CN203595763U - Non-destructive testing device for LIV high temperature performance of lasers - Google Patents
Non-destructive testing device for LIV high temperature performance of lasers Download PDFInfo
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- CN203595763U CN203595763U CN201320771509.7U CN201320771509U CN203595763U CN 203595763 U CN203595763 U CN 203595763U CN 201320771509 U CN201320771509 U CN 201320771509U CN 203595763 U CN203595763 U CN 203595763U
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- laser instrument
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- bracing frame
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- 238000009659 non-destructive testing Methods 0.000 title abstract 4
- 238000012360 testing method Methods 0.000 claims abstract description 53
- 230000006399 behavior Effects 0.000 description 16
- 239000013307 optical fiber Substances 0.000 description 4
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 239000002510 pyrogen Substances 0.000 description 2
- 238000004891 communication Methods 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000011835 investigation Methods 0.000 description 1
- 230000014759 maintenance of location Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000007639 printing Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
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Abstract
The utility model discloses a non-destructive testing device for LIV high temperature performance of lasers. The non-destructive testing device includes a baking pan, a heat conducting support frame disposed above the baking pan and a plurality of test units assembled in the heat conducting support frame. The baking pan generates heat and transmits the heat to lasers in the test units via the heat conducting support frame so as to reach a temperature to be tested. Each test unit has a separate conductive circuit board, a laser socket and a power supply socket, wherein the laser socket and the power supply socket are used respectively for the plugging of a laser tube socket and a power line and a plug thereof. Compared with the prior art, the non-destructive testing device can quickly heat up the lasers in a test on the high temperature performance of the lasers and requires no movement of the lasers to ensure that the lasers are tested under high temperature environment and that no damage is done to the appearance of the lasers after the test is completed.
Description
Technical field
The utility model relates to the product detection field of laser instrument, relates in particular a kind of nondestructive test device of laser instrument LIV high-temperature behavior.
Background technology
Along with the development of photoelectron technology and infotech, semiconductor laser is widely used in fields such as optical fiber communication, information storages.As the light source of system, the inferior position of laser characteristic directly affects the performance of system.Therefore,, in production and use procedure, need to accurately test its LIV family curve and correlation parameter.
Thus, various laser diode LIV test macros on market, are developed, it can integrate microcomputer control, data acquisition, data processing, chart demonstration, data backup importing and data drawing list printing function, and can be by visual in image the showing of chart for test result.
But, because the application region of laser instrument is very extensive, it unavoidably can work under the region of high temperature, so to also extremely urgent while producing test request in enormous quantities (be particularly badly in need of meeting on market) of the test request of its high-temperature behavior, but in existing system, do not provide concrete solution for this, really have improved space.
In view of this, the inventor, for above-mentioned defect further investigation of the prior art, has this case to produce then.
Utility model content
The purpose of this utility model is to provide a kind of nondestructive test device of laser instrument LIV high-temperature behavior, cannot carry out specially the problem of high-temperature behavior test to solve prior art.
In order to reach above-mentioned purpose, solution of the present utility model is:
A kind of nondestructive test device of laser instrument LIV high-temperature behavior, wherein, comprise baking tray, be positioned at the heat conduction bracing frame of baking tray top and be assemblied in several test cells of heat conduction bracing frame, this baking tray produce heat and by heat conduction bracing frame toward the laser instrument transferring heat in test cell to make it to reach temperature to be tested, laser instrument socket and power supply base that each test cell all has independent order wire circuit plate and plants for laser instrument base plant and supply lines and plug thereof respectively.
Further, the test surface of contact of this heat conduction bracing frame is by directly contacting to the rapid transferring heat of laser instrument with laser instrument base bottom surface.
Further, this heat conduction bracing frame back side is come directly to contact with baking tray surface by the support rod of protrusion is set.
Adopt after said structure, the nondestructive test device of a kind of laser instrument LIV high-temperature behavior that the utility model relates to, in the time that needs carry out the test of LIV high-temperature behavior to laser instrument, first laser instrument is planted into laser instrument socket, its base bottom surface is directly contacted with the test surface of contact in heat conduction bracing frame front, regulate baking tray temperature to make it the temperature that reaches to be tested, after a period of time, connect respectively optical fiber cable and supply lines to each test cell, each laser instrument is carried out to independent LIV test, finally reach effect of batch testing laser instrument high-temperature behavior.
Compared with prior art, the utility model, in the time laser instrument being carried out to high-temperature behavior test, can make the rapid pyrogenicity of laser instrument, and without mobile laser instrument, tested under hot environment to guarantee laser instrument, and be completed rear laser instrument and can be subject in appearance any damage.
Accompanying drawing explanation
Fig. 1 is nondestructive test device that the utility model relates to a kind of laser instrument LIV high-temperature behavior one-piece construction schematic diagram when laser instrument is tested;
Fig. 2 is the front schematic view of the utility model when testing and being separated from baking tray;
Fig. 3 is the schematic rear view of the utility model when testing and being separated from baking tray;
Heat conduction bracing frame schematic diagram when Fig. 4 is the unassembled laser instrument socket of the utility model, order wire circuit plate, power supply base.
