solar cell material resistivity at high temperature that the utility model provides is as follows:
(1) described device can make solar cell material be in the temperature range of room temperature～80 ℃, and the resistivity of test solar cell material in this temperature range;
(2) described device can be controlled the precision of temperature and is :≤± 0.5 ℃;
(3) but the precision of described device measuring resistance rate be: 0.0001～19000 Ω cm;
(4) sensitivity of described device is: 10 μ V.
The beneficial effects of the utility model are:
The device that the utility model provides can make solar cell material be under the high temperature of room temperature～80 ℃, and it is carried out resistivity measurement.Because solar cell material is generally all in outdoor application, therefore, the variation of outdoor temperature is that the researchist is concerned about to the influence of battery material, the device that the utility model provides can accurately be simulated the actual environment temperature, has solved under hot environment the test problem to solar cell material resistivity.
Description of drawings
Fig. 1 is the apparatus structure synoptic diagram of the test solar cell material resistivity at high temperature that provides of the utility model.
Embodiment
The utility model is described in more detail below in conjunction with accompanying drawing and specific embodiment.
Testing sample is that upper and lower surface is smooth, and planar dimension is no more than the rectangle sample of Φ 100mm circular sample or 100mm * 100mm, and thickness 10mm is with interior solar cell material.
Embodiment 1:
Embodiment 2:
Embodiment 3:
Above embodiment only is used for the technical solution of the utility model being described and unrestricted that all technical schemes that belongs under the utility model thinking all belong to protection domain of the present utility model.For those skilled in the art, some improvement of carrying out based on the technical solution of the utility model and/or be equal to replacement all should be considered as dropping among the protection domain of the present utility model.
Claims (1)
1. device of testing solar cell material resistivity at high temperature, it is characterized in that described device comprises constant temperature oven (1), high-temperature control system (2), testing jig (3), Four probing pin probe (4), resistivity measurement device (5), testing sample (6), connects lead (7) and stationary installation (8);
Described testing jig (3) is positioned at constant temperature oven (1); Four probing pin probe (4) can move in vertical direction, and is connected on the testing jig (3) by stationary installation (8); Four probing pin probe (4) contacts with testing sample (6) surface, and the other end is connected with resistivity measurement device (5) by connecting lead (7); Described resistivity measurement device (5) is positioned at outside the constant temperature oven (1); High-temperature control system (2) is positioned at the bottom of described constant temperature oven (1) and closely contacts with constant temperature oven (1).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220588511 CN203037741U (en) | 2012-11-09 | 2012-11-09 | Device for testing resistivity of solar cell material under high temperature |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220588511 CN203037741U (en) | 2012-11-09 | 2012-11-09 | Device for testing resistivity of solar cell material under high temperature |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203037741U true CN203037741U (en) | 2013-07-03 |
Family
ID=48689852
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201220588511 Expired - Lifetime CN203037741U (en) | 2012-11-09 | 2012-11-09 | Device for testing resistivity of solar cell material under high temperature |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203037741U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104275485A (en) * | 2013-10-16 | 2015-01-14 | 济南大学 | Method for rapidly optimizing sintering schedule of powder metallurgical material |
| CN106707025A (en) * | 2016-12-06 | 2017-05-24 | 河北工业大学 | Micro-area resistivity measurement device having temperature control function |
-
2012
- 2012-11-09 CN CN 201220588511 patent/CN203037741U/en not_active Expired - Lifetime
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104275485A (en) * | 2013-10-16 | 2015-01-14 | 济南大学 | Method for rapidly optimizing sintering schedule of powder metallurgical material |
| CN106707025A (en) * | 2016-12-06 | 2017-05-24 | 河北工业大学 | Micro-area resistivity measurement device having temperature control function |
| CN106707025B (en) * | 2016-12-06 | 2024-04-05 | 河北工业大学 | Micro-area resistivity measuring device with temperature control |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C41 | Transfer of patent application or patent right or utility model | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20160811 Address after: Yang Yanlu 101407 Beijing city Huairou District Yanqi Economic Development Zone No. 88 Patentee after: GUOBIAO (BEIJING) TESTING & CERTIFICATION CO.,LTD. Address before: 100088, 2, Xinjie street, Beijing, Beijing, Xicheng District Patentee before: General Research Institute for Nonferrous Metals |
|
| CX01 | Expiry of patent term |
Granted publication date: 20130703 |
|
| CX01 | Expiry of patent term |