In figure:
Baking tray 1 laser instrument 2
Optical fiber cable and plug 3 supply lines and plug 4 thereof
Test cell 5 laser instrument sockets 51
Power supply base 52 is tested surface of contact 53
Order wire circuit plate 54 heat conduction bracing frames 6
Support rod 7.
Embodiment
In order further to explain the technical solution of the utility model, below by specific embodiment, the utility model is elaborated.
As shown in Figure 1, the nondestructive test device of a kind of laser instrument LIV high-temperature behavior that the utility model relates to, comprises baking tray 1, is positioned at the heat conduction bracing frame 6 of baking tray 1 top and is assemblied in several test cells 5 of heat conduction bracing frame 6; In the present embodiment, what these several test cells showed is 50, this baking tray 1 produce heat and by heat conduction bracing frame 6 toward laser instrument 2 transferring heats in test cell 5 to make it to reach temperature to be tested, laser instrument socket 51 and power supply base 52 that each test cell 5 all has independent order wire circuit plate 54 and plants for laser instrument 2 base plants and supply lines and plug 4 thereof respectively.
Like this, the utility model is in the time that needs carry out the test of LIV high-temperature behavior to laser instrument 2, first laser instrument 2 is planted into laser instrument 2 sockets, its base bottom surface is directly contacted with the test surface of contact 53 in heat conduction bracing frame 6 fronts, regulate baking tray 1 temperature to make it the temperature that reaches to be tested, after a period of time, connect respectively optical fiber cable and supply lines to each test cell 5, each laser instrument 2 is carried out to independent LIV test, finally reach effect of batch testing laser instrument 2 high-temperature behaviors.
Compared with prior art, the utility model, in the time laser instrument 2 being carried out to high-temperature behavior test, can make the rapid pyrogenicity of laser instrument 2, and without mobile laser instrument 2, tested under hot environment to guarantee laser instrument 2, and be completed rear laser instrument 2 and can be subject in appearance any damage.
As shown in Figures 2 to 3, the nondestructive test device of a kind of laser instrument LIV high-temperature behavior that the utility model relates to, it comprises 50 test cells 5, these 50 test cells 5 share the test surface of contact 53 of same heat conduction bracing frame 6, and each test cell 5 is also by independently laser instrument socket 51, power supply base 52, order wire circuit plate 54 form separately, laser instrument socket 51 and power supply base 52, by being welded on same order wire circuit plate 54, are realized the connection of circuit.
As shown in Figure 4, these heat conduction bracing frame 6 back sides directly contact with baking tray 1 surface by the support rod 7 that protrusion is set, and give the rapid transferring heat of laser instrument, have so also protected the order wire circuit on it can not contact and be burned with baking tray 1 simultaneously.These heat conduction bracing frame 6 back sides have 11 support rods 7.
Above-described embodiment and graphic and non-limiting product form of the present utility model and style, suitable variation or modification that any person of an ordinary skill in the technical field does it, all should be considered as not departing from patent category of the present utility model.
Claims (3)
1. the nondestructive test device of a laser instrument LIV high-temperature behavior, it is characterized in that, comprise baking tray, be positioned at the heat conduction bracing frame of baking tray top and be assemblied in several test cells of heat conduction bracing frame, this baking tray produce heat and by heat conduction bracing frame toward the laser instrument transferring heat in test cell to make it to reach temperature to be tested, laser instrument socket and power supply base that each test cell all has independent order wire circuit plate and plants for laser instrument base plant and supply lines and plug thereof respectively.
2. the nondestructive test device of a kind of laser instrument LIV high-temperature behavior as claimed in claim 1, is characterized in that, the test surface of contact of this heat conduction bracing frame is by directly contacting to the rapid transferring heat of laser instrument with laser instrument base bottom surface.
3. the nondestructive test device of a kind of laser instrument LIV high-temperature behavior as claimed in claim 1, is characterized in that, this heat conduction bracing frame back side is come directly to contact with baking tray surface by the support rod of protrusion is set.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320771509.7U CN203595763U (en) | 2013-11-29 | 2013-11-29 | Non-destructive testing device for LIV high temperature performance of lasers |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320771509.7U CN203595763U (en) | 2013-11-29 | 2013-11-29 | Non-destructive testing device for LIV high temperature performance of lasers |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203595763U true CN203595763U (en) | 2014-05-14 |
Family
ID=50676632
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201320771509.7U Expired - Lifetime CN203595763U (en) | 2013-11-29 | 2013-11-29 | Non-destructive testing device for LIV high temperature performance of lasers |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203595763U (en) |
-
2013
- 2013-11-29 CN CN201320771509.7U patent/CN203595763U/en not_active Expired - Lifetime
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CX01 | Expiry of patent term |
Granted publication date: 20140514 |
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| CX01 | Expiry of patent term